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DE3880456D1 - Verfahren zur massenspektroskopischen untersuchung eines gasgemisches und massenspektrometer zur durchfuehrung dieses verfahrens. - Google Patents

Verfahren zur massenspektroskopischen untersuchung eines gasgemisches und massenspektrometer zur durchfuehrung dieses verfahrens.

Info

Publication number
DE3880456D1
DE3880456D1 DE8888120710T DE3880456T DE3880456D1 DE 3880456 D1 DE3880456 D1 DE 3880456D1 DE 8888120710 T DE8888120710 T DE 8888120710T DE 3880456 T DE3880456 T DE 3880456T DE 3880456 D1 DE3880456 D1 DE 3880456D1
Authority
DE
Germany
Prior art keywords
mass
carrying
gas mixture
spectroscopic examination
mass spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8888120710T
Other languages
English (en)
Inventor
Jochen Dr Franzen
Reemt-Holger Dr Gabling
Gerhard Heinen
Gerhard Weiss
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bruker Daltonics GmbH and Co KG
Original Assignee
Bruken Franzen Analytik GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=6343365&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE3880456(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Bruken Franzen Analytik GmbH filed Critical Bruken Franzen Analytik GmbH
Priority to DE8888120710T priority Critical patent/DE3880456D1/de
Application granted granted Critical
Publication of DE3880456D1 publication Critical patent/DE3880456D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/429—Scanning an electric parameter, e.g. voltage amplitude or frequency

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DE8888120710T 1987-12-23 1988-12-12 Verfahren zur massenspektroskopischen untersuchung eines gasgemisches und massenspektrometer zur durchfuehrung dieses verfahrens. Expired - Lifetime DE3880456D1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE8888120710T DE3880456D1 (de) 1987-12-23 1988-12-12 Verfahren zur massenspektroskopischen untersuchung eines gasgemisches und massenspektrometer zur durchfuehrung dieses verfahrens.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3743718 1987-12-23
DE8888120710T DE3880456D1 (de) 1987-12-23 1988-12-12 Verfahren zur massenspektroskopischen untersuchung eines gasgemisches und massenspektrometer zur durchfuehrung dieses verfahrens.

Publications (1)

Publication Number Publication Date
DE3880456D1 true DE3880456D1 (de) 1993-05-27

Family

ID=6343365

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888120710T Expired - Lifetime DE3880456D1 (de) 1987-12-23 1988-12-12 Verfahren zur massenspektroskopischen untersuchung eines gasgemisches und massenspektrometer zur durchfuehrung dieses verfahrens.

Country Status (3)

Country Link
US (1) US5028777A (de)
EP (1) EP0321819B2 (de)
DE (1) DE3880456D1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115047259A (zh) * 2022-04-15 2022-09-13 安徽省太微量子科技有限公司 基于频率可调二维线性离子阱的颗粒荷质比测量方法

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5225141A (en) * 1988-07-11 1993-07-06 Milad Limited Partnership Process for injection molding a hollow plastic article
US5206506A (en) * 1991-02-12 1993-04-27 Kirchner Nicholas J Ion processing: control and analysis
US5182451A (en) * 1991-04-30 1993-01-26 Finnigan Corporation Method of operating an ion trap mass spectrometer in a high resolution mode
DE4142871C1 (de) * 1991-12-23 1993-05-19 Bruker - Franzen Analytik Gmbh, 2800 Bremen, De
DE4142870C2 (de) * 1991-12-23 1995-03-16 Bruker Franzen Analytik Gmbh Verfahren für phasenrichtiges Messen der Ionen aus Ionenfallen-Massenspektrometern
DE4316738C2 (de) * 1993-05-19 1996-10-17 Bruker Franzen Analytik Gmbh Auswurf von Ionen aus Ionenfallen durch kombinierte elektrische Dipol- und Quadrupolfelder
DE4324224C1 (de) * 1993-07-20 1994-10-06 Bruker Franzen Analytik Gmbh Quadrupol-Ionenfallen mit schaltbaren Multipol-Anteilen
US5420425A (en) * 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
US5572025A (en) * 1995-05-25 1996-11-05 The Johns Hopkins University, School Of Medicine Method and apparatus for scanning an ion trap mass spectrometer in the resonance ejection mode
JP3648906B2 (ja) * 1997-02-14 2005-05-18 株式会社日立製作所 イオントラップ質量分析計を用いた分析装置
DE19733834C1 (de) * 1997-08-05 1999-03-04 Bruker Franzen Analytik Gmbh Axialsymmetrische Ionenfalle für massenspektrometrische Messungen
DE19751401B4 (de) * 1997-11-20 2007-03-01 Bruker Daltonik Gmbh Quadrupol-Hochfrequenz-Ionenfallen für Massenspektrometer
US6124592A (en) * 1998-03-18 2000-09-26 Technispan Llc Ion mobility storage trap and method
US6239429B1 (en) 1998-10-26 2001-05-29 Mks Instruments, Inc. Quadrupole mass spectrometer assembly
US6469298B1 (en) 1999-09-20 2002-10-22 Ut-Battelle, Llc Microscale ion trap mass spectrometer
DE10028914C1 (de) * 2000-06-10 2002-01-17 Bruker Daltonik Gmbh Interne Detektion von Ionen in Quadrupol-Ionenfallen
US7019289B2 (en) * 2003-01-31 2006-03-28 Yang Wang Ion trap mass spectrometry
US7034293B2 (en) * 2004-05-26 2006-04-25 Varian, Inc. Linear ion trap apparatus and method utilizing an asymmetrical trapping field
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
US9171706B1 (en) * 2014-11-06 2015-10-27 Shimadzu Corporation Mass analysis device and mass analysis method
CN110783165A (zh) * 2019-11-01 2020-02-11 上海裕达实业有限公司 线性离子阱离子引入侧的端盖电极结构

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3527939A (en) * 1968-08-29 1970-09-08 Gen Electric Three-dimensional quadrupole mass spectrometer and gauge
US4540884A (en) * 1982-12-29 1985-09-10 Finnigan Corporation Method of mass analyzing a sample by use of a quadrupole ion trap
US4650999A (en) * 1984-10-22 1987-03-17 Finnigan Corporation Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap
EP0202943B2 (de) * 1985-05-24 2004-11-24 Thermo Finnigan LLC Steuerungsverfahren für eine Ionenfalle
ATE99834T1 (de) * 1988-04-13 1994-01-15 Bruker Franzen Analytik Gmbh Methode zur massenanalyse einer probe mittels eines quistors und zur durchfuehrung dieses verfahrens entwickelter quistor.

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115047259A (zh) * 2022-04-15 2022-09-13 安徽省太微量子科技有限公司 基于频率可调二维线性离子阱的颗粒荷质比测量方法
CN115047259B (zh) * 2022-04-15 2022-12-06 安徽省太微量子科技有限公司 基于频率可调二维线性离子阱的颗粒荷质比测量方法

Also Published As

Publication number Publication date
EP0321819B1 (de) 1993-04-21
US5028777A (en) 1991-07-02
EP0321819A2 (de) 1989-06-28
EP0321819A3 (en) 1989-08-23
EP0321819B2 (de) 2002-06-19

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Legal Events

Date Code Title Description
8363 Opposition against the patent
8327 Change in the person/name/address of the patent owner

Owner name: BRUKER DALTONIK GMBH, 28359 BREMEN, DE

8366 Restricted maintained after opposition proceedings