KR940004761A - 기밀 밀봉된 집적회로 - Google Patents
기밀 밀봉된 집적회로 Download PDFInfo
- Publication number
- KR940004761A KR940004761A KR1019930016758A KR930016758A KR940004761A KR 940004761 A KR940004761 A KR 940004761A KR 1019930016758 A KR1019930016758 A KR 1019930016758A KR 930016758 A KR930016758 A KR 930016758A KR 940004761 A KR940004761 A KR 940004761A
- Authority
- KR
- South Korea
- Prior art keywords
- silicon
- ceramic
- layer
- integrated circuit
- bond pads
- Prior art date
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- 230000009972 noncorrosive effect Effects 0.000 claims abstract description 6
- 239000000919 ceramic Substances 0.000 claims abstract 16
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 230000000903 blocking effect Effects 0.000 claims description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 10
- 229910052710 silicon Inorganic materials 0.000 claims 10
- 239000010703 silicon Substances 0.000 claims 10
- 239000000463 material Substances 0.000 claims 7
- 229910004298 SiO 2 Inorganic materials 0.000 claims 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims 2
- 230000004888 barrier function Effects 0.000 claims 2
- 239000002775 capsule Substances 0.000 claims 2
- 229910010293 ceramic material Inorganic materials 0.000 claims 2
- 238000009792 diffusion process Methods 0.000 claims 2
- 239000000203 mixture Substances 0.000 claims 2
- 229910052709 silver Inorganic materials 0.000 claims 2
- 239000004332 silver Substances 0.000 claims 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims 2
- 239000010937 tungsten Substances 0.000 claims 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims 1
- 239000004593 Epoxy Substances 0.000 claims 1
- 229910052581 Si3N4 Inorganic materials 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical group O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 1
- 229910001069 Ti alloy Inorganic materials 0.000 claims 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical group [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims 1
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 claims 1
- 229910001080 W alloy Inorganic materials 0.000 claims 1
- DZPJVKXUWVWEAD-UHFFFAOYSA-N [C].[N].[Si] Chemical compound [C].[N].[Si] DZPJVKXUWVWEAD-UHFFFAOYSA-N 0.000 claims 1
- HMDDXIMCDZRSNE-UHFFFAOYSA-N [C].[Si] Chemical compound [C].[Si] HMDDXIMCDZRSNE-UHFFFAOYSA-N 0.000 claims 1
- UBMXAAKAFOKSPA-UHFFFAOYSA-N [N].[O].[Si] Chemical compound [N].[O].[Si] UBMXAAKAFOKSPA-UHFFFAOYSA-N 0.000 claims 1
- UMVBXBACMIOFDO-UHFFFAOYSA-N [N].[Si] Chemical compound [N].[Si] UMVBXBACMIOFDO-UHFFFAOYSA-N 0.000 claims 1
- 125000001931 aliphatic group Chemical group 0.000 claims 1
- 125000003118 aryl group Chemical group 0.000 claims 1
- 229910052799 carbon Inorganic materials 0.000 claims 1
- 125000004432 carbon atom Chemical group C* 0.000 claims 1
- 229910052802 copper Inorganic materials 0.000 claims 1
- 239000010949 copper Substances 0.000 claims 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims 1
- 229910052737 gold Inorganic materials 0.000 claims 1
- 239000010931 gold Substances 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 229920003209 poly(hydridosilsesquioxane) Polymers 0.000 claims 1
- 239000011347 resin Substances 0.000 claims 1
- 229920005989 resin Polymers 0.000 claims 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims 1
- 229910010271 silicon carbide Inorganic materials 0.000 claims 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims 1
- 229910052814 silicon oxide Inorganic materials 0.000 claims 1
- 229910000679 solder Inorganic materials 0.000 claims 1
- 229910052719 titanium Inorganic materials 0.000 claims 1
- 239000010936 titanium Substances 0.000 claims 1
- 229910052721 tungsten Inorganic materials 0.000 claims 1
- 239000011248 coating agent Substances 0.000 abstract 1
- 238000000576 coating method Methods 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 description 2
Classifications
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- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
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Abstract
본 발명은 주위환경으로부터 보호된 집적회로에 관한 것이다. 이러한 회로는 비부식성 전도성 층을 본드 패드에 피복하고 추가의 세라믹 층을 1차 불활성 층에 피복시켜 기밀 밀봉한다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 불활성 층 및 비부식성 전도성 층을 갖는 반도체 장치의 단면도이고,
제2도는 본 발명의 불활성 층,
차단 금속 층 및 비부식성 전도성 층을 갖는 반도체 장치의 단면도이다.
Claims (10)
- 하나 이상의 본드 패드를 갖는 회로 반조립 부품; 하나 이상의 본드 패드에서 노출된 반조립 부품의 표면위에 있는 1차 불활성 층; 노출된 본드 패드를 덮고 있는 하나 이상의 비부식성 전도성 층; 및 1차 불활성 층을 덮고 있는 세라믹 층(여기서, 세라믹 층을 회로를 예비세라믹 규소-함유 물질을 포함하는 조성물로 피복시킨 다음 당해 물질을 세라믹으로 전환시킴으로 특징으로 하는 방법에 의해 침착된 규소-함유 세라믹 물질을 포함하고, 세라믹 층을 전도성 층과 밀접하게 접촉한다)을 포함하는 기밀 밀봉된 집적회로.
- 제1항에 있어서, 비부식성 전도성 층이 금, 은, 텅스텐, 땜납, 은-충전된 에폭시 및 구리로 이루어진 그룹중에서 선택된 물질로부터 제조된 집적회로.
- 제1항에 있어서, 세라믹 층이 산화규소, 질화규소, 규소 옥시니트라이드, 규소 옥시카바이드, 규소 카보니트라이드, 규소 옥시카보니트라이드 및 규소 카바이드로 이루어진 그룹 중에서 선택된 집적회로.
- 제1항에 있어서, 예비세라믹 규소-함유 물질이 수소 실세스퀴옥산 수지인 집적회로.
- 제1항에 있어서, 예비세라믹 규소-함유 물질이 가수분해 되거나 부분적으로 가수분해된 RnSi(OR)C4-n(여기서, R은 각각 독립적으로 탄소수 1내지 20의 지방족, 지환족 또는 방향족 치환체이고, n은 0내지 3이다)인 집적회로.
- 제1항에 있어서, 세라믹 층이 SiO2피막, SiO2/세라믹 산화물 피막, 규소 피막, 규소 탄소 함유 피막, 규소 질소 함유 피막, 규소 산소 질소 함유 피막, 규소 탄소 질소 함유 피막 및 다이아몬드형 탄소 피막으로부터 선택된 하나 이상의 추가의 세라믹 층에 의해 피복된 집적회로.
- 제1항에 있어서, 유기 캡슐제 및 규소 캡슐제로 이루어진 그룹 중에서 선택된 물질내에 서로 연결되고 밀봉된 집적회로.
- 제1항에 있어서, 세라믹 층이 자외선 및 가시광선을 통과 시키지 않는 집적회로.
- 하나 이상의 본드 패드를 갖는 회로 반조립 부품; 하나 이상의 본드 패드에서 노출된 반조립 부품의 표면위에 있는 1차 불활성 층; 본드 패드를 덮고 있는 확산 차단 금속 층; 확산 차단 금속 층을 덮고 있는 비부식성 전도성 층; 및 1차 불활성 층을 덮고 있는 세라믹 층(예 : 세라믹 층은 회로를 예비세라믹 규소-함유 물질을 포함하는 조성물로 피복시킨 다음 당해 물질을 세라믹으로 전환시킴을 특징으로 하는 방법에 의해 침작된 규소-함유 세라믹 물질을 포함하고, 세라믹 층은 전도성 층과 밀접하게 첩촉한다)을 포함하는 기밀 밀봉된 집적 회로.
- 제9항에 있어서, 차단 금속 층이 티탄, 티탄과 텅스텐과의 합금 및 티탄 니트라이드로 이루어진 그룹 중에서 선택된 집적회로.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
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US93647592A | 1992-08-28 | 1992-08-28 | |
US7/936,475 | 1992-08-28 |
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KR940004761A true KR940004761A (ko) | 1994-03-15 |
KR100287487B1 KR100287487B1 (ko) | 2001-04-16 |
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KR1019930016758A KR100287487B1 (ko) | 1992-08-28 | 1993-08-27 | 기밀 밀봉된 집적회로의 제조방법 |
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EP (1) | EP0590780B1 (ko) |
JP (1) | JPH06177185A (ko) |
KR (1) | KR100287487B1 (ko) |
CA (1) | CA2104487A1 (ko) |
DE (1) | DE69311774T2 (ko) |
TW (1) | TW232094B (ko) |
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DE4427309C2 (de) * | 1994-08-02 | 1999-12-02 | Ibm | Herstellung eines Trägerelementmoduls zum Einbau in Chipkarten oder andere Datenträgerkarten |
DE19548046C2 (de) * | 1995-12-21 | 1998-01-15 | Siemens Matsushita Components | Verfahren zur Herstellung von für eine Flip-Chip-Montage geeigneten Kontakten von elektrischen Bauelementen |
US5935638A (en) * | 1998-08-06 | 1999-08-10 | Dow Corning Corporation | Silicon dioxide containing coating |
WO2008122292A1 (en) * | 2007-04-04 | 2008-10-16 | Ecole Polytechnique Federale De Lausanne (Epfl) | Diffusion-barrier coating for protection of moisture and oxygen sensitive devices |
US10399256B1 (en) | 2018-04-17 | 2019-09-03 | Goodrich Corporation | Sealed circuit card assembly |
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JPS63213347A (ja) * | 1987-02-27 | 1988-09-06 | Mitsubishi Electric Corp | 半導体装置 |
US4849296A (en) * | 1987-12-28 | 1989-07-18 | Dow Corning Corporation | Multilayer ceramic coatings from metal oxides and hydrogen silsesquioxane resin ceramified in ammonia |
US4888226A (en) * | 1988-08-08 | 1989-12-19 | American Telephone And Telegraph Company | Silicone gel electronic device encapsulant |
CA2027031A1 (en) * | 1989-10-18 | 1991-04-19 | Loren A. Haluska | Hermetic substrate coatings in an inert gas atmosphere |
US5136364A (en) * | 1991-06-12 | 1992-08-04 | National Semiconductor Corporation | Semiconductor die sealing |
-
1993
- 1993-08-19 DE DE69311774T patent/DE69311774T2/de not_active Expired - Fee Related
- 1993-08-19 EP EP93306587A patent/EP0590780B1/en not_active Expired - Lifetime
- 1993-08-20 TW TW082106719A patent/TW232094B/zh active
- 1993-08-20 CA CA002104487A patent/CA2104487A1/en not_active Abandoned
- 1993-08-27 KR KR1019930016758A patent/KR100287487B1/ko not_active IP Right Cessation
- 1993-08-30 JP JP5214449A patent/JPH06177185A/ja active Pending
Also Published As
Publication number | Publication date |
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DE69311774T2 (de) | 1998-01-08 |
EP0590780B1 (en) | 1997-06-25 |
TW232094B (ko) | 1994-10-11 |
EP0590780A1 (en) | 1994-04-06 |
KR100287487B1 (ko) | 2001-04-16 |
CA2104487A1 (en) | 1994-03-01 |
JPH06177185A (ja) | 1994-06-24 |
DE69311774D1 (de) | 1997-07-31 |
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