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JPS6243791A - Ic card - Google Patents

Ic card

Info

Publication number
JPS6243791A
JPS6243791A JP60183244A JP18324485A JPS6243791A JP S6243791 A JPS6243791 A JP S6243791A JP 60183244 A JP60183244 A JP 60183244A JP 18324485 A JP18324485 A JP 18324485A JP S6243791 A JPS6243791 A JP S6243791A
Authority
JP
Japan
Prior art keywords
card
mode
test
reader
mode signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60183244A
Other languages
Japanese (ja)
Other versions
JPH0721819B2 (en
Inventor
Kenichi Takahira
高比良 賢一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP60183244A priority Critical patent/JPH0721819B2/en
Publication of JPS6243791A publication Critical patent/JPS6243791A/en
Publication of JPH0721819B2 publication Critical patent/JPH0721819B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Credit Cards Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To easily test an IC card chip loaded to a card reader by switching an operation mode to a normal or a test mode on the basis of a mode signal inputted from the card reader and testing the card by a CPU in the card itself. CONSTITUTION:When the IC card is inserted into the reader, power supply voltage is supplied from the reader to the card and the card reads a mode signal through a mode signal detecting means 2. Since the mode signal for controlling the operation mode of the card is applied from the reader to a terminal 6a, the means 2 detects the level of the terminal 6a and applies the detected level to an operation control means 3. If a mode signal '0' is outputted from the reader, the means 3 detects the signal '0' and turns the current operation mode to the test mode and tests the IC card itself in accordance with a test program stored in a memory part 1 to execute the self-diagnosis of the IC card. Consequently, the self-diagnosis can be easily and precisely executed and the reliability of the card can be remarkably improved.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明はICカードに関し、特にその機能テストに関
するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an IC card, and particularly relates to a functional test thereof.

〔従来の技術〕[Conventional technology]

ここでICカートとは、従来の磁気ストライプ付カード
に代わって用いられるものであり、カードの基体内にメ
モリICやCPUその他の半導体片を内蔵し、従来の磁
気ストライプ付カードに比べて数桁以上の大容量の記憶
能力を持たせることができるほか、任意の演算機能を持
たせることができるものである。
Here, an IC cart is used in place of a conventional card with a magnetic stripe, and has a memory IC, CPU, and other semiconductor pieces built into the base of the card, and is several orders of magnitude larger than a conventional card with a magnetic stripe. In addition to being able to have the above-mentioned large-capacity storage capacity, it can also be provided with arbitrary arithmetic functions.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

このようなICカードにおいて、カードの信頼性を上げ
るためには、その制御プログラムやメモリ内のデータが
正常か否かについてテストを行なった方が望ましい訳で
あるが、ICチップを一旦実装してしまうとテストは不
可能であり、外部から該カードが止宿なものか否かを判
断することはできない。また、実装する前段階ではテス
トすることもできるが、この場合はICチップ単体にミ
クロン単位の針をあてて、大型の試験装置を用いて行な
わなければならず、非常に面倒なものである。さらにこ
の実装する前段階のテストは、あくまでもICチップ単
体のテストであり、実際の使用における不具合等を発見
できるものではない。
In order to increase the reliability of such IC cards, it is desirable to test whether the control program and data in the memory are normal or not, but once the IC chip is mounted, Once this is done, testing is impossible, and it is impossible to determine from the outside whether the card is a permanent card or not. Although it is possible to test the IC chip before it is mounted, it is very troublesome to do so by applying a micron-sized needle to the IC chip and using a large testing device. Furthermore, this pre-implementation test is just a test of the IC chip as a unit, and cannot detect defects during actual use.

この発明は、かかる従来の問題点を解消するためになさ
れたもので、ICチップ実装後のカードのテストを容易
に行うことができるICカードを提供することを目的と
している。
The present invention has been made to solve these conventional problems, and an object of the present invention is to provide an IC card that allows easy testing of the card after mounting an IC chip thereon.

〔問題点を解決するための手段〕[Means for solving problems]

この発明に係るICカードは、カード内に通常動作プロ
グラムとともにテスト用のプログラムを収納し、カード
読取り装置から入力されるモード信号により、動作モー
ドを通常あるいはテストモードに切り換えて、カード内
部のCPUで該カードのテストを行うようにしたもので
ある。
The IC card according to the present invention stores a test program together with a normal operation program in the card, and switches the operation mode between normal and test mode according to a mode signal input from a card reading device, and uses a CPU inside the card to switch the operation mode to normal or test mode. The card is tested.

〔作用〕[Effect]

この発明においては、ICカードの動作が正常か否かの
確認が、試験装置を用いることな(カード内部のCPU
で行われ、該テストが非常に容易になり、しかも実使用
に即したテストが可能となる。
In this invention, it is possible to check whether the IC card is operating normally without using a test device (the CPU inside the card
This makes the test extremely easy, and also allows the test to be performed in accordance with actual use.

〔実施例〕〔Example〕

以下、本発明の実施例を図について説明する。 Embodiments of the present invention will be described below with reference to the drawings.

第1図は本発明の一実施例によるICカード10の機能
ブロック図であり、本ICカード1oはCPU4.メモ
リ部1.インターフェース5.及び端子6で構成されて
いる。そして上記メモリ部1は、通常動作を行うための
プログラムが収納された通常動作プログラム領域1a、
動作確認等のテストを行うためのプログラムが収納され
たテスト用プログラム領域1b、及びデータが収納され
たデータ領域1cからなっている。またCPU4におい
て、2は図示しないカード読取り装置(以下リーグと記
す)から入力されるモード信号を検出するモード信号検
出手段、3はこの検出結果に応じて動作モードを制御す
る動作制御手段である。
FIG. 1 is a functional block diagram of an IC card 10 according to an embodiment of the present invention, and this IC card 1o has a CPU 4. Memory section 1. Interface 5. and a terminal 6. The memory unit 1 includes a normal operation program area 1a in which programs for performing normal operations are stored;
It consists of a test program area 1b that stores programs for performing tests such as operation confirmation, and a data area 1c that stores data. Further, in the CPU 4, reference numeral 2 denotes mode signal detection means for detecting a mode signal inputted from a card reading device (hereinafter referred to as league), and reference numeral 3 denotes an operation control means for controlling the operation mode according to the detection result.

また上記端子6は、ISO規格等に$拠して設けられて
おり、図中−格下の端子6aが、リーグからのモード信
号が印加される端子となっている。
The terminals 6 are provided in accordance with ISO standards, and the lower terminal 6a in the figure is the terminal to which the mode signal from the league is applied.

なお、上記メモリ部1とCPU4とは別々のチップとし
て設けられていても、また1チツプとして設けられてい
てもよい。
Note that the memory section 1 and the CPU 4 may be provided as separate chips or may be provided as one chip.

次に動作について説明する。Next, the operation will be explained.

ここで本実施例の場合、まずICカードのテストを行っ
て該カードが正常か否かを確認し、[正常」を確認した
後通常動作モードに移行する場合の動作について説明す
る。
Here, in the case of this embodiment, an operation will be described in which an IC card is first tested to confirm whether the card is normal or not, and after confirming "normal", the operation is shifted to the normal operation mode.

上記のような動作フローを第2図に示す。まずICカー
ドがリーグに挿入されると、該リーグからカードに電源
電圧が供給され、該カードはモード信号検出手段2にて
モード信号の読込みを行う(ステップ11)、ここで、
上記リーグからはカードの動作モードを制御するための
モード信号が端子6aに印加されており、上記モード信
号検出手段2は該端子6aのレベルを検出してこれを動
作制御手段3に与える。今、リーグからはモード信号“
0° (テストモード)が出力されているので、動作制
御手段3はこれを受けて動作モードをテストモードとし
くステップ12)、ステップ13にて、メモリ部1に収
納されたテスト用プログラムに従って本ICカードのテ
ストを行う。即ち、ICカードが自己診断を行う訳であ
る。
FIG. 2 shows the operation flow as described above. First, when an IC card is inserted into the league, power supply voltage is supplied from the league to the card, and the card reads the mode signal using the mode signal detection means 2 (step 11).
A mode signal for controlling the operation mode of the card is applied from the league to the terminal 6a, and the mode signal detection means 2 detects the level of the terminal 6a and supplies it to the operation control means 3. Now, the league is giving a mode signal “
Since 0° (test mode) is output, the operation control means 3 receives this and sets the operation mode to the test mode, and in step 12) and step 13, the main operation is performed according to the test program stored in the memory section 1. Perform an IC card test. In other words, the IC card performs self-diagnosis.

ここで、テストの内容としては、メモリ部1のデータが
正常であるか否かのテスト、亥たビット総和をとって自
己の通常動作プログラムが正常が否かのテスト等があり
、これらを確認しくステップ13.14)、正常であれ
ばインタフェース5及び端子6を介してリーグ側へその
旨を示す信号を送出する。これによりリーグの表示装置
に「OK」の表示がなされ、該リーグはモード信号を“
1′に切り換える。カードは、このモード信号“1”を
読込み(ステップ11)、動作モードを通常モードに切
り換えて所定の動作を行う(ステップ12.17)。
Here, the test contents include testing whether the data in memory section 1 is normal or not, and testing whether the own normal operation program is normal by taking the sum of bits, etc., and confirming these. In step 13.14), if it is normal, a signal indicating this is sent to the league side via the interface 5 and terminal 6. As a result, "OK" is displayed on the league's display device, and the league transmits the mode signal "
Switch to 1'. The card reads this mode signal "1" (step 11), switches the operation mode to normal mode, and performs a predetermined operation (step 12.17).

また、上記テストの結果、プログラム等に異常があれば
その旨を示す信号をリーグへ送出し、1ノーダはこれを
受けてその表示装置にrNGJの表示を行い、該カード
をイジェクトする。
Further, as a result of the above test, if there is an abnormality in the program, etc., a signal indicating this is sent to the league, and in response to this, the 1 node displays rNGJ on its display device and ejects the card.

このような本実施例では、カード内にテスト用のプログ
ラムを収納し、リーグからのモード信号によってテスト
、あるいは通常動作を行うようにしたので、試験装置等
を全(用いることなくカード自身で自己のテストを容易
に行うことができ、しかも従来のようにICチップ単体
のテストではなく、カードの実使用に即したテストを行
うことができる。
In this embodiment, the test program is stored in the card, and the test or normal operation is performed by the mode signal from the league. Moreover, it is possible to conduct a test based on the actual use of the card, rather than testing a single IC chip as in the past.

なお、上記実施例ではモード信号を“0”又は“1″と
したが、これは複数の端子を使用してコード化するよう
にしてもよい。
In the above embodiment, the mode signal is set to "0" or "1", but this may be encoded using a plurality of terminals.

また、本発明のICカードの動作フローは第2図に示し
たフローに限られるものではなく、例えば工場における
出荷時の製品検査等、種々の使用法が考えられるのは勿
論である。
Further, the operation flow of the IC card of the present invention is not limited to the flow shown in FIG. 2, and it goes without saying that various uses can be considered, such as, for example, product inspection at the time of shipment at a factory.

〔発明の効果〕〔Effect of the invention〕

以上のように、本発明によれば、カード内に通當のプロ
グラムとともにテスト用のプログラムを収納し、リーダ
からのモード信号によって動作モードを切り換えるよう
にしたので、カード内部のCPUで該カードが正常であ
るか否かを容易に、しかも正確に自己診断することがで
き、カードの信頼性を著しく向上できる効果がある。
As described above, according to the present invention, the test program is stored in the card along with the current program, and the operating mode is switched by the mode signal from the reader, so that the card is controlled by the CPU inside the card. It is possible to easily and accurately self-diagnose whether or not the card is normal, which has the effect of significantly improving the reliability of the card.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例によるICカードの機能ブロ
ック図、第2図は該ICカードの動作の一例を説明する
ためのフローチャート図である。 1・・・メモリ部、2・・モード信号検出手段、3・・
・動作制御手段。
FIG. 1 is a functional block diagram of an IC card according to an embodiment of the present invention, and FIG. 2 is a flowchart for explaining an example of the operation of the IC card. DESCRIPTION OF SYMBOLS 1...Memory part, 2...Mode signal detection means, 3...
・Operation control means.

Claims (1)

【特許請求の範囲】[Claims] (1)通常動作プログラム及びテスト用プログラムが収
納されたメモリと、 本ICカードがカード読取り装置に挿入されたときカー
ドの少なくとも1つの端子に上記カード読取り装置から
入力されるモード信号を検出するモード信号検出手段と
、 該検出結果に応じて動作モードを通常モードあるいはテ
ストモードとする動作制御手段とを備えたことを特徴と
するICカード。
(1) A memory that stores a normal operation program and a test program, and a mode that detects a mode signal input from the card reader to at least one terminal of the card when the IC card is inserted into the card reader. An IC card comprising: a signal detection means; and an operation control means for setting an operation mode to a normal mode or a test mode according to the detection result.
JP60183244A 1985-08-20 1985-08-20 IC card Expired - Lifetime JPH0721819B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60183244A JPH0721819B2 (en) 1985-08-20 1985-08-20 IC card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60183244A JPH0721819B2 (en) 1985-08-20 1985-08-20 IC card

Publications (2)

Publication Number Publication Date
JPS6243791A true JPS6243791A (en) 1987-02-25
JPH0721819B2 JPH0721819B2 (en) 1995-03-08

Family

ID=16132297

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60183244A Expired - Lifetime JPH0721819B2 (en) 1985-08-20 1985-08-20 IC card

Country Status (1)

Country Link
JP (1) JPH0721819B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0196782A (en) * 1987-10-08 1989-04-14 Dainippon Printing Co Ltd Ic card information processing method
JPH02157988A (en) * 1988-12-12 1990-06-18 Hitachi Ltd Command processing system in ic card
JPH03122788A (en) * 1989-10-05 1991-05-24 Oki Electric Ind Co Ltd Ic card
JP2002183670A (en) * 2000-12-08 2002-06-28 Sony Corp Access device of ic card, inspection device the card access device and inspection method of ic card access device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS603082A (en) * 1983-06-18 1985-01-09 Dainippon Printing Co Ltd Ic card
JPS61278992A (en) * 1985-06-04 1986-12-09 Toppan Moore Co Ltd Ic card having failure inspecting function

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS603082A (en) * 1983-06-18 1985-01-09 Dainippon Printing Co Ltd Ic card
JPS61278992A (en) * 1985-06-04 1986-12-09 Toppan Moore Co Ltd Ic card having failure inspecting function

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0196782A (en) * 1987-10-08 1989-04-14 Dainippon Printing Co Ltd Ic card information processing method
JPH02157988A (en) * 1988-12-12 1990-06-18 Hitachi Ltd Command processing system in ic card
JPH03122788A (en) * 1989-10-05 1991-05-24 Oki Electric Ind Co Ltd Ic card
JP2002183670A (en) * 2000-12-08 2002-06-28 Sony Corp Access device of ic card, inspection device the card access device and inspection method of ic card access device
JP4501276B2 (en) * 2000-12-08 2010-07-14 ソニー株式会社 IC card viewer and inspection method in IC card viewer

Also Published As

Publication number Publication date
JPH0721819B2 (en) 1995-03-08

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