WO2010005026A1 - 発光装置 - Google Patents
発光装置 Download PDFInfo
- Publication number
- WO2010005026A1 WO2010005026A1 PCT/JP2009/062450 JP2009062450W WO2010005026A1 WO 2010005026 A1 WO2010005026 A1 WO 2010005026A1 JP 2009062450 W JP2009062450 W JP 2009062450W WO 2010005026 A1 WO2010005026 A1 WO 2010005026A1
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- WIPO (PCT)
- Prior art keywords
- electron source
- electrode
- light
- gas
- emitting device
- Prior art date
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- 230000005284 excitation Effects 0.000 claims abstract description 16
- 230000005684 electric field Effects 0.000 claims description 32
- 229910052724 xenon Inorganic materials 0.000 claims description 30
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 claims description 30
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 23
- 239000013081 microcrystal Substances 0.000 claims description 12
- 239000004065 semiconductor Substances 0.000 claims description 7
- 230000001360 synchronised effect Effects 0.000 claims description 3
- 239000007789 gas Substances 0.000 description 83
- 239000010408 film Substances 0.000 description 30
- 239000010410 layer Substances 0.000 description 30
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 15
- 229910052814 silicon oxide Inorganic materials 0.000 description 15
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 9
- 229910052710 silicon Inorganic materials 0.000 description 9
- 239000010703 silicon Substances 0.000 description 9
- 239000000463 material Substances 0.000 description 8
- 238000000034 method Methods 0.000 description 5
- 239000011521 glass Substances 0.000 description 4
- 150000002500 ions Chemical class 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 238000007599 discharging Methods 0.000 description 3
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 3
- 229910052753 mercury Inorganic materials 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- 125000006850 spacer group Chemical group 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 150000003736 xenon Chemical class 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000005281 excited state Effects 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 238000005121 nitriding Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J63/00—Cathode-ray or electron-stream lamps
- H01J63/06—Lamps with luminescent screen excited by the ray or stream
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J61/00—Gas-discharge or vapour-discharge lamps
- H01J61/02—Details
- H01J61/30—Vessels; Containers
- H01J61/305—Flat vessels or containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/30—Cold cathodes, e.g. field-emissive cathode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J61/00—Gas-discharge or vapour-discharge lamps
- H01J61/02—Details
- H01J61/12—Selection of substances for gas fillings; Specified operating pressure or temperature
- H01J61/16—Selection of substances for gas fillings; Specified operating pressure or temperature having helium, argon, neon, krypton, or xenon as the principle constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J63/00—Cathode-ray or electron-stream lamps
- H01J63/02—Details, e.g. electrode, gas filling, shape of vessel
- H01J63/04—Vessels provided with luminescent coatings; Selection of materials for the coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J63/00—Cathode-ray or electron-stream lamps
- H01J63/08—Lamps with gas plasma excited by the ray or stream
Definitions
- the present invention relates to a light emitting device. Specifically, the gas enclosed in the hermetic container is excited to emit excitation light defined as first light, and the first light has a wavelength different from the first wavelength by the phosphor.
- the present invention relates to a light emitting device configured to be converted into second light and emitted.
- the rare gas fluorescent lamp emits light at a lower efficiency than the conventional fluorescent lamp using mercury emits light. Accordingly, in order for the rare gas fluorescent lamp to emit light having a luminance equivalent to that of light emitted by the conventional fluorescent lamp, a high starting voltage and a driving voltage are set between a pair of electrodes arranged inside the hermetic container. Had to be applied.
- Japanese Patent Laid-Open Publication No. 2002-150944 discloses another conventional light emitting device.
- This light-emitting device is provided on an airtight container having a light-transmitting property, a rare gas such as xenon gas enclosed in the airtight container, a pair of discharge electrodes, a field emission electron source, and an inner surface of the airtight container.
- the hermetic container houses a pair of discharge electrodes and an electron source.
- the electron source has a pair of drive electrodes.
- This light-emitting device is configured to drive the electron source to emit electrons to the electron source and subsequently apply a voltage between the pair of discharge electrodes.
- Such a light emitting device emits the first light with a starting voltage that is about half the starting voltage of the conventional starting voltage.
- the first light is converted into second light having a wavelength longer than that of the first light by the phosphor layer.
- the light emitting device in order to cause the light emitting device to emit light, it is necessary to supply electrons of 12.13 eV or more, which is the ionization energy of the xenon gas, to the xenon gas in the hermetic container.
- the ionization energy of xenon gas is greater than 8.44 eV, which is the excitation energy necessary for generating ultraviolet light from xenon gas. Accordingly, a large voltage is applied between the drive electrodes of the electron source. Therefore, the light emitting device described above cannot achieve low power consumption and cannot increase the light emission efficiency per unit input power. A large voltage applied between the drive electrodes leads to a reduction in the lifetime of the electron source.
- discharge plasma ions are generated, and the discharge plasma ions collide with and damage the electron source and the phosphor layer, and this collision reduces the life of the light emitting device. Invite.
- An object of the present invention is to provide a light-emitting device with low power consumption, high efficiency, and long life.
- the light emitting device of the present invention includes an airtight container, a gas, an electron source, an anode electrode, a control device, and a phosphor.
- the airtight container has airtightness and translucency.
- the gas is sealed in an airtight container.
- the gas is configured to emit first light having a wavelength in the vacuum ultraviolet to visible light range when excited by electrons.
- the electron source is disposed inside the hermetic container.
- the electron source has a first drive electrode and a second drive electrode.
- the electron source is configured to emit the electrons when a driving voltage is applied between the first driving electrode and the second driving electrode.
- the anode electrode is disposed inside the hermetic container and is disposed to face the electron source.
- the control device is configured to apply the drive voltage between the first drive electrode and the second drive electrode.
- the control device is configured to apply an emission voltage between the electron source and the anode electrode so that the electrons move to the anode electrode.
- the phosphor is provided inside the airtight container. The phosphor is configured to be excited by the first light and emit a second light having a wavelength different from that of the first light.
- the electron source is configured to emit electrons having an energy distribution having a peak energy when the emission voltage is applied. The peak energy is larger than the excitation energy of the gas and smaller than the ionization energy of the gas.
- the control device adjusts the voltage between the drive electrodes, and causes the electron source to emit electrons having a peak value of an energy distribution that is larger than the excitation energy of the gas and smaller than the ionization energy of the gas.
- the control device excites the gas without discharging the gas.
- the excited gas emits excitation light that is first light.
- the first light emitted from the gas is applied to the phosphor, and thereby the phosphor converts the first light into second light having a wavelength different from the wavelength of the first light.
- This second light is emitted from the hermetic container. Therefore, the light emitting device can emit light by applying a voltage between the drive electrodes, which is lower than the voltage necessary for discharging the gas to cause the phosphor to emit light. Therefore, a light emitting device with low power consumption and high light emission efficiency can be obtained.
- the ions in the discharge plasma do not damage the electron source or the phosphor layer. Therefore, a long-life light emitting device can be obtained.
- the gas is preferably sealed in the airtight container so as to have a pressure of 2 kPa to 20 kPa.
- gas discharge can be prevented.
- the light emission efficiency of the light emitting device can be improved.
- the gas is more preferably a rare gas.
- This gas is sealed in the hermetic container so as to have a predetermined pressure.
- the predetermined pressure of the gas is set so as to form an excimer when the gas is excited.
- control device is configured to apply the rectangular wave driving voltage to the electron source, thereby giving the electron source an on state and an off state.
- the electron source is configured to emit electrons over an on period in the on state.
- the electron source is configured to be prohibited from emitting electrons for an off period in the off state.
- control device drives the electron source intermittently. Therefore, this configuration makes it possible to drive the light emitting device with lower power than that consumed when the electron source is continuously driven.
- the gas has a characteristic of afterglow over an afterglow period after the electron source is switched from the on state to the off state. Accordingly, the off period is set shorter than the afterglow period.
- the light emitting device is configured to emit light even during a predetermined period in which the supply of electrons from the electron source is stopped. Therefore, this configuration makes it possible to improve the light emission efficiency of the light emitting device.
- the electron source is defined as a ballistic electron surface emission electron source.
- the ballistic electron surface emission electron source includes a lower electrode, a surface electrode, and a strong electric field drift layer.
- the surface electrode is disposed to face the lower electrode.
- the surface electrode defines the first drive electrode.
- the lower electrode defines the second drive electrode.
- the strong electric field drift layer is disposed between the surface electrode and the lower electrode.
- the strong electric field drift layer is composed of a large number of semiconductor microcrystals on the order of nanometers and a large number of insulating films.
- the insulating film is formed on the surface of each semiconductor microcrystal.
- the insulating film has a film thickness smaller than the crystal grain size of the semiconductor microcrystal.
- the control device is configured to apply alternating current and the rectangular wave driving voltage to the electron source.
- the electron source is alternately given a first period and a second period.
- the control device is configured to apply a forward bias voltage between the drive electrodes, whereby electrons are supplied from the electron source into the hermetic container.
- the control device is configured to apply a reverse bias voltage between the drive voltages, whereby electrons trapped in the trap in the strong electric field drift layer are emitted to the lower electrode. Is done.
- the electron source when the electron source is alternately given the first period and the second period, the relaxation of the electric field due to the electrons trapped in the traps in the strong electric field drift layer is suppressed, and thereby the length of the electron source is increased. Life expectancy is achieved.
- the control device is preferably configured to apply the rectangular wave emission voltage synchronized with the drive voltage between the anode electrode and the electron source.
- This configuration enables the light emitting device to be driven with lower power consumption than when the constant voltage is applied between the anode electrode and the electron source.
- control device is configured to apply the discharge voltage between the anode electrode and the electron source so that the potential of the anode electrode is higher than the potential of the electron source. Accordingly, the voltage value of the discharge voltage in the off period is set lower than the voltage value of the discharge voltage in the on period.
- the electron source can be operated with low power consumption.
- this configuration can extract electrons to the anode electrode during the off period.
- the distance between the electron source and the anode electrode is preferably set larger than the Paschen minimum.
- FIG. 1 is a schematic view of the light emitting device of this embodiment.
- the light emitting device of the present embodiment includes an airtight container 1, an electron source 2, an anode electrode 3, a phosphor layer 4, and a control device 5.
- the airtight container 1 has translucency and has airtightness.
- the hermetic container 1 has a gas sealed therein. When excited, this gas has a wavelength in the vacuum ultraviolet to visible light range and emits excitation light defined as first light. This gas is made of, for example, xenon.
- the electron source 2 is configured to supply electrons for exciting the gas into the hermetic container 1 by applying a driving voltage between the surface electrode 27 and the lower electrode 25.
- the anode electrode 3 is made of a transparent electrode made of ITO or the like, and is disposed facing the electron source 2.
- the phosphor layer 4 is configured to convert the first light into second light that has a wavelength longer than that of the first light and is visible light. This second light is emitted to the outside of the airtight container 1 having translucency.
- the control device 5 is configured to apply a voltage between the surface electrode 27 and the lower electrode 25 of the electron source, and a voltage applied between the surface electrode 27 and the anode electrode 3 of the electron source. Configured to adjust.
- the control device 5 is configured to apply a voltage between the anode electrode 3 and the surface electrode 27 of the electron source 2, and between the anode electrode 3 and the surface electrode 27 of the electron source 2. It is configured to adjust the applied voltage.
- the surface electrode 27 defines a drive electrode in cooperation with the lower electrode 25.
- the surface electrode 27 constitutes a first drive electrode
- the lower electrode 25 constitutes a second drive electrode.
- the airtight container 1 includes a rear plate 11, a face plate 12, and a spacer 13.
- the rear plate 11 is made of a light-transmitting material such as glass and is formed in a rectangular plate shape.
- the face plate 12 is made of a light-transmitting material such as glass, and is disposed to face one surface side of the rear plate 11 and is formed in a rectangular plate shape.
- the spacer 13 is interposed between the rear plate 11 and the face plate 12, and is formed in a rectangular frame shape.
- the rear plate 11 has the electron source 2 disposed on one surface facing the face plate 12.
- the face plate 12 is provided with an anode electrode on one surface facing the rear plate 11.
- the anode electrode 3 is provided with a phosphor layer 4 on one surface facing the rear plate 11.
- the shape of the airtight container 1 is not restricted to the said shape.
- the material of the rear plate 11, the face plate 12, and the spacer 13 is not limited to glass, and may be, for example, a translucent ceramic.
- the airtight container 1 is entirely formed of a translucent material.
- the hermetic container 1 does not necessarily need to be formed of a material having translucency as a whole.
- the airtight container 1 should just be formed at least partially by the translucent material.
- the electron source 2 is a ballistic electron surface-emitting device (BSD).
- the ballistic electron surface emission type electron source includes the lower electrode 25, the surface electrode 27, and a strong electric field drift layer 26 interposed between the lower electrode 25 and the surface electrode 27.
- the lower electrode 25 is made of a metal film such as tungsten.
- the surface electrode is made of, for example, Au, and is made of a conductive thin film having a thickness of about 10 nm to 15 nm.
- the materials of the lower electrode 25 and the surface electrode 27 are not limited to the materials described above.
- the lower electrode 25 and the surface electrode 27 may each be a single layer or multiple layers.
- the strong electric field drift layer 26 includes at least a grain (semiconductor crystal) 261, a silicon oxide film 262, a silicon microcrystal 263, and a silicon oxide film 264.
- the grain 261, the silicon oxide film 262, the silicon microcrystal (semiconductor microcrystal) 263, and the silicon oxide film 264 are provided between the lower electrode 25 and the surface electrode 27.
- the grains 261 are made of polycrystalline silicon and arranged in a columnar shape on the surface side of the lower electrode 25.
- the grain 261 is provided with a thin silicon oxide film 262 on the surface thereof.
- a number of nanometer order silicon microcrystals 263 are interposed between each grain 261.
- Each silicon microcrystal 263 has a large number of silicon oxide films 264 formed on the surface thereof.
- This silicon oxide film 264 is an insulating film having a film thickness smaller than the crystal grain size of the silicon microcrystal 263.
- Each grain 261 extends in the thickness direction of the lower electrode 25. That is, each grain 261 extends along the thickness direction of the rear plate 11.
- the control unit 5 a controls the driving power source Vps so that the surface electrode 27 and the lower electrode have a potential higher than that of the lower electrode 25.
- a drive voltage is applied between the two.
- a driving voltage is applied between the surface electrode 27 and the lower electrode 25
- electrons are injected from the lower electrode 25 into the strong electric field drift layer 26.
- the electrons injected into the strong electric field drift layer 26 drift and are then emitted through the surface electrode 27.
- electrons can also be emitted from the electron source 2 by applying a low voltage of about 10 to 20 V to the driving power source Vps between the surface electrode 27 and the lower electrode 25.
- the electron source 2 of the present embodiment is characterized in that the electron emission characteristic is low in vacuum degree dependency, and a popping phenomenon does not occur during electron emission, and electrons can be stably emitted with high electron emission efficiency. Have.
- the electron source described above emits electrons as described below. That is, a voltage is applied between the surface electrode 27 and the lower electrode 25 so that the surface electrode 27 has a higher potential than the lower electrode 25.
- a voltage is applied to the lower electrode 25
- electrons e ⁇ are injected from the lower electrode 25.
- most of the electric field generated in the strong electric field drift layer 26 is applied to the silicon oxide film 264. Therefore, the injected electron e ⁇ receives a force directed to the arrow in FIG. 2 due to the strong electric field generated in the silicon oxide film 264.
- the electron e ⁇ that has received the force toward the arrow drifts in the direction of the arrow in the region between the grains 261 of the strong electric field drift layer 26 toward the surface.
- the drifted electron e ⁇ passes through the surface electrode 27 and is emitted.
- the electrons e ⁇ injected from the lower electrode 25 are almost scattered by the silicon microcrystal 263, and are accelerated and drifted by the electric field generated in the silicon oxide film 264. Electrons e ⁇ are emitted through the surface electrode 27. This is the so-called ballistic electron emission phenomenon. Further, the heat generated in the strong electric field drift layer 26 is released through the grains 261. Therefore, no popping phenomenon occurs when electrons are emitted. Thereby, electrons can be stably emitted.
- the silicon oxide film 264 constitutes an insulating film, and this insulating film is formed by an oxidation process.
- the insulating film can be formed by a nitriding process instead of the oxidation process.
- a silicon nitride film is formed as an insulating film.
- the insulating film can be formed by an oxynitriding process instead of the oxidation process.
- a silicon oxynitride film is formed as an insulating film instead of the silicon oxide film 262 and the silicon oxide film 264.
- the electron source 2 is directly formed on one surface side of the rear plate 11 made of a glass substrate.
- an electron source composed of a silicon substrate and an ohmic electrode on the back side of the silicon substrate can also be employed.
- Such an electron source is also arranged on the one surface side of the rear plate 11.
- the control device 5 described above includes a drive power supply Vps, an anode electrode power supply Va, and a control means 5a.
- the driving power source Vps is configured to apply a voltage between the surface electrode 27 and the lower electrode 25 of the electron source 2.
- the anode electrode power supply Va is configured to apply a voltage between the anode electrode 3 and the surface electrode 27 of the electron source 2.
- the control means 5a comprises a microcomputer or the like, and this microcomputer controls each of the drive power source Vps and the anode electrode power source Va.
- the control means 5a controls the drive power source Vps to apply a drive voltage to the electron source 2 and controls the anode electrode power source Va so that electrons having an energy distribution having peak energy are emitted from the electron source 2.
- an emission voltage is applied between the anode electrode 3 and the electron source 2.
- the drive voltage and the emission voltage are such that the peak energy of the energy distribution of electrons is larger than the excitation energy of xenon gas, which is a gas sealed in the hermetic container 1, and smaller than the ionization energy of xenon gas. Is set. That is, the drive voltage is set so that the peak energy of the electron energy distribution is larger than the excitation energy of the xenon gas and smaller than the ionization energy of the xenon gas.
- the control means 5a controls the drive power supply Vps to adjust the voltage between the surface electrode 27 and the lower electrode 25, so that the gas is excited without being discharged.
- the control device 5 controls the driving power source Vps so that the surface electrode 27 and the lower electrode have a higher potential than the potential of the lower electrode 25.
- a drive voltage is applied between the two.
- the control device 5 controls the anode electrode power source Va so that the anode electrode 3 has a higher potential than the potential of the surface electrode 27 of the electron source. 27, an emission voltage is applied. Therefore, the electrons e ⁇ emitted from the electron source 2 are subjected to a force by the electric field generated between the anode electrode 3 and the surface electrode 27.
- the electron e ⁇ is moved toward the anode electrode 3 by receiving a force, and thereby collides with a xenon atom existing between the anode electrode 3 and the surface electrode 27.
- the energy obtained by the electron emitted from the electron source 2 by the electric field between the anode electrode 3 and the surface electrode 27 is the electric field strength between the anode electrode 3 and the surface electrode 27 and the average movement of electrons in the gas.
- the electric field strength depends on the voltage applied between the anode electrode 3 and the surface electrode 27 and the distance between the anode electrode 3 and the surface electrode 27.
- the mean free path depends on the type of gas in the hermetic container 1 and the gas pressure. In this embodiment, the gas pressure is set to 5 kPa, and the mean free path of electrons is short.
- the energy obtained by the electric field between the anode electrode 3 and the surface electrode 27 by the electrons emitted from the electron source 2 is The peak energy of the energy distribution of electrons emitted from the electron source 2 is small. Therefore, the energy distribution of electrons emitted from the electron source 2 is slightly shifted to the high energy side from the energy distribution of electrons colliding with the gas.
- a voltage of 20 V is applied between the surface electrode 27 and the lower electrode 25 of the electron source 2 so that the surface electrode 27 has a higher potential than the potential of the lower electrode 25.
- the electron source As a voltage of 20 V is applied between the surface electrode 27 and the lower electrode 25, the electron source has a peak energy with an energy distribution that is larger than the excitation energy of the xenon gas and smaller than the ionization energy of the xenon gas. Emits electrons.
- the electrons emitted from the electron source have a peak energy of an electron energy distribution of about 10 eV.
- the control device 5 applies a voltage between the surface electrode 27 and the lower electrode 25.
- the electron source that receives the voltage emits electrons having a peak energy with an energy distribution that is larger than the excitation energy of the gas and smaller than the ionization energy of the gas. This electron is indicated by an arrow 500 in FIG.
- the emitted electrons are excited without discharging the gas filled in the hermetic container 1.
- the excited gas emits excitation light defined as first light.
- This first light is indicated by arrow 501 in FIG.
- the emitted first light is converted by the phosphor layer 4 into second light having a wavelength longer than that of the first light.
- the second light is emitted from the phosphor layer 4.
- the light emitting device having this configuration is configured to emit the second light when a low voltage is applied between the surface electrode 27 and the lower electrode 25. Therefore, the light emitting device having this configuration is configured to emit light with lower power than the light emitting device configured to discharge gas and emit light. Therefore, a light emitting device with low power consumption and high light emission efficiency can be obtained. Further, the electron source 2 and the phosphor layer 4 are not damaged by the discharge plasma ions. Therefore, a long-life light emitting device can be obtained.
- the distance between the electron source 2 and the anode electrode 3 is 1 cm larger than the Paschen minimum. Increasing the distance between the electron source 2 and the anode electrode 3 to be larger than the Paschen minimum makes it difficult to cause gas discharge.
- the interval between the electron source 2 and the anode electrode 3 is not limited to 1 cm.
- a ballistic electron surface emission type electron source is provided as the electron source 2.
- the ballistic electron surface emission electron source can operate stably even in a gas, and can emit electrons having an initial energy of 8.44 eV or more, which is an excitation energy of xenon gas. That is, the initial energy of electrons emitted from the ballistic electron surface emission type electron source can be emitted as an initial energy higher than the initial energy of electrons emitted from the Spindt type electron source as the electron source.
- a light emitting device including a ballistic electron surface emission type electron source as the electron source 2 can be driven at a lower voltage than a light emitting device including a Spindt type electron source, thereby obtaining a light emitting device with low power consumption. It is done.
- xenon gas is sealed inside the airtight container 1.
- This xenon gas is set to have a pressure of 5 kPa.
- the pressure of this xenon gas is not limited to 5 kPa.
- 3 (a) to 3 (c) show the results of measuring the emission intensity of ultraviolet light emitted from a light emitting device in which xenon gas having various pressures is sealed, using a photomultiplier tube.
- the light emitting device used in this experiment includes an airtight container 1, a gas, an electron source 2, an anode electrode 3, and a control device 5. That is, the light emitting device used in this experiment does not include the phosphor layer 4.
- the control device 5 is configured to apply a voltage of 100 V between the anode electrode 3 and the surface electrode 27.
- the control device 5 is configured to apply a pulse voltage of 20 V between the surface electrode 27 and the lower electrode 25 so that the surface electrode 27 has a higher potential than that of the lower electrode 25.
- the discharge of the xenon gas can be prevented by sealing the xenon gas in the hermetic container so as to have a pressure in the range of 2 kPa to 20 kPa, and light emission. Increases efficiency.
- the hermetic container 1 in which xenon gas having a pressure of 100 Pa and 1 kPa was sealed, discharge was generated, and therefore measurement using a photomultiplier tube was not performed.
- FIG. 4 shows another example in which the ultraviolet light emission intensity is measured with a photomultiplier tube.
- the anode electrode 3 is provided 1 cm away from the surface electrode 27.
- the hermetic container 1 is filled so that the xenon gas has a pressure of 5 kPa.
- the anode voltage is 0 to 180V, no discharge occurs. That is, it can be seen that discharge can be prevented by setting the converted electric field strength in the range of 0 to 3.6 (V / mPa).
- These converted electric field strengths are defined by E / p using the electric field strength E (v / m) between the anode electrode 3 and the surface electrode 27 of the electron source 2 and the gas pressure p (Pa).
- FIG. 4 shows another example in which the ultraviolet light emission intensity is measured with a photomultiplier tube.
- the anode electrode 3 is provided 1 cm away from the surface electrode 27.
- the hermetic container 1 is filled so that the xenon gas has a pressure of 5 kP
- xenon gas which is a kind of rare gas
- the hermetic container 1 is filled with a gas having a pressure of 5 kPa so that excimer can be produced. Therefore, excimers (excited molecules) are generated in the hermetic container 1 by supplying electrons from the electron source 2 into the hermetic container 1. That is, the Stokes loss in the phosphor of the phosphor layer 4 can be reduced, whereby a light emitting device with improved luminous efficiency can be obtained.
- control means 5a of this embodiment sends a control signal to the drive power supply Vps.
- the drive power supply Vps that has received the control signal applies a rectangular-wave drive voltage between the surface electrode 27 and the lower electrode 25 so that the surface electrode 27 has a higher potential than the potential of the lower electrode 25. That is, the drive power supply Vps that has received the control signal supplies the electron source 2 with electrons in the hermetic container 1 and the electrons in the hermetic container 1 by applying a rectangular-wave drive voltage. Are alternately provided with an off state in which the switching is prohibited for a predetermined period. As a result, the electron source 2 that has received the rectangular wave driving voltage periodically supplies electrons into the hermetic container 1.
- the control device 5 applies a rectangular wave voltage between the surface electrode 27 and the lower electrode 25 so that the surface electrode 27 has a higher potential than the potential of the lower electrode 25.
- the electron source 2 periodically supplies electrons into the hermetic container 1.
- the light-emitting device of this embodiment is comprised so that the control apparatus 5 may drive the electron source 2 intermittently. Therefore, with this configuration, a light-emitting device that is driven with lower power consumption than a light-emitting device that includes the control device 5 that is configured to continuously drive the electron source 2 can be obtained.
- FIG. 6 shows the results of measuring the change over time of the emission intensity of the ultraviolet light emitted from the light emitting device.
- This measurement was performed by a light emitting device including an airtight container 1, a xenon gas, an electron source 2, an anode electrode 3, and a control device 5, and no phosphor layer 4.
- the control device 5 is configured to apply a pulse voltage of 20 V between the surface electrode 27 and the lower electrode 25 so that the surface electrode 27 has a higher potential than that of the lower electrode 25.
- ON in FIG. 6 indicates a period during which a pulse voltage is applied to the electron source 2.
- 6 indicates a period in which the pulse voltage is not applied to the electron source 2.
- FIG. 6 shows that afterglow is obtained for about 20 ⁇ sec after the application of the pulse voltage to the electron source 2 is stopped. In short, it can be seen that the afterglow period is about 20 ⁇ sec.
- FIG. 7 shows the off period time (ie, off time) when the frequency and on-duty of the rectangular wave voltage are changed.
- the horizontal axis represents frequency
- the vertical axis represents off time.
- “A” indicates the relationship between the frequency and the off time when the on-duty is 1%.
- “B” indicates the relationship between the frequency and the off time when the on-duty is 10%.
- “C” indicates the relationship between the frequency and the off time when the on-duty is 50%.
- the electron source 2 supplies electrons even during the off period. Therefore, the gas in the hermetic container 1 is excited by electrons even in the off period, and thereby the excitation of ultraviolet rays is continued even in the off period. Therefore, a light emitting device with improved luminous efficiency can be obtained.
- the electron source 2 includes the lower electrode 25, the surface electrode 27 facing the lower electrode 25, and the strong electric field drift layer 26 interposed between the lower electrode 25 and the surface electrode 27. And a ballistic electron surface emitting electron source. Therefore, the electron source 2 is applied with a forward bias voltage and a reverse bias voltage having a potential opposite to the forward bias voltage from the control device 5. That is, the control device 5 is configured to apply a forward bias voltage and a reverse bias voltage between the surface electrode 27 and the lower electrode 25. When a forward bias voltage is applied to the electron source 2, the electron source 2 supplies electrons into the hermetic container 1. As the electron source 2 receives a forward bias voltage, electrons are trapped in traps in the strong electric field drift layer 26.
- the control device 5 alternately gives the electron source 2 the forward period in which the forward bias voltage is applied and the reverse period in which the reverse bias voltage is applied. Thereby, relaxation of the electric field caused by electrons trapped in the trap can be suppressed. Thereby, the lifetime of the electron source 2 can be extended.
- control device 5 is configured to apply a rectangular wave emission voltage synchronized with the rectangular wave drive voltage between the anode electrode 3 and the electron source 2.
- a light emitting device configured to emit light with lower power than the light emitting device configured to apply a constant voltage between the anode electrode 3 and the electron source 2 is obtained.
- control device 5 may apply a rectangular wave emission voltage between the anode electrode 3 and the electron source 2 so that the potential of the anode electrode 3 has a higher potential than that of the electron source 2. More preferred. Accordingly, it is preferable that the voltage value of the discharge voltage in the on period is set to have a voltage value lower than the voltage value of the discharge voltage in the off period. Thereby, the electron source 2 can be operated with low power consumption. Further, the electrons can be continuously moved to the anode electrode 3 in the off period.
- xenon gas is used as the gas sealed in the hermetic container 1, but the gas sealed in the hermetic container 1 is not limited to xenon gas.
- helium gas or neon gas is used.
- Argon gas, krypton gas, nitrogen gas, or a mixed gas thereof may be used.
- each said structure can be combined separately, respectively.
Landscapes
- Vessels And Coating Films For Discharge Lamps (AREA)
- Circuit Arrangements For Discharge Lamps (AREA)
- Discharge Lamps And Accessories Thereof (AREA)
- Cold Cathode And The Manufacture (AREA)
- Discharge Lamp (AREA)
Abstract
Description
Claims (10)
- 発光装置であって、
透光性を有している気密容器と、
前記気密容器内に封入されており、電子によって励起されて真空紫外~可視光域の波長を有する第1の光を放出するように構成されているガスと、
前記気密容器内部に配置されており、第1の駆動電極と第2の駆動電極とを有しており、前記第1の駆動電極と前記第2の駆動電極との間に駆動電圧が印加されることにより前記電子を放出するように構成された電子源と、
前記気密容器内部に配置されており、前記電子源と対向して配置されたアノード電極と、
前記第1の駆動電極と前記第2の駆動電極との間に前記駆動電圧を印加するように構成されており、且つ、前記電子が前記アノード電極に移動するように前記電子源と前記アノード電極との間に放出電圧を印加するように構成された制御装置と、
前記気密容器の内部に設けられており、前記第1の光によって励起されて、前記第1の光が有する波長と異なる波長を有する第2の光を放出するように構成された蛍光体とを備え、
前記電子源は、前記放出電圧が印加されることによりピークエネルギーを持ったエネルギー分布を有する電子を放出するように構成されており、
前記ピークエネルギーは、前記ガスの励起エネルギーよりも大きく、前記ガスのイオン化エネルギーよりも小さいことを特徴とする発光装置。 - 前記ガスは、2kPa~20kPaの圧力を有するように前記気密容器に封入されていることを特徴とする請求項1に記載の発光装置。
- 前記ガスは、希ガスであり、所定の圧力を有するように前記気密容器に封入されており、
前記所定の圧力は、前記ガスが励起されることによりエキシマを形成するように設定されていることを特徴とする請求項2に記載の発光装置。 - 前記制御装置は、前記電子源に矩形波の前記駆動電圧を印加するように構成されており、これにより前記電子源に前記電子をオン期間にわたって放出させるオン状態と、前記電子源が前記電子を放出するのをオフ期間にわたって禁止するオフ状態とを交互に与えることを特徴とする請求項1に記載の発光装置。
- 前記ガスは、前記電子源が前記オン状態から前記オフ状態に切り替わったときから、残光期間にわたって残光する特性を有しており、
前記オフ期間は、前記残光期間よりも短く設定されていることを特徴とする請求項4に記載の発光装置。 - 前記電子源は、弾道電子面放出型電子源で定義され、当該弾道電子面放出型電子源は、下部電極と、表面電極と、強電界ドリフト層とを有し、
前記表面電極は、前記下部電極に対向して配置されており、前記表面電極は、前記第1の駆動電極を定義し、前記下部電極は、前記第2の駆動電極を定義し、
前記強電界ドリフト層は、前記表面電極と前記下部電極との間に配置されており、ナノメータオーダの多数の半導体微結晶及び各半導体微結晶それぞれの表面に形成されており半導体微結晶の結晶粒径よりも小さな膜厚の多数の絶縁膜とを有し、
前記制御装置は、交流でありかつ前記矩形波の駆動電圧を前記電子源に印加するように構成されていることを特徴とする請求項4に記載の発光装置。 - 前記制御装置は、前記駆動電圧と同期した矩形波の前記放出電圧を前記アノード電極と前記電子源との間に印加するように構成されていることを特徴とする請求項4に記載の発光装置。
- 前記制御装置は、前記アノード電極の電位が前記電子源の電位よりも高くなるように前記放電電圧を前記アノード電極と前記電子源との間に印加するように構成されており、
前記オフ期間における放電電圧の電圧値は、前記オン期間における放電電圧の電圧値よりも低いことを特徴とする請求項7に記載の発光装置。 - 前記電子源と前記アノード電極との間隔は、パッシェンミニマムよりも大きいことを特徴とする請求項1に記載の発光装置。
- 前記ガスは、キセノンガスからなり、
前記電子源は、前記エネルギー分布のピークエネルギーは、8.44eV以上であり、12.13eV以下であることを特徴とする請求項1に記載の発光装置。
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US13/002,851 US20110163686A1 (en) | 2008-07-09 | 2009-07-08 | Lighting device |
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JP2011154906A (ja) * | 2010-01-27 | 2011-08-11 | Panasonic Electric Works Co Ltd | 発光装置 |
JP2011154905A (ja) * | 2010-01-27 | 2011-08-11 | Panasonic Electric Works Co Ltd | 発光装置 |
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JP2011175800A (ja) * | 2010-02-23 | 2011-09-08 | Panasonic Electric Works Co Ltd | 電界放射型電子源およびそれを用いた発光装置 |
JP5346310B2 (ja) * | 2010-03-26 | 2013-11-20 | パナソニック株式会社 | 発光装置 |
CN103972028A (zh) * | 2013-01-28 | 2014-08-06 | 海洋王照明科技股份有限公司 | 场发射灯 |
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