JPS5633841A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5633841A JPS5633841A JP10984879A JP10984879A JPS5633841A JP S5633841 A JPS5633841 A JP S5633841A JP 10984879 A JP10984879 A JP 10984879A JP 10984879 A JP10984879 A JP 10984879A JP S5633841 A JPS5633841 A JP S5633841A
- Authority
- JP
- Japan
- Prior art keywords
- injected
- resist
- nitrogen
- polysilicon film
- passivation film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Formation Of Insulating Films (AREA)
- Bipolar Transistors (AREA)
- Weting (AREA)
Abstract
PURPOSE:To facilitate the treatment process of a passivation film by injecting nitrogen ions in the predetermined region of a surface layer including Si provided on a semiconductor substrate wherein the region where the nitrogen ions are not injected is selectively eliminated. CONSTITUTION:A polysilicon film 15 containing oxygen is provided as a passivation film on a silicon substrate 11 and a photo resist 16 is provided on the polysilicon film 15 with a predetermined pattern. A nitrogen ions are injected in the surfaces of the polysilicon film 15 and photo resist 16 to form a layer 17 containing nitrogen on the surfaces. Next, the resist 16 is removed and the part where nitrogen is not injected by the resist 16 is selectively removed by etchants (For example, H2O2: HF:NH4F=6:1:10) to form an aperture 18. In this way, a special mask will be unnecessary at the time of etching and unnecessary etching due to the defect of a mask pattern in case of a mesa type element or the like will be eliminated and the treatment process of the passivation film will be facilitated.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10984879A JPS5633841A (en) | 1979-08-29 | 1979-08-29 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10984879A JPS5633841A (en) | 1979-08-29 | 1979-08-29 | Manufacture of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5633841A true JPS5633841A (en) | 1981-04-04 |
JPS6227539B2 JPS6227539B2 (en) | 1987-06-15 |
Family
ID=14520718
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10984879A Granted JPS5633841A (en) | 1979-08-29 | 1979-08-29 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5633841A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58142529A (en) * | 1982-02-18 | 1983-08-24 | Mitsubishi Electric Corp | Manufacture of semiconductor element |
JPS58147150A (en) * | 1982-02-26 | 1983-09-01 | Fujitsu Ltd | Manufacture of semiconductor device |
KR101524824B1 (en) * | 2009-01-21 | 2015-06-03 | 삼성전자주식회사 | method of forming pattern structure |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53114685A (en) * | 1977-03-17 | 1978-10-06 | Toshiba Corp | Manufacture for semiconductor device |
-
1979
- 1979-08-29 JP JP10984879A patent/JPS5633841A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53114685A (en) * | 1977-03-17 | 1978-10-06 | Toshiba Corp | Manufacture for semiconductor device |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58142529A (en) * | 1982-02-18 | 1983-08-24 | Mitsubishi Electric Corp | Manufacture of semiconductor element |
JPS58147150A (en) * | 1982-02-26 | 1983-09-01 | Fujitsu Ltd | Manufacture of semiconductor device |
JPH0371771B2 (en) * | 1982-02-26 | 1991-11-14 | Fujitsu Ltd | |
KR101524824B1 (en) * | 2009-01-21 | 2015-06-03 | 삼성전자주식회사 | method of forming pattern structure |
Also Published As
Publication number | Publication date |
---|---|
JPS6227539B2 (en) | 1987-06-15 |
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