JP4829143B2 - 温度検出回路 - Google Patents
温度検出回路 Download PDFInfo
- Publication number
- JP4829143B2 JP4829143B2 JP2007037234A JP2007037234A JP4829143B2 JP 4829143 B2 JP4829143 B2 JP 4829143B2 JP 2007037234 A JP2007037234 A JP 2007037234A JP 2007037234 A JP2007037234 A JP 2007037234A JP 4829143 B2 JP4829143 B2 JP 4829143B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- circuit
- power supply
- output
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000001514 detection method Methods 0.000 title claims description 61
- 230000007257 malfunction Effects 0.000 claims description 19
- 239000003990 capacitor Substances 0.000 claims description 14
- 230000002265 prevention Effects 0.000 claims description 12
- 230000004913 activation Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 3
- 230000000630 rising effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000009966 trimming Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/007—Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
- G01K7/20—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electronic Switches (AREA)
- Semiconductor Integrated Circuits (AREA)
Description
まず、第1の実施形態の温度検出回路について説明する。図1は第1の実施形態の温度検出回路の回路図である。
次に、第2の実施形態の温度検出回路について説明する。図2は第2の実施形態の温度検出回路の回路図である。
次に、第3の実施形態の温度検出回路について説明する。図3は第3の実施形態の温度検出回路の回路図である。
次に、第4の実施形態の温度検出回路について説明する。図4は第4の実施形態の温度検出回路の回路図である。
101、102 ・・・ コンデンサ
111、112 ・・・ MOSトランジスタ
121 ・・・ 定電流源
200 ・・・ 温度センサ回路
300 ・・・ 基準電圧回路
400 ・・・ コンパレータ
500 ・・・ 正の電源端子
600 ・・・ 負の電源端子
700 ・・・ 出力端子
800 ・・・ 制御端子
Claims (1)
- ある温度以上であるか否かによって、出力論理を切り替える動作をする温度検出回路において、
温度に応じて出力電圧が変化する温度センサ回路と、
基準電圧を出力する基準電圧回路と、
前記温度センサ回路の出力電圧と前記基準電圧とを比較して、所定の温度を境に反転する信号を出力するコンパレータと、
前記コンパレータの出力端子に接続した誤動作防止回路と、を備え、
前記誤動作防止回路は、
電源端子と接地端子との間に設けられた定電流源と容量の直列回路と、
前記電源端子と前記コンパレータの出力端子との間に設けられ、ゲートを前記定電流源と前記容量の接続点に接続されたMOSトランジスタと、で構成され、
前記直列回路は、電源起動後の所定時間において前記MOSトランジスタをオンすることによって、前記コンパレータの出力端子を前記電源端子の電圧にする、
ことを特徴とする温度検出回路。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007037234A JP4829143B2 (ja) | 2007-02-17 | 2007-02-17 | 温度検出回路 |
CN2008100055687A CN101246059B (zh) | 2007-02-17 | 2008-02-15 | 温度检测电路 |
KR1020080013955A KR101229652B1 (ko) | 2007-02-17 | 2008-02-15 | 온도 검출 회로 |
US12/070,211 US7795950B2 (en) | 2007-02-17 | 2008-02-15 | Temperature detection circuit |
TW097105388A TWI431258B (zh) | 2007-02-17 | 2008-02-15 | Temperature detection circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007037234A JP4829143B2 (ja) | 2007-02-17 | 2007-02-17 | 温度検出回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008202997A JP2008202997A (ja) | 2008-09-04 |
JP4829143B2 true JP4829143B2 (ja) | 2011-12-07 |
Family
ID=39706622
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007037234A Expired - Fee Related JP4829143B2 (ja) | 2007-02-17 | 2007-02-17 | 温度検出回路 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7795950B2 (ja) |
JP (1) | JP4829143B2 (ja) |
KR (1) | KR101229652B1 (ja) |
CN (1) | CN101246059B (ja) |
TW (1) | TWI431258B (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4863818B2 (ja) * | 2006-08-29 | 2012-01-25 | セイコーインスツル株式会社 | 温度センサ回路 |
JP2009058438A (ja) * | 2007-08-31 | 2009-03-19 | Toshiba Corp | 温度検出回路 |
JP5034919B2 (ja) * | 2007-12-13 | 2012-09-26 | 富士電機株式会社 | 温度センサ回路 |
JP2010151458A (ja) * | 2008-12-24 | 2010-07-08 | Seiko Instruments Inc | 温度検出回路 |
DE102009023354B3 (de) * | 2009-05-29 | 2010-12-02 | Austriamicrosystems Ag | Schaltungsanordnung und Verfahren zur Temperaturmessung |
JP5389635B2 (ja) * | 2009-12-25 | 2014-01-15 | セイコーインスツル株式会社 | 温度検出システム |
US8995218B2 (en) * | 2012-03-07 | 2015-03-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
DE102013226763A1 (de) * | 2013-12-19 | 2015-06-25 | Bayerische Motoren Werke Aktiengesellschaft | Sicherheitsschaltungsanordnung für eine elektrische Antriebseinheit |
JP6450184B2 (ja) * | 2014-12-24 | 2019-01-09 | エイブリック株式会社 | 過熱検出回路及び半導体装置 |
CN110782857A (zh) * | 2019-11-15 | 2020-02-11 | Tcl华星光电技术有限公司 | 一种显示装置及其驱动方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50107318A (ja) * | 1974-02-01 | 1975-08-23 | ||
JPH04314078A (ja) * | 1991-04-12 | 1992-11-05 | Matsushita Electric Ind Co Ltd | 温度異常検出装置 |
DE19841202C1 (de) * | 1998-09-09 | 2000-03-02 | Siemens Ag | Temperatursensor |
JP3823622B2 (ja) * | 1999-08-05 | 2006-09-20 | 富士電機デバイステクノロジー株式会社 | 過熱保護回路 |
US6184746B1 (en) * | 1999-08-13 | 2001-02-06 | Advanced Micro Devices, Inc. | PLL power supply filter (with pump) having a wide voltage range and immunity to oxide overstress |
JP2001165783A (ja) * | 1999-12-14 | 2001-06-22 | Matsushita Electric Ind Co Ltd | 温度検出回路 |
KR100560652B1 (ko) * | 2003-01-14 | 2006-03-16 | 삼성전자주식회사 | 전원 전압과 온도 변화에 둔감한 온도 검출 회로 |
CN2677895Y (zh) * | 2003-09-03 | 2005-02-09 | 上海复旦微电子股份有限公司 | 一种温度测量电路 |
JP2005134145A (ja) * | 2003-10-28 | 2005-05-26 | Seiko Instruments Inc | 温度センサ回路 |
JP4669292B2 (ja) * | 2005-01-20 | 2011-04-13 | 株式会社日立製作所 | 半導体装置 |
-
2007
- 2007-02-17 JP JP2007037234A patent/JP4829143B2/ja not_active Expired - Fee Related
-
2008
- 2008-02-15 CN CN2008100055687A patent/CN101246059B/zh active Active
- 2008-02-15 US US12/070,211 patent/US7795950B2/en not_active Expired - Fee Related
- 2008-02-15 KR KR1020080013955A patent/KR101229652B1/ko active IP Right Grant
- 2008-02-15 TW TW097105388A patent/TWI431258B/zh active
Also Published As
Publication number | Publication date |
---|---|
JP2008202997A (ja) | 2008-09-04 |
CN101246059A (zh) | 2008-08-20 |
US20080198899A1 (en) | 2008-08-21 |
US7795950B2 (en) | 2010-09-14 |
KR101229652B1 (ko) | 2013-02-04 |
KR20080077050A (ko) | 2008-08-21 |
CN101246059B (zh) | 2012-07-04 |
TW200844414A (en) | 2008-11-16 |
TWI431258B (zh) | 2014-03-21 |
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