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Sixt et al., 1974 - Google Patents

Determination of cesium distributions in oxides of MOS structures by photoinjection studies

Sixt et al., 1974

Document ID
8660112878878233801
Author
Sixt G
Schulz M
Goetzberger A
Publication year
Publication venue
Applied physics

External Links

Snippet

The photoinjection technique of Berglund and Powell has been used for the determination of cesium profiles in the oxide films of MOS-structures. Measurements of photocurrent as a function of the applied voltage provide information on the distribution of charges in the …
Continue reading at link.springer.com (other versions)

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