Determination of cesium distributions in oxides of MOS structures by photoinjection studies
G Sixt, M Schulz, A Goetzberger - Applied physics, 1974 - Springer
The photoinjection technique of Berglund and Powell has been used for the determination of
cesium profiles in the oxide films of MOS-structures. Measurements of photocurrent as a …
cesium profiles in the oxide films of MOS-structures. Measurements of photocurrent as a …
Determination of cesium distributions in oxides of MOS structures by photoinjection studies
G Sixt, M Schulz, A Goetzberger - Applied Physics, 1974 - ui.adsabs.harvard.edu
The photoinjection technique of Berglund and Powell has been used for the determination of
cesium profiles in the oxide films of MOS-structures. Measurements of photocurrent as a …
cesium profiles in the oxide films of MOS-structures. Measurements of photocurrent as a …
[CITATION][C] Determination of cesium distributions in oxides of MOS structures by photoinjection studies
G Sixt, M Schulz, A Goetzberger - Applied Physics, 1974 - cir.nii.ac.jp
Determination of cesium distributions in oxides of MOS structures by photoinjection studies |
CiNii Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ …
CiNii Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ …
[CITATION][C] Determination of cesium distributions in oxides of MOS structures by photoinjection studies
G Sixt, M Schulz, A Goetzberger - Applied Physics A: Materials Science & …, 1974 - Springer