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- ArticleApril 2006
An indirect current sensing technique for IDDQ and IDDT tests
GLSVLSI '06: Proceedings of the 16th ACM Great Lakes symposium on VLSIPages 235–240https://doi.org/10.1145/1127908.1127964An indirect current sensing technique for IDDQ and IDDT tests is proposed in this paper. This is accomplished by utilizing the pervasive on-chip voltage regulators and thus have little or no impact on CUT's design and its performance. We demonstrate ...
- ArticleSeptember 2005
Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic
SBCCI '05: Proceedings of the 18th annual symposium on Integrated circuits and system designPages 62–67https://doi.org/10.1145/1081081.1081103In this paper, we propose a new approach for using Built-in Current Sensor (BICS) to detect not only transient upsets in sequential logic but also in combinational circuits. In this approach, the BICS is connected in the design bulk to increase its ...
- ArticleDecember 2000
A high-speed IDDQ sensor implementation
This paper presents an effective IDDQ sensor design implemented using a 0.35 /spl mu/m process. A straightforward feedback scheme minimizes the effect of process variations. Independent structures permit one to monitor the basic characteristics of the ...
- ArticleJuly 2000
A Compact Built-In Current Sensor for IDDQ Testing
In this paper a simple to implement, compact, build-in current sensor for IDDQ testing of CMOS VLSI circuits based on current mirroring techniques is proposed. This sensor can attain small detection times and can be used for both on-line and off-line ...
- articleMay 2000
Design and Realization of a Built-In Current Sensor for I _DDQ Testing and Power Dissipation Measurement
Analog Integrated Circuits and Signal Processing (KLU-ALOG), Volume 23, Issue 2Pages 117–126https://doi.org/10.1023/A:1008341925559Built-in current sensor (BICS) is known to enhance test accuracy, defect coverage of quiescent current (I_{DDQ}) testing method in CMOS VLSI circuits. For new deep-submicron technologies, BICSs become essential for accurate and practical I_{DDQ} ...
- ArticleNovember 1998
100MHz IDDQ Sensor Design with 1(A Resolution for BIST Applications
This paper presents a high-speed, high-resolution IDDQ (power supply quiescent current) sensor design for BIST (Built-in Self Test) applications. The voltage drop is amplified before comparison with a reference voltage to improve sensing resolution. For ...
- ArticleNovember 1997
A High-Speed Low-Voltage Built-In Current Sensor
This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to ...
- articleOctober 1997
Incorporating I_DDQ Testing with BIST forImproved Coverage: An Experimental Study
Journal of Electronic Testing: Theory and Applications (JELT), Volume 11, Issue 2Pages 147–156https://doi.org/10.1023/A:1008218422533In this paper we present an experimental study on the effectiveness of incorporating at-speed I_DDQ testing with traditional BIST for improved test coverage. The high speed I_DDQ testing is conducted using the differential built-in on-chip current ...