Cited By
View all- Dang KAhmed AAbdallah ATran X(2020)TSV-OCT: A Scalable Online Multiple-TSV Defects Localization for Real-Time 3-D-IC SystemsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2019.294887828:3(672-685)Online publication date: 1-Mar-2020
- Chennakesavulu MJayachandra Prasad TSumalatha V(2018)Improved Performance of Error Controlling Codes Using Pass Transistor LogicCircuits, Systems, and Signal Processing10.1007/s00034-017-0596-437:3(1145-1161)Online publication date: 1-Mar-2018
- Aghaei BKhademzadeh AReshadi MBadie K(2017)Link TestingJournal of Electronic Testing: Theory and Applications10.1007/s10836-017-5646-033:2(209-225)Online publication date: 1-Apr-2017
- Show More Cited By