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research-article

Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra

Published: 01 November 2015 Publication History

Abstract

A new method is presented for simulating of Transition Delay Faults (TDF) based on the parallel exact critical path tracing for Stuck-at Fault (SAF) analysis and subsequent TDF reasoning. A method is proposed to extend the TDF model, traditionally considered as a class of robustly tested delay faults, to a class of TDFs with extended detection conditions. Three known fault classes of delay fault sensitization are considered: robust, non-robust and functional sensitization of delay faults. Additionally, a new fourth fault class is introduced, called non-robust functionally sensitized delay fault. A novel fault analysis algorithm based on 7-valued algebra is presented, which delivers the fault coverage for all mentioned four types of TDFs.

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  1. Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra

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    Published In

    cover image Microprocessors & Microsystems
    Microprocessors & Microsystems  Volume 39, Issue 8
    November 2015
    718 pages

    Publisher

    Elsevier Science Publishers B. V.

    Netherlands

    Publication History

    Published: 01 November 2015

    Author Tags

    1. 7-valued algebra
    2. Critical path fault tracing
    3. Non-robust and functional sensitization
    4. Transition delay faults

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