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research-article

Parallel X-fault simulation with critical path tracing technique

Authors:

Sergei Devadze,

Artur JutmanAuthors Info & Claims

DATE '10: Proceedings of the Conference on Design, Automation and Test in Europe

Pages 879 - 884

Published: 08 March 2010 Publication History

Abstract

In this paper, a new very fast fault simulation method to handle the X-fault model is proposed. The method is based on a two-phase procedure. In the first phase, a parallel exact critical path fault tracing is used to determine all the detected stuck-at faults in the circuit, and in the second phase a postprocess is launched which will determine the detectability of X-faults.

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Cited By

Gorev MUbar RDevadze SNebel WAtienza D(2015)Fault simulation with parallel exact critical path tracing in multiple core environmentProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2757085(1180-1185)Online publication date: 9-Mar-2015
https://dl.acm.org/doi/10.5555/2755753.2757085
Saltarelli PNiazmand BRaik JGovind VHollstein TJervan GHariharan RIvanov AMarculescu DPande PFlich JPattabiraman K(2015)A Framework for Combining Concurrent Checking and On-Line Embedded Test for Low-Latency Fault Detection in NoC RoutersProceedings of the 9th International Symposium on Networks-on-Chip10.1145/2786572.2788713(1-8)Online publication date: 28-Sep-2015
https://dl.acm.org/doi/10.1145/2786572.2788713
Kõusaar JUbar RDevadze SRaik J(2015)Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebraMicroprocessors & Microsystems10.1016/j.micpro.2015.05.00339:8(1130-1138)Online publication date: 1-Nov-2015
https://dl.acm.org/doi/10.1016/j.micpro.2015.05.003
Show More Cited By

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Information & Contributors

Information

Published In

cover image ACM Conferences

DATE '10: Proceedings of the Conference on Design, Automation and Test in Europe

March 2010

1868 pages

ISBN:9783981080162

General Chairs:
Giovanni De Micheli
EPF Lausanne, CH
,
Bashir Al-Hashimi
University of Southampton, UK
,
Program Chairs:
Wolfgang Mueller
University of Paderborn, SE
,
Enrico Macii
Politecnico di Torino, IT

Sponsors

EDAA: European Design Automation Association
ECSI
EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
The IEEE Computer Society TTTC
The IEEE Computer Society DATC
The Russian Academy of Sciences: The Russian Academy of Sciences

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European Design and Automation Association

Leuven, Belgium

Publication History

Published: 08 March 2010

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DATE '10

Sponsor:

EDAA
EDAC
SIGDA
The Russian Academy of Sciences

DATE '10: Design, Automation and Test in Europe

March 8 - 12, 2010

Germany, Dresden

Acceptance Rates

Overall Acceptance Rate 518 of 1,794 submissions, 29%

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DATE '25

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Design, Automation and Test in Europe

March 31 - April 2, 2025

Lyon , France

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Cited By

Gorev MUbar RDevadze SNebel WAtienza D(2015)Fault simulation with parallel exact critical path tracing in multiple core environmentProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2757085(1180-1185)Online publication date: 9-Mar-2015
https://dl.acm.org/doi/10.5555/2755753.2757085
Saltarelli PNiazmand BRaik JGovind VHollstein TJervan GHariharan RIvanov AMarculescu DPande PFlich JPattabiraman K(2015)A Framework for Combining Concurrent Checking and On-Line Embedded Test for Low-Latency Fault Detection in NoC RoutersProceedings of the 9th International Symposium on Networks-on-Chip10.1145/2786572.2788713(1-8)Online publication date: 28-Sep-2015
https://dl.acm.org/doi/10.1145/2786572.2788713
Kõusaar JUbar RDevadze SRaik J(2015)Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebraMicroprocessors & Microsystems10.1016/j.micpro.2015.05.00339:8(1130-1138)Online publication date: 1-Nov-2015
https://dl.acm.org/doi/10.1016/j.micpro.2015.05.003
Gorev MUbar REllervee PDevadze SRaik JMin M(2015)Functional self-test of high-performance pipe-lined signal processing architecturesMicroprocessors & Microsystems10.1016/j.micpro.2014.11.00239:8(909-918)Online publication date: 1-Nov-2015
https://dl.acm.org/doi/10.1016/j.micpro.2014.11.002
Peder ATombak M(2011)Finding the description of structure by counting methodProceedings of the 37th international conference on Current trends in theory and practice of computer science10.5555/1946370.1946408(455-466)Online publication date: 22-Jan-2011
https://dl.acm.org/doi/10.5555/1946370.1946408

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