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Tools and devices supporting the pseudo-exhaustive test

Authors:

Sybille Hellebrand,

Hans-Joachim WunderlichAuthors Info & Claims

EURO-DAC '90: Proceedings of the conference on European design automation

Pages 13 - 17

Published: 12 March 1990 Publication History

Abstract

In this paper logical cells and algorithms are presented supporting the design of pseudo-exhaustively testable circuits. The approach is based on real hardware segmentation, instead of path-sensitizing. The developed cells segment the entire circuits into exhaustively testable parts, and the presented algorithms place these cells, under the objective to minimize the hardware overhead.The approach is completely compatible with the usual LSSD-rules. The analysis of the well-known benchmark circuits shows only little additional hardware costs.

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Cited By

Kagaris D(2003)Multiple-Seed TPG StructuresIEEE Transactions on Computers10.1109/TC.2003.125285852:12(1633-1639)Online publication date: 1-Dec-2003
https://dl.acm.org/doi/10.1109/TC.2003.1252858
Kagaris DTragoudas S(2003)LFSR Characteristic Polynomials for Pseudo-Exhaustive TPG with Low Number of SeedsJournal of Electronic Testing: Theory and Applications10.1023/A:102374081161319:3(233-244)Online publication date: 1-Jun-2003
https://dl.acm.org/doi/10.1023/A%3A1023740811613
Kunzmann AMermet J(1994)Test pattern generation hardware motivated by pseudo-exhaustive test techniquesProceedings of the conference on European design automation10.5555/198174.198252(240-245)Online publication date: 23-Sep-1994
https://dl.acm.org/doi/10.5555/198174.198252
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Information & Contributors

Information

Published In

cover image ACM Conferences

EURO-DAC '90: Proceedings of the conference on European design automation

March 1990

659 pages

ISBN:0818620242

General Chair:
Gordon Adshead
ICL, Manchester, UK
,
Program Chair:
Jochen Jess
Eindhoven University of Technology, Eindhoven, The Netherlands

Sponsors

EDAC Association
SIGDA: ACM Special Interest Group on Design Automation

Publisher

IEEE Computer Society Press

Washington, DC, United States

Publication History

Published: 12 March 1990

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Cited By

Kagaris D(2003)Multiple-Seed TPG StructuresIEEE Transactions on Computers10.1109/TC.2003.125285852:12(1633-1639)Online publication date: 1-Dec-2003
https://dl.acm.org/doi/10.1109/TC.2003.1252858
Kagaris DTragoudas S(2003)LFSR Characteristic Polynomials for Pseudo-Exhaustive TPG with Low Number of SeedsJournal of Electronic Testing: Theory and Applications10.1023/A:102374081161319:3(233-244)Online publication date: 1-Jun-2003
https://dl.acm.org/doi/10.1023/A%3A1023740811613
Kunzmann AMermet J(1994)Test pattern generation hardware motivated by pseudo-exhaustive test techniquesProceedings of the conference on European design automation10.5555/198174.198252(240-245)Online publication date: 23-Sep-1994
https://dl.acm.org/doi/10.5555/198174.198252
Chen CYuen JLightner MJess J(1993)Logic partitioning to pseudo-exhaustive test for BIST designProceedings of the 1993 IEEE/ACM international conference on Computer-aided design10.5555/259794.259895(646-649)Online publication date: 7-Nov-1993
https://dl.acm.org/doi/10.5555/259794.259895
Srinivasan RGupta SBreuer MDunlop A(1993)An efficient partitioning strategy for pseudo-exhaustive testingProceedings of the 30th international Design Automation Conference10.1145/157485.164880(242-248)Online publication date: 1-Jul-1993
https://dl.acm.org/doi/10.1145/157485.164880

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