Test pattern generation hardware motivated by pseudo-exhaustive test techniques

Pseudo-exhaustive pattern generators for built-in self-test (BIST) provide high fault coverage of detectable combinational faults with much fewer test vectors than exhaustive generation. In (n, k)-adjacent bit pseudo-exhaustive test sets, all 2^k binary ...

Bounded-exhaustive exploration of test case candidates is a commonly employed approach for test generation in some contexts. Even when small bounds are used for test generation, executing the obtained tests may become prohibitive, despite the time for ...

Two pseudo-exhaustive test pattern generator designs are presented, each capable of exhaustively testing a single segment of a circuit. The generators are reconfigurable and easily controlled by a state machine to implement full pseudo-exhaustive test.