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Synchronous path analysis in MOS circuit simulator

Published: 01 January 1982 Publication History

Abstract

For verifying the timing performance of synchronous MOS circuits a path analysis facility has been developed in the MOTIS (MOS Timing Simulator) system. This path analysis traces the clock signals to the latches in the circuit, computes the clock skews and then performs a path search analysis between all latches. For the paths between clocked latches, the timing constraints are determined using the clock skews and the operating frequency. The paths that do not satisfy these constraints are identified as problem paths. Such an analysis does not require a prior generation of circuit stimuli that are necessary for simulation. In terms of complexity also, it is simpler than simulation.

References

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Cited By

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  • (2008)Software optimization for MPSoCProceedings of the 6th IEEE/ACM/IFIP international conference on Hardware/Software codesign and system synthesis10.1145/1450135.1450146(43-48)Online publication date: 19-Oct-2008
  • (1997)Effective Path Selection for Delay Fault Testing of Sequential CircuitsProceedings of the 1997 IEEE International Test Conference10.5555/844384.845817Online publication date: 1-Nov-1997
  • (1993)TIMProceedings of the 30th international Design Automation Conference10.1145/157485.164998(497-502)Online publication date: 1-Jul-1993
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cover image ACM Conferences
DAC '82: Proceedings of the 19th Design Automation Conference
January 1982
919 pages

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IEEE Press

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Published: 01 January 1982

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View all
  • (2008)Software optimization for MPSoCProceedings of the 6th IEEE/ACM/IFIP international conference on Hardware/Software codesign and system synthesis10.1145/1450135.1450146(43-48)Online publication date: 19-Oct-2008
  • (1997)Effective Path Selection for Delay Fault Testing of Sequential CircuitsProceedings of the 1997 IEEE International Test Conference10.5555/844384.845817Online publication date: 1-Nov-1997
  • (1993)TIMProceedings of the 30th international Design Automation Conference10.1145/157485.164998(497-502)Online publication date: 1-Jul-1993
  • (1992)DynaTAPPProceedings of the conference on European design automation10.5555/159754.161743(138-141)Online publication date: 1-Nov-1992
  • (1992)Analyzing cycle stealing on synchronous circuits with level-sensitive latchesProceedings of the 29th ACM/IEEE Design Automation Conference10.5555/113938.149504(393-398)Online publication date: 1-Jul-1992
  • (1992)Delay fault models and test generation for random logic sequential circuitsProceedings of the 29th ACM/IEEE Design Automation Conference10.5555/113938.117295(165-172)Online publication date: 1-Jul-1992
  • (1991)Analysis and design of latch-controlled synchronous digital circuitsProceedings of the 27th ACM/IEEE Design Automation Conference10.1145/123186.123237(111-117)Online publication date: 3-Jan-1991
  • (1989)Post-Layout Verification of the WE DSP32 Digital Signal ProcessorIEEE Design & Test10.1109/54.203906:1(56-66)Online publication date: 1-Jan-1989
  • (1988)On path selection in combinational logic circuitsProceedings of the 25th ACM/IEEE Design Automation Conference10.5555/285730.285753(142-147)Online publication date: 1-Jun-1988
  • (1988)Chip layout optimization using critical path weightingPapers on Twenty-five years of electronic design automation10.1145/62882.62915(278-281)Online publication date: 1-Jun-1988
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