Article

Modifying User-Defined Logic for Test Access to Embedded Cores

Authors:

Bahram Pouya,

Nur A. ToubaAuthors Info & Claims

Proceedings of the IEEE International Test Conference

Pages 60 - 68

Published: 03 November 1997 Publication History

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Xu QNicolici N(2005)Modular and rapid testing of SOCs with unwrapped logic blocksIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2005.85958513:11(1275-1285)Online publication date: 1-Nov-2005
https://dl.acm.org/doi/10.1109/TVLSI.2005.859585
Kay DChung SMourad SAckland B(2002)Embedded test control schemes for compression in SOCsProceedings of the 39th annual Design Automation Conference10.1145/513918.514091(679-684)Online publication date: 10-Jun-2002
https://dl.acm.org/doi/10.1145/513918.514091
Whetsel L(2000)Adapting Scan Architectures for Low Power OperationProceedings of the 2000 IEEE International Test Conference10.5555/839295.843683Online publication date: 3-Oct-2000
https://dl.acm.org/doi/10.5555/839295.843683
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Modifying User-Defined Logic for Test Access to Embedded Cores
ITC '97: Proceedings of the 1997 IEEE International Test Conference

Testing embedded cores is a challenge becauseaccess to core I/Os is limited. The user-defined logic(UDL) surrounding the core may restrict the set of testvectors that can be applied to the core. Consequently,some of the core test vectors specified by ...

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Proceedings of the IEEE International Test Conference

November 1997

1011 pages

ISBN:0780342097

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IEEE Computer Society

United States

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Published: 03 November 1997

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Xu QNicolici N(2005)Modular and rapid testing of SOCs with unwrapped logic blocksIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2005.85958513:11(1275-1285)Online publication date: 1-Nov-2005
https://dl.acm.org/doi/10.1109/TVLSI.2005.859585
Kay DChung SMourad SAckland B(2002)Embedded test control schemes for compression in SOCsProceedings of the 39th annual Design Automation Conference10.1145/513918.514091(679-684)Online publication date: 10-Jun-2002
https://dl.acm.org/doi/10.1145/513918.514091
Whetsel L(2000)Adapting Scan Architectures for Low Power OperationProceedings of the 2000 IEEE International Test Conference10.5555/839295.843683Online publication date: 3-Oct-2000
https://dl.acm.org/doi/10.5555/839295.843683
Papachristou CMartin FNourani M(1999)Microprocessor based testing for core-based system on chipProceedings of the 36th annual ACM/IEEE Design Automation Conference10.1145/309847.310004(586-591)Online publication date: 1-Jun-1999
https://dl.acm.org/doi/10.1145/309847.310004
Zorian YMarinissen EDey S(1998)Testing embedded-core based system chipsProceedings of the 1998 IEEE International Test Conference10.5555/648020.745773Online publication date: 18-Oct-1998
https://dl.acm.org/doi/10.5555/648020.745773
Makris YOrailaglu A(1998)DFT guidance through RTL test justification and propagation analysisProceedings of the 1998 IEEE International Test Conference10.5555/648020.745770Online publication date: 18-Oct-1998
https://dl.acm.org/doi/10.5555/648020.745770
Sugihara MDate HYasuura H(1998)A novel test methodology for core-based system LSIs and a testing time minimization problemProceedings of the 1998 IEEE International Test Conference10.5555/648020.745631Online publication date: 18-Oct-1998
https://dl.acm.org/doi/10.5555/648020.745631
Varma PBhatia S(1998)A structured test re-use methodology for core-based system chipsProceedings of the 1998 IEEE International Test Conference10.5555/648020.745612(294-302)Online publication date: 18-Oct-1998
https://dl.acm.org/doi/10.5555/648020.745612
Makris YOrailoǧlu A(1998)RTL Test Justification and Propagation Analysis for Modular DesignsJournal of Electronic Testing: Theory and Applications10.1023/A:100830172007013:2(105-120)Online publication date: 1-Oct-1998
https://dl.acm.org/doi/10.1023/A%3A1008301720070

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A logic for state-modifying authorization policies

A modal logic for role-based access control within the hol theorem prover

Modifying User-Defined Logic for Test Access to Embedded Cores

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