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WO2023021854A1 - Method for inspecting optically transparent laminate - Google Patents

Method for inspecting optically transparent laminate Download PDF

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Publication number
WO2023021854A1
WO2023021854A1 PCT/JP2022/025868 JP2022025868W WO2023021854A1 WO 2023021854 A1 WO2023021854 A1 WO 2023021854A1 JP 2022025868 W JP2022025868 W JP 2022025868W WO 2023021854 A1 WO2023021854 A1 WO 2023021854A1
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WO
WIPO (PCT)
Prior art keywords
height
light
laminate
main surface
scanning
Prior art date
Application number
PCT/JP2022/025868
Other languages
French (fr)
Japanese (ja)
Inventor
裕司 山下
浩次 自然
ジョンビン ユン
Original Assignee
日東電工株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日東電工株式会社 filed Critical 日東電工株式会社
Priority to KR1020247004130A priority Critical patent/KR20240045215A/en
Priority to CN202280055466.4A priority patent/CN117795288A/en
Priority to JP2022545358A priority patent/JPWO2023021854A1/ja
Publication of WO2023021854A1 publication Critical patent/WO2023021854A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8858Flaw counting
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8861Determining coordinates of flaws

Definitions

  • the present invention relates to a method for inspecting a light transmissive laminate.
  • a light-transmitting laminate for example, an optical member, an optical laminate, an optical film, a light-transmitting adhesive sheet
  • an image display device removes foreign matter inside the laminate in order to prevent image display defects.
  • a light-transmissive laminate is typically subjected to a foreign matter inspection.
  • a foreign matter inspection is typically a transmission inspection carried out while conveying a long web of light-transmitting laminates, and defects such as foreign matter can be recognized as dark spots in the transmission inspection.
  • the display performance required for image display devices has increased remarkably, and as a result, remarkably high accuracy in foreign matter inspection of light-transmissive laminates has been required.
  • the present invention has been made to solve the above-mentioned problems, and its main purpose is to detect defects that are much smaller than those in the past, even if wrinkles or bends are present in the light-transmitting laminate. It is an object of the present invention to provide a method for inspecting a sheet-fed light-transmitting laminate that can be inspected.
  • a method for inspecting a sheet-fed light-transmissive laminate having a first principal surface and a second principal surface wherein a displacement sensor detects the first principal surface of the light-transmissive laminate. detecting the height of the main surface to obtain displacement data; scanning the light-transmissive laminate with an optical system to create a coordinate map of defects from the resulting scanned image; detecting a defect based on the coordinate map of the defect, and the height of the focal point of the optical system when scanning the light transmissive laminate to obtain the scanned image based on the displacement data; An inspection method is provided in which the distance between the position and the height position of the first main surface is maintained constant.
  • creating the defect coordinate map includes scanning the light transmissive laminate multiple times with the optical system to create a plurality of preliminary coordinate maps; Integrating a preliminary coordinate map, wherein the distance between the height position of the focus and the height position of the first principal surface in each scan differs by a predetermined distance P.
  • the number of times of scanning is Qa + Qb + Qc + 2, and from the height position of the first main surface of the light-transmitting laminate to the thickness direction upward (Qa + 1) ⁇ P distance from the height to the thickness direction downward A region up to a height of (Qb+Qc) ⁇ P is scanned while changing the distance between the height position of the focus and the height position of the first principal surface by the predetermined distance P.
  • the predetermined distance P is 10 ⁇ m to 100 ⁇ m.
  • the optical system includes a line camera, and obtaining the displacement data and creating the coordinate map of the defect are continuously performed for each field of view of the line camera in the width direction.
  • the inspection method detects defects with a size of 50 ⁇ m or less.
  • the light transmissive laminate is selected from optical films, adhesive sheets, and combinations thereof.
  • the optical film is selected from polarizing plates, retardation plates, and laminates containing these.
  • the thickness of the light transmissive laminate is 300 ⁇ m or less.
  • the displacement (undulation) of a sheet of light-transmitting laminate is detected, and the light-transmitting layer is detected so that the focus of imaging is along the undulation.
  • FIG. 1 is a schematic side view of an example of an inspection device that can be used in an inspection method according to an embodiment of the invention
  • FIG. It is a schematic diagram explaining a displacement data acquisition process. It is a schematic diagram explaining a displacement data acquisition process.
  • FIG. 11 is a schematic diagram for explaining a scan number determination process;
  • FIG. 4 is a schematic diagram for explaining the height position of the focal point when capturing a scanned image;
  • FIG. 4 is a conceptual diagram illustrating an example of creation of a defect coordinate map;
  • A. Outline of inspection method for light-transmissive laminate As shown in the flow diagram of FIG. detecting the height of the first main surface of the light-transmitting laminate with a displacement sensor to obtain displacement data (displacement data acquisition step); creating a defect coordinate map from the scanned image (defect coordinate map creating step); and detecting the defect based on the defect coordinate map (defect detecting step), preferably It further includes determining the number of scans (number of scans determination step).
  • the scanning of the light transmissive laminate is based on the obtained displacement data, and the height position of the focal point of the optical system and the height position of the first main surface when obtaining the scanned image.
  • FIG. 2 is a schematic side view of an example of an inspection apparatus that can be used in an inspection method according to an embodiment of the present invention.
  • the inspection apparatus 100 shown in FIG. 2 includes a sample stage 10 that fixes a light-transmitting laminate to be inspected, an optical system 20 that includes an imaging unit that captures a scanned image, and a first main surface of the light-transmitting laminate ( A displacement sensor 30 for detecting the height of the upper surface), and a Z-axis movement control unit 40 for supporting the optical system 20 so as to be arbitrarily movable in the Z-axis direction.
  • the displacement sensor 30 and the Z-axis movement control section 40 are supported by support mechanisms 50a and 50b, and the sample stage 10 can be arbitrarily moved in the X-axis direction and the Y-axis direction by the XY-axis movement control section 60.
  • the displacement sensor 30 is connected to a displacement data processing unit that analyzes or processes the measured displacement data, and the Z-axis movement control unit 40 receives displacement information (for example, a displacement map) output from the displacement data processing unit. ), the height of the optical system 20 can be varied to correspond to the displacement pattern of the first principal surface.
  • the focal point of the optical system (imaging unit) can be set at a desired position (height) through a change in the position (height) of the optical system 20.
  • the height position of the focal point of the optical system (imaging unit) can be controlled so that the distance from the height position of the first main surface during scanning is constant.
  • the sample stage 10 is configured to be arbitrarily movable in the X-axis direction and the Y-axis direction, as described above. With such a configuration, any region of the light-transmitting laminate can be inspected.
  • the sample stage can include, for example, a stage base on which the light-transmissive laminate is placed, and fixing members for fixing the ends thereof.
  • the sample stage may be configured to fix the light-transmitting laminate in the air.
  • the sample stage may be configured such that only the ends of the light-transmitting laminate can be gripped by a pair or two pairs of supporting members facing each other. can be From the viewpoint of reducing wrinkles and bending, the light-transmissive laminate may be fixed while being tensioned.
  • the optical system 20 includes an irradiation-side optical system for irradiating the light-transmissive laminate with inspection light and an imaging section.
  • the imaging unit includes an imaging device and an imaging-side optical system that forms an image of inspection light reflected by the light-transmissive laminate on the imaging device.
  • the irradiation-side optical system includes a coaxial epi-illumination system or an oblique illumination system, and the coaxial epi-illumination system is preferably used.
  • Laser light is preferably used as the inspection light.
  • the image-side optics may include an objective lens, an imaging lens, and the like.
  • a CCD, a CMOS, or the like can preferably be exemplified as an imaging device.
  • the imaging unit may be referred to as a camera. In one embodiment, the imaging unit is a line camera.
  • the displacement sensor 30 is typically a non-contact displacement sensor.
  • a laser displacement sensor, an ultrasonic displacement sensor, and the like can be preferably exemplified.
  • the inspection device that can be used in the inspection method according to the embodiment of the present invention is not limited to the example illustrated above.
  • the illustrated inspection apparatus 100 is a reflective inspection apparatus, a transmissive inspection apparatus can also be used. Defects such as air bubbles can be detected as white dots by the reflective inspection device, and defects such as foreign matter can be detected as black dots by the transmissive inspection device.
  • the illumination-side optical system (light source) is provided on the second main surface side, typically below the sample stage, and the sample stage is provided with a light-transmissive laminate so as to allow light to pass through. It can be configured in a shape (for example, frame-like) that can hold only the end of the body.
  • an XY-axis movement mechanism capable of arbitrarily moving the optical system and the displacement sensor in the X-axis direction and the Y-axis direction is provided. good too.
  • the light-transmitting laminate to be inspected includes any suitable light-transmitting laminate that requires inspection.
  • Specific examples include optical films, pressure-sensitive adhesive sheets, and combinations thereof (for example, pressure-sensitive adhesive layer-attached optical films).
  • optical films include polarizing plates, retardation plates, conductive films for touch panels, surface treatment films, and laminates obtained by appropriately laminating these according to the purpose (e.g., antireflection circular polarizing plate, touch panel polarizing plate with a conductive layer).
  • a pressure-sensitive adhesive sheet typically includes a pressure-sensitive adhesive and a release film temporarily adhered to at least one side thereof.
  • the light-transmitting laminate may typically be an optical film with a pressure-sensitive adhesive layer.
  • the thickness of the light-transmissive laminate is preferably 300 ⁇ m or less, more preferably 280 ⁇ m or less, still more preferably 250 ⁇ m or less. According to the embodiment of the present invention, even in such a thin light-transmissive laminate, minute foreign matter can be detected satisfactorily.
  • the lower limit of the thickness of the light transmissive laminate may be 30 ⁇ m, for example.
  • the thickness of the light-transmitting laminate is the thickness when the refractive index is taken into consideration, and is calculated based on the following formula (1). Also, the average refractive index in the formula (1) is calculated based on the following formula (2).
  • Thickness ( ⁇ m) of the light-transmitting laminate when the refractive index is taken into consideration Total thickness ( ⁇ m) of each layer constituting the light-transmitting laminate/average refractive index (1)
  • Average refractive index total refractive index of each layer constituting the light-transmitting laminate / number of layers constituting the light-transmitting laminate (2)
  • the light-transmitting laminate can be produced, for example, by laminating each layer constituting the light-transmitting laminate by so-called roll-to-roll.
  • the light transmissive laminate has a first main surface and a second main surface.
  • the first main surface is a surface (upper surface) on the imaging unit side.
  • the first main surface is, for example, the surface opposite to the image display cell to which the light-transmitting laminate is bonded;
  • the second main surface is, for example, the surface on the image display cell side, more specifically adhesive It can be the surface of the agent layer.
  • the produced long optically transparent laminate is cut into a predetermined size and subjected to inspection.
  • the size may typically be a size that allows multiple final products to be obtained. After inspection, the light transmissive laminate can typically be cut to the final product size and shipped.
  • the light-transmissive laminate may have a reflective protective film releasably attached to the first main surface when the laminate is subjected to inspection.
  • a reflective protective film releasably attached to the first main surface when the laminate is subjected to inspection.
  • a reflective protective film typically reflects measurement light from the displacement sensor and inspection light from the optical system.
  • the reflective protective film satisfies the following relationship: y ⁇ 0.0181x ⁇ 11.142
  • x is the absolute value of the detection wavelength in the wavelength range of 650 nm to 800 nm
  • y is the absolute value of the reflectance.
  • the reflective protective film can be composed of, for example, a cyclic olefin resin described in [0031] of JP-A-2019-099751. Examples of cyclic olefin resins include polynorbornene.
  • a commercially available product may be used as the cyclic olefin resin.
  • Specific examples of commercially available products include Zeonor and Zeonex manufactured by Nippon Zeon, Arton manufactured by JSR, Appel manufactured by Mitsui Chemicals, and Topas manufactured by TOPAS ADVANCED POLYMERS.
  • the cyclic olefin resin film preferably contains 50% by weight or more of the cyclic olefin resin.
  • a hard coat layer may be formed on the surface of the reflective protective film. By forming a hard coat layer, it is possible to prevent the occurrence of scratches on the reflective protective film and the adhesion of foreign matter to the reflective protective film, so that inspection can be performed with higher accuracy, and minute defects can be detected. can be accurately detected.
  • multiple reflective protective films may be temporarily attached. For example, if two inspections are scheduled, by sticking two reflective protective films together, peeling off one outer reflective protective film before the second inspection allows the inner reflective protection to be removed. Since it is possible to prevent the occurrence of scratches on the film and the adhesion of foreign matter to the inner reflective protective film, it is possible to perform inspections more accurately and multiple times. Note that even when multiple inspections are scheduled, only one reflective protective film may be temporarily attached.
  • a surface protective film may be detachably temporarily adhered to the surface of the reflective protective film (if there are multiple reflective protective films, the surface of the outermost reflective protective film). By temporarily attaching the surface protective film, it is possible to prevent the reflective protective film from being scratched, prevent foreign substances from adhering to the reflective protective film, and the like, so that inspection can be performed with higher accuracy.
  • the surface protective film is typically peeled off during inspection. After completion of the inspection, the surface protective film that was peeled off during the inspection may be temporarily adhered to the surface of the light-transmitting laminate again, or another surface protective film may be temporarily adhered in a detachable manner.
  • the reflective protective film and surface protective film may be temporarily attached to the light-transmitting laminate by roll-to-roll (that is, before cutting), or may be temporarily attached after cutting.
  • the displacement sensor detects the height (displacement) of the first main surface of the light transmissive laminate to acquire displacement data.
  • a displacement sensor is used to two-dimensionally scan the first main surface of the light transmissive laminate to detect its height.
  • the first main surface 200a of the light transmissive laminate 200 is scanned linearly at a predetermined interval L to detect the height.
  • the predetermined distance L is, for example, 1 mm to 100 mm, preferably 1 mm to 30 mm, more preferably 5 mm to 15 mm.
  • Detection of the height of the first main surface by the displacement sensor can be performed along a plurality of lines for each field of view in the width direction of the imaging section (typically, a line camera).
  • the height of the first main surface is detected as follows. First, the area to be inspected on the first main surface of the light-transmissive laminate is divided into N areas for each field of view (30 mm in the illustrated example) in the width direction of the imaging section.
  • the height of the first main surface from the starting point (coordinate Y 0 ) to the end point (coordinate Y 100 ) in the Y direction of the four lines X1 to X4 at intervals of 10 mm is sequentially measured.
  • the height of the first main surface from the starting point (coordinate Y 0 ) to the end point (coordinate Y 100 ) in the Y direction of the four lines X4 to X7 at intervals of 10 mm is Detection is performed sequentially (height detection on line X4 may be omitted).
  • displacement data can be obtained for the entire first main surface of the light-transmissive laminate or the entire inspection target area.
  • displacement data may be acquired for the entire first main surface or the entire inspection target area, and then the optical system may be scanned, or an image may be captured.
  • the steps from obtaining the displacement data to creating the coordinate map of the defect are continuously performed for each field of view in the width direction of the part, and the same operation is repeated while sequentially shifting the field of view. You can do an inspection. Therefore, by detecting the height of the first main surface in one direction for each field of view, it is possible to obtain displacement data that matches the scanning pattern (scanning direction and position) of the optical system. It can contribute to efficiency of inspection.
  • a 2D or 3D shape profile (hereinafter also referred to as a displacement map) can be obtained by processing the obtained displacement data with any suitable algorithm.
  • a displacement map of the entire first main surface or a predetermined region, a displacement map in any cross section, a displacement map when viewed from any side, etc. can be obtained.
  • Examples of such processing include processing using any suitable computer program such as a shape analysis program attached to the displacement sensor, a program created according to the purpose, etc. (for example, Auto Focus Whole Displacement Scan Mode Algorithm). .
  • the height position of the first main surface of the light-transmitting laminate and the imaging can be performed by changing the distance from the height position of the focus of the part by a predetermined distance P.
  • the number of scans is determined prior to the defect coordinate mapping process.
  • the number of scans is, for example, the reference height, maximum height and minimum height of the first main surface of the light-transmitting laminate determined based on the displacement data (hereinafter simply referred to as the reference height of the light-transmitting laminate , may be referred to as maximum height and minimum height) and the thickness of the light transmissive laminate.
  • the height of an arbitrary point on the first main surface can be used as the reference height.
  • the reference height of the light transmissive laminate is the median value of the maximum height and minimum height in the displacement data obtained with respect to the first principal surface, and is calculated as the arithmetic mean of both.
  • the maximum height and minimum height of the light transmissive laminate are the maximum height and minimum height in the displacement data, respectively.
  • the assumed maximum height and the assumed minimum height calculated by extrapolation, interpolation, etc. based on the displacement data can be used as the maximum height and minimum height of the light-transmitting laminate, respectively.
  • the number of scans is, for example, Qa, the value obtained by dividing the difference between the maximum height and the reference height (
  • Qb is the value obtained by rounding the quotient obtained by dividing the difference (
  • Qc is a value obtained by rounding to the first decimal place, it can be determined to be Qa+Qb+Qc or more (however, when Qa+Qb+Qc is 0, 1 or more).
  • the upper limit of the number of scans is not particularly limited, but from the viewpoint of production takt time, the number of scans may be, for example, 1 or more and 10 or less.
  • the number of scans is Qa+Qb+Qc+1 or Qa+Qb+Qc+2, further adding a first pre-scan above the first main surface and/or a second pre-scan below the second main surface. can be done.
  • the first pre-scanning and/or the second pre-scanning it is possible to reliably inspect the light transmissive laminate over the entire thickness direction.
  • the displacement map shown in FIG. 5(b) is a 2D shape profile showing the surface displacement of the first main surface when the light transmissive laminate 200 is viewed from the Y-direction ⁇ side in FIG. 5(a).
  • the displacement sensor 30 detects the surface displacement in four lines (line A to line D) at predetermined intervals, and auto focus is performed.
  • the maximum measured value is 160 ⁇ m at line B, and the minimum measured value is ⁇ 310 ⁇ m, and the assumed maximum and minimum heights obtained by interpolation are 190 ⁇ m and ⁇ 340 ⁇ m, respectively).
  • the maximum height and minimum height in the obtained displacement data are used as the maximum height and minimum height of the light-transmitting laminate.
  • the thickness of the light-transmitting laminate (calculated by dividing the actual thickness (350 ⁇ m) by the average refractive index (1.4)) is 250 ⁇ m, and the predetermined distance P in each scan is 100 ⁇ m. Note that the height of 0 ⁇ m in FIG.
  • Procedure A1 Based on the maximum height H max (160 ⁇ m) and the minimum height H min ( ⁇ 310 ⁇ m), determine a reference height of ⁇ 75 ⁇ m.
  • Procedure A5 Determine the number of scans based on Qa, Qb, and Qc (the number of scans applied as Qa+Qb+Qc or more is 7 or more, and perform either or both of the first prescan and the second prescan The number of scans in each case can be 8 or 9).
  • a defect coordinate map is created by scanning the light-transmissive laminate with inspection light and obtaining a scanned image. At this time, based on the displacement data, scanning is performed while maintaining a constant distance between the height position of the focal point of the optical system (imaging unit) and the height position of the first main surface. In one embodiment, scanning is performed while adjusting the height position of the focal point so that the focal point of the imaging unit follows the displacement pattern of the first main surface.
  • Alignment between the displacement data and the scanning position can be performed, for example, by providing a reference mark in advance on the first main surface of the light-transmitting laminate and based on the position coordinates of the reference mark.
  • alignment can be performed using the corners of the light-transmissive laminate as a reference.
  • scanning can be performed two-dimensionally over the entire inspection target area of the light-transmitting laminate.
  • the scanning direction of the imaging unit and the scanning direction of the displacement sensor are parallel, more preferably the same direction.
  • a value calculated from displacement data using any appropriate algorithm can be used as the height position of the first main surface.
  • the median value between the maximum height and the minimum height of the first main surface within the field of view in the width direction (eg, X direction) of the line camera is taken as the height position of the first main surface.
  • Scanning is performed while changing the height position of the focal point of the line scan camera so as to follow the change in the height position of the first main surface in the scanning direction (for example, the Y direction) for each field of view. be able to.
  • Y coordinates from Y 0 to Y 100 such as the median of maximum and minimum heights at X4, . It is possible to scan while changing the height position of the focal point of the line camera so as to follow the height position of the first main surface that changes along with the movement of the line camera.
  • the scanning of the light-transmissive laminate is performed once or multiple times. Preferably, a plurality of scans determined in the scan count determination step are performed.
  • the imaging unit focused on the first main surface in other words, at the height position of the first main surface
  • the imaging unit focused on the depth With the imaging unit focused on the depth, the entire inspection target area is scanned, and the scanned image obtained by the scanning becomes the defect coordinate map (XY coordinate map).
  • the predetermined distance P is not limited within a range in which a clear scanned image can be obtained, and can be appropriately set according to the depth of focus (depth of field) of the optical system.
  • the predetermined distance P is, for example, 10 ⁇ m to 100 ⁇ m, preferably 20 ⁇ m to 80 ⁇ m, more preferably 40 ⁇ m to 60 ⁇ m. According to such a configuration, substantially all defects existing in the thickness direction can be detected with an appropriate number of scans.
  • the focus is adjusted by moving the optical system (imaging unit) in the Z direction using the Auto Focus system, but the focus is adjusted by other means. good too.
  • the focal length of the imaging unit may be changed by a lens or the like, the height of the sample stage may be changed, or these means may be combined.
  • the scanning order is not particularly limited. Specifically, the first pre-scanning can be performed first, the scanning can be performed while shifting the focal point of the imaging unit downward in the thickness direction by a predetermined distance P, and finally the second pre-scanning can be performed.
  • the first scanning is performed with the imaging unit focused on the first main surface (in other words, at the height position of the first main surface), and then the imaging unit is moved downward in the thickness direction.
  • Sequential scanning is performed while shifting the focus, and after completion of the second preliminary scanning, sequential scanning is performed while shifting the focus of the imaging unit upward in the thickness direction from the height position of the first main surface, and finally the first preliminary scanning is performed.
  • Scanning can be performed.
  • the first scanning is performed with the imaging unit focused on the first main surface (in other words, at the height position of the first main surface), and then the imaging unit moves upward in the thickness direction.
  • Sequential scanning is performed while shifting the focus, and after completion of the first preliminary scanning, sequential scanning is performed while shifting the focus of the imaging unit downward in the thickness direction from the height position of the first main surface, and finally the second preliminary scanning is performed. Scanning can be performed.
  • the maximum height, minimum height, standard height, and thickness of the light-transmitting laminate are 160 ⁇ m, ⁇ 310 ⁇ m, ⁇ 75 ⁇ m, and 250 ⁇ m, respectively, and the predetermined distance P is 100 ⁇ m.
  • the height position of the focal point of the imaging unit is A first scan is performed so as to maintain a distance of 300 ⁇ m upward from the height position of one principal surface, and then a total of 9 scans are performed while shifting the height position of the focal point downward by 100 ⁇ m. can.
  • a defect coordinate map (integrated XY coordinate map) is created by integrating a plurality of obtained preliminary coordinate maps using the scanned image obtained in each scanning as a preliminary coordinate map. be done.
  • FIG. 7 shows an example of creating a defect coordinate map (integrated XY coordinate map) by integrating five preliminary coordinate maps.
  • defects present in each coordinate map can be expressed on common XY coordinates.
  • substantially all defects in the light-transmissive laminate are represented by XY coordinates (two-dimensional coordinates).
  • defects are detected based on the defect coordinate map.
  • the same defect can be identified from the XY coordinates in all the preliminary coordinate maps, and the image with the highest contrast value can be detected as the defect.
  • the depth (Z coordinate) of the defect can be specified from the focal position when the image was obtained.
  • defects with a size (maximum length) of 50 ⁇ m or less, preferably 30 ⁇ m or less, more preferably 20 ⁇ m or less, and even more preferably 10 ⁇ m or less can be detected.
  • the size of the detected defects can be for example 1 ⁇ m or more, also for example 3 ⁇ m or more, also for example 8 ⁇ m or more.
  • Defects can be detected as described above.
  • the light-transmitting laminate can typically be cut to the final product size and shipped as described above.
  • the peeled surface protective film may be re-attached temporarily to the light-transmissive laminate in a peelable manner, if necessary.
  • the steps from the displacement data acquisition step to the defect coordinate map creation step may be performed for each field of view in the width direction of the imaging unit (line camera).
  • the method for inspecting a light-transmitting laminate according to an embodiment of the present invention can be suitably used for detecting defects in optical films, pressure-sensitive adhesive sheets, etc. in the manufacturing process of image display devices.

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The present invention provides a method for inspecting an optically transparent laminate that makes it possible to detect defects which are markedly more minute, as compared to the prior art. This method for inspecting an optically transparent laminate is a method for inspecting a sheet of optically transparent laminate that has a first principal surface and a second principal surface, the method comprising: detecting the height of the first principal surface of the optically transparent laminate with a displacement sensor to obtain displacement data; scanning the optically transparent laminate with an optical system and creating a coordinate map of defects from scanning images obtained thereby; and detecting defects on the basis of the coordinate map of defects. The scanning of the optically transparent laminate is performed while a constant distance is maintained between the height position of the focus of the optical system when obtaining the scanning images and the height position of the first principal surface on the basis of the displacement data.

Description

光透過性積層体の検査方法Inspection method for light transmissive laminate
 本発明は、光透過性積層体の検査方法に関する。 The present invention relates to a method for inspecting a light transmissive laminate.
 画像表示装置に適用される光透過性積層体(例えば、光学部材、光学積層体、光学フィルム、光透過性粘着シート)は、画像表示欠陥等を防止するために当該積層体内部の異物を排除する必要がある。そのため、このような光透過性積層体は、代表的には異物検査に供される。異物検査は、代表的には、光透過性積層体の長尺状のウェブを搬送しながら行われる透過検査であり、当該透過検査において異物等の欠点は暗点として認識され得る。近年、画像表示装置に要求される表示性能が格段に高くなり、その結果、光透過性積層体の異物検査の精度についても格段に高いものが要求されるようになっている。具体的には、従来は50μm程度の欠点を検出すれば許容されていたところ、10μm程度の欠点を検出する必要が生じている。しかし、上記のような長尺状のウェブを搬送しながら行われる異物検査では、このように小さな欠点を検出することはきわめて困難である。また、光透過性積層体に皺や撓みが存在する場合に、正確に欠点を検出することが困難であるという問題がある。 A light-transmitting laminate (for example, an optical member, an optical laminate, an optical film, a light-transmitting adhesive sheet) applied to an image display device removes foreign matter inside the laminate in order to prevent image display defects. There is a need to. Therefore, such a light-transmissive laminate is typically subjected to a foreign matter inspection. A foreign matter inspection is typically a transmission inspection carried out while conveying a long web of light-transmitting laminates, and defects such as foreign matter can be recognized as dark spots in the transmission inspection. In recent years, the display performance required for image display devices has increased remarkably, and as a result, remarkably high accuracy in foreign matter inspection of light-transmissive laminates has been required. Specifically, conventionally, if a defect of about 50 μm is detected, it is acceptable, but now it is necessary to detect a defect of about 10 μm. However, it is extremely difficult to detect such small defects in the foreign matter inspection carried out while conveying a long web as described above. Moreover, there is a problem that it is difficult to accurately detect defects when wrinkles or warps are present in the light-transmissive laminate.
特開2005-062165号公報JP 2005-062165 A
 本発明は上記課題を解決するためになされたものであり、その主たる目的は、光透過性積層体に皺や撓みが存在する場合であっても、従来に比べて格段に微小な欠点を検出し得る枚葉の光透過性積層体の検査方法を提供することにある。 The present invention has been made to solve the above-mentioned problems, and its main purpose is to detect defects that are much smaller than those in the past, even if wrinkles or bends are present in the light-transmitting laminate. It is an object of the present invention to provide a method for inspecting a sheet-fed light-transmitting laminate that can be inspected.
 本発明の1つの局面によれば、第1主面と第2主面とを有する枚葉の光透過性積層体の検査方法であって、変位センサで該光透過性積層体の該第1主面の高さを検出して、変位データを得ること、光学系で該光透過性積層体を走査して、それにより得られた走査画像から欠点の座標マップを作成すること、および、
 該欠点の座標マップに基づいて、欠点を検出すること、を含み、該光透過性積層体の走査が、該変位データに基づいて、該走査画像を得る際の該光学系の焦点の高さ位置と該第1主面の高さ位置との距離を一定に維持しながら行われる、検査方法が提供される。
 1つの実施形態において、上記欠点の座標マップを作成することが、上記光学系で上記光透過性積層体を複数回走査して、複数の予備的座標マップを作成すること、および、該複数の予備的座標マップを統合すること、を含み、各走査における上記焦点の高さ位置と上記第1主面の高さ位置との距離が、所定距離Pずつ異なる。
 1つの実施形態において、上記変位データに基づいて決定される上記光透過性積層体の第1主面の基準高さ、最大高さおよび最小高さと、上記光透過性積層体の厚みとに基づいて、走査回数を決定することをさらに含み、該最大高さと基準高さとの差を上記所定距離Pで除した商の小数点第1位を四捨五入した値をQa、該最小高さと基準高さとの差を上記所定距離Pで除した商の小数点第1位を四捨五入した値をQb、上記光透過性積層体の厚みを上記所定距離Pで除した商の小数点第1位を四捨五入した値をQc、とした場合に、該走査回数が、Qa+Qb+Qc以上(ただし、Qa+Qb+Qc=0のときは1以上)である。
 1つの実施形態において、上記走査回数が、Qa+Qb+Qc+2であり、上記光透過性積層体の第1主面の高さ位置から厚み方向上方へ(Qa+1)×Pの距離の高さから厚み方向下方へ(Qb+Qc)×Pの距離の高さまでの領域を、上記焦点の高さ位置と上記第1主面の高さ位置との距離を上記所定距離Pずつ変化させながら走査する。
 1つの実施形態において、上記所定距離Pが、10μm~100μmである。
 1つの実施形態において、上記光学系が、ラインカメラを含み、上記変位データを得ることおよび上記欠点の座標マップを作成することが、該ラインカメラの幅方向の視野毎に連続して行われる。
 1つの実施形態において、上記検査方法は、50μm以下のサイズの欠点を検出する。
 1つの実施形態において、上記光透過性積層体が、光学フィルム、粘着剤シート、およびこれらの組み合わせから選択される。
 1つの実施形態において、上記光学フィルムが、偏光板、位相差板、およびこれらを含む積層体から選択される。
 1つの実施形態において、上記光透過性積層体の厚みが300μm以下である。
According to one aspect of the present invention, there is provided a method for inspecting a sheet-fed light-transmissive laminate having a first principal surface and a second principal surface, wherein a displacement sensor detects the first principal surface of the light-transmissive laminate. detecting the height of the main surface to obtain displacement data; scanning the light-transmissive laminate with an optical system to create a coordinate map of defects from the resulting scanned image;
detecting a defect based on the coordinate map of the defect, and the height of the focal point of the optical system when scanning the light transmissive laminate to obtain the scanned image based on the displacement data; An inspection method is provided in which the distance between the position and the height position of the first main surface is maintained constant.
In one embodiment, creating the defect coordinate map includes scanning the light transmissive laminate multiple times with the optical system to create a plurality of preliminary coordinate maps; Integrating a preliminary coordinate map, wherein the distance between the height position of the focus and the height position of the first principal surface in each scan differs by a predetermined distance P.
In one embodiment, based on the reference height, maximum height, and minimum height of the first main surface of the light-transmitting laminate determined based on the displacement data, and the thickness of the light-transmitting laminate determining the number of scans by dividing the difference between the maximum height and the reference height by the predetermined distance P and rounding the quotient to the first decimal place, Qa; Qb is the quotient obtained by dividing the difference by the predetermined distance P and rounded to the first decimal place; , the number of scans is Qa+Qb+Qc or more (1 or more when Qa+Qb+Qc=0).
In one embodiment, the number of times of scanning is Qa + Qb + Qc + 2, and from the height position of the first main surface of the light-transmitting laminate to the thickness direction upward (Qa + 1) × P distance from the height to the thickness direction downward A region up to a height of (Qb+Qc)×P is scanned while changing the distance between the height position of the focus and the height position of the first principal surface by the predetermined distance P.
In one embodiment, the predetermined distance P is 10 μm to 100 μm.
In one embodiment, the optical system includes a line camera, and obtaining the displacement data and creating the coordinate map of the defect are continuously performed for each field of view of the line camera in the width direction.
In one embodiment, the inspection method detects defects with a size of 50 μm or less.
In one embodiment, the light transmissive laminate is selected from optical films, adhesive sheets, and combinations thereof.
In one embodiment, the optical film is selected from polarizing plates, retardation plates, and laminates containing these.
In one embodiment, the thickness of the light transmissive laminate is 300 µm or less.
 本発明の実施形態による光透過性積層体の検査方法によれば、枚葉の光透過性積層体の変位(うねり)を検出し、撮像の焦点を当該うねりに沿わせるように当該光透過性積層体を走査することにより、光透過性積層体に皺や撓みが存在する場合であっても、微小な欠点を良好に検出することができる。 According to the method for inspecting a light-transmitting laminate according to an embodiment of the present invention, the displacement (undulation) of a sheet of light-transmitting laminate is detected, and the light-transmitting layer is detected so that the focus of imaging is along the undulation. By scanning the laminate, even if the light-transmitting laminate has wrinkles or warps, minute defects can be detected satisfactorily.
本発明の実施形態による光透過性積層体の検査方法を説明するフロー図である。It is a flow figure explaining the inspection method of the light transmission layered product by the embodiment of the present invention. 本発明の実施形態による検査方法に用いられ得る検査装置の一例の概略側面図である。1 is a schematic side view of an example of an inspection device that can be used in an inspection method according to an embodiment of the invention; FIG. 変位データ取得工程を説明する概略図である。It is a schematic diagram explaining a displacement data acquisition process. 変位データ取得工程を説明する概略図である。It is a schematic diagram explaining a displacement data acquisition process. 走査回数決定工程を説明する概略図である。FIG. 11 is a schematic diagram for explaining a scan number determination process; 走査画像を撮像する際の焦点の高さ位置を説明する概略図である。FIG. 4 is a schematic diagram for explaining the height position of the focal point when capturing a scanned image; 欠点の座標マップの作成の一例を説明する概念図である。FIG. 4 is a conceptual diagram illustrating an example of creation of a defect coordinate map;
 以下、図面を参照して本発明の実施形態について説明するが、本発明はこれらの実施形態には限定されない。また、図面はすべて模式的に表されており、実際の状態を正確に描いたものではない。 Embodiments of the present invention will be described below with reference to the drawings, but the present invention is not limited to these embodiments. Also, all the drawings are schematic representations and do not represent the actual state accurately.
A.光透過性積層体の検査方法の概略
 図1のフロー図に示す通り、本発明の実施形態による光透過性積層体の検査方法は、第1主面と第2主面とを有する枚葉の光透過性積層体の第1主面の高さを変位センサで検出して、変位データを得ること(変位データ取得工程)、光学系で該光透過性積層体を走査して、それにより得られた走査画像から欠点の座標マップを作成すること(欠点の座標マップ作成工程)、および、該欠点の座標マップに基づいて、欠点を検出すること(欠点検出工程)、を含み、好ましくは、走査回数を決定すること(走査回数決定工程)をさらに含む。欠点の座標マップ作成工程において、光透過性積層体の走査は、得られた変位データに基づいて、走査画像を得る際の光学系の焦点の高さ位置と第1主面の高さ位置との距離を一定に維持しながら行われる。このように光透過性積層体を走査することにより、第1主面の変位(うねり)に追従した走査を行うことができ、結果として、光透過性積層体に皺や撓みが存在する場合であっても、微小な欠点を良好に検出することができる。
A. Outline of inspection method for light-transmissive laminate As shown in the flow diagram of FIG. detecting the height of the first main surface of the light-transmitting laminate with a displacement sensor to obtain displacement data (displacement data acquisition step); creating a defect coordinate map from the scanned image (defect coordinate map creating step); and detecting the defect based on the defect coordinate map (defect detecting step), preferably It further includes determining the number of scans (number of scans determination step). In the defect coordinate map creation step, the scanning of the light transmissive laminate is based on the obtained displacement data, and the height position of the focal point of the optical system and the height position of the first main surface when obtaining the scanned image. This is done while maintaining a constant distance between By scanning the light-transmissive laminate in this way, it is possible to perform scanning that follows the displacement (undulation) of the first main surface, and as a result, even if wrinkles or warps exist in the light-transmissive laminate, Even if there is, a minute defect can be detected satisfactorily.
A-1.検査装置
 図2は、本発明の実施形態による検査方法に用いられ得る検査装置の一例の概略側面図である。図2に示す検査装置100は、検査対象の光透過性積層体を固定するサンプルステージ10と、走査画像を撮像する撮像部を含む光学系20と、光透過性積層体の第1主面(上面)の高さを検出する変位センサ30と、光学系20をZ軸方向に任意に移動可能に支持するZ軸移動制御部40と、を備える。変位センサ30およびZ軸移動制御部40は、支持機構50a、50bに支持されており、サンプルステージ10はXY軸移動制御部60によってX軸方向およびY軸方向に任意に移動可能である。図示しないが、変位センサ30は、測定された変位データを解析または処理する変位データ処理部と接続され、Z軸移動制御部40は、変位データ処理部から出力される変位情報(例えば、変位マップ)に基づいて、第1主面の変位パターンに対応するように光学系20の高さを変化させることができる。このような構成とすることにより、光学系20の位置(高さ)の変化を介して、光学系(撮像部)の焦点を所望の位置(高さ)に設定することができ、結果として、走査時における第1主面の高さ位置との距離が一定となるように光学系(撮像部)の焦点の高さ位置を制御することができる。
A-1. Inspection Apparatus FIG. 2 is a schematic side view of an example of an inspection apparatus that can be used in an inspection method according to an embodiment of the present invention. The inspection apparatus 100 shown in FIG. 2 includes a sample stage 10 that fixes a light-transmitting laminate to be inspected, an optical system 20 that includes an imaging unit that captures a scanned image, and a first main surface of the light-transmitting laminate ( A displacement sensor 30 for detecting the height of the upper surface), and a Z-axis movement control unit 40 for supporting the optical system 20 so as to be arbitrarily movable in the Z-axis direction. The displacement sensor 30 and the Z-axis movement control section 40 are supported by support mechanisms 50a and 50b, and the sample stage 10 can be arbitrarily moved in the X-axis direction and the Y-axis direction by the XY-axis movement control section 60. FIG. Although not shown, the displacement sensor 30 is connected to a displacement data processing unit that analyzes or processes the measured displacement data, and the Z-axis movement control unit 40 receives displacement information (for example, a displacement map) output from the displacement data processing unit. ), the height of the optical system 20 can be varied to correspond to the displacement pattern of the first principal surface. With such a configuration, the focal point of the optical system (imaging unit) can be set at a desired position (height) through a change in the position (height) of the optical system 20. As a result, The height position of the focal point of the optical system (imaging unit) can be controlled so that the distance from the height position of the first main surface during scanning is constant.
 サンプルステージ10は、上記の通り、X軸方向およびY軸方向に任意に移動可能に構成されている。このような構成とすることにより、光透過性積層体の任意の領域を検査することができる。サンプルステージは、例えば、光透過性積層体を載置するステージ台と、その端部を固定する固定部材とを備え得る。あるいは、サンプルステージは、光透過性積層体を中空に固定し得る構成であってもよく、例えば、対向する一対または2対の支持部材で光透過性積層体の端部のみを把持可能に構成され得る。皺や撓みを低減する観点から、張力を付与した状態で光透過性積層体を固定してもよい。 The sample stage 10 is configured to be arbitrarily movable in the X-axis direction and the Y-axis direction, as described above. With such a configuration, any region of the light-transmitting laminate can be inspected. The sample stage can include, for example, a stage base on which the light-transmissive laminate is placed, and fixing members for fixing the ends thereof. Alternatively, the sample stage may be configured to fix the light-transmitting laminate in the air. For example, the sample stage may be configured such that only the ends of the light-transmitting laminate can be gripped by a pair or two pairs of supporting members facing each other. can be From the viewpoint of reducing wrinkles and bending, the light-transmissive laminate may be fixed while being tensioned.
 光学系20は、光透過性積層体に検査光を照射する照射側光学系と撮像部とを含む。撮像部は、撮像素子と、光透過性積層体で反射された検査光を撮像素子上で結像させる結像側光学系とを含む。照射側光学系としては、同軸落射照明系または斜方照明系が挙げられ、同軸落射照明系が好ましく用いられ得る。検査光としては、好ましくはレーザー光が用いられる。結像側光学系は、対物レンズ、結像レンズ等を含み得る。撮像素子としては、CCD、CMOS等が好ましく例示できる。なお、本明細書においては、撮像部をカメラと称する場合がある。1つの実施形態において、撮像部はラインカメラである。 The optical system 20 includes an irradiation-side optical system for irradiating the light-transmissive laminate with inspection light and an imaging section. The imaging unit includes an imaging device and an imaging-side optical system that forms an image of inspection light reflected by the light-transmissive laminate on the imaging device. The irradiation-side optical system includes a coaxial epi-illumination system or an oblique illumination system, and the coaxial epi-illumination system is preferably used. Laser light is preferably used as the inspection light. The image-side optics may include an objective lens, an imaging lens, and the like. A CCD, a CMOS, or the like can preferably be exemplified as an imaging device. In addition, in this specification, the imaging unit may be referred to as a camera. In one embodiment, the imaging unit is a line camera.
 変位センサ30は、代表的には、非接触系変位センサである。非接触系変位センサとしては、レーザー変位センサ、超音波変位センサ等が好ましく例示できる。 The displacement sensor 30 is typically a non-contact displacement sensor. As the non-contact displacement sensor, a laser displacement sensor, an ultrasonic displacement sensor, and the like can be preferably exemplified.
 本発明の実施形態による検査方法に用いられ得る検査装置は、上記図示例に限定されない。図示例の検査装置100は、反射型検査装置であるが、これとは異なり、透過型検査装置を用いることもできる。反射型検査装置によれば、気泡等の欠点を白点として検出でき、透過型検査装置によれば、異物等の欠点を黒点として検出できる。透過型検査装置の場合、照射側光学系(光源)が第2主面側、代表的には、サンプルステージの下方、に設けられ、サンプルステージは、光を透過できるように、光透過性積層体の端部のみを把持し得る形状(例えば、枠状)に構成され得る。 The inspection device that can be used in the inspection method according to the embodiment of the present invention is not limited to the example illustrated above. Although the illustrated inspection apparatus 100 is a reflective inspection apparatus, a transmissive inspection apparatus can also be used. Defects such as air bubbles can be detected as white dots by the reflective inspection device, and defects such as foreign matter can be detected as black dots by the transmissive inspection device. In the case of a transmissive inspection apparatus, the illumination-side optical system (light source) is provided on the second main surface side, typically below the sample stage, and the sample stage is provided with a light-transmissive laminate so as to allow light to pass through. It can be configured in a shape (for example, frame-like) that can hold only the end of the body.
 また例えば、サンプルステージをX軸方向およびY軸方向に任意に移動可能に構成する代わりに、光学系および変位センサをX軸方向およびY軸方向に任意に移動可能なXY軸移動機構を設けてもよい。 Further, for example, instead of arbitrarily moving the sample stage in the X-axis direction and the Y-axis direction, an XY-axis movement mechanism capable of arbitrarily moving the optical system and the displacement sensor in the X-axis direction and the Y-axis direction is provided. good too.
A-2.光透過性積層体
 検査対象となる光透過性積層体としては、検査が必要とされる任意の適切な光透過性の積層体が挙げられる。具体例としては、光学フィルム、粘着剤シート、およびこれらの組み合わせ(例えば、粘着剤層付光学フィルム)が挙げられる。光学フィルムとしては、例えば、偏光板、位相差板、タッチパネル用導電性フィルム、表面処理フィルム、および、これらを目的に応じて適切に積層した積層体(例えば、反射防止用円偏光板、タッチパネル用導電層付偏光板)が挙げられる。粘着剤シートは、代表的には、粘着剤とその少なくとも一方の側に仮着された離型フィルムとを含む。光透過性積層体は、代表的には、粘着剤層付光学フィルムであり得る。光透過性積層体の厚みは、好ましくは300μm以下であり、より好ましくは280μm以下であり、さらに好ましくは250μm以下である。本発明の実施形態によれば、このような薄型の光透過性積層体においても微小な異物を良好に検出することができる。光透過性積層体の厚みの下限は、例えば30μmであり得る。なお、本明細書において、光透過性積層体の厚みは、屈折率を加味した場合の厚みであり、下記式(1)に基づいて算出される。また、式(1)中の平均屈折率は、下記式(2)に基づいて算出される。
  屈折率を加味した場合の光透過性積層体の厚み(μm)=光透過性積層体を構成する各層の厚みの合計(μm)÷平均屈折率   (1)
  平均屈折率=光透過性積層体を構成する各層の屈折率の合計÷光透過性積層体を構成する層の数   (2)
A-2. Light-Transmitting Laminate The light-transmitting laminate to be inspected includes any suitable light-transmitting laminate that requires inspection. Specific examples include optical films, pressure-sensitive adhesive sheets, and combinations thereof (for example, pressure-sensitive adhesive layer-attached optical films). Examples of optical films include polarizing plates, retardation plates, conductive films for touch panels, surface treatment films, and laminates obtained by appropriately laminating these according to the purpose (e.g., antireflection circular polarizing plate, touch panel polarizing plate with a conductive layer). A pressure-sensitive adhesive sheet typically includes a pressure-sensitive adhesive and a release film temporarily adhered to at least one side thereof. The light-transmitting laminate may typically be an optical film with a pressure-sensitive adhesive layer. The thickness of the light-transmissive laminate is preferably 300 μm or less, more preferably 280 μm or less, still more preferably 250 μm or less. According to the embodiment of the present invention, even in such a thin light-transmissive laminate, minute foreign matter can be detected satisfactorily. The lower limit of the thickness of the light transmissive laminate may be 30 μm, for example. In addition, in this specification, the thickness of the light-transmitting laminate is the thickness when the refractive index is taken into consideration, and is calculated based on the following formula (1). Also, the average refractive index in the formula (1) is calculated based on the following formula (2).
Thickness (μm) of the light-transmitting laminate when the refractive index is taken into consideration=Total thickness (μm) of each layer constituting the light-transmitting laminate/average refractive index (1)
Average refractive index = total refractive index of each layer constituting the light-transmitting laminate / number of layers constituting the light-transmitting laminate (2)
 光透過性積層体は、例えば、光透過性積層体を構成する各層をいわゆるロールトゥロールにより積層することにより作製され得る。光透過性積層体は、第1主面と第2主面とを有する。第1主面は、撮像部側の面(上面)である。第1主面は、例えば、光透過性積層体が貼り合わせられる画像表示セルと反対側の表面であり;第2主面は、例えば、画像表示セル側の表面であり、より詳細には粘着剤層の表面であり得る。作製された長尺状の光透過性積層体は、所定サイズに裁断されて検査に供される。当該サイズは、代表的には、最終製品が複数枚得られるサイズであり得る。検査終了後、光透過性積層体は、代表的には最終製品サイズに裁断されて出荷され得る。 The light-transmitting laminate can be produced, for example, by laminating each layer constituting the light-transmitting laminate by so-called roll-to-roll. The light transmissive laminate has a first main surface and a second main surface. The first main surface is a surface (upper surface) on the imaging unit side. The first main surface is, for example, the surface opposite to the image display cell to which the light-transmitting laminate is bonded; the second main surface is, for example, the surface on the image display cell side, more specifically adhesive It can be the surface of the agent layer. The produced long optically transparent laminate is cut into a predetermined size and subjected to inspection. The size may typically be a size that allows multiple final products to be obtained. After inspection, the light transmissive laminate can typically be cut to the final product size and shipped.
 1つの実施形態においては、光透過性積層体は、検査に供される際、第1主面に反射性保護フィルムが剥離可能に仮着されてもよい。光透過性積層体の種類・構成によっては(例えば、光透過性積層体が低反射層(AR層)を含む場合には)、変位センサによる表面変位の検出や撮像部による撮像が困難となる場合があるところ、反射性保護フィルムを仮着することにより、そのような問題を回避できる。反射性保護フィルムは、代表的には、変位センサからの計測光および光学系からの検査光を反射する。1つの実施形態においては、反射性保護フィルムは以下の関係を満足する:
   y≧0.0181x-11.142
ここで、xは650nm~800nmの波長領域での検出波長の絶対値であり、yは反射率の絶対値である。このような構成であれば、変位センサによる表面変位の検出や撮像部による撮像を良好に行うことができる。反射性保護フィルムとしては、上記機能を有する限りにおいて任意の適切な構成が採用され得る。具体的には、反射性保護フィルムは、例えば特開2019-099751号公報の[0031]に記載の環状オレフィン系樹脂で構成され得る。環状オレフィン系樹脂としては、例えばポリノルボルネンが挙げられる。環状オレフィン系樹脂は、市販品を用いてもよい。市販品の具体例としては、日本ゼオン製のゼオノアおよびゼオネックス、JSR製のアートン、三井化学製のアペル、TOPAS ADVANCED POLYMERS製のトパス等が挙げられる。環状オレフィン系樹脂フィルムは、環状オレフィン系樹脂を50重量%以上含有するものが好ましい。1つの実施形態においては、反射性保護フィルムの表面にハードコート層が形成されていてもよい。ハードコート層を形成することにより、反射性保護フィルムのキズの発生、反射性保護フィルムへの異物の付着等を防止することができるので、より高精度で検査を行うことができ、微小な欠点を正確に検出することができる。
In one embodiment, the light-transmissive laminate may have a reflective protective film releasably attached to the first main surface when the laminate is subjected to inspection. Depending on the type and configuration of the light-transmitting laminate (for example, when the light-transmitting laminate includes a low-reflection layer (AR layer)), it becomes difficult to detect surface displacement by the displacement sensor and to capture images by the imaging unit. In some cases, such problems can be avoided by temporarily applying a reflective protective film. A reflective protective film typically reflects measurement light from the displacement sensor and inspection light from the optical system. In one embodiment, the reflective protective film satisfies the following relationship:
y≧0.0181x−11.142
Here, x is the absolute value of the detection wavelength in the wavelength range of 650 nm to 800 nm, and y is the absolute value of the reflectance. With such a configuration, detection of surface displacement by the displacement sensor and imaging by the imaging unit can be performed satisfactorily. Any appropriate configuration can be adopted as the reflective protective film as long as it has the above functions. Specifically, the reflective protective film can be composed of, for example, a cyclic olefin resin described in [0031] of JP-A-2019-099751. Examples of cyclic olefin resins include polynorbornene. A commercially available product may be used as the cyclic olefin resin. Specific examples of commercially available products include Zeonor and Zeonex manufactured by Nippon Zeon, Arton manufactured by JSR, Appel manufactured by Mitsui Chemicals, and Topas manufactured by TOPAS ADVANCED POLYMERS. The cyclic olefin resin film preferably contains 50% by weight or more of the cyclic olefin resin. In one embodiment, a hard coat layer may be formed on the surface of the reflective protective film. By forming a hard coat layer, it is possible to prevent the occurrence of scratches on the reflective protective film and the adhesion of foreign matter to the reflective protective film, so that inspection can be performed with higher accuracy, and minute defects can be detected. can be accurately detected.
 反射性保護フィルムは、予定される検査回数に応じて、複数枚を仮着してもよい。例えば検査が2回予定されている場合には、反射性保護フィルムを2枚貼り合わせることにより、2回目の検査の前に外側の反射性保護フィルムを1枚剥離すれば、内側の反射性保護フィルムのキズの発生、内側の反射性保護フィルムへの異物の付着等を防止することができるので、より高精度で複数回の検査を行うことができる。なお、複数回の検査が予定されている場合であっても、反射性保護フィルムを1枚のみ仮着してもよい。 Depending on the number of scheduled inspections, multiple reflective protective films may be temporarily attached. For example, if two inspections are scheduled, by sticking two reflective protective films together, peeling off one outer reflective protective film before the second inspection allows the inner reflective protection to be removed. Since it is possible to prevent the occurrence of scratches on the film and the adhesion of foreign matter to the inner reflective protective film, it is possible to perform inspections more accurately and multiple times. Note that even when multiple inspections are scheduled, only one reflective protective film may be temporarily attached.
 1つの実施形態においては、反射性保護フィルムの表面(反射性保護フィルムが複数存在する場合には、最表の反射性保護フィルム表面)に表面保護フィルムが剥離可能に仮着されてもよい。表面保護フィルムを仮着することにより、反射性保護フィルムのキズの発生、反射性保護フィルムへの異物の付着等を防止することができるので、より高精度で検査を行うことができる。表面保護フィルムは、代表的には、検査時に剥離除去される。検査終了後には、検査時に剥離された表面保護フィルムが光透過性積層体の表面に再度仮着されてもよく、別の表面保護フィルムが剥離可能に仮着されてもよい。 In one embodiment, a surface protective film may be detachably temporarily adhered to the surface of the reflective protective film (if there are multiple reflective protective films, the surface of the outermost reflective protective film). By temporarily attaching the surface protective film, it is possible to prevent the reflective protective film from being scratched, prevent foreign substances from adhering to the reflective protective film, and the like, so that inspection can be performed with higher accuracy. The surface protective film is typically peeled off during inspection. After completion of the inspection, the surface protective film that was peeled off during the inspection may be temporarily adhered to the surface of the light-transmitting laminate again, or another surface protective film may be temporarily adhered in a detachable manner.
 反射性保護フィルムおよび表面保護フィルムは、ロールトゥロールにより(すなわち、裁断前に)光透過性積層体に仮着されてもよく、裁断後に仮着されてもよい。 The reflective protective film and surface protective film may be temporarily attached to the light-transmitting laminate by roll-to-roll (that is, before cutting), or may be temporarily attached after cutting.
 以下、各工程について具体的に説明する。 Each step will be explained in detail below.
B.変位データ取得工程
 変位データ取得工程においては、変位センサで光透過性積層体の第1主面の高さ(変位)を検出して、変位データを取得する。代表的には、変位センサを用いて、光透過性積層体の第1主面上を二次元的に走査してその高さを検出する。例えば、図3に示すようにして、光透過性積層体200の第1主面200a上を所定の間隔Lでライン状に走査してその高さを検出する。当該所定の間隔Lは、例えば1mm~100mm、好ましくは1mm~30mm、より好ましくは5mm~15mmである。
B. Displacement Data Acquisition Step In the displacement data acquisition step, the displacement sensor detects the height (displacement) of the first main surface of the light transmissive laminate to acquire displacement data. Typically, a displacement sensor is used to two-dimensionally scan the first main surface of the light transmissive laminate to detect its height. For example, as shown in FIG. 3, the first main surface 200a of the light transmissive laminate 200 is scanned linearly at a predetermined interval L to detect the height. The predetermined distance L is, for example, 1 mm to 100 mm, preferably 1 mm to 30 mm, more preferably 5 mm to 15 mm.
 変位センサによる第1主面の高さの検出は、撮像部(代表的には、ラインカメラ)の幅方向の視野毎に複数のラインに沿って行うことができる。例えば、図4に示す実施形態では、次のようにして第1主面の高さが検出される。まず、光透過性積層体の第1主面の検査対象領域を撮像部の幅方向の視野(図示例では、30mm)毎にN個の領域に分割する。ラインX1とX4とによって規定される領域1において、10mm間隔の4つのラインX1~X4におけるY方向の始点(座標Y)から終点(座標Y100)までの第1主面の高さを順次検出する。次いで、ラインX4とX7とによって規定される領域2において10mm間隔の4つのラインX4~X7におけるY方向の始点(座標Y)から終点(座標Y100)までの第1主面の高さを順次検出する(ラインX4上での高さ検出は省略してもよい)。当該手順を領域Nまで繰り返すことにより、光透過性積層体の第1主面全体または検査対象領域の全体について、変位データを得ることができる。後述するように、本発明の実施形態による検査方法においては、第1主面全体または検査対象領域の全体について、変位データを取得し、次いで、光学系の走査を行ってもよく、あるいは、撮像部の幅方向の視野毎に変位データ取得工程から欠点の座標マップ作成工程までを連続して行い、視野を順次ずらして同様の操作を繰り返すことによって第1主面全体または検査対象領域の全体について検査を行ってもよい。よって、上記視野毎に一方向に第1主面の高さを検出することにより、光学系の走査パターン(走査の向きおよび位置)と一致した変位データを得ることができ、後者の実施形態において検査の効率化に寄与し得る。 Detection of the height of the first main surface by the displacement sensor can be performed along a plurality of lines for each field of view in the width direction of the imaging section (typically, a line camera). For example, in the embodiment shown in FIG. 4, the height of the first main surface is detected as follows. First, the area to be inspected on the first main surface of the light-transmissive laminate is divided into N areas for each field of view (30 mm in the illustrated example) in the width direction of the imaging section. In the area 1 defined by the lines X1 and X4, the height of the first main surface from the starting point (coordinate Y 0 ) to the end point (coordinate Y 100 ) in the Y direction of the four lines X1 to X4 at intervals of 10 mm is sequentially measured. To detect. Next, in the region 2 defined by the lines X4 and X7, the height of the first main surface from the starting point (coordinate Y 0 ) to the end point (coordinate Y 100 ) in the Y direction of the four lines X4 to X7 at intervals of 10 mm is Detection is performed sequentially (height detection on line X4 may be omitted). By repeating the procedure up to area N, displacement data can be obtained for the entire first main surface of the light-transmissive laminate or the entire inspection target area. As will be described later, in the inspection method according to the embodiment of the present invention, displacement data may be acquired for the entire first main surface or the entire inspection target area, and then the optical system may be scanned, or an image may be captured. The steps from obtaining the displacement data to creating the coordinate map of the defect are continuously performed for each field of view in the width direction of the part, and the same operation is repeated while sequentially shifting the field of view. You can do an inspection. Therefore, by detecting the height of the first main surface in one direction for each field of view, it is possible to obtain displacement data that matches the scanning pattern (scanning direction and position) of the optical system. It can contribute to efficiency of inspection.
 得られた変位データを、任意の適切なアルゴリズムによって処理することにより、2Dまたは3D形状プロファイル(以下、変位マップとも称する)が得られ得る。例えば、第1主面の全体または所定の領域の変位マップ、任意の断面における変位マップ、任意の側面から見た場合の変位マップ等が得られ得る。このような処理としては、変位センサに付属の形状解析プログラム、目的に応じて作製されたプログラム等の任意の適切なコンピュータープログラム(例えば、Auto Focus全面変位Scanモードアルゴリズム)を用いた処理が挙げられる。 A 2D or 3D shape profile (hereinafter also referred to as a displacement map) can be obtained by processing the obtained displacement data with any suitable algorithm. For example, a displacement map of the entire first main surface or a predetermined region, a displacement map in any cross section, a displacement map when viewed from any side, etc. can be obtained. Examples of such processing include processing using any suitable computer program such as a shape analysis program attached to the displacement sensor, a program created according to the purpose, etc. (for example, Auto Focus Whole Displacement Scan Mode Algorithm). .
C.走査回数決定工程
 後述するように、欠点の座標マップ作成工程においては、光透過性積層体をその厚み方向全体にわたって検査する観点から、光透過性積層体の第1主面の高さ位置と撮像部の焦点の高さ位置との距離を所定距離Pずつ変化させて複数回の走査が行われ得る。よって、1つの実施形態において、欠点の座標マップ作成工程の前に走査回数を決定する。
C. Scan Count Determination Step As will be described later, in the defect coordinate map creation step, from the viewpoint of inspecting the light-transmitting laminate over the entire thickness direction, the height position of the first main surface of the light-transmitting laminate and the imaging A plurality of scans can be performed by changing the distance from the height position of the focus of the part by a predetermined distance P. Thus, in one embodiment, the number of scans is determined prior to the defect coordinate mapping process.
 走査回数は、例えば、変位データに基づいて決定される光透過性積層体の第1主面の基準高さ、最大高さおよび最小高さ(以下、単に、光透過性積層体の基準高さ、最大高さおよび最小高さと称する場合がある)と、光透過性積層体の厚みとに基づいて決定され得る。 The number of scans is, for example, the reference height, maximum height and minimum height of the first main surface of the light-transmitting laminate determined based on the displacement data (hereinafter simply referred to as the reference height of the light-transmitting laminate , may be referred to as maximum height and minimum height) and the thickness of the light transmissive laminate.
 光透過性積層体の基準高さとしては、第1主面の任意の地点の高さを基準高さとすることができる。1つの実施形態において、光透過性積層体の基準高さは、第1主面に関して得られた変位データにおける最大高さおよび最小高さの中央値であり、両者の算術平均として算出される。また、光透過性積層体の最大高さおよび最小高さはそれぞれ、当該変位データにおける最大高さおよび最小高さである。あるいは、当該変位データに基づいて外挿法、内挿法等により算出される想定最大高さおよび想定最小高さをそれぞれ、光透過性積層体の最大高さおよび最小高さとすることもできる。 As for the reference height of the light-transmitting laminate, the height of an arbitrary point on the first main surface can be used as the reference height. In one embodiment, the reference height of the light transmissive laminate is the median value of the maximum height and minimum height in the displacement data obtained with respect to the first principal surface, and is calculated as the arithmetic mean of both. Also, the maximum height and minimum height of the light transmissive laminate are the maximum height and minimum height in the displacement data, respectively. Alternatively, the assumed maximum height and the assumed minimum height calculated by extrapolation, interpolation, etc. based on the displacement data can be used as the maximum height and minimum height of the light-transmitting laminate, respectively.
 走査回数は、例えば、最大高さと基準高さとの差(|最大高さ-基準高さ|)を所定距離Pで除した商の小数点第1位を四捨五入した値をQa、最小高さと基準高さとの差(|最小高さ-基準高さ|)を所定距離Pで除した商の小数点第1位を四捨五入した値をQb、光透過性積層体の厚みを所定距離Pで除した商の小数点第1位を四捨五入した値をQcとした場合に、Qa+Qb+Qc以上(ただし、Qa+Qb+Qcが0の場合は1以上)に決定され得る。走査回数をQa+Qb+Qc以上とすることにより、光透過性積層体が皺や撓みを有する場合であっても、それらの影響を排除して、光透過性積層体を厚み方向の全体にわたって検査することができる。走査回数の上限は、特に制限されないが、生産タクトの観点から、走査回数は、例えば1回以上10回以下であってよい。 The number of scans is, for example, Qa, the value obtained by dividing the difference between the maximum height and the reference height (|maximum height−reference height|) by a predetermined distance P and rounding off to the first decimal place, and the minimum height and the reference height. Qb is the value obtained by rounding the quotient obtained by dividing the difference (|minimum height−reference height|) by the predetermined distance P, and the quotient obtained by dividing the thickness of the light-transmitting laminate by the predetermined distance P. When Qc is a value obtained by rounding to the first decimal place, it can be determined to be Qa+Qb+Qc or more (however, when Qa+Qb+Qc is 0, 1 or more). By setting the number of scans to Qa+Qb+Qc or more, even if the light-transmissive laminate has wrinkles or warps, the effects of these are eliminated, and the entire thickness direction of the light-transmissive laminate can be inspected. can. The upper limit of the number of scans is not particularly limited, but from the viewpoint of production takt time, the number of scans may be, for example, 1 or more and 10 or less.
 1つの実施形態において、走査回数は、第1主面よりも上方における第1の予備走査および/または第2主面よりも下方における第2の予備走査をさらに加えて、Qa+Qb+Qc+1またはQa+Qb+Qc+2とすることができる。第1の予備走査および/または第2の予備走査を行うことにより、光透過性積層体を厚み方向の全体にわたって確実に検査することができる。 In one embodiment, the number of scans is Qa+Qb+Qc+1 or Qa+Qb+Qc+2, further adding a first pre-scan above the first main surface and/or a second pre-scan below the second main surface. can be done. By performing the first pre-scanning and/or the second pre-scanning, it is possible to reliably inspect the light transmissive laminate over the entire thickness direction.
 図5を参照しながら、走査回数決定工程の1つの実施形態に関して、具体的な手順を説明する。本実施形態においては、図5(b)に示す変位マップから光透過性積層体の基準高さ、最大高さおよび最小高さを決定し、これらと光透過性積層体の厚みとに基づいて走査回数を決定する。なお、図5(b)に示す変位マップは、図5(a)において光透過性積層体200をY方向-側から見た場合の第1主面の表面変位を示す2D形状プロファイルであり、図5(a)に示すように、光透過性積層体200の第1主面において、変位センサ30で所定の間隔の4つライン(ラインA~ラインD)における表面変位を検出し、Auto Focus全面変位Scanモードアルゴリズムを用いた処理によって得られ得る(図5(b)中、実測値での最大高さは、ラインBにおける160μmであり、実測値での最小高さは、ラインCにおける-310μmである。また、内挿法で得られた想定最大高さおよび想定最小高さはそれぞれ、190μmおよび-340μmである。)。本実施形態においては、光透過性積層体の最大高さおよび最小高さとして、取得された変位データ(実測値)における最大高さおよび最小高さを用いる。また、光透過性積層体の厚み(実際の厚み(350μm)を平均屈折率(1.4)で除して算出した)は250μmであり、各走査における所定距離Pは100μmとする。なお、図5(b)における高さ0μmは、変位データの取得開始点の第1主面の高さ(最初に焦点が合った第1主面の高さ)である。
   手順A1:最大高さHmax(160μm)および最小高さHmin(-310μm)に基づいて、基準高さを-75μmに決定する。
   手順A2:Hmaxと基準高さとの差(235μm)を所定距離P(100μm)で除した商(2.35)の小数点第1位を四捨五入した値Qaを得る(Qa=2)。
   手順A3:Hminと基準高さとの差(235μm)を所定距離P(100μm)で除した商(2.35)の小数点第1位を四捨五入した値Qbを得る(Qb=2)。
   手順A4:光透過性積層体の厚み(250μm)を所定距離Pで除した商(2.5)の小数点第1位を四捨五入した値Qcを得る(Qc=3)。
   手順A5:Qa、QbおよびQcに基づいて走査回数を決定する(Qa+Qb+Qc以上として適用される走査回数は7以上であり、第1の予備走査および第2の予備走査のいずれか一方または両方を行う場合の走査回数はそれぞれ、8または9であり得る)。
A specific procedure for one embodiment of the scan number determination process will be described with reference to FIG. In this embodiment, the reference height, maximum height and minimum height of the light-transmitting laminate are determined from the displacement map shown in FIG. Determine the number of scans. The displacement map shown in FIG. 5(b) is a 2D shape profile showing the surface displacement of the first main surface when the light transmissive laminate 200 is viewed from the Y-direction − side in FIG. 5(a). As shown in FIG. 5(a), on the first main surface of the light-transmitting laminate 200, the displacement sensor 30 detects the surface displacement in four lines (line A to line D) at predetermined intervals, and auto focus is performed. (In FIG. 5(b), the maximum measured value is 160 μm at line B, and the minimum measured value is − 310 μm, and the assumed maximum and minimum heights obtained by interpolation are 190 μm and −340 μm, respectively). In this embodiment, the maximum height and minimum height in the obtained displacement data (actual measurement values) are used as the maximum height and minimum height of the light-transmitting laminate. The thickness of the light-transmitting laminate (calculated by dividing the actual thickness (350 μm) by the average refractive index (1.4)) is 250 μm, and the predetermined distance P in each scan is 100 μm. Note that the height of 0 μm in FIG. 5B is the height of the first main surface at the acquisition start point of the displacement data (the height of the first main surface that is initially focused).
Procedure A1: Based on the maximum height H max (160 μm) and the minimum height H min (−310 μm), determine a reference height of −75 μm.
Procedure A2: A value Qa is obtained by rounding off the quotient (2.35) obtained by dividing the difference (235 μm) between H max and the reference height by the predetermined distance P (100 μm) (Qa=2).
Procedure A3: A value Qb is obtained by rounding off the quotient (2.35) obtained by dividing the difference (235 μm) between H min and the reference height by the predetermined distance P (100 μm) (Qb=2).
Step A4: A value Qc is obtained by rounding off the quotient (2.5) obtained by dividing the thickness (250 μm) of the light-transmissive laminate by the predetermined distance P (Qc=3).
Procedure A5: Determine the number of scans based on Qa, Qb, and Qc (the number of scans applied as Qa+Qb+Qc or more is 7 or more, and perform either or both of the first prescan and the second prescan The number of scans in each case can be 8 or 9).
D.欠点の座標マップ作成工程
 欠点の座標マップは、光透過性積層体に対して検査光を走査し、走査画像を得ることによって作成される。このとき、変位データに基づいて、光学系(撮像部)の焦点の高さ位置と第1主面の高さ位置との距離を一定に維持しながら走査する。1つの実施形態において、撮像部の焦点が第1主面の変位パターンに追従するように焦点の高さ位置を調整しながら走査する。
D. Defect Coordinate Map Creation Step A defect coordinate map is created by scanning the light-transmissive laminate with inspection light and obtaining a scanned image. At this time, based on the displacement data, scanning is performed while maintaining a constant distance between the height position of the focal point of the optical system (imaging unit) and the height position of the first main surface. In one embodiment, scanning is performed while adjusting the height position of the focal point so that the focal point of the imaging unit follows the displacement pattern of the first main surface.
 変位データと走査位置との位置合わせは、例えば、予め光透過性積層体の第1主面に基準マークを設けておき、当該基準マークの位置座標に基づいて行うことができる。あるいは、光透過性積層体の角部を基準として位置合わせを行うこともできる。 Alignment between the displacement data and the scanning position can be performed, for example, by providing a reference mark in advance on the first main surface of the light-transmitting laminate and based on the position coordinates of the reference mark. Alternatively, alignment can be performed using the corners of the light-transmissive laminate as a reference.
 走査は、撮像部と光透過性積層体の相対的な位置関係を変化させることによって、光透過性積層体の検査対象領域全体に対して二次元的に行われ得る。好ましくは、撮像部の走査方向と変位センサの走査方向とは平行であり、より好ましくは同じ向きである。 By changing the relative positional relationship between the imaging unit and the light-transmitting laminate, scanning can be performed two-dimensionally over the entire inspection target area of the light-transmitting laminate. Preferably, the scanning direction of the imaging unit and the scanning direction of the displacement sensor are parallel, more preferably the same direction.
 上記走査においては、第1主面の高さ位置として、任意の適切なアルゴリズムを用いて変位データから算出される値を用いることができる。例えば、撮像部としてラインカメラを用いる場合、ラインカメラの幅方向(例えば、X方向)の視野内における第1主面の最大高さと最小高さとの中央値を第1主面の高さ位置とすることができ、当該視野毎に、走査方向(例えば、Y方向)における第1主面の高さ位置の変化に追従するように、ラインスキャンカメラの焦点の高さ位置を変化させながら走査することができる。例えば、図4を参照しながら具体的に説明すると、領域1に関して、座標Yで検出されるラインX1~X4における最大高さと最小高さの中央値、座標Yで検出されるラインX1~X4における最大高さと最小高さの中央値、・・・、座標Y100で検出されるラインX1~X4における最大高さと最小高さの中央値、のようにYからY100までのY座標の移動に沿って変化する第1主面の高さ位置に追従するように、ラインカメラの焦点の高さ位置を変化させながら走査することができる。 In the above scanning, a value calculated from displacement data using any appropriate algorithm can be used as the height position of the first main surface. For example, when a line camera is used as the imaging unit, the median value between the maximum height and the minimum height of the first main surface within the field of view in the width direction (eg, X direction) of the line camera is taken as the height position of the first main surface. Scanning is performed while changing the height position of the focal point of the line scan camera so as to follow the change in the height position of the first main surface in the scanning direction (for example, the Y direction) for each field of view. be able to. For example , specifically referring to FIG. Y coordinates from Y 0 to Y 100 , such as the median of maximum and minimum heights at X4, . It is possible to scan while changing the height position of the focal point of the line camera so as to follow the height position of the first main surface that changes along with the movement of the line camera.
 光透過性積層体の走査は、1回または複数回行われる。好ましくは、走査回数決定工程で決定された複数回の走査が行われる。 The scanning of the light-transmissive laminate is performed once or multiple times. Preferably, a plurality of scans determined in the scan count determination step are performed.
 走査が1回のみ行われる場合、第1主面上に(換言すると、第1主面の高さ位置に)撮像部の焦点を合わせた状態で、または、光透過性積層体内部の任意の深度に撮像部の焦点を合わせた状態で、検査対象領域全体に対して走査が行われ、当該走査において得られた走査画像が欠点の座標マップ(XY座標マップ)となる。 When scanning is performed only once, with the imaging unit focused on the first main surface (in other words, at the height position of the first main surface), or at an arbitrary position inside the light-transmitting laminate With the imaging unit focused on the depth, the entire inspection target area is scanned, and the scanned image obtained by the scanning becomes the defect coordinate map (XY coordinate map).
 走査が複数回行われる場合、図6に示すように、撮像部の焦点を所定距離Pずつずらしながら走査が行われ得る。所定距離Pは、鮮明な走査画像が得られる範囲において制限されず、光学系の焦点深度(被写界深度)に応じて適切に設定され得る。所定距離Pは、例えば10μm~100μmであり、好ましくは20μm~80μmであり、より好ましくは40μm~60μmである。このような構成によれば、適切な走査回数で、厚み方向に存在する実質的にすべての欠点を検出することができる。なお、図示例では、Auto Focusシステムを用いて光学系(撮像部)をZ方向に移動させることにより、焦点の位置合わせを行っているが、焦点の位置合わせは、他の手段によって行われてもよい。例えば、レンズ等により撮像部の焦点距離を変更してもよく、サンプルステージの高さを変化させてもよく、これらの手段を組み合わせてもよい。 When scanning is performed multiple times, scanning can be performed while shifting the focus of the imaging unit by a predetermined distance P, as shown in FIG. The predetermined distance P is not limited within a range in which a clear scanned image can be obtained, and can be appropriately set according to the depth of focus (depth of field) of the optical system. The predetermined distance P is, for example, 10 μm to 100 μm, preferably 20 μm to 80 μm, more preferably 40 μm to 60 μm. According to such a configuration, substantially all defects existing in the thickness direction can be detected with an appropriate number of scans. In the illustrated example, the focus is adjusted by moving the optical system (imaging unit) in the Z direction using the Auto Focus system, but the focus is adjusted by other means. good too. For example, the focal length of the imaging unit may be changed by a lens or the like, the height of the sample stage may be changed, or these means may be combined.
 上述のように、第1の予備走査および第2の予備捜査を行う場合、光透過性積層体200の第1主面200aの高さ位置から厚み方向上方へ(Qa+1)×Pの距離の高さから厚み方向下方へ(Qb+Qc)×Pの距離の高さまでの領域を、走査毎に、撮像部の焦点高さ位置と第1主面高さ位置との距離を所定距離Pずつ変化させながら走査する。この場合、走査の順序は特に制限されない。具体的には、第1の予備走査を最初に行い、厚み方向下方に向かって撮像部の焦点を所定距離Pずつずらしながら走査を行い、最後に第2の予備走査を行うことができる。また例えば、第1主面上に(換言すると、第1主面の高さ位置に)撮像部の焦点を合わせた状態で最初の走査を行い、次いで、その厚み方向下方に向かって撮像部の焦点をずらしながら順次走査を行い、第2の予備走査の終了後に第1主面の高さ位置から厚み方向上方に向かって撮像部の焦点をずらしながら順次走査を行い、最後に第1の予備走査を行うことができる。また例えば、第1主面上に(換言すると、第1主面の高さ位置に)撮像部の焦点を合わせた状態で最初の走査を行い、次いで、その厚み方向上方に向かって撮像部の焦点をずらしながら順次走査を行い、第1の予備走査の終了後に第1主面の高さ位置から厚み方向下方に向かって撮像部の焦点をずらしながら順次走査を行い、最後に第2の予備走査を行うことができる。 As described above, when performing the first preliminary scan and the second preliminary scan, from the height position of the first main surface 200a of the light-transmitting laminate 200 to the thickness direction upward (Qa + 1) × P distance height From the height to the height of the distance (Qb + Qc) × P downward in the thickness direction, while changing the distance between the focal height position of the imaging unit and the first principal surface height position by a predetermined distance P for each scan. Scan. In this case, the scanning order is not particularly limited. Specifically, the first pre-scanning can be performed first, the scanning can be performed while shifting the focal point of the imaging unit downward in the thickness direction by a predetermined distance P, and finally the second pre-scanning can be performed. Further, for example, the first scanning is performed with the imaging unit focused on the first main surface (in other words, at the height position of the first main surface), and then the imaging unit is moved downward in the thickness direction. Sequential scanning is performed while shifting the focus, and after completion of the second preliminary scanning, sequential scanning is performed while shifting the focus of the imaging unit upward in the thickness direction from the height position of the first main surface, and finally the first preliminary scanning is performed. Scanning can be performed. Further, for example, the first scanning is performed with the imaging unit focused on the first main surface (in other words, at the height position of the first main surface), and then the imaging unit moves upward in the thickness direction. Sequential scanning is performed while shifting the focus, and after completion of the first preliminary scanning, sequential scanning is performed while shifting the focus of the imaging unit downward in the thickness direction from the height position of the first main surface, and finally the second preliminary scanning is performed. Scanning can be performed.
 具体例として、図5に示す実施形態において、最大高さ、最小高さ、標準高さおよび光透過性積層体厚みをそれぞれ、160μm、-310μm、-75μmおよび250μmとし、所定距離Pを100μmとして、走査回数を9回に決定した場合(Qa+Qb+Qcにより算出される操作回数(7回)に第1の予備走査および第2の予備走査を追加した場合)、撮像部の焦点の高さ位置が第1主面の高さ位置から上方に300μmの距離を維持するように1回目の走査を行い、次いで、当該焦点の高さ位置を下方へ100μmずつずらしながら、計9回の走査を行うことができる。 As a specific example, in the embodiment shown in FIG. 5, the maximum height, minimum height, standard height, and thickness of the light-transmitting laminate are 160 μm, −310 μm, −75 μm, and 250 μm, respectively, and the predetermined distance P is 100 μm. , when the number of scans is determined to be 9 (when the first prescan and the second prescan are added to the number of operations (7) calculated by Qa+Qb+Qc), the height position of the focal point of the imaging unit is A first scan is performed so as to maintain a distance of 300 μm upward from the height position of one principal surface, and then a total of 9 scans are performed while shifting the height position of the focal point downward by 100 μm. can.
 走査が複数回行われる場合、各走査で得られた走査画像を予備的座標マップとして、得られた複数の予備的座標マップを統合することにより、欠点の座標マップ(統合XY座標マップ)が作成される。 When scanning is performed multiple times, a defect coordinate map (integrated XY coordinate map) is created by integrating a plurality of obtained preliminary coordinate maps using the scanned image obtained in each scanning as a preliminary coordinate map. be done.
 例えば図7は、5つの予備的座標マップを統合して欠点の座標マップ(統合XY座標マップ)を作成する一例を示す。図7のように、各画像データを統合することにより、それぞれの座標マップに存在する欠点を共通のXY座標上で表すことができる。このようにして、得られた欠点の座標マップ(統合XY座標マップ)においては、光透過性積層体における実質的にすべての欠点がXY座標(2次元座標)に表されている。 For example, FIG. 7 shows an example of creating a defect coordinate map (integrated XY coordinate map) by integrating five preliminary coordinate maps. By integrating each image data as shown in FIG. 7, defects present in each coordinate map can be expressed on common XY coordinates. Thus, in the obtained defect coordinate map (integrated XY coordinate map), substantially all defects in the light-transmissive laminate are represented by XY coordinates (two-dimensional coordinates).
E.欠点検出工程
 欠点検出工程においては、欠点の座標マップに基づいて、欠点を検出する。統合XY座標マップに基づいて欠点を検出する場合は、全ての予備的座標マップにおいて、XY座標から同一欠点を特定し、最もコントラスト値が高い画像を欠点として検出することができ、さらには、当該画像が得られた際の焦点の位置から欠点の深度(Z座標)を特定することができる。
E. Defect Detection Step In the defect detection step, defects are detected based on the defect coordinate map. When detecting defects based on the integrated XY coordinate map, the same defect can be identified from the XY coordinates in all the preliminary coordinate maps, and the image with the highest contrast value can be detected as the defect. The depth (Z coordinate) of the defect can be specified from the focal position when the image was obtained.
 本発明の実施形態による検査方法によれば、50μm以下、好ましくは30μm以下、より好ましくは20μm以下、さらに好ましくは10μm以下のサイズ(最大長さ)の欠点を検出することができる。検出される欠点のサイズは、例えば1μm以上、また例えば3μm以上、また例えば8μm以上であり得る。 According to the inspection method according to the embodiment of the present invention, defects with a size (maximum length) of 50 μm or less, preferably 30 μm or less, more preferably 20 μm or less, and even more preferably 10 μm or less can be detected. The size of the detected defects can be for example 1 μm or more, also for example 3 μm or more, also for example 8 μm or more.
 以上のようにして、欠点の検出が行われ得る。検査終了後、光透過性積層体は、上記のとおり、代表的には最終製品サイズに裁断されて出荷され得る。これも上記のとおり、検査終了後には必要に応じて、剥離した表面保護フィルムを光透過性積層体に再度剥離可能に仮着してもよい。 Defects can be detected as described above. After inspection, the light-transmitting laminate can typically be cut to the final product size and shipped as described above. Also as described above, after the inspection is completed, the peeled surface protective film may be re-attached temporarily to the light-transmissive laminate in a peelable manner, if necessary.
 上記B項~E項で説明した本発明の実施形態による光透過性積層体の検査方法においては、変位データ取得工程から欠点の座標マップ作成工程までを撮像部(ラインカメラ)の幅方向の視野毎に行ってもよい。撮像部の幅方向の視野毎に変位データ取得工程から欠点の座標マップ作成工程までを連続して行うことにより、変位データと走査位置との位置合わせが不要または極めて容易となり、また、走査領域毎に走査回数を最適化できることから、高精度な欠点の検出を効率的に行うことができる。目的に応じて、変位データ取得工程から欠点検出工程までを撮像部(ラインカメラ)の幅方向の視野毎に行ってもよい。 In the method for inspecting a light-transmissive laminate according to the embodiment of the present invention described in the above items B to E, from the displacement data acquisition step to the defect coordinate map creation step, the field of view in the width direction of the imaging unit (line camera) You can go every By continuously performing from the displacement data acquisition step to the defect coordinate map creation step for each field of view in the width direction of the imaging unit, it becomes unnecessary or extremely easy to align the displacement data and the scanning position. Since the number of scans can be optimized, highly accurate defect detection can be performed efficiently. Depending on the purpose, the steps from the displacement data acquisition step to the defect detection step may be performed for each field of view in the width direction of the imaging unit (line camera).
 本発明の実施形態による光透過性積層体の検査方法は、画像表示装置の製造過程において光学フィルム、粘着剤シート等の欠点の検出に好適に用いられ得る。 The method for inspecting a light-transmitting laminate according to an embodiment of the present invention can be suitably used for detecting defects in optical films, pressure-sensitive adhesive sheets, etc. in the manufacturing process of image display devices.
 10  サンプルステージ
 20  光学系
 30  変位センサ
 40  Z軸移動制御部
 50  支持機構
 60  XY軸移動制御部
100  検査装置
200  光透過性積層体
 
REFERENCE SIGNS LIST 10 sample stage 20 optical system 30 displacement sensor 40 Z-axis movement controller 50 support mechanism 60 XY-axis movement controller 100 inspection device 200 light transmissive laminate

Claims (10)

  1.  第1主面と第2主面とを有する枚葉の光透過性積層体の検査方法であって、
     変位センサで該光透過性積層体の該第1主面の高さを検出して、変位データを得ること、
     光学系で該光透過性積層体を走査して、それにより得られた走査画像から欠点の座標マップを作成すること、および、
     該欠点の座標マップに基づいて、欠点を検出すること、を含み、
     該光透過性積層体の走査が、該変位データに基づいて、該走査画像を得る際の該光学系の焦点の高さ位置と該第1主面の高さ位置との距離を一定に維持しながら行われる、検査方法。
    A method for inspecting a sheet-fed light transmissive laminate having a first main surface and a second main surface, comprising:
    obtaining displacement data by detecting the height of the first main surface of the light transmissive laminate with a displacement sensor;
    scanning the light transmissive laminate with an optical system to create a coordinate map of the defects from the resulting scanned image; and
    detecting a defect based on the coordinate map of the defect;
    Scanning of the light transmissive laminate maintains a constant distance between the height position of the focal point of the optical system and the height position of the first main surface when obtaining the scanned image based on the displacement data. An inspection method that is carried out while
  2.  前記欠点の座標マップを作成することが、
     前記光学系で前記光透過性積層体を複数回走査して、複数の予備的座標マップを作成すること、および、
     該複数の予備的座標マップを統合すること、を含み、
     各走査における前記焦点の高さ位置と前記第1主面の高さ位置との距離が、所定距離Pずつ異なる、請求項1に記載の検査方法。
    creating a coordinate map of the defects;
    scanning the light transmissive laminate multiple times with the optical system to create a plurality of preliminary coordinate maps; and
    integrating the plurality of preliminary coordinate maps;
    2. The inspection method according to claim 1, wherein the distance between the height position of the focal point and the height position of the first main surface in each scan differs by a predetermined distance P.
  3.  前記変位データに基づいて決定される前記光透過性積層体の第1主面の基準高さ、最大高さおよび最小高さと、前記光透過性積層体の厚みとに基づいて、走査回数を決定することをさらに含み、
     該最大高さと基準高さとの差を前記所定距離Pで除した商の小数点第1位を四捨五入した値をQa、該最小高さと基準高さとの差を前記所定距離Pで除した商の小数点第1位を四捨五入した値をQb、前記光透過性積層体の厚みを前記所定距離Pで除した商の小数点第1位を四捨五入した値をQc、とした場合に、該走査回数が、Qa+Qb+Qc以上(ただし、Qa+Qb+Qc=0のときは1以上)である、請求項2に記載の検査方法。
    The number of scans is determined based on the reference height, maximum height, and minimum height of the first main surface of the light-transmitting laminate determined based on the displacement data, and the thickness of the light-transmitting laminate. further comprising:
    Qa is the value obtained by rounding the quotient obtained by dividing the difference between the maximum height and the reference height by the predetermined distance P, and the decimal point of the quotient obtained by dividing the difference between the minimum height and the reference height by the predetermined distance P. When Qb is the value rounded to the first place, and Qc is the value obtained by dividing the thickness of the light-transmissive laminate by the predetermined distance P and the first decimal place is rounded, the number of scans is Qa + Qb + Qc. 3. The inspection method according to claim 2, wherein the number is equal to or more (however, 1 or more when Qa+Qb+Qc=0).
  4.  前記走査回数が、Qa+Qb+Qc+2であり、
     前記光透過性積層体の第1主面の高さ位置から厚み方向上方へ(Qa+1)×Pの距離の高さから厚み方向下方へ(Qb+Qc)×Pの距離の高さまでの領域を、前記焦点の高さ位置と前記第1主面の高さ位置との距離を前記所定距離Pずつ変化させながら走査する、請求項3に記載の検査方法。
    the number of scans is Qa+Qb+Qc+2;
    The area from the height of the distance of (Qa+1)×P in the thickness direction upward from the height position of the first main surface of the light-transmitting laminate to the height of the distance (Qb+Qc)×P in the thickness direction downward, 4. The inspection method according to claim 3, wherein scanning is performed while changing the distance between the height position of the focal point and the height position of the first main surface by the predetermined distance P.
  5.  前記所定距離Pが、10μm~100μmである、請求項3または4に記載の検査方法。 The inspection method according to claim 3 or 4, wherein the predetermined distance P is 10 µm to 100 µm.
  6.  前記光学系が、ラインカメラを含み、
     前記変位データを得ることおよび前記欠点の座標マップを作成することが、該ラインカメラの幅方向の視野毎に連続して行われる、請求項1から5のいずれかに記載の検査方法。
    the optical system includes a line camera,
    6. The inspection method according to claim 1, wherein obtaining the displacement data and creating the coordinate map of the defect are performed continuously for each field of view in the width direction of the line camera.
  7.  50μm以下のサイズの欠点を検出する、請求項1から6のいずれかに記載の検査方法。 The inspection method according to any one of claims 1 to 6, which detects defects with a size of 50 μm or less.
  8.  前記光透過性積層体が、光学フィルム、粘着剤シート、およびこれらの組み合わせから選択される、請求項1から7のいずれかに記載の検査方法。 The inspection method according to any one of claims 1 to 7, wherein the light-transmitting laminate is selected from an optical film, an adhesive sheet, and a combination thereof.
  9.  前記光学フィルムが、偏光板、位相差板、およびこれらを含む積層体から選択される、請求項8に記載の検査方法。 The inspection method according to claim 8, wherein the optical film is selected from a polarizing plate, a retardation plate, and a laminate containing these.
  10.  前記光透過性積層体の厚みが300μm以下である、請求項1から9のいずれかに記載の検査方法。
     
    The inspection method according to any one of claims 1 to 9, wherein the thickness of the light transmissive laminate is 300 µm or less.
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