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JPWO2023021854A1 - - Google Patents

Info

Publication number
JPWO2023021854A1
JPWO2023021854A1 JP2022545358A JP2022545358A JPWO2023021854A1 JP WO2023021854 A1 JPWO2023021854 A1 JP WO2023021854A1 JP 2022545358 A JP2022545358 A JP 2022545358A JP 2022545358 A JP2022545358 A JP 2022545358A JP WO2023021854 A1 JPWO2023021854 A1 JP WO2023021854A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022545358A
Other languages
Japanese (ja)
Other versions
JPWO2023021854A5 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023021854A1 publication Critical patent/JPWO2023021854A1/ja
Publication of JPWO2023021854A5 publication Critical patent/JPWO2023021854A5/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8858Flaw counting
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8861Determining coordinates of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2022545358A 2021-08-17 2022-06-29 Pending JPWO2023021854A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021132506 2021-08-17
PCT/JP2022/025868 WO2023021854A1 (en) 2021-08-17 2022-06-29 Method for inspecting optically transparent laminate

Publications (2)

Publication Number Publication Date
JPWO2023021854A1 true JPWO2023021854A1 (en) 2023-02-23
JPWO2023021854A5 JPWO2023021854A5 (en) 2024-07-08

Family

ID=85240457

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022545358A Pending JPWO2023021854A1 (en) 2021-08-17 2022-06-29

Country Status (5)

Country Link
JP (1) JPWO2023021854A1 (en)
KR (1) KR20240045215A (en)
CN (1) CN117795288A (en)
TW (1) TW202309511A (en)
WO (1) WO2023021854A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI853522B (en) * 2023-04-07 2024-08-21 住華科技股份有限公司 Optical film defect detection system and optical film defect detection method using the same

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005062165A (en) 2003-07-28 2005-03-10 Nitto Denko Corp Inspection method for sheet-shaped product, inspection system, sheet-shaped product and image display apparatus
JP6191204B2 (en) * 2012-09-27 2017-09-06 日産自動車株式会社 Appearance inspection apparatus and appearance inspection method for automobile body
JP2017166903A (en) * 2016-03-15 2017-09-21 株式会社大真空 Defect inspection device and defect inspection method
CN110998298B (en) * 2017-08-24 2023-01-06 日本电气硝子株式会社 Method for manufacturing plate-shaped glass
JP2019219357A (en) * 2018-06-22 2019-12-26 名古屋電機工業株式会社 Imaging apparatus, imaging method, and imaging program
JP7451227B2 (en) * 2020-02-28 2024-03-18 日東電工株式会社 Inspection method for optically transparent laminates

Also Published As

Publication number Publication date
TW202309511A (en) 2023-03-01
WO2023021854A1 (en) 2023-02-23
CN117795288A (en) 2024-03-29
KR20240045215A (en) 2024-04-05

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