WO2022249648A1 - 組成物およびそれを用いた電子デバイスの製造方法 - Google Patents
組成物およびそれを用いた電子デバイスの製造方法 Download PDFInfo
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- WO2022249648A1 WO2022249648A1 PCT/JP2022/010967 JP2022010967W WO2022249648A1 WO 2022249648 A1 WO2022249648 A1 WO 2022249648A1 JP 2022010967 W JP2022010967 W JP 2022010967W WO 2022249648 A1 WO2022249648 A1 WO 2022249648A1
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- WIPO (PCT)
- Prior art keywords
- electrode
- transport layer
- hole transport
- ether
- type dopant
- Prior art date
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Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/14—Carrier transporting layers
- H10K50/15—Hole transporting layers
- H10K50/155—Hole transporting layers comprising dopants
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/80—Constructional details
- H10K30/81—Electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/12—Light sources with substantially two-dimensional radiating surfaces
- H05B33/26—Light sources with substantially two-dimensional radiating surfaces characterised by the composition or arrangement of the conductive material used as an electrode
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/40—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation comprising a p-i-n structure, e.g. having a perovskite absorber between p-type and n-type charge transport layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/50—Photovoltaic [PV] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/12—Deposition of organic active material using liquid deposition, e.g. spin coating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/12—Deposition of organic active material using liquid deposition, e.g. spin coating
- H10K71/15—Deposition of organic active material using liquid deposition, e.g. spin coating characterised by the solvent used
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/30—Doping active layers, e.g. electron transporting layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/60—Forming conductive regions or layers, e.g. electrodes
- H10K71/611—Forming conductive regions or layers, e.g. electrodes using printing deposition, e.g. ink jet printing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/50—Organic perovskites; Hybrid organic-inorganic perovskites [HOIP], e.g. CH3NH3PbI3
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the present disclosure relates to a composition and a method for manufacturing an electronic device using the composition.
- Many electronic devices have a structure in which a hole transport layer or an electron transport layer is in contact with a photoelectric conversion layer in order to exhibit functions such as light absorption, light emission, amplification, or rectification. Only electrons are extracted or supplied in one direction.
- the hole-transporting layer is a layer that allows holes to enter and exit from the valence band of the adjacent photoelectric conversion layer, and has the function of insulating electrons in the conduction band of the same photoelectric conversion layer.
- the electron transport layer is a layer having a function of allowing electrons in and out of the conduction band of the adjacent photoelectric conversion layer and insulating holes in the valence band of the same photoelectric conversion layer.
- hole-transporting materials exist as the main material that constitutes the hole-transporting layer, but there are few materials that have a hole concentration sufficient to function as the hole-transporting layer of electronic devices by themselves. Additives are often added to the hole-transporting material to obtain the required hole concentration. That is, the additive has the function of depriving the hole transport material of electrons in the valence band.
- a perovskite solar cell for example, has a structure in which a first electrode, a photoelectric conversion layer, a hole transport layer, and a second electrode are formed in this order.
- An electron transport layer may be further positioned between the first electrode and the photoelectric conversion layer.
- the photoelectric conversion layer is the layer that absorbs light and generates electrons and holes.
- the hole transport layer is a layer that conducts only holes generated in the photoelectric conversion layer to the second electrode and insulates electrons.
- the electron transport layer is a layer that conducts only electrons generated in the photoelectric conversion layer to the first electrode and insulates holes (Non-Patent Document 1).
- An organic thin film solar cell has, for example, a structure in which a first electrode, a photoelectric conversion layer, a hole transport layer, and a second electrode are formed in this order.
- the details of the operating principle are different from perovskite solar cells, but the hole-transporting layer does not conduct electrons, but conducts only holes to the second electrode. is the same as (Patent Document 1).
- An organic EL light-emitting element having an organic compound as a light-emitting layer has, for example, a structure in which a first electrode, a light-emitting layer, a hole transport layer, and a second electrode are formed in this order.
- a hole transport layer in an organic EL light-emitting device operates differently from the perovskite solar cell and organic thin-film solar cell described above in that it is a functional layer that does not conduct electrons to the light-emitting layer but only conducts holes. However, they are the same in that the hole transport layer has the function of not conducting electrons but conducting only holes (Patent Document 2).
- the hole transport layer is a component that plays a central role in the operation of electronic devices.
- the performance of the electronic device tends to be low (Non-Patent Document 2).
- Patent document 3 discloses an electrode containing a dopant for the electron transport layer.
- An object of the present disclosure is to provide a composition suitable for improving the performance of electronic devices.
- a composition of the present disclosure includes a conductive material, a p-type dopant, and a solvent.
- Said solvent comprises at least one compound selected from the group consisting of alcohols, aliphatic hydrocarbons, siloxanes, esters and ethers.
- compositions suitable for improving the performance of electronic devices are provided.
- FIG. 1 is a flow chart showing an example of the manufacturing method according to the second embodiment.
- FIG. 2 shows a cross-sectional view of a schematic configuration of a solar cell 100 obtained by the manufacturing method according to the second embodiment.
- FIG. 3 shows a cross-sectional view of a schematic configuration of a solar cell 200 obtained by the manufacturing method according to the second embodiment.
- FIG. 4 is a flow chart showing an example of the manufacturing method according to the third embodiment.
- FIG. 5 shows a cross-sectional view of a schematic configuration of a solar cell 300 obtained by the manufacturing method according to the third embodiment.
- FIG. 6 shows a cross-sectional view of a schematic configuration of a solar cell 400 obtained by the manufacturing method according to the third embodiment.
- a composition according to the first embodiment includes a conductive material, a p-type dopant, and a solvent.
- the solvent contains at least one compound selected from the group consisting of alcohols, aliphatic hydrocarbons, siloxanes, esters and ethers.
- the composition according to the first embodiment is used, for example, as ink for forming electrodes.
- the composition according to the first embodiment is used, for example, in electronic devices.
- An electronic device comprising, for example, a first electrode, a photoelectric conversion layer, a hole transport layer, and a second electrode in this order is, for example, a solar cell.
- the concentration of holes in the hole transport layer is can suppress the decrease in Therefore, by manufacturing an electronic device using the composition according to the first embodiment, the performance of the electronic device can be improved.
- p-type dopant refers to a material that functions as an acceptor when added to a hole-transporting material that constitutes a hole-transporting layer in an electronic device.
- a hole-transporting material is a material that allows the injection and ejection of holes and rejects the injection and ejection of electrons.
- a conductive material is a material that allows the injection and emission of holes and electrons.
- the conductive material may contain at least one selected from the group consisting of metals, conductive carbon, and conductive compounds.
- the conductive material may be powder.
- alkali metals and alkaline earth metals that easily combine with oxygen and water are somewhat difficult to use, but there are no restrictions as long as they can be powdered.
- conductive carbon there are various forms of conductive carbon depending on the manufacturing method, but one with high conductivity is desirable.
- Examples of conductive carbon are carbon black, graphene, carbon nanotubes or graphite.
- the carbon black may be, for example, carbon black #3030B, #3050B, #3230B, or #3400B manufactured by Mitsubishi Chemical Corporation.
- Examples of conductive compounds are fluorine-doped tin oxide ( SnO2 :F), indium tin oxide (ITO), Al-doped zinc oxide (ZnO:Al), Ga-doped zinc oxide (ZnO:Ga), Nb-doped titanium oxide. (TiO2:Nb), barium tin oxide (BTO), or titanium nitride (TiN).
- the conductive material When the conductive material is a particle, it may have a particle size of 10 ⁇ m or less from the viewpoint of making an ink.
- the p-type dopant is a metal salt containing a bis(trifluoromethanesulfonyl)imide group, a metal salt containing a bis(fluorosulfonyl)imide group, a metal salt containing a bis(pentafluoroethylsulfonyl)imide group, 4,4,5, Metal salt containing 5-tetrafluoro-1,3,2-dithiazolidine-1,1,3,3-tetraoxide group, tris(pentafluorophenyl)borane (TPFPB), 2,3,5,6-tetra At least one selected from the group consisting of fluoro-7,7,8,8-tetracyanoquinodimethane (F4-TCNQ), SnCl 4 , SbCl 5 , FeCl 3 and WO 3 may be included.
- F4-TCNQ fluoro-7,7,8,8-tetracyanoquinodimethane
- the p-type dopant is a metal salt containing a bis(trifluoromethanesulfonyl)imide group, a metal salt containing a bis(fluorosulfonyl)imide group, a metal salt containing a bis(pentafluoroethylsulfonyl)imide group, 4,4,5,
- the p-type dopant may contain at least one selected from the group consisting of lithium bis(trifluoromethanesulfonyl)imide (LiTFSI) and TPFPB.
- LiTFSI lithium bis(trifluoromethanesulfonyl)imide
- TPFPB TPFPB
- Any solvent may be used as long as it does not corrode the material forming the surface to which the composition is applied.
- Solvents include 1-propanol, 2-propanol, 1-butanol, 2-butanol, 1-pentanol, 2-pentanol, 3-pentanol, hexanol, heptanol, octanol, nonanol, decanol, undecanol, dodecanol, 1, 2-propanediol, 1,3-propanediol, 1,2-pentadiol, 1,3-pentadiol, hexane, heptane, octane, nonane, decane, undecane, dodecane, hexamethyldisiloxane, hexamethoxydisiloxane, 1,1,3,3-tetramethyldisiloxane, 1,1,3,3,5,5,7,7,9,9,11,11-dodecamethylhexasiloxane, 1,1,5,5- tetramethyl
- the above solvents are effective, for example, in perovskite solar cells and organic thin-film solar cells.
- the solvent may contain 2-propanol.
- the composition according to the first embodiment may contain a binder. Thereby, the adhesion of the electrode formed using the composition can be improved.
- binders are polyvinylidene fluoride, polytetrafluoroethylene, polyhexafluoropropylene, polyethylene, polypropylene, polymethyl methacrylate, polyvinyl chloride, polyvinylidene chloride, polyvinyl acetate, polyacrylic acid, polyvinyl butyral, polyacrylamide, Polyurethane, polydimethylsiloxane, epoxy resin, acrylic resin, polyester resin, melamine resin, phenol resin, various rubbers, lignin, pectin, gelatin, xanthan gum, welan gum, succinoglycan, polyvinyl alcohol, polyvinyl acetal, cellulose resin, polyalkylene oxides, polyvinyl ethers, polyvinylpyrrolidone, chitins, chitosans, or starch.
- composition according to the first embodiment may contain a binder in an amount of 2% by mass or more and 10% by mass or less with respect to the conductive material in order to suppress aggregation of the conductive material.
- the p-type dopant concentration may be 0.1% by mass or more and less than 100% by mass. According to the above configuration, it is possible to suppress the decrease in the dopant concentration in the hole transport layer.
- the concentration of the p-type dopant may be 0.1% by mass or more and the saturation concentration or less with respect to the solvent. According to the above configuration, it is possible to suppress the decrease in the dopant concentration in the hole transport layer. Furthermore, the composition can be stored while suppressing evaporation of the solvent.
- the concentration of the p-type dopant may be 0.1% by mass or more and 50% by mass or less, or 0.1% by mass or more and 46.1% by mass or less. This can further suppress the decrease in the dopant concentration in the hole transport layer. In addition, it is possible to suppress an increase in the viscosity of the composition, thereby facilitating film formation by spin coating.
- FIG. 1 is a flow chart showing an example of the manufacturing method according to the second embodiment.
- a method for manufacturing an electronic device includes: (A1) laminating a first electrode, a photoelectric conversion layer, and a hole transport layer in this order; (B1) forming a second electrode on the hole transport layer using the composition according to any one of claims 1 to 8; including.
- the second electrode may be formed by applying the composition according to the first embodiment onto the hole transport layer.
- the performance tended to be low. This is because the p-type dopant contained in the hole transport layer is eluted into the electrode, and the hole concentration in the hole transport layer is lowered.
- the electrode is produced by applying the composition according to the first embodiment onto the hole transport layer.
- the composition contains a p-type dopant, which suppresses a decrease in the concentration of the p-type dopant in the hole transport layer due to elution of the p-type dopant from the hole transport layer to the electrode. can do. As a result, a decrease in hole concentration in the hole transport layer can be suppressed. Therefore, the manufacturing method according to the second embodiment can provide an electronic device with improved performance.
- the first electrode, the photoelectric conversion layer, and the hole transport layer may be laminated in this order on the substrate.
- the first electrode, the electron transport layer, the photoelectric conversion layer, and the hole transport layer may be laminated in this order.
- the electronic device manufactured by the manufacturing method according to the second embodiment is not particularly limited as long as it comprises a first electrode, a photoelectric conversion layer, a hole transport layer, and a second electrode in this order.
- Electronic devices manufactured by the manufacturing method according to the second embodiment are, for example, solar cells, light-emitting elements, or optical sensors.
- An electronic device manufactured by the manufacturing method according to the second embodiment may be, for example, a solar cell.
- FIG. 2 An example of the configuration when the electronic device manufactured by the manufacturing method according to the second embodiment is a solar cell will be described with reference to FIGS. 2 and 3.
- FIG. 2 An example of the configuration when the electronic device manufactured by the manufacturing method according to the second embodiment is a solar cell will be described with reference to FIGS. 2 and 3.
- FIG. 2 An example of the configuration when the electronic device manufactured by the manufacturing method according to the second embodiment is a solar cell will be described with reference to FIGS. 2 and 3.
- FIG. 2 shows a cross-sectional view of a schematic configuration of the solar cell 100 obtained by the manufacturing method according to the second embodiment.
- the solar cell 100 has a substrate 1, a first electrode 2, an electron transport layer 3, a photoelectric conversion layer 4, a hole transport layer 5, and a second electrode 6 laminated in this order.
- the manufacturing method according to the second embodiment includes: (C1) Laminating an auxiliary electrode on the second electrode may be further included.
- the current from the second electrode can be extracted to the outside with little loss.
- FIG. 3 shows a cross-sectional view of a schematic configuration of a solar cell 200 obtained by the manufacturing method according to the second embodiment.
- the solar cell 200 has a substrate 1, a first electrode 2, an electron transport layer 3, a photoelectric conversion layer 4, a hole transport layer 5, a second electrode 6, and an auxiliary electrode 7 laminated in this order.
- the electron transport layer 3, the photoelectric conversion layer 4, and the hole transport of the portion where the first electrode 2 is exposed In order to expose the first electrode 2 as a negative electrode, for example, by laser scribing by laser irradiation or mechanical scribing with a metal blade, the electron transport layer 3, the photoelectric conversion layer 4, and the hole transport of the portion where the first electrode 2 is exposed. removing layer 5, second electrode 6, and auxiliary electrode 7;
- the substrate 1 serves to hold each layer of the solar cell.
- the substrate 1 is made of a stable material that does not corrode or disappear during the process of forming the first electrode 2 , the photoelectric conversion layer 4 , the hole transport layer 5 and the second electrode 6 on the substrate 1 .
- the substrate 1 is made of a material having light transmittance.
- the substrate 1 may be a ceramic substrate such as glass or a plastic substrate.
- the plastic substrate may be a plastic film.
- the first electrode 2 can hold each layer of the solar cell, so the substrate 1 may not be provided.
- First electrode 2 The function of the first electrode 2 is to receive electrons generated in the photoelectric conversion layer 4 and extract them to the outside.
- the first electrode 2 has conductivity. It is desirable that the first electrode 2 have a small electrical resistance.
- Examples of materials that make up the first electrode 2 are metals, conductive compounds that exhibit electronic conductivity, or conductive carbon.
- a conductive compound having light-transmitting properties is desirable.
- conductive compounds are indium, zinc or tin oxides, titanium oxides and nitrides, or organic conductors.
- BTO barium tin oxide
- SnO2 :F, ITO, ZnO:Al, ZnO:Ga, TiO2 :Nb, and BTO are particularly useful for solar cells because they also have optical transparency.
- Examples of conductive carbon are carbon black, carbon nanotubes (CNT), graphene, or graphite. Ketjenblack and acetylene black are materials classified as carbon black.
- Examples of the manufacturing method of the first electrode 2 are a vacuum film formation method such as sputtering, vapor deposition, or ion plating, screen printing, spray method, or CVD (Chemical Vapor Deposition) method.
- the CVD method is a method of forming a film on the surface of the substrate 1 by spraying fine droplets of a special liquid material or gas onto the heated substrate 1 .
- the first electrode 2 may be formed by sputtering ITO on the substrate 1 so as to have a sheet resistance of about 10 ⁇ / ⁇ or more and 40 ⁇ / ⁇ or less.
- Electrode transport layer 3 The function of the electron transport layer 3 is to accept electrons in the conduction band of the photoelectric conversion layer 4 and conduct the electrons to the first electrode 2, while insulating holes in the valence band of the photoelectric conversion layer 4. .
- Examples of materials that constitute the electron transport layer 3 are titanium oxide and tin oxide.
- the electron transport layer 3 As a method for manufacturing the electron transport layer 3, for example, there is a method of spin-coating or spray-coating an alcohol dispersion containing TiO 2 nanoparticles (concentration of 1% by mass) and removing the alcohol by heating at 100° C. or higher.
- the electron transport layer 3 may be formed on the first electrode 2 by sputtering TiO 2 to a thickness of 10 nm or more and 100 nm or less. Further, the electron transport layer 3 may be formed by forming an aggregate of TiO 2 nanoparticles with a thickness of about 100 nm or more and 500 nm or less.
- Photoelectric conversion layer 4 The function of the photoelectric conversion layer 4 is to receive light incident from the substrate side or from the opposite side, generate electrons and holes, and diffuse the electrons and holes without recombination.
- the photoelectric conversion layer 4 may contain a perovskite compound.
- a perovskite compound means a compound having a perovskite-type crystal structure represented by the compositional formula ABX 3 and similar structures.
- A is a monovalent cation.
- cations A are monovalent cations such as alkali metal cations or organic cations.
- alkali metal cations are sodium cations (Na + ), potassium cations (K + ), cesium cations (Cs + ) or rubidium cations (Rb + ).
- Examples of organic cations are the methylammonium cation (CH 3 NH 3 + ) or the formamidinium cation (NH 2 CHNH 2 + ).
- B is a divalent metal cation.
- cations B are Pb, Sn or Ge cations.
- X is a monovalent anion.
- Examples of anions X are halogen anions. Halogen anions are, for example, iodine or bromine anions.
- Each site of cation A, cation B, and anion X may be occupied by multiple types of ions.
- An example of a method of manufacturing the photoelectric conversion layer 4 is a method of applying a solution in which a predetermined material is dissolved in an organic solvent, removing the organic solvent from the coating film, and further heat-treating.
- the removal of the organic solvent from the coating film is, for example, removal by evaporating the organic solvent by reducing the pressure, or a poor solvent for the predetermined material dissolved in the organic solvent and an organic
- a solvent compatible with the solvent only the organic solvent can be removed from the coating film, or the like.
- Such methods are common. Such a method is easy and can manufacture the photoelectric conversion layer 4 with high performance.
- the method for manufacturing the photoelectric conversion layer 4 may be vacuum deposition.
- Hole transport layer 5 The function of the hole transport layer 5 is to accept only holes from the photoelectric conversion layer 4 and block electrons.
- Hole transport layer 5 comprises a hole transport material.
- the hole transport material has a HOMO level close to the HOMO (Highest Occupied Molecular Orbital) level of the photoelectric conversion layer 4 and a LUMO level higher than the LUMO (Lowest Unoccupied Molecular Orbital) level of the photoelectric conversion layer 4. is desirable.
- the photoelectric conversion layer 4 has a LUMO level of around ⁇ 4 eV and a HOMO level of around ⁇ 5 eV.
- hole-transporting materials are poly(bis(4-phenyl)(2,4,6-trimethylphenyl))amine (PTAA), N 2 ,N 2 ,N 2′ ,N 2′ ,N 7 ,N 7 ,N 7′ ,N 7′ -octakis(4-methoxyphenyl)-9,9′-spirobi[9H-fluorene]-2,2′,7,7′-tetramine (Spiro-OMeTAD), di thiophenebenzene copolymer (DTB), poly-3-hexylthiophene (P3HT), or poly-3-hexylthiophene-polystyrene block polymer (P3HT-b-PSt).
- the hole transport layer 5 may contain at least one selected from the group consisting of PTAA, Spiro-OMeTAD, DTB, P3HT, and P3HT-b-PSt. These materials may not provide a sufficient hole density in the hole transport layer when used alone. Therefore, the hole-transporting layer 5 may contain additives as well as the hole-transporting material. The additive has the function of depriving the hole-transporting material of electrons in the valence band. That is, the hole transport layer 5 may contain a p-type dopant.
- the p-type dopant contained in the hole transport layer 5 is also referred to as a second p-type dopant.
- the hole transport layer 5 may contain the same material as the p-type dopant contained in the composition according to the first embodiment, or may contain a different material.
- the manufacturing process of the electronic device is not complicated.
- the hole transport layer 5 and the composition according to the first embodiment forming the second electrode 6 contain different substances as p-type dopants, p-type dopants with different properties can be used in the electronic device. , can complement each other's properties. For example, if the hole transport layer 5 and the second electrode 6 include a light-durable p-type dopant and a heat-durable p-type dopant, the electronic device can be made light- and heat-durable. can improve.
- the hole transport layer 5 is formed by applying a solution obtained by dissolving a hole transport material and a second p-type dopant in an organic solvent onto a layer serving as a base (for example, the photoelectric conversion layer 4) and drying the solution.
- a layer serving as a base for example, the photoelectric conversion layer 4
- the organic solvent used for this for example, one that does not dissolve the first electrode 2, the electron transport layer 3, and the photoelectric conversion layer 4 is selected.
- organic solvents are benzene, chlorobenzene, toluene, xylene, anisole or mesitylene.
- the function of the second electrode 6 is to receive holes generated in the photoelectric conversion layer 4 and extract them to the outside.
- the second electrode 6 is formed using the composition according to the first embodiment.
- the second electrode 6 can be formed, for example, by applying and drying the composition according to the first embodiment.
- it may be formed by applying the above composition to the hole transport layer and drying. Thereby, the decrease in the dopant concentration in the hole transport layer 5 can be further suppressed. As a result, it is possible to improve the performance of the electronic device.
- Auxiliary electrode 7 is electrically connected to second electrode 6 .
- the function of the auxiliary electrode 7 is to extract the current from the second electrode 6 to the outside with little loss.
- the auxiliary electrode 7 can be made of a low-resistance material.
- the auxiliary electrode 7 is formed by vapor deposition, for example.
- FIG. 4 is a flow chart showing an example of the manufacturing method according to the third embodiment.
- a method for manufacturing an electronic device includes: (A2) forming a second electrode using the composition according to any one of claims 1 to 8; (B2) Laminating a hole transport layer, a photoelectric conversion layer, and a first electrode in this order on the second electrode.
- the second electrode may be formed by applying the composition according to the first embodiment to the substrate.
- the hole transport layer, the photoelectric conversion layer, the electron transport layer, and the first electrode may be laminated in this order on the second electrode.
- An electronic device manufactured by the manufacturing method according to the third embodiment is, for example, a solar cell.
- FIG. 5 shows a cross-sectional view of a schematic configuration of a solar cell 300 obtained by the manufacturing method according to the third embodiment.
- Solar cell 300 has substrate 11, second electrode 16, hole transport layer 15, photoelectric conversion layer 14, electron transport layer 13, and first electrode 12 stacked in this order.
- the manufacturing method according to the third embodiment includes: (C2) may further include stacking an auxiliary electrode on the second electrode.
- the current from the second electrode can be extracted to the outside with little loss.
- FIG. 6 shows a cross-sectional view of a schematic configuration of a solar cell 400 obtained by the manufacturing method according to the third embodiment.
- Solar cell 400 has substrate 11, second electrode 16, auxiliary electrode 17, hole transport layer 15, photoelectric conversion layer 14, electron transport layer 13, and first electrode 12 laminated in this order.
- the substrate 11 has the same configuration as the substrate 1 described in the second embodiment.
- the auxiliary electrode 17 has the same configuration as the auxiliary electrode 7 described in the second embodiment.
- the hole transport layer 15 has the same configuration as the hole transport layer 5 described in the second embodiment.
- the photoelectric conversion layer 14 has the same configuration as the photoelectric conversion layer 4 described in the second embodiment.
- the electron transport layer 13 has the same configuration as the electron transport layer 3 described in the second embodiment.
- the first electrode 12 has the same configuration as the first electrode 2 described in the second embodiment.
- the second electrode 16 is formed using the composition according to the first embodiment.
- the second electrode 16 can be formed, for example, by applying and drying the composition according to the first embodiment.
- it may be formed by applying the composition described above to the substrate 1 and drying it. Thereby, a decrease in the hole concentration in the hole transport layer 15 can be suppressed. As a result, an electronic device with improved performance can be provided.
- the manufacturing method of the hole transport layer 15 is as described in the second embodiment.
- a method for manufacturing the photoelectric conversion layer 14 there is a method of applying a solution in which a predetermined material is dissolved in an organic solvent, reducing the pressure to evaporate and remove the organic solvent, and performing heat treatment.
- the electron transport layer 13 As a method of manufacturing the electron transport layer 13, for example, there is a method of sputtering TiO 2 or SnO 2 .
- a method of sputtering TiO 2 or SnO 2 there is a method of sputtering TiO 2 or SnO 2 .
- an alcohol dispersion containing TiO2 nanoparticles (concentration 1% by mass) is spin-coated or spray-coated, the alcohol is removed by heating at 100 °C or higher, and then TiO2 or SnO2 is sputtered to form the electron transport layer. 13 may be formed.
- the first electrode 12 for example, indium tin oxide (ITO), Al-doped zinc oxide (ZnO:Al), Ga-doped zinc oxide (ZnO:Ga), Nb-doped titanium oxide (TiO2:Nb), or barium Vacuum deposition such as sputter or evaporation of tin oxide (BTO).
- ITO indium tin oxide
- ZnO:Al Al-doped zinc oxide
- ZnO:Ga Ga-doped zinc oxide
- TiO2:Nb Nb-doped titanium oxide
- BTO barium Vacuum deposition
- perovskite solar cells were fabricated and their device performance was evaluated.
- a 25 mm square glass with a thickness of 0.7 mm was prepared as a substrate.
- indium tin oxide ITO was formed by sputtering so as to have a sheet resistance of 10 ⁇ / ⁇ .
- a first electrode was formed on the substrate.
- Titanium oxide (TiO 2 ) was formed on the first electrode by sputtering so as to have a thickness of 30 nm.
- an aggregate of TiO 2 nanoparticles was formed with a thickness of 250 nm.
- an electron transport layer was formed on the first electrode.
- the stock solution consisted of 2.91 g of formamidinium hydroiodide (( NH2 ) 2CH2I ), 0.57 g of methylammonium hydroiodide ( CH3NH3I ), and lead iodide (PbI) . 2 ) 10 g was dissolved in a mixed solvent of 23.3 mL of N,N-dimethylformamide (DMF) and 5.8 mL of dimethylsulfoxide (DMSO). A raw material solution (80 ⁇ L) was dropped onto the electron transport layer, and the substrate including the electron transport layer was spun at 4000 rpm for 70 seconds using a spin coater.
- DMF N,N-dimethylformamide
- DMSO dimethylsulfoxide
- a hole-transporting material liquid was prepared.
- a hole transport material liquid was obtained by adding 4.8 ⁇ L of a solution of 500 mg of LiTFSI dissolved in 1 mL of acetonitrile to a solution of 10 mg of PTAA and 6 ⁇ L of tert-butylpyridine added to 1 mL of toluene.
- the hole transport layer was formed by dropping 60 ⁇ L of the hole transport material liquid onto the photoelectric conversion layer and rotating it with a spin coater at 4000 rpm for 30 seconds.
- a composition of the present disclosure was prepared as an electrode ink.
- the electrode ink 9 parts by mass of acetylene black and 1 part by mass of cellulose are placed in a bead mill, 2-propanol in the amount shown in Table 1 is added and stirred, and then a p-type dopant is added in the amount shown in Table 1. of LiTFSI or TPFPB were added.
- Table 1 shows the p-type dopant concentrations in the electrode inks.
- the concentration of the p-type dopant in the electrode ink is the mass fraction of the p-type dopant in the electrode ink.
- Electrode ink 500 ⁇ L of the electrode ink (composition) was dropped onto the hole transport layer, spun at 1000 rpm for 30 seconds with a spin coater, and then heated with a hot plate at 100° C. for 2 hours. Thus, a second electrode was formed on the hole transport layer. Au was deposited on the second electrode to a thickness of 200 nm by vapor deposition. An auxiliary electrode was thus formed.
- Comparative example 1 A solar cell of Comparative Example 1 was fabricated in the same manner as in Examples 1 to 9, except that the p-type dopant was not added to the electrode ink dropped onto the hole transport layer.
- the current value in evaluation 1 and the maximum output value in evaluation 2 of Examples 8 and 9 are larger than those of Comparative Example 1.
- the p-type dopant contained in the electrode ink is TPFPB, whereas the p-type dopant that the hole-transporting layer is preliminarily provided with is LiTFSI, the characteristics of the solar cell are improved. That is, it was shown that the p-type dopant contained in the electrode ink is not limited to the dopant contained in the hole transport layer, and may be a different material.
- Example 10 to 18 The methods for fabricating the solar cells of Examples 10 to 18 are described below. Except for the hole-transporting layer and the second electrode, they were prepared in the same manner as in Examples 1 to 9, so the description is omitted.
- the hole transport layer was formed by dropping 0.06 mL of the hole transport material liquid onto the semiconductor layer and rotating it with a spin coater at 4000 rpm for 30 seconds.
- a hole transport material liquid was obtained by placing 0.1 g of PTAA in a glass container, adding 10 mL of a TPFPB solution obtained by dissolving 1 g of TPFPB powder in 10 mL of toluene, and shaking the mixture for 2 hours. That is, the hole transport layers in Examples 10 to 18 differ from Examples 1 to 9 in that the contained p-type dopant is TPFPB.
- the composition of the present disclosure was prepared as an electrode ink.
- the electrode ink 9 parts by mass of acetylene black and 1 part by mass of cellulose are placed in a bead mill, 2-propanol in the amount shown in Table 2 is added and stirred, and then a p-type dopant is added in the amount shown in Table 2. of LiTFSI or TPFPB were added. Table 2 shows the p-type dopant concentrations in the electrode inks.
- the electrode ink and 500 ⁇ L were dropped onto the hole transport layer, spun with a spin coater at 1000 rpm for 30 seconds, and then heated with a hot plate at 100° C. for 2 hours. Thus, a second electrode was formed on the hole transport layer. Au was deposited on the second electrode to a thickness of 200 nm by vapor deposition. An auxiliary electrode was thus formed.
- Comparative example 2 A solar cell of Comparative Example 2 was fabricated in the same manner as in Examples 10 to 18, except that no p-type dopant was added to the electrode ink.
- the current value in evaluation 3 and the maximum output value in evaluation 4 of Examples 17 and 18 are larger than the value of Comparative Example 2.
- the p-type dopant included in the hole transport layer is TPFPB
- the p-type dopant contained in the electrode ink is LiTFSI
- the characteristics of the solar cell are improved. That is, it was shown that the p-type dopant contained in the electrode ink is not limited to the p-type dopant contained in the hole transport layer, and may be a different material. Further, from Tables 1 and 2, it can be seen that the characteristics of the electronic device are improved by forming the second electrode using the electrode ink containing the p-type dopant, regardless of the p-type dopant contained in the hole transport layer. I understand.
- composition and manufacturing method of the present disclosure are useful because they provide an electronic device that exhibits improved performance in both initial and long-term reliability.
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Abstract
Description
以下、第1実施形態では、組成物が説明される。
本明細書において、正孔輸送材料とは、正孔の注入および放出を許容し、電子の注入および放出を拒む材料である。
導電材料は、正孔および電子の注入および放出を許容する材料である。
以下、第2実施形態では第1実施形態による組成物を用いた電子デバイスの製造方法が説明される。
(A1)第一電極、光電変換層、および正孔輸送層、をこの順で積層することと、
(B1)正孔輸送層上に、請求項1から8のいずれか一項に記載の組成物を用いて第二電極を形成することと、
を含む。
(C1)第二電極の上に補助電極を積層すること、をさらに含んでもよい。
基板1は、太陽電池の各層を保持する役割を果たす。基板1は、基板1上に第一電極2、光電変換層4、正孔輸送層5、および第二電極6を形成する工程において、腐食および消失しない安定な材料から構成される。
第一電極2の機能は、光電変換層4で発生した電子を受容し、外部に取り出すことである。第一電極2は、導電性を有する。第一電極2は、電気抵抗が小さいことが望ましい。
電子輸送層3の機能は、光電変換層4の伝導帯の電子を受容して、電子を第一電極2に伝導すると同時に、光電変換層4の価電子帯の正孔は絶縁することである。
光電変換層4の機能は、基板側から、あるいはその反対側から入射した光を受容して電子と正孔を生じさせ、電子と正孔とを再結合させずに拡散させることである。
正孔輸送層5の機能は、光電変換層4から正孔のみを受容し、電子をブロックすることである。正孔輸送層5は、正孔輸送材料を含む。正孔輸送材料は、光電変換層4のHOMO(Highest Occupied Molecular Orbital)準位に近いHOMO準位、および光電変換層4のLUMO(Lowest Unoccupied Molecular Orbital)準位よりも高いLUMO準位を有することが望ましい。
第二電極6の機能は、光電変換層4で発生した正孔を受容し、外部に取り出すことである。
補助電極7は、第二電極6に電気的に接続されている。補助電極7の機能は第二電極6からの電流を外部にロスを少なく取り出すことである。補助電極7は、低抵抗な材料から構成され得る。補助電極7は、例えば、蒸着によって形成される。
以下、第3実施形態では第1実施形態による組成物を用いた電子デバイスの製造方法が説明される。第1実施形態および第2実施形態において説明された事項は、適宜、省略され得る。
(A2)請求項1から8のいずれか一項に記載の組成物を用いて第二電極を形成することと、
(B2)第二電極上に、正孔輸送層、光電変換層、および第一電極をこの順で積層することと、を含む。
(C2)第二電極の上に補助電極を積層すること、をさらに含んでもよい。
以下、実施例1から9による太陽電池の作製方法を説明する。
正孔輸送層上に滴下する電極用インクにp型ドーパントを加えなかったこと以外、実施例1から9と同様にして、比較例1の太陽電池が作製された。
作製した実施例1から9および比較例1の太陽電池の特性が、蛍光灯光下で評価された。太陽電池に対して、基板であるガラス面側から光が入射するようにして、さらに、受光面積を規定するように開口面形状が0.4cm×0.25cmの遮光マスクをガラス面に装荷した状態で、蛍光灯光(照度200lx)を照射した。ソースメーター(ADC株式会社製、6246)を用いて、動作電圧0.6Vでの電流値を計測した。以下、動作電圧を「Vop」ともいう。実施例1から9および比較例1の太陽電池の照度200lxにおけるVop=0.6Vでの電流値を表1に示す。
作製した実施例1から9および比較例1の太陽電池の特性が、疑似太陽光下で評価された。太陽電池に対して、開口面形状が0.4cm×0.25cmの遮光マスクを介して基板であるガラス面側から光が入射するようにして、ソーラーシミュレータによる1SUN光を照射した。ソースメーター(ADC株式会社製、6246)を用いて、-0.2Vから+1.2Vの電圧範囲における電圧-電流特性を計測し、最大出力点での出力を求めた。実施例1から9および比較例1の太陽電池の最大出力を表1に示す。
表1に示されるように、実施例1から7の評価1における電流値および評価2における最大出力の値は、比較例1よりも大きい。p型ドーパントであるLiTFSIを含む電極用インクを用いて第二電極を形成することで、太陽電池の特性が向上する。また、電極用インク中のLiTFSI濃度が0.1質量%から46.1質量%の範囲において、太陽電池の特性が向上する。
以下、実施例10から18の太陽電池の作製方法を説明する。正孔輸送層および第二電極以外は、実施例1から9と同様に作製されたため、説明を省略する。
電極用インクにp型ドーパントを加えなかったこと以外、実施例10から18と同様にして、比較例2の太陽電池が作製された。
作製した実施例10から18および比較例2の太陽電池の特性が、蛍光灯光下で評価された。太陽電池に対して、基板であるガラス面側から光が入射するようにして、さらに、受光面積を規定するように開口面形状が0.4cm×0.25cmの遮光マスクをガラス面に装荷した状態で、蛍光灯光(照度200lx)を照射した。ソースメーター(ADC株式会社製、6246)を用い、動作電圧0.6Vでの電流値を計測した。実施例10から18および比較例2の太陽電池の照度200lxにおけるVop=0.6Vでの電流値を表2に示す。
作製した実施例10から18および比較例2の太陽電池デバイスの特性が、疑似太陽光下で評価された。太陽電池に対して、開口面形状が0.4cm×0.25cmの遮光マスクを介して基板であるガラス面側から光が入射するようにして、ソーラーシミュレータによる1SUN光を照射した。ソースメーター(ADC株式会社製、6246)を用いて、電圧範囲-0.2Vから+1.2Vの範囲で電圧-電流特性を計測し、最大出力点での出力を求めた。実施例10から18および比較例2の太陽電池の最大出力を表2に示す。
表2に示されるように、実施例10から16の評価3および評価4の値は、比較例2の評価1および評価2の値よりも大きい。p型ドーパントであるTPFPBを含む電極用インクを用いて第二電極を形成することで、太陽電池の特性が向上する。また、電極用インク中のTPFPB濃度が0.1質量%以上かつ46.1質量%以下の範囲において、太陽電池の特性が向上する。
2、12 第一電極
3、13 電子輸送層
4、14 光電変換層
5、15 正孔輸送層
6、16 第二電極
7、17 補助電極
100、200、300、400 太陽電池
Claims (12)
- 導電材料、p型ドーパント、および溶媒を含み、
前記溶媒は、アルコール、脂肪族炭化水素、シロキサン、エステル、およびエーテルからなる群より選択される少なくとも1つの化合物を含む、
組成物。 - 前記導電材料は、金属、導電性炭素、および導電性化合物からなる群より選択される少なくとも1つを含む、
請求項1に記載の組成物。 - 前記p型ドーパントは、ビス(トリフルオロメタンスルホニル)イミド基を含む金属塩、ビス(フルオロスルホニル)イミド基を含む金属塩、ビス(ペンタフルオロエチルスルホニル)イミド基を含む金属塩、4,4,5,5-テトラフルオロ-1,3,2-ジチアゾリジン-1,1,3,3-テトラオキシド基を含む金属塩、トリス(ペンタフルオロフェニル)ボラン、2,3,5,6-テトラフルオロ-7,7,8,8-テトラシアノキノジメタン、SnCl4、SbCl5、FeCl3、およびWO3からなる群より選択される少なくとも1つを含む、
請求項1または2に記載の組成物。 - 前記p型ドーパントは、リチウムビス(トリフルオロメタンスルホニル)イミド、およびトリス(ペンタフルオロフェニル)ボランからなる群より選択される少なくとも1つを含む、
請求項3に記載の組成物。 - 前記溶媒は、1-プロパノール、2-プロパノール、1-ブタノール、2-ブタノール、1-ペンタノール、2-ペンタノール、3-ペンタノール、ヘキサノール、ヘプタノール、オクタノール、ノナノール、デカノール、ウンデカノール、ドデカノール、1,2-プロパンジオール、1,3-プロパンジオール、1,2-ペンタジオール,1,3-ペンタジオール、ヘキサン、ヘプタン、オクタン、ノナン、デカン、ウンデカン、ドデカン、ヘキサメチルジシロキサン、ヘキサメトキシジシロキサン、1,1,3,3-テトラメチルジシロキサン、1,1,3,3,5,5,7,7,9,9,11,11-ドデカメチルヘキサシロキサン、1,1,5,5-テトラメチル-3,3-ジフェニルトリシロキサン、1,1,1,3,3-ペンタメチルジシロキサン、酢酸メチル、酢酸エチル、酢酸プロピル、酢酸ブチル、メチルセルソルブ、エチルセルソルブ、プロピルセルソルブ、ブチルセルソルブ、ジメチルセルソルブ、フェニルセルソルブ、ジイソプロピルエーテル、エチレングリコールモノエチルエーテルアセテート、プロピレングリコールモノメチルエーテルアセテート、ジエチレングリコールモノブチルエーテルアセテート、ジエチレングリコールモノエチルエーテルアセテート、ジエチレングリコールモノメチルエーテル、ジエチレングリコールモノエチルエーテル、ジエチレングリコールモノブチルエーテル、プロピレングリコールモノメチルエーテル、プロピレングリコールモノメチルエーテルプロピオネート、エチレングリコールジメチルエーテル、ジエチレングリコールジメチルエーテル、エチレングリコールジエチルエーテル、ジエチレングリコールジエチルエーテル、トリエチレングリコールジメチルエーテル、ジエチレングリコールジブチルエーテル、テトラエチレングリコールジメチルエーテル、およびジプロピレングリコールジメチルエーテルからなる群より選択される少なくとも1つを含む、
請求項1から4のいずれか一項に記載の組成物。 - 前記溶媒は、2-プロパノールを含む、
請求項5に記載の組成物。 - 前記組成物において、前記p型ドーパントの濃度は、0.1質量%以上かつ100質量%未満である、
請求項1から6のいずれか一項に記載の組成物。 - 前記p型ドーパントの濃度は、0.1質量%以上かつ46.1質量%以下である、
請求項7に記載の組成物。 - (A1)第一電極、光電変換層、および正孔輸送層、をこの順で積層することと、
(B1)前記正孔輸送層上に、請求項1から8のいずれか一項に記載の組成物を用いて第二電極を形成することと、
を含む、
電子デバイスの製造方法。 - 前記(B1)において、前記組成物を前記正孔輸送層上に塗布することで前記第二電極を形成する、
請求項9に記載の製造方法。 - (A2)請求項1から8のいずれか一項に記載の組成物を用いて第二電極を形成することと、
(B2)前記第二電極上に、正孔輸送層、光電変換層、および第一電極をこの順で積層することと、
を含む、
電子デバイスの製造方法。 - 前記(A2)において、前記組成物を基板上に塗布することで前記第二電極を形成する、
請求項11に記載の製造方法。
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JP2019077685A (ja) | 2017-10-26 | 2019-05-23 | エルジー ディスプレイ カンパニー リミテッド | 有機化合物、これを含む発光ダイオードおよび発光装置 |
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US20210043851A1 (en) * | 2019-08-08 | 2021-02-11 | Raynergy Tek Inc. | Hole transporting material, manufacturing method thereof, and organic photodiode thereof |
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WO2011052546A1 (ja) | 2009-10-29 | 2011-05-05 | 住友化学株式会社 | 有機光電変換素子及びその製造方法 |
JP2012216673A (ja) | 2011-03-31 | 2012-11-08 | Tokyo Institute Of Technology | 太陽電池用電極体及びその製造方法、この電極体を備えた太陽電池 |
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US20210043851A1 (en) * | 2019-08-08 | 2021-02-11 | Raynergy Tek Inc. | Hole transporting material, manufacturing method thereof, and organic photodiode thereof |
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