WO2004064191A1 - 光電変換素子 - Google Patents
光電変換素子 Download PDFInfo
- Publication number
- WO2004064191A1 WO2004064191A1 PCT/JP2003/016730 JP0316730W WO2004064191A1 WO 2004064191 A1 WO2004064191 A1 WO 2004064191A1 JP 0316730 W JP0316730 W JP 0316730W WO 2004064191 A1 WO2004064191 A1 WO 2004064191A1
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- WO
- WIPO (PCT)
- Prior art keywords
- photoelectric conversion
- layer
- conversion element
- conductive
- conductive wiring
- Prior art date
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- 239000011164 primary particle Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 229940070891 pyridium Drugs 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 150000003856 quaternary ammonium compounds Chemical class 0.000 description 1
- 150000003242 quaternary ammonium salts Chemical class 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- PYWVYCXTNDRMGF-UHFFFAOYSA-N rhodamine B Chemical compound [Cl-].C=12C=CC(=[N+](CC)CC)C=C2OC2=CC(N(CC)CC)=CC=C2C=1C1=CC=CC=C1C(O)=O PYWVYCXTNDRMGF-UHFFFAOYSA-N 0.000 description 1
- 229940043267 rhodamine b Drugs 0.000 description 1
- 239000011829 room temperature ionic liquid solvent Substances 0.000 description 1
- 229930187593 rose bengal Natural products 0.000 description 1
- 229940081623 rose bengal Drugs 0.000 description 1
- STRXNPAVPKGJQR-UHFFFAOYSA-N rose bengal A Natural products O1C(=O)C(C(=CC=C2Cl)Cl)=C2C21C1=CC(I)=C(O)C(I)=C1OC1=C(I)C(O)=C(I)C=C21 STRXNPAVPKGJQR-UHFFFAOYSA-N 0.000 description 1
- STWARMWRDXFBIE-UHFFFAOYSA-N ruthenium(2+);dihydrate Chemical compound O.O.[Ru+2] STWARMWRDXFBIE-UHFFFAOYSA-N 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- HYHCSLBZRBJJCH-UHFFFAOYSA-N sodium polysulfide Chemical compound [Na+].S HYHCSLBZRBJJCH-UHFFFAOYSA-N 0.000 description 1
- 239000008279 sol Substances 0.000 description 1
- 239000007784 solid electrolyte Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- HXJUTPCZVOIRIF-UHFFFAOYSA-N sulfolane Chemical compound O=S1(=O)CCCC1 HXJUTPCZVOIRIF-UHFFFAOYSA-N 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- KKEYFWRCBNTPAC-UHFFFAOYSA-L terephthalate(2-) Chemical compound [O-]C(=O)C1=CC=C(C([O-])=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-L 0.000 description 1
- 125000005207 tetraalkylammonium group Chemical group 0.000 description 1
- 238000009210 therapy by ultrasound Methods 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- XJDNKRIXUMDJCW-UHFFFAOYSA-J titanium tetrachloride Chemical compound Cl[Ti](Cl)(Cl)Cl XJDNKRIXUMDJCW-UHFFFAOYSA-J 0.000 description 1
- YONPGGFAJWQGJC-UHFFFAOYSA-K titanium(iii) chloride Chemical compound Cl[Ti](Cl)Cl YONPGGFAJWQGJC-UHFFFAOYSA-K 0.000 description 1
- 239000006097 ultraviolet radiation absorber Substances 0.000 description 1
- 238000010792 warming Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
- 239000010938 white gold Substances 0.000 description 1
- 229910000832 white gold Inorganic materials 0.000 description 1
- 239000001018 xanthene dye Substances 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/20—Light-sensitive devices
- H01G9/2027—Light-sensitive devices comprising an oxide semiconductor electrode
- H01G9/2031—Light-sensitive devices comprising an oxide semiconductor electrode comprising titanium oxide, e.g. TiO2
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/20—Light-sensitive devices
- H01G9/2068—Panels or arrays of photoelectrochemical cells, e.g. photovoltaic modules based on photoelectrochemical cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M14/00—Electrochemical current or voltage generators not provided for in groups H01M6/00 - H01M12/00; Manufacture thereof
- H01M14/005—Photoelectrochemical storage cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/542—Dye sensitized solar cells
Definitions
- the present invention relates to a photoelectric conversion element, and is particularly suitable for application to a wet solar cell.
- solar cells which are photoelectric conversion elements that convert sunlight into electric energy, use sunlight as an energy source, so they have very little impact on the global environment, and are expected to become more widely used.
- crystalline silicon-based solar cells have higher photoelectric conversion efficiencies, which represent the ability to convert light (solar) energy into electrical energy, than amorphous silicon-based solar cells, but require more energy, time, and time for crystal growth. Required, the productivity was low and the cost was disadvantageous.
- Amorphous silicon-based solar cells also have features such as higher light absorption, a wider selection range of substrates, and easier area enlargement than crystalline silicon-based solar cells, but have a higher photoelectric conversion efficiency. Lower than crystalline silicon solar cells.
- amorphous silicon solar cells have higher productivity than crystalline silicon solar cells, but require a vacuum process for manufacturing, and the burden on facilities is still large.
- This solar cell is a wet type solar cell using a titanium oxide porous thin film spectrally sensitized using a ruthenium complex as a sensitizing dye as a photoelectrode, that is, an electrochemical photocell.
- the advantage of this solar cell is that an inexpensive oxide semiconductor such as titanium oxide can be used, the light absorption of the sensitizing dye extends over a wide visible wavelength range up to 80 O nm, High efficiency and high energy conversion efficiency can be realized. Also, since no vacuum process is required for production, large equipment is not required.
- halo such as iodine is contained in the electrolyte. Since it contains a gen element, the dissolution and disconnection of wiring due to corrosion and the destruction of wiring due to dissolution of the underlying metal become problems, and the characteristics deteriorate significantly with time. In addition, even when a highly corrosion-resistant metal is used as the wiring material, the wiring is in direct contact with the electrolyte, so the electrons injected into the semiconductor and reach the wiring reduce the electrolyte before flowing to the external circuit. The so-called reverse electron transfer reaction becomes a problem.
- an object of the present invention is to provide a photoelectric conversion element which does not cause a reverse electron transfer reaction, has high durability, and has high photoelectric conversion efficiency. Disclosure of Invention ⁇
- a plurality of conductive wiring layers are provided on the transparent conductive substrate, and at least one conductive wiring layer is joined to a current collecting portion of the photoelectric conversion element in order to increase current collection efficiency.
- “transparent” is defined as having a transmittance of 10% or more in a part or the whole of light in the visible to near infrared region with a wavelength of 400 to 1200 nm.
- the material constituting the conductive wiring layer is preferably a substance having a high electron conductivity, and among them, a substance that is electrochemically stable is particularly preferable.
- a conductive material single metal, alloy, etc.
- a conductive material containing at least one element selected from the group consisting of l and C.
- the thickness of the conductive wiring layer there is no particular limitation on the thickness of the conductive wiring layer, and higher electron conductivity can be achieved as the thickness is increased.On the other hand, if the thickness is too large, the unevenness of the surface becomes large, and a protective layer is formed uniformly thereon. Becomes difficult. At this time, since the adhesion of the protective layer is significantly reduced, the conductive wiring layer has a preferable thickness.
- the thickness of the conductive wiring layer is usually 10 to 100 nm, particularly preferably 50 to 500 nm. is there.
- the coverage area ratio of the conductive wiring layer to the light receiving portion of the photoelectric conversion element is preferably 0.01% to 50%. If the coating area ratio is too large, the received light cannot be transmitted sufficiently, so that the content is particularly preferably 0.1% to 20%.
- the width of the conductive wiring layer and its interval and higher electron conductivity can be realized as the width is increased and the interval is reduced. If the value is too narrow, the transmittance of incident light decreases, so that a preferable value exists.
- the width of the conductive wiring layer is usually 1 to 100 / m, particularly preferably 10 to 500m.
- the distance between the conductive wiring layers is usually 0.1 to 100 mm, particularly preferably 1 to 50 mm.
- the method of forming the conductive wiring layer on the transparent substrate can be formed by a known method such as a method.
- a base material having higher adhesion can be provided between the conductive wiring layer and the transparent substrate in order to increase the adhesion to the substrate.
- patterning can be performed by a known method such as laser irradiation, etching, or lift-off.
- the protective layer blocks the conductive wiring layer from the electrolyte, + Has the role of preventing corrosion of conductive wiring.
- This protective layer has high electron conductivity (including electron conductivity due to normal electric conduction and electron conductivity due to tunnel effect), and is preferably transparent. As long as these conditions are satisfied, basically any material can be used as the material of the protective layer, and even if it has a single-layer structure, it has a multilayer structure including at least two layers made of different materials. It may be a structure.
- a metal oxide layer is typically used, but a metal nitride layer such as TN or WN can also be used.
- the metal oxide Specific examples view the, for example, I n-S n complex oxide (ITO), (including those off Tsu containing such doped) S n 0 2, T i 0 2, Z Examples include, but are not limited to, nO and the like, but it is particularly preferable to include at least one metal oxide selected from these.
- the thickness of the metal oxide layer is not particularly limited, but if it is too thin, the barrier property between the conductive wiring layer and the electrolyte is poor, and if it is too thick, the transmittance is reduced. Will be. This thickness is usually 1 to 500 nm, particularly preferably 100 to 100 nm. Further, for the purpose of improving the oxidation resistance, the above-mentioned metal oxide can be laminated as needed.
- the material of the transparent substrate is not particularly limited, and various substrates can be used as long as they are transparent.
- the transparent substrate preferably has excellent properties such as water and gas infiltration from the outside of the photoelectric conversion element, solvent resistance, weather resistance, etc.
- a transparent inorganic substrate such as quartz or glass, polyethylene, or the like is preferable.
- Terephthalate polyethylene naphthalate, polycarbonate, polystyrene, polyethylene, polypropylene, polyphenylene sulfide, polyvinylidene fluoride, tetraacetyl cellulose, brominated phenoxy, aramides, polyimides, polystyrenes, Transparent plastic substrates such as polyarylates, polysulfones, and polyolefins
- Transparent plastic substrates such as polyarylates, polysulfones, and polyolefins
- a transparent plastic substrate in consideration of calorie properties, lightness, and the like.
- the thickness of the transparent substrate is not particularly limited, and can be freely selected depending on the light transmittance, the shielding property between the inside and the outside of the photoelectric conversion element, and the like.
- the material of the semiconductor fine particles in addition to elemental semiconductors represented by silicon, various compound semiconductors, compounds having a belovskite structure, and the like can be used. These semiconductors are preferably n-type semiconductors in which conduction band electrons serve as carriers under photoexcitation and provide anodic current. These semiconductors, specific examples, T i 0 2, Z n ⁇ , W 0 3, a N b 0 5, T i S r 0, S n 0 2 , etc., of these T i 0 2 Is particularly preferred.
- the type of semiconductor is not limited to these, and two or more types can be used in combination.
- the method of producing the semiconductor layer composed of semiconductor fine particles.
- a wet film forming method is preferable. It is preferable to prepare a paste uniformly dispersed in the above solvent and apply it on a transparent conductive substrate.
- the coating method is not particularly limited and can be performed according to a known method.Examples include a dip method, a spray method, a wire bar method, a spin coat method, a roller coat method, a blade coat method, a gravure coat method,
- the wet printing method can be performed by various methods such as letterpress, offset, gravure, intaglio, rubber plate, screen printing, and the like.
- the crystal type is preferably anatase type from the viewpoint of photocatalytic activity.
- the anatase type titanium oxide may be a commercially available powder, sol, slurry, or titanium oxide.
- a product having a predetermined particle size may be produced by a known method such as hydrolysis of alkoxide.
- a commercially available powder it is preferable to eliminate the secondary aggregation of the particles, and it is preferable to grind the particles using a mortar, a ball mill, or the like when preparing the coating solution.
- acetyl aceton, hydrochloric acid, nitric acid, a surfactant, a chelating agent and the like can be added in order to prevent the particles having undergone secondary aggregation from aggregating again.
- various thickeners such as a polymer such as polyethylene oxide / polybutyl alcohol and a cellulose-based thickener can also be added.
- the average particle size of the primary particles is preferably from 1 to 200 nm, and particularly preferably from 5 to 100 nm. Also, it is possible to improve the quantum yield by mixing semiconductor fine particles having an average particle size larger than the average particle size with the semiconductor fine particles having the average particle size, and scattering incident light by the semiconductor fine particles having the larger average particle size. It is. In this case, the average particle size of the semiconductor fine particles separately mixed is preferably 20 to 500 nm.
- the semiconductor layer composed of semiconductor fine particles preferably has a large surface area so that a large amount of dye can be adsorbed.
- the surface area in the state where the semiconductor fine particle layer is coated on the support is preferably at least 10 times, more preferably at least 100 times the projected area. There is no particular upper limit, but it is usually about 1000 times.
- the semiconductor fine particle layer has a preferable thickness, but the thickness is generally 0.1 to 100 wm, preferably 1 to 50 m, more preferably 3 to 3 m.
- Semiconductor particles are applied to the support After that, it is preferable that the particles be electronically contacted with each other and fired to improve the film strength and the adhesion to the substrate.
- the range of the firing temperature There is no particular limitation on the range of the firing temperature.However, if the temperature is too high, the resistance of the substrate increases and the substrate may be melted, so that the temperature is usually 40 to 700 ° C., and more preferably, it is more preferable. 40 to 65 ° C.
- the firing time is not particularly limited, but is usually about 10 minutes to 10 hours.
- sintering for example, chemical plating using aqueous titanium tetrachloride or trichloride to increase the surface area of the semiconductor fine particles, remove impurities in the semiconductor fine particle layer, and increase the efficiency of electron injection from the dye into the semiconductor fine particles.
- Electrochemical plating using a titanium aqueous solution may be performed.
- a conductive auxiliary may be added for the purpose of reducing the impedance of the semiconductor fine particle layer.
- a paste containing a binder and a dispersion of semiconductor fine particles is formed (coated) on the substrate, for example, at a temperature of 50 to 120 ° C. It is also possible to press the semiconductor fine particles onto the substrate by the heat press in the above.
- the dye to be supported on the semiconductor fine particles is not particularly limited as long as it exhibits a sensitizing effect.
- xanthene dyes such as rhodamine B, rose bengal, eosin, and erythrocin, quinosinean, and cryptosyanin
- other basic dyes such as phenosafuranine, capriblue, thiosin, and methylene bull
- porphyrin compounds such as chlorophyll, zinc porphyrin, and magnesium porphyrin
- other azo dyes and phthalocyanine compounds such as coumarin compounds, luteuium (Ru) biviridine complex compounds, anthraquinone dyes, and polycyclic quinone dyes.
- the Ru biviridine complex compound is particularly preferable because of its high quantum yield, but is not limited thereto, and can be used alone or in combination of two or more.
- the dye may be alcohols, nitriles, nitromethane, halogenated hydrocarbons, ethers, dimethyl sulfoxide, amides, N —Methyl pyrrolidone, 1,3-dimethylimidazolidinone, 3_methyloxazolidinone, esters, carbonates, ketones, hydrocarbons, water, etc., dissolved in a solvent, and immersed in the semiconductor fine particle layer, or dye solution Is generally applied to the semiconductor fine particle layer.
- the charged amount of the dye molecules per 1 semiconductor fine particle is preferably 1 to 1000 molecules, and more preferably 1 to 100 molecules.
- the dye molecules are carried in a large excess with respect to the semiconductor fine particles, electrons excited by light energy are not injected into the semiconductor fine particles, and reduce the electrolyte, thereby causing energy loss. Therefore, the dye molecules are ideally adsorbed on the semiconductor fine particles in a single molecule state, and the temperature and pressure at which the dye molecules are supported can be changed as necessary.
- a carboxylic acid such as deoxycholic acid may be added for the purpose of reducing the association between the dyes.
- an ultraviolet absorber can be used in combination.
- the surface of the semiconductor fine particle layer may be treated with amines after the dye is adsorbed.
- the amines include pyridine, 4-tert-butylpyridine, and polybutylpyridine. When these are liquids, they may be used as they are, or may be used by dissolving them in an organic solvent.
- any material can be used as long as it is a conductive material.
- an insulating material can also be used if a conductive layer is provided on the side facing the semiconductor electrode.
- the surface facing the semiconductor electrode has a fine structure and an increased surface area.For example, platinum is in a platinum black state, and carbon is in a porous state. It is desired.
- the platinum black state can be formed by anodic oxidation of white gold or chloroplatinic acid treatment, and the porous carbon can be formed by methods such as sintering of carbon fine particles or sintering of organic polymers. it can.
- a transparent counter electrode can be used by wiring a metal having a high redox catalytic effect such as platinum on a transparent conductive substrate, or by treating the surface with chloroplatinic acid.
- the electrolyte may be a combination of iodine (I 2 ) with a metal iodide or an organic iodide, a combination of bromine (Br 2 ) with a metal bromide or an organic bromide, or a mixture of furocyanate / furocyanate / fluorescein / phenyl.
- Metal complexes such as perylene sulfide, sodium polysulfide, zeo compounds such as alkylthiol / alkyl disulfide, piologen dyes, hydroquinone / quinone, and the like can be used.
- the quaternary ammonium compounds are preferred, but not limited thereto, and two or more of these can be used in combination.
- I 2 and L i I electrolyte obtained by combining the quaternary Anmoniumu compounds such N a I and imidazo Riumuyodai de are preferred.
- the concentration of the electrolyte salt is preferably from 0.05 to 5 M, more preferably from 0.2 to 1 M, based on the solvent.
- concentration of B r 2 is 0. 0 0 0 5 ⁇ 1 M, more preferably an 0. 0 0 1 ⁇ 0. 1 M.
- various additives such as 4-tert-butylpyridine and carboxylic acid can be added for the purpose of improving the open-circuit voltage and the short-circuit current.
- the electrolyte composition For the purpose of reducing leakage of the photoelectric conversion element and volatilization of the electrolyte, it is also possible to dissolve a gelling agent, a polymer, a cross-linking monomer, and the like in the above-mentioned electrolyte composition and use it as a gel electrolyte.
- a gelling agent a polymer, a cross-linking monomer, and the like
- the ratio of germa tritas to the electrolyte composition the more the electrolyte composition, the higher the ionic conductivity but the lower the mechanical strength.
- the electrolyte composition is desirably 50 to 99% by weight of the gel electrolyte, and 80 to 97% by weight. Is more preferred. Further, it is also possible to realize an all-solid-state photoelectric conversion element by dissolving the above-mentioned electrolyte and plasticizer in a polymer and volatilizing and removing the plasticizer.
- the method for manufacturing the photoelectric conversion element is not particularly limited.
- the electrolyte composition can be in a liquid state or can be gelled inside the photoelectric conversion element.
- the semiconductor electrode and the counter electrode face each other, and a portion of the substrate on which the semiconductor electrode is not formed is sealed so that the two electrodes do not touch each other.
- the gap between the semiconductor electrode and the counter electrode is not particularly limited, but is usually 1 to 100 m, which is more preferable. Preferably it is 1 to 50 m. If the distance between the electrodes is too long, the photocurrent will decrease due to the decrease in conductivity.
- the sealing method is not particularly limited, a material having light resistance, insulation, and moisture resistance is preferable.
- an injection port for injecting the solution of the electrolyte composition is required, but the location of the injection port is not particularly limited as long as it is not on the counter electrode of the semiconductor electrode supporting the dye and a portion facing the semiconductor electrode.
- the injection method it is preferable to inject the liquid into the above-mentioned cell, which is sealed in advance and has a solution injection port opened. In this case, it is convenient to drop several drops of the solution into the inlet and inject the solution by capillary action.
- the injection operation can be performed under reduced pressure or under heating, if necessary. After the solution has been completely injected, remove the solution remaining in the inlet and seal the inlet.
- a glass plate, a plastic substrate, or the like can be sealed with a sealing agent.
- a polymer solution containing an electrolyte composition and a plasticizer is volatilized and removed by a casting method on a semiconductor electrode supporting a dye. After the plasticizer is completely removed, sealing is performed in the same manner as described above. This sealing is preferably performed using a vacuum sealer or the like under an inert gas atmosphere or under reduced pressure. After sealing, heating and pressurizing operations can be performed as necessary to sufficiently impregnate the electrolyte into the semiconductor fine particle layer.
- the photoelectric conversion element can be manufactured in various shapes depending on its use, and the shape is not particularly limited.
- the transparent substrate, the conductive wiring layer, and the protective layer for example, a metal oxide layer are not sequentially stacked from the light receiving surface side.
- the use of a transparent conductive substrate having a sheet resistance of 10 ⁇ / port or less eliminates direct contact between the conductive wiring layer and the electrolyte. This makes it possible to prevent corrosion of the photovoltaic element, thereby realizing a photoelectric conversion element having high durability and excellent photoelectric conversion efficiency.
- FIG. 1 is a cross-sectional view of a principal part of a dye-sensitized wet photoelectric conversion element according to one embodiment of the present invention.
- FIG. 2 is a conductive wiring of the dye-sensitized wet photoelectric conversion element according to one embodiment of the present invention.
- FIG. 3 is a plan view of a main part of a dye-sensitized wet photoelectric conversion element according to an embodiment of the present invention.
- FIG. 1 shows a dye-sensitized wet photoelectric conversion device according to an embodiment of the present invention.
- a semiconductor fine particle layer 3 carrying a sensitizing dye on one main surface of a transparent substrate 1 via a conductive wiring layer / metal oxide layer is provided.
- semiconductor electrode semiconductor electrode
- the platinum or platinum catalyst layer 5 is formed on one main surface of the transparent conductive substrate 4.
- the semiconductor fine particle layer 3 and the platinum or platinum catalyst layer 5 They are arranged facing each other at a predetermined interval, and an electrolyte layer (electrolyte solution) 6 is sealed in the space between them.
- the electrolyte layer 6 is sealed by a predetermined sealing member not shown.
- FIG. 2 shows the details of the conductive wiring layer / metal oxide layer 2 laminated on one main surface of the transparent substrate 1.
- the transparent substrate The plate 1, the conductive wiring layer 2a and the metal oxide layer 2b are sequentially laminated to form a transparent conductive substrate having a sheet resistance of 10 ⁇ / port or less.
- the conductive wiring layer 2a is completely covered by the metal oxide layer 2b formed continuously over the entire surface of the substrate.
- FIG. 3 is a plan view (projection view) of the transparent conductive substrate of the dye-sensitized wet photoelectric conversion element viewed from the light receiving surface side.
- the conductive wiring layer 2 a is joined to the current collecting portion 7.
- transparent substrate 1 Materials for the transparent substrate 1, conductive wiring layer 1a, metal oxide layer 2b, semiconductor fine particle layer 3, transparent conductive substrate 4 and electrolyte layer 6 can be selected as necessary from the materials listed above. can do.
- the transparent substrate 1 is prepared.
- a conductive wiring layer 2a having a predetermined pattern is formed on the transparent substrate 1 by a lithography method, a lift-off method, or the like.
- a metal oxide layer 2b is formed on the entire surface of the transparent substrate 1 so as to cover the conductive wiring layer 2a.
- a paste in which semiconductor fine particles are dispersed is applied to a predetermined gap (thickness) on the metal oxide layer 2b.
- the semiconductor fine particles are sintered by heating at a predetermined temperature for a predetermined time. Thereby, semiconductor fine particle layer 3 is formed on metal oxide layer 2b.
- the dye is carried by dipping the semiconductor fine particle layer 3 in a dye solution or the like.
- a transparent conductive substrate 4 is separately prepared, and a platinum or platinum catalyst layer 5 is formed thereon.
- the transparent substrate 1 and the transparent conductive substrate 4 on which the conductive wiring layer 2a, the metal oxide layer 2b and the dye-carrying semiconductor fine particle layer 3 are formed are combined with the semiconductor fine particle layer 3 and platinum or platinum.
- the catalyst layers 5 are spaced at predetermined intervals, for example, 1 to 100 wm, preferably 1 to 50 m.
- a space for enclosing the electrolyte layer 6 is formed using a predetermined sealing member while being arranged so as to face each other, and the electrolyte layer 6 is injected into this space from a liquid injection port formed in advance. Then, close the injection port. Thereby, a dye-sensitized wet photoelectric conversion element is manufactured.
- the light transmitted through the transparent substrate 1 from the side of the transparent substrate 1 and incident thereon excites a sensitizing dye carried on the surface of the semiconductor fine particle layer 3 to generate electrons.
- the electrons are immediately transferred from the dye to the semiconductor fine particles of the semiconductor fine particle layer 3.
- the sensitizing dye that has lost the electrons receives electrons from the ions of the electrolyte layer 6, and the molecule that has passed the electrons receives the electrons again at the platinum or platinum catalyst layer 5 at the counter electrode.
- a transparent conductive substrate which is electrically connected to the semiconductor fine particle layer 3, and is formed by sequentially laminating the transparent substrate 1, the conductive wiring layer 2a and the metal oxide layer 1b, and platinum or platinum An electromotive force is generated between the catalyst layer 5 and the electrically conductive transparent conductive substrate 4. Thus, photoelectric conversion is performed.
- the use of the transparent conductive substrate in which the transparent substrate 1, the conductive wiring layer a, and the metal oxide layer 1b are sequentially stacked from the light receiving surface side is used. Since the conductive wiring layer 2a and the electrolyte layer 6 do not come into direct contact with each other, not only does the reverse electron transfer reaction not occur, but also the corrosion of the conductive wiring layer 2a can be prevented, and the durability is improved. It is possible to realize a dye-sensitized wet-type photoelectric conversion element having high photoelectric conversion efficiency and excellent, particularly, a dye-sensitized wet-type solar cell.
- Table 1 summarizes the conditions of the examples together with the conditions of the comparative examples.
- Table 2 shows the measurement results of the examples together with the measurement results of the comparative example. 9 I
- T i 0 2 fine particles as the fine semiconductor particles.
- T i 0 2 particles are distributed to the base one strike Arakawa Hiroshisoku "dye-sensitized state-of-the-art solar cells" (Sea Emushi one) P.45 - 47 a with reference (2001) was prepared as follows. 125 ml of titanium isopropoxide was slowly added dropwise to 75Om1 of a 0.1 M nitric acid aqueous solution while stirring at room temperature. When the addition was completed, the solution was transferred to a constant temperature bath at 80 ° C. and stirred for 8 hours to obtain a cloudy translucent sol solution.
- This sol solution was allowed to cool to room temperature, filtered through a glass filter, and then diluted to 700 ml.
- the obtained sol solution was transferred to an autoclave, subjected to a hydrothermal treatment at 220 ° C. for 12 hours, and then subjected to a dispersion treatment by performing an ultrasonic treatment for 1 hour.
- this solution was concentrated at 40 ° C. using an evaporator, and adjusted to have a Ti 2 content of 10 wt%.
- polyethylene glycol molecular weight 5 0 50,000
- a transparent substrate 1 made of soda-lime glass with a thickness of 1.1 mm, a conductive layer 2 a with a Ru layer with a thickness of 450 nm (underlying thickness of 50 nm) C r layer of wiring width is 1 0 0, wire spacing is 5 mm), in order to S n 0 2 layers I tO layer and thickness 5 0 nm thick 4 5 0 nm as the metal oxide layer 1 b the transparent conductive film was formed glass substrate (sheet resistance 1 Omega / mouth, 3 0 mm opening) size by was prepared, Buredoko one coating method Tokura the T i 0 2 paste as described above thereon is 2 0 m mx 1 5 mm. after coating with the gap 2 0 0 m, 4 5 and held between 0 ° C to 3 0 minutes to sinter the T i 0 2 on the transparent conductive glass substrate.
- platinum was sputtered on a fluorine-doped conductive glass substrate (sheet resistance: 100 ⁇ / port) with a 1-mm injection port in advance with a thickness of 100 nm, and platinum chloride was placed on it. A few drops of an ethanol solution of the acid were dripped and heated to 385 ° C.
- Examples 2 to 18 photoelectric conversion elements were manufactured in the same manner as in Example 1 except that a transparent conductive substrate provided with a conductive wiring layer and a metal oxide layer shown in Table 1 was used.
- a photoelectric conversion element was manufactured in the same manner as in Example 1 except that the conductive wiring layers shown in Table 1 were provided, and a transparent conductive substrate without the metal oxide layer was used. did. Further, in Comparative Examples 16 to 19, the metal oxide layers shown in Table 1 were provided, and the conductive wiring layers were formed.
- a photoelectric conversion element was produced in the same manner as in Example 1 except that a transparent conductive substrate without the was used.
- the dye-sensitized wet-type photoelectric conversion elements of Examples 1 to 18 and Comparative Examples 1 to 19 manufactured as described above were irradiated with simulated sunlight (AM 1.5, 100 mW / cm 2 ).
- the photoelectric conversion efficiency was measured immediately after fabrication and one month after. During the measurement period, the photoelectric conversion element was irradiated with ultraviolet light (UV light) and stored at room temperature.
- UV light ultraviolet light
- the dye-sensitized wet-type photoelectric conversion elements of Examples 1 to 18 are the dye-sensitized wet-type photoelectric conversion elements of Comparative Examples 1 to 19 using a transparent conductive substrate without a conductive wiring layer or a metal oxide layer. It can be seen that the photoelectric conversion efficiency is dramatically improved as compared with the conversion element, and that the durability is far superior due to the lamination of the conductive wiring layer 1a and the metal oxide layer 1b.
- the present invention is not limited to the above-described embodiments and examples, and various types based on the technical idea of the present invention may be used. Deformation is possible.
- the numerical values, structures, shapes, materials, raw materials, processes, and the like described in the above embodiments and examples are merely examples, and different numerical values, structures, shapes, materials, and raw materials may be used as necessary. , Processes, etc. may be used.
- the semiconductor fine particles are immersed in a dye solution after the semiconductor fine particle layer is formed, and the semiconductor fine particles carry the dye. May be applied.
- the transparent substrate By using a transparent conductive substrate with a sheet resistance of 10 ⁇ / port or less, in which a conductive wiring layer and a protective layer are sequentially laminated, no reverse electron transfer reaction occurs, high durability, and high photoelectric conversion efficiency A photoelectric conversion element can be obtained.
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Priority Applications (3)
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US10/542,193 US20060112988A1 (en) | 2003-01-15 | 2003-12-25 | Photoelectric conversion element |
AU2003292806A AU2003292806A1 (en) | 2003-01-15 | 2003-12-25 | Photoelectric conversion element |
US12/876,784 US20100326516A1 (en) | 2003-01-15 | 2010-09-07 | Photoelectric transfer device |
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JP2003-6914 | 2003-01-15 | ||
JP2003006914A JP4674435B2 (ja) | 2003-01-15 | 2003-01-15 | 光電変換素子 |
Related Child Applications (1)
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US12/876,784 Continuation US20100326516A1 (en) | 2003-01-15 | 2010-09-07 | Photoelectric transfer device |
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WO2004064191A1 true WO2004064191A1 (ja) | 2004-07-29 |
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US (2) | US20060112988A1 (ja) |
JP (1) | JP4674435B2 (ja) |
AU (1) | AU2003292806A1 (ja) |
WO (1) | WO2004064191A1 (ja) |
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JP4674435B2 (ja) | 2011-04-20 |
US20100326516A1 (en) | 2010-12-30 |
AU2003292806A1 (en) | 2004-08-10 |
US20060112988A1 (en) | 2006-06-01 |
JP2004220920A (ja) | 2004-08-05 |
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