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TW201843287A - Sealing film and sealed structure, and method for manufacturing sealing film and sealed structure - Google Patents

Sealing film and sealed structure, and method for manufacturing sealing film and sealed structure Download PDF

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TW201843287A
TW201843287A TW107114483A TW107114483A TW201843287A TW 201843287 A TW201843287 A TW 201843287A TW 107114483 A TW107114483 A TW 107114483A TW 107114483 A TW107114483 A TW 107114483A TW 201843287 A TW201843287 A TW 201843287A
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resin
functional group
sealing film
mol
reactive functional
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TW107114483A
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TWI746841B (en
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渡瀨裕介
野村豐
石毛紘之
鈴木雅彥
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日商日立化成股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C43/00Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
    • B29C43/32Component parts, details or accessories; Auxiliary operations
    • B29C43/34Feeding the material to the mould or the compression means
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/18Manufacture of films or sheets
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/01Use of inorganic substances as compounding ingredients characterized by their specific function
    • C08K3/013Fillers, pigments or reinforcing additives
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L101/00Compositions of unspecified macromolecular compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • H01L23/295Organic, e.g. plastic containing a filler
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/93Batch processes
    • H01L2224/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L2224/97Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Manufacture Of Macromolecular Shaped Articles (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Wire Bonding (AREA)
  • Epoxy Resins (AREA)

Abstract

Provided is a method for manufacturing a sealing film containing a heat curable resin, and an inorganic filler, the method comprising: the step for preparing a resin composition containing a resin having a reactive functional group equivalent of 250 g/mol or larger as the heat curable resin, and the inorganic filler; and the step for shaping the resin composition into a film.

Description

密封用薄膜及密封結構體、以及此等的製造方法Sealing film, sealing structure, and manufacturing method thereof

本發明有關一種密封用薄膜及密封結構體、以及此等的製造方法。The present invention relates to a sealing film, a sealing structure, and a method for manufacturing the same.

伴隨電子機器的輕薄短小化,電子零件裝置(半導體裝置等)的小型化和薄型化正在進展。使用了與半導體元件幾乎相同大小的半導體裝置之形態、或將半導體裝置裝載於半導體裝置上之構裝形態(層疊封裝(package-on-package))正蓬勃發展,而預期今後電子零件裝置小型化和薄型化進一步進展。With the reduction in weight and thickness of electronic devices, miniaturization and reduction in thickness of electronic component devices (semiconductor devices, etc.) are progressing. A form that uses a semiconductor device that is almost the same size as a semiconductor element or a structure that mounts a semiconductor device on the semiconductor device (package-on-package) is booming, and miniaturization of electronic parts and devices is expected in the future. And thinning further progress.

如果半導體元件的細微化進展,從而端子數量逐漸增加時,則變得難以在半導體元件上設置全部的外部連接端子(外部連接用的端子)。例如,當強行設置外部連接端子時,端子間的間距變窄,並且端子高度變低,從而在構裝半導體裝置後變得難以確保連接可靠性。因此,為了實現電子零件的小型化和薄型化,已提案許多新的構裝方式。If the miniaturization of the semiconductor element progresses and the number of terminals gradually increases, it becomes difficult to provide all external connection terminals (terminals for external connection) on the semiconductor element. For example, when external connection terminals are forcibly provided, the distance between the terminals becomes narrower, and the height of the terminals becomes lower, making it difficult to ensure connection reliability after the semiconductor device is constructed. Therefore, in order to reduce the size and thickness of electronic parts, many new construction methods have been proposed.

已提案例如下述構裝方法及使用此構裝方法來製作的半導體裝置:能夠將對半導體晶片進行單片化而製作的半導體元件,以具有適度的間隔的方式進行再配置後,使用固體或液狀的樹脂(密封用樹脂)來對半導體元件進行密封,並在密封部分上設置外部連接端子,該密封部分是在半導體元件的外側對半導體元件進行密封的部分(例如參照下述專利文獻1~3)。It has been proposed, for example, a mounting method and a semiconductor device manufactured by using the mounting method: a semiconductor device manufactured by singulating a semiconductor wafer can be rearranged at an appropriate interval, and then a solid or A liquid resin (resin for sealing) is used to seal a semiconductor element, and an external connection terminal is provided at a sealing portion which is a portion that seals the semiconductor element outside the semiconductor element (see, for example, Patent Document 1 below) ~ 3).

上述構裝方法中,實施了下述步驟:對於密封電子零件而製作的密封結構體(密封成形物),形成用以配置外部連接端子的線路、及外部連接端子。又,上述構裝方法中,有時將密封結構體單片化,來獲得複數個電子零件裝置(半導體裝置等),該密封結構體是對複數個電子零件(半導體元件等)進行密封而獲得的。此時,進行再配置的電子零件越多,一次的步驟中能夠製作的電子零件裝置越增加。因此,正在實行增大密封結構體的研究。現狀,例如是將半導體製造裝置用於形成線路,因此密封結構體成形成晶圓形狀(扇出型晶圓級封裝體),從而有晶圓形狀的大直徑化進展的傾向。進一步,為了更大尺寸化,並能夠使用印刷線路板製造裝置等(扇出型面板級封裝),正在研究密封結構體的面板化,該印刷線路板製造裝置比半導體製造裝置更廉價。 [先前技術文獻] (專利文獻)In the above-mentioned assembly method, the following steps are performed: for a sealed structure (sealed molded product) produced by sealing an electronic component, a line for disposing external connection terminals and an external connection terminal are formed. Further, in the above-mentioned assembly method, a plurality of electronic component devices (semiconductor devices, etc.) may be obtained by singulating the sealed structure body. The sealed structure body may be obtained by sealing a plurality of electronic components (semiconductor elements, etc.). of. At this time, the more electronic components to be relocated, the more electronic component devices can be produced in one step. Therefore, research into increasing the size of the sealed structure is being carried out. Currently, for example, since a semiconductor manufacturing apparatus is used to form a circuit, the sealed structure is formed into a wafer shape (fan-out type wafer-level package), and there is a tendency that the wafer shape becomes larger in diameter. Furthermore, in order to increase the size and enable the use of a printed wiring board manufacturing apparatus (fan-out panel-level package), the panelization of a sealed structure is being studied. This printed wiring board manufacturing apparatus is cheaper than a semiconductor manufacturing apparatus. [Prior Art Literature] (Patent Literature)

專利文獻1:日本特開2015-178635號公報 專利文獻2:日本特開2014-131016號公報 專利文獻3:日本特開2014-197670號公報Patent Document 1: Japanese Patent Application Publication No. 2015-178635 Patent Document 2: Japanese Patent Application Publication No. 2014-131016 Patent Document 3: Japanese Patent Application Publication No. 2014-197670

[發明所欲解決的問題] 然而,當使用密封用樹脂來對被密封體進行密封時,根據被密封體與用以對被密封體進行密封之密封部(密封用樹脂的硬化物)的熱膨脹率不同,有時翹曲會成為問題。尤其是在扇出型晶圓級封裝體和扇出型面板級封裝體這樣的不具有封裝基板之薄型半導體裝置中,容易發生翹曲。[Problems to be Solved by the Invention] However, when sealing a sealed body using a sealing resin, the thermal expansion of the sealed body and a sealing portion (a hardened body of the sealing resin) for sealing the sealed body is caused by the thermal expansion Different rates can sometimes cause warping. In particular, in a thin semiconductor device without a package substrate such as a fan-out wafer-level package and a fan-out panel-level package, warpage is liable to occur.

因此,本發明的目的在於提供一種密封用薄膜及其製造方法、以及使用了該密封用薄膜而得之密封結構體,該密封用薄膜能夠減少密封結構體的翹曲。 [解決問題的技術手段]Therefore, an object of the present invention is to provide a sealing film, a method for manufacturing the same, and a sealing structure obtained by using the sealing film, which can reduce warping of the sealing structure. [Technical means to solve the problem]

本發明的一態樣有關一種密封用薄膜的製造方法,該密封薄膜含有熱硬化性樹脂與無機填充材料。此方法,具備下述步驟:準備樹脂組成物的步驟,該樹脂組成物含有作為熱硬化性樹脂的反應性官能基當量大於250g/mol之樹脂、及無機填充材料;以及,將樹脂組成物成形成薄膜狀的步驟。根據此方法,能夠獲得一種密封用薄膜,該密封用薄膜能夠減少密封結構體的翹曲。One aspect of the present invention relates to a method for producing a sealing film, the sealing film containing a thermosetting resin and an inorganic filler. This method includes the steps of preparing a resin composition containing a resin having a reactive functional group equivalent of more than 250 g / mol as a thermosetting resin, and an inorganic filler; and forming the resin composition into A step of forming a thin film. According to this method, it is possible to obtain a sealing film capable of reducing warpage of the sealing structure.

樹脂組成物硬化後的玻璃轉化溫度,可以是80~180℃。此時,能夠獲得一種密封用薄膜,其能夠提升密封結構體的可靠性。The glass transition temperature after the resin composition is cured may be 80 to 180 ° C. In this case, it is possible to obtain a sealing film capable of improving the reliability of the sealed structure.

反應性官能基當量大於250g/mol之樹脂,可包含反應性官能基當量為300~410g/mol之樹脂。此時,能夠獲得一種密封用薄膜,其能夠更減少密封結構體的翹曲。又,根據此方法,容易獲得一種密封用薄膜,該密封用薄膜在硬化後具有充分的玻璃轉化溫度(Tg),且能夠提升密封結構體的可靠性。The resin having a reactive functional group equivalent of more than 250 g / mol may include a resin having a reactive functional group equivalent of 300 to 410 g / mol. In this case, it is possible to obtain a sealing film which can further reduce the warpage of the sealing structure. Moreover, according to this method, it is easy to obtain a sealing film which has a sufficient glass transition temperature (Tg) after hardening and can improve the reliability of the sealing structure.

樹脂組成物,可進一步含有反應性官能基當量為100~210g/mol之樹脂來作為熱硬化性樹脂。此時,能夠獲得一種密封用薄膜,其能夠更減少密封結構體的翹曲。又,根據此方法,容易獲得一種密封用薄膜,該密封用薄膜在硬化後具有充分的Tg,且能夠提升密封結構體的可靠性。The resin composition may further contain a resin having a reactive functional group equivalent of 100 to 210 g / mol as a thermosetting resin. In this case, it is possible to obtain a sealing film which can further reduce the warpage of the sealing structure. In addition, according to this method, it is easy to obtain a sealing film which has a sufficient Tg after curing and can improve the reliability of the sealing structure.

樹脂組成物,可進一步含有下述樹脂來作為熱硬化性樹脂:相對於反應性官能基當量大於250g/mol之樹脂的反應性官能基當量,具有1/2.9~1/2倍的反應性官能基當量之樹脂。此時,能夠獲得一種密封用薄膜,其能夠更減少密封結構體的翹曲。又,根據此方法,容易獲得一種密封用薄膜,該密封用薄膜在硬化後具有充分的Tg,且能夠提升密封結構體的可靠性。The resin composition may further contain, as the thermosetting resin, a resin having a reactive functional group equivalent of more than 250 g / mol of the reactive functional group equivalent and having a reactive function of 1 / 2.9 to 1/2 times as a reactive functional group. Base equivalent resin. In this case, it is possible to obtain a sealing film which can further reduce the warpage of the sealing structure. In addition, according to this method, it is easy to obtain a sealing film which has a sufficient Tg after curing and can improve the reliability of the sealing structure.

反應性官能基當量大於250g/mol之樹脂,可包含環氧樹脂。此時,能夠獲得一種密封用薄膜,其能夠更減少密封結構體的翹曲。又,根據此方法,容易獲得一種密封用薄膜,該密封用薄膜在硬化後具有充分的Tg,且能夠提升密封結構體的可靠性。The resin having a reactive functional group equivalent weight greater than 250 g / mol may include an epoxy resin. In this case, it is possible to obtain a sealing film which can further reduce the warpage of the sealing structure. In addition, according to this method, it is easy to obtain a sealing film which has a sufficient Tg after curing and can improve the reliability of the sealing structure.

密封用薄膜的膜厚,可以是20~250μm。此時,在塗佈時容易抑制面內的厚度的偏差,並且在塗佈時容易在深度方向上獲得一定的乾燥性。The film thickness of the sealing film may be 20 to 250 μm. In this case, it is easy to suppress the variation in thickness in the surface during coating, and it is easy to obtain a certain drying property in the depth direction during coating.

本發明的一態樣有關一種密封用薄膜,其含有熱硬化性樹脂與無機填充材料,並且,熱硬化性樹脂包含反應性官能基當量大於250g/mol之樹脂。根據此密封用薄膜,能夠減少密封結構體的翹曲。One aspect of the present invention relates to a sealing film, which contains a thermosetting resin and an inorganic filler, and the thermosetting resin contains a resin having a reactive functional group equivalent weight greater than 250 g / mol. According to this sealing film, the warpage of the sealing structure can be reduced.

密封用薄膜硬化後的玻璃轉化溫度,可以是80~180℃。此時,能夠提升密封結構體的可靠性。The glass transition temperature after the sealing film is cured may be 80 to 180 ° C. In this case, the reliability of the sealed structure can be improved.

反應性官能基當量大於250g/mol之樹脂,可包含反應性官能基當量為300~410g/mol之樹脂。此時,能夠更減少密封結構體的翹曲,並且能夠提升密封結構體的可靠性。The resin having a reactive functional group equivalent of more than 250 g / mol may include a resin having a reactive functional group equivalent of 300 to 410 g / mol. In this case, warpage of the sealing structure can be further reduced, and reliability of the sealing structure can be improved.

熱硬化性樹脂,可進一步包含反應性官能基當量為100~210g/mol之樹脂。此時,能夠更減少密封結構體的翹曲,並且能夠提升密封結構體的可靠性。The thermosetting resin may further include a resin having a reactive functional group equivalent of 100 to 210 g / mol. In this case, warpage of the sealing structure can be further reduced, and reliability of the sealing structure can be improved.

熱硬化性樹脂,可進一步包含下述樹脂:相對於反應性官能基當量大於250g/mol之樹脂的反應性官能基當量,具有1/2.9~1/2倍的反應性官能基當量之樹脂。此時,能夠更減少密封結構體的翹曲,並且能夠提升密封結構體的可靠性。The thermosetting resin may further include a resin having a reactive functional group equivalent of more than 250 g / mol of the reactive functional group equivalent, and a resin having a reactive functional group equivalent of 1 / 2.9 to 1/2 times. In this case, warpage of the sealing structure can be further reduced, and reliability of the sealing structure can be improved.

反應性官能基當量大於250g/mol之樹脂,可包含環氧樹脂。此時,能夠更減少密封結構體的翹曲,並且能夠提升密封結構體的可靠性。The resin having a reactive functional group equivalent weight greater than 250 g / mol may include an epoxy resin. In this case, warpage of the sealing structure can be further reduced, and reliability of the sealing structure can be improved.

密封用薄膜的膜厚,可以是20~250μm。此時,能夠更減少密封結構體的翹曲,並且能夠提升密封結構體的可靠性。The film thickness of the sealing film may be 20 to 250 μm. In this case, warpage of the sealing structure can be further reduced, and reliability of the sealing structure can be improved.

本發明的一態樣有關一種密封結構體,其具備:被密封體;及,上述密封用薄膜的硬化物,其用以對該被密封體進行密封。此密封結構體的翹曲減少。One aspect of the present invention relates to a sealed structure including: a to-be-sealed body; and a hardened body of the above-mentioned sealing film for sealing the to-be-sealed body. This seal structure has less warpage.

本發明的一態樣有關一種密封結構體的製造方法,其具備下述步驟:使用根據上述方法而獲得的密封用薄膜、或上述密封用薄膜,來對被密封體進行密封。根據此方法,能夠獲得一種密封結構體,該密封結構體的翹曲減少。 [發明的功效]One aspect of the present invention relates to a method for manufacturing a sealed structure, which includes the step of using a sealing film obtained by the method or the sealing film to seal a to-be-sealed body. According to this method, it is possible to obtain a sealed structure having reduced warpage. [Effect of the invention]

根據本發明,能夠提供一種密封用薄膜及其製造方法、以及使用了該密封用薄膜而得之密封結構體,該密封用薄膜能夠減少密封結構體的翹曲。According to the present invention, it is possible to provide a sealing film, a method for manufacturing the same, and a sealing structure obtained by using the sealing film, which can reduce warping of the sealing structure.

在本說明書中使用「~」來表示的數值範圍中,包含「~」前後所記載的數值,分別作為最小值和最大值。在本說明書中以階段性記載的數值範圍中,某個階段的數值範圍的上限值或下限值,可置換為另一個階段的數值範圍的上限值或下限值。本說明書中所記載的數值範圍中,該數值範圍的上限值或下限值,可置換為實施例所示的數值。「A或B」,是指只要包含A和B中的任一方即可,亦可兩方皆包含。本說明書中例示的材料,只要未特別說明,可使用單獨1種,亦可將2種以上併用。在本說明書中,當組成物中存在有複數種物質符合各成分時,只要未特別說明,組成物中的各成分的含量,意指存在於組成物中的該複數種物質的合計量。The numerical ranges indicated by "~" in this specification include the numerical values described before and after "~" as the minimum and maximum values, respectively. In the numerical ranges described stepwise in this specification, the upper limit or lower limit of the numerical range at one stage may be replaced with the upper limit or lower limit of the numerical range at another stage. Among the numerical ranges described in this specification, the upper limit value or lower limit value of the numerical range may be replaced with the numerical values shown in the examples. "A or B" means that either one of A and B may be included, or both. Unless otherwise specified, the materials exemplified in this specification may be used alone or in combination of two or more. In the present specification, when a plurality of substances are present in the composition in accordance with each component, the content of each component in the composition means the total amount of the plurality of substances present in the composition unless otherwise specified.

以下,說明本發明的較佳實施形態。Hereinafter, preferred embodiments of the present invention will be described.

本實施形態的密封用薄膜,是一種薄膜狀樹脂組成物,其含有熱硬化性成分與無機填充材料。作為熱硬化性成分,可列舉:熱硬化性樹脂、硬化劑、硬化促進劑等。熱硬化性成分,可在不包含硬化劑及/或硬化促進劑的情況下包含熱硬化性樹脂。The sealing film of this embodiment is a film-like resin composition containing a thermosetting component and an inorganic filler. Examples of the thermosetting component include a thermosetting resin, a curing agent, and a curing accelerator. The thermosetting component may contain a thermosetting resin without containing a hardener and / or a hardening accelerator.

(熱硬化性樹脂) 熱硬化性樹脂,在一分子中具有2個以上的反應性官能基。本實施形態中,是藉由例如下述方式來形成立體交聯結構而使密封用薄膜硬化:反應性官能基與其他反應性官能基藉由熱來進行反應。能夠與反應性官能基進行反應的其他反應性官能基,可以是熱硬化性樹脂所具有的反應性官能基,亦可以是硬化劑所具有的反應性官能基。(Thermosetting resin) The thermosetting resin has two or more reactive functional groups in one molecule. In this embodiment, the sealing film is hardened by, for example, forming a three-dimensional crosslinked structure by reacting a reactive functional group with another reactive functional group by heat. The other reactive functional group capable of reacting with the reactive functional group may be a reactive functional group possessed by the thermosetting resin or a reactive functional group possessed by the hardener.

熱硬化性樹脂,能夠使用選自由25℃時呈液狀的熱硬化性樹脂、及25℃時不呈液狀的熱硬化性樹脂所組成之群組中的至少一種。本實施形態中,從容易抑制薄膜表面發生破裂和裂縫的觀點而言,較佳是使用25℃時呈液狀的熱硬化性樹脂。再者,「25℃時呈液狀」,是指由E型黏度計所測得的25℃時的黏度為400Pa・s以下。The thermosetting resin can be at least one selected from the group consisting of a thermosetting resin that is liquid at 25 ° C and a thermosetting resin that is not liquid at 25 ° C. In this embodiment, it is preferable to use a thermosetting resin which is liquid at 25 ° C from the viewpoint of easily suppressing occurrence of cracks and cracks on the film surface. In addition, "liquid at 25 ° C" means that the viscosity at 25 ° C measured by an E-type viscometer is 400 Pa · s or less.

熱硬化性樹脂,包含反應性官能基當量大於250g/mol之樹脂A。本說明書中,「反應性官能基當量」,意指熱硬化性樹脂所具有的每1莫耳(mol)反應性官能基的熱硬化性樹脂的質量(g/mol)。例如,當反應性官能基為環氧基時,反應性官能基當量,是藉由下述方式測定:使熱硬化性樹脂溶於氯仿後,對所獲得的溶液加入乙酸和溴化四乙基銨乙酸溶液,然後利用過氯酸乙酸標準液進行電位滴定,並偵測全部環氧基反應後的終點。又,當反應性官能基為羥基時,是藉由下述方式測定:對熱硬化性樹脂加入乙醯化試藥,然後在甘油浴中進行加熱,並放置冷卻後,加入作為指示劑的酚酞溶液,並利用氫氧化鉀乙醇溶液來進行滴定。The thermosetting resin includes Resin A having a reactive functional group equivalent of more than 250 g / mol. In this specification, "reactive functional group equivalent" means the mass (g / mol) of the thermosetting resin per 1 mol (mol) of the reactive functional group which the thermosetting resin has. For example, when the reactive functional group is an epoxy group, the reactive functional group equivalent is determined by dissolving a thermosetting resin in chloroform, and adding acetic acid and tetraethyl bromide to the obtained solution. The ammonium acetic acid solution was then potentiometrically titrated with a perchloric acid acetic acid standard solution, and the end point of all epoxy groups was detected. In addition, when the reactive functional group is a hydroxyl group, it is measured by adding an ethylated reagent to a thermosetting resin, heating it in a glycerin bath, and leaving it to cool, and then adding phenolphthalein as an indicator. The solution was titrated with a potassium hydroxide ethanol solution.

根據本實施形態的密封用薄膜,藉由包含樹脂A,能夠減少對被密封體進行密封而獲得之密封結構體的翹曲。根據本發明人的知識見解,包含環氧樹脂及/或酚樹脂之以往的密封用樹脂(例如由密封用樹脂所構成之密封用薄膜),容易發生密封結構體的翹曲,相對於此,本實施形態中,即便是在密封用薄膜包含環氧樹脂及/或酚樹脂的情況下,亦能夠減少密封結構體的翹曲。雖然能夠獲得這樣的功效的原因並不清楚,但本發明人推測原因在於,由於密封用薄膜包含樹脂A,以致硬化時的交聯點減少,從而硬化後的交聯密度變小。According to the sealing film of this embodiment, by including the resin A, it is possible to reduce the warpage of the sealing structure obtained by sealing the object to be sealed. According to the knowledge of the present inventors, conventional sealing resins containing epoxy resins and / or phenol resins (for example, sealing films made of sealing resins) are prone to warping of the sealing structure. In this embodiment, even when the sealing film includes an epoxy resin and / or a phenol resin, the warpage of the sealing structure can be reduced. Although the reason why such an effect can be obtained is not clear, the inventors speculate that the reason is that the sealing film contains resin A, so that the crosslinking point at the time of curing is reduced, and the crosslinking density after curing is reduced.

作為樹脂A,可列舉例如:環氧樹脂、酚樹脂、苯氧樹脂、氰酸酯樹脂、熱硬化性聚醯亞胺、三聚氰胺樹脂、尿素樹脂、不飽和聚酯、醇酸樹脂、聚胺酯等。從容易獲得具有優異的熱導率的硬化物的觀點、及本發明的功效變得顯著的觀點而言,較佳是環氧樹脂或酚樹脂。當樹脂A為環氧樹脂時,反應性官能基為環氧基。當樹脂A為酚樹脂時,反應性官能基為羥基(酚性羥基)。Examples of the resin A include epoxy resin, phenol resin, phenoxy resin, cyanate resin, thermosetting polyimide, melamine resin, urea resin, unsaturated polyester, alkyd resin, and polyurethane. An epoxy resin or a phenol resin is preferable from the viewpoint that a hardened material having excellent thermal conductivity is easily obtained and the effect of the present invention becomes remarkable. When the resin A is an epoxy resin, the reactive functional group is an epoxy group. When the resin A is a phenol resin, the reactive functional group is a hydroxyl group (phenolic hydroxyl group).

從能夠更減少密封結構體的翹曲的觀點而言,樹脂A,可包含反應性官能基當量為280g/mol以上之樹脂,亦可包含反應性官能基當量為300g/mol以上之樹脂,亦可包含反應性官能基當量為330g/mol以上之樹脂。從硬化後的Tg變得充分且能夠提升密封結構體的可靠性(熱可靠性)的觀點而言,樹脂A,可包含反應性官能基當量為500g/mol以下之樹脂,亦可包含反應性官能基當量為450g/mol以下之樹脂,亦可包含反應性官能基當量為410g/mol以下之樹脂。從這些觀點而言,樹脂A,可包含反應性官能基當量大於250g/mol且500g/mol以下之樹脂,亦可包含反應性官能基當量為280~450g/mol之樹脂,亦可包含反應性官能基當量為300~410g/mol之樹脂,亦可包含反應性官能基當量為330~410g/mol之樹脂。From the viewpoint of further reducing the warpage of the sealing structure, the resin A may include a resin having a reactive functional group equivalent of 280 g / mol or more, or a resin having a reactive functional group equivalent of 300 g / mol or more. A resin having a reactive functional group equivalent of 330 g / mol or more may be included. From the viewpoint that the Tg after curing is sufficient and the reliability (thermal reliability) of the sealed structure can be improved, the resin A may include a resin having a reactive functional group equivalent of 500 g / mol or less, and may also include reactivity. The resin having a functional group equivalent of 450 g / mol or less may also include a resin having a reactive functional group equivalent of 410 g / mol or less. From these viewpoints, the resin A may include a resin having a reactive functional group equivalent weight greater than 250 g / mol and less than 500 g / mol, or a resin having a reactive functional group equivalent weight of 280 to 450 g / mol, and may also include a reactive property. The resin having a functional group equivalent of 300 to 410 g / mol may also include a resin having a reactive functional group equivalent of 330 to 410 g / mol.

從能夠兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,樹脂A的含量,以熱硬化性樹脂的總質量作為基準計,可以是5質量%以上、10質量%以上、12質量%以上或15質量%以上,並且,可以是90質量%以下、85質量%以下、70質量%以下或30質量%以下。上述上限值和下限值,能夠任意地組合。因此,樹脂A的含量,以熱硬化性樹脂的總質量作為基準計,例如可以是10~90質量%,亦可以是12~85質量%,亦可以是15~75質量%,亦可以是5~30質量%,亦可以是10~30質量%,亦可以是15~30質量%。再者,在以下相同的記載中,個別記載的上限值和下限值亦能夠任意地組合。From the viewpoint of reducing the warpage of the sealing structure and improving the reliability of the sealing structure, the content of the resin A may be 5% by mass or more and 10% by mass based on the total mass of the thermosetting resin. Above, 12% by mass or more, or 15% by mass, and may be 90% by mass or less, 85% by mass or less, 70% by mass or less, or 30% by mass or less. The above upper limit value and lower limit value can be arbitrarily combined. Therefore, the content of the resin A, based on the total mass of the thermosetting resin, may be, for example, 10 to 90% by mass, 12 to 85% by mass, or 15 to 75% by mass, or 5 -30 mass%, 10-30 mass%, or 15-30 mass% may also be sufficient. In addition, in the same description below, the upper limit value and the lower limit value individually described can also be arbitrarily combined.

尤其是從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,樹脂A中的反應性官能基單量為300~410g/mol之樹脂的含量,以熱硬化性樹脂的總質量作為基準計,可以是10~90質量%,亦可以是12~85質量%,亦可以是15~75質量%。In particular, from the viewpoint of reducing the warpage of the sealed structure and improving the reliability of the sealed structure at a higher level, the content of the resin having a single reactive functional group in the resin A of 300 to 410 g / mol Based on the total mass of the thermosetting resin, it may be 10 to 90% by mass, 12 to 85% by mass, or 15 to 75% by mass.

本實施形態中,將具有相互不同的反應性官能基當量之複數種熱硬化性樹脂組合使用。此時,能夠兼顧減少密封結構體的翹曲與提升密封結構體的可靠性。又,此時,即便在增多了無機填充材料的情況(例如以密封用薄膜的總質量(溶劑的質量除外)作為基準計,將無機填充材料的量設為70質量%以上的情況)下,亦能夠減少硬化後的龜裂和裂縫。雖然能夠獲得這些功效的原因並不清楚,但本發明人推測原因在於,源自樹脂A的交聯結構能夠提升耐龜裂性。In this embodiment, a plurality of types of thermosetting resins having mutually different reactive functional group equivalents are used in combination. In this case, it is possible to achieve both reduction in warpage of the sealed structure and improvement in reliability of the sealed structure. In this case, even when the inorganic filler is increased (for example, when the total mass of the sealing film (excluding the mass of the solvent) is used as a reference and the amount of the inorganic filler is 70% by mass or more), It can also reduce cracks and cracks after hardening. Although the reason why these effects can be obtained is not clear, the inventors speculate that the reason is that the crosslinked structure derived from the resin A can improve the crack resistance.

熱硬化性樹脂,較佳是包含樹脂B,相對於樹脂A的反應性官能基當量,該樹脂B具有1/2.9~1/2倍的反應性官能基當量。此時,能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性。雖然此原因並不清楚,但本發明人推測原因在於,藉由利用硬化來形成具有交聯較密的部分與交聯較疏的部分之交聯結構,在硬化時能夠抑制發生應力,並且在硬化後能夠確保充分的Tg。樹脂B,可包含反應性官能基當量不同的複數種樹脂。The thermosetting resin preferably contains resin B, and has a reactive functional group equivalent of 1 / 2.9 to 1/2 times the reactive functional group equivalent of resin A. In this case, it is possible to achieve a higher level of both reducing warpage of the sealed structure and improving reliability of the sealed structure. Although the reason for this is not clear, the inventors speculate that the reason is that by using hardening to form a crosslinked structure having densely crosslinked portions and sparsely crosslinked portions, stress can be suppressed during hardening, and After hardening, sufficient Tg can be ensured. The resin B may include a plurality of types of resins having different reactive functional group equivalents.

當熱硬化性樹脂包含反應性官能基當量不同的複數種樹脂A時,樹脂B,只要是相對於至少1種樹脂A的反應性官能基當量,具有1/2.9~1/2倍的反應性官能基當量之樹脂即可。When the thermosetting resin contains a plurality of resins A having different reactive functional group equivalents, the resin B has a reactivity of 1 / 2.9 to 1/2 times that of the reactive functional group equivalents of at least one resin A. Functionally equivalent resin is sufficient.

樹脂B所具有的反應性官能基,可與樹脂A所具有的反應性官能基相同,亦可以不同。樹脂B所具有的反應性官能基,可以是能夠與樹脂A所具有的反應性官能基藉由熱進行反應的官能基。例如,當樹脂A為環氧樹脂時,樹脂B可以是酚樹脂、聚醯胺樹脂、羧酸樹脂等。又,例如,當樹脂A為酚樹脂時,樹脂B可以是環氧樹脂等。The reactive functional group of the resin B may be the same as or different from the reactive functional group of the resin A. The reactive functional group of the resin B may be a functional group capable of reacting with the reactive functional group of the resin A by heat. For example, when the resin A is an epoxy resin, the resin B may be a phenol resin, a polyamide resin, a carboxylic acid resin, or the like. In addition, for example, when the resin A is a phenol resin, the resin B may be an epoxy resin or the like.

從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,樹脂B的含量,以熱硬化性樹脂的總質量作為基準計,可以是5質量%以上、15質量%以上或25質量%以上,並且,可以是60質量%以下、50質量%以下或40質量%以下。因此,樹脂B的含量,以熱硬化性樹脂的總質量作為基準計,例如可以是5~60質量%,亦可以是15~50質量%,亦可以是25~40質量%。From the standpoint of reducing the warpage of the sealing structure and improving the reliability of the sealing structure at a higher level, the content of the resin B may be 5% by mass based on the total mass of the thermosetting resin. It is 15 mass% or more or 25 mass% or more, and may be 60 mass% or less, 50 mass% or less, or 40 mass% or less. Therefore, the content of the resin B may be 5 to 60% by mass, 15 to 50% by mass, or 25 to 40% by mass based on the total mass of the thermosetting resin.

又,熱硬化性樹脂,較佳是包含樹脂A、及反應性官能基當量為250g/mol以下之樹脂C。此時,能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性。雖然此原因並不清楚,但本發明人推測原因在於,藉由利用硬化來形成具有交聯較密的部分與交聯較疏的部分之交聯結構,在硬化時能夠抑制發生應力,並且在硬化後能夠確保充分的Tg。The thermosetting resin is preferably resin A and resin C having a reactive functional group equivalent of 250 g / mol or less. In this case, it is possible to achieve a higher level of both reducing warpage of the sealed structure and improving reliability of the sealed structure. Although the reason for this is not clear, the inventors speculate that the reason is that by using hardening to form a crosslinked structure having densely crosslinked portions and sparsely crosslinked portions, stress can be suppressed during hardening, and After hardening, sufficient Tg can be ensured.

從能夠更減少密封結構體的翹曲的觀點而言,樹脂C,可包含反應性官能基當量為80g/mol以上之樹脂,亦可包含反應性官能基當量為90g/mol以上之樹脂,亦可包含反應性官能基當量為100g/mol以上之樹脂,亦可包含反應性官能基當量為130g/mol以上之樹脂。從硬化後的Tg變得充分且能夠提升密封結構體的可靠性(熱可靠性)的觀點而言,樹脂C,可包含反應性官能基當量為210g/mol以下之樹脂,亦可包含反應性官能基當量為205g/mol以下之樹脂,亦可包含反應性官能基當量為160g/mol以下之樹脂。從這些觀點而言,樹脂C,可包含反應性官能基當量為80~250g/mol之樹脂,亦可包含反應性官能基當量為90~210g/mol之樹脂,亦可包含反應性官能基當量為100~205g/mol之樹脂,亦可包含反應性官能基當量為100~210g/mol之樹脂,亦可包含反應性官能基當量為100~160g/mol以下之樹脂,亦可包含反應性官能基當量為130~210g/mol之樹脂,亦可包含反應性官能基當量為130~160g/mol之樹脂。From the viewpoint of further reducing the warpage of the sealing structure, the resin C may include a resin having a reactive functional group equivalent of 80 g / mol or more, or a resin having a reactive functional group equivalent of 90 g / mol or more. A resin having a reactive functional group equivalent of 100 g / mol or more may be included, and a resin having a reactive functional group equivalent of 130 g / mol or more may be included. From the viewpoint that the Tg after curing is sufficient and the reliability (thermal reliability) of the sealed structure can be improved, the resin C may include a resin having a reactive functional group equivalent of 210 g / mol or less, and may also include reactivity. The resin having a functional group equivalent of 205 g / mol or less may also include a resin having a reactive functional group equivalent of 160 g / mol or less. From these viewpoints, the resin C may include a resin having a reactive functional group equivalent of 80 to 250 g / mol, a resin having a reactive functional group equivalent of 90 to 210 g / mol, or a reactive functional group equivalent. Resins of 100 to 205 g / mol, and resins having a reactive functional group equivalent of 100 to 210 g / mol, and resins having a reactive functional group equivalent of 100 to 160 g / mol or less may be included. The resin having a base equivalent of 130 to 210 g / mol may also include a resin having a reactive functional group equivalent of 130 to 160 g / mol.

樹脂C,可包含反應性官能基不同的複數種樹脂。例如,作為樹脂C,可將反應性官能基當量為100~160g/mol之樹脂與反應性官能基當量為160~250g/mol之樹脂組合使用。The resin C may include a plurality of types of resins having different reactive functional groups. For example, as the resin C, a resin having a reactive functional group equivalent of 100 to 160 g / mol and a resin having a reactive functional group equivalent of 160 to 250 g / mol can be used in combination.

樹脂C所具有的反應性官能基,可與樹脂A所具有的反應性官能基相同,亦可以不同。例如,樹脂C所具有的反應性官能基,可以是能夠與樹脂A所具有的反應性官能基藉由熱進行反應的官能基。The reactive functional group of the resin C may be the same as or different from the reactive functional group of the resin A. For example, the reactive functional group of the resin C may be a functional group capable of reacting with the reactive functional group of the resin A by heat.

相對於樹脂A的反應性官能基當量,樹脂C的反應性官能基當量可以是1/2.9~1/2倍。作為樹脂A與樹脂C之較佳的組合,是反應性官能基當量為300~410g/mol之樹脂與反應性官能基當量為100~210g/mol之樹脂之組合,更佳的組合是反應性官能基當量為330~410g/mol之樹脂與反應性官能基當量為130~210g/mol之樹脂之組合。The reactive functional group equivalent of the resin C may be 1 / 2.9 to 1/2 times the reactive functional group equivalent of the resin A. The preferred combination of resin A and resin C is a combination of a resin having a reactive functional group equivalent of 300 to 410 g / mol and a resin having a reactive functional group equivalent of 100 to 210 g / mol, and a more preferable combination is reactivity. A combination of a resin having a functional group equivalent of 330 to 410 g / mol and a resin having a reactive functional group equivalent of 130 to 210 g / mol.

從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,樹脂C的含量,以熱硬化性樹脂的總質量作為基準計,可以是5質量%以上、15質量%以上、25質量%以上、35質量%以上或45質量%以上,並且,可以是85質量%以下、75質量%以下、65質量%以下、60質量%以下、50質量%以下或40質量%以下。因此,樹脂C的含量,以熱硬化性樹脂的總質量作為基準計,例如可以是25~85質量%,亦可以是35~75質量%,亦可以是45~65質量%,亦可以是5~60質量%,亦可以是15~50質量%,亦可以是25~40質量%。尤其是從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,樹脂C中的反應性官能基當量為100~210g/mol之樹脂的含量,以熱硬化性樹脂的總質量作為基準計,可以是25~85質量%,亦可以是35~75質量%,亦可以是45~65質量%。From the viewpoint of reducing the warpage of the sealing structure and improving the reliability of the sealing structure at a higher level, the content of the resin C may be 5% by mass based on the total mass of the thermosetting resin. Above, 15% by mass, 25% by mass, 35% by mass, or 45% by mass, and may be 85% by mass, 75% by mass, 65% by mass, 60% by mass, or 50% by mass Or 40% by mass or less. Therefore, the content of the resin C, based on the total mass of the thermosetting resin, may be, for example, 25 to 85% by mass, or 35 to 75% by mass, or 45 to 65% by mass, or 5 -60% by mass, 15-50% by mass, or 25-40% by mass. In particular, from the viewpoint of reducing the warpage of the sealed structure and improving the reliability of the sealed structure at a higher level, the content of the resin having a reactive functional group equivalent of 100 to 210 g / mol in the resin C, Based on the total mass of the thermosetting resin, it may be 25 to 85% by mass, 35 to 75% by mass, or 45 to 65% by mass.

繼而,詳細說明樹脂A包含環氧樹脂之第1實施形態、及樹脂A包含酚樹脂之第2實施形態。Next, a first embodiment in which the resin A includes an epoxy resin and a second embodiment in which the resin A includes a phenol resin will be described in detail.

[第1實施形態] 第1實施形態的密封用薄膜的樹脂A包含環氧樹脂。反應性官能基當量大於250g/mol之環氧樹脂,只要是一分子中具有2個以上環氧基且環氧基當量大於250g/mol之樹脂,能夠無特別限制地使用。[First Embodiment] The resin A of the sealing film according to the first embodiment contains an epoxy resin. An epoxy resin having a reactive functional group equivalent weight greater than 250 g / mol can be used without particular limitation as long as it is a resin having two or more epoxy groups in one molecule and an epoxy group equivalent weight greater than 250 g / mol.

作為反應性官能基當量大於250g/mol之環氧樹脂,可列舉例如:雙酚A型環氧樹脂、雙酚AP型環氧樹脂、雙酚AF型環氧樹脂、雙酚B型環氧樹脂、雙酚BP型環氧樹脂、雙酚C型環氧樹脂、雙酚E型環氧樹脂、雙酚F型環氧樹脂、雙酚G型環氧樹脂、雙酚M型環氧樹脂、雙酚S型環氧樹脂(己二醇雙酚S二環氧丙基醚等)、雙酚P型環氧樹脂、雙酚PH型環氧樹脂、雙酚TMC型環氧樹脂、雙酚Z型環氧樹脂、苯酚酚醛清漆型環氧樹脂(鄰甲酚酚醛清漆型環氧樹脂等)、聯苯型環氧樹脂、萘型環氧樹脂、雙環戊二烯型環氧樹脂、聯二甲酚型環氧樹脂(聯二甲酚二環氧丙基醚等)、氫化雙酚A型環氧樹脂(氫化雙酚A環氧丙基醚等);這些樹脂的二元酸改質二環氧丙基醚型環氧樹脂;脂肪族環氧樹脂等。其中,從能夠兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,較佳是具有雙酚A骨架之環氧樹脂。環氧樹脂,可使用單獨1種,亦可將2種以上併用。Examples of the epoxy resin having a reactive functional group equivalent weight greater than 250 g / mol include bisphenol A epoxy resin, bisphenol AP epoxy resin, bisphenol AF epoxy resin, and bisphenol B epoxy resin. Bisphenol BP epoxy resin, bisphenol C epoxy resin, bisphenol E epoxy resin, bisphenol F epoxy resin, bisphenol G epoxy resin, bisphenol M epoxy resin, Phenol S type epoxy resin (hexanediol bisphenol S diglycidyl ether, etc.), bisphenol P type epoxy resin, bisphenol PH type epoxy resin, bisphenol TMC type epoxy resin, bisphenol Z type Epoxy resin, phenol novolac epoxy resin (o-cresol novolac epoxy resin, etc.), biphenyl epoxy resin, naphthalene epoxy resin, dicyclopentadiene epoxy resin, bixylenol Type epoxy resin (bixylenol diglycidyl ether, etc.), hydrogenated bisphenol A type epoxy resin (hydrogenated bisphenol A glycidyl ether, etc.); dibasic acid modified diepoxy of these resins Propyl ether epoxy resin; aliphatic epoxy resin, etc. Among these, an epoxy resin having a bisphenol A skeleton is preferred from the viewpoint of reducing the warpage of the sealed structure and improving the reliability of the sealed structure. An epoxy resin may be used individually by 1 type, and may use 2 or more types together.

從容易抑制薄膜表面發生破裂和裂縫的觀點而言,作為反應性官能基當量大於250g/mol之環氧樹脂,可使用25℃時呈液狀的環氧樹脂(液狀環氧樹脂)。作為液狀環氧樹脂,可列舉:雙酚A型環氧丙基醚、雙酚AD型環氧丙基醚、雙酚S型環氧丙基醚、雙酚F型環氧丙基醚、氫化雙酚A型環氧丙基醚、氧化乙烯加成物雙酚A型環氧丙基醚、氧化丙烯加成物雙酚A型環氧丙基醚、萘樹脂的環氧丙基醚、3官能型或4官能型環氧丙基胺等。From the viewpoint of easily suppressing the occurrence of cracks and cracks on the film surface, as the epoxy resin having a reactive functional group equivalent weight greater than 250 g / mol, a liquid epoxy resin (liquid epoxy resin) at 25 ° C can be used. Examples of the liquid epoxy resin include bisphenol A type glycidyl ether, bisphenol AD type glycidyl ether, bisphenol S type glycidyl ether, bisphenol F type glycidyl ether, Hydrogenated bisphenol A-type epoxypropyl ether, ethylene oxide adducts bisphenol A-type epoxypropyl ether, propylene oxide adducts bisphenol A-type epoxypropyl ether, naphthalene resin epoxypropyl ether, 3-functional or 4-functional epoxypropylamine.

從能夠更減少密封結構體的翹曲的觀點而言,反應性官能基當量大於250g/mol之環氧樹脂的反應性官能基當量,較佳是280g/mol,更佳是300g/mol,進一步更佳是330g/mol。從硬化後的Tg變得充分且能夠提升密封結構體的可靠性(熱可靠性)的觀點而言,反應性官能基當量大於250g/mol之環氧樹脂的反應性官能基當量,較佳是500g/mol以下,更佳是450g/mol以下,進一步更佳是410g/mol以下。從這樣的觀點而言,反應性官能基當量大於250g/mol之環氧樹脂的反應性官能基當量,較佳是大於250g/mol且500g/mol以下,更佳是280~450g/mol,進一步更佳是300~410g/mol,特佳是330~410g/mol。From the viewpoint of further reducing the warpage of the sealing structure, the reactive functional group equivalent of the epoxy resin having a reactive functional group equivalent of more than 250 g / mol is preferably 280 g / mol, more preferably 300 g / mol, further More preferably, it is 330 g / mol. From the viewpoint that the Tg after curing becomes sufficient and the reliability (thermal reliability) of the sealed structure can be improved, the reactive functional group equivalent of the epoxy resin having a reactive functional group equivalent of more than 250 g / mol is preferably 500 g / mol or less, more preferably 450 g / mol or less, even more preferably 410 g / mol or less. From such a viewpoint, the reactive functional group equivalent of the epoxy resin having a reactive functional group equivalent of more than 250 g / mol is preferably greater than 250 g / mol and 500 g / mol or less, more preferably 280 to 450 g / mol, and further It is more preferably 300 to 410 g / mol, and particularly preferably 330 to 410 g / mol.

作為反應性官能基當量大於250g/mol之市售的環氧樹脂,可列舉DIC股份有限公司製造的「EXA4816」、「EXA4850-1000」、「EXA4850-150」等。Examples of commercially available epoxy resins having a reactive functional group equivalent weight greater than 250 g / mol include "EXA4816", "EXA4850-1000", and "EXA4850-150" manufactured by DIC Corporation.

從能夠兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,反應性官能基當量大於250g/mol之環氧樹脂的含量,以熱硬化性樹脂的總質量作為基準計,可以是5質量%以上、10質量%以上或15質量%以上,亦可以是90質量%以下、85質量%以下或75質量%以下。因此,反應性官能基當量大於250g/mol之環氧樹脂的含量,以熱硬化性樹脂的總質量作為基準計,例如可以是5質量%~90質量,亦可以是10質量%~85質量%,亦可以是15質量%~75質量%。尤其是從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,反應性官能基當量為300~410g/mol之環氧樹脂的含量,以熱硬化性樹脂的總質量作為基準計,可以是5質量%~90質量,亦可以是10質量%~85質量%,亦可以是15質量%~75質量%。From the viewpoint of reducing the warpage of the sealing structure and improving the reliability of the sealing structure, the content of the epoxy resin having a reactive functional group equivalent of more than 250 g / mol is based on the total mass of the thermosetting resin. It may be 5 mass% or more, 10 mass% or more, or 15 mass% or more, and may also be 90 mass% or less, 85 mass% or less, or 75 mass% or less. Therefore, the content of the epoxy resin having a reactive functional group equivalent weight greater than 250 g / mol, based on the total mass of the thermosetting resin, may be, for example, 5% to 90% by mass, or 10% to 85% by mass. It can also be 15% to 75% by mass. In particular, from the viewpoint of reducing the warpage of the sealed structure and improving the reliability of the sealed structure at a higher level, the content of the epoxy resin having a reactive functional group equivalent of 300 to 410 g / mol is based on heat. The total mass of the curable resin may be 5 to 90% by mass, 10 to 85% by mass, or 15 to 75% by mass.

反應性官能基當量大於250g/mol之液狀環氧樹脂,以熱硬化性樹脂的總質量作為基準計,可以是5質量%以上、10質量%以上或15質量%以上,亦可以是90質量%以下、85質量%以下或75質量%以下。因此,反應性官能基當量大於250g/mol之液狀環氧樹脂,以熱硬化性樹脂的總質量作為基準計,例如可以是5質量%~90質量,亦可以是10質量%~85質量%,亦可以是15質量%~75質量%。若反應性官能基當量大於250g/mol之液狀環氧樹脂的含量為上述下限值以上,則容易抑制薄膜表面發生破裂和裂縫。又,若反應性官能基當量大於250g/mol之液狀環氧樹脂的含量為上述上限值以下,則容易抑制薄膜的黏性過度變高及容易抑制邊緣融合(edge fusion)。The liquid epoxy resin having a reactive functional group equivalent weight greater than 250 g / mol, based on the total mass of the thermosetting resin, may be 5 mass% or more, 10 mass% or more, or 15 mass% or more, or 90 mass % Or less, 85% by mass or less, or 75% by mass or less. Therefore, for a liquid epoxy resin having a reactive functional group equivalent weight greater than 250 g / mol, based on the total mass of the thermosetting resin, it may be, for example, 5% to 90% by mass, or 10% to 85% by mass. It can also be 15% to 75% by mass. When the content of the liquid epoxy resin having a reactive functional group equivalent of more than 250 g / mol is equal to or more than the above-mentioned lower limit value, it is easy to suppress the occurrence of cracks and cracks on the surface of the film. In addition, when the content of the liquid epoxy resin having a reactive functional group equivalent of more than 250 g / mol is equal to or less than the above-mentioned upper limit value, it is easy to suppress an excessively high viscosity of the film and to easily suppress edge fusion.

熱硬化性樹脂,可包含反應性官能基當量為250g/mol以下之環氧樹脂。作為反應性官能基當量為250g/mol以下之環氧樹脂,可列舉例如:雙酚A型環氧樹脂、雙酚AP型環氧樹脂、雙酚AF型環氧樹脂、雙酚B型環氧樹脂、雙酚BP型環氧樹脂、雙酚C型環氧樹脂、雙酚E型環氧樹脂、雙酚F型環氧樹脂、雙酚G型環氧樹脂、雙酚M型環氧樹脂、雙酚S型環氧樹脂(己二醇雙酚S二環氧丙基醚等)、雙酚P型環氧樹脂、雙酚PH型環氧樹脂、雙酚TMC型環氧樹脂、雙酚Z型環氧樹脂、苯酚酚醛清漆型環氧樹脂(鄰甲酚酚醛清漆型環氧樹脂等)、聯苯型環氧樹脂、萘型環氧樹脂、雙環戊二烯型環氧樹脂、聯二甲酚型環氧樹脂(聯二甲酚二環氧丙基醚等)、氫化雙酚A型環氧樹脂(氫化雙酚A環氧丙基醚等);這些樹脂的二元酸改質二環氧丙基醚型環氧樹脂;脂肪族環氧樹脂等。反應性官能基當量為250g/mol以下之環氧樹脂,可使用單獨1種,亦可將2種以上併用。The thermosetting resin may contain an epoxy resin having a reactive functional group equivalent of 250 g / mol or less. Examples of the epoxy resin having a reactive functional group equivalent weight of 250 g / mol or less include, for example, bisphenol A epoxy resin, bisphenol AP epoxy resin, bisphenol AF epoxy resin, and bisphenol B epoxy resin. Resin, bisphenol BP epoxy resin, bisphenol C epoxy resin, bisphenol E epoxy resin, bisphenol F epoxy resin, bisphenol G epoxy resin, bisphenol M epoxy resin, Bisphenol S epoxy resin (hexanediol bisphenol S diglycidyl ether, etc.), bisphenol P epoxy resin, bisphenol PH epoxy resin, bisphenol TMC epoxy resin, bisphenol Z Epoxy resin, phenol novolac epoxy resin (o-cresol novolac epoxy resin, etc.), biphenyl epoxy resin, naphthalene epoxy resin, dicyclopentadiene epoxy resin, bidimethyl Phenol-type epoxy resins (bixylenol diglycidyl ether, etc.), hydrogenated bisphenol A type epoxy resins (hydrogenated bisphenol A glycidyl ether, etc.); dibasic acid modified bicyclics of these resins Oxypropyl ether type epoxy resin; aliphatic epoxy resin, etc. The epoxy resin having a reactive functional group equivalent weight of 250 g / mol or less may be used singly or in combination of two or more kinds.

從容易獲得優異的流動性的觀點而言,密封用薄膜中包含的全部環氧樹脂的含量,以密封用薄膜的總質量(溶劑的質量除外)作為基準計,可以是1質量%,亦可以是3質量%以上,亦可以是4質量%以上,亦可以是4質量%以上,亦可以是5質量%以上,亦可以是10質量%以上,亦可以是15質量%以上。從容易抑制薄膜表面發生破裂和裂縫的觀點而言,密封用薄膜中包含的全部環氧樹脂的含量,以密封用薄膜的總質量(溶劑的質量除外)作為基準計,可以是30質量%以下,亦可以是25質量%以下,亦可以是20質量%以下。因此,密封用薄膜中包含的全部環氧樹脂的含量,以密封用薄膜的總質量(溶劑的質量除外)作為基準計,例如可以是1~30質量%。From the viewpoint of easily obtaining excellent fluidity, the content of the entire epoxy resin contained in the sealing film may be 1% by mass based on the total mass of the sealing film (excluding the mass of the solvent), or may be 3 mass% or more, 4 mass% or more, 4 mass% or more, 5 mass% or more, 10 mass% or more, or 15 mass% or more. From the viewpoint of easily suppressing the occurrence of cracks and cracks on the surface of the film, the content of the entire epoxy resin contained in the sealing film may be 30% by mass or less based on the total mass of the sealing film (excluding the mass of the solvent). It may be 25% by mass or less, or 20% by mass or less. Therefore, the content of the entire epoxy resin contained in the sealing film may be, for example, 1 to 30% by mass based on the total mass of the sealing film (excluding the mass of the solvent).

熱硬化性樹脂,可進一步包含具有下述官能基之樹脂:能夠與反應性官能基當量大於250g/mol之環氧樹脂藉由熱進行反應的官能基。例如,熱硬化性樹脂,較佳是包含酚樹脂。作為酚樹脂,只要是一分子中具有2個以上酚性羥基之樹脂,能夠無特別限制地使用公知的酚樹脂。The thermosetting resin may further include a resin having a functional group: a functional group capable of reacting with an epoxy resin having a reactive functional group equivalent weight greater than 250 g / mol by heat. For example, the thermosetting resin preferably contains a phenol resin. As a phenol resin, if it is a resin which has two or more phenolic hydroxyl groups in one molecule, a well-known phenol resin can be used without a restriction | limiting.

作為酚樹脂,可列舉例如:使苯酚類及/或萘酚類與醛類在酸性觸媒下進行縮合或共縮合而獲得之樹脂、聯苯骨架型酚樹脂、對二甲苯改質酚樹脂、間二甲苯/對二甲苯改質酚樹脂、三聚氰胺改質酚樹脂、萜烯改質酚樹脂、雙環戊二烯改質酚樹脂、環戊二烯改質酚樹脂、多環芳香環改質酚樹脂、二甲苯改質萘酚樹脂等。作為酚類,可列舉:苯酚、含取代基之苯酚、甲酚、二甲酚、間苯二酚、鄰苯二酚、雙酚A、雙酚F等。作為萘酚類,可列舉:α-萘酚、β-萘酚、二羥基萘等。作為醛類,可列舉:甲醛、乙醛、丙醛、苯甲醛、水楊醛等。Examples of the phenol resin include a resin obtained by condensing or co-condensing phenols and / or naphthols with an aldehyde under an acidic catalyst, a biphenyl skeleton type phenol resin, a p-xylene modified phenol resin, M-xylene / p-xylene modified phenol resin, melamine modified phenol resin, terpene modified phenol resin, dicyclopentadiene modified phenol resin, cyclopentadiene modified phenol resin, polycyclic aromatic ring modified phenol Resin, xylene modified naphthol resin, etc. Examples of the phenols include phenol, phenol containing substituents, cresol, xylenol, resorcinol, catechol, bisphenol A, and bisphenol F. Examples of naphthols include α-naphthol, β-naphthol, and dihydroxynaphthalene. Examples of the aldehydes include formaldehyde, acetaldehyde, propionaldehyde, benzaldehyde, and salicylaldehyde.

從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,相對於反應性官能基當量大於250g/mol之環氧樹脂的反應性官能基當量,酚樹脂的反應性官能基當量,可以是1/2.9~1/2倍。From the viewpoint of reducing the warpage of the sealing structure and improving the reliability of the sealing structure at a higher level, the reactive functional group equivalent of the epoxy resin having a reactive functional group equivalent of more than 250 g / mol, The reactive functional group equivalent of the phenol resin may be 1 / 2.9 to 1/2 times.

從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,相對於反應性官能基當量大於250g/mol之環氧樹脂的反應性官能基當量,具有1/2.9~1/2倍的反應性官能基當量之酚樹脂的含量,以熱硬化性樹脂的總質量作為基準計,可以是15質量%以上、20質量%以上或25質量%以上,並且,可以是95質量%以下、90質量%以下或85質量%以下。因此,上述酚樹脂的含量,以熱硬化性樹脂的總質量作為基準計,例如可以是15~95質量%,亦可以是20~90質量%,亦可以是25~85質量%。From the viewpoint of reducing the warpage of the sealing structure and improving the reliability of the sealing structure at a higher level, the reactive functional group equivalent of the epoxy resin having a reactive functional group equivalent of more than 250 g / mol, The content of the phenol resin having a reactive functional group equivalent of 1 / 2.9 to 1/2 times, based on the total mass of the thermosetting resin, may be 15% by mass, 20% by mass, or 25% by mass. In addition, it may be 95% by mass or less, 90% by mass or less, or 85% by mass or less. Therefore, the content of the phenol resin may be, for example, 15 to 95% by mass, 20 to 90% by mass, or 25 to 85% by mass based on the total mass of the thermosetting resin.

從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,酚樹脂的反應性官能基當量,可以是250g/mol以下。從能夠更減少密封結構體的翹曲的觀點而言,酚樹脂的反應性官能基當量,可以是210g/mol以下,亦可以是205g/mol以下,亦可以是160g/mol以下。從硬化後的Tg變得充分且能夠提升密封結構體的可靠性(熱可靠性)的觀點而言,酚樹脂的反應性官能基當量,可以是80g/mol以上,亦可以是90g/mol以上,亦可以是100g/mol。因此,酚樹脂的反應性官能基當量,例如可以是80~250g/mol,亦可以是90~210g/mo,亦可以是100~210g/mol,亦可以是100~205g/mol,亦可以是100~160g/mol,亦可以是130~210g/mol,亦可以是130~160g/mol。From the viewpoint of reducing the warpage of the sealed structure and improving the reliability of the sealed structure at a higher level, the reactive functional group equivalent of the phenol resin may be 250 g / mol or less. From the viewpoint of further reducing the warpage of the sealing structure, the reactive functional group equivalent of the phenol resin may be 210 g / mol or less, 205 g / mol or less, or 160 g / mol or less. From the viewpoint that the Tg after curing is sufficient and the reliability (thermal reliability) of the sealed structure can be improved, the reactive functional group equivalent of the phenol resin may be 80 g / mol or more, or 90 g / mol or more. , Can also be 100g / mol. Therefore, the reactive functional group equivalent of the phenol resin may be, for example, 80 to 250 g / mol, 90 to 210 g / mo, 100 to 210 g / mol, 100 to 205 g / mol, or 100 to 160 g / mol, 130 to 210 g / mol, or 130 to 160 g / mol.

熱硬化性樹脂,可包含反應性官能基當量不同的複數種酚樹脂。例如,熱硬化性樹脂,可包含反應性官能基當量為100~160g/mol之酚樹脂、與反應性官能基當量為160~250g/mol之酚樹脂。The thermosetting resin may include a plurality of phenol resins having different reactive functional group equivalents. For example, the thermosetting resin may include a phenol resin having a reactive functional group equivalent of 100 to 160 g / mol and a phenol resin having a reactive functional group equivalent of 160 to 250 g / mol.

作為反應性官能基當量為250g/mol以下之酚樹脂,可列舉例如具有以下述式(1)表示的結構單元之酚樹脂。式(1)中,R1 表示碳數2~25的烴基。當以式(1)表示的結構單元為複數個時,複數個R1 各自可以相同亦可以不同。R1 的位置,相對於-OH,可以是鄰位、間位或對位中的任一個;鍵結(-*和-CH2 -*)的位置,相對於-OH,可以是鄰位、間位或對位中的任一個。Examples of the phenol resin having a reactive functional group equivalent of 250 g / mol or less include a phenol resin having a structural unit represented by the following formula (1). In the formula (1), R 1 represents a hydrocarbon group having 2 to 25 carbon atoms. When the number of structural units represented by the formula (1) is plural, each of the plural R 1 may be the same or different. The position of R 1 may be any of the ortho, meta or para positions relative to -OH; the position of the bond (-* and -CH 2- *) may be ortho, Either meta or counter.

以R1 表示的的烴基,可以是直鏈狀或分枝狀中的任一個。又,烴基可以是飽和或不飽和中的任一個。當烴基為不飽和烴基時,不飽和烴基可具有2個以上不飽和鍵。烴基的碳數可以是4~22,亦可以是8~20,亦可以是10~18。The hydrocarbon group represented by R 1 may be either linear or branched. The hydrocarbon group may be either saturated or unsaturated. When the hydrocarbon group is an unsaturated hydrocarbon group, the unsaturated hydrocarbon group may have two or more unsaturated bonds. The carbon number of the hydrocarbon group may be 4 to 22, 8 to 20, or 10 to 18.

具有以上述式(1)表示的結構單元之酚樹脂,可僅由以上述式(1)表示的結構單元所構成,亦可進一步具有以上述式(1)表示的結構單元以外的其他結構單元。上述酚樹脂,例如可以是以上述式(1)表示的結構單元與其他結構單元之隨機共聚物,亦可以是具備包含以上述式(1)表示的結構單元的嵌段與包含其他結構單元的嵌段之隨機共聚物。The phenol resin having a structural unit represented by the above-mentioned formula (1) may be composed of only the structural unit represented by the above-mentioned formula (1), or may further have a structural unit other than the structural unit represented by the above-mentioned formula (1). . The phenol resin may be, for example, a random copolymer of a structural unit represented by the formula (1) and other structural units, or may be a block including a structural unit represented by the formula (1) and another structural unit. Random block copolymer.

作為其他結構單元,可列舉以下述式(2)表示的結構單元。式(2)中,R2 表示氫原子或苯基。當以式(2)表示的結構單元為複數個時,複數個R2 各自可以相同亦可以不同。R2 的位置,相對於-OH,可以是鄰位、間位或對位中的任一個;鍵結(-*和-CH2 -*)的位置,相對於-OH,可以是鄰位、間位或對位中的任一個。As another structural unit, the structural unit represented by following formula (2) is mentioned. In formula (2), R 2 represents a hydrogen atom or a phenyl group. When the number of structural units represented by formula (2) is plural, each of the plural R 2 may be the same or different. The position of R 2 may be any of the ortho, meta, or para positions relative to -OH; the position of the bond (-* and -CH 2- *) may be ortho, Either meta or counter.

上述酚樹脂中的以上述式(1)表示的結構單元的含量,以構成該酚樹脂的結構單元的總量作為基準計,可以是20~100莫耳%,亦可以是30~90莫耳%,亦可以是40~80莫耳%。The content of the structural unit represented by the above formula (1) in the phenol resin may be 20 to 100 mol% or 30 to 90 mol based on the total amount of the structural units constituting the phenol resin. %, Or 40 to 80 mole%.

上述酚樹脂中的以上述式(2)表示的結構單元的含量,以構成該酚樹脂的結構單元的總量作為基準計,可以超過0莫耳%且80莫耳%以下,亦可以是10~70莫耳%,亦可以是20~60莫耳%。The content of the structural unit represented by the above formula (2) in the above phenol resin, based on the total amount of the structural units constituting the phenol resin, may be more than 0 mol% and 80 mol% or less, or may be 10 ~ 70 mol%, but also 20 ~ 60 mol%.

具有以上述式(1)表示的結構單元之酚樹脂,能夠藉由例如下述方式來獲得:使以下述式(3)表示的含取代基之苯酚、甲醛,根據情況與以下述式(4)表示的含取代基之苯酚進行反應。再者,下述式(3)中的R1 的例子,與上述式(1)中的R1 的例子相同;下述式(4)中的R2 的例子,與上述式(2)中的R2 的例子相同。 A phenol resin having a structural unit represented by the above-mentioned formula (1) can be obtained, for example, by using a substituent-containing phenol and formaldehyde represented by the following formula (3) according to the situation and the following formula (4) The substituent-containing phenol represented by) is reacted. Moreover, the example of R 1 in the following formula (3) is the same as the example of R 1 in the above formula (1) ; the example of R 2 in the following formula (4) is the same as in the above formula (2) The example of R 2 is the same.

從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,反應性官能基當量為250g/mol以下之酚樹脂的含量,以熱硬化性樹脂的總質量作為基準計,可以是15質量%以上、20質量%以上或25質量%,亦可以是95質量%以下、90質量%以下或85質量%以下。因此,反應性官能基當量為250g/mol以下之酚樹脂的含量,以熱硬化性樹脂的總質量作為基準計,例如可以是15~95質量%,亦可以是20~90質量%,亦可以是25~85質量%。尤其是從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,反應性官能基當量為100~210g/mol之酚樹脂的含量,以熱硬化性樹脂的總質量作為基準計,可以是15~95質量%,亦可以是20~90質量%,亦可以是25~85質量%。From the viewpoint of reducing the warpage of the sealing structure and improving the reliability of the sealing structure at a higher level, the content of the phenol resin having a reactive functional group equivalent of 250 g / mol or less is based on the thermosetting resin. The total mass can be 15 mass% or more, 20 mass% or more, or 25 mass%, or 95 mass% or less, 90 mass% or less, or 85 mass% or less. Therefore, the content of the phenol resin having a reactive functional group equivalent weight of 250 g / mol or less may be based on the total mass of the thermosetting resin, for example, 15 to 95% by mass, or 20 to 90% by mass, or may be It is 25 to 85% by mass. Especially from the viewpoint of reducing the warpage of the seal structure and improving the reliability of the seal structure at a higher level, the content of the phenol resin having a reactive functional group equivalent of 100 to 210 g / mol is cured by heat. The total mass of the resin is 15 to 95% by mass, 20 to 90% by mass, or 25 to 85% by mass.

密封用薄膜中包含的全部酚樹脂的含量,可考量環氧樹脂的含量和環氧樹脂的環氧基當量來適當設定。從不易殘留未反應的環氧樹脂及/或未反應的酚樹脂且容易獲得期望的硬化物特性的觀點而言,密封用薄膜中的環氧基的莫耳數M2相對於酚性羥基的莫耳數M1的比值(M2/M1),可以是0.7以上、0.8以上或0.9以上,並且,可以是2.0以下、1.8以下或1.7以下。因此,密封用薄膜中的環氧基的莫耳數M2相對於酚性羥基的莫耳數M1的比值(M2/M1),例如可以是0.7~2.0,亦可以是0.8~1.8,亦可以是0.9~1.7。The content of the entire phenol resin contained in the sealing film can be appropriately set in consideration of the content of the epoxy resin and the epoxy equivalent of the epoxy resin. From the viewpoint that it is difficult to leave unreacted epoxy resin and / or unreacted phenol resin and it is easy to obtain desired characteristics of the cured product, the molar number M2 of the epoxy group in the sealing film is higher than that of the phenolic hydroxyl group. The ratio of the number of ears M1 (M2 / M1) may be 0.7 or more, 0.8 or more, or 0.9 or more, and may be 2.0 or less, 1.8 or less, or 1.7 or less. Therefore, the ratio (M2 / M1) of the molar number M2 of the epoxy group to the molar number M1 of the phenolic hydroxyl group in the sealing film may be, for example, 0.7 to 2.0, 0.8 to 1.8, or 0.9 to 1.7.

[第2實施形態] 第2實施形態的密封用薄膜的樹脂A包含酚樹脂。反應性官能基當量大於250g/mol之酚樹脂,只要是一分子中具有2個以上酚性羥基且酚性羥基當量大於250g/mol之樹脂,能夠無特別限制地使用公知的酚樹脂。[Second Embodiment] The resin A of the sealing film of the second embodiment contains a phenol resin. As long as the phenol resin having a reactive functional group equivalent weight greater than 250 g / mol is a resin having two or more phenolic hydroxyl groups in one molecule and the phenolic hydroxyl equivalent weight is greater than 250 g / mol, a known phenol resin can be used without particular limitation.

作為酚樹脂,可列舉例如:使苯酚類及/或萘酚類與醛類在酸性觸媒下進行縮合或共縮合而獲得之樹脂、聯苯骨架型酚樹脂、對二甲苯改質酚樹脂、間二甲苯/對二甲苯改質酚樹脂、三聚氰胺改質酚樹脂、萜烯改質酚樹脂、雙環戊二烯改質酚樹脂、環戊二烯改質酚樹脂、多環芳香環改質酚樹脂、二甲苯改質萘酚樹脂等。酚樹脂,可使用單獨1種,亦可將2種以上併用。Examples of the phenol resin include a resin obtained by condensing or co-condensing phenols and / or naphthols with an aldehyde under an acidic catalyst, a biphenyl skeleton type phenol resin, a p-xylene modified phenol resin, M-xylene / p-xylene modified phenol resin, melamine modified phenol resin, terpene modified phenol resin, dicyclopentadiene modified phenol resin, cyclopentadiene modified phenol resin, polycyclic aromatic ring modified phenol Resin, xylene modified naphthol resin, etc. A phenol resin may be used individually by 1 type, and may use 2 or more types together.

從能夠減少交聯點且能夠減少翹曲的觀點而言,反應性官能基當量大於250g/mol之酚樹脂的反應性官能基當量,可以大於250g/mol且500g/mol以下,亦可以是280~450g/mol,亦可以是300~410g/mol,亦可以是330~410g/mol。From the viewpoint of reducing the crosslinking point and reducing warpage, the reactive functional group equivalent of a phenol resin having a reactive functional group equivalent of more than 250 g / mol may be greater than 250 g / mol and less than 500 g / mol, or may be 280. ~ 450 g / mol, 300-410 g / mol, or 330-410 g / mol.

從能夠兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,反應性官能基當量大於250g/mol之酚樹脂的含量,以熱硬化性樹脂的總質量作為基準計,可以是5~85質量%,亦可以是10~80質量%,亦可以是15~75質量%。尤其是從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,反應性官能基當量為300~410g/mol之酚樹脂的含量,以熱硬化性樹脂的總質量作為基準計,可以是5~85質量%,亦可以是10~80質量%,亦可以是15~75質量%。From the viewpoint of reducing the warpage of the sealing structure and improving the reliability of the sealing structure, the content of the phenol resin having a reactive functional group equivalent of more than 250 g / mol is based on the total mass of the thermosetting resin. It may be 5 to 85% by mass, 10 to 80% by mass, or 15 to 75% by mass. Especially from the viewpoint of reducing the warpage of the seal structure and improving the reliability of the seal structure at a higher level, the content of the phenol resin having a reactive functional group equivalent of 300 to 410 g / mol is heat-cured. As a reference, the total mass of the resin can be 5 to 85% by mass, 10 to 80% by mass, or 15 to 75% by mass.

熱硬化性樹脂,可包含反應性官能基當量為250g/mol以下之酚樹脂。The thermosetting resin may include a phenol resin having a reactive functional group equivalent of 250 g / mol or less.

從容易獲得優異的流動性的觀點、及容易抑制薄膜表面發生破裂和裂縫的觀點而言,密封用薄膜中包含的全部酚樹脂的含量,以密封用薄膜的總質量(溶劑的質量除外)作為基準計,可以是15~95質量%,亦可以是20~90質量%,亦可以是25~85質量%。From the viewpoint of easy to obtain excellent fluidity and to suppress the occurrence of cracks and cracks on the surface of the film, the content of the entire phenol resin contained in the sealing film is the total mass of the sealing film (except the quality of the solvent) as The reference meter may be 15 to 95% by mass, 20 to 90% by mass, or 25 to 85% by mass.

熱硬化性樹脂,可進一步包含具有下述官能基之樹脂:能夠與反應性官能基當量大於250g/mol之酚樹脂藉由熱進行反應的官能基。例如,熱硬化性樹脂,較佳是包含環氧樹脂。作為環氧樹脂,只要是一分子中具有2個以上環氧基之樹脂,能夠無特別限制地使用公知的環氧樹脂。The thermosetting resin may further include a resin having a functional group: a functional group capable of reacting with a phenol resin having a reactive functional group equivalent weight greater than 250 g / mol by heat. For example, the thermosetting resin preferably contains an epoxy resin. As the epoxy resin, as long as it is a resin having two or more epoxy groups in one molecule, a known epoxy resin can be used without particular limitation.

作為環氧樹脂,能夠使用作為反應性官能基當量大於250g/mol之環氧樹脂及反應性官能基當量為250g/mol以下之環氧樹脂的上述環氧樹脂。As the epoxy resin, the epoxy resins having an epoxy functional group equivalent of more than 250 g / mol and the epoxy resins having a reactive functional group equivalent of 250 g / mol or less can be used.

從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,相對於反應性官能基當量大於250g/mol之酚樹脂的反應性官能基當量,環氧樹脂的反應性官能基當量可以是1/2.9~1/2倍。From the viewpoint of achieving a higher level of both reducing the warpage of the sealed structure and improving the reliability of the sealed structure, the reactive functional group equivalent of the phenol resin having a reactive functional group equivalent of greater than 250 g / mol, the ring The reactive functional group equivalent of the oxygen resin may be 1 / 2.9 to 1/2 times.

從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,相對於反應性官能基當量大於250g/mol之酚樹脂的反應性官能基當量,具有1/2.9~1/2倍的反應性官能基當量之環氧樹脂的含量,以熱硬化性樹脂的總質量作為基準計,可以是15~95質量%,亦可以是20~90質量%,亦可以是25~85質量%。From the viewpoint of achieving a higher level of reducing the warpage of the sealed structure and improving the reliability of the sealed structure, it has a reactive functional group equivalent of a phenol resin having a reactive functional group equivalent of more than 250 g / mol. The content of the epoxy resin with a reactive functional group equivalent of 1 / 2.9 to 1/2 times, based on the total mass of the thermosetting resin, may be 15 to 95% by mass, or 20 to 90% by mass. It may be 25 to 85% by mass.

從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,環氧樹脂的反應性官能基當量,可以是250g/mol以下。從能夠更減少密封結構體的翹曲的觀點而言,環氧樹脂的反應性官能基當量,可以是80~250g/mol,亦可以是90~210g/mol,亦可以是100~205g/mol,亦可以是100~160g/mol。From the viewpoint of reducing the warpage of the sealed structure and improving the reliability of the sealed structure at a higher level, the reactive functional group equivalent of the epoxy resin may be 250 g / mol or less. From the viewpoint of further reducing the warpage of the sealing structure, the reactive functional group equivalent of the epoxy resin may be 80 to 250 g / mol, 90 to 210 g / mol, or 100 to 205 g / mol. , Can also be 100-160g / mol.

從能夠以更高水準來兼顧減少密封結構體的翹曲與提升密封結構體的可靠性的觀點而言,反應性官能基當量為250g/mol以下之環氧樹脂的含量,以熱硬化性樹脂的總質量作為基準計,可以是15~95質量%,亦可以是20~90質量%,亦可以是25~85質量%。From the viewpoint of reducing the warpage of the sealing structure and improving the reliability of the sealing structure at a higher level, the content of the epoxy resin having a reactive functional group equivalent of 250 g / mol or less is used as the thermosetting resin. As a reference, the total mass may be 15 to 95% by mass, 20 to 90% by mass, or 25 to 85% by mass.

密封用薄膜中包含的全部環氧樹脂的含量,可考量酚樹脂的含量和酚樹脂的酚性羥基當量來適當設定。密封用薄膜中的環氧基的莫耳數M2相對於酚性羥基的莫耳數M1的比值的範圍,可以與第1實施形態中例示的範圍相同。The content of the entire epoxy resin contained in the sealing film can be appropriately set in consideration of the content of the phenol resin and the phenolic hydroxyl equivalent of the phenol resin. The range of the ratio of the molar number M2 of the epoxy group to the molar number M1 of the phenolic hydroxyl group in the sealing film may be the same as the range exemplified in the first embodiment.

(硬化劑) 本實施形態的密封用薄膜,可包含硬化劑(符合熱硬化性樹脂的成分除外)來作為熱硬化性成分。作為硬化劑,並無特別限定,可列舉:酚系硬化劑、酸酐系硬化劑、活性酯系硬化劑、氰酸酯系硬化劑等。當熱硬化性樹脂包含環氧樹脂時,作為硬化劑,只要是一分子中具有2個以上能夠與環氧基進行反應的官能基之化合物,能夠無特別限制地使用。又,當熱硬化性樹脂包含酚樹脂時,作為硬化劑,只要是一分子中具有2個以上能夠與酚性羥基進行反應的官能基之化合物,能夠無特別限制地使用。硬化劑,可使用單獨1種,亦可將2種以上併用。當熱硬化性樹脂包含了具有不同的反應性官能基之複數種樹脂時,可根據反應性官能基的種類而將複數種硬化劑併用。(Hardener) The sealing film of this embodiment may contain a hardener (other than a component conforming to a thermosetting resin) as a thermosetting component. The hardener is not particularly limited, and examples thereof include a phenol-based hardener, an acid anhydride-based hardener, an active ester-based hardener, and a cyanate-based hardener. When a thermosetting resin contains an epoxy resin, as a hardener, if it is a compound which has 2 or more functional groups which can react with an epoxy group in a molecule | numerator, it can be used without a restriction | limiting in particular. Moreover, when a thermosetting resin contains a phenol resin, as a hardener, if it is a compound which has two or more functional groups which can react with a phenolic hydroxyl group in a molecule | numerator, it can be used without a restriction | limiting in particular. A hardening agent may be used individually by 1 type, and may use 2 or more types together. When the thermosetting resin contains a plurality of resins having different reactive functional groups, a plurality of curing agents may be used in combination according to the types of the reactive functional groups.

從熱硬化性樹脂的硬化性優異的觀點而言,硬化劑的含量,以密封用薄膜的總質量(溶劑的質量除外)作為基準計,可以是1~20質量%,亦可以是2~15質量%,亦可以是3~10質量%。From the viewpoint of excellent curability of the thermosetting resin, the content of the curing agent may be 1 to 20% by mass or 2 to 15 based on the total mass of the sealing film (excluding the mass of the solvent). The mass% may be 3 to 10 mass%.

(硬化促進劑) 本實施形態的密封用薄膜,可含有硬化促進劑來作為熱硬化性成分。作為硬化促進劑,能夠無特別限制地使用,較佳是選自由胺系硬化促進劑和磷系硬化促進劑所組成之群組中的至少一種。尤其是從容易獲得具有優異熱導率的硬化物的觀點、衍生物豐富的觀點、及容易獲得期望的活性溫度的觀點而言,作為硬化促進劑,較佳是胺系硬化促進劑,更佳是選自由咪唑化合物、脂肪族胺及脂環族胺所組成之群組中的至少一種,進一步更佳是咪唑化合物。作為咪唑化合物,可列舉:2-苯基-4-甲基咪唑、1-苯甲基-2-甲基咪唑等。硬化促進劑,可使用單獨1種,亦可將2種以上併用。作為硬化促進劑的市售品,可列舉四國化成工業股份有限公司製造的「2P4MZ」和「1B2MZ」等。(Hardening accelerator) The sealing film of this embodiment may contain a hardening accelerator as a thermosetting component. The hardening accelerator can be used without particular limitation, and it is preferably at least one selected from the group consisting of an amine-based hardening accelerator and a phosphorus-based hardening accelerator. In particular, from the viewpoint of easily obtaining a hardened material having excellent thermal conductivity, from the viewpoint of rich derivatives, and from the viewpoint of easily obtaining a desired active temperature, as the hardening accelerator, an amine-based hardening accelerator is preferred, and more preferably It is at least one selected from the group consisting of an imidazole compound, an aliphatic amine, and an alicyclic amine, and more preferably an imidazole compound. Examples of the imidazole compound include 2-phenyl-4-methylimidazole and 1-benzyl-2-methylimidazole. A hardening accelerator may be used individually by 1 type, and may use 2 or more types together. Examples of commercially available hardening accelerators include "2P4MZ" and "1B2MZ" manufactured by Shikoku Chemical Industry Co., Ltd.

硬化促進劑的含量,以熱硬化性樹脂的合計量作為基準計,較佳是下述範圍。從容易獲得充分的硬化促進效果的觀點而言,硬化促進劑的含量,較佳是0.01質量%以上,更佳是0.1質量%以上,進一步更佳是0.3質量%以上。從在製造密封用薄膜時的步驟(例如塗佈和乾燥)中或密封用薄膜的保管中硬化不易進展,從而容易防止密封用薄膜破裂及由於熔融黏度上升所引起的成形不良的觀點而言,硬化促進劑的含量,較佳是5質量%以下,更佳是3質量%以下,進一步更佳是1.5質量%以下。從這些觀點而言,硬化促進劑的含量,較佳是0.01~5質量%,更佳是0.1~3質量%,進一步更佳是0.3~1.5質量%。The content of the curing accelerator is based on the total amount of the thermosetting resin, and is preferably in the following range. From the viewpoint of easily obtaining a sufficient hardening promoting effect, the content of the hardening accelerator is preferably 0.01% by mass or more, more preferably 0.1% by mass or more, and still more preferably 0.3% by mass or more. From the standpoint that hardening does not easily progress during the steps (such as coating and drying) when manufacturing the sealing film or during storage of the sealing film, and it is easy to prevent cracking of the sealing film and poor molding due to an increase in melt viscosity, The content of the hardening accelerator is preferably 5% by mass or less, more preferably 3% by mass or less, and still more preferably 1.5% by mass or less. From these viewpoints, the content of the hardening accelerator is preferably 0.01 to 5% by mass, more preferably 0.1 to 3% by mass, and still more preferably 0.3 to 1.5% by mass.

(無機填充材料) 作為無機填充材料,能夠使用以往公知的無機填充材料,並無特別限定。作為無機填充材料的構成材料,可列舉:二氧化矽類(非晶二氧化矽、結晶性二氧化矽、熔融二氧化矽、球狀二氧化矽、合成二氧化矽、中空二氧化矽等)、硫酸鋇、鈦酸鋇、滑石、黏土、雲母粉、碳酸鎂、碳酸鈣、氧化鋁(alumina)、氫氧化鋁、氧化鎂、氫氧化鎂、氮化矽、氮化鋁、硼酸鋁、氮化硼、鈦酸鋇、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、鋯酸鋇、鋯酸鈣等。從容易利用表面改質(例如利用矽烷化合物來進行的表面處理)等來獲得提升在樹脂組成物中的分散性的效果、及抑制在清漆中沉澱的效果的觀點、以及容易獲得期望的硬化膜特性以具有較小的熱膨脹係數的觀點而言,較佳是包含二氧化矽類之無機填充材料。從獲得高熱傳導性的觀點而言,較佳是包含氧化鋁之無機填充材料。無機填充材料,可使用單獨1種,亦可將2種以上併用。(Inorganic Filler) As the inorganic filler, a conventionally known inorganic filler can be used, and it is not particularly limited. Examples of the constituent material of the inorganic filler include silicon dioxide (amorphous silicon dioxide, crystalline silicon dioxide, fused silicon dioxide, spherical silicon dioxide, synthetic silicon dioxide, hollow silicon dioxide, etc.) , Barium sulfate, barium titanate, talc, clay, mica powder, magnesium carbonate, calcium carbonate, alumina, aluminum hydroxide, magnesium oxide, magnesium hydroxide, silicon nitride, aluminum nitride, aluminum borate, nitrogen Boron, barium titanate, strontium titanate, calcium titanate, magnesium titanate, bismuth titanate, titanium oxide, barium zirconate, calcium zirconate and the like. From the viewpoint of easily using surface modification (such as surface treatment with a silane compound) to obtain the effect of improving the dispersibility in the resin composition and the effect of suppressing the precipitation in the varnish, and to easily obtain a desired cured film From the viewpoint of having a small thermal expansion coefficient, an inorganic filler containing silicon dioxide is preferred. From the viewpoint of obtaining high thermal conductivity, an inorganic filler containing alumina is preferred. The inorganic filler may be used singly or in combination of two or more kinds.

可對無機填充材料進行表面改質。表面改質的方法,並無特別限定。從處理簡便、官能基種類豐富且容易賦予期望的特性的觀點而言,較佳是使用矽烷偶合劑來進行的表面改質。Surface modification of inorganic fillers. The method for surface modification is not particularly limited. From the viewpoint of easy handling, abundant functional group types, and easy provision of desired characteristics, surface modification using a silane coupling agent is preferred.

作為矽烷偶合劑,可列舉:烷基矽烷、烷氧基矽烷、乙烯基矽烷、環氧基矽烷、胺基矽烷、丙烯醯基矽烷、甲基丙烯醯基矽烷、巰基矽烷、硫醚矽烷、異氰酸基矽烷、硫矽烷、苯乙烯基矽烷、烷基氯矽烷等。Examples of the silane coupling agent include alkyl silane, alkoxy silane, vinyl silane, epoxy silane, amino silane, acryl silane, methacryl silane, thiol silane, thioether silane, isosilane Cyanosilane, thiosilane, styrylsilane, alkylchlorosilane, etc.

作為矽烷偶合劑的具體例,可列舉:甲基三甲氧基矽烷、二甲基二甲氧基矽烷、三甲基甲氧基矽烷、甲基三乙氧基矽烷、甲基三苯氧基矽烷、乙基三甲氧基矽烷、正丙基三甲氧基矽烷、二異丙基二甲氧基矽烷、異丁基三甲氧基矽烷、二異丁基二甲氧基矽烷、異丁基三乙氧基矽烷、正己基三甲氧基矽烷、正己基三乙氧基矽烷、環己基甲基二甲氧基矽烷、正辛基三乙氧基矽烷、正癸基甲氧基矽烷、苯基三甲氧基矽烷、二苯基二甲氧基矽烷、三苯基矽烷醇、甲基三氯矽烷、二甲基二氯矽烷、三甲基氯矽烷、正辛基二甲基氯矽烷、四乙氧基矽烷、3-胺基丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-(2-胺基乙基)胺基丙基三甲氧基矽烷、3-(2-胺基乙基)胺基丙基甲基二甲氧基矽烷、3-苯基胺基丙基三甲氧基矽烷、3-環氧丙氧基丙基三甲氧基矽烷、3-環氧丙氧基丙基甲基二甲氧基矽烷、3-環氧丙氧基丙基三乙氧基矽烷、3-環氧丙氧基丙基甲基二乙氧基矽烷、二硫化雙(3-(三乙氧基矽基)丙基)、四硫化雙(3-(三乙氧基矽基)丙基)、乙烯基三乙醯氧基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙氧基矽烷、乙烯基三異丙氧基矽烷、烯丙基三甲氧基矽烷、二烯丙基二甲基矽烷、3-甲基丙醯氧基丙基三甲氧基矽烷、3-甲基丙醯氧基丙基甲基二甲氧基矽烷、3-甲基丙醯氧基丙基三乙氧基矽烷、3-巰基丙基三甲氧基矽烷、3-巰基丙基甲基二甲氧基矽烷、3-巰基丙基三乙氧基矽烷、N-(1,3-二甲基亞丁基)-3-胺基丙基三乙氧基矽烷、胺基矽烷(苯基胺基矽烷等)等。矽烷偶合劑,可使用單獨1種,亦可將2種以上併用。Specific examples of the silane coupling agent include methyltrimethoxysilane, dimethyldimethoxysilane, trimethylmethoxysilane, methyltriethoxysilane, and methyltriethoxysilane. , Ethyltrimethoxysilane, n-propyltrimethoxysilane, diisopropyldimethoxysilane, isobutyltrimethoxysilane, diisobutyldimethoxysilane, isobutyltriethoxy Silane, n-hexyltrimethoxysilane, n-hexyltriethoxysilane, cyclohexylmethyldimethoxysilane, n-octyltriethoxysilane, n-decylmethoxysilane, phenyltrimethoxy Silane, diphenyldimethoxysilane, triphenylsilanol, methyltrichlorosilane, dimethyldichlorosilane, trimethylchlorosilane, n-octyldimethylchlorosilane, tetraethoxysilane , 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3- (2-aminoethyl) aminopropyltrimethoxysilane, 3- (2-amino group (Ethyl) aminopropylmethyldimethoxysilane, 3-phenylaminopropyltrimethoxysilane, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropyl Methyldimethoxysilane, 3-glycidoxypropyltriethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, bis (3- (triethyl disulfide) Oxysilyl) propyl), bis (3- (triethoxysilyl) propyl) tetrasulfide, vinyltriethoxysilane, vinyltrimethoxysilane, vinyltriethoxysilane , Vinyltriisopropoxysilane, allyltrimethoxysilane, diallyldimethylsilane, 3-methylpropoxypropyltrimethoxysilane, 3-methylpropoxysilane Propylmethyldimethoxysilane, 3-methylpropanyloxypropyltriethoxysilane, 3-mercaptopropyltrimethoxysilane, 3-mercaptopropylmethyldimethoxysilane, 3 -Mercaptopropyltriethoxysilane, N- (1,3-dimethylbutylene) -3-aminopropyltriethoxysilane, aminosilane (phenylaminosilane, etc.), and the like. The silane coupling agent may be used singly or in combination of two or more kinds.

從容易抑制無機填充材料凝集,從而容易分散無機填充材料的觀點而言,無機填充材料的平均粒徑,較佳是0.01μm以上,更佳是0.1μm以上,進一步更佳是0.3μm以上,特佳是0.5μm以上。從容易抑制無機填充材料在清漆中沉澱的情形,從而容易製作均質的密封用薄膜的觀點而言,無機填充材料的平均粒徑,較佳是25μm以下,更佳是10μm以下,進一步更佳是5μm以下。從這些觀點而言,無機填充材料的平均粒徑,較佳是0.01~25μm,更佳是0.01~10μm,進一步更佳是0.1~10μm,特佳是0.3~5μm,極佳是0.5~5μm。無機填充材料的平均粒徑,亦可以是10~18μm。From the standpoint of easily inhibiting the aggregation of the inorganic filler and thereby easily dispersing the inorganic filler, the average particle diameter of the inorganic filler is preferably 0.01 μm or more, more preferably 0.1 μm or more, and still more preferably 0.3 μm or more. It is preferably at least 0.5 μm. The average particle diameter of the inorganic filler is preferably 25 μm or less, more preferably 10 μm or less, and further more preferably, from the viewpoint that it is easy to suppress the precipitation of the inorganic filler in the varnish and it is easy to produce a homogeneous sealing film. 5 μm or less. From these viewpoints, the average particle diameter of the inorganic filler is preferably 0.01 to 25 μm, more preferably 0.01 to 10 μm, still more preferably 0.1 to 10 μm, particularly preferably 0.3 to 5 μm, and most preferably 0.5 to 5 μm. The average particle diameter of the inorganic filler may be 10 to 18 μm.

從樹脂組成物的流動性優異的觀點而言,較佳是將具有相互不同平均粒徑的複數種無機填充材料組合使用。無機填充材料的組合中,較佳是最大平均粒徑為15~25μm。較佳是將平均粒徑為15~25μm的無機填充材料、平均粒徑為0.5~2.5μm的無機填充材料及平均粒徑為0.1~1.0μm的無機填充材料組合使用。From the viewpoint of excellent fluidity of the resin composition, it is preferable to use a plurality of inorganic fillers having different average particle diameters in combination. In the combination of inorganic fillers, the maximum average particle diameter is preferably 15 to 25 μm. An inorganic filler having an average particle diameter of 15 to 25 μm, an inorganic filler having an average particle diameter of 0.5 to 2.5 μm, and an inorganic filler having an average particle diameter of 0.1 to 1.0 μm are preferably used in combination.

「平均粒徑」,是指將粒子的總體積設為100%並求出基於粒徑的累積次數分佈曲線(cumulative frequency distribution curve)時相當於體積50%的點的粒徑,並且能夠利用粒度分佈測定裝置來測定,該粒度分佈測定裝置使用了雷射繞射散射法。組合後的各無機填充材料的平均粒徑,能夠由混合時的各無機填充材料的平均粒徑來進行確認,並且能夠藉由測定粒度分佈來進行確認。"Average particle diameter" is a particle diameter equivalent to 50% of the volume when the total volume of the particles is set to 100% and a cumulative frequency distribution curve based on the particle diameter is obtained. The measurement was performed by a distribution measuring device using a laser diffraction scattering method. The average particle diameter of each inorganic filler after combination can be confirmed from the average particle diameter of each inorganic filler at the time of mixing, and can also be confirmed by measuring a particle size distribution.

作為無機填充材料的市售品,可列舉:Denka股份有限公司製造的「DAW20」;Admatechs股份有限公司製造的商品名「SC550O-SXE」和「SC2050-KC」等。Examples of commercially available inorganic fillers include "DAW20" manufactured by Denka Corporation; trade names "SC550O-SXE" and "SC2050-KC" manufactured by Admatechs Corporation.

從提升熱導率的觀點、及容易抑制因與被密封體的熱膨脹係數的差異而導致密封結構體(例如半導體裝置等電子零件裝置)的翹曲變大的情形的觀點而言,無機填充材料的含量,以密封用薄膜的總質量(溶劑的質量除外)作為基準計,可以是70質量%以上,亦可以是75質量%以上,亦可以是80質量%以上。從在製作密封用薄膜時的乾燥步驟中容易抑制密封用薄膜破裂的觀點、及抑制因密封用薄膜的熔融黏度上升導致流動性下降而容易對被密封體(電子零件等)充分進行密封的觀點而言,無機填充材料的含量,以密封用薄膜的總質量(溶劑的質量除外)作為基準計,可以是93質量%以下,亦可以是91質量%以下,亦可以是88質量%以下。從這些觀點而言,無機填充材料的含量,以密封用薄膜的總質量(溶劑的質量除外)作為基準計,可以是70~93質量%,亦可以是75~91質量%,亦可以是80~88質量%。再者,上述含量,是表面處理劑的量除外後的無機填充材料的含量。From the viewpoint of improving the thermal conductivity and easily suppressing the warpage of the sealing structure (such as an electronic component device such as a semiconductor device) from increasing due to a difference in the coefficient of thermal expansion with the sealed body, an inorganic filler The content may be 70% by mass or more, 75% by mass or more, and 80% by mass or more based on the total mass of the sealing film (excluding the mass of the solvent). From the viewpoint that it is easy to suppress cracking of the sealing film in the drying step when producing the sealing film, and from suppressing the decrease in fluidity due to an increase in the melt viscosity of the sealing film, it is easy to sufficiently seal the sealed body (electronic parts, etc.). The content of the inorganic filler may be 93 mass% or less, 91 mass% or less, or 88 mass% or less based on the total mass of the sealing film (excluding the mass of the solvent) as a reference. From these viewpoints, the content of the inorganic filler may be 70 to 93% by mass, or 75 to 91% by mass, or 80% based on the total mass of the sealing film (excluding the mass of the solvent). ~ 88% by mass. The above-mentioned content is the content of the inorganic filler after excluding the amount of the surface treatment agent.

(彈性體) 本實施形態的密封用薄膜,可根據需要而含有彈性體(可撓材料)。從分散性和溶解性優異的觀點而言,彈性體,較佳是使用選自由聚丁二烯粒子、苯乙烯丁二烯粒子、丙烯酸系彈性體、聚矽氧粉末、矽氧油及矽氧低聚物所組成之群組中的至少一種。彈性體,可使用單獨1種,亦可將2種以上併用。(Elastomer) The sealing film of this embodiment may contain an elastomer (flexible material) as needed. From the viewpoint of excellent dispersibility and solubility, the elastomer is preferably selected from the group consisting of polybutadiene particles, styrene butadiene particles, acrylic elastomers, polysiloxane powder, silicone oil, and silicone. At least one of the group consisting of oligomers. The elastomer may be used singly or in combination of two or more kinds.

當彈性體為粒子狀時,彈性體的平均粒徑並無特別限制。在嵌入式晶圓級球柵陣列(Embedded Wafer-Level Ball Grid Array,eWLB)用途中,由於需要將半導體元件間包埋,因此當將密封用薄膜用於eWLB用途時,彈性體的平均粒徑,較佳是50μm以下。從彈性體的分散性優異的觀點而言,彈性體的平均粒徑,較佳是0.1μm以上。When the elastomer is particulate, the average particle diameter of the elastomer is not particularly limited. For embedded Wafer-Level Ball Grid Array (eWLB) applications, since semiconductor elements need to be embedded, when the sealing film is used for eWLB applications, the average particle diameter of the elastomer Is preferably 50 μm or less. From the viewpoint of excellent dispersibility of the elastomer, the average particle diameter of the elastomer is preferably 0.1 μm or more.

作為彈性體的市售品,可列舉Nagase ChemteX股份有限公司製造的丙烯酸系彈性體也就是「SG-280 EK23」、「SG-70L」、「WS-023 EK30」等。又,市售的彈性體成分中,存在預先分散於液狀樹脂(例如液狀環氧樹脂)中的彈性體成分,而非單獨的彈性體,能夠毫無問題地使用。作為這種市售品,可列舉KANEKA股份有限公司製造的「MX-136」和「MX-965」等。Examples of commercially available elastomers include "SG-280 EK23", "SG-70L", and "WS-023 EK30", which are acrylic elastomers manufactured by Nagase ChemteX Corporation. In addition, among the commercially available elastomer components, there is an elastomer component previously dispersed in a liquid resin (for example, a liquid epoxy resin), rather than a separate elastomer, and can be used without any problem. Examples of such commercially available products include "MX-136" and "MX-965" manufactured by KANEKA Corporation.

從對薄膜賦予柔軟性且改善破裂的觀點而言,添加量並無特別限制,彈性體的含量,以熱硬化性成分與彈性體的合計量作為基準計,可以是1質量%以上,亦可以是5質量%以上,亦可以是10質量%以上。從確保包埋等所需要的流動性的觀點而言,彈性體的含量,以熱硬化性成分與彈性體的合計量作為基準計,可以是30質量%以下,亦可以是25質量%以下,亦可以是20質量%以下。從以上觀點而言,彈性體的含量,以熱硬化性成分與彈性體的合計量作為基準計,可以是1~30質量%,亦可以是5~25質量%,亦可以是10~20質量%以下。From the viewpoint of imparting flexibility to the film and improving cracking, the amount of addition is not particularly limited. The content of the elastomer may be 1% by mass or more based on the total amount of the thermosetting component and the elastomer as a reference. It is 5 mass% or more, and may be 10 mass% or more. From the viewpoint of ensuring the fluidity required for embedding, etc., the content of the elastomer may be 30% by mass or less, or 25% by mass or less based on the total amount of the thermosetting component and the elastomer. It may be 20% by mass or less. From the above point of view, the content of the elastomer may be 1 to 30% by mass, 5 to 25% by mass, or 10 to 20% by mass based on the total amount of the thermosetting component and the elastomer. %the following.

(其他成分) 本實施形態的密封用薄膜,能夠進一步含有其他添加劑。作為這種添加劑的具體例,可列舉:顔料、染料、脫模劑、抗氧化劑、表面張力調整劑等。(Other components) The sealing film of this embodiment can further contain other additives. Specific examples of such additives include pigments, dyes, release agents, antioxidants, and surface tension adjusters.

又,本實施形態的密封用薄膜,可含有溶劑(例如製備密封用薄膜時所使用的溶劑)。作為溶劑,可以是以往公知的有機溶劑。作為有機溶劑,可以是能夠將無機填充材料以外的成分溶解的溶劑,可列舉:脂肪族烴類、芳香族烴類、萜烯(terpene)類、鹵素類、酯類、酮類、醇類、醛類等。溶劑,可以使用單獨1種,亦可以將2種以上併用。The sealing film of the present embodiment may contain a solvent (for example, a solvent used when preparing a sealing film). The solvent may be a conventionally known organic solvent. The organic solvent may be a solvent capable of dissolving components other than the inorganic filler, and examples thereof include aliphatic hydrocarbons, aromatic hydrocarbons, terpene, halogens, esters, ketones, alcohols, Aldehydes, etc. A solvent may be used individually by 1 type, and may use 2 or more types together.

從環境負荷小的觀點、及容易溶解熱硬化性成分的觀點而言,作為溶劑,可以是選自由酯類、酮類及醇類所組成之群組中的至少一種。其中,當溶劑為酮類時,特別容易溶解熱硬化性成分。從室溫(25℃)時揮發的情形少且在乾燥時容易去除的觀點而言,作為溶劑,可以是選自由丙酮、甲基乙基酮及甲基異丁酮所組成之群組中的至少一種。The solvent may be at least one selected from the group consisting of esters, ketones, and alcohols from the viewpoint of a small environmental load and a viewpoint of easily dissolving a thermosetting component. Among them, when the solvent is a ketone, it is particularly easy to dissolve the thermosetting component. From the viewpoint of less volatilization at room temperature (25 ° C) and easy removal during drying, the solvent may be selected from the group consisting of acetone, methyl ethyl ketone, and methyl isobutyl ketone. At least one.

相對於密封用薄膜的總質量(包含溶劑的質量),密封用薄膜中包含的溶劑(有機溶劑等)的含量,較佳是在下述範圍內。從容易抑制密封用薄膜變脆而發生密封用薄膜破裂等不良狀況的情形及最低熔融黏度變高而包埋性下降的情形的觀點而言,溶劑的含量,可以是0.2質量%以上,亦可以是0.3質量%以上,亦可以是0.5質量%以上,亦可以是0.6質量%以上,亦可以是0.7質量%以上。從容易抑制密封用薄膜的黏合性變過強而操作性下降的不良狀況及在密封用薄膜熱硬化時伴隨溶劑(有機溶劑等)揮發而引起發泡等不良狀況的觀點而言,溶劑的含量,可以是1.5質量%以下,亦可以是1質量%以下。從這些觀點而言,溶劑的含量,可以是0.2~1.5質量%,亦可以是0.3~1質量%,亦可以是0.5~1質量%,亦可以是0.6~1質量%,亦可以是0.7~1質量%。Content of the solvent (organic solvent etc.) contained in the sealing film with respect to the total mass (mass including a solvent) of the sealing film is preferably in the following range. The content of the solvent may be 0.2% by mass or more, from the viewpoints that it is easy to prevent the sealing film from becoming brittle and causing problems such as cracking of the sealing film and the case where the minimum melt viscosity becomes high and the embedding property decreases. It is 0.3 mass% or more, may be 0.5 mass% or more, may be 0.6 mass% or more, and may be 0.7 mass% or more. The content of the solvent is from the viewpoints that it is easy to suppress the disadvantages that the adhesiveness of the sealing film becomes too strong and the operability is reduced, and that the solvent (organic solvent, etc.) is volatilized during the thermal curing of the sealing film, which causes problems such as foaming. It may be 1.5% by mass or less, or 1% by mass or less. From these viewpoints, the content of the solvent may be 0.2 to 1.5% by mass, 0.3 to 1% by mass, 0.5 to 1% by mass, 0.6 to 1% by mass, or 0.7 to 1% by mass. 1% by mass.

本實施形態的密封用薄膜,能夠用於例如半導體器件的密封、配置於印刷線路板上的電子零件的包埋等。尤其,本實施形態的密封用薄膜,能夠適合用於扇出扇出型晶圓級封裝體和扇出型面板級封裝體這樣的不具有封裝基板之薄型半導體裝置的密封。The sealing film according to this embodiment can be used for, for example, sealing of semiconductor devices, embedding of electronic components arranged on a printed wiring board, and the like. In particular, the sealing film of this embodiment can be suitably used for sealing thin semiconductor devices without a package substrate, such as a fan-out fan-out wafer-level package and a fan-out panel-level package.

從在塗佈時容易抑制面內的厚度的偏差的觀點、及能夠提升密封結構體的可靠性的觀點而言,密封用薄膜的厚度,可以是20μm以上,亦可以是30μm以上,亦可以是50μm以上,亦可以是100μm以上。從在塗佈時容易在深度方向上獲得一定的乾燥性的觀點、及能夠減少密封結構體的翹曲的觀點而言,密封用薄膜的厚度,可以是250μm以下,亦可以是200μm以下,亦可以是150μm以下。從這些觀點而言,密封用薄膜的厚度,可以是20~250μm,亦可以是30~250μm,亦可以是50~200μm,亦可以是100~150μm。又,亦能夠積層複數片的密封用薄膜的厚度,來製造厚度超過250μm的密封用薄膜。The thickness of the sealing film may be 20 μm or more, or 30 μm or more, from the viewpoint that it is easy to suppress variations in the thickness of the surface during coating and to improve the reliability of the sealing structure. It is 50 μm or more, and may be 100 μm or more. The thickness of the sealing film may be 250 μm or less, or 200 μm or less, from the viewpoint of easily obtaining a certain level of dryness in the depth direction during coating, and from the viewpoint of reducing warpage of the sealing structure. It may be 150 μm or less. From these viewpoints, the thickness of the sealing film may be 20 to 250 μm, 30 to 250 μm, 50 to 200 μm, or 100 to 150 μm. Moreover, the thickness of several sealing films can be laminated | stacked, and the sealing film whose thickness exceeds 250 micrometers can be manufactured.

從所獲得的密封結構體的可靠性(熱可靠性)優異的觀點而言,密封用薄膜硬化後的玻璃轉化溫度,可以是80℃以上,亦可以是100℃以上。從所獲得的密封結構體的可靠性(熱可靠性)優異的觀點而言,密封用薄膜硬化後的玻璃轉化溫度,可以是180℃以下,亦可以是165℃以上,亦可以是150℃以上。從這些觀點而言,密封用薄膜硬化後的玻璃轉化溫度,可以是80~180℃,亦可以是80~165℃,亦可以是80~150℃,亦可以是100~150℃。密封用薄膜的玻璃轉化溫度,能夠利用熱硬化性成分的種類和含量、彈性體成分的種類和含量等,來進行調整。玻璃轉化溫度,能夠利用實施例所記載的方法來進行測定。From the viewpoint of excellent reliability (thermal reliability) of the obtained sealed structure, the glass transition temperature after the sealing film is cured may be 80 ° C. or higher, or 100 ° C. or higher. From the viewpoint of excellent reliability (thermal reliability) of the obtained sealing structure, the glass transition temperature after the sealing film is cured may be 180 ° C. or lower, or may be 165 ° C. or higher, or 150 ° C. or higher. . From these viewpoints, the glass transition temperature after curing of the sealing film may be 80 to 180 ° C, 80 to 165 ° C, 80 to 150 ° C, or 100 to 150 ° C. The glass transition temperature of the sealing film can be adjusted using the type and content of the thermosetting component, the type and content of the elastomer component, and the like. The glass transition temperature can be measured by the method described in Examples.

本實施形態的密封用薄膜,亦能夠製成例如附有支撐體之密封用薄膜來使用。第1圖所示的附有支撐體之密封用薄膜10,具備支撐體1、及設置於支撐體1上的密封用薄膜2。The sealing film of this embodiment can also be used as a sealing film with a support, for example. The sealing film 10 with a support shown in FIG. 1 includes a support 1 and a sealing film 2 provided on the support 1.

作為支撐體1,能夠使用高分子薄膜、金屬箔等。作為高分子薄膜,可列舉:聚乙烯薄膜、聚丙烯薄膜等聚烯烴薄膜;聚氯乙烯薄膜等乙烯系薄膜;聚對苯二甲酸乙二酯薄膜等聚酯薄膜;聚碳酸酯薄膜;乙酸纖維素薄膜;四氟乙烯薄膜等。作為金屬箔,可列舉銅箔、鋁箔等。As the support 1, a polymer film, a metal foil, or the like can be used. Examples of the polymer film include polyolefin films such as polyethylene films and polypropylene films; vinyl films such as polyvinyl chloride films; polyester films such as polyethylene terephthalate films; polycarbonate films; acetate fibers Plain film; tetrafluoroethylene film, etc. Examples of the metal foil include copper foil and aluminum foil.

支撐體1的厚度,並無特別限定,從作業性和乾燥性優異的觀點而言,可以是2~200μm。當支撐體1的厚度為2μm以上時,在塗佈時容易抑制支撐體斷裂的不良狀況、因清漆的重量導致支撐體彎曲的不良狀況等。當支撐體1的厚度為200μm以下時,於乾燥步驟中,在從塗佈面和背面的雙面吹熱風的情況下,容易抑制清漆中的溶劑乾燥受到妨礙的不良狀況。The thickness of the support 1 is not particularly limited, but may be 2 to 200 μm from the viewpoint of excellent workability and dryness. When the thickness of the support 1 is 2 μm or more, it is easy to suppress the failure of the support during coating, the failure of the support to bend due to the weight of the varnish, and the like. When the thickness of the support 1 is 200 μm or less, in the drying step, when hot air is blown from both sides of the coating surface and the back surface, it is easy to suppress a problem that the drying of the solvent in the varnish is prevented.

本實施形態中,可以不使用支撐體1。又,可在密封用薄膜2的與支撐體1相反的一側配置保護層,該保護層的目的在於保護密封用薄膜。藉由在密封用薄膜2上形成保護層,能夠提升操作性,且當進行卷繞時,能夠避免密封用薄膜黏附在支撐體的背面上這樣的不良狀況。In this embodiment, the support body 1 may not be used. A protective layer may be disposed on the side of the sealing film 2 opposite to the support 1, and the purpose of the protective layer is to protect the sealing film. By forming a protective layer on the sealing film 2, the operability can be improved, and a trouble such as the sealing film sticking to the back surface of the support when the winding is performed can be avoided.

作為保護層,能夠使用高分子薄膜、金屬箔等。作為高分子薄膜,可例示:聚乙烯薄膜、聚丙烯薄膜等聚烯烴薄膜;聚氯乙烯薄膜等乙烯系薄膜;聚對苯二甲酸乙二酯薄膜等聚酯薄膜;聚碳酸酯薄膜;乙酸纖維素薄膜;四氟乙烯薄膜等。作為金屬箔,可例示銅箔、鋁箔等。As the protective layer, a polymer film, a metal foil, or the like can be used. Examples of the polymer film include polyolefin films such as polyethylene films and polypropylene films; vinyl films such as polyvinyl chloride films; polyester films such as polyethylene terephthalate films; polycarbonate films; acetate fibers Plain film; tetrafluoroethylene film, etc. Examples of the metal foil include copper foil and aluminum foil.

然而,電子零件的密封,有時使用模造成形,該模造成形是利用金屬模具來將固體或液狀樹脂密封材料加以成形。有時使用例如轉注成形(transfer molding),其是藉由使圓粒狀樹脂密封材料熔融並將樹脂流入模具內,來進行密封。然而,轉注成形中,由於使熔融後的樹脂流入來進行成形,因此當要對大面積進行密封時,可能發生未填充部分。因此,近年來,已開始使用壓縮成形(compression molding),其是預先對金屬模具或被密封體供給樹脂密封材料,再實行成形。壓縮成形中,由於直接將樹脂密封材料供給至模具或被密封體,因此有下述優點:即便是大面積的密封,亦不易發生未填充部分。However, in the sealing of electronic parts, a mold is sometimes used. The mold is formed by using a metal mold to form a solid or liquid resin sealing material. For example, transfer molding is used, which is performed by melting a pellet-shaped resin sealing material and flowing the resin into a mold to perform sealing. However, in the injection molding, since the molten resin is flowed in for molding, when a large area is to be sealed, an unfilled portion may occur. Therefore, in recent years, compression molding has been used, in which a resin sealing material is supplied to a metal mold or a sealed body in advance, and then molding is performed. In compression molding, since a resin sealing material is directly supplied to a mold or a to-be-sealed body, there is an advantage that even in a large-area seal, an unfilled portion is less likely to occur.

壓縮成形中,與轉注成形同樣地能夠使用固體或液狀的樹脂密封材料。然而,當被密封體大型化時,液狀的樹脂密封材料有時會發生液體流動等,而難以均勻地供給至被密封體上。又,由於需要將樹脂均勻地供給至被密封體上,因此作為固體的樹脂密封材料,有時使用顆粒或粉體的樹脂密封材料,而非以往的圓粒狀的樹脂。然而,顆粒或粉體的樹脂密封材料,難以將樹脂密封材料均勻地供給至金屬模具或被密封體上,並且,由於是顆粒或粉體,因此樹脂密封材料成為產生粉塵的來源,從而擔心會對裝置或無塵室造成汙染。In compression molding, a solid or liquid resin sealing material can be used in the same manner as in transfer molding. However, when the object to be sealed is enlarged, liquid resin sealing material may cause liquid flow and the like, and it is difficult to uniformly supply the object to the object to be sealed. In addition, since it is necessary to uniformly supply the resin to the object to be sealed, as a solid resin sealing material, a granular or powder resin sealing material may be used instead of the conventional pellet-shaped resin. However, it is difficult to supply the resin sealing material to the metal mold or the sealed body uniformly with the resin sealing material of particles or powders, and the resin sealing material becomes a source of dust due to the particles or powders. Pollution to the device or clean room.

又,模造成形中,由於在金屬模具中將樹脂成形,因此為了要使密封結構體大型化,必須使金屬模具大型化。然而,金屬模具的大型化,由於要求較高的金屬模具精度,因此在技術方面的難易度上升,並且金屬模具的製造成本大幅增加。In addition, since the resin is formed in a metal mold during molding, the metal mold must be enlarged in order to increase the size of the sealing structure. However, since the size of a metal mold is required to be high, the technical difficulty is increased, and the manufacturing cost of the metal mold is greatly increased.

相對於此,根據上述密封用薄膜,能夠將樹脂均勻地供給至被密封體上及能夠減少產生粉塵。又,能夠獲得包埋能力,該包埋能力不僅能夠進行藉由模造成形來實行的密封,還能夠進行藉由不需要金屬模具(高壓用的金屬模具等)的成形方法(層壓、壓製等)來實行的密封。On the other hand, according to the said sealing film, resin can be uniformly supplied to a to-be-sealed body, and dust generation can be reduced. In addition, embedding capability can be obtained, which can not only perform sealing by molding, but also a forming method (laminating, pressing, etc.) by a mold that does not require a mold (such as a mold for high pressure). ) To implement the seal.

本實施形態的密封用薄膜,適合用來對電子零件進行密封。尤其,能夠適合用來作為扇出扇出型晶圓級封裝體和扇出型面板級封裝體這樣的不具有封裝基板之薄型半導體裝置中電子零件的密封用。The sealing film of this embodiment is suitable for sealing electronic components. In particular, it can be suitably used for sealing electronic components in thin semiconductor devices without a package substrate, such as a fan-out fan-out wafer-level package and a fan-out panel-level package.

<密封用薄膜的製造方法> 本實施形態的密封用薄膜2的製造方法,具備下述步驟:準備樹脂組成物的步驟(準備步驟),該樹脂組成物含有作為熱硬化性樹脂的反應性官能基當量大於250g/mol之樹脂、及無機填充材料;以及,將樹脂組成物成形成薄膜狀的步驟(成形步驟)。<The manufacturing method of the sealing film> The manufacturing method of the sealing film 2 of this embodiment is provided with the process of preparing the resin composition (preparation process) containing the reactive function as a thermosetting resin A resin having a base equivalent of more than 250 g / mol, and an inorganic filler; and a step of forming the resin composition into a thin film (forming step).

準備步驟中,藉由混合本實施形態的密封用薄膜2的構成成分(熱硬化性樹脂、硬化劑、硬化促進劑、無機填充材料、溶劑等),來製作清漆(清漆狀樹脂組成物)。混合方法,並無特別限定,能夠使用粉碎機(mill)、混合機、攪拌葉片。溶劑(有機溶劑),能夠用來將密封用薄膜2的材料也就是樹脂組成物的構成成分加以溶解並分散來製備清漆、或能夠用來輔助製備清漆。能夠利用塗佈後的乾燥步驟,來去除大部分的溶劑。In the preparation step, the varnish (varnish-like resin composition) is prepared by mixing the constituents (thermosetting resin, hardener, hardening accelerator, inorganic filler, solvent, etc.) of the sealing film 2 of this embodiment. The mixing method is not particularly limited, and a mill, a mixer, or a stirring blade can be used. The solvent (organic solvent) can be used to dissolve and disperse the material of the sealing film 2, that is, the constituents of the resin composition to prepare a varnish, or can be used to assist in the preparation of a varnish. Most of the solvent can be removed by the drying step after coating.

成形步驟中,例如,將上述清漆,塗佈在支撐體1(薄膜狀的支撐體等)上之後,利用吹熱風等來進行加熱乾燥。藉此,能夠將清漆成形成薄膜狀,來獲得附有支撐體之密封用薄膜10,該附有支撐體之密封用薄膜10具備密封用薄膜2。作為塗佈(coating)方法,並無特別限定,能夠使用例如:缺角輪塗佈機、刮棒塗佈機、吻合式塗佈機(kiss coater)、輥式塗佈機、凹版塗佈機、模具塗佈機等塗佈裝置。In the forming step, for example, the varnish is applied to the support 1 (thin film support or the like), and then heated and dried by blowing hot air or the like. Thereby, the varnish can be formed into a thin film to obtain a sealing film 10 with a support, which includes the sealing film 2. The coating method is not particularly limited, and examples thereof include a corner wheel coater, a bar coater, a kiss coater, a roll coater, and a gravure coater. , Die coating machine and other coating devices.

<密封結構體> 本實施形態的密封結構體,具備被密封體、及本實施形態的密封用薄膜的硬化物(密封部),該硬化物用以對該被密封體進行密封。作為密封結構體,可列舉電子零件裝置等。電子零件裝置,具備電子零件作為被密封體。作為電子零件,可列舉:半導體元件、半導體晶圓、積體電路、半導體器件、表面聲波(SAW)濾波器等濾波器、感測器等被動組件等。可使用藉由將半導體晶片單片化而獲得的半導體元件。電子零件裝置,可以是:半導體裝置,其具備作為電子零件的半導體元件或半導體晶圓;印刷線路板等。本實施形態的密封結構體,可具備複數個被密封體。複數個被密封體,可以是相互相同的種類,亦可以是相互不同的種類。<Sealed Structure> The sealed structure of this embodiment includes a to-be-sealed body and a hardened body (sealed portion) of the sealing film of this embodiment, and the hardened body is used to seal the to-be-sealed body. Examples of the sealed structure include electronic component devices. The electronic component device includes an electronic component as a sealed body. Examples of the electronic component include semiconductor elements, semiconductor wafers, integrated circuits, semiconductor devices, filters such as surface acoustic wave (SAW) filters, and passive components such as sensors. A semiconductor element obtained by singulating a semiconductor wafer can be used. The electronic component device may be a semiconductor device including a semiconductor element or a semiconductor wafer as an electronic component, a printed wiring board, and the like. The sealed structure of the present embodiment may include a plurality of sealed bodies. The plurality of sealed bodies may be the same type or different types.

繼而,說明使用本實施形態的密封用薄膜來實行的密封結構體的製造方法。此處,針對被密封體也就是電子零件為半導體元件的情況進行說明。第2圖是概略剖面圖,用以說明作為密封結構體的製造方法的一實施形態,亦即說明電子零件裝置也就是半導體裝置的製造方法的一實施形態。本實施形態的製造方法,具備下述步驟:將被密封體(被包埋對象)也就是複數個半導體元件20,並列配置在具有暫時固定材料40之基板30上(第2圖的(a));使附有支撐體之密封用薄膜10與半導體元件20相對向後,藉由在加熱下向半導體元件20推壓(層壓)密封用薄膜2,來將半導體元件20包埋於密封用薄膜2中,該附有支撐體之密封用薄膜10具備支撐體1、及設置於支撐體1上的密封用薄膜2(第2圖的(b));及,使包埋有半導體元件20之密封薄膜2硬化,來獲得硬化物2a(第2圖的(c))。本實施形態中,是根據層壓法並利用密封用薄膜2來對半導體元件20進行密封後,使密封用薄膜2熱硬化,藉此獲得具備包埋於硬化物2a中的半導體元件20之密封結構體(電子零件裝置),亦可藉由壓縮成形來獲得密封結構體。Next, a method for manufacturing a sealed structure to be performed using the sealing film of the present embodiment will be described. Here, a case where the sealed body, that is, the electronic component is a semiconductor element will be described. FIG. 2 is a schematic cross-sectional view for explaining an embodiment of a method for manufacturing a sealed structure, that is, an embodiment of a method for manufacturing an electronic component device, that is, a semiconductor device. The manufacturing method of this embodiment includes the steps of placing a sealed body (object to be embedded), that is, a plurality of semiconductor elements 20 in parallel on a substrate 30 having a temporary fixing material 40 ((a) of FIG. 2). ); The sealing film 10 with the support body facing the semiconductor element 20 faces backward, and the semiconductor element 20 is embedded in the sealing film by pressing (laminating) the sealing film 2 against the semiconductor element 20 under heating. In 2, the support-attached sealing film 10 includes a support 1 and a sealing film 2 ((b) in FIG. 2) provided on the support 1; and a semiconductor device 20 is embedded therein. The sealing film 2 is hardened to obtain a cured product 2a ((c) of FIG. 2). In this embodiment, after the semiconductor element 20 is sealed with the sealing film 2 according to the lamination method, the sealing film 2 is thermally hardened to obtain a seal including the semiconductor element 20 embedded in the cured material 2a. The structure (electronic component device) can also be obtained by compression molding.

作為用於層壓法的層壓機,並無特別限定,可列舉例如輥式、氣囊式等的層壓機。從包埋性優異的觀點而言,層壓機,可以是能夠進行真空加壓的氣囊式。The laminator used for the lamination method is not particularly limited, and examples thereof include a laminator such as a roll type and an air bag type. From the viewpoint of excellent embedding properties, the laminator may be a bladder type capable of performing vacuum pressure.

層壓,通常是在支撐體的軟化點以下實行。層壓溫度,較佳是在密封用薄膜的最低熔融黏度附近。層壓時的壓力,是根據要包埋的被密封體(例如半導體元件等電子零件)的尺寸、密集度等而不同。層壓時的壓力,例如可以在0.2~1.5MPa的範圍內,亦可以在0.3~1.0MPa的範圍內。層壓時間,並無特別限定,可以是20~600秒,亦可以是30~300秒,亦可以是40~120秒。Lamination is usually carried out below the softening point of the support. The lamination temperature is preferably near the minimum melt viscosity of the sealing film. The pressure at the time of lamination differs according to the size, density, etc. of the to-be-sealed body (for example, an electronic component such as a semiconductor element) to be embedded. The pressure during lamination may be, for example, in a range of 0.2 to 1.5 MPa, or may be in a range of 0.3 to 1.0 MPa. The laminating time is not particularly limited, and may be 20 to 600 seconds, 30 to 300 seconds, or 40 to 120 seconds.

密封用薄膜的硬化,例如能夠在大氣下或惰性氣體下實行。硬化溫度(加熱溫度),並無特別限定,可以是80~280℃,亦可以是100~240℃,亦可以是120~200℃。如果硬化溫度為80℃以上,則密封用薄膜的硬化能夠充分進展,且能夠抑制發生不良狀況。當硬化溫度為280℃以下時,有能夠抑制對於其他材料發生熱損傷的情形的傾向。硬化時間(加熱時間),並無特別限定,可以是30~600分鐘,亦可以是45~300分鐘,亦可以是60~240分鐘。當硬化時間在這些範圍內時,密封用薄膜的硬化能夠充分進展,且能夠獲得更良好的生產效率。又,硬化條件,可組合複數個條件。The sealing film can be cured, for example, in the atmosphere or under an inert gas. The curing temperature (heating temperature) is not particularly limited, and may be 80 to 280 ° C, 100 to 240 ° C, or 120 to 200 ° C. When the curing temperature is 80 ° C. or higher, the curing of the sealing film can sufficiently progress, and the occurrence of a defective condition can be suppressed. When the curing temperature is 280 ° C. or lower, there is a tendency that thermal damage to other materials can be suppressed. The curing time (heating time) is not particularly limited, and may be 30 to 600 minutes, 45 to 300 minutes, or 60 to 240 minutes. When the curing time is within these ranges, the curing of the sealing film can sufficiently progress, and more favorable production efficiency can be obtained. Moreover, a plurality of conditions can be combined for the hardening conditions.

又,本實施形態中,可經由以下的絕緣層形成、線路圖案形成、植球(ball mounting)及切割的各步驟,來獲得密封結構體也就是半導體裝置。Moreover, in this embodiment, a sealed structure, that is, a semiconductor device can be obtained through each of the following steps of forming an insulating layer, forming a line pattern, ball mounting, and cutting.

首先,在從基板30剝離的密封成形物100的半導體元件20露出的一側,設置絕緣層50(第3圖(a)和(b))。繼而,對於絕緣層50實行線路圖案形成後,實行植球,來形成絕緣層52、線路54、焊球56。First, an insulating layer 50 is provided on the exposed side of the semiconductor element 20 of the sealed molded article 100 peeled from the substrate 30 (FIGS. 3 (a) and (b)). Next, after the line pattern is formed on the insulating layer 50, a ball is planted to form the insulating layer 52, the line 54, and the solder ball 56.

繼而,利用切割機60將密封成形物單片化,來獲得半導體裝置200。Then, the sealing molded article is singulated by the dicing machine 60 to obtain the semiconductor device 200.

以上,說明了本發明的較佳實施形態,但本發明不一定限定於上述實施形態,可在不超出其主旨的範圍內適當地實行變更。 [實施例]As mentioned above, although the preferred embodiment of this invention was described, this invention is not necessarily limited to the said embodiment, A change can be implemented suitably within the range which does not deviate from the meaning. [Example]

以下,利用實施例來進一步具體地說明本發明,但本發明完全不限定於這些實施例。Hereinafter, the present invention will be described in more detail using examples, but the present invention is not limited to these examples at all.

實施例和比較例中使用了以下材料。 (熱硬化性樹脂) A1:含柔軟性骨架之雙酚A型環氧樹脂(DIC股份有限公司製造,商品名「EXA4816」,環氧基當量:403g/eq,25℃時呈液狀的環氧樹脂) A2:含柔軟性骨架之雙酚A型環氧樹脂(DIC股份有限公司製造,商品名「EXA4850-1000」,環氧基當量:350g/eq,25℃時呈液狀的環氧樹脂) A3:鄰甲酚酚醛清漆型環氧樹脂(DIC股份有限公司製造,商品名「N500P-1」,環氧基當量:201g/eq,25℃時未呈液狀的環氧樹脂) B1:含烴基酚樹脂(酚性羥基當量:140g/eq) B2:含萘骨架之酚醛清漆型酚樹脂(新日鐵住金化學股份有限公司製造,商品名「SN475N」,酚性羥基當量:205g/eq) B3:含萘骨架之酚醛清漆型酚樹脂(新日鐵住金化學股份有限公司製造,商品名「SN395」,酚性羥基當量:110g/eq) (硬化促進劑) C1:咪唑(四國化成工業股份有限公司製造,商品名「2P4MZ」) (彈性體) D1:丙烯酸酯聚合物(Nagase ChemteX股份有限公司製造,商品名「SG-280 EK23」,分子量90萬) (無機填充材料) E1:二氧化矽(Admatechs股份有限公司製造,商品名「SX-E2」,苯基胺基矽烷處理,平均粒徑:5.8μm)The following materials were used in the examples and comparative examples. (Thermosetting resin) A1: A bisphenol A type epoxy resin containing a flexible skeleton (manufactured by DIC Corporation, trade name "EXA4816", epoxy group equivalent weight: 403 g / eq, liquid ring at 25 ° C Oxygen resin) A2: bisphenol A type epoxy resin containing flexible skeleton (manufactured by DIC Corporation, trade name "EXA4850-1000", epoxy group equivalent weight: 350 g / eq, liquid epoxy resin at 25 ° C Resin) A3: o-cresol novolac epoxy resin (manufactured by DIC Corporation, trade name "N500P-1", epoxy equivalent: 201 g / eq, epoxy resin that is not liquid at 25 ° C) B1 : Hydrocarbon-based phenol resin (phenolic hydroxyl equivalent: 140g / eq) B2: Naphthalene skeleton-containing novolac phenol resin (manufactured by Nippon Steel & Sumikin Chemical Co., Ltd., trade name "SN475N", phenolic hydroxyl equivalent: 205g / eq) B3: Novolac-type phenol resin (produced by Nippon Steel & Sumikin Chemical Co., Ltd. under the trade name "SN395", phenolic hydroxyl equivalent: 110g / eq) (hardening accelerator) C1: imidazole (Shikoku (Product name: "2P4MZ") (Elastomer) D1: Acrylate polymerization (Manufactured by Nagase ChemteX Corporation, trade name "SG-280 EK23", molecular weight 900,000) (inorganic filler) E1: silicon dioxide (manufactured by Admatechs Corporation, trade name "SX-E2", phenylamine Silane treatment, average particle size: 5.8 μm)

再者,B1(含烴基酚樹脂),是由40莫耳%的以下述式(5)表示的結構單元與60莫耳%的以下述式(6)表示的結構單元所構成之樹脂。 In addition, B1 (hydrocarbon-based phenol resin) is a resin composed of a structural unit represented by the following formula (5) at 40 mol% and a structural unit represented by the following formula (6) at 60 mol%.

本實施例中,是依照日本特開2015-89949所記載的方法來製備B1。具體而言,首先,將腰果酚(cardanol)、甲醇、50%甲醛水溶液混合,來獲得混合液。繼而,將30%氫氧化鈉水溶液滴入所獲得的混合液中來使其反應後,對所獲得的反應液添加35%鹽酸,來中和氫氧化鈉。繼而,對反應液添加苯酚後,進一步添加草酸。繼而,實行反應液的水洗後,餾除過剩的苯酚。藉此,獲得B1。In this example, B1 was prepared according to the method described in Japanese Patent Application Laid-Open No. 2015-89949. Specifically, first, cardanol, methanol, and a 50% formaldehyde aqueous solution are mixed to obtain a mixed solution. Then, a 30% sodium hydroxide aqueous solution was dropped into the obtained mixed solution to react, and 35% hydrochloric acid was added to the obtained reaction solution to neutralize sodium hydroxide. Then, phenol was added to the reaction solution, and then oxalic acid was further added. Then, after washing the reaction solution with water, excess phenol was distilled off. Thereby, B1 is obtained.

<製作密封用薄膜(薄膜狀環氧樹脂組成物)> (實施例1) 將100g甲基乙基酮(MEK)加入聚乙烯容器中,並將18.8g的A1、56.3g的A3、45.7g的B1、12.1g的D1及866.7g的E1加入0.5L(公升)的聚乙烯容器中,並以攪拌葉片進行攪拌,來使無機填充材料E1分散。然後,加入0.4g硬化劑C1,並進一步攪拌30分鐘。利用耐綸製的#150篩網(開口為106μm)過濾所獲得的混合液,並提取濾液。藉此,獲得清漆狀環氧樹脂組成物。使用塗佈機,並依以下條件來將此清漆狀環氧樹脂組成物塗佈在PET薄膜上。藉此,在支撐體上製作厚度210μm的密封用薄膜。 ・塗佈頭方式:缺角輪 ・塗佈和乾燥速度:0.5公尺/分鐘 ・乾燥條件(溫度/爐長):80℃/1.5m(公尺)、100℃/1.5m ・薄膜狀支撐體:厚度38μm的PET薄膜<Preparation of a film for sealing (film-like epoxy resin composition)> (Example 1) 100 g of methyl ethyl ketone (MEK) was put into a polyethylene container, and 18.8 g of A1, 56.3 g of A3, and 45.7 g B1, 12.1 g of D1, and 866.7 g of E1 were added to a 0.5 L (liter) polyethylene container and stirred with a stirring blade to disperse the inorganic filler E1. Then, 0.4 g of the hardener C1 was added, and further stirred for 30 minutes. The obtained mixed liquid was filtered through a nylon # 150 mesh (opening: 106 μm), and the filtrate was extracted. Thereby, a varnish-like epoxy resin composition was obtained. Using a coater, this varnish-like epoxy resin composition was coated on a PET film under the following conditions. Thereby, a sealing film having a thickness of 210 μm was produced on the support.・ Applying head method: corner wheel ・ Coating and drying speed: 0.5 m / min ・ Drying conditions (temperature / furnace length): 80 ° C / 1.5m (meter), 100 ° C / 1.5m ・ Film support Body: PET film with a thickness of 38 μm

在密封用薄膜中的與支撐體相反的一側配置保護層(厚度50μm的聚對苯二甲酸乙二酯薄膜),藉此保護密封用薄膜的表面。再者,在下述各評估中,是在將支撐體和保護層剝離後實行評估。關於以下實施例和比較例亦相同。A protective layer (a polyethylene terephthalate film having a thickness of 50 μm) is disposed on the side opposite to the support in the sealing film, thereby protecting the surface of the sealing film. In each of the evaluations described below, the evaluation is performed after the support and the protective layer are separated. The same applies to the following examples and comparative examples.

(實施例2~4及比較例1~2) 將所使用的材料(A1、A3、B1、C1、D1及E1)的種類和摻合量變更如表1所示,除此以外則與實施例1同樣地進行,來獲得實施例2~4及比較例1的清漆狀環氧樹脂組成物。繼而,分別使用實施例2~4及比較例1的清漆狀環氧樹脂組成物,來取代實施例1的清漆狀環氧樹脂組成物,除此以外則與實施例1同樣地進行,來獲得實施例2~4及比較例1的密封用薄膜(厚度為210μm)。再者,表1中的各材料的摻合量,是以密封薄膜的總質量作為基準計的摻合量(質量%)。(Examples 2 to 4 and Comparative Examples 1 to 2) The types and blending amounts of the materials (A1, A3, B1, C1, D1, and E1) used were changed as shown in Table 1. Otherwise, it was implemented Example 1 was performed in the same manner to obtain varnish-like epoxy resin compositions of Examples 2 to 4 and Comparative Example 1. Then, the varnish-like epoxy resin composition of Examples 2 to 4 and Comparative Example 1 were used instead of the varnish-like epoxy resin composition of Example 1, and the procedure was performed in the same manner as in Example 1 to obtain The sealing films (thickness: 210 μm) of Examples 2 to 4 and Comparative Example 1. The blending amount of each material in Table 1 is the blending amount (% by mass) based on the total mass of the sealing film.

<評估> 利用以下方法,來評估密封結構體的翹曲和破裂、以及密封用薄膜硬化後的彈性模數和玻璃轉化溫度。再者,密封用薄膜硬化後的彈性模數和玻璃轉化溫度的評估中,使用了厚度110μm的密封用薄膜,該密封用薄膜是使用實施例和比較例的清漆狀環氧樹脂組成物並依以下條件來製作。 ・塗佈頭方式:缺角輪 ・塗佈和乾燥速度:1m/分鐘 ・乾燥條件(溫度/爐長):80℃/1.5m、100℃/1.5m ・薄膜狀支撐體:厚度38μm的PET薄膜<Evaluation> The following methods were used to evaluate warpage and cracking of the sealing structure, and the elastic modulus and glass transition temperature of the sealing film after curing. In addition, in the evaluation of the modulus of elasticity and the glass transition temperature of the sealing film after curing, a sealing film having a thickness of 110 μm was used. It is produced under the following conditions.・ Applying head method: corner wheel ・ Coating and drying speed: 1m / min ・ Drying conditions (temperature / furnace length): 80 ° C / 1.5m, 100 ° C / 1.5m ・ Film-shaped support: PET with a thickness of 38μm film

(1)密封結構體的翹曲 依以下條件,來將厚度210μm的密封用薄膜層壓在厚度800μm的矽晶圓(12吋大小)上,而獲得未硬化的密封結構體(環氧樹脂密封體)。 ・層壓機裝置:名機製作所製造的真空加壓層壓機MVLP-500 ・層壓溫度:90℃ ・層壓壓力:0.5MPa ・抽真空時間:30秒 ・層壓時間:40秒(1) Warpage of the sealing structure The sealing film with a thickness of 210 μm was laminated on a silicon wafer (with a size of 12 inches) having a thickness of 800 μm according to the following conditions to obtain an unhardened sealing structure (epoxy seal body).・ Laminator device: MVLP-500, a vacuum pressure laminator manufactured by Meiki Seisakusho ・ Lamination temperature: 90 ° C ・ Lamination pressure: 0.5MPa ・ Evacuation time: 30 seconds ・ Lamination time: 40 seconds

依以下條件來使所獲得的未硬化的密封結構體硬化,而獲得密封結構體(環氧樹脂硬化體) ・烘箱:ESPEC股份有限公司製造的SAFETY OVEN SPH-201 ・烘箱溫度:140℃ ・時間:120分鐘The obtained uncured sealing structure was cured under the following conditions to obtain a sealed structure (epoxy resin cured body). • Oven: SAFETY OVEN SPH-201 manufactured by ESPEC Corporation. • Oven temperature: 140 ° C. • Time. : 120 minutes

使用以下裝置,來測定所獲得的密封結構體的翹曲量。 ・翹曲測定台裝置名稱:COMS公司製造的CP-500 ・翹曲測定雷射光裝置名稱:KEYENCE公司製造的LK-030The following apparatus was used to measure the amount of warpage of the obtained sealed structure.・ Warp measurement table device name: CP-500 manufactured by COMS company ・ Warp measurement laser device name: LK-030 manufactured by KEYENCE company

作為破裂性的指標,依據以下評估基準來評估硬化後的翹曲。 A:翹曲量≦2.0mm B:翹曲量>2.0mmAs an index of crackability, warpage after hardening was evaluated according to the following evaluation criteria. A: Amount of warpage ≦ 2.0mm B: Amount of warpage > 2.0mm

(2)密封用薄膜硬化後的彈性模數和玻璃轉化溫度Tg 依以下條件,來將實施例和比較例的密封用薄膜層壓在銅箔上,而獲得附有銅箔之密封用薄膜。 ・層壓機裝置:名機製作所製造的真空加壓層壓機MVLP-500 ・層壓溫度:110℃ ・層壓壓力:0.5MPa ・抽真空時間:30秒 ・層壓時間:40秒(2) The elastic modulus and the glass transition temperature Tg of the sealing film after hardening The sealing films of Examples and Comparative Examples were laminated on a copper foil under the following conditions to obtain a sealing film with a copper foil.・ Laminator device: MVLP-500, a vacuum pressurizing laminator manufactured by Meiji Seisakusho ・ Laminating temperature: 110 ° C ・ Laminating pressure: 0.5MPa ・ Evacuation time: 30 seconds ・ Laminating time: 40 seconds

將附有銅箔之密封用薄膜黏貼於不銹鋼(SUS)板上,並依以下條件來使密封薄膜硬化,而獲得附有銅箔之密封用薄膜的硬化物(附有銅箔之環氧樹脂硬化體) ・烘箱:ESPEC股份有限公司製造的SAFETY OVEN SPH-201 ・烘箱溫度:140℃ ・時間:120分鐘The sealing film with a copper foil is adhered to a stainless steel (SUS) plate, and the sealing film is hardened under the following conditions to obtain a cured product of the sealing film with a copper foil (epoxy resin with a copper foil). (Hardened body) • Oven: SAFETY OVEN SPH-201 manufactured by ESPEC Corporation • Oven temperature: 140 ° C • Time: 120 minutes

將銅箔從附有銅箔之密封用薄膜的硬化物剝離後,將密封用薄膜的硬化物切割成4mm×30mm,來製作試驗片。依以下條件,來測定所製作的試驗片的彈性模數和玻璃轉化溫度。 ・測定裝置:DVE(RHEOLOGY股份有限公司製造的DVE-V4) ・測定溫度:25~300℃ ・升溫速度:5℃/minAfter peeling the copper foil from the hardened | cured material of the sealing film with a copper foil attached, the hardened | cured material of the sealing film was cut into 4 mm x 30 mm, and the test piece was produced. The elastic modulus and glass transition temperature of the produced test piece were measured under the following conditions. • Measuring device: DVE (DVE-V4 manufactured by RHEOLOGY Co., Ltd.) • Measuring temperature: 25 to 300 ° C • Heating rate: 5 ° C / min

當彈性模數較高時,密封結構體變得容易發生翹曲和破裂,因此依照以下判斷基準來評估彈性模數。 A:彈性模數(30℃) ≦25GPa B:彈性模數(30℃) >25GPaWhen the elastic modulus is high, the sealed structure becomes prone to warping and cracking. Therefore, the elastic modulus is evaluated in accordance with the following judgment criteria. A: Modulus of elasticity (30 ° C) ≦ 25GPa B: Modulus of elasticity (30 ° C) > 25GPa

當玻璃轉化溫度Tg較低時,密封結構體的熱可靠性會惡化,因此依照以下判斷基準來評估玻璃轉化溫度。 A:玻璃轉化溫度(℃) ≧100 B:玻璃轉化溫度(℃) <100When the glass transition temperature Tg is low, the thermal reliability of the sealed structure is deteriorated. Therefore, the glass transition temperature is evaluated in accordance with the following judgment criteria. A: Glass transition temperature (℃) ≧ 100 B: Glass transition temperature (℃) < 100

<評估結果> 評估結果如表1所示。<Evaluation results> The evaluation results are shown in Table 1.

[表1] [Table 1]

1‧‧‧支撐體1‧‧‧ support

2‧‧‧密封用薄膜2‧‧‧ Sealing film

2a‧‧‧硬化物(密封部)2a‧‧‧hardened (seal)

10‧‧‧附有支撐體之密封用薄膜10‧‧‧ Sealing film with support

20‧‧‧半導體元件(被密封體)20‧‧‧Semiconductor element (sealed body)

30‧‧‧基板30‧‧‧ substrate

40‧‧‧暫時固定材料40‧‧‧Temporary fixing material

50、52‧‧‧絕緣層50, 52‧‧‧ Insulation

54‧‧‧線路54‧‧‧ route

56‧‧‧焊球56‧‧‧Solder Ball

60‧‧‧切割機60‧‧‧Cutting Machine

100‧‧‧密封成形物(密封結構體)100‧‧‧Sealed molding (sealed structure)

200‧‧‧半導體裝置(密封結構體)200‧‧‧Semiconductor device (sealed structure)

第1圖是表示附有支撐體之密封用薄膜的概略剖面圖,其具有實施形態的密封用薄膜。 第2圖是用以說明密封結構體的製造方法的一實施形態的概略剖面圖。 第3圖是用以說明密封結構體的製造方法的一實施形態的概略剖面圖。FIG. 1 is a schematic cross-sectional view showing a sealing film with a support, which includes a sealing film according to an embodiment. Fig. 2 is a schematic cross-sectional view for explaining an embodiment of a method for manufacturing a sealed structure. FIG. 3 is a schematic cross-sectional view illustrating an embodiment of a method for manufacturing a sealed structure.

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Claims (16)

一種密封用薄膜的製造方法,該密封薄膜含有熱硬化性樹脂與無機填充材料,該製造方法具備下述步驟: 準備樹脂組成物的步驟,該樹脂組成物含有作為前述熱硬化性樹脂的反應性官能基當量大於250g/mol之樹脂、及前述無機填充材料;以及, 將前述樹脂組成物成形成薄膜狀的步驟。A method for producing a sealing film comprising a thermosetting resin and an inorganic filler, the method comprising the steps of preparing a resin composition containing a reactivity as the thermosetting resin; A resin having a functional group equivalent weight greater than 250 g / mol, and the inorganic filler; and a step of forming the resin composition into a thin film. 如請求項1所述之密封用薄膜的製造方法,其中,前述樹脂組成物硬化後的玻璃轉化溫度為80~180℃。The method for producing a sealing film according to claim 1, wherein a glass transition temperature of the resin composition after curing is 80 to 180 ° C. 如請求項1或2所述之密封用薄膜的製造方法,其中,前述反應性官能基當量大於250g/mol之樹脂,包含反應性官能基當量為300~410g/mol之樹脂。The method for producing a sealing film according to claim 1 or 2, wherein the resin having a reactive functional group equivalent weight greater than 250 g / mol includes a resin having a reactive functional group equivalent weight of 300 to 410 g / mol. 如請求項1~3中任一項所述之密封用薄膜的製造方法,其中,前述樹脂組成物,進一步含有反應性官能基當量為100~210g/mol之樹脂來作為前述熱硬化性樹脂。The method for producing a sealing film according to any one of claims 1 to 3, wherein the resin composition further contains a resin having a reactive functional group equivalent of 100 to 210 g / mol as the thermosetting resin. 如請求項1~4中任一項所述之密封用薄膜的製造方法,其中,前述樹脂組成物進一步含有下述樹脂來作為前述熱硬化性樹脂:相對於前述反應性官能基當量大於250g/mol之樹脂的反應性官能基當量,具有1/2.9~1/2倍的反應性官能基當量之樹脂。The method for producing a sealing film according to any one of claims 1 to 4, wherein the resin composition further contains, as the thermosetting resin, the following resin: an equivalent to the reactive functional group of more than 250 g / The reactive functional group equivalent of a mol resin is a resin having a reactive functional group equivalent of 1 / 2.9 to 1/2 times. 如請求項1~5中任一項所述之密封用薄膜的製造方法,其中,前述反應性官能基當量大於250g/mol之樹脂包含環氧樹脂。The method for producing a sealing film according to any one of claims 1 to 5, wherein the resin having a reactive functional group equivalent weight greater than 250 g / mol includes an epoxy resin. 如請求項1~6中任一項所述之密封用薄膜的製造方法,其中,前述密封用薄膜的膜厚為20~250μm。The manufacturing method of the sealing film as described in any one of Claims 1-6 whose film thickness of the said sealing film is 20-250 micrometers. 一種密封用薄膜,其含有熱硬化性樹脂與無機填充材料, 並且,前述熱硬化性樹脂包含反應性官能基當量大於250g/mol之樹脂。A sealing film comprising a thermosetting resin and an inorganic filler, and the thermosetting resin contains a resin having a reactive functional group equivalent weight greater than 250 g / mol. 如請求項8所述之密封用薄膜,其中,硬化後的玻璃轉化溫度為80~180℃。The sealing film according to claim 8, wherein the glass transition temperature after curing is 80 to 180 ° C. 如請求項8或9所述之密封用薄膜,其中,前述反應性官能基當量大於250g/mol之樹脂,包含反應性官能基當量為300~410g/mol之樹脂。The sealing film according to claim 8 or 9, wherein the resin having a reactive functional group equivalent weight greater than 250 g / mol includes a resin having a reactive functional group equivalent weight of 300 to 410 g / mol. 如請求項8~10中任一項所述之密封用薄膜,其中,前述熱硬化性樹脂進一步包含反應性官能基當量為100~210g/mol之樹脂。The sealing film according to any one of claims 8 to 10, wherein the thermosetting resin further contains a resin having a reactive functional group equivalent of 100 to 210 g / mol. 如請求項8~11中任一項所述之密封用薄膜,其中,前述熱硬化性樹脂進一步包含下述樹脂:相對於前述反應性官能基當量大於250g/mol之樹脂的反應性官能基當量,具有1/2.9~1/2倍的反應性官能基當量之樹脂。The sealing film according to any one of claims 8 to 11, wherein the thermosetting resin further includes a resin having a reactive functional group equivalent to a resin having a reactive functional group equivalent of greater than 250 g / mol. , Resin with a reactive functional group equivalent of 1 / 2.9 to 1/2 times. 如請求項8~12中任一項所述之密封用薄膜,其中,前述反應性官能基當量大於250g/mol之樹脂包含環氧樹脂。The sealing film according to any one of claims 8 to 12, wherein the resin having a reactive functional group equivalent weight greater than 250 g / mol includes an epoxy resin. 如請求項8~13中任一項所述之密封用薄膜,其中,膜厚為20~250μm。The sealing film according to any one of claims 8 to 13, wherein the film thickness is 20 to 250 μm. 一種密封結構體,其具備:被密封體;及,請求項8~14中任一項所述之密封用薄膜的硬化物,其用以對該被密封體進行密封。A sealed structure comprising: a sealed body; and a cured product of the sealing film according to any one of claims 8 to 14 for sealing the sealed body. 一種密封結構體的製造方法,其具備下述步驟:使用根據請求項1~7中任一項所述之方法而獲得的密封用薄膜、或請求項8~14中任一項所述之密封用薄膜,來對被密封體進行密封。A method for manufacturing a sealed structure, comprising the steps of using the sealing film obtained by the method according to any one of claims 1 to 7 or the seal according to any one of claims 8 to 14 A film is used to seal the object to be sealed.
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Publication number Priority date Publication date Assignee Title
JP5435685B2 (en) * 2007-02-28 2014-03-05 ナミックス株式会社 Resin film for sealing
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JP6041933B2 (en) 2012-11-29 2016-12-14 日東電工株式会社 Method for manufacturing thermosetting resin sheet and electronic component package
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JP6341277B2 (en) * 2014-06-04 2018-06-13 日立化成株式会社 Film-like epoxy resin composition, method for producing film-like epoxy resin composition, and method for producing semiconductor device
WO2018003590A1 (en) * 2016-06-28 2018-01-04 住友ベークライト株式会社 Heat-curable resin composition, resin film with carrier, printed wiring board, and semiconductor device
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