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TWI752222B - Film for sealing, sealing structure, and manufacturing method of sealing structure - Google Patents

Film for sealing, sealing structure, and manufacturing method of sealing structure Download PDF

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TWI752222B
TWI752222B TW107114497A TW107114497A TWI752222B TW I752222 B TWI752222 B TW I752222B TW 107114497 A TW107114497 A TW 107114497A TW 107114497 A TW107114497 A TW 107114497A TW I752222 B TWI752222 B TW I752222B
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sealing
film
sealed
thermosetting resin
mass
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TW201843288A (en
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渡瀨裕介
野村豐
石毛紘之
鈴木雅彥
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日商昭和電工材料股份有限公司
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
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    • C08G59/00Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
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    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
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    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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    • H03ELECTRONIC CIRCUITRY
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    • H03H3/007Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/08Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves
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    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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    • H01L2224/97Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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    • H01L2924/181Encapsulation

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Abstract

本發明是一種密封用薄膜(2),其由樹脂組成物構成,該樹脂組成物含有熱硬化樹脂與無機填充材料,該熱硬化樹脂具有以下述式(1)表示的結構單元:

Figure 107114497-A0305-02-0001-1
The present invention is a sealing film (2), which is composed of a resin composition containing a thermosetting resin and an inorganic filler, and the thermosetting resin has a structural unit represented by the following formula (1):
Figure 107114497-A0305-02-0001-1

式(1)中,X1表示反應性官能基,R1表示碳數2~25的烴基。 In formula (1), X 1 represents a reactive functional group, and R 1 represents a hydrocarbon group having 2 to 25 carbon atoms.

Description

密封用薄膜、密封結構體、及密封結構體的製造方法Film for sealing, sealing structure, and manufacturing method of sealing structure

本發明有關一種密封用薄膜、密封結構體、及密封結構體的製造方法。The present invention relates to a film for sealing, a sealing structure, and a method for producing the sealing structure.

近年來,伴隨以智慧型手機等作為代表且在以攜帶作為前提下製作的電子機器的發達,半導體裝置正在進行小型化、薄型化。同樣地,其中所使用的電子零件裝置的小型化、薄型化的要求高漲。因此,正在研究各種將表面聲波(SAW:Surface Acoustic Wave)元件這類的具有可動部之電子零件進行封裝體化的技術。SAW元件是一種電子零件,其在壓電體的薄膜或壓電基板上形成有具有規則性的梳狀電極,並且,是一種能夠利用表面聲波來擷取特定頻帶的電訊號之電子零件。In recent years, with the development of electronic apparatuses such as smartphones and the like, which are produced on the premise of being portable, semiconductor devices are being reduced in size and thickness. Similarly, the demand for miniaturization and thinning of electronic component devices used therein is increasing. Therefore, various technologies for encapsulating electronic components having movable parts such as surface acoustic wave (SAW) elements are being studied. A SAW element is an electronic component in which regular comb-shaped electrodes are formed on a piezoelectric film or a piezoelectric substrate, and is an electronic component capable of extracting electrical signals in a specific frequency band using surface acoustic waves.

當將這種具有可動部之電子零件進行封裝體化時,需要設置用以確保可動部的可動性之空間。例如,SAW元件中,如果其他物質附著於形成有梳狀電極之面,則無法獲得期望的頻率特性,因此變得必須形成中空結構。When encapsulating such an electronic component having a movable portion, it is necessary to provide a space for securing the movability of the movable portion. For example, in a SAW element, if another substance adheres to the surface on which the comb-shaped electrodes are formed, desired frequency characteristics cannot be obtained, and therefore it becomes necessary to form a hollow structure.

以往,為了形成中空結構,實行了一種密封方法,該密封方法是在壓電基板上形成肋(rib)等之後,蓋上蓋子(例如專利文獻1)。然而,此方法中,由於步驟數增加並且密封部分的高度較高,因此存在難以使電子零件裝置薄型化的問題。Conventionally, in order to form a hollow structure, a sealing method in which a rib or the like is formed on a piezoelectric substrate, and then a lid is closed (for example, Patent Document 1) has been carried out. However, in this method, since the number of steps increases and the height of the sealing portion is high, there is a problem that it is difficult to reduce the thickness of the electronic component device.

因此,已提案一種方法,其準備中空結構體,並在基板與晶片之間設置有中空區域的狀態下實行晶片密封,該中空結構體是將形成有梳狀電極之晶片隔著凸塊來倒裝晶片構裝在基板上而成(例如專利文獻2和3)。 [先前技術文獻] (專利文獻)Therefore, there has been proposed a method of preparing a hollow structure in which the wafer on which the comb-shaped electrodes are formed is inverted via bumps, and performing wafer sealing in a state in which a hollow region is provided between the substrate and the wafer. A wafer is mounted on a substrate (for example, Patent Documents 2 and 3). [Prior Art Literature] (Patent Literature)

專利文獻1:日本特開2002-16466號公報 專利文獻2:日本專利第4989402號 專利文獻3:日本特開2016-175976號公報Patent Document 1: Japanese Patent Laid-Open No. 2002-16466 Patent Document 2: Japanese Patent No. 4989402 Patent Document 3: Japanese Patent Laid-Open No. 2016-175976

[發明所欲解決的問題] 當在基板與被密封體之間設置有中空區域的狀態下對被密封體進行密封時,難以確保對於被密封體的優異包埋性,並且難以充分抑制密封材料(構成密封用薄膜的樹脂組成物)流入中空區域。例如,專利文獻2和3的技術中,當試圖確保充分的包埋性時,有時密封材料會進入基材與被密封體之間的中空區域。[Problem to be Solved by the Invention] When the body to be sealed is sealed in a state where a hollow region is provided between the substrate and the body to be sealed, it is difficult to ensure excellent embedding properties for the body to be sealed, and it is difficult to sufficiently suppress the sealing material (The resin composition constituting the sealing film) flows into the hollow region. For example, in the techniques of Patent Documents 2 and 3, when an attempt is made to ensure sufficient embedding properties, the sealing material may enter the hollow region between the base material and the body to be sealed.

因此,本發明的目的在於提供一種密封用薄膜、使用了該密封用薄膜而得之密封結構體、及該密封結構體的製造方法,該密封用薄膜對於被密封體的包埋性優異,並且能夠充分抑制密封材料流入基板與被密封體之間的中空區域。 [解決問題的技術手段]Accordingly, an object of the present invention is to provide a film for sealing, which is excellent in embedding property for a body to be sealed, a sealing structure using the film for sealing, and a method for producing the same, and The flow of the sealing material into the hollow region between the substrate and the body to be sealed can be sufficiently suppressed. [Technical means to solve the problem]

本發明人首先考慮將構成密封用薄膜的樹脂組成物的熔融黏度調整成期望的範圍,並且研究對於樹脂組成物添加彈性體成分、調整無機填充材料的摻合量等。然而,僅利用這些方法來將熔融黏度調整成期望的範圍,難以解決上述問題。本發明人著眼於熱硬化性樹脂,進一步實行研究,結果發現藉由將特定支鏈基團導入特定熱硬化性樹脂的主骨架中,變得容易控制密封用薄膜的流動性,而能夠確保對於被密封體的優異包埋性,並且充分抑制密封材料(構成密封用薄膜的樹脂組成物)流入基板與被密封體之間的中空區域,從而完成本發明。The present inventors first considered adjusting the melt viscosity of the resin composition constituting the sealing film to a desired range, and studied adding an elastomer component to the resin composition, adjusting the blending amount of the inorganic filler, and the like. However, it is difficult to solve the above-mentioned problems only by adjusting the melt viscosity to a desired range by these methods. The present inventors focused on thermosetting resins and conducted further studies, and as a result found that by introducing a specific branched group into the main skeleton of the specific thermosetting resin, it becomes easy to control the fluidity of the sealing film, and it is possible to ensure the The present invention is accomplished by achieving excellent embeddability of the body to be sealed and sufficiently suppressing the sealing material (resin composition constituting the film for sealing) from flowing into the hollow region between the substrate and the body to be sealed.

亦即,本發明的一態樣有關一種密封用薄膜,其由樹脂組成物構成,該樹脂組成物含有熱硬化樹脂與無機填充材料,該熱硬化樹脂具有以下述式(1)表示的結構單元:

Figure 02_image001
式(1)中,X1 表示反應性官能基,R1 表示碳數2~25的烴基。That is, one aspect of the present invention relates to a sealing film comprising a resin composition containing a thermosetting resin and an inorganic filler, the thermosetting resin having a structural unit represented by the following formula (1) :
Figure 02_image001
In formula (1), X 1 represents a reactive functional group, and R 1 represents a hydrocarbon group having 2 to 25 carbon atoms.

根據上述密封用薄膜,能夠確保對於被密封體的優異包埋性,並且充分抑制密封材料流入基板與被密封體之間的中空區域。亦即,根據上述密封用薄膜,能夠兼具包埋性與中空非填充性。進一步,根據上述密封用薄膜,硬化後的玻璃轉化溫度(Tg)容易變得充分,且容易提升密封結構體的可靠性(熱可靠性)。According to the above-described film for sealing, it is possible to sufficiently suppress the flow of the sealing material into the hollow region between the substrate and the body to be sealed while ensuring excellent embedding properties with respect to the body to be sealed. That is, according to the above-mentioned film for sealing, it is possible to have both embedding properties and hollow non-filling properties. Furthermore, according to the said film for sealing, the glass transition temperature (Tg) after hardening becomes sufficient easily, and it becomes easy to improve the reliability (thermal reliability) of a sealing structure.

上述熱硬化性樹脂,可進一步具有以下述式(2)表示的結構單元。此時,能夠維持中空非填充性,並且進一步提升對於被密封體的包埋性。

Figure 02_image003
式(2)中,X2 表示反應性官能基,R2 表示氫原子或苯基。The above thermosetting resin may further have a structural unit represented by the following formula (2). In this case, it is possible to maintain the non-filling properties of the hollow, and further improve the embedding properties with respect to the body to be sealed.
Figure 02_image003
In formula (2), X 2 represents a reactive functional group, and R 2 represents a hydrogen atom or a phenyl group.

上述X1 可以是羥基。此時,耐熱性和難燃性優異。又,能夠廉價地製作這種熱硬化性樹脂。The above-mentioned X 1 may be a hydroxyl group. In this case, heat resistance and flame retardancy are excellent. Moreover, such a thermosetting resin can be produced inexpensively.

上述樹脂組成物,可進一步含有環氧樹脂。此時,機械強度優異,並且硬化時收縮的情形少,因而尺寸穩定性優異。又,耐熱性、耐水性及耐化學藥品性優異,且電絕緣性優異。The above-mentioned resin composition may further contain an epoxy resin. In this case, the mechanical strength is excellent, and the shrinkage during hardening is less, so that the dimensional stability is excellent. In addition, it is excellent in heat resistance, water resistance, and chemical resistance, and is excellent in electrical insulation.

上述熱硬化性樹脂中的以上述式(1)表示的結構單元的含量,以構成上述熱硬化性樹脂的結構單元的總量作為基準計,可以是20莫耳%以上。此時,能夠以更高水準來兼具包埋性與中空非填充性。Content of the structural unit represented by the said formula (1) in the said thermosetting resin may be 20 mol% or more based on the total amount of the structural unit which comprises the said thermosetting resin. In this case, the embedding property and the hollow non-filling property can be achieved at a higher level.

上述熱硬化性樹脂的重量平均分子量,可以是500以上。此時,能夠以更高水準來兼具包埋性與中空非填充性。The weight average molecular weight of the said thermosetting resin may be 500 or more. In this case, the embedding property and the hollow non-filling property can be achieved at a higher level.

上述密封用薄膜的膜厚,可以是20~250μm。The film thickness of the said sealing film may be 20-250 micrometers.

上述密封用薄膜,能夠適合用於對被密封體進行密封的用途,該被密封體是隔著凸塊而設置在基板上。The above-mentioned film for sealing can be suitably used for the purpose of sealing a body to be sealed, which is provided on a substrate with a bump therebetween.

本發明的一態樣有關一種密封結構體的製造方法,其準備中空結構體,該中空結構體具備基板、及隔著凸塊而設置在該基板上的被密封體,且在上述基板與上述被密封體之間設置有中空區域;並且,藉由上述本發明的密封用薄膜來對上述被密封體進行密封。根據此方法,能夠獲得一種密封結構體,該密封結構體充分包埋了被密封體,並且充分確保了中空區域。One aspect of the present invention relates to a method for producing a sealing structure, which prepares a hollow structure including a substrate and a to-be-sealed body provided on the substrate with bumps interposed therebetween, wherein the substrate and the above-mentioned A hollow area is provided between the bodies to be sealed; and the body to be sealed is sealed by the film for sealing of the present invention. According to this method, it is possible to obtain a sealing structure in which the body to be sealed is sufficiently embedded and the hollow region is sufficiently secured.

上述製造方法中,被密封體可以是表面聲波(SAW)元件,其在中空區域側具有電極。上述製造方法中,能夠充分包埋SAW元件,並且能夠充分抑制密封材料附著於SAW元件的具有電極之面上。因此,根據上述製造方法,能夠提升SAW元件的可靠性。又,根據相同理由,上述製造方法,能夠在製造具備這種被密封體之密封結構體(中空密封結構體)時提升產率。In the above-described manufacturing method, the body to be sealed may be a surface acoustic wave (SAW) element having electrodes on the side of the hollow region. In the above-described manufacturing method, the SAW element can be sufficiently embedded, and the adhesion of the sealing material to the surface having the electrodes of the SAW element can be sufficiently suppressed. Therefore, according to the above-described manufacturing method, the reliability of the SAW element can be improved. Moreover, for the same reason, the above-mentioned manufacturing method can improve the yield when manufacturing the sealing structure (hollow sealing structure) provided with such a to-be-sealed body.

本發明的一態樣有關一種密封結構體,其具備:基板;被密封體,其隔著凸塊而設置在該基板上;及,上述本發明的密封用薄膜的硬化物,其用以對該被密封體進行密封;並且,在上述基板與上述被密封體之間設置有中空區域。此密封結構體中,充分包埋了被密封體,並且充分確保了中空區域。One aspect of the present invention relates to a sealing structure including: a substrate; a body to be sealed provided on the substrate with bumps interposed therebetween; The body to be sealed is sealed; and a hollow region is provided between the substrate and the body to be sealed. In this sealing structure, the to-be-sealed body is sufficiently embedded, and the hollow region is sufficiently secured.

上述密封結構體中,被密封體可以是SAW元件,其在中空區域側具有電極。此密封結構體中,充分包埋了SAW元件,並且充分抑制了密封材料附著於SAW元件的具有電極之面上的情形。因此,SAW元件的可靠性優異。 [發明的功效]In the above-described sealing structure, the body to be sealed may be a SAW element having electrodes on the side of the hollow region. In this sealing structure, the SAW element is sufficiently embedded, and the adhesion of the sealing material to the surface having the electrodes of the SAW element is sufficiently suppressed. Therefore, the reliability of the SAW element is excellent. [Effect of invention]

根據本發明,能夠提供一種密封用薄膜、使用了該密封用薄膜而得之密封結構體、及該密封結構體的製造方法,該密封用薄膜對於被密封體的包埋性優異,並且能夠充分抑制密封材料流入基板與被密封體之間的中空區域。ADVANTAGE OF THE INVENTION According to the present invention, it is possible to provide a film for sealing, which is excellent in embedding property for a to-be-sealed body, and a sealing structure using the same, and a method for producing the sealing structure. The sealing material is suppressed from flowing into the hollow region between the substrate and the body to be sealed.

在本說明書中使用「~」來表示的數值範圍中,包含「~」前後所記載的數值,分別作為最小值和最大值。在本說明書中以階段性記載的數值範圍中,某個階段的數值範圍的上限值或下限值,可置換為另一個階段的數值範圍的上限值或下限值。本說明書中所記載的數值範圍中,該數值範圍的上限值或下限值,可置換為實施例所示的數值。「A或B」,是指只要包含A和B中的任一方即可,亦可兩方皆包含。本說明書中例示的材料,只要未特別說明,可使用單獨1種,亦可將2種以上併用。在本說明書中,當組成物中存在有複數種物質符合各成分時,只要未特別說明,組成物中的各成分的含量,意指存在於組成物中的該複數種物質的合計量。In the numerical range represented using "-" in this specification, the numerical value described before and after "-" is included as a minimum value and a maximum value, respectively. In the numerical range described in steps in this specification, the upper limit or the lower limit of the numerical range in one stage can be replaced with the upper limit or the lower limit of the numerical range in another stage. In the numerical range described in this specification, the upper limit or the lower limit of this numerical range can be replaced with the numerical value shown in an Example. "A or B" means that any one of A and B may be included, or both of them may be included. The materials exemplified in this specification may be used alone or in combination of two or more, unless otherwise specified. In this specification, when there are plural substances in the composition to correspond to each component, unless otherwise specified, the content of each component in the composition means the total amount of the plural substances present in the composition.

以下,一面參照圖示,一面說明本發明的較佳實施形態。Hereinafter, preferred embodiments of the present invention will be described with reference to the drawings.

<密封用薄膜> 本實施形態的密封用薄膜,是一種薄膜狀的樹脂組成物,其含有熱硬化性成分和無機填充材料。本實施形態的密封用薄膜,含有作為熱硬化性成分的具有以下述式(1)表示的結構單元之熱硬化性樹脂。

Figure 02_image005
式(1)中,X1 表示反應性官能基,R1 表示碳數2~25的烴基。<Film for sealing> The film for sealing according to the present embodiment is a film-like resin composition containing a thermosetting component and an inorganic filler. The sealing film of the present embodiment contains, as a thermosetting component, a thermosetting resin having a structural unit represented by the following formula (1).
Figure 02_image005
In formula (1), X 1 represents a reactive functional group, and R 1 represents a hydrocarbon group having 2 to 25 carbon atoms.

本實施形態的密封用薄膜,適合對於中空結構體使用,該中空結構體具備基板、設置於該基板上的被密封體(例如SAW元件等電子零件)、及設置於該基板與該被密封體之間的中空區域。根據本實施形態的密封用薄膜,能夠兼具對於被密封體的包埋性與中空非填充性。能夠獲得這樣的功效的理由不明,但本發明人推測如下所述。亦即,本實施形態的密封用薄膜中,以上述式(1)表示的結構單元中的R1 成為立體阻礙(steric hindrance),於是熱硬化性樹脂在密封薄膜中的流動受到抑制,從而抑制樹脂組成物流入中空區域。另一方面,R1 為適度大小,且密封時立體阻礙因剪切應力而緩和,因此不會阻礙對於被密封體的包埋性。由這樣的理由推測,根據本實施形態的密封薄膜,能夠獲得上述功效。The sealing film of the present embodiment is suitable for use with a hollow structure including a substrate, a body to be sealed (for example, an electronic component such as a SAW element) provided on the substrate, and a body provided on the substrate and the body to be sealed the hollow area in between. According to the sealing film of the present embodiment, it is possible to have both the embedding property and the hollow non-filling property with respect to the to-be-sealed body. The reason why such an effect can be obtained is unknown, but the present inventors speculate as follows. That is, in the sealing film of the present embodiment, R 1 in the structural unit represented by the above formula (1) becomes a steric hindrance, and the flow of the thermosetting resin in the sealing film is suppressed, thereby suppressing the The resin composition flows into the hollow region. On the other hand, R 1 has an appropriate size, and the steric hindrance at the time of sealing is relieved by the shear stress, so the embedding property with respect to the body to be sealed is not hindered. From such a reason, according to the sealing film of this embodiment, the said effect can be acquired.

然而,雖然亦可考慮藉由對密封用薄膜添加過量的彈性體來防止密封材料(尤其是熱硬化性樹脂)流入中空區域,但是此方法不只有包埋性下降的情況,還有硬化後的Tg下降的情況,從而可能變得難以確保密封結構體的可靠性(熱可靠性)。另一方面,本實施形態的密封用薄膜中,不需要使用過量的彈性體,並且具有以上述式(1)表示的結構單元,因此能夠充分確保硬化後的Tg。However, it is also possible to prevent the sealing material (especially thermosetting resin) from flowing into the hollow region by adding an excessive amount of elastomer to the sealing film, but this method not only reduces the embedding property, but also reduces the encapsulation property after curing. When Tg falls, it may become difficult to ensure the reliability (thermal reliability) of the sealing structure. On the other hand, the film for sealing according to the present embodiment does not need to use an excessive amount of the elastomer, and has the structural unit represented by the above formula (1), so that Tg after curing can be sufficiently secured.

(熱硬化性成分) 作為熱硬化性成分,可列舉熱硬化性樹脂、硬化劑、硬化促進劑等。熱硬化性成分,可在不包含硬化劑及/或硬化促進劑的情況下包含熱硬化性樹脂。又,熱硬化性成分,含有至少具有以上述式(1)表示的結構單元之熱硬化性樹脂(以下,亦稱為「第1熱硬化性樹脂」),亦可進一步含有第1熱硬化性樹脂以外的熱硬化性樹脂(以下,亦稱為「第2熱硬化性樹脂」)(Thermosetting component) As a thermosetting component, a thermosetting resin, a hardening agent, a hardening accelerator, etc. are mentioned. The thermosetting component may contain a thermosetting resin without containing a curing agent and/or a curing accelerator. In addition, the thermosetting component may contain a thermosetting resin having at least a structural unit represented by the above formula (1) (hereinafter, also referred to as "first thermosetting resin"), and may further contain a first thermosetting resin Thermosetting resin other than resin (hereinafter, also referred to as "second thermosetting resin")

[第1熱硬化性樹脂] 第1熱硬化性樹脂,至少具有以上述式(1)表示的結構單元。[First Thermosetting Resin] The first thermosetting resin has at least a structural unit represented by the above formula (1).

以X1 表示的反應性官能基,只要是能夠利用熱來與其他反應性官能基進行反應之官能基即可。本實施形態中,是藉由例如下述方式來形成立體交聯結構而使密封用薄膜硬化:第1熱硬化性樹脂所具有的反應性官能基利用熱來與其他反應性官能基進行反應。作為反應性官能基,可列舉羥基、環氧基、羧基、異氰酸基等。這些官能基中,從能夠廉價地製作的觀點、以及耐熱性和難燃性優異的觀點而言,較佳是羥基(酚性羥基)。換言之,第1熱硬化性樹脂,較佳是包含酚樹脂。再者,能夠與反應性官能基反應的其他反應性官能基,可以是第1熱硬化性樹脂所具有的反應性官能基,亦可以是第2熱硬化性樹脂所具有的反應性官能基,亦可以是硬化劑所具有的反應性官能基。The reactive functional group represented by X 1 should just be a functional group which can react with another reactive functional group by heat. In the present embodiment, the film for sealing is cured by forming a three-dimensionally crosslinked structure, for example, by reacting the reactive functional group of the first thermosetting resin with another reactive functional group by heat. As a reactive functional group, a hydroxyl group, an epoxy group, a carboxyl group, an isocyanato group, etc. are mentioned. Among these functional groups, a hydroxyl group (phenolic hydroxyl group) is preferable from the viewpoint of being able to be produced inexpensively and from the viewpoint of being excellent in heat resistance and flame retardancy. In other words, the first thermosetting resin preferably contains a phenol resin. Furthermore, the other reactive functional group that can react with the reactive functional group may be the reactive functional group possessed by the first thermosetting resin or the reactive functional group possessed by the second thermosetting resin, It may also be a reactive functional group possessed by the hardener.

以R1 表示的烴基,可以是直鏈狀或分枝狀中的任一種。又,烴基,可以是飽和或不飽和中的任一種。當烴基為不飽和烴基時,不飽和烴基可具有2個以上不飽和鍵。The hydrocarbon group represented by R 1 may be linear or branched. In addition, the hydrocarbon group may be either saturated or unsaturated. When the hydrocarbon group is an unsaturated hydrocarbon group, the unsaturated hydrocarbon group may have two or more unsaturated bonds.

從中空非填充性變得更良好的觀點而言,烴基的碳數,較佳是4以上,更佳是8以上,進一步更佳是10以上,特佳是15以上。尤其是當烴基的碳數為15以上時,能夠減少彈性率,並且能夠改善破裂性和翹曲性。從包埋性變得更良好的觀點而言,烴基的碳數,可以是22以下,亦可以是20以下,亦可以是18以下。上述上限值和下限值,能夠任意組合。因此,烴基的碳數,例如可以是4~22,亦可以是8~20,亦可以是10~18,亦可以是15~18。再者,在以下相同的記載中,個別記載的上限值和下限值,亦能夠任意組合。The number of carbon atoms in the hydrocarbon group is preferably 4 or more, more preferably 8 or more, still more preferably 10 or more, and particularly preferably 15 or more, from the viewpoint of making the hollow non-filling property more favorable. In particular, when the carbon number of the hydrocarbon group is 15 or more, the elastic modulus can be reduced, and the cracking property and the warp property can be improved. The number of carbon atoms in the hydrocarbon group may be 22 or less, 20 or less, or 18 or less, from the viewpoint of better embedding properties. The above upper limit value and lower limit value can be arbitrarily combined. Therefore, the carbon number of the hydrocarbon group may be, for example, 4-22, 8-20, 10-18, or 15-18. In addition, in the same description below, the upper limit value and the lower limit value described individually can also be combined arbitrarily.

本實施形態中,烴基的主鏈越長,中空非填充性越容易變得良好,且硬化後的Tg越容易變得充分。從這樣的觀點而言,當烴基為分枝狀時,分枝狀烴基的主鏈的碳數,可以是2以上,亦可以是4以上,亦可以是6以上。從包埋性變得更良好的觀點而言,分枝狀烴基的主鏈的碳數,可以是22以下,亦可以是20以下,亦可以是18以下。In the present embodiment, the longer the main chain of the hydrocarbon group is, the better the hollow non-filling property is, and the easier the Tg after hardening is sufficient. From such a viewpoint, when the hydrocarbon group is branched, the number of carbon atoms in the main chain of the branched hydrocarbon group may be 2 or more, 4 or more, or 6 or more. The number of carbon atoms in the main chain of the branched hydrocarbon group may be 22 or less, 20 or less, or 18 or less, from the viewpoint of better embedding properties.

作為直鏈狀的烴基,可列舉例如:-(CH2 )14 CH3 、-(CH2 )7 CH=CH(CH2 )5 CH3 、-(CH2 )7 CH=CHCH2 CH=CH(CH2 )2 CH3 、-(CH2 )7 CH=CHCH2 CH=CHCH=CHCH3 、-(CH2 )7 CH=CHCH2 CH=CHCH2 CH=CH2 等。Examples of linear hydrocarbon groups include -(CH 2 ) 14 CH 3 , -(CH 2 ) 7 CH=CH(CH 2 ) 5 CH 3 , -(CH 2 ) 7 CH=CHCH 2 CH=CH (CH 2 ) 2 CH 3 , -(CH 2 ) 7 CH=CHCH 2 CH=CHCH=CHCH 3 , -(CH 2 ) 7 CH=CHCH 2 CH=CHCH 2 CH=CH 2 , etc.

作為分枝狀的烴基,可列舉例如:-C(CH3 )2 CH3 、-C(CH3 )2 CH2 C(CH3 )2 CH3 等。A branched hydrocarbon group, for example, include: -C (CH 3) 2 CH 3, -C (CH 3) 2 CH 2 C (CH 3) 2 CH 3 and the like.

上述式(1)中的R1 的位置,相對於-X1 ,可以是鄰位、間位或對位中的任一個。從不易引起立體阻礙且反應性優異的觀點而言,R1 的位置,相對於-X1 ,較佳是對位。 The position of R 1 in the above formula (1) may be any of the ortho position, the meta position or the para position with respect to -X 1 . The position of R 1 is preferably the para position with respect to -X 1 from the viewpoint that steric hindrance is unlikely to occur and the reactivity is excellent.

鍵結(-*和-CH2 -*)的位置,相對於-X1 ,可以是鄰位、間位或對位中的任一個。從R1 所及於的範圍變廣的觀點而言,鍵結位置,相對於-X1 ,較佳是鄰位。例如,以式(1)表示的結構單元,可包含以下述式(1a)表示的結構單元。

Figure 02_image007
式(1a)中,X1 與上述式(1)中的X1 相同,R1 與上述式(1)中的R1 相同。The positions of the bonds (-* and -CH 2 -*) can be any of ortho, meta or para positions relative to -X 1 . From the viewpoint of widening the range of R 1 , the bonding position is preferably an ortho position with respect to -X 1 . For example, the structural unit represented by the formula (1) may contain the structural unit represented by the following formula (1a).
Figure 02_image007
In formula (1a), X 1 is the same as X 1 in the above formula (1), and R 1 is the same as R 1 in the above formula (1).

第1熱硬化性樹脂,可僅由以上述式(1)表示的結構單元所構成。此時,以上述式(1)表示的結構單元,可以是複數個。當以上述式(1)表示的結構單元為複數個時,複數個X1 各自可以相同亦可以不同,複數個R1 各自可以相同亦可以不同。第1熱硬化性樹脂,例如可以是由不同的複數個結構單元所構成之隨機共聚物,亦可以是嵌段共聚物。The first thermosetting resin may be constituted only by the structural unit represented by the above formula (1). In this case, a plurality of structural units represented by the above formula (1) may be used. When there are plural structural units represented by the above formula (1), each of the plural X 1s may be the same or different, and each of the plural R 1s may be the same or different. The first thermosetting resin may be, for example, a random copolymer composed of a plurality of different structural units, or a block copolymer.

當以上述式(1)表示的結構單元為複數個時,第1熱硬化性樹脂,較佳是包含下述結構單元:R1 為碳數6以上的烴基之結構單元(1A)、與R1 為碳數5以下的烴基之結構單元(1B)。

Figure 02_image009
式(1A)中,X1 與上述式(1)中的X1 相同,R1A 表示碳數6以上的烴基。
Figure 02_image011
式(1B)中,X1 與上述式(1)中的X1 相同,R1B 表示碳數5以下的烴基。When there are plural structural units represented by the above formula (1), the first thermosetting resin preferably contains the following structural units: structural unit (1A) wherein R 1 is a hydrocarbon group having 6 or more carbon atoms, and R 1 is a structural unit (1B) of a hydrocarbon group having 5 or less carbon atoms.
Figure 02_image009
In the formula (1A), X 1 same as (1) in the above formulas X 1, R 1A represents a hydrocarbon group having 6 or more carbon atoms.
Figure 02_image011
In the formula (1B), X 1 same as (1) in the above formulas X 1, R 1B represents a hydrocarbon group having 5 or less carbon atoms.

第1熱硬化性樹脂中的以上述式(1)表示的結構單元中,從中空非填充性變得更良好的觀點而言,結構單元(1A)的含量,以構成熱硬化性樹脂的結構單元的總量作為基準計,可以是20莫耳%以上,亦可以是30莫耳%以上,亦可以是40莫耳%以上。從包埋性變得更良好的觀點而言,結構單元(1A)的含量,以構成熱硬化性樹脂的結構單元的總量作為基準計,可以是100莫耳%以下,亦可以是90莫耳%以下,亦可以是80莫耳%以下。從這些觀點而言,結構單元(1A)的含量,以構成熱硬化性樹脂的結構單元的總量作為基準計,可以是20~100莫耳%,亦可以是30~90莫耳%,亦可以是40~80莫耳%。Among the structural units represented by the above-mentioned formula (1) in the first thermosetting resin, the content of the structural unit (1A) constitutes the structure of the thermosetting resin from the viewpoint that the hollow non-filling property becomes more favorable. The total amount of cells may be 20 mol % or more, 30 mol % or more, or 40 mol % or more based on the basis. From the viewpoint of better embedding properties, the content of the structural unit (1A) may be 100 mol % or less, or 90 mol % based on the total amount of the structural units constituting the thermosetting resin. ear % or less, or 80 mol % or less. From these viewpoints, the content of the structural unit (1A) may be 20 to 100 mol %, or 30 to 90 mol %, based on the total amount of the structural units constituting the thermosetting resin. It may be 40 to 80 mol%.

第1熱硬化性樹脂中的以上述式(1)表示的結構單元中,從包埋性變得更良好的觀點而言,結構單元(1B)的含量,以構成熱硬化性樹脂的結構單元的總量作為基準計,可超過0莫耳%,可以是10莫耳%以上,可以是20莫耳%以上。從中空非填充性變得更良好的觀點而言,結構單元(1B)的含量,以構成熱硬化性樹脂的結構單元的總量作為基準計,可以是80莫耳%以下,亦可以是70莫耳%以下,亦可以是60莫耳%以下。從這些觀點而言,結構單元(1B)的含量,以構成熱硬化性樹脂的結構單元的總量作為基準計,可以是超過0莫耳%且80莫耳%以下,亦可以是10~70莫耳%,亦可以是20~60莫耳%。In the structural unit represented by the above-mentioned formula (1) in the first thermosetting resin, from the viewpoint of better embedding properties, the content of the structural unit (1B) constitutes the structural unit of the thermosetting resin As a benchmark, the total amount can exceed 0 mol%, can be more than 10 mol%, and can be more than 20 mol%. From the viewpoint of making the hollow non-filling property more favorable, the content of the structural unit (1B) may be 80 mol % or less, or 70 mol %, based on the total amount of the structural units constituting the thermosetting resin. mol% or less, and may also be 60 mol% or less. From these viewpoints, the content of the structural unit (1B) may be more than 0 mol % and 80 mol % or less, or may be 10 to 70 mol % based on the total amount of structural units constituting the thermosetting resin. The molar % can also be 20 to 60 mol %.

從能夠以更高水準來兼具對於被密封體的包埋性與中空非填充性的觀點而言,結構單元(1A)相對於結構單元(1B)的莫耳比,可以是0.5以上,並且,可以是3.0以下。因此,結構單元(1A)相對於結構單元(1B)的莫耳比,例如可以是0.5~3.0。The molar ratio of the structural unit (1A) to the structural unit (1B) may be 0.5 or more from the viewpoint of being able to have both the embedding property and the hollow non-filling property for the sealed body at a higher level, and , can be below 3.0. Therefore, the molar ratio of the structural unit (1A) to the structural unit (1B) may be, for example, 0.5 to 3.0.

第1熱硬化性樹脂,可進一步具有以上述式(1)表示的結構單元以外的其他結構單元。作為其他結構單元,可列舉例如以下述式(2)表示的結構單元。

Figure 02_image013
式(2)中,X2 表示反應性官能基,R2 表示氫原子或苯基。當以式(2)表示的結構單元為複數個時,複數個X2 各自可以相同亦可以不同,複數個R2 各自可以相同亦可以不同。The first thermosetting resin may further have other structural units than the structural unit represented by the above formula (1). As another structural unit, the structural unit represented by following formula (2) is mentioned, for example.
Figure 02_image013
In formula (2), X 2 represents a reactive functional group, and R 2 represents a hydrogen atom or a phenyl group. When there are plural structural units represented by formula (2), each of plural X 2 may be the same or different, and each plural R 2 may be the same or different.

作為以X2 表示的反應性官能基的例子,可列舉與X1 的例子相同的反應性官能基,且較佳的反應性官能基的例子亦相同。Examples of the reactive functional group in X 2 represented by X 1 include the same examples of the reactive functional group, and preferred examples of the reactive functional groups are also the same.

上述式(2)中的R2 的位置,相對於-X2 ,可以是鄰位、間位或對位中的任一個。從不易引起立體阻礙且反應性優異的觀點而言,R2 的位置,相對於-X2 ,較佳是對位。 The position of R 2 in the above formula (2) may be any of the ortho position, the meta position or the para position with respect to -X 2 . The position of R 2 is preferably the para position with respect to -X 2 from the viewpoint of hardly causing steric hindrance and having excellent reactivity.

鍵結(-*和-CH2 -*)的位置,相對於-X2 ,可以是鄰位、間位或對位中的任一個。從熱硬化性樹脂的體積變小且反應性提升的觀點而言,鍵結位置,相對於-X2 ,較佳是鄰位。例如,以式(2)表示的結構單元,可包含以下述式(2b)表示的結構單元。

Figure 02_image015
式(2b)中,X2 與上述式(2)中的X2 相同,R2 與上述式(2)中的R2 相同。The positions of the bonds (-* and -CH 2 -*), relative to -X 2 , may be any of the ortho, meta or para positions. From the viewpoint of reducing the volume of the thermosetting resin and improving the reactivity, the bonding position is preferably an ortho position with respect to -X 2 . For example, the structural unit represented by the formula (2) may contain the structural unit represented by the following formula (2b).
Figure 02_image015
In formula (2b), X 2 is the same as X 2 in the above formula (2), and R 2 is the same as R 2 in the above formula (2).

從中空非填充性變得更良好的觀點而言,第1熱硬化性樹脂中的以上述(1)表示的結構單元的含量,以構成熱硬化性樹脂的結構單元的總量作為基準計,可以是20莫耳%以上,亦可以是30莫耳%以上,亦可以是40莫耳%以上。從包埋性變得更良好的觀點而言,第1熱硬化性樹脂中的以上述(1)表示的結構單元的含量,以構成熱硬化性樹脂的結構單元的總量作為基準計,可以是100莫耳%以下,亦可以是90莫耳%以下,亦可以是80莫耳%以下。從這些觀點而言,第1熱硬化性樹脂中的以上述(1)表示的結構單元的含量,以構成熱硬化性樹脂的結構單元的總量作為基準計,可以是20~100莫耳%,亦可以是30~90莫耳%,亦可以是40~80莫耳%。The content of the structural unit represented by the above-mentioned (1) in the first thermosetting resin is based on the total amount of the structural units constituting the thermosetting resin, from the viewpoint that the hollow non-filling property becomes more favorable, It may be 20 mol% or more, 30 mol% or more, or 40 mol% or more. From the viewpoint of better embedding properties, the content of the structural unit represented by the above (1) in the first thermosetting resin may be based on the total amount of the structural units constituting the thermosetting resin. It may be 100 mol % or less, 90 mol % or less, or 80 mol % or less. From these viewpoints, the content of the structural unit represented by the above (1) in the first thermosetting resin may be 20 to 100 mol % based on the total amount of the structural units constituting the thermosetting resin. , can also be 30 to 90 mol%, or 40 to 80 mol%.

從包埋性變得更良好的觀點而言,第1熱硬化性樹脂中的以上述(2)表示的結構單元的含量,以構成熱硬化性樹脂的結構單元的總量作為基準計,可超過0莫耳%,可以是10莫耳%以上,可以是20莫耳%以上。從中空非填充性變得更良好的觀點而言,第1熱硬化性樹脂中的以上述(2)表示的結構單元的含量,以構成熱硬化性樹脂的結構單元的總量作為基準計,可以是80莫耳%以下,亦可以是70莫耳%以下,亦可以是60莫耳%以下。從這些觀點而言,第1熱硬化性樹脂中的以上述(2)表示的結構單元的含量,以構成熱硬化性樹脂的結構單元的總量作為基準計,可以是超過0莫耳%且80莫耳%以下,亦可以是10~70莫耳%,亦可以是20~60莫耳%。From the viewpoint of better embedding properties, the content of the structural unit represented by the above (2) in the first thermosetting resin may be based on the total amount of the structural units constituting the thermosetting resin. If it exceeds 0 mol%, it may be 10 mol% or more, and may be 20 mol% or more. The content of the structural unit represented by the above-mentioned (2) in the first thermosetting resin is based on the total amount of the structural units constituting the thermosetting resin, from the viewpoint that the hollow non-filling property becomes more favorable, It may be 80 mol % or less, 70 mol % or less, or 60 mol % or less. From these viewpoints, the content of the structural unit represented by the above (2) in the first thermosetting resin may be more than 0 mol % based on the total amount of the structural units constituting the thermosetting resin. 80 mol% or less may be 10-70 mol%, or 20-60 mol%.

從能夠以更高水準來兼具對於被密封體的包埋性與中空非填充性的觀點而言,第1熱硬化性樹脂中的以上述(1)表示的結構單元相對於以上述(2)表示的結構單元的莫耳比,可以是0.5以上,並且,可以是3.0以下。因此,上述(1)表示的結構單元相對於以上述(2)表示的結構單元的莫耳比,例如可以是0.5~3.0。The structural unit represented by the above-mentioned (1) in the first thermosetting resin is relative to the above-mentioned (2) from the viewpoint of being able to have both the embedding property and the hollow non-filling property for the sealed body at a higher level. The molar ratio of the structural unit represented by ) may be 0.5 or more, and may be 3.0 or less. Therefore, the molar ratio of the structural unit represented by the above (1) to the structural unit represented by the above (2) may be, for example, 0.5 to 3.0.

從能夠以更高水準來兼具對於被密封體的包埋性與中空非填充性的觀點而言,第1熱硬化性樹脂的重量平均分子量,可以是500~1000000,亦可以是500~500000,亦可以是500~300000。再者,重量平均分子量,是利用凝膠滲透層析法(GPC)並使用了基於標準聚苯乙烯的校準曲線而得的以聚苯乙烯換算的值。The weight average molecular weight of the first thermosetting resin may be 500 to 1,000,000, or 500 to 500,000, from the viewpoint of being able to have both the embedding property and the hollow non-filling property for the sealed body at a higher level. , or 500 to 300,000. In addition, the weight average molecular weight is a polystyrene conversion value obtained by gel permeation chromatography (GPC) and using the calibration curve based on standard polystyrene.

從樹脂的交聯點變多,從而硬化後的Tg變高的觀點而言,第1熱硬化性樹脂的反應性官能基當量,可以是100g/eq.以上、110g/eq.以上、120g/eq.以上或130g/eq.以上,並且,從相同的觀點而言,可以是250g/eq.以下、240g/eq.以下、210g/eq.以下或200g/eq.以下。因此,第1熱硬化性樹脂的反應性官能基當量,例如可以是100~250g/eq.,亦可以是110~240g/eq.,亦可以是120~210g/eq.,亦可以是130~200g/eq.。再者,「反應性官能基當量」,意指熱硬化性樹脂所具有的每1當量(1eq.)反應性官能基的熱硬化性樹脂的質量(g/eq.)。例如,當反應性官能基為環氧基時,反應性官能基,是藉由下述方式測定:使熱硬化性樹脂溶於氯仿後,對所獲得的溶液加入乙酸和溴化四乙基銨乙酸溶液,然後利用過氯酸乙酸標準液進行電位滴定,並偵測全部環氧基反應後的終點。又,當反應性官能基為羥基時,是藉由下述方式測定:對熱硬化性樹脂加入乙醯化試藥,然後在甘油浴中進行加熱,並放置冷卻後,加入作為指示劑的酚酞,並利用氫氧化鉀乙醇溶液來進行滴定。The reactive functional group equivalent of the first thermosetting resin may be 100 g/eq. or more, 110 g/eq. or more, or 120 g/ eq. or more or 130 g/eq. or more, and from the same viewpoint, 250 g/eq. or less, 240 g/eq. or less, 210 g/eq. or less, or 200 g/eq. or less. Therefore, the reactive functional group equivalent of the first thermosetting resin may be, for example, 100 to 250 g/eq., 110 to 240 g/eq., 120 to 210 g/eq., or 130 to 130 g/eq. 200g/eq.. In addition, "reactive functional group equivalent" means the mass (g/eq.) of thermosetting resin per 1 equivalent (1 eq.) of reactive functional groups which thermosetting resin has. For example, when the reactive functional group is an epoxy group, the reactive functional group is measured by: after dissolving the thermosetting resin in chloroform, acetic acid and tetraethylammonium bromide are added to the obtained solution acetic acid solution, and then use perchloric acid acetic acid standard solution for potentiometric titration, and detect the end point after all the epoxy groups react. In addition, when the reactive functional group is a hydroxyl group, it is measured by adding an acetylation reagent to a thermosetting resin, heating it in a glycerin bath, and leaving it to cool, and then adding phenolphthalein as an indicator. , and titrated with potassium hydroxide ethanol solution.

從容易抑制薄膜表面發生破裂和裂縫的觀點而言,第1熱硬化性樹脂,可以是25℃時呈液狀。再者,「25℃時呈液狀」,是指由E型黏度計所測得的25℃時的黏度為400Pa・s以下。The first thermosetting resin may be in a liquid state at 25° C. from the viewpoint of easily suppressing the occurrence of cracks and cracks on the surface of the film. In addition, "liquid state at 25 degreeC" means that the viscosity at 25 degreeC measured by an E-type viscometer is 400 Pa・s or less.

具有以上述式(1)表示的結構單元之樹脂,能夠藉由例如下述方式來獲得:利用以往公知的方法來使以下述式(3)表示的化合物進行聚合。又,具有以上述式(1)表示的結構單元與以上述式(2)表示的結構單元之樹脂,能夠藉由例如下述方式來獲得:利用以往公知的方法來使以下述式(3)表示的化合物與以下述式(4)表示的化合物進行共聚合。

Figure 02_image017
式(3)中,X1 與上述式(1)中的X1 相同,R1 與上述式(1)中的R1 相同。R1 的位置,相對於-X1 ,可以是鄰位、間位或對位中的任一個。
Figure 02_image019
式(4)中,X2 與上述式(2)中的X2 相同,R2 與上述式(2)中的R2 相同。R2 的位置,相對於-X2 ,可以是鄰位、間位或對位中的任一個。The resin having the structural unit represented by the above formula (1) can be obtained, for example, by polymerizing the compound represented by the following formula (3) by a conventionally known method. In addition, the resin having the structural unit represented by the above formula (1) and the structural unit represented by the above formula (2) can be obtained, for example, by the following method: by a conventionally known method, the following formula (3) The compound represented is copolymerized with the compound represented by the following formula (4).
Figure 02_image017
In formula (3), X 1 is the same as X 1 in the above formula (1), and R 1 is the same as R 1 in the above formula (1). The position of R 1 with respect to -X 1 may be any of ortho, meta or para.
Figure 02_image019
In formula (4), X 2 is the same as X 2 in the above formula (2), and R 2 is the same as R 2 in the above formula (2). The position of R 2 with respect to -X 2 may be any of ortho, meta or para.

例如,當X1 為羥基時,第1熱硬化性樹脂,能夠藉由下述方式來獲得:使以下述式(3a)表示的含取代基苯酚與甲醛、根據情況而與以下述式(4a)表示的含取代基苯酚進行反應。本實施形態中,藉由調整以式(3a)表示的含取代基苯酚和以式(4a)表示的含取代基苯酚的使用量等,能夠調整第1熱硬化性樹脂所具有的各結構單元的含量。

Figure 02_image021
式(3a)中,R1 與上述式(1)中的R1 相同。R1 的位置,相對於-OH,可以是鄰位、間位或對位中的任一個。
Figure 02_image023
式(4a)中,R2 與上述式(2)中的R2 相同。R2 的位置,相對於-OH,可以是鄰位、間位或對位中的任一個。For example, when X 1 is a hydroxyl group, the first thermosetting resin can be obtained by combining a substituent-containing phenol represented by the following formula (3a) with formaldehyde, and in some cases with the following formula (4a) ) to react with a substituent-containing phenol represented by . In this embodiment, each structural unit which the 1st thermosetting resin has can be adjusted by adjusting the usage-amount of the substituent-containing phenol represented by formula (3a) and the substituent-containing phenol represented by formula (4a), etc. content.
Figure 02_image021
In the formula (3a), R 1 the same as (1) R in the above formula 1. The position of R 1 can be any of the ortho, meta or para positions relative to -OH.
Figure 02_image023
In the formula (4a), R 2 the same (2) R in the above formula 2. The position of R 2 can be any of the ortho, meta or para positions relative to -OH.

又,例如,當X1 為環氧基時,第1熱硬化性樹脂,能夠藉由下述方式來獲得:使以上述式(3a)表示的含取代基苯酚與表氯醇(epichlorohydrin)在30%NaOH溶液中進行反應。本實施形態中,藉由調整以式(3a)表示的含取代基苯酚和以式(4a)表示的含取代基苯酚的使用量等,能夠調整第1熱硬化性樹脂所具有的各結構單元的含量。Further, for example, when X 1 is an epoxy group, the first thermosetting resin can be obtained by mixing the substituent-containing phenol represented by the above formula (3a) with epichlorohydrin The reaction was carried out in 30% NaOH solution. In this embodiment, each structural unit which the 1st thermosetting resin has can be adjusted by adjusting the usage-amount of the substituent-containing phenol represented by formula (3a) and the substituent-containing phenol represented by formula (4a), etc. content.

從中空非填充性變得更良好的觀點而言,第1熱硬化性樹脂的含量,以密封用薄膜的總質量作為基準計,可以是1質量%以上,亦可以是3質量%以上,亦可以是5質量%以上。從包埋性變得更良好的觀點而言,第1熱硬化性樹脂的含量,以密封用薄膜的總質量作為基準計,可以是50質量%以下,亦可以是30質量%以下,亦可以是10質量%以下。因此,第1熱硬化性樹脂的含量,例如可以是1~50質量%,亦可以是3~30質量%,亦可以是5~10質量%。The content of the first thermosetting resin may be 1 mass % or more, 3 mass % or more, based on the total mass of the sealing film, from the viewpoint of making the hollow non-filling property more favorable. It may be 5 mass % or more. From the viewpoint of better embedding properties, the content of the first thermosetting resin may be 50 mass % or less, or 30 mass % or less, based on the total mass of the sealing film. It is 10 mass % or less. Therefore, the content of the first thermosetting resin may be, for example, 1 to 50% by mass, 3 to 30% by mass, or 5 to 10% by mass.

[第2熱硬化性樹脂] 作為第2熱硬化性樹脂,可列舉:環氧樹脂、酚樹脂、苯氧樹脂、氰酸酯樹脂、熱硬化性聚醯亞胺、三聚氰胺樹脂、尿素樹脂、不飽和聚酯、醇酸樹脂、聚胺酯等。第2熱硬化性樹脂所具有的反應性官能基,較佳是能夠利用熱來與第1熱硬化性樹脂所具有的反應性官能基進行反應之官能基。例如,當第1熱硬化性樹脂所具有的反應性官能基為羥基(酚性羥基)時,第2熱硬化性樹脂所具有的反應性官能基,較佳是環氧基。換言之,當第1熱硬化性樹脂為酚樹脂時,第2熱硬化性樹脂,較佳是環氧樹脂。此時,機械強度優異,並且硬化時收縮的情形較少,從而尺寸穩定性優異。又,耐熱性、耐水性及耐化學藥品性優異,且電絕緣性優異。第2熱硬化性樹脂所具有的反應性官能基,可與第1熱硬化性樹脂所具有的反應性官能基相同。例如,當第1熱硬化性樹脂所具有的反應性官能基為羥基(酚性羥基)時,第2熱硬化性樹脂所具有的反應性官能基,可以是羥基(酚性羥基)。此時,能夠使用硬化劑來作為熱硬化性成分。[Second Thermosetting Resin] Examples of the second thermosetting resin include epoxy resin, phenol resin, phenoxy resin, cyanate resin, thermosetting polyimide, melamine resin, urea resin, Saturated polyester, alkyd resin, polyurethane, etc. The reactive functional group which the second thermosetting resin has is preferably a functional group which can react with the reactive functional group which the first thermosetting resin has by heat. For example, when the reactive functional group which the first thermosetting resin has is a hydroxyl group (phenolic hydroxyl group), the reactive functional group which the second thermosetting resin has is preferably an epoxy group. In other words, when the first thermosetting resin is a phenol resin, the second thermosetting resin is preferably an epoxy resin. In this case, the mechanical strength is excellent, and the shrinkage during hardening is less, so that the dimensional stability is excellent. In addition, it is excellent in heat resistance, water resistance, and chemical resistance, and is excellent in electrical insulation. The reactive functional group which the second thermosetting resin has may be the same as the reactive functional group which the first thermosetting resin has. For example, when the reactive functional group which the first thermosetting resin has is a hydroxyl group (phenolic hydroxyl group), the reactive functional group which the second thermosetting resin has may be a hydroxyl group (phenolic hydroxyl group). In this case, a hardening agent can be used as a thermosetting component.

作為環氧樹脂,只要是一分子中具有2個以上環氧基之樹脂,能夠無特別限制地使用。作為環氧樹脂,可列舉例如:雙酚A型環氧樹脂、雙酚AP型環氧樹脂、雙酚AF型環氧樹脂、雙酚B型環氧樹脂、雙酚BP型環氧樹脂、雙酚C型環氧樹脂、雙酚E型環氧樹脂、雙酚F型環氧樹脂、雙酚G型環氧樹脂、雙酚M型環氧樹脂、雙酚S型環氧樹脂(己二醇雙酚S二環氧丙基醚等)、雙酚P型環氧樹脂、雙酚PH型環氧樹脂、雙酚TMC型環氧樹脂、雙酚Z型環氧樹脂、苯酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、萘型環氧樹脂、雙環戊二烯型環氧樹脂、聯二甲酚型環氧樹脂(聯二甲酚二環氧丙基醚等)、氫化雙酚A型環氧樹脂(氫化雙酚A環氧丙基醚等);及,這些樹脂的二元酸改質二環氧丙基醚型環氧樹脂;脂肪族環氧樹脂等。環氧樹脂,可使用單獨1種,亦可將2種以上併用。As an epoxy resin, if it is resin which has two or more epoxy groups in one molecule, it can be used without a restriction|limiting in particular. Examples of epoxy resins include bisphenol A type epoxy resin, bisphenol AP type epoxy resin, bisphenol AF type epoxy resin, bisphenol B type epoxy resin, bisphenol BP type epoxy resin, bisphenol BP type epoxy resin, Phenol C type epoxy resin, bisphenol E type epoxy resin, bisphenol F type epoxy resin, bisphenol G type epoxy resin, bisphenol M type epoxy resin, bisphenol S type epoxy resin (hexanediol Bisphenol S diglycidyl ether, etc.), bisphenol P type epoxy resin, bisphenol PH type epoxy resin, bisphenol TMC type epoxy resin, bisphenol Z type epoxy resin, phenol novolac type epoxy resin Resin, biphenyl type epoxy resin, naphthalene type epoxy resin, dicyclopentadiene type epoxy resin, bixylenol type epoxy resin (bixylenol diglycidyl ether, etc.), hydrogenated bisphenol A type epoxy resins (hydrogenated bisphenol A glycidyl ether, etc.); and, dibasic acid-modified diglycidyl ether type epoxy resins of these resins; aliphatic epoxy resins, etc. As for the epoxy resin, one type may be used alone, or two or more types may be used in combination.

從容易抑制薄膜表面發生破裂和裂縫的觀點而言,環氧樹脂,可以是25℃時呈液狀的環氧樹脂(液狀環氧樹脂)。作為液狀環氧樹脂,可列舉:雙酚A型環氧丙基醚、雙酚AD型環氧丙基醚、雙酚S型環氧丙基醚、雙酚F型環氧丙基醚、氫化雙酚A型環氧丙基醚、氧化乙烯加成物雙酚A型環氧丙基醚、氧化丙烯加成物雙酚A型環氧丙基醚、萘樹脂的環氧丙基醚、3官能型或4官能型環氧丙基胺等。The epoxy resin may be a liquid epoxy resin (liquid epoxy resin) at 25° C. from the viewpoint of easily suppressing the occurrence of cracks and cracks on the surface of the film. Examples of liquid epoxy resins include bisphenol A type glycidyl ether, bisphenol AD type glycidyl ether, bisphenol S type glycidyl ether, bisphenol F type glycidyl ether, Hydrogenated bisphenol A glycidyl ether, ethylene oxide adduct bisphenol A glycidyl ether, propylene oxide adduct bisphenol A glycidyl ether, glycidyl ether of naphthalene resin, 3-functional or 4-functional glycidylamine, etc.

作為市售的環氧樹脂,可列舉例如:三菱化學股份有限公司製造的商品名「jER825」(雙酚A型環氧樹脂,環氧基當量:175g/eq.)、三菱化學股份有限公司製造的商品名「jER806」(雙酚F型環氧樹脂,環氧基當量:160g/eq.)、DIC股份有限公司製造的商品名「HP-4032D」(萘型環氧樹脂,環氧基當量:141g/eq.)、DIC股份有限公司製造的商品名「EXA-4850」等柔軟強韌性環氧樹脂;DIC股份有限公司製造的商品名「HP-4700」(4官能萘型環氧樹脂)、商品名「HP-4750」(3官能萘型環氧樹脂)、商品名「HP-4710」(4官能萘型環氧樹脂)、商品名「EPICLON N-770」(苯酚酚醛清漆型環氧樹脂)、商品名「EPICLON N-660」(甲酚酚醛清漆型環氧樹脂)及商品名「EPICLONHP-7200H」(雙環戊二烯型環氧樹脂);日本化藥股份有限公司製造的商品名「EPPN-502H」(三苯基甲烷型環氧樹脂)和商品名「NC-3000」(聯苯基烷基型環氧樹脂);新日鐵住金化學股份有限公司製造的商品名「ESN-355」(萘型環氧樹脂);三菱化學股份有限公司製造的商品名「YX-8800」(蒽型環氧樹脂)、住友化學股份有限公司製造的商品名「ESCN-190-2」(鄰甲酚酚醛清漆型環氧樹脂)等。這些環氧樹脂,可各自單獨使用,亦可將2種以上組合使用。Examples of commercially available epoxy resins include trade name "jER825" (bisphenol A epoxy resin, epoxy group equivalent: 175 g/eq.) manufactured by Mitsubishi Chemical Corporation, manufactured by Mitsubishi Chemical Corporation, for example. trade name "jER806" (bisphenol F type epoxy resin, epoxy equivalent: 160 g/eq.), trade name "HP-4032D" manufactured by DIC Co., Ltd. (naphthalene type epoxy resin, epoxy equivalent : 141g/eq.), trade name "EXA-4850" manufactured by DIC Co., Ltd., and other soft and tough epoxy resins; trade name "HP-4700" manufactured by DIC Co., Ltd. (tetrafunctional naphthalene type epoxy resin) , trade name "HP-4750" (3-functional naphthalene type epoxy resin), trade name "HP-4710" (tetra-functional naphthalene type epoxy resin), trade name "EPICLON N-770" (phenol novolak type epoxy resin) resin), trade name "EPICLON N-660" (cresol novolak type epoxy resin) and trade name "EPICLONHP-7200H" (dicyclopentadiene type epoxy resin); trade name manufactured by Nippon Kayaku Co., Ltd. "EPPN-502H" (triphenylmethane type epoxy resin) and trade name "NC-3000" (biphenyl alkyl type epoxy resin); trade name "ESN- 355” (naphthalene type epoxy resin); trade name “YX-8800” (anthracene type epoxy resin) manufactured by Mitsubishi Chemical Co., Ltd., trade name “ESCN-190-2” manufactured by Sumitomo Chemical Co., Ltd. cresol novolac epoxy resin), etc. These epoxy resins may be used alone or in combination of two or more.

作為酚樹脂,只要一分子中具有2個以上酚性羥基,能夠無特別限制地使用公知的酚樹脂。作為酚樹脂,可列舉例如:使苯酚類及/或萘酚類與醛類在酸性觸媒下進行縮合或共縮合而獲得之樹脂、聯苯骨架型酚樹脂、對二甲苯改質酚樹脂、間二甲苯/對二甲苯改質酚樹脂、三聚氰胺改質酚樹脂、萜烯改質酚樹脂、雙環戊二烯改質酚樹脂、環戊二烯改質酚樹脂、多環芳香環改質酚樹脂、二甲苯改質萘酚樹脂等。作為酚類,可列舉:苯酚、甲酚、二甲酚、間苯二酚、鄰苯二酚、雙酚A、雙酚F等。作為萘酚類,可列舉:α-萘酚、β-萘酚、二羥基萘等。作為醛類,可列舉:甲醛、乙醛、丙醛、苯甲醛、水楊醛等。As the phenol resin, a known phenol resin can be used without particular limitation as long as it has two or more phenolic hydroxyl groups in one molecule. Examples of phenol resins include resins obtained by condensing or co-condensing phenols and/or naphthols and aldehydes under an acidic catalyst, biphenyl skeleton type phenol resins, p-xylene modified phenol resins, m-xylene/para-xylene modified phenol resin, melamine modified phenol resin, terpene modified phenol resin, dicyclopentadiene modified phenol resin, cyclopentadiene modified phenol resin, polycyclic aromatic ring modified phenol resin, xylene modified naphthol resin, etc. As phenols, phenol, cresol, xylenol, resorcinol, catechol, bisphenol A, bisphenol F, etc. are mentioned. As naphthols, α-naphthol, β-naphthol, dihydroxynaphthalene, etc. are mentioned. As aldehydes, formaldehyde, acetaldehyde, propionaldehyde, benzaldehyde, salicylaldehyde, etc. are mentioned.

作為市售的酚樹脂,可列舉:旭有機材工業股份有限公司製造的商品名「PAPS-PN2」(酚醛清漆型酚樹脂);AIR WATER股份有限公司製造的商品名「SK Resin HE200C-7」(聯苯基烷基型酚樹脂)、商品名「HE910-10」(三苯基甲烷型酚樹脂);明和化成股份有限公司製造的商品名「MEH-7000」、「DL-92」、「H-4」及「HF-1M」;群榮化學工業股份有限公司製造的商品名「LVR-8210DL」、「ELP」系列及「NC」系列、新日鐵住金化學股份有限公司製造的商品名「SN-100、SN-300、SN-395、SN-400」(萘型酚樹脂);以及,日立化成股份有限公司製造的商品名「HP-850N」(酚醛清漆型酚樹脂)等。Commercially available phenol resins include trade name "PAPS-PN2" (novolak-type phenol resin) manufactured by Asahi Organic Materials Co., Ltd.; trade name "SK Resin HE200C-7" manufactured by Air Water Co., Ltd. (biphenyl alkyl type phenol resin), trade name "HE910-10" (triphenylmethane type phenol resin); trade names "MEH-7000", "DL-92", "Meiwa Chemical Co., Ltd. H-4" and "HF-1M"; trade names "LVR-8210DL", "ELP" series and "NC" series manufactured by Qunrong Chemical Industry Co., Ltd., trade names manufactured by Nippon Steel & Sumitomo Metal Chemical Co., Ltd. "SN-100, SN-300, SN-395, SN-400" (naphthalene-type phenol resin); and the trade name "HP-850N" (novolak-type phenol resin) manufactured by Hitachi Chemical Co., Ltd.

從藉由減少樹脂彼此的交聯點來減少硬化收縮,能夠改善翹曲性和破裂性的觀點而言,第2熱硬化性樹脂的反應性官能基當量,可以是100g/eq.以上、120g/eq.以上或140g/eq.以上。從相同的觀點而言,可以是500g/eq.以下、400g/eq.以下或300g/eq.以下。因此,第2熱硬化性樹脂的反應性官能基當量,例如可以是100~500g/eq.,亦可以是120~400g/eq.,亦可以是140~300g/eq.。The reactive functional group equivalent of the second thermosetting resin may be 100 g/eq. or more and 120 g from the viewpoint of reducing the curing shrinkage by reducing the cross-linking points between the resins and improving the warpage and cracking properties. /eq. or more or 140g/eq. or more. From the same viewpoint, it may be 500 g/eq. or less, 400 g/eq. or less, or 300 g/eq. or less. Therefore, the reactive functional group equivalent of the second thermosetting resin may be, for example, 100 to 500 g/eq., 120 to 400 g/eq., or 140 to 300 g/eq.

當第2熱硬化性樹脂包含環氧樹脂時,從包埋性變得更良好的觀點而言,環氧樹脂的含量,以密封用薄膜的總質量作為基準計,可以是1質量%以上,亦可以是3質量%以上,亦可以是5質量%以上。從中空非填充性變得更良好的觀點而言,環氧樹脂的含量,以密封用薄膜的總質量作為基準計,可以是50質量%以下,亦可以是30質量%以下,亦可以是10質量%以下。因此,環氧樹脂的含量,以密封用薄膜的總質量作為基準計,例如可以是1~50質量%,亦可以是3~30質量%以下,亦可以是5~10質量%。When the second thermosetting resin contains an epoxy resin, from the viewpoint of better embedding properties, the content of the epoxy resin may be 1 mass % or more based on the total mass of the sealing film, 3 mass % or more may be sufficient, and 5 mass % or more may be sufficient. The content of epoxy resin may be 50 mass % or less, 30 mass % or less, or 10 mass % based on the total mass of the sealing film, from the viewpoint of making the hollow non-filling property more favorable. mass % or less. Therefore, the content of the epoxy resin may be, for example, 1 to 50 mass %, 3 to 30 mass % or less, or 5 to 10 mass % based on the total mass of the sealing film.

當第2熱硬化性樹脂包含液狀環氧樹脂時,從容易抑制薄膜表面發生破裂和裂縫的觀點而言,液狀環氧樹脂的含量,以密封用薄膜的總質量作為基準計,較佳是0.5質量%以上,更佳是1質量%以上,進一步更佳是3質量%以上,特佳是5質量%以上,極佳是7質量%以上,非常佳是9質量%以上。從容易抑制薄膜的黏性過度提高的觀點、及容易抑制邊緣融合(edge fusion)的觀點而言,液狀環氧樹脂的含量,以密封用薄膜的總質量作為基準計,較佳是20質量%以下,更佳是15質量%以下,進一步更佳是13質量%以下。從這些觀點而言,液狀環氧樹脂的含量,以密封用薄膜的總質量作為基準計,較佳是0.5~20質量%,更佳是1~20質量%,進一步更佳是3~20質量%,特佳是5~20質量%,極佳是7~15質量%,非常佳是9~13質量%。When the second thermosetting resin contains a liquid epoxy resin, the content of the liquid epoxy resin is preferably based on the total mass of the sealing film from the viewpoint of easily suppressing cracks and cracks on the surface of the film. It is 0.5 mass % or more, more preferably 1 mass % or more, still more preferably 3 mass % or more, particularly preferably 5 mass % or more, very preferably 7 mass % or more, and very preferably 9 mass % or more. The content of the liquid epoxy resin is preferably 20 mass based on the total mass of the sealing film from the viewpoint of easily suppressing an excessive increase in the viscosity of the film and easily suppressing edge fusion. % or less, more preferably 15 mass % or less, still more preferably 13 mass % or less. From these viewpoints, the content of the liquid epoxy resin is preferably 0.5 to 20 mass %, more preferably 1 to 20 mass %, and still more preferably 3 to 20 mass % based on the total mass of the sealing film. The mass % is particularly preferably 5 to 20 mass %, extremely preferably 7 to 15 mass %, and very preferably 9 to 13 mass %.

從容易抑制薄膜表面發生破裂和裂縫的觀點而言,液狀環氧樹脂的含量,以第2熱硬化性樹脂的總質量作為基準計,較佳是20質量%以上,更佳是30質量%以上,進一步更佳是50質量%以上。從容易抑制薄膜的黏性過度提高的觀點、及容易抑制邊緣融合的觀點而言,液狀環氧樹脂的含量,以第2熱硬化性樹脂的總質量作為基準計,較佳是95質量%以下,更佳是90質量%以下,進一步更佳是80質量%以下。從這些觀點而言,液狀環氧樹脂的含量,以第2熱硬化性樹脂的總質量作為基準計,較佳是20~95質量%,更佳是30~90質量%,進一步更佳是50~80質量%。液狀環氧樹脂的含量,以第2熱硬化性樹脂的總質量作為基準計,亦可以是100質量%。The content of the liquid epoxy resin is preferably 20% by mass or more, more preferably 30% by mass, based on the total mass of the second thermosetting resin, from the viewpoint of easily suppressing the occurrence of cracks and cracks on the surface of the film. The above, more preferably 50 mass % or more. The content of the liquid epoxy resin is preferably 95% by mass based on the total mass of the second thermosetting resin from the viewpoint of easily suppressing an excessive increase in the viscosity of the film and from the viewpoint of easily suppressing edge fusion. Below, it is more preferable that it is 90 mass % or less, and it is still more preferable that it is 80 mass % or less. From these viewpoints, the content of the liquid epoxy resin is preferably 20 to 95% by mass, more preferably 30 to 90% by mass, and even more preferably 20 to 95% by mass based on the total mass of the second thermosetting resin. 50 to 80 mass %. The content of the liquid epoxy resin may be 100% by mass based on the total mass of the second thermosetting resin.

當第2熱硬化性樹脂包含酚樹脂時,從包埋性變得更良好的觀點而言,酚樹脂的含量,以密封用薄膜的總質量作為基準計,可以是1質量%以上,亦可以是3質量%以上,亦可以是5質量%以上。從中空非填充性變得更良好的觀點而言,酚樹脂的含量,以密封用薄膜的總質量作為基準計,可以是50質量%以下,亦可以是30質量%以下,亦可以是10質量%以下。因此,酚樹脂的含量,以密封用薄膜的總質量作為基準計,例如可以是1~50質量%,亦可以是3~30質量%,亦可以是5~10質量%。When the second thermosetting resin contains a phenol resin, from the viewpoint of better embedding properties, the content of the phenol resin may be 1 mass % or more based on the total mass of the sealing film, or may be It is 3 mass % or more, and may be 5 mass % or more. From the viewpoint of making the hollow non-filling property more favorable, the content of the phenol resin may be 50 mass % or less, 30 mass % or less, or 10 mass % based on the total mass of the sealing film. %the following. Therefore, the content of the phenol resin may be, for example, 1 to 50 mass %, 3 to 30 mass %, or 5 to 10 mass % based on the total mass of the sealing film.

本實施形態中,從能夠以更高水準來兼具對於被密封體的包埋性與中空非填充性的觀點而言,較佳是熱硬化成分包含環氧樹脂和酚樹脂,較佳是第1熱硬化性樹脂包含酚樹脂並且第2熱硬化性樹脂包含環氧樹脂。此時,樹脂組成物中包含的全部環氧樹脂的含量和酚樹脂的含量,能夠以樹脂組成物中的環氧基的莫耳數M2相對於酚性羥基的莫耳數M1的比值作為基準來設定。In this embodiment, it is preferable that the thermosetting component contains an epoxy resin and a phenol resin, and the second 1 thermosetting resin contains phenol resin and 2nd thermosetting resin contains epoxy resin. At this time, the content of all epoxy resins and the content of phenol resin contained in the resin composition can be based on the ratio of the molar number M2 of epoxy groups to the molar number M1 of phenolic hydroxyl groups in the resin composition to set.

樹脂組成物中的環氧基的莫耳數M2相對於酚性羥基的莫耳數M1的比值(M2/M1),可以是0.7以上、0.8以上或0.9以上,並且,可以是2.0以下、1.8以下或1.7以下。因此,比值(M2/M1),例如可以是0.7~2.0,亦可以是0.8~1.8,亦可以是0.9~1.7。The ratio (M2/M1) of the molar number M2 of the epoxy group in the resin composition to the molar number M1 of the phenolic hydroxyl group may be 0.7 or more, 0.8 or more, or 0.9 or more, and may be 2.0 or less and 1.8 below or below 1.7. Therefore, the ratio (M2/M1) may be, for example, 0.7 to 2.0, 0.8 to 1.8, or 0.9 to 1.7.

[硬化劑] 作為硬化劑(符合熱硬化性樹脂的成分除外),並無特別限定,可列舉:酚系硬化劑、酸酐系硬化劑、活性酯系硬化劑、氰酸酯系硬化劑等。硬化劑,可使用單獨1種,亦可將2種以上併用。[Curing agent] Although it does not specifically limit as a curing agent (except a component which corresponds to a thermosetting resin), A phenol type curing agent, an acid anhydride type curing agent, an active ester type curing agent, a cyanate ester type curing agent, etc. are mentioned. A hardener may be used individually by 1 type, and may use 2 or more types together.

從熱硬化性樹脂的硬化性優異的觀點而言,硬化劑的含量,以密封用薄膜的總質量作為基準計,可以是1~20質量%,亦可以是2~15質量%,亦可以是3~10質量%。From the viewpoint of excellent curability of the thermosetting resin, the content of the curing agent may be 1 to 20% by mass, 2 to 15% by mass, or 2 to 15% by mass based on the total mass of the sealing film. 3 to 10 mass %.

[硬化促進劑] 作為硬化促進劑,能夠無特別限制地使用,較佳是選自由胺系硬化促進劑和磷系硬化促進劑所組成之群組中的至少一種。尤其是從容易獲得具有優異熱導率的硬化物的觀點、衍生物豐富的觀點、及容易獲得期望的活性溫度的觀點而言,作為硬化促進劑,較佳是胺系硬化促進劑,更佳是選自由咪唑化合物、脂肪族胺及脂環族胺所組成之群組中的至少一種,進一步更佳是咪唑化合物。作為咪唑化合物,可列舉:2-苯基-4-甲基咪唑、1-苯甲基-2-甲基咪唑等。硬化促進劑,可使用單獨1種,亦可將2種以上併用。作為硬化促進劑的市售品,可列舉四國化成工業股份有限公司製造的「2P4MZ」和「1B2MZ」等。[Hardening Accelerator] As the curing accelerator, it can be used without particular limitation, and is preferably at least one selected from the group consisting of an amine-based curing accelerator and a phosphorus-based curing accelerator. In particular, the hardening accelerator is preferably an amine-based hardening accelerator, more preferably from the viewpoint of easily obtaining a cured product having excellent thermal conductivity, from the viewpoint of abundant derivatives, and from the viewpoint of being easy to obtain a desired activation temperature. is at least one selected from the group consisting of imidazole compounds, aliphatic amines and alicyclic amines, and more preferably imidazole compounds. As an imidazole compound, 2-phenyl-4-methylimidazole, 1-benzyl-2-methylimidazole, etc. are mentioned. A hardening accelerator may be used individually by 1 type, and may use 2 or more types together. As a commercial item of a hardening accelerator, "2P4MZ" and "1B2MZ" by Shikoku Chemical Industry Co., Ltd., etc. are mentioned.

硬化促進劑的含量,以熱硬化性樹脂的合計量作為基準計,較佳是下述範圍。從容易獲得充分的硬化促進效果的觀點而言,硬化促進劑的含量,較佳是0.01質量%以上,更佳是0.1質量%以上,進一步更佳是0.3質量%以上。從在製造密封用薄膜時的步驟(例如塗佈和乾燥)中或密封用薄膜的保管中硬化不易進展,從而容易防止密封用薄膜破裂及由於熔融黏度上升所引起的成形不良的觀點而言,硬化促進劑的含量,較佳是5質量%以下,更佳是3質量%以下,進一步更佳是1.5質量%以下。從這些觀點而言,硬化促進劑的含量,較佳是0.01~5質量%,更佳是0.1~3質量%,進一步更佳是0.3~1.5質量%。The content of the curing accelerator is preferably in the following range based on the total amount of the thermosetting resin. From the viewpoint of easily obtaining a sufficient hardening acceleration effect, the content of the hardening accelerator is preferably 0.01 mass % or more, more preferably 0.1 mass % or more, and further more preferably 0.3 mass % or more. From the viewpoints that curing does not progress easily in the steps of manufacturing the sealing film (such as coating and drying) or during storage of the sealing film, and it is easy to prevent cracking of the sealing film and forming defects due to an increase in melt viscosity, The content of the hardening accelerator is preferably 5% by mass or less, more preferably 3% by mass or less, and still more preferably 1.5% by mass or less. From these viewpoints, the content of the hardening accelerator is preferably 0.01 to 5 mass %, more preferably 0.1 to 3 mass %, and still more preferably 0.3 to 1.5 mass %.

(無機填充材料) 作為無機填充材料,能夠使用以往公知的無機填充材料,並無特別限定。作為無機填充材料的構成材料,可列舉:二氧化矽類(非晶二氧化矽、結晶性二氧化矽、熔融二氧化矽、球狀二氧化矽、合成二氧化矽、中空二氧化矽等)、硫酸鋇、鈦酸鋇、滑石、黏土、雲母粉、碳酸鎂、碳酸鈣、氧化鋁(alumina)、氫氧化鋁、氧化鎂、氫氧化鎂、氮化矽、氮化鋁、硼酸鋁、氮化硼、鈦酸鋇、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、鋯酸鋇、鋯酸鈣等。從容易利用表面改質(例如利用矽烷化合物來進行的表面處理)等來獲得提升在樹脂組成物中的分散性的效果、及抑制在清漆中沉澱的效果的觀點、以及容易獲得期望的硬化膜特性以具有較小的熱膨脹係數的觀點而言,較佳是包含二氧化矽類之無機填充材料。從獲得高熱傳導性的觀點而言,較佳是包含氧化鋁之無機填充材料。無機填充材料,可使用單獨1種,亦可將2種以上併用。(Inorganic Filler) As the inorganic filler, conventionally known inorganic fillers can be used, and are not particularly limited. Examples of the constituent material of the inorganic filler include silicas (amorphous silica, crystalline silica, fused silica, spherical silica, synthetic silica, hollow silica, etc.) , barium sulfate, barium titanate, talc, clay, mica powder, magnesium carbonate, calcium carbonate, aluminum oxide (alumina), aluminum hydroxide, magnesium oxide, magnesium hydroxide, silicon nitride, aluminum nitride, aluminum borate, nitrogen Boronide, barium titanate, strontium titanate, calcium titanate, magnesium titanate, bismuth titanate, titanium oxide, barium zirconate, calcium zirconate, etc. From the viewpoints that the effect of improving the dispersibility in the resin composition and the effect of suppressing the precipitation in the varnish are easily obtained by surface modification (for example, surface treatment with a silane compound), etc., and the desired cured film is easily obtained Characteristics From the viewpoint of having a small thermal expansion coefficient, it is preferable to include an inorganic filler such as silica. From the viewpoint of obtaining high thermal conductivity, an inorganic filler containing alumina is preferred. The inorganic filler may be used alone or in combination of two or more.

可對無機填充材料進行表面改質。表面改質的方法,並無特別限定。從處理簡便、官能基種類豐富且容易賦予期望的特性的觀點而言,較佳是使用矽烷偶合劑來進行的表面改質。Surface modification of inorganic filler materials is possible. The method of surface modification is not specifically limited. Surface modification using a silane coupling agent is preferable from the viewpoints of easy handling, abundant functional groups, and easy imparting of desired properties.

作為矽烷偶合劑,可列舉:烷基矽烷、烷氧基矽烷、乙烯基矽烷、環氧基矽烷、胺基矽烷、丙烯醯基矽烷、甲基丙烯醯基矽烷、巰基矽烷、硫醚矽烷、異氰酸基矽烷、硫矽烷、苯乙烯基矽烷、烷基氯矽烷等。Examples of the silane coupling agent include alkyl silane, alkoxy silane, vinyl silane, epoxy silane, amino silane, acryl silane, methacryloyl silane, mercapto silane, thioether silane, isopropyl silane Cyanate silane, sulfur silane, styryl silane, alkyl chlorosilane, etc.

作為矽烷偶合劑的具體例,可列舉:甲基三甲氧基矽烷、二甲基二甲氧基矽烷、三甲基甲氧基矽烷、甲基三乙氧基矽烷、甲基三苯氧基矽烷、乙基三甲氧基矽烷、正丙基三甲氧基矽烷、二異丙基二甲氧基矽烷、異丁基三甲氧基矽烷、二異丁基二甲氧基矽烷、異丁基三乙氧基矽烷、正己基三甲氧基矽烷、正己基三乙氧基矽烷、環己基甲基二甲氧基矽烷、正辛基三乙氧基矽烷、正癸基甲氧基矽烷、苯基三甲氧基矽烷、二苯基二甲氧基矽烷、三苯基矽烷醇、甲基三氯矽烷、二甲基二氯矽烷、三甲基氯矽烷、正辛基二甲基氯矽烷、四乙氧基矽烷、3-胺基丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-(2-胺基乙基)胺基丙基三甲氧基矽烷、3-(2-胺基乙基)胺基丙基甲基二甲氧基矽烷、3-苯基胺基丙基三甲氧基矽烷、3-環氧丙氧基丙基三甲氧基矽烷、3-環氧丙氧基丙基甲基二甲氧基矽烷、3-環氧丙氧基丙基三乙氧基矽烷、3-環氧丙氧基丙基甲基二乙氧基矽烷、二硫化雙(3-(三乙氧基矽基)丙基)、四硫化雙(3-(三乙氧基矽基)丙基)、乙烯基三乙醯氧基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙氧基矽烷、乙烯基三異丙氧基矽烷、烯丙基三甲氧基矽烷、二烯丙基二甲基矽烷、3-甲基丙醯氧基丙基三甲氧基矽烷、3-甲基丙醯氧基丙基甲基二甲氧基矽烷、3-甲基丙醯氧基丙基三乙氧基矽烷、3-巰基丙基三甲氧基矽烷、3-巰基丙基甲基二甲氧基矽烷、3-巰基丙基三乙氧基矽烷、N-(1,3-二甲基亞丁基)-3-胺基丙基三乙氧基矽烷、胺基矽烷(苯基胺基矽烷等)等。矽烷偶合劑,可使用單獨1種,亦可將2種以上併用。Specific examples of the silane coupling agent include methyltrimethoxysilane, dimethyldimethoxysilane, trimethylmethoxysilane, methyltriethoxysilane, and methyltriphenoxysilane , ethyltrimethoxysilane, n-propyltrimethoxysilane, diisopropyldimethoxysilane, isobutyltrimethoxysilane, diisobutyldimethoxysilane, isobutyltriethoxy Silane, n-hexyltrimethoxysilane, n-hexyltriethoxysilane, cyclohexylmethyldimethoxysilane, n-octyltriethoxysilane, n-decylmethoxysilane, phenyltrimethoxysilane Silane, diphenyldimethoxysilane, triphenylsilanol, methyltrichlorosilane, dimethyldichlorosilane, trimethylchlorosilane, n-octyldimethylchlorosilane, tetraethoxysilane , 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-(2-aminoethyl)aminopropyltrimethoxysilane, 3-(2-aminopropyltrimethoxysilane Ethyl)aminopropylmethyldimethoxysilane, 3-phenylaminopropyltrimethoxysilane, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropyl Dimethoxysilane, 3-glycidoxypropyltriethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, bis(3-(triethyl)disulfide oxysilyl)propyl), bis(3-(triethoxysilyl)propyl) tetrasulfide, vinyltriacetoxysilane, vinyltrimethoxysilane, vinyltriethoxysilane , vinyltriisopropoxysilane, allyltrimethoxysilane, diallyldimethylsilane, 3-methylpropoxypropyltrimethoxysilane, 3-methylpropoxysilane Propylmethyldimethoxysilane, 3-Methylpropionyloxypropyltriethoxysilane, 3-mercaptopropyltrimethoxysilane, 3-mercaptopropylmethyldimethoxysilane, 3 -Mercaptopropyltriethoxysilane, N-(1,3-dimethylbutylene)-3-aminopropyltriethoxysilane, aminosilane (phenylaminosilane, etc.), etc. A silane coupling agent may be used individually by 1 type, and may use 2 or more types together.

從容易抑制無機填充材料凝集,從而容易分散無機填充材料的觀點而言,無機填充材料的平均粒徑,較佳是0.01μm以上,更佳是0.1μm以上,進一步更佳是0.3μm以上,特佳是0.5μm以上。從容易抑制無機填充材料在清漆中沉澱的情形,從而容易製作均質的密封用薄膜的觀點而言,無機填充材料的平均粒徑,較佳是25μm以下,更佳是10μm以下,進一步更佳是5μm以下。從這些觀點而言,無機填充材料的平均粒徑,較佳是0.01~25μm,更佳是0.01~10μm,進一步更佳是0.1~10μm,特佳是0.3~5μm,極佳是0.5~5μm。無機填充材料的平均粒徑,亦可以是10~18μm。The average particle size of the inorganic filler is preferably 0.01 μm or more, more preferably 0.1 μm or more, still more preferably 0.3 μm or more, from the viewpoint of easily suppressing aggregation of the inorganic filler and easily dispersing the inorganic filler. Preferably, it is 0.5 μm or more. The average particle size of the inorganic filler is preferably 25 μm or less, more preferably 10 μm or less, and even more preferably 25 μm or less, from the viewpoint of easily suppressing precipitation of the inorganic filler in the varnish, thereby facilitating the production of a homogeneous sealing film. 5μm or less. From these viewpoints, the average particle diameter of the inorganic filler is preferably 0.01 to 25 μm, more preferably 0.01 to 10 μm, still more preferably 0.1 to 10 μm, particularly preferably 0.3 to 5 μm, and most preferably 0.5 to 5 μm. The average particle diameter of the inorganic filler may be 10 to 18 μm.

從樹脂組成物的流動性優異的觀點而言,較佳是將具有相互不同平均粒徑的複數種無機填充材料組合使用。無機填充材料的組合中,較佳是下述組合:具有最大平均粒徑的無機填充材料的平均粒徑為15~25μm。較佳是將平均粒徑為15~25μm的無機填充材料、平均粒徑為0.5~2.5μm的無機填充材料及平均粒徑為0.1~1.0μm的無機填充材料組合使用。From the viewpoint of excellent fluidity of the resin composition, it is preferable to use a combination of a plurality of inorganic fillers having mutually different average particle diameters. Among the combinations of inorganic fillers, those in which the average particle diameter of the inorganic filler having the largest average particle diameter is 15 to 25 μm are preferred. Preferably, an inorganic filler having an average particle diameter of 15 to 25 μm, an inorganic filler having an average particle diameter of 0.5 to 2.5 μm, and an inorganic filler having an average particle diameter of 0.1 to 1.0 μm are used in combination.

「平均粒徑」,是指將粒子的總體積設為100%並求出基於粒徑的累積次數分佈曲線(cumulative frequency distribution curve)時相當於體積50%的點的粒徑,並且能夠利用粒度分佈測定裝置來測定,該粒度分佈測定裝置使用了雷射繞射散射法。組合後的各無機填充材料的平均粒徑,能夠由混合時的各無機填充材料的平均粒徑來進行確認,並且能夠藉由測定粒度分佈來進行確認。"Average particle size" refers to the particle size at a point corresponding to 50% of the volume when the cumulative frequency distribution curve based on the particle size is obtained by taking the total volume of the particles as 100%, and the particle size can be used The particle size distribution measurement apparatus used the laser diffraction scattering method. The average particle diameter of each inorganic filler after the combination can be confirmed from the average particle diameter of each inorganic filler at the time of mixing, and can be confirmed by measuring the particle size distribution.

作為無機填充材料的市售品,可列舉:Denka股份有限公司製造的「DAW20」;Admatechs股份有限公司製造的商品名「SC550O-SXE」和「SC2050-KC」等。As a commercial item of an inorganic filler, "DAW20" by Denka Co., Ltd.; "SC550O-SXE" and "SC2050-KC" by Admatechs Co., Ltd. are mentioned.

從提升熱導率的觀點、及容易抑制因與被密封體的熱膨脹係數的差異而導致密封結構體(例如半導體裝置等電子零件裝置)的翹曲變大的情形的觀點而言,無機填充材料的含量,以密封用薄膜的總質量作為基準計,可以是70質量%以上,亦可以是75質量%以上,亦可以是80質量%以上,亦可以是84質量%以上。從在製作密封用薄膜時的乾燥步驟中容易抑制密封用薄膜破裂的觀點、及抑制因密封用薄膜的熔融黏度上升導致流動性下降而容易對被密封體(電子零件等)充分進行密封的觀點而言,無機填充材料的含量,以密封用薄膜的總質量作為基準計,可以是93質量%以下,亦可以是91質量%以下,亦可以是88質量%以下。從這些觀點而言,無機填充材料的含量,以密封用薄膜的總質量作為基準計,可以是70~93質量%,亦可以是75~91質量%,亦可以是80~91質量%,亦可以是84~91質量%,亦可以是84~88質量%。再者,上述含量,是表面處理劑的量除外後的無機填充材料的含量。From the viewpoint of improving thermal conductivity and from the viewpoint of easily suppressing the increase in warpage of the sealing structure (for example, electronic component devices such as semiconductor devices) due to the difference in thermal expansion coefficient with the body to be sealed, inorganic fillers The content may be 70 mass % or more, 75 mass % or more, 80 mass % or more, or 84 mass % or more based on the total mass of the sealing film. From the viewpoint of easily suppressing the cracking of the sealing film in the drying step when the sealing film is produced, and from the viewpoint of suppressing the decrease in fluidity due to the increase in the melt viscosity of the sealing film, and the ease of fully sealing the to-be-sealed body (electronic parts, etc.) In other words, the content of the inorganic filler may be 93% by mass or less, 91% by mass or less, or 88% by mass or less, based on the total mass of the sealing film. From these viewpoints, the content of the inorganic filler may be 70 to 93% by mass, 75 to 91% by mass, 80 to 91% by mass, or 80 to 91% by mass based on the total mass of the sealing film. 84-91 mass % may be sufficient, and 84-88 mass % may be sufficient. In addition, the said content is content of the inorganic filler excluding the quantity of a surface treatment agent.

(彈性體) 本實施形態的密封用薄膜,可根據需要而含有彈性體(軟化劑(flexibilizer))。從分散性和溶解性優異的觀點而言,彈性體,較佳是使用選自由聚丁二烯粒子、苯乙烯丁二烯粒子、丙烯酸系彈性體、聚矽氧粉末、矽氧油及矽氧低聚物所組成之群組中的至少一種。彈性體,可使用單獨1種,亦可將2種以上併用。(Elastomer) The sealing film of the present embodiment may contain an elastomer (flexibilizer) as needed. From the viewpoint of being excellent in dispersibility and solubility, the elastomer is preferably selected from the group consisting of polybutadiene particles, styrene butadiene particles, acrylic elastomers, polysiloxane powder, silicone oil, and silicone At least one of the group consisting of oligomers. Elastomers may be used alone or in combination of two or more.

當彈性體為粒子狀時,彈性體的平均粒徑並無特別限制。在嵌入式晶圓級球柵陣列(Embedded Wafer-Level Ball Grid Array,eWLB)用途中,由於需要將半導體元件間包埋,因此當將密封用薄膜用於eWLB用途時,彈性體的平均粒徑,較佳是50μm以下。從彈性體的分散性優異的觀點而言,彈性體的平均粒徑,較佳是0.1μm以上。When the elastomer is in the form of particles, the average particle diameter of the elastomer is not particularly limited. In Embedded Wafer-Level Ball Grid Array (eWLB) applications, since it is necessary to embed semiconductor elements, when the sealing film is used for eWLB applications, the average particle size of the elastomer , preferably 50 μm or less. From the viewpoint of excellent dispersibility of the elastomer, the average particle diameter of the elastomer is preferably 0.1 μm or more.

作為彈性體的市售品,可列舉Nagase ChemteX股份有限公司製造的丙烯酸系彈性體也就是「SG-280 EK23」、「SG-70L」、「WS-023 EK30」等。又,市售的彈性體成分中,存在預先分散於液狀樹脂(例如液狀環氧樹脂)中的彈性體成分,而非單獨的彈性體,能夠毫無問題地使用。作為這種市售品,可列舉KANEKA股份有限公司製造的「MX-136」和「MX-965」等。As a commercial item of an elastomer, "SG-280 EK23", "SG-70L", "WS-023 EK30" etc. which are acrylic elastomers by Nagase ChemteX Co., Ltd. are mentioned. In addition, among commercially available elastomer components, there are elastomer components dispersed in liquid resins (eg, liquid epoxy resins) in advance, but not the elastomers alone, and can be used without problems. As such a commercial item, "MX-136" and "MX-965" by KANEKA Co., Ltd., etc. are mentioned.

從中空非填充性變得更良好的觀點而言,彈性體的含量,以熱硬化性成分與彈性體的合計量作為基準計,可以是1質量%以上,亦可以是5質量%以上,亦可以是10質量%以上。從包埋性變得更良好的觀點、及硬化後容易獲得充分的Tg且容易提升密封結構體的可靠性(熱可靠性)的觀點而言,彈性體的含量,以熱硬化性成分與彈性體的合計量作為基準計,可以是30質量%以下,亦可以是25質量%以下,亦可以是20質量%以下。從以上觀點而言,彈性體的含量,以熱硬化性成分與彈性體的合計量作為基準計,可以是1~30質量%,亦可以是5~25質量%,亦可以是10~20質量%以下。From the viewpoint of making the hollow non-filling property more favorable, the content of the elastomer may be 1 mass % or more, 5 mass % or more, based on the total amount of the thermosetting component and the elastomer. It may be 10 mass % or more. From the viewpoint of better embedding properties, and from the viewpoint of easily obtaining a sufficient Tg after hardening and improving the reliability (thermal reliability) of the sealing structure, the content of the elastomer is based on the thermosetting component and elasticity. The total amount of bodies may be 30 mass % or less, 25 mass % or less, or 20 mass % or less as a reference. From the above viewpoints, the content of the elastomer may be 1 to 30% by mass, 5 to 25% by mass, or 10 to 20% by mass based on the total amount of the thermosetting component and the elastomer. %the following.

(其他成分) 本實施形態的密封用薄膜,能夠進一步含有其他添加劑。作為這種添加劑的具體例,可列舉:顔料、染料、脫模劑、抗氧化劑、表面張力調整劑等。(Other components) The sealing film of the present embodiment may further contain other additives. Specific examples of such additives include pigments, dyes, mold release agents, antioxidants, surface tension modifiers, and the like.

又,本實施形態的密封用薄膜,可含有溶劑(例如製造密封用薄膜時所使用的溶劑)。作為溶劑,可以是以往公知的有機溶劑。作為有機溶劑,可以是能夠將無機填充材料以外的成分溶解的溶劑,可列舉:脂肪族烴類、芳香族烴類、萜烯(terpene)類、鹵素類、酯類、酮類、醇類、醛類等。溶劑,可以使用單獨1種,亦可以將2種以上併用。Moreover, the film for sealing of this embodiment may contain a solvent (for example, the solvent used when manufacturing the film for sealing). As the solvent, a conventionally known organic solvent may be used. The organic solvent may be a solvent capable of dissolving components other than the inorganic filler, and examples thereof include aliphatic hydrocarbons, aromatic hydrocarbons, terpenes, halogens, esters, ketones, alcohols, Aldehydes, etc. A solvent may be used individually by 1 type, and may use 2 or more types together.

從環境負荷小的觀點、及容易溶解熱硬化性成分的觀點而言,作為溶劑,可以是選自由酯類、酮類及醇類所組成之群組中的至少一種。其中,當溶劑為酮類時,特別容易溶解熱硬化性成分。從室溫(25℃)時揮發的情形少且在乾燥時容易去除的觀點而言,作為溶劑,可以是選自由丙酮、甲基乙基酮及甲基異丁酮所組成之群組中的至少一種。The solvent may be at least one selected from the group consisting of esters, ketones, and alcohols, from the viewpoint of a small environmental load and the ease of dissolving the thermosetting component. Among them, when the solvent is a ketone, it is particularly easy to dissolve the thermosetting component. The solvent may be selected from the group consisting of acetone, methyl ethyl ketone, and methyl isobutyl ketone from the viewpoint of less volatilization at room temperature (25° C.) and easy removal during drying. at least one.

密封用薄膜中包含的溶劑(有機溶劑等)的含量,以密封用薄膜的總質量作為基準計,較佳是在下述範圍內。從容易抑制密封用薄膜變脆而發生密封用薄膜破裂等不良狀況的情形及最低熔融黏度變高而包埋性下降的情形的觀點而言,溶劑的含量,可以是0.2質量%以上,亦可以是0.3質量%以上,亦可以是0.5質量%以上,亦可以是0.6質量%以上,亦可以是0.7質量%以上。從容易抑制密封用薄膜的黏合性變過強而操作性下降的不良狀況及在密封用薄膜熱硬化時伴隨溶劑(有機溶劑等)揮發而引起發泡等不良狀況的觀點而言,溶劑的含量,可以是1.5質量%以下,亦可以是1質量%以下。從這些觀點而言,溶劑的含量,可以是0.2~1.5質量%,亦可以是0.3~1質量%,亦可以是0.5~1質量%,亦可以是0.6~1質量%,亦可以是0.7~1質量%。The content of the solvent (organic solvent, etc.) contained in the film for sealing is preferably within the following range based on the total mass of the film for sealing. The content of the solvent may be 0.2 mass % or more from the viewpoint of easily suppressing the occurrence of defects such as cracking of the sealing film due to brittleness, and the case where the minimum melt viscosity is increased and the embedding property is lowered. It may be 0.3 mass % or more, 0.5 mass % or more, 0.6 mass % or more, or 0.7 mass % or more. From the viewpoint of easily suppressing the problems that the adhesiveness of the sealing film becomes too strong and the workability is lowered, and the problems such as foaming caused by the volatilization of the solvent (organic solvent, etc.) during the thermal curing of the sealing film, the content of the solvent , may be 1.5 mass % or less, or 1 mass % or less. From these viewpoints, the content of the solvent may be 0.2 to 1.5 mass %, 0.3 to 1 mass %, 0.5 to 1 mass %, 0.6 to 1 mass %, or 0.7 to 0.7 mass %. 1 mass %.

從在塗佈時容易抑制面內的厚度的偏差的觀點而言,密封用薄膜的厚度,可以是20μm以上,亦可以是30μm以上,亦可以是50μm以上,亦可以是100μm以上。從在塗佈時容易在深度方向上獲得一定的乾燥性的觀點而言,密封用薄膜的厚度,可以是250μm以下,亦可以是200μm以下,亦可以是150μm以下。從這些觀點而言,密封用薄膜的厚度,可以是20~250μm,亦可以是30~250μm,亦可以是50~200μm,亦可以是100~150μm。又,亦能夠積層複數片的密封用薄膜的厚度,來製造厚度超過250μm的密封用薄膜。The thickness of the sealing film may be 20 μm or more, 30 μm or more, 50 μm or more, or 100 μm or more, from the viewpoint of easily suppressing in-plane thickness variation during coating. The thickness of the film for sealing may be 250 μm or less, 200 μm or less, or 150 μm or less, from the viewpoint of easily obtaining constant drying properties in the depth direction during coating. From these viewpoints, the thickness of the film for sealing may be 20 to 250 μm, 30 to 250 μm, 50 to 200 μm, or 100 to 150 μm. Moreover, the thickness of the film for sealing of a plurality of sheets can also be laminated|stacked, and the film for sealing with a thickness exceeding 250 micrometers can also be manufactured.

從所獲得的密封結構體的可靠性(熱可靠性)的觀點而言,密封用薄膜硬化後的玻璃轉化溫度Tg,可以是80~180℃,亦可以是80~165℃,亦可以是80~150℃。密封用薄膜硬化後的玻璃轉化溫度Tg,能夠利用熱硬化性成分的種類和含量、彈性體成分的種類和含量等,來進行調整。玻璃轉化溫度Tg,能夠利用實施例所記載的方法來進行測定。From the viewpoint of reliability (thermal reliability) of the obtained sealing structure, the glass transition temperature Tg after curing of the film for sealing may be 80 to 180° C., 80 to 165° C., or 80° C. ~150°C. The glass transition temperature Tg after curing of the film for sealing can be adjusted by the type and content of the thermosetting component, the type and content of the elastomer component, and the like. The glass transition temperature Tg can be measured by the method described in the examples.

從包埋性變得更良好的觀點而言,密封用薄膜在35~200℃時的熔融黏度的最低值(最低熔融黏度),可以是100~10000Pa・s,亦可以是250~8500Pa・s,亦可以是500~7000Pa・s。從中空非填充性變得更良好的觀點而言,密封用薄膜在70~90℃時的熔融黏度的最大值(最大熔融黏度),可以是500~25000Pa・s,亦可以是4000~20000Pa・s,亦可以是6000~15000Pa・s。上述最低熔融黏度和最大熔融黏度,能夠藉由下述方式來求得:利用實施所記載的方法,來測量密封用薄膜的熔融黏度。From the viewpoint of better embedding properties, the minimum value (minimum melt viscosity) of the melt viscosity of the film for sealing at 35 to 200°C may be 100 to 10000 Pa・s or 250 to 8500 Pa・s , or 500 to 7000Pa・s. From the viewpoint of better non-filling properties in the hollow, the maximum value (maximum melt viscosity) of the melt viscosity of the sealing film at 70 to 90°C may be 500 to 25000Pa・s or 4000 to 20000Pa・s s, may be 6000 to 15000Pa・s. The said minimum melt viscosity and the maximum melt viscosity can be calculated|required by carrying out the method described, and measuring the melt viscosity of the film for sealing.

如上所述,本實施形態的密封用薄膜,能夠適合用於對中空結構體中的被密封體進行密封,但作為密封對象的結構體可以不具有中空結構。本實施形態的密封用薄膜,亦能夠用於例如半導體器件的密封、配置於印刷線路板上的電子零件的包埋等。As described above, the sealing film of the present embodiment can be suitably used for sealing the body to be sealed in the hollow structure, but the structure to be sealed does not need to have a hollow structure. The sealing film of the present embodiment can also be used for, for example, sealing of semiconductor devices, embedding of electronic components arranged on printed wiring boards, and the like.

本實施形態的密封用薄膜,亦能夠製成例如附有支撐體之密封用薄膜來使用。第1圖所示的附有支撐體之密封用薄膜10,具備支撐體1、及設置於支撐體1上的密封用薄膜2。The sealing film of the present embodiment can also be used as, for example, a support-attached sealing film. The supporting body-attached sealing film 10 shown in FIG. 1 includes a supporting body 1 and a sealing film 2 provided on the supporting body 1 .

作為支撐體1,能夠使用高分子薄膜、金屬箔等。作為高分子薄膜,可列舉:聚乙烯薄膜、聚丙烯薄膜等聚烯烴薄膜;聚氯乙烯薄膜等乙烯系薄膜;聚對苯二甲酸乙二酯薄膜等聚酯薄膜;聚碳酸酯薄膜;乙酸纖維素薄膜;四氟乙烯薄膜等。作為金屬箔,可列舉銅箔、鋁箔等。As the support 1, a polymer film, a metal foil, or the like can be used. Examples of polymer films include: polyolefin films such as polyethylene films and polypropylene films; vinyl films such as polyvinyl chloride films; polyester films such as polyethylene terephthalate films; polycarbonate films; acetate fibers plain film; tetrafluoroethylene film, etc. As metal foil, copper foil, aluminum foil, etc. are mentioned.

支撐體1的厚度,並無特別限定,從作業性和乾燥性優異的觀點而言,可以是2~200μm。當支撐體1的厚度為2μm以上時,在塗佈時容易抑制支撐體斷裂的不良狀況、因清漆的重量導致支撐體彎曲的不良狀況等。當支撐體1的厚度為200μm以下時,於乾燥步驟中,在從塗佈面和背面的雙面吹熱風的情況下,容易抑制清漆中的溶劑乾燥受到妨礙的不良狀況。The thickness of the support body 1 is not particularly limited, but from the viewpoint of excellent workability and drying properties, it may be 2 to 200 μm. When the thickness of the support body 1 is 2 μm or more, the failure of the support body to be broken during coating, the failure of the support body to bend due to the weight of the varnish, and the like are easily suppressed. When the thickness of the support body 1 is 200 μm or less, in the drying step, when hot air is blown from both the coated surface and the back surface, it is easy to suppress the inconvenience that the drying of the solvent in the varnish is hindered.

本實施形態中,可以不使用支撐體1。又,可在密封用薄膜2的與支撐體1相反的一側配置保護層,該保護層的目的在於保護密封用薄膜。藉由在密封用薄膜2上形成保護層,能夠提升操作性,且當進行卷繞時,能夠避免密封用薄膜黏附在支撐體的背面上這樣的不良狀況。In this embodiment, the support body 1 may not be used. Moreover, the protective layer may be arrange|positioned at the opposite side to the support body 1 of the film 2 for sealing, and the purpose of this protective layer is to protect the film for sealing. By forming a protective layer on the film 2 for sealing, workability|operativity can be improved, and when winding, it can avoid the inconvenience that the film for sealing sticks to the back surface of a support body.

作為保護層,能夠使用高分子薄膜、金屬箔等。作為高分子薄膜,可例示:聚乙烯薄膜、聚丙烯薄膜等聚烯烴薄膜;聚氯乙烯薄膜等乙烯系薄膜;聚對苯二甲酸乙二酯薄膜等聚酯薄膜;聚碳酸酯薄膜;乙酸纖維素薄膜;四氟乙烯薄膜等。作為金屬箔,可例示銅箔、鋁箔等。As the protective layer, a polymer film, a metal foil, or the like can be used. Examples of polymer films include: polyolefin films such as polyethylene films and polypropylene films; vinyl films such as polyvinyl chloride films; polyester films such as polyethylene terephthalate films; polycarbonate films; acetate fibers plain film; tetrafluoroethylene film, etc. As a metal foil, a copper foil, an aluminum foil, etc. can be illustrated.

<密封用薄膜的製造方法> 本實施形態的密封用薄膜,具體而言,能夠以下述方式進行來製作。<The manufacturing method of the film for sealing> The film for sealing of this embodiment can be specifically manufactured as follows.

首先,藉由混合本實施形態的樹脂組成物的構成成分(熱硬化性樹脂、硬化劑、硬化促進劑、無機填充材料、溶劑等),來製作清漆(清漆狀樹脂組成物)。混合方法,並無特別限定,能夠使用粉碎機(mill)、混合機、攪拌葉片。溶劑(有機溶劑),能夠用來將密封用薄膜的材料也就是樹脂組成物的構成成分加以溶解並分散來製備清漆、或能夠用來輔助製備清漆。能夠利用塗佈後的乾燥步驟,來去除大部分的溶劑。First, a varnish (varnish-like resin composition) is prepared by mixing the constituent components (thermosetting resin, curing agent, curing accelerator, inorganic filler, solvent, etc.) of the resin composition of the present embodiment. The mixing method is not particularly limited, and a mill, a mixer, and a stirring blade can be used. The solvent (organic solvent) can be used to prepare a varnish by dissolving and dispersing the material of the sealing film, that is, the constituent components of the resin composition, or can be used to assist in the preparation of a varnish. Most of the solvent can be removed by the drying step after coating.

將以這樣的方式進行來製作的清漆,塗佈在支撐體(薄膜狀的支撐體等)上之後,利用吹熱風等來進行加熱乾燥,藉此能夠製作密封用薄膜。作為塗佈(coating)方法,並無特別限定,能夠使用例如:缺角輪塗佈機、刮棒塗佈機、吻合式塗佈機(kiss coater)、輥式塗佈機、凹版塗佈機、模具塗佈機等塗佈裝置。A film for sealing can be produced by applying the varnish produced in this way on a support (a film-like support or the like), and then heating and drying by blowing hot air or the like. The coating method is not particularly limited, and for example, a notch coater, a bar coater, a kiss coater, a roll coater, and a gravure coater can be used. , die coater and other coating devices.

<密封結構體及其製造方法> 本實施形態的密封結構體,具備被密封體、及用以對該被密封體進行密封的密封部。密封部,是本實施形態的密封用薄膜的硬化物,且包含本實施形態的樹脂組成物的硬化物。密封結構體,可以是具有中空結構之中空密封結構體。中空密封結構體,具備例如:基板、設置於基板上的被密封體、設置於基板與被密封體之間的中空區域、及用以對被密封體進行密封的密封部。本實施形態的密封結構體,可具備複數個被密封體。複數個被密封體,可以是相互相同的種類,亦可以是相互不同的種類。<The sealing structure and its manufacturing method> The sealing structure of this embodiment is provided with the to-be-sealed body and the sealing part for sealing the to-be-sealed body. The sealing portion is the cured product of the sealing film of the present embodiment, and includes the cured product of the resin composition of the present embodiment. The sealing structure may be a hollow sealing structure having a hollow structure. The hollow sealing structure includes, for example, a substrate, a to-be-sealed body provided on the substrate, a hollow region provided between the substrate and the to-be-sealed body, and a sealing portion for sealing the to-be-sealed body. The sealing structure of the present embodiment may include a plurality of bodies to be sealed. A plurality of to-be-sealed bodies may be of the same type or different from each other.

密封結構體,例如是電子零件裝置。電子零件裝置,具備電子零件作為被密封體。作為電子零件,可列舉:半導體元件、半導體晶圓、積體電路、半導體器件、SAW濾波器等濾波器、感測器等被動組件等。可使用藉由將半導體晶片單片化而獲得的半導體元件。電子零件裝置,可以是:半導體裝置,其具備作為電子零件的半導體元件或半導體晶圓;印刷線路板等。當電子零件裝置具有中空結構時,亦即當電子零件裝置為中空密封結構體時,被密封體,例如是以在中空區域側(基板側)的表面具有可動部的方式,隔著凸塊來設置於基板上。作為這種被密封體,可列舉例如SAW濾波器等SAW元件(SAW device)等電子零件。當被密封體為SAW濾波器時,壓電基板的表面中的安裝有電極(例如一對梳狀電極也就是叉指換能器(Inter Digital Transducer,IDT))之一側的表面成為可動部。The sealing structure is, for example, an electronic component device. An electronic component device includes electronic components as a to-be-sealed body. Examples of electronic components include semiconductor elements, semiconductor wafers, integrated circuits, semiconductor devices, filters such as SAW filters, passive components such as sensors, and the like. A semiconductor element obtained by singulating a semiconductor wafer can be used. The electronic component device may be a semiconductor device including a semiconductor element or a semiconductor wafer as an electronic component, a printed wiring board, or the like. When the electronic component device has a hollow structure, that is, when the electronic component device is a hollow sealed structure, the body to be sealed has a movable portion on the surface of the hollow region side (substrate side), for example, through the bumps. arranged on the substrate. As such a to-be-sealed body, electronic components, such as a SAW element (SAW device), such as a SAW filter, are mentioned, for example. When the body to be sealed is a SAW filter, among the surfaces of the piezoelectric substrate, the surface on the side where the electrodes (for example, a pair of comb-shaped electrodes, that is, an interdigital transducer (IDT)) are mounted becomes the movable portion .

繼而,說明使用本實施形態的密封用薄膜來實行的中空密封結構體的製造方法。此處,針對中空密封結構體為電子零件裝置且被密封體為SAW元件的情況進行說明。Next, the manufacturing method of the hollow sealing structure performed using the film for sealing of this embodiment is demonstrated. Here, the case where the hollow sealing structure is an electronic component device and the body to be sealed is a SAW element will be described.

第2圖是概略剖面圖,用以說明作為中空密封結構體的製造方法的一實施形態,亦即說明電子零件裝置也就是半導體裝置的製造方法的一實施形態。本實施形態的製造方法中,首先,作為被密封體(被包埋對象),準備中空結構體,該中空結構體具備基板30、與隔著凸塊40且並列配置在基板30上的複數個表面聲波(SAW)元件20,然後使基板30的SAW元件20側的面與附有支撐體之密封用薄膜10的密封用薄膜2側的面相對向(第2圖的(a))。此處,中空結構體60具有中空區域50,SAW元件20在中空區域50側(基板30側)的表面20a具有可動部。FIG. 2 is a schematic cross-sectional view for explaining an embodiment of a method of manufacturing a hollow sealing structure, that is, an embodiment of a method of manufacturing an electronic component device, that is, a semiconductor device. In the manufacturing method of the present embodiment, first, as a body to be sealed (object to be embedded), a hollow structure is prepared, and the hollow structure includes a substrate 30 and a plurality of the substrates 30 arranged in parallel on the substrate 30 with the bumps 40 interposed therebetween. In the surface acoustic wave (SAW) element 20, the SAW element 20 side surface of the substrate 30 faces the sealing film 2 side surface of the support-attached sealing film 10 (FIG. 2(a)). Here, the hollow structure 60 has the hollow region 50, and the SAW element 20 has a movable portion on the surface 20a on the side of the hollow region 50 (the side of the substrate 30).

繼而,藉由在加熱下向SAW元件20推壓(層壓)密封用薄膜2,來將SAW元件20包埋於密封用薄膜2中之後,使包埋有SAW元件20之密封用薄膜2硬化,來獲得密封用薄膜的硬化物(包含樹脂組成物的硬化物之密封部)2a(第2圖的(b))。藉此,能夠獲得電子零件裝置100。Next, after the SAW element 20 is embedded in the sealing film 2 by pressing (laminating) the sealing film 2 against the SAW element 20 under heating, the sealing film 2 in which the SAW element 20 is embedded is cured. , to obtain a cured product of the sealing film (the sealing portion of the cured product including the resin composition) 2a (Fig. 2(b)). Thereby, the electronic component device 100 can be obtained.

作為用於層壓的層壓機,並無特別限定,可列舉例如輥式、氣囊式等的層壓機。從包埋性優異的觀點而言,層壓機,可以是能夠進行真空加壓的氣囊式層壓機。It does not specifically limit as a laminator used for lamination, For example, the laminator of a roll type, a balloon type, etc. is mentioned. From the viewpoint of excellent embeddability, the laminator may be a bladder-type laminator capable of vacuum pressurization.

層壓,通常是在支撐體的軟化點以下實行。層壓溫度(密封溫度),較佳是在密封用薄膜的最低熔融黏度附近。層壓溫度,例如是60~140℃。層壓時的壓力,是根據要包埋的被密封體(例如半導體元件等電子零件)的尺寸、密集度等而不同。層壓時的壓力,例如可以在0.2~1.5MPa的範圍內,亦可以在0.3~1.0MPa的範圍內。層壓時間,並無特別限定,可以是20~600秒,亦可以是30~300秒,亦可以是40~120秒。Lamination is usually carried out below the softening point of the support. The lamination temperature (sealing temperature) is preferably in the vicinity of the minimum melt viscosity of the film for sealing. The lamination temperature is, for example, 60 to 140°C. The pressure at the time of lamination differs depending on the size, density, etc. of the to-be-sealed body to be embedded (eg, electronic components such as semiconductor elements). The pressure at the time of lamination may be, for example, in the range of 0.2 to 1.5 MPa, or in the range of 0.3 to 1.0 MPa. The lamination time is not particularly limited, and may be 20 to 600 seconds, 30 to 300 seconds, or 40 to 120 seconds.

密封用薄膜的硬化,例如能夠在大氣下或惰性氣體下實行。硬化溫度(加熱溫度),並無特別限定,可以是80~280℃,亦可以是100~240℃,亦可以是120~200℃。如果硬化溫度為80℃以上,則密封用薄膜的硬化能夠充分進展,且能夠抑制發生不良狀況。當硬化溫度為280℃以下時,有能夠抑制對於其他材料發生熱損傷的情形的傾向。硬化時間(加熱時間),並無特別限定,可以是30~600分鐘,亦可以是45~300分鐘,亦可以是60~240分鐘。當硬化時間在這些範圍內時,密封用薄膜的硬化能夠充分進展,且能夠獲得更良好的生產效率。又,硬化條件,可組合複數個條件。Hardening of the film for sealing can be carried out, for example, in the atmosphere or under an inert gas. The hardening temperature (heating temperature) is not particularly limited, and may be 80 to 280°C, 100 to 240°C, or 120 to 200°C. When the curing temperature is 80° C. or higher, the curing of the sealing film can be sufficiently advanced, and the occurrence of defects can be suppressed. When the hardening temperature is 280° C. or lower, thermal damage to other materials tends to be suppressed. The hardening time (heating time) is not particularly limited, and may be 30 to 600 minutes, 45 to 300 minutes, or 60 to 240 minutes. When the hardening time is within these ranges, the hardening of the sealing film can sufficiently progress, and more favorable production efficiency can be obtained. In addition, as for the hardening conditions, a plurality of conditions may be combined.

本實施形態中,可進一步藉由利用切割機等將電子零件裝置100單片化,來獲得複數個電子零件裝置200(第2圖的(c))。In the present embodiment, a plurality of electronic component devices 200 can be obtained by further dividing the electronic component devices 100 into pieces by a cutting machine or the like ( FIG. 2( c )).

上述本實施形態的中空密封結構體的製造方法,能夠確保對於被密封體(例如SAW元件20)的優異的包埋性,並且能夠充分抑制密封材料流入基板30與被密封體之間的中空區域50。The above-described method for producing a hollow sealing structure of the present embodiment can ensure excellent embedding properties for the body to be sealed (eg, the SAW element 20 ), and can sufficiently suppress the sealing material from flowing into the hollow region between the substrate 30 and the body to be sealed 50.

本實施形態中,是根據層壓法並藉由密封用薄膜20來對SAW元件20進行密封後,藉由對密封用薄膜2進行熱硬化,來獲得一種中空密封結構體(電子零件裝置),該中空密封結構體具備包埋於硬化物2a中的SAW元件20,亦可藉由使用壓縮成形裝置來實行的壓縮成形(compression molding)來獲得密封結構體,亦可藉由使用油壓壓製機來實行的壓製成形來獲得密封結構體。藉由壓縮成形和油壓壓製來對被密封體進行密封時的溫度(密封溫度),可與上述層壓溫度相同。In the present embodiment, after the SAW element 20 is sealed with the sealing film 20 according to the lamination method, the sealing film 2 is thermally cured to obtain a hollow sealing structure (electronic component device), The hollow sealing structure includes the SAW element 20 embedded in the cured product 2a, and the sealing structure can also be obtained by compression molding using a compression molding device, or by using a hydraulic press. Press-forming is carried out to obtain a sealing structure. The temperature (sealing temperature) when the body to be sealed is sealed by compression molding and hydraulic pressing can be the same as the lamination temperature described above.

以上,說明了本發明的較佳實施形態,但本發明不一定限定於上述實施形態,可在不超出其主旨的範圍內適當地實行變更。 [實施例]As mentioned above, although the preferable embodiment of this invention was described, this invention is not necessarily limited to the said embodiment, It can change suitably in the range which does not deviate from the summary. [Example]

以下,利用實施例來進一步詳細說明本發明,但本發明完全不限定於這些實施例。Hereinafter, the present invention will be described in further detail using examples, but the present invention is not limited to these examples at all.

實施例和比較例中使用了以下材料。The following materials were used in Examples and Comparative Examples.

(熱硬化性樹脂) A1:雙酚F型環氧樹脂(三菱化學股份有限公司製造,商品名「jER806」,環氧基當量:160g/eq.) B1:含烴基酚樹脂(酚性羥基當量:140g/eq.,重量平均分子量:12萬) B2:含烴基酚樹脂(酚性羥基當量:185g/eq.,重量平均分子量:12萬) B3:含烴基酚樹脂(酚性羥基當量:243g/eq.,重量平均分子量:12萬) B4:含烴基酚樹脂(酚性羥基當量:205g/eq.,重量平均分子量:12萬) B5:酚醛清漆型酚樹脂(明和化成股份有限公司製造,商品名「DL-92」,酚性羥基當量:103g/eq.,重量平均分子量:5萬)(Thermosetting resin) A1: Bisphenol F-type epoxy resin (manufactured by Mitsubishi Chemical Corporation, trade name "jER806", epoxy group equivalent: 160 g/eq.) B1: Hydrocarbyl group-containing phenol resin (phenolic hydroxyl equivalent : 140 g/eq., weight-average molecular weight: 120,000) B2: Hydrocarbyl-containing phenol resin (phenolic hydroxyl equivalent: 185 g/eq., weight-average molecular weight: 120,000) B3: Hydrocarbyl-containing phenol resin (phenolic hydroxyl equivalent: 243 g /eq., weight-average molecular weight: 120,000) B4: Hydrocarbyl-containing phenol resin (phenolic hydroxyl equivalent: 205 g/eq., weight-average molecular weight: 120,000) B5: Novolak-type phenol resin (manufactured by Meiwa Chemical Co., Ltd., Brand name "DL-92", phenolic hydroxyl equivalent: 103 g/eq., weight average molecular weight: 50,000)

(硬化促進劑) C1:咪唑(四國化成工業股份有限公司製造,商品名「2P4MZ」)(hardening accelerator) C1: Imidazole (manufactured by Shikoku Chemical Industry Co., Ltd., trade name "2P4MZ")

(彈性體) D1:丙烯酸酯聚合物(Nagase ChemteX股份有限公司製造,商品名「SG-280 EK23」,分子量90萬)(Elastomer) D1: Acrylate polymer (manufactured by Nagase ChemteX Co., Ltd., trade name "SG-280 EK23", molecular weight 900,000)

(無機填充材料) E1:二氧化矽(Admatechs股份有限公司製造,商品名「5μm SX-E2」,苯基胺基矽烷處理,平均粒徑:5.8μm)(Inorganic filler) E1: Silica (manufactured by Admatechs Co., Ltd., trade name "5μm SX-E2", phenylaminosilane treatment, average particle size: 5.8μm)

B1~B4,是依照日本特開2015-89949所記載的方法來製備。具體而言,是根據以下方法來製備。B1 to B4 were prepared according to the method described in Japanese Patent Laid-Open No. 2015-89949. Specifically, it was prepared according to the following method.

(合成例1) 首先,將腰果酚(cardanol)、甲醇、50%甲醛水溶液混合,來獲得混合液。繼而,將30%氫氧化鈉水溶液滴入所獲得的混合液中來使其反應後,對所獲得的反應液添加35%鹽酸,來中和氫氧化鈉。繼而,對反應液添加苯酚後,進一步添加草酸。繼而,實行反應液的水洗後,餾除過剩的苯酚。藉此,獲得樹脂B1,其由40莫耳%的以下述式(5)表示的結構單元與60莫耳%的以下述式(6)表示的結構單元所構成。

Figure 02_image025
Figure 02_image026
(Synthesis Example 1) First, cardanol, methanol, and a 50% formaldehyde aqueous solution were mixed to obtain a mixed solution. Next, 35% hydrochloric acid was added to the obtained reaction liquid after dripping 30% sodium hydroxide aqueous solution into the obtained mixed liquid, and it was made to react, and sodium hydroxide was neutralized. Next, after adding phenol to the reaction liquid, oxalic acid was further added. Next, after washing the reaction liquid with water, excess phenol was distilled off. Thereby, resin B1 which consists of 40 mol% of the structural unit represented by following formula (5) and 60 mol% of the structural unit represented by following formula (6) was obtained.
Figure 02_image025
Figure 02_image026

(合成例2) 首先,將4-三級丁基苯酚、甲醇、50%甲醛水溶液混合,來獲得混合液。繼而,將30%氫氧化鈉水溶液滴入所獲得的混合液中來使其反應後,對所獲得的反應液添加35%鹽酸,來中和氫氧化鈉。繼而,對反應液添加4-苯基苯酚後,進一步添加草酸。繼而,實行反應液的水洗後,餾除過剩的4-苯基苯酚。藉此,獲得樹脂B2,其由50莫耳%的以下述式(7)表示的結構單元與50莫耳%的以下述式(8)表示的結構單元所構成。

Figure 02_image027
Figure 02_image028
(Synthesis Example 2) First, 4-tertiary butylphenol, methanol, and a 50% formaldehyde aqueous solution were mixed to obtain a mixed solution. Next, 35% hydrochloric acid was added to the obtained reaction liquid after dripping 30% sodium hydroxide aqueous solution into the obtained mixed liquid, and it was made to react, and sodium hydroxide was neutralized. Next, after adding 4-phenylphenol to the reaction liquid, oxalic acid was further added. Next, after washing the reaction liquid with water, excess 4-phenylphenol was distilled off. Thereby, resin B2 which consists of 50 mol% of the structural unit represented by following formula (7) and 50 mol% of the structural unit represented by following formula (8) was obtained.
Figure 02_image027
Figure 02_image028

(合成例3) 首先,將4-(1,1,3,3-四甲基丁基)苯酚、甲醇、50%甲醛水溶液混合,來獲得混合液。繼而,將30%氫氧化鈉水溶液滴入所獲得的混合液中來使其反應。藉此,獲得樹脂B3,其由以下述式(9)表示的結構單元所構成。

Figure 02_image029
(Synthesis Example 3) First, 4-(1,1,3,3-tetramethylbutyl)phenol, methanol, and a 50% formaldehyde aqueous solution were mixed to obtain a mixed solution. Next, 30% sodium hydroxide aqueous solution was dripped into the obtained mixed liquid, and it was made to react. Thereby, resin B3 which consists of a structural unit represented by following formula (9) is obtained.
Figure 02_image029

(合成例4) 首先,將腰果酚、甲醇、50%甲醛水溶液混合,來獲得混合液。繼而,將30%氫氧化鈉水溶液滴入所獲得的混合液中來使其反應後,對所獲得的反應液添加35%鹽酸,來中和氫氧化鈉。繼而,對反應液添加戊基苯酚後,進一步添加草酸。繼而,實行反應液的水洗後,餾除過剩的戊基苯酚。藉此,獲得樹脂B4,其由75莫耳%的以上述式(5)表示的結構單元與25莫耳%的以下述式(10)表示的結構單元所構成。

Figure 02_image030
(Synthesis Example 4) First, cardanol, methanol, and a 50% formaldehyde aqueous solution were mixed to obtain a mixed solution. Next, 35% hydrochloric acid was added to the obtained reaction liquid after dripping 30% sodium hydroxide aqueous solution into the obtained mixed liquid, and it was made to react, and sodium hydroxide was neutralized. Next, after adding amylphenol to the reaction liquid, oxalic acid was further added. Next, after washing the reaction liquid with water, excess amylphenol was distilled off. Thereby, resin B4 which consists of 75 mol% of the structural unit represented by the said formula (5) and 25 mol% of the structural unit represented by the following formula (10) was obtained.
Figure 02_image030

<製作密封用薄膜(薄膜狀環氧樹脂組成物)> (實施例1) 將表1所示的量(質量份)的A1、B1、D1及E1加入0.5L(公升)的聚乙烯容器中,並以攪拌葉片進行攪拌,來使無機填充材料E1分散。然後,加入表1所示的量(質量份)的C1,並進一步攪拌30分鐘。利用耐綸製的#150篩網(開口為106μm)過濾所獲得的混合液,並提取濾液。藉此,獲得清漆狀環氧樹脂組成物。使用塗佈機,並依以下條件來將此清漆狀環氧樹脂組成物塗佈在PET薄膜上。藉此,在支撐體上製作厚度110μm的密封用薄膜。 ・塗佈頭方式:缺角輪 ・塗佈和乾燥速度:1公尺/分鐘 ・乾燥條件(溫度/爐長):80℃/1.5m(公尺)、100℃/1.5m ・支撐體:厚度38μm的PET薄膜<Preparation of sealing film (film-like epoxy resin composition)> (Example 1) A1, B1, D1, and E1 in amounts (parts by mass) shown in Table 1 were put into a 0.5 L (liter) polyethylene container , and stir with a stirring blade to disperse the inorganic filler E1. Then, the amount (parts by mass) of C1 shown in Table 1 was added, and the mixture was further stirred for 30 minutes. The obtained mixed solution was filtered through a nylon-made #150 mesh (106 μm opening), and the filtrate was extracted. Thereby, a varnish-like epoxy resin composition was obtained. Using a coater, the varnish-like epoxy resin composition was coated on a PET film under the following conditions. In this way, a film for sealing with a thickness of 110 μm was produced on the support.・Coating head method: Cutaway wheel ・Coating and drying speed: 1 m/min ・Drying conditions (temperature/furnace length): 80°C/1.5m (meter), 100°C/1.5m ・Support: PET film with a thickness of 38 μm

在密封用薄膜中的與支撐體相反的一側配置保護層(厚度50μm的聚對苯二甲酸乙二酯薄膜),藉此保護密封用薄膜的表面。再者,在下述各評估中,是在將支撐體和保護層剝離後實行評估。關於以下實施例和比較例亦相同。A protective layer (polyethylene terephthalate film with a thickness of 50 μm) was arranged on the side opposite to the support in the film for sealing, thereby protecting the surface of the film for sealing. In addition, in each following evaluation, the evaluation was performed after peeling a support body and a protective layer. The same applies to the following Examples and Comparative Examples.

(實施例2~4及比較例1~2) 將所使用的材料(A1、B1、C1、D1及E1)的種類和摻合量變更如表1所示,除此以外則與實施例1同樣地進行,來獲得實施例2~4及比較例1~2的清漆狀環氧樹脂組成物。繼而,分別使用實施例2~4及比較例1~2的清漆狀環氧樹脂組成物,來取代實施例1的清漆狀環氧樹脂組成物,除此以外則與實施例1同樣地進行,來獲得實施例2~4及比較例1~2的密封用薄膜(厚度為110μm)。(Examples 2 to 4 and Comparative Examples 1 to 2) The types and blending amounts of the materials (A1, B1, C1, D1, and E1) used were changed as shown in Table 1. Otherwise, the same as in Example 1. In the same manner, the varnish-like epoxy resin compositions of Examples 2 to 4 and Comparative Examples 1 to 2 were obtained. Next, the same procedure as in Example 1 was carried out, except that the varnish-like epoxy resin compositions of Examples 2 to 4 and Comparative Examples 1 to 2 were used, respectively, in place of the varnish-like epoxy resin composition of Example 1. The sealing films (thickness: 110 μm) of Examples 2 to 4 and Comparative Examples 1 to 2 were obtained.

<評估方法> 利用以下方法,來實行密封用薄膜的熔融黏度、包埋性和中空非填充性、以及密封用薄膜硬化後的彈性模數和玻璃轉化溫度的評估。<Evaluation method> The following methods were used to evaluate the melt viscosity, embedding properties, and hollow non-filling properties of the sealing film, as well as the elastic modulus and glass transition temperature after curing of the sealing film.

(1)評估A:密封用薄膜(薄膜狀環氧樹脂組成物)的熔融黏度 量取0.6g密封用薄膜,並利用壓縮成形機來成形成直徑2cm的平板狀。將所獲得的成形物作成評估用試樣,並依以下條件來測定密封用薄膜的熔融黏度。測定,是藉由將溫度從40℃升溫至200℃為止來實行。 測定裝置:流變計,產品名:日本TA儀器股份有限公司製造的ARES-G2 測定模式:Dynamic Temperature Ramp 頻率:1.0Hz 溫度範圍:40℃~200℃ 升溫速度:5℃/分鐘(1) Evaluation A: Melt viscosity of sealing film (film-like epoxy resin composition) 0.6 g of the sealing film was weighed and formed into a flat plate shape with a diameter of 2 cm using a compression molding machine. The obtained molded product was prepared as a sample for evaluation, and the melt viscosity of the sealing film was measured under the following conditions. The measurement was performed by raising the temperature from 40°C to 200°C. Measuring device: Rheometer, product name: ARES-G2 manufactured by Japan TA Instruments Co., Ltd. Measurement mode: Dynamic Temperature Ramp Frequency: 1.0 Hz Temperature range: 40°C to 200°C Heating rate: 5°C/min

(2)評估B:密封溫度70℃時的包埋性和中空非填充性 利用以下方法,評估密封溫度70℃時的包埋性和中空非填充性。首先,準備在主表面的中央設置有通孔(直徑為1mm)之基板(5cm×5cm)。繼而,在從該基板的其中一主表面上的上述通孔的邊緣起算距離2cm的位置黏貼雙面膠帶,並隔著雙面膠帶而將玻璃板黏貼在基板上。以玻璃板側的面朝下的方式,配置所獲得的積層體,並在基板的與玻璃板相反的一側的面上,以堵塞通孔的方式,來配置1cm見方尺寸的密封用薄膜。繼而,將100g的重物載置於密封用薄膜上後,在70℃的烘箱(ESPEC股份有限公司製造的商品名「SAFETY OVEN SPH-201」)內進行加熱1小時。(2) Evaluation B: Embedding properties and hollow non-filling properties at a sealing temperature of 70°C The following methods were used to evaluate the embedding properties and hollow non-filling properties at a sealing temperature of 70°C. First, a substrate (5 cm×5 cm) provided with a through hole (1 mm in diameter) in the center of the main surface was prepared. Next, a double-sided tape was pasted at a distance of 2 cm from the edge of the through hole on one of the main surfaces of the substrate, and the glass plate was pasted on the substrate through the double-sided tape. The obtained laminate was placed with the glass plate side facing down, and a 1 cm square sealing film was placed on the surface of the substrate opposite to the glass plate so as to close the through holes. Next, after placing a weight of 100 g on the film for sealing, heating was performed in an oven (trade name "SAFETY OVEN SPH-201" by ESPEC Co., Ltd.) at 70° C. for 1 hour.

加熱後,以目視觀察有無樹脂因密封薄膜熔融而從通孔流入玻璃板側、及樹脂的流入量(流入面積),並依據以下基準,來評估包埋性和中空非填充性。 [包埋性] A:樹脂到達基板為止 B:樹脂未到達基板 [中空非填充性] A:流入面積≦2.5mm2 B:流入面積≦5mm2 但>2.5mm2 C:流入面積>5mm2 After heating, the presence or absence of resin flowing into the glass plate side from the through hole due to the melting of the sealing film and the inflow amount (inflow area) of the resin were visually observed, and the embedding properties and hollow non-filling properties were evaluated according to the following criteria. [Embedding properties] A: Resin reaches the substrate B: Resin does not reach the substrate [Hollow non-filling properties] A: Inflow area ≦ 2.5mm 2 B: Inflow area ≦ 5mm 2 but > 2.5mm 2 C: Inflow area > 5mm 2

(3)評估C:熔融黏度7000Pa・s時的包埋性和中空非填充性 依據評估A的熔融黏度的測定結果,以密封用薄膜的熔融黏度成為7000Pa・s的溫度來實行密封,除此以外則以與評估B相同的方法來評估包埋性和中空非填充性。(3) Evaluation C: Embedding properties and hollow non-filling properties at a melt viscosity of 7000 Pa・s Based on the measurement results of the melt viscosity of Evaluation A, sealing was performed at a temperature at which the melt viscosity of the sealing film became 7000 Pa・s, except that Otherwise, the embedding and hollow non-filling properties were evaluated in the same way as Evaluation B.

(4)評估D:密封薄膜硬化後的彈性模數和玻璃轉化溫度Tg 依以下條件,來將實施例和比較例的密封用薄膜層壓在銅箔上,而獲得附有銅箔之密封用薄膜。 ・層壓機裝置:名機製作所製造的真空加壓層壓機MVLP-500 ・層壓溫度:110℃ ・層壓壓力:0.5MPa ・抽真空時間:30秒 ・層壓時間:40秒(4) Evaluation D: Elastic modulus and glass transition temperature Tg after curing of sealing film The sealing films of Examples and Comparative Examples were laminated on copper foil under the following conditions to obtain a sealing film with copper foil film.・Laminator device: Vacuum pressure laminator MVLP-500 manufactured by Meiki Seisakusho ・Lamination temperature: 110°C ・Lamination pressure: 0.5MPa ・Evacuation time: 30 seconds ・Lamination time: 40 seconds

將附有銅箔之密封用薄膜黏貼於不銹鋼(SUS)板上,並依以下條件來使密封用薄膜硬化,而獲得附有銅箔之密封用薄膜的硬化物(附有銅箔之環氧樹脂硬化體) ・烘箱:ESPEC股份有限公司製造的SAFETY OVEN SPH-201 ・烘箱溫度:140℃ ・時間:120分鐘The sealing film with copper foil is pasted on a stainless steel (SUS) plate, and the sealing film is hardened according to the following conditions to obtain a cured product of the sealing film with copper foil (epoxy with copper foil) Resin hardened body) ・Oven: SAFETY OVEN SPH-201 manufactured by ESPEC Co., Ltd. ・Oven temperature: 140°C ・Time: 120 minutes

將銅箔從附有銅箔之密封用薄膜的硬化物剝離後,將密封薄膜的硬化物切割成4mm×30mm,來製作試驗片。依以下條件,來測定所製作的試驗片的彈性模數和玻璃轉化溫度。 ・測定裝置:DVE(RHEOLOGY股份有限公司製造的DVE-V4) ・測定溫度:25~300℃ ・升溫速度:5℃/minAfter peeling the copper foil from the cured product of the copper foil-attached sealing film, the cured product of the sealing film was cut into 4 mm×30 mm to prepare a test piece. The elastic modulus and glass transition temperature of the produced test piece were measured under the following conditions.・Measuring device: DVE (DVE-V4 manufactured by RHEOLOGY Co., Ltd.) ・Measuring temperature: 25 to 300°C ・Heating rate: 5°C/min

當彈性模數較高時,密封結構體變得容易發生翹曲和破裂,因此依照以下判斷基準來評估彈性模數。 A:彈性模數(30℃) ≦15GPa B:彈性模數(30℃) >15GPaWhen the elastic modulus is high, the sealing structure becomes liable to warp and crack, so the elastic modulus is evaluated according to the following judgment criteria. A: Modulus of elasticity (30℃) ≦15GPa B: Modulus of elasticity (30℃) >15GPa

當玻璃轉化溫度Tg較低時,密封結構體的熱可靠性會惡化,因此依照以下判斷基準來評估玻璃轉化溫度。 A:玻璃轉化溫度(℃) ≧100 B:玻璃轉化溫度(℃) <100When the glass transition temperature Tg is low, the thermal reliability of the sealing structure deteriorates, so the glass transition temperature is evaluated according to the following judgment criteria. A: Glass transition temperature (°C) ≧100 B: Glass transition temperature (°C) <100

<評估結果> 結果如表1所示。再者,表1中的各成分的摻合量為固體成分量(溶劑的量除外後的量)。<Evaluation Results> Table 1 shows the results. In addition, the compounding quantity of each component in Table 1 is a solid content quantity (quantity except the quantity of a solvent).

[表1]

Figure 107114497-A0304-0001
[Table 1]
Figure 107114497-A0304-0001

如表1所示,實施例中,在密封溫度70℃時能夠兼具包埋性與中空非填充性。又,在以熔融黏度成為7000Pa・s的溫度來實行密封的情況下,亦能夠兼具包埋性與中空非填充性。另一方面,比較例1中,密封溫度70℃時無法獲得期望的包埋性,熔融黏度成為7000Pa・s的溫度時亦無法獲得期望的中空非填充性。又,比較例2中,在評估A(密封溫度為70℃)和評估B(熔融黏度為7000Pa・s)中皆無法獲得期望的中空非填充性。As shown in Table 1, in the examples, both the embedding property and the hollow non-filling property can be achieved at a sealing temperature of 70°C. In addition, even when sealing is performed at a temperature where the melt viscosity is 7000 Pa·s, it is possible to have both embedding properties and hollow non-filling properties. On the other hand, in Comparative Example 1, the desired embedding property was not obtained at a sealing temperature of 70° C., and the desired hollow non-filling property was not obtained even when the melt viscosity was at a temperature of 7000 Pa·s. In addition, in Comparative Example 2, the desired hollow non-fillability was not obtained in both evaluation A (sealing temperature: 70° C.) and evaluation B (melt viscosity: 7000 Pa·s).

1‧‧‧支撐體2‧‧‧密封用薄膜2a‧‧‧密封用薄膜的硬化物(密封部)10‧‧‧附有支撐體之密封用薄膜20‧‧‧表面聲波元件(被密封體)20a‧‧‧表面聲波元件在中空區域側(基板側)的表面30‧‧‧基板40‧‧‧凸塊50‧‧‧中空區域60‧‧‧中空結構體100、200‧‧‧中空密封結構體(密封結構體)1‧‧‧Support 2‧‧‧Film for sealing 2a‧‧‧Cutting of film for sealing (sealing part) 10‧‧‧Film for sealing with support 20‧‧‧Surface acoustic wave element (body to be sealed )20a‧‧‧Surface acoustic wave element on the hollow region side (substrate side) 30‧‧‧Substrate 40‧‧‧Bumps 50‧‧‧Hollow region 60‧‧‧Hollow structure 100, 200‧‧‧Hollow sealing Structure (sealed structure)

第1圖是表示附有支撐體之密封用薄膜的概略剖面圖,其具有實施形態的密封用薄膜。 第2圖是用以說明中空密封結構體的製造方法的一實施形態的概略剖面圖。Fig. 1 is a schematic cross-sectional view showing a support-attached sealing film having a sealing film according to an embodiment. FIG. 2 is a schematic cross-sectional view for explaining an embodiment of a method for producing a hollow sealing structure.

國內寄存資訊 (請依寄存機構、日期、號碼順序註記) 無Domestic storage information (please note in the order of storage institution, date and number) None

國外寄存資訊 (請依寄存國家、機構、日期、號碼順序註記) 無Foreign deposit information (please note in the order of deposit country, institution, date and number) None

1:支撐體 1: Support body

2:密封用薄膜 2: Film for sealing

10:附有支撐體之密封用薄膜 10: Sealing film with support

Claims (11)

一種密封用薄膜,其由樹脂組成物構成,該樹脂組成物含有熱硬化樹脂與無機填充材料,該熱硬化樹脂具有以下述式(1)表示的結構單元:
Figure 107114497-A0305-02-0053-3
式(1)中,X1表示反應性官能基,R1表示碳數2~25的烴基;該密封用薄膜用來對被密封體進行密封,該被密封體隔著凸塊而設置在基板上。
A sealing film comprising a resin composition containing a thermosetting resin and an inorganic filler, the thermosetting resin having a structural unit represented by the following formula (1):
Figure 107114497-A0305-02-0053-3
In formula (1), X 1 represents a reactive functional group, and R 1 represents a hydrocarbon group having 2 to 25 carbon atoms; the sealing film is used to seal the body to be sealed, and the body to be sealed is provided on the substrate through the bumps superior.
如請求項1所述之密封用薄膜,其中,前述熱硬化性樹脂進一步具有以下述式(2)表示的結構單元:
Figure 107114497-A0305-02-0053-4
式(2)中,X2表示反應性官能基,R2表示氫原子或苯基。
The sealing film according to claim 1, wherein the thermosetting resin further has a structural unit represented by the following formula (2):
Figure 107114497-A0305-02-0053-4
In formula (2), X 2 represents a reactive functional group, and R 2 represents a hydrogen atom or a phenyl group.
如請求項1或2所述之密封用薄膜,其中,前述X1是羥基。 The film for sealing according to claim 1 or 2, wherein X 1 is a hydroxyl group. 如請求項1或2所述之密封用薄膜,其中,前述樹脂組成物進一步含有環氧樹脂。 The film for sealing according to claim 1 or 2, wherein the resin composition further contains an epoxy resin. 如請求項1或2所述之密封用薄膜,其中,前述熱硬化性樹脂中的以前述式(1)表示的結構單元的含量,以構成前述熱硬化性樹脂的結構單元的總量作為基準計,為20莫耳%以上。 The sealing film according to claim 1 or 2, wherein the content of the structural unit represented by the formula (1) in the thermosetting resin is based on the total amount of the structural units constituting the thermosetting resin. In total, it is more than 20 mol%. 如請求項1或2所述之密封用薄膜,其中,前述熱硬化性樹脂的重量平均分子量為500以上。 The sealing film according to claim 1 or 2, wherein the thermosetting resin has a weight average molecular weight of 500 or more. 如請求項1或2所述之密封用薄膜,其中,膜厚為20~250μm。 The film for sealing according to claim 1 or 2, wherein the film thickness is 20 to 250 μm. 一種密封結構體的製造方法,其準備中空結構體,該中空結構體具備基板以及隔著凸塊而設置在該基板上的被密封體,且在前述基板與前述被密封體之間設置有中空區域;並且,藉由請求項1~7中任一項所述之密封用薄膜來對前述被密封體進行密封。 A method of manufacturing a sealing structure, which prepares a hollow structure including a substrate and a body to be sealed provided on the substrate with bumps interposed therebetween, and a hollow body is provided between the substrate and the body to be sealed The said to-be-sealed body is sealed by the film for sealing described in any one of Claims 1-7. 如請求項8所述之密封結構體的製造方法,其中,前述被密封體是表面聲波元件,其在前述中空區域側具有電極。 The method for producing a sealing structure according to claim 8, wherein the body to be sealed is a surface acoustic wave element having electrodes on the side of the hollow region. 一種密封結構體,其具備:基板;被密封體,其隔著凸塊而設置在該基板上;及請求項1~7中任一項所述之密封用薄膜的硬化物,其用以對該被密封體進行密封;並且,在前述基板與前述被密封體之間設置有中空區 域。 A sealing structure comprising: a substrate; a body to be sealed provided on the substrate with bumps interposed therebetween; and a cured product of the sealing film according to any one of claims 1 to 7, which is used for The body to be sealed is sealed; and a hollow area is provided between the substrate and the body to be sealed area. 如請求項10所述之密封結構體,其中,前述被密封體是表面聲波元件,其在前述中空區域側具有電極。 The sealing structure according to claim 10, wherein the body to be sealed is a surface acoustic wave element having electrodes on the side of the hollow region.
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201141937A (en) * 2010-03-25 2011-12-01 Sumitomo Bakelite Co Epoxy resin composition for encapsulating semiconductor and semiconductor device using the same
JP2013082785A (en) * 2011-10-07 2013-05-09 Nippon Kayaku Co Ltd Phenol resin, epoxy resin, and cured product of the same
JP2015089940A (en) * 2013-11-07 2015-05-11 群栄化学工業株式会社 Polyhydric resin, production method thereof, curing agent for epoxy resin, epoxy resin composition, and cured product
TW201627340A (en) * 2014-10-01 2016-08-01 Dainippon Ink & Chemicals Epoxy resin composition and cured product thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06322348A (en) * 1993-05-14 1994-11-22 Toray Ind Inc Adhesive composition for flexible printing plate, flexible printing plate using the same and adhesive tape for tab
JP4404450B2 (en) 2000-06-30 2010-01-27 京セラ株式会社 Surface acoustic wave device and manufacturing method thereof
JP4989402B2 (en) 2007-10-04 2012-08-01 日東電工株式会社 Hollow device sealing resin composition sheet and hollow device sealed using the same
JP2012182407A (en) * 2011-03-03 2012-09-20 Bridgestone Corp Sealing film for solar cell and solar cell using the same
JP6883937B2 (en) 2015-03-19 2021-06-09 日東電工株式会社 Manufacturing method of sealing sheet and hollow package

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201141937A (en) * 2010-03-25 2011-12-01 Sumitomo Bakelite Co Epoxy resin composition for encapsulating semiconductor and semiconductor device using the same
JP2013082785A (en) * 2011-10-07 2013-05-09 Nippon Kayaku Co Ltd Phenol resin, epoxy resin, and cured product of the same
JP2015089940A (en) * 2013-11-07 2015-05-11 群栄化学工業株式会社 Polyhydric resin, production method thereof, curing agent for epoxy resin, epoxy resin composition, and cured product
TW201627340A (en) * 2014-10-01 2016-08-01 Dainippon Ink & Chemicals Epoxy resin composition and cured product thereof

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