TW200630606A - Device and method for detecting flaw of edge face of glass plate - Google Patents
Device and method for detecting flaw of edge face of glass plateInfo
- Publication number
- TW200630606A TW200630606A TW095103457A TW95103457A TW200630606A TW 200630606 A TW200630606 A TW 200630606A TW 095103457 A TW095103457 A TW 095103457A TW 95103457 A TW95103457 A TW 95103457A TW 200630606 A TW200630606 A TW 200630606A
- Authority
- TW
- Taiwan
- Prior art keywords
- end surface
- glass sheet
- glass plate
- surface portion
- lighting
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Textile Engineering (AREA)
- Engineering & Computer Science (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005034238A JP4626982B2 (ja) | 2005-02-10 | 2005-02-10 | ガラス板の端面の欠陥検出装置および検出方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200630606A true TW200630606A (en) | 2006-09-01 |
TWI330253B TWI330253B (zh) | 2010-09-11 |
Family
ID=36793187
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095103457A TW200630606A (en) | 2005-02-10 | 2006-01-27 | Device and method for detecting flaw of edge face of glass plate |
Country Status (7)
Country | Link |
---|---|
US (1) | US8120654B2 (zh) |
EP (1) | EP1850120A4 (zh) |
JP (1) | JP4626982B2 (zh) |
KR (1) | KR101140072B1 (zh) |
CN (1) | CN101115988B (zh) |
TW (1) | TW200630606A (zh) |
WO (1) | WO2006085618A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11639898B2 (en) | 2017-04-18 | 2023-05-02 | Corning Incorporated | Substrate edge test apparatus, system, and method |
Families Citing this family (49)
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KR100791277B1 (ko) | 2006-09-12 | 2008-01-04 | 주식회사 케이엔제이 | 평판 디스플레이 패널 검사장치 |
JP5160993B2 (ja) * | 2008-07-25 | 2013-03-13 | 株式会社荏原製作所 | 基板処理装置 |
JP5268740B2 (ja) * | 2009-03-30 | 2013-08-21 | 株式会社日本製鋼所 | 角形基板の4角割れ欠け検出装置 |
CN102235982A (zh) * | 2010-03-31 | 2011-11-09 | 旭硝子株式会社 | 透光性矩形板状物的端面检查方法和端面检查装置 |
WO2012005019A1 (ja) * | 2010-07-08 | 2012-01-12 | 旭硝子株式会社 | ガラス基板端面の評価方法及びガラス基板端面の加工方法並びにガラス基板 |
DE102010037788B4 (de) * | 2010-09-27 | 2012-07-19 | Viprotron Gmbh | Verfahren und Vorrichtung zur Anzeige von automatisiert ermittelten Fehlerstellen |
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JP5982738B2 (ja) * | 2011-04-15 | 2016-08-31 | 株式会社リコー | 画像処理プログラム、画像処理装置、及び記憶媒体 |
JP5796430B2 (ja) * | 2011-09-15 | 2015-10-21 | 日本電気硝子株式会社 | 板ガラス検査装置、板ガラス検査方法、板ガラス製造装置、及び板ガラス製造方法 |
US9683945B2 (en) | 2012-05-30 | 2017-06-20 | Corning Incorporated | Apparatus and method for inspecting a flexible glass ribbon |
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JP6486050B2 (ja) | 2014-09-29 | 2019-03-20 | 株式会社Screenホールディングス | 検査装置および検査方法 |
KR102386192B1 (ko) * | 2014-12-05 | 2022-04-12 | 케이엘에이 코포레이션 | 워크 피스들에서의 결함 검출을 위한 장치, 방법 및 컴퓨터 프로그램 제품 |
JP6875285B2 (ja) | 2015-03-13 | 2021-05-19 | コーニング インコーポレイテッド | エッジ強度試験方法および装置 |
US9933251B2 (en) | 2015-06-26 | 2018-04-03 | Glasstech, Inc. | Non-contact gaging system and method for contoured glass sheets |
US9851200B2 (en) | 2015-06-26 | 2017-12-26 | Glasstech, Inc. | Non-contact gaging system and method for contoured panels having specular surfaces |
US9470641B1 (en) | 2015-06-26 | 2016-10-18 | Glasstech, Inc. | System and method for measuring reflected optical distortion in contoured glass sheets |
US9952037B2 (en) | 2015-06-26 | 2018-04-24 | Glasstech, Inc. | System and method for developing three-dimensional surface information corresponding to a contoured sheet |
US9841276B2 (en) | 2015-06-26 | 2017-12-12 | Glasstech, Inc. | System and method for developing three-dimensional surface information corresponding to a contoured glass sheet |
US9952039B2 (en) | 2015-06-26 | 2018-04-24 | Glasstech, Inc. | System and method for measuring reflected optical distortion in contoured panels having specular surfaces |
CN105044119A (zh) * | 2015-08-27 | 2015-11-11 | 李明英 | 一种基于灰度均值分析的玻璃瑕疵分类方法 |
JP6614978B2 (ja) * | 2016-01-14 | 2019-12-04 | 株式会社荏原製作所 | 研磨装置及び研磨方法 |
JP6088679B1 (ja) * | 2016-02-19 | 2017-03-01 | ファナック株式会社 | カメラの画像により故障を判定するロボットシステムの故障診断装置 |
CN105572144B (zh) * | 2016-03-07 | 2018-11-20 | 凌云光技术集团有限责任公司 | 玻璃边角图像采集装置及系统 |
JP6668959B2 (ja) * | 2016-06-07 | 2020-03-18 | 日本電気硝子株式会社 | 管ガラス用検査装置、管ガラスの検査方法、管ガラスの加工装置、及び管ガラスの製造方法 |
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KR20180116154A (ko) * | 2017-04-14 | 2018-10-24 | 코닝 인코포레이티드 | 커버 글라스 검사 장치 |
JP6937647B2 (ja) * | 2017-09-28 | 2021-09-22 | 日東電工株式会社 | 光学表示パネルの損傷検査方法 |
JP6963725B2 (ja) * | 2017-10-13 | 2021-11-10 | 日本電気硝子株式会社 | ガラス板の検査方法及び検査装置並びにガラス板の製造方法 |
KR102580389B1 (ko) * | 2018-02-13 | 2023-09-19 | 코닝 인코포레이티드 | 유리 시트 검사 장치 및 방법 |
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CN109490311B (zh) * | 2018-10-25 | 2021-09-10 | 武汉精立电子技术有限公司 | 基于多角度拍摄的背光面板缺陷检测系统及方法 |
CN109540918B (zh) * | 2018-11-28 | 2021-04-16 | 鞍钢集团自动化有限公司 | 一种热轧卷边部缺陷检测装置及方法 |
CN109540911A (zh) * | 2018-12-29 | 2019-03-29 | 天津市协力自动化工程有限公司 | 一种木板边缘崩边检测装置 |
CN110000665B (zh) * | 2019-04-22 | 2020-03-24 | 福建省元诚机车部件有限公司 | 一种刹车片外弧的智能磨床 |
CN110726733A (zh) * | 2019-11-15 | 2020-01-24 | 湖南讯目科技有限公司 | 一种板材边缘缺陷检测装置、系统和方法 |
CN111024706B (zh) * | 2019-11-22 | 2022-08-12 | 北京航天控制仪器研究所 | 一种多自由度铁氧体元件无损检测装置及方法 |
US11399108B2 (en) * | 2020-05-21 | 2022-07-26 | Kyocera Document Solutions Inc. | Image reading apparatus capable of determining whether missing part of document image occurs based on edge shape of at least one of leading and trailing edges of document image |
CN113146368B (zh) * | 2020-05-29 | 2022-11-08 | 浙江大学 | 一种用于长轨线上的钢轨表面质量检测系统 |
JP2022051056A (ja) * | 2020-09-18 | 2022-03-31 | 日本電気硝子株式会社 | 検査結果表示装置、製造システム、検査結果表示方法、製造方法、及びプログラム |
PL443439A1 (pl) * | 2023-01-09 | 2024-07-15 | Politechnika Warszawska | Urządzenie i sposób jednoczesnej oceny chropowatości oraz detekcji wad na powierzchni profili aluminiowych |
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JPS556214A (en) * | 1978-06-28 | 1980-01-17 | Toshiba Corp | Rod selection |
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JP2002062267A (ja) * | 2000-08-21 | 2002-02-28 | Asahi Glass Co Ltd | 欠点検査装置 |
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WO2002018980A2 (en) * | 2000-09-01 | 2002-03-07 | Applied Process Technologies | Optical system for imaging distortions in moving reflective sheets |
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JP2003098122A (ja) * | 2001-09-21 | 2003-04-03 | Toshiba Ceramics Co Ltd | ガラス基板の外観検査装置 |
AU2002349646A1 (en) | 2001-11-20 | 2003-06-10 | Mitsuboshi Diamond Industrial Co., Ltd. | Inspecting method for end faces of brittle-material-made substrate and device therefor |
JP2003247953A (ja) * | 2002-02-25 | 2003-09-05 | Seiko Epson Corp | 液晶パネル外観検査方法及び検査装置 |
KR100798320B1 (ko) * | 2002-03-06 | 2008-01-28 | 엘지.필립스 엘시디 주식회사 | 액정 패널의 검사 장치 및 그 방법 |
JP4793266B2 (ja) * | 2004-11-24 | 2011-10-12 | 旭硝子株式会社 | 透明板状体の欠陥検査方法および装置 |
WO2006095519A1 (ja) * | 2005-03-07 | 2006-09-14 | Nippon Sheet Glass Company, Limited | 光透過性パネルの透視歪検査装置および検査方法 |
-
2005
- 2005-02-10 JP JP2005034238A patent/JP4626982B2/ja not_active Expired - Fee Related
-
2006
- 2006-01-27 TW TW095103457A patent/TW200630606A/zh unknown
- 2006-02-10 US US11/884,142 patent/US8120654B2/en not_active Expired - Fee Related
- 2006-02-10 WO PCT/JP2006/302371 patent/WO2006085618A1/ja active Application Filing
- 2006-02-10 CN CN2006800045167A patent/CN101115988B/zh not_active Expired - Fee Related
- 2006-02-10 EP EP06713514A patent/EP1850120A4/en not_active Withdrawn
- 2006-02-10 KR KR1020077018439A patent/KR101140072B1/ko not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11639898B2 (en) | 2017-04-18 | 2023-05-02 | Corning Incorporated | Substrate edge test apparatus, system, and method |
TWI822675B (zh) * | 2017-04-18 | 2023-11-21 | 美商康寧公司 | 用於基板邊緣測試之設備、系統和方法 |
Also Published As
Publication number | Publication date |
---|---|
JP4626982B2 (ja) | 2011-02-09 |
KR20070107700A (ko) | 2007-11-07 |
EP1850120A1 (en) | 2007-10-31 |
JP2006220540A (ja) | 2006-08-24 |
TWI330253B (zh) | 2010-09-11 |
EP1850120A4 (en) | 2011-11-23 |
CN101115988A (zh) | 2008-01-30 |
WO2006085618A1 (ja) | 2006-08-17 |
US8120654B2 (en) | 2012-02-21 |
KR101140072B1 (ko) | 2012-04-30 |
US20100149327A1 (en) | 2010-06-17 |
CN101115988B (zh) | 2010-05-19 |
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