KR100355484B1 - 막으로 코팅된 기판을 지지하기 위한 기구 및 방법 - Google Patents
막으로 코팅된 기판을 지지하기 위한 기구 및 방법 Download PDFInfo
- Publication number
- KR100355484B1 KR100355484B1 KR1019990060118A KR19990060118A KR100355484B1 KR 100355484 B1 KR100355484 B1 KR 100355484B1 KR 1019990060118 A KR1019990060118 A KR 1019990060118A KR 19990060118 A KR19990060118 A KR 19990060118A KR 100355484 B1 KR100355484 B1 KR 100355484B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- stage
- film
- support
- film forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 121
- 238000000034 method Methods 0.000 title claims abstract description 13
- 230000015572 biosynthetic process Effects 0.000 claims description 21
- 239000004065 semiconductor Substances 0.000 claims description 13
- 239000011521 glass Substances 0.000 claims description 12
- 238000006073 displacement reaction Methods 0.000 claims description 5
- 239000010408 film Substances 0.000 abstract description 65
- 239000010409 thin film Substances 0.000 abstract description 35
- 238000005336 cracking Methods 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 28
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 238000010276 construction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting substrates others than wafers, e.g. chips
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
Claims (13)
- 막 형성 장치에 사용되고 막으로 코팅되는 기판을 지지하기 위한 기구에 있어서,기판 상에 막을 형성하기 위한 막 형성 장치로 이송된 기판을 수용하기 위한 스테이지와,스테이지가 기판을 수용하는 기판 수용 위치로부터 스테이지의 기판 지지면이 수직한 또는 실질적으로 수직한 막 형성 위치까지 기판을 지지하는 스테이지를 각변위시키기 위한 축 부재와,스테이지가 막 형성 위치로 각변위될 때 하방으로 대면하는 기판의 단부면을 지지하기 위해 스테이지의 기판 지지면으로부터 돌출되도록 제공되는 복수개의 지지 부재와,지지 부재를 이동시키기 위한 이동 수단을 포함하는 것을 특징으로 하는 기구.
- 제1항에 있어서, 이동 수단은 지지 부재를 스테이지 상에서 3차원 방향 중 한 방향에 평행하게 이동시키거나 지지 부재를 스테이지 상에서 회전 이동시키는 것을 특징으로 하는 기구.
- 제1항에 있어서, 이동 수단은 지지 부재를 축 부재를 향해 또는 축 부재로부터 멀리 이동시키는 것을 특징으로 하는 기구.
- 제1항에 있어서, 이동 수단은 복수개의 지지 부재와 함께 연결되어 있고 복수개의 지지 부재를 단일 작동으로 이동시키는 것을 특징으로 하는 기구.
- 제1항에 있어서, 복수개의 이동 수단은 복수개의 지지 부재를 독립적으로 이동시키기 위해 복수개의 지지 부재와 각각 연결되도록 제공되는 것을 특징으로 하는 기구.
- 제1항에 있어서, 이동 수단은 액츄에이터인 것을 특징으로 하는 기구.
- 제1항에 있어서, 복수개의 지지 부재는 각각 원기둥 형상으로 형성되는 것을 특징으로 하는 기구.
- 제1항에 있어서, 기판은 유리판 또는 반도체 웨이퍼인 것을 특징으로 하는 기구.
- 막 형성 장치에 사용되고 막으로 코팅된 기판을 지지하기 위한 방법에 있어서,막 형성 장치로 이송된 기판인 막으로 코팅될 기판을 복수개의 지지 부재가가동식으로 제공된 스테이지 상에 위치시키는 단계와,기판이 스테이지에 의해 수용되는 기판 수용 위치로부터 스테이지의 기판 지지면이 수직 또는 실질적으로 수직하고 기판의 단부면이 지지 부재에 의해 하부로부터 지지되는 막 형성 위치까지 기판이 위치된 스테이지를 각변위시키는 단계와,막 형성 후에 막 형성 위치로부터 기판 수용 위치로 스테이지를 다시 각변위시키는 단계와,스테이지가 기판 수용 위치로 복귀한 후에 지지 부재를 이동시키는 단계와,지지 부재의 이동 후에 막으로 코팅된 기판을 막 형성 장치의 스테이지 밖으로 이송하는 단계를 포함하는 방법.
- 제9항에 있어서, 지지 부재를 이동시키는 단계에서, 지지 부재는 스테이지 상에서 3차원 방향 중 한 방향에 평행하게 이동되거나 스테이지 상에서 회전 이동되는 것을 특징으로 하는 방법.
- 제9항에 있어서, 지지 부재를 이동시키는 단계에서, 지지 부재는 스테이지를 각변위시키기 위한 축 부재를 향한 방향 또는 축 부재로부터 멀어지는 방향으로 이동되는 것을 특징으로 하는 방법.
- 제9항에 있어서, 기판은 유리판 또는 반도체 웨이퍼인 것을 특징으로 하는 방법.
- 제1항에 있어서, 상기 지지 부재는 기판의 일측면에만 설치되는 것을 특징으로 하는 기구.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP36531098A JP3695971B2 (ja) | 1998-12-22 | 1998-12-22 | 成膜装置および成膜方法 |
JP98-365310 | 1998-12-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20000048313A KR20000048313A (ko) | 2000-07-25 |
KR100355484B1 true KR100355484B1 (ko) | 2002-10-11 |
Family
ID=18483950
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019990060118A Expired - Lifetime KR100355484B1 (ko) | 1998-12-22 | 1999-12-22 | 막으로 코팅된 기판을 지지하기 위한 기구 및 방법 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20030172874A1 (ko) |
EP (1) | EP1014425B1 (ko) |
JP (1) | JP3695971B2 (ko) |
KR (1) | KR100355484B1 (ko) |
DE (1) | DE69938120T2 (ko) |
TW (1) | TW457615B (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102340103B1 (ko) | 2021-09-01 | 2021-12-17 | (주)한테크 | 초박형 유리기판 이송장치 및 이송방법 |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100819369B1 (ko) * | 2001-12-31 | 2008-04-04 | 엘지.필립스 엘시디 주식회사 | 노광용 척 |
JP4364196B2 (ja) | 2005-01-05 | 2009-11-11 | 三星モバイルディスプレイ株式會社 | トレイ用整列システム |
WO2010055876A1 (ja) * | 2008-11-14 | 2010-05-20 | 株式会社アルバック | 有機薄膜蒸着装置、有機el素子製造装置、及び有機薄膜蒸着方法 |
KR101470883B1 (ko) * | 2008-12-29 | 2014-12-10 | 주식회사 케이씨텍 | 원자층 증착장치 |
WO2011024853A1 (ja) * | 2009-08-26 | 2011-03-03 | キヤノンアネルバ株式会社 | 成膜装置 |
US8898928B2 (en) * | 2012-10-11 | 2014-12-02 | Lam Research Corporation | Delamination drying apparatus and method |
CN104516131B (zh) * | 2014-12-24 | 2018-02-13 | 合肥京东方光电科技有限公司 | 一种贴膜治具 |
CN105172302A (zh) * | 2015-08-24 | 2015-12-23 | 苏州英多智能科技股份有限公司 | 翻转式真空贴合治具 |
US9960068B1 (en) | 2016-12-02 | 2018-05-01 | Lam Research Corporation | Moment cancelling pad raising mechanism in wafer positioning pedestal for semiconductor processing |
US9892956B1 (en) | 2016-10-12 | 2018-02-13 | Lam Research Corporation | Wafer positioning pedestal for semiconductor processing |
US10573549B2 (en) | 2016-12-01 | 2020-02-25 | Lam Research Corporation | Pad raising mechanism in wafer positioning pedestal for semiconductor processing |
IT201700119768A1 (it) * | 2017-10-23 | 2019-04-23 | Incitec Production S R L | Dispositivo per l'accoppiamento di porzioni di materiale |
CN109850238A (zh) * | 2019-01-31 | 2019-06-07 | 武汉精毅通电子技术有限公司 | 显示面板贴膜装置 |
CN110203698B (zh) * | 2019-05-24 | 2021-11-09 | 上海提牛机电设备有限公司 | 一种方形件的搬运翻转装置 |
CN112117204B (zh) * | 2020-09-10 | 2022-10-14 | 安徽龙芯微科技有限公司 | 一种封装结构的制作方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5840837A (ja) * | 1981-09-02 | 1983-03-09 | Tokyo Ohka Kogyo Co Ltd | クランプ装置 |
JPH08107076A (ja) * | 1994-10-06 | 1996-04-23 | Sony Corp | バッチ式減圧cvd装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3288554B2 (ja) * | 1995-05-29 | 2002-06-04 | 株式会社日立製作所 | イオン注入装置及びイオン注入方法 |
JP3720515B2 (ja) * | 1997-03-13 | 2005-11-30 | キヤノン株式会社 | 基板処理装置及びその方法並びに基板の製造方法 |
-
1998
- 1998-12-22 JP JP36531098A patent/JP3695971B2/ja not_active Expired - Fee Related
-
1999
- 1999-12-17 TW TW088122250A patent/TW457615B/zh not_active IP Right Cessation
- 1999-12-20 DE DE69938120T patent/DE69938120T2/de not_active Expired - Lifetime
- 1999-12-20 EP EP99125447A patent/EP1014425B1/en not_active Expired - Lifetime
- 1999-12-22 KR KR1019990060118A patent/KR100355484B1/ko not_active Expired - Lifetime
- 1999-12-22 US US09/470,615 patent/US20030172874A1/en not_active Abandoned
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5840837A (ja) * | 1981-09-02 | 1983-03-09 | Tokyo Ohka Kogyo Co Ltd | クランプ装置 |
JPH08107076A (ja) * | 1994-10-06 | 1996-04-23 | Sony Corp | バッチ式減圧cvd装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102340103B1 (ko) | 2021-09-01 | 2021-12-17 | (주)한테크 | 초박형 유리기판 이송장치 및 이송방법 |
Also Published As
Publication number | Publication date |
---|---|
EP1014425A1 (en) | 2000-06-28 |
DE69938120D1 (de) | 2008-03-27 |
JP3695971B2 (ja) | 2005-09-14 |
US20030172874A1 (en) | 2003-09-18 |
DE69938120T2 (de) | 2009-02-05 |
TW457615B (en) | 2001-10-01 |
JP2000188315A (ja) | 2000-07-04 |
EP1014425B1 (en) | 2008-02-13 |
KR20000048313A (ko) | 2000-07-25 |
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