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JPS61251319A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPS61251319A
JPS61251319A JP9274685A JP9274685A JPS61251319A JP S61251319 A JPS61251319 A JP S61251319A JP 9274685 A JP9274685 A JP 9274685A JP 9274685 A JP9274685 A JP 9274685A JP S61251319 A JPS61251319 A JP S61251319A
Authority
JP
Japan
Prior art keywords
voltage
gate
fet
mosfet
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9274685A
Other languages
Japanese (ja)
Inventor
Koichi Teruyama
照山 浩一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP9274685A priority Critical patent/JPS61251319A/en
Publication of JPS61251319A publication Critical patent/JPS61251319A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To obtain a steep inverting characteristic by adopting a depletion MOSFET for a MOSFET to which an input voltage is applied to apply voltage comparison near a power supply voltage with high sensitivity. CONSTITUTION:Depletion MOSFETs are employed for a PMOSFET 1 and NMOSFET 2 connected respectively to input terminals 6, 5. When a reference voltage inputted to the terminal 6 is set near a power voltage VDD, a gate-source voltage of the FET 1 inputting the said voltage gets smaller, and since the FET 1 is of depletion type, a sufficient current flows and the FET 1 is operated at the saturated state. Since the FET 3 is connected to be operated with saturation, a bias voltage decided by the FETs 1, 3 fed to a gate of a MOSFET 4. When the comparison voltage inputted to the gate of the FET 2 approaches the reference voltage, the FET 4 is operated in saturated state and the FET 2 is operated also in the saturated state. When the input voltage to the FET 2 exceeds a reference voltage, the output is inverted immediately.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は2つの入力電圧値を比較してその大小関係によ
り出力を変化させる半導体集積回路に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor integrated circuit that compares two input voltage values and changes the output depending on the magnitude relationship.

〔発明の概要〕[Summary of the invention]

本発明は2つの入力電圧値を比較してその大小関係によ
り出力を変化させる半導体集積回路であシ、一方の入力
端子に接続されたゲート、1万の電源端子に接続され九
ソース、逆導電型の第3のMO8F]!!Tのドレイン
に接続されたドレインからなる第1導電型の第1のMO
8FI[ITと、他方の入力端子が接続されたゲート、
1万の電源端子が接続されたソース、逆導電型の第4の
MO87F!Tのドレイン、ゲニト及び第3のMOSF
ETのゲートに接続されたドレインからなる第1導電型
の第2のMO8FEITとから底シ、第3及び第4のM
OEIFFTのソースが他方の電源端子に接続し、第1
及び第2のMO8FKTをデプレッション型にすること
によυ、電源電圧付近の電圧値を感層よ(比較して出力
を急峻に反転させるようにしたものである。
The present invention is a semiconductor integrated circuit that compares two input voltage values and changes the output depending on the magnitude relationship between them, and has a gate connected to one input terminal, nine sources connected to 10,000 power supply terminals, and reverse conduction. 3rd MO8F of the mold]! ! a first MO of a first conductivity type, the drain of which is connected to the drain of T;
8FI [IT and the gate to which the other input terminal is connected,
Source with 10,000 power supply terminals connected, fourth MO87F of reverse conductivity type! T drain, genit and third MOSF
A second MO8FEIT of the first conductivity type consisting of a drain connected to the gate of the ET;
The source of OEIFFT is connected to the other power supply terminal, and the first
By making the second MO8FKT a depression type, the voltage value near the power supply voltage is compared to the sensitive layer, and the output is sharply inverted.

〔従来の技術〕[Conventional technology]

従来、第2図に示すように、PMO8PIT8のドレイ
ンとゲートと、PM08F]1CT9のゲートとNMO
8FIT 12のドレインが接続され。
Conventionally, as shown in Fig. 2, the drain and gate of PMO8PIT8, the gate of PM08F]1CT9 and NMO
8FIT 12 drains are connected.

PMO8FIT9のドレインとNMO8FmT15のド
レインが接続され% PMO日T++1!XT8及び9
のソースが1方の電源端、子31(以下VDDと称す)
に、NMO87!!!TIO及び11が他方の電源端子
30(以下711g+  と称す)に接続され、1方の
入力端子12がNMO日FF1T10のゲート(C1他
方の入力端子がNMOSFET11のゲートに接続され
、各々の入力端子12及び13に加えられた電圧を比較
してその大小関係により出力を変化させる半導体集積回
路が知られている。
The drain of PMO8FIT9 and the drain of NMO8FmT15 are connected and % PMO day T++1! XT8 and 9
The source is one power terminal, terminal 31 (hereinafter referred to as VDD)
NMO87! ! ! TIO and 11 are connected to the other power supply terminal 30 (hereinafter referred to as 711g+), one input terminal 12 is connected to the gate of NMOFFET10 (C1), and the other input terminal is connected to the gate of NMOSFET11, and each input terminal 12 is connected to the gate of NMOSFET11. A semiconductor integrated circuit is known that compares the voltages applied to the terminals 1 and 13 and changes the output depending on the magnitude relationship.

この回路は比較すべき基準電圧を例えば入力端子12に
加えることにより飽和接続されたPMO81FIT8と
NMOslP?!!T10o電圧電流特性ニよシ定まる
バイアス電位がPMOEIFET9のゲートに印加され
ることになる。比較されるべき電圧を入力端子13に加
えて除々に変化させた場合。
This circuit connects PMO81FIT8 and NMOslP?, which are connected to saturation by applying a reference voltage to be compared to the input terminal 12, for example. ! ! A bias potential determined by T10o voltage-current characteristics is applied to the gate of PMOEIFET9. When the voltage to be compared is applied to the input terminal 13 and gradually changed.

基準電圧付近においてPMO8F’1ltT9及びNM
O8F’KT 11が飽和領域で動作していれば、入力
端子13の電圧が入力端子12に入力されている基準電
圧を越えると出力14のレベルが急激に反転するという
ものである。
PMO8F'1ltT9 and NM near the reference voltage
If the O8F'KT 11 is operating in the saturation region, when the voltage at the input terminal 13 exceeds the reference voltage input to the input terminal 12, the level of the output 14 will be rapidly reversed.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかし、従来の回路は、基準電圧が電源電圧付近になる
と、出力14の反転特性が悪化し、オフセット電圧が大
きくなるという欠点があった。こ ′の状態を従来例を
示す第3図により更に詳しく説明する。入力12が高く
なるとNMOEIFKTloは曲線18のような電流電
圧特性をもちPMO8711iτ8の電流電圧特性曲線
15とによりパイアス電圧V、が定められた時、NMO
81F]]’l’IOは非飽和領域で動作することにな
る。
However, the conventional circuit has a drawback that when the reference voltage becomes close to the power supply voltage, the inversion characteristic of the output 14 deteriorates and the offset voltage increases. This state will be explained in more detail with reference to FIG. 3, which shows a conventional example. When the input 12 becomes high, NMOEIFKTlo has a current-voltage characteristic as shown in the curve 18, and when the bias voltage V is determined by the current-voltage characteristic curve 15 of the PMO8711iτ8, the NMOEIFKTlo
81F]]'l'IO will operate in the non-saturation region.

バイアス電圧V、がゲートに印加されるPM08FIC
’l’ 9はバイアス電圧’VOO時は曲線16に示す
電流電圧特性をもつことになる。比較されるべき電圧を
入力13に加えていくと、8M08?KT 11の電流
電圧特性は、入力13の電圧が入力12の電圧よシ低い
時は曲線17で、一致した時には曲線18で、高くなっ
た時は曲線19で示される。そのためPM08F’ll
!T9の電流電圧特性曲線16と曲線17,18.19
の交点で出力14の出力電圧が定められるが、1M08
7mT11は非飽和領域で動作しているために、出力1
4の電圧変化は曲線17と曲I!16の交点で得られる
電圧V、から曲線19と曲線16との交点で得られる電
圧v1までしか得られないことになる。そのために出力
14の反転特性は第6図の曲線27で示されるように鈍
くなってしまうのである。入力13の電圧を更に上げる
と出力14の出力が大きく変化するが、それでは入カイ
2に加えちれている電圧との差が大きく、つまフオフセ
ット電圧が大きくなってし1う。
PM08FIC with bias voltage V, applied to the gate
'l' 9 has a current-voltage characteristic shown in curve 16 when bias voltage 'VOO' is applied. When the voltage to be compared is applied to input 13, 8M08? The current-voltage characteristics of KT 11 are shown by curve 17 when the voltage at input 13 is lower than the voltage at input 12, by curve 18 when they match, and by curve 19 when they are higher. Therefore PM08F'll
! Current-voltage characteristic curve 16 and curve 17, 18.19 of T9
The output voltage of output 14 is determined at the intersection of 1M08
7mT11 operates in the non-saturation region, so the output 1
4 voltage change is curve 17 and song I! Only the voltage V obtained at the intersection of curves 19 and 16 can be obtained up to the voltage v1 obtained at the intersection of curves 19 and 16. Therefore, the reversal characteristic of the output 14 becomes dull as shown by curve 27 in FIG. If the voltage at the input 13 is further increased, the output at the output 14 will change significantly, but this will result in a large difference from the voltage applied to the input 2, and the pinch offset voltage will increase.

そこで本発明は、従来のこのような欠点を解決するため
、比較すべき基準電圧が電源電圧付近であっても、出力
140反転特性が急峻でオフセット電圧の小さい半導体
集積回路を得ることを目的としている。
Therefore, in order to solve these conventional drawbacks, the present invention aims to obtain a semiconductor integrated circuit with a steep output 140 reversal characteristic and a small offset voltage even when the reference voltage to be compared is near the power supply voltage. There is.

〔問題点を解決するための手段〕[Means for solving problems]

上記問題点を解決するために、本発明は、1方の入力端
子に接続されたゲート、1方の電源端子に接続されたソ
ース、逆導電型の第5のMO87m!iTのドレインに
接続されたドレインからなる第1導i型のM OB F
 ]!! T、他方の入力端子が接続されたゲート% 
1万の電源端子が接続され九ソース、逆導電型の第4の
MO87I!!Tのドレイン、ゲート、及び第5のMO
EIIPII!Tのゲートに接続されたドレインからな
る第1導lic型のM’0I3FE!?、第3及び第4
のMO81PIliTのソースを他方の電源端子に接続
した槽底とし、第1及び第2のMOEIFl[tTはデ
プレッション型にすることにより、電源電圧付近の基準
電圧に対して、出力が急峻な反転特性をもつようにした
In order to solve the above problems, the present invention provides a fifth MO87m! having a gate connected to one input terminal, a source connected to one power supply terminal, and a fifth MO87m! of opposite conductivity type. A first conductive i-type MOB F whose drain is connected to the drain of iT.
]! ! T, gate % to which the other input terminal is connected
4th MO87I with 10,000 power supply terminals connected, 9 sources, and reverse conductivity type! ! T drain, gate, and fifth MO
EIIPII! M'0I3FE of the first conductive lic type consisting of the drain connected to the gate of T! ? , third and fourth
The source of the MO81PIliT is the bottom of the tank connected to the other power supply terminal, and the first and second MOEIFl[tT are depletion type, so that the output has a steep inversion characteristic with respect to the reference voltage near the power supply voltage. I made it last.

〔作用〕[Effect]

上記のように構放された半導体集積回路において、基準
電圧が電源電圧付近に設定された時、この電圧を入力と
する第1のMO8FInTOゲート・ソース間電圧が小
さくなるが、このMO8Fm!!Tはデプレッション型
であるため十分な電流を流すことができ、飽和状態で動
作させることができる。
In the above-described semiconductor integrated circuit, when the reference voltage is set near the power supply voltage, the first MO8FInTO gate-source voltage that receives this voltage as input becomes small, but this MO8Fm! ! Since T is a depletion type, a sufficient current can flow therethrough and it can be operated in a saturated state.

第3のMO8FICTも飽和接続されているので。Since the third MO8FICT is also connected in saturation.

sgl及び第5のMO8FITにより定められたバイア
ス電圧が第4のMO8’FKTのゲートに印加される、
第2のMOSFETのゲートに入力される比較されるべ
き電圧が基準電圧に近すいた時。
sgl and a bias voltage determined by the fifth MO8FIT is applied to the gate of the fourth MO8′FKT;
When the voltage to be compared that is input to the gate of the second MOSFET approaches the reference voltage.

第4のMO8FI!!Tは飽和状態で動作することにな
シ、また第2のMO8FIIITもゲート・y−スミ圧
が小さくなるため飽和状態で動作することになる。その
ため、第2のMOSFETのゲートに入力される電圧が
第1のMO8F11tTのゲートに加えられている基準
電圧を越えると出力が直ちに反転することになシ、急峻
な反転特性を得ることができるのである。
4th MO8FI! ! T does not operate in a saturated state, and the second MO8FIIIT also operates in a saturated state because the gate-y-sum pressure becomes small. Therefore, when the voltage input to the gate of the second MOSFET exceeds the reference voltage applied to the gate of the first MO8F11tT, the output does not immediately invert, and a sharp inversion characteristic can be obtained. be.

〔実施例〕〔Example〕

以下に本発明の実施例を図面にもとすいて説明する。第
1図において、デプレッション型PMO8FKT1のゲ
ートの入力端子6 f: VDD31に接続して基準電
圧を71)D  としている。
Embodiments of the present invention will be described below with reference to the drawings. In FIG. 1, the input terminal 6f of the gate of the depression type PMO8FKT1 is connected to VDD31 and the reference voltage is set to 71)D.

PMOEIPKT 10ソースはynn31に接続し、
ドレインをNMO87mT3のドレインとゲート及びN
MO8Fm!1T4のゲートに接続する。比較すべき電
圧の入力端子5がゲートに接続されたデプレッション型
PMO87m!!T2のソースはVD131に接続され
たドレインはNMO81FIIiT4のドレインと接続
され出力端子となっている。
PMOEIPKT 10 source connects to ynn31,
Connect the drain to the drain and gate of NMO87mT3 and N
MO8Fm! Connect to the gate of 1T4. A depression type PMO87m with the input terminal 5 of the voltage to be compared connected to the gate! ! The source of T2 is connected to VD131, and the drain is connected to the drain of NMO81FIIiT4, serving as an output terminal.

NMO87FfT!及び40ンースはyas30に接続
されている。(この場合ysg50を接地電位としてい
る。)PM08F]nT6のゲート・ソース間電圧はO
vであるがデプレッション型であるために第5図の曲線
22に示す電圧電流特性を示す、NMOE1?1!IT
は飽和接続(ドレインとゲートが接続)しているため曲
線20に示す電流電圧特性をもつため、PMO8FE!
T1とNMO8FIItTlを流れる電流値が一致する
バイアス電圧V、に設定される。このバイアス電圧V、
がNMO8FmT4のゲート電圧となるため、NMO8
P]lCτ4の電流電圧特性は曲線24で示される。出
カフがバイアス電圧V、の付近の時NMO8Fm!iT
4は飽和状態で動作していることになる。さて、デプレ
ッション型PMO8IPI!!T2のゲートに印加され
る入力5を変化させていくとynn51の電圧よルわず
かに低い時は、このPMO8Fm!!T2もドレイン・
ソース間電圧に比ベゲート・ソース間電圧よシ充分低い
ため飽和領域で動作し、曲線21で示す電流電圧特性を
もっている。そのため出力17の電圧は曲線24と曲線
21の交点であるvlなる電圧になっている7人力5が
入力4の電圧と一致するとPM08Fmτ2の電流電圧
特性は曲線22の如くなシ、わずかに高くなるとI’M
O81PIIIT2のゲート・ソース間電圧が負になっ
てしまうがデプレッション型であるため充分電流を流す
ことができ曲線23に示すような特性となる−この時曲
線24と曲線23の電流値が一致する電圧がvlなる電
圧となる。
NMO87FfT! and 40 are connected to yas30. (In this case, ysg50 is set to the ground potential.) The gate-source voltage of PM08F]nT6 is O
NMOE1?1!, which exhibits the voltage-current characteristics shown by curve 22 in FIG. 5 because it is a depression type. IT
Since PMO8FE! has the current-voltage characteristics shown in curve 20 because it is connected in saturation (the drain and gate are connected), PMO8FE!
A bias voltage V is set so that the current values flowing through T1 and NMO8FIItTl match. This bias voltage V,
is the gate voltage of NMO8FmT4, so NMO8
The current-voltage characteristic of P]lCτ4 is shown by a curve 24. When the output cuff is near the bias voltage V, NMO8Fm! iT
4 means that it is operating in a saturated state. Now, depression type PMO8IPI! ! As the input 5 applied to the gate of T2 is changed, when the voltage of ynn51 is slightly lower, this PMO8Fm! ! T2 is also a drain.
Since the gate-to-source voltage is sufficiently lower than the source-to-source voltage, it operates in the saturation region and has the current-voltage characteristics shown by curve 21. Therefore, the voltage of the output 17 is the voltage vl, which is the intersection of the curves 24 and 21.7 When the human power 5 matches the voltage of the input 4, the current-voltage characteristic of PM08Fmτ2 becomes as shown in the curve 22, and becomes slightly higher. I'M
The voltage between the gate and source of O81PIIIT2 becomes negative, but since it is a depression type, sufficient current can flow, resulting in the characteristics shown in curve 23 - At this time, the voltage at which the current values of curve 24 and curve 23 match becomes the voltage vl.

つまシ、入力5の電圧が基準電圧ynn510前後を通
過することによ゛シ出カフはV、なる電圧からvlなる
電圧へ急峻な変化をすることになる。
As the voltage at the input 5 passes around the reference voltage ynn510, the output cuff sharply changes from the voltage V to the voltage Vl.

すなわち第6図の曲線25に示すような急峻な出力反転
特性をもつことができるのである。
That is, it is possible to have a steep output reversal characteristic as shown by curve 25 in FIG.

第4図は本発明の他の実施例を示すもので、定電流源8
で駆動するようにしたものである。この場合各々のMO
8FETのゲート・ソース間電圧が低くなるため飽和領
域で動作する電圧範囲が広(なシ第6図の曲線26に示
すように、よ〕急峻な反転特性を得ることができるうえ
に、定電流であるために動作電流を一定に保つことがで
き電源の安定化が図れる。なお曲線26の出力電圧が7
DD  側で下がっているのは定電流回路8によりPM
o 8 FIIXT 1及び2のソース32がVDD5
1よ〕も低くなっているためである。
FIG. 4 shows another embodiment of the present invention, in which a constant current source 8
It is designed to be driven by In this case each MO
Since the gate-source voltage of the 8FET is lower, the voltage range in which it operates in the saturation region is wider (as shown in curve 26 in Figure 6), and it is possible to obtain a steep inversion characteristic. Therefore, the operating current can be kept constant and the power supply can be stabilized.It should be noted that the output voltage of curve 26 is 7
What is decreasing on the DD side is the PM caused by the constant current circuit 8.
o 8 FIIXT 1 and 2 source 32 is VDD5
1] is also lower.

実施例において、PMO8F’llXT1の入力6を基
準電圧としたが、PM08FI!fT2の入力5を基準
電圧として、FMOEIFE!T1の火力6を変えても
、出カフの反転特性の極性が反対になるだけであシ、ま
た基準電圧として7rrD51を設定したがデプレッシ
ョンM0日F1nTが飽和領域で動作させることができ
る電圧値なら特に問題はない。さらに定電流回路8を’
VDD  側に設けたが、これをyss  側に設けて
も同様の効果が得られることは言うまでもない。
In the embodiment, input 6 of PMO8F'llXT1 was used as the reference voltage, but PM08FI! Using input 5 of fT2 as the reference voltage, FMOEIFE! Even if the thermal power 6 of T1 is changed, the polarity of the reversal characteristic of the output cuff will be reversed.Also, although 7rrD51 was set as the reference voltage, if the voltage value allows the depression M0 and F1nT to operate in the saturation region. There are no particular problems. Furthermore, the constant current circuit 8'
Although it is provided on the VDD side, it goes without saying that the same effect can be obtained even if it is provided on the yss side.

また、  ygs+  付近の電圧値を比較する場合に
は第1図に示した回路を構成するMO8FBiT1 。
Moreover, when comparing voltage values near ygs+, MO8FBiT1 constitutes the circuit shown in FIG.

2.5,4.の導電型を各々反対の導電型のMOSFE
Tとし、電源7ss30とVDD31の極性を反対にす
れば全く同様の効果を得ることができる。
2.5,4. MOSFE of opposite conductivity type
If the polarity of the power source 7ss30 and VDD31 is reversed, exactly the same effect can be obtained.

〔発明の効果〕〔Effect of the invention〕

本発明は以上説明したように、入力電圧が印加されるM
OSFETをデプレッション盤にすることによりミ源電
圧付近の電圧比較を感層よ〈行ない、急峻な反転特性を
得ることができるという効果がある。
As explained above, the present invention provides M
By using the OSFET as a depression disk, voltage comparison near the source voltage can be performed as a sensitive layer, and there is an effect that a steep reversal characteristic can be obtained.

【図面の簡単な説明】 第1図は本発明による電圧比較回路の回路図。 第2図は、従来の電圧比較回路の回路図、第3図は、従
来の電圧比較回路の動作を示す電圧電流特性図、第4図
は本発明による他の電圧比較回路の回路図、第5図は本
発明による電圧比較回路の動作を示す電流電圧特性図、
第6図は1本発明及び従来の回路の出力反転特性図であ
る。 1・・・第1導電屋MO8711!T 2・−第1導電型M087EltT 5 ・・・第2 導電m M OEI F K T4・
・・第2導電ff1M011117IIIT5・・・入
力端子 6・・・入力端子 8・・・電電流源 30・・・電源端子 51・・・電源端子 以上 出願人 セイコー電子工業株式会社 SS 本発明による和の1i比比較口路のrjJ路図第4図 第5図
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a circuit diagram of a voltage comparison circuit according to the present invention. FIG. 2 is a circuit diagram of a conventional voltage comparison circuit, FIG. 3 is a voltage-current characteristic diagram showing the operation of the conventional voltage comparison circuit, and FIG. 4 is a circuit diagram of another voltage comparison circuit according to the present invention. Figure 5 is a current-voltage characteristic diagram showing the operation of the voltage comparison circuit according to the present invention;
FIG. 6 is an output inversion characteristic diagram of the present invention and a conventional circuit. 1... 1st conductive shop MO8711! T 2・-1st conductivity type M087EltT 5 ... 2nd conductivity m M OEI F K T4・
...Second conductive ff1M011117IIIT5...Input terminal 6...Input terminal 8...Current source 30...Power supply terminal 51...Power supply terminal and above Applicant: Seiko Electronics Co., Ltd. SS Japanese wire according to the present invention 1i ratio comparison route rjj route diagram Figure 4 Figure 5

Claims (1)

【特許請求の範囲】 4方の入力端子に接続されたゲート、1方の電源端子が
接続されたソース、逆導電型の第3のMOSFETのド
レインに接続されたドレインからなる第1導電型の第1
のMOSFETと、他方の入力端子が接続されたゲート
、1方の電源端子が接続されたソース、逆導電型の第4
のM0SFETのドレイン、ゲート及び前記第3のMO
SFETのゲートに接続されたドレインからなる第1導
電型の第2のMOSFETとから成り、前記第3及び第
4のMOSFETはソースが他方の電源端子に接続され
、 前記第1及び第2のMOSFETはデプレツシヨン型で
あることを特徴とする半導体集積回路。 (2)前記1方の電源端子又は前記他方の電源端子が定
電流源により駆動されていることを特徴とする特許請求
の範囲第1項記載の半導体集積回路。
[Claims] A first conductivity type MOSFET consisting of a gate connected to four input terminals, a source connected to one power supply terminal, and a drain connected to the drain of a third MOSFET of opposite conductivity type. 1st
MOSFET, a gate connected to the other input terminal, a source connected to one power supply terminal, and a fourth MOSFET of opposite conductivity type.
The drain and gate of the MOSFET and the third MOSFET
a second MOSFET of the first conductivity type, the drain of which is connected to the gate of the SFET; the sources of the third and fourth MOSFETs are connected to the other power supply terminal; is a semiconductor integrated circuit characterized by being a depression type. (2) The semiconductor integrated circuit according to claim 1, wherein the one power supply terminal or the other power supply terminal is driven by a constant current source.
JP9274685A 1985-04-30 1985-04-30 Semiconductor integrated circuit Pending JPS61251319A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9274685A JPS61251319A (en) 1985-04-30 1985-04-30 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9274685A JPS61251319A (en) 1985-04-30 1985-04-30 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPS61251319A true JPS61251319A (en) 1986-11-08

Family

ID=14062977

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9274685A Pending JPS61251319A (en) 1985-04-30 1985-04-30 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS61251319A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000156616A (en) * 1998-11-19 2000-06-06 Sony Corp Multi-input differential amplifier circuit

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53149747A (en) * 1977-06-01 1978-12-27 Seiko Instr & Electronics Ltd Voltage comparator circuit
JPS5640331A (en) * 1979-09-11 1981-04-16 Nec Corp High-speed logical operation circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53149747A (en) * 1977-06-01 1978-12-27 Seiko Instr & Electronics Ltd Voltage comparator circuit
JPS5640331A (en) * 1979-09-11 1981-04-16 Nec Corp High-speed logical operation circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000156616A (en) * 1998-11-19 2000-06-06 Sony Corp Multi-input differential amplifier circuit

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