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JPS52104982A - Method of calibrating energy of semiiconductor for radiation - Google Patents

Method of calibrating energy of semiiconductor for radiation

Info

Publication number
JPS52104982A
JPS52104982A JP2167476A JP2167476A JPS52104982A JP S52104982 A JPS52104982 A JP S52104982A JP 2167476 A JP2167476 A JP 2167476A JP 2167476 A JP2167476 A JP 2167476A JP S52104982 A JPS52104982 A JP S52104982A
Authority
JP
Japan
Prior art keywords
semiiconductor
radiation
calibrating energy
calibrating
energy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2167476A
Other languages
Japanese (ja)
Other versions
JPS5442792B2 (en
Inventor
Toshihiko Ooura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP2167476A priority Critical patent/JPS52104982A/en
Publication of JPS52104982A publication Critical patent/JPS52104982A/en
Publication of JPS5442792B2 publication Critical patent/JPS5442792B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Light Receiving Elements (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP2167476A 1976-02-28 1976-02-28 Method of calibrating energy of semiiconductor for radiation Granted JPS52104982A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2167476A JPS52104982A (en) 1976-02-28 1976-02-28 Method of calibrating energy of semiiconductor for radiation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2167476A JPS52104982A (en) 1976-02-28 1976-02-28 Method of calibrating energy of semiiconductor for radiation

Publications (2)

Publication Number Publication Date
JPS52104982A true JPS52104982A (en) 1977-09-02
JPS5442792B2 JPS5442792B2 (en) 1979-12-15

Family

ID=12061588

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2167476A Granted JPS52104982A (en) 1976-02-28 1976-02-28 Method of calibrating energy of semiiconductor for radiation

Country Status (1)

Country Link
JP (1) JPS52104982A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62240846A (en) * 1986-04-14 1987-10-21 Seiko Instr & Electronics Ltd Calibration for fluorescent x-ray measuring apparatus
JP2006029986A (en) * 2004-07-16 2006-02-02 Fuji Electric Systems Co Ltd Radiation measuring device
JP2009243998A (en) * 2008-03-31 2009-10-22 Hitachi Ltd Radiation inspection device and calibration method
JP2018021899A (en) * 2016-08-05 2018-02-08 清華大学Ｔｓｉｎｇｈｕａ Ｕｎｉｖｅｒｓｉｔｙ Method and device for reconstituting energy spectrum detected by probe

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010107261A (en) * 2008-10-29 2010-05-13 Shimadzu Corp Fluorescent x-ray analyzer
JP6009975B2 (en) * 2013-03-06 2016-10-19 日本電子株式会社 Radiation detector and sample analyzer

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62240846A (en) * 1986-04-14 1987-10-21 Seiko Instr & Electronics Ltd Calibration for fluorescent x-ray measuring apparatus
JP2006029986A (en) * 2004-07-16 2006-02-02 Fuji Electric Systems Co Ltd Radiation measuring device
JP2009243998A (en) * 2008-03-31 2009-10-22 Hitachi Ltd Radiation inspection device and calibration method
JP2018021899A (en) * 2016-08-05 2018-02-08 清華大学Ｔｓｉｎｇｈｕａ Ｕｎｉｖｅｒｓｉｔｙ Method and device for reconstituting energy spectrum detected by probe
US10649104B2 (en) 2016-08-05 2020-05-12 Tsinghua University Methods and apparatuses for reconstructing incident energy spectrum for a detector

Also Published As

Publication number Publication date
JPS5442792B2 (en) 1979-12-15

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