JPS62240846A - Calibration for fluorescent x-ray measuring apparatus - Google Patents
Calibration for fluorescent x-ray measuring apparatusInfo
- Publication number
- JPS62240846A JPS62240846A JP8557286A JP8557286A JPS62240846A JP S62240846 A JPS62240846 A JP S62240846A JP 8557286 A JP8557286 A JP 8557286A JP 8557286 A JP8557286 A JP 8557286A JP S62240846 A JPS62240846 A JP S62240846A
- Authority
- JP
- Japan
- Prior art keywords
- fluorescent
- energy
- ray
- calibration
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005855 radiation Effects 0.000 claims abstract description 14
- 238000000034 method Methods 0.000 claims description 2
- 238000012937 correction Methods 0.000 abstract description 12
- 238000010586 diagram Methods 0.000 description 4
- 230000005284 excitation Effects 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明はエネルギー分散型の蛍光X11測定全般に関す
るものである。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to energy dispersive fluorescence X11 measurement in general.
(発明の概要)
本発明はエネルギー分数型の蛍光X線測定@直に於て、
二種類以上の異ったエネルギーの蛍光X線を発生する校
正用試料を用い、各エネルギーの蛍光X$2それぞれに
ついてチャンネル数とX#!強度の補正を行うことによ
って、広いエネルギー域で正確な蛍光X線測定装置の校
正が行えるようにしたものである。(Summary of the invention) The present invention provides energy fractional fluorescent X-ray measurement @ directly.
Using a calibration sample that generates two or more types of fluorescent X-rays with different energies, calculate the number of channels and X# for each fluorescence X$2 of each energy! By correcting the intensity, it is possible to accurately calibrate the fluorescent X-ray measuring device in a wide energy range.
(従来の技術)
蛍光X1g測定装置の校正は、校正用試料から発生した
ある一種類のエネルギーの蛍光X線にのみ注目し、注目
した蛍光xIaのチャンネル数とX線強度とに補正を加
え、他のエネルギーのXSについては、補正量はそのX
線の持つエネルギーに比例するとしてチャンネル数の補
正を行い、あるいは標準値との強度比はそのX線の持つ
エネルギーどは無関係であるとしてX線強度の補正を行
っていた。(Prior art) Calibration of a fluorescence X1g measuring device focuses only on fluorescent X-rays of one type of energy generated from a calibration sample, and corrects the number of channels and X-ray intensity of the focused fluorescence xIa. For XS of other energies, the correction amount is that
The number of channels has been corrected on the basis that it is proportional to the energy of the X-ray, or the X-ray intensity has been corrected on the basis that the intensity ratio with the standard value is unrelated to the energy of the X-ray.
(発明が解決しようとする問題点)
校正用の蛍光XIQとしである・−穂類のエネルギーに
のみ注目し、他のエネルギーの蛍光X線については、チ
ャンネル補正量はその蛍光xI2の持つエネルギーに比
例し、あるいは標準値との強度比はその蛍光X線の持つ
エネルギーとは無関係であるという仮定のもとに全エネ
ルギー域に於る校正を行った場合、これらの仮定が成り
立たない時、例えばチャンネル補正量がその蛍光X線の
持つエネルギーに比例せず、折れ曲ったりオフセットが
存在する時、あるいは標準値との強度比がその蛍光X線
の持つエネルギーの影響を受ける時等は、真に補正すべ
きはと実際に補正される准とが大きくくい違ってしまう
という問題がある。(Problem to be solved by the invention) Fluorescence XIQ for calibration focuses only on the energy of panicles, and for fluorescent X-rays with other energies, the channel correction amount is based on the energy of the fluorescence xI2. If calibration is performed in the entire energy range based on the assumption that the intensity ratio is proportional or that the intensity ratio with the standard value is unrelated to the energy of the fluorescent X-ray, when these assumptions do not hold, for example When the channel correction amount is not proportional to the energy of the fluorescent X-ray and there is a bend or offset, or when the intensity ratio with the standard value is affected by the energy of the fluorescent X-ray, the true There is a problem in that there is a large difference between what should be corrected and what is actually corrected.
(問題点を解決するための手段)
以上の問題を解決するために、校正用の蛍光X線としで
ある一種類のエネルギーのみではなく、複数のエネルギ
ーの蛍光XI!ilを使用し、これらをマルチチャンネ
ルアナライザによって同時に測定することにより、複数
のエネルギーで同時に校正を行う。更に各エネルギー間
の補正値を内挿することにより、校正に使用しなかった
エネルギーの蛍光X線についても、真に補正すべき世に
近い頃の補正を加える。(Means for Solving the Problems) In order to solve the above problems, instead of using only one type of energy as a fluorescent X-ray for calibration, we used fluorescent XI of multiple energies! Calibration is performed at multiple energies simultaneously by using il and measuring them simultaneously with a multichannel analyzer. Furthermore, by interpolating correction values between each energy, corrections are applied to fluorescent X-rays of energies not used for calibration, which are close to the time when they should really be corrected.
(実施例)
以下図面とともに本発明の好適な実施例について説明す
る。第1図は本発明のブロックダイレグラムである。図
中、?1@1で示されるものは放射Ia源であり、ここ
より放射される励起放射線2が校正用試料3に照射され
る。ここで本図には示していないが、放射線源1と校正
用試料3との間に、放ts11を収束させるための装置
(コリメータ等)あるいは放rA12を減衰さ眩るため
の装′a/−介在しても、何ら問題はない。また校正用
試料の位置も、一般被測定用試料と同様に、試料台等に
胃かれても、公開特許公報58−184655に記載さ
れているような自動校正のために、励起放射線を遮断す
るためのシャッタ一部に取り付()られていても、校正
用試料からの蛍光X線がX線検出器に導入できればどこ
でもさしつかえない。校正用試料3から発生ずる複数の
エネルギーの蛍光X線4は、x19検出器5によって検
出され、電気信号に変換される。変換された電気信号は
プリアンプ6及びリニアアンプ7によって電気的に増幅
される。増幅された電気信号はマルチチャンネルアナラ
イザ8によって蛍光xsi;tのエネルギー別に計数さ
れ、各チャンネルのX12強度のデータとしてcpui
誼9に送られる。CPU装置9は各エネルギーの蛍光X
線のチャンネル数とX線強度とを求め、あらかしめ各エ
ネルギーごとに定められた標準値と比較し、各エネルギ
ーに於る補1Efflを決定する。(Embodiments) Preferred embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a block diagram of the present invention. In the diagram? 1@1 is a radiation Ia source, from which excitation radiation 2 is irradiated onto a calibration sample 3. Although not shown in this figure, there is a device (such as a collimator) for converging the radiation ts11 or a device for attenuating and dazzling the radiation rA12 between the radiation source 1 and the calibration sample 3. - There is no problem even if there is intervention. In addition, the position of the calibration sample is similar to that of general samples to be measured, so that even if it is placed on a sample stage, excitation radiation is blocked for automatic calibration as described in Japanese Patent Publication No. 58-184655. Even if it is attached to a part of the shutter for the calibration sample, it can be installed anywhere as long as the fluorescent X-rays from the calibration sample can be introduced into the X-ray detector. Fluorescent X-rays 4 of multiple energies generated from the calibration sample 3 are detected by the x19 detector 5 and converted into electrical signals. The converted electrical signal is electrically amplified by a preamplifier 6 and a linear amplifier 7. The amplified electrical signal is counted by the energy of fluorescence
Sent to 誼9. The CPU device 9 emits fluorescence X of each energy.
The number of ray channels and the X-ray intensity are determined and compared with standard values determined for each energy to determine the supplementary Effl for each energy.
従来法による補正量と、本発明による補正量との比較例
を、第2図に示す。第2図は本発明のための校正用試料
として、2Qch、、56ch、。FIG. 2 shows a comparison example between the amount of correction according to the conventional method and the amount of correction according to the present invention. FIG. 2 shows 2Qch, 56ch, as a calibration sample for the present invention.
95ch、、及び110ch、の、4種類のエネルギー
の蛍光XSを発生させるものを用いた事例である。This is an example in which a device that generates fluorescence XS of four types of energy, 95ch and 110ch, is used.
(効果)
本発明は蛍光XII測定装置の校正を行う際、ある一種
類のエネルギーの蛍光X線のみでtよなく、複数の蛍光
X線を使用することにより、複数のエネルギーで同時に
校正が行える。更に各エネルギー間の補正値を内挿する
ことにより、校正に使用しなかったエネルギーの蛍光X
i1についても、真に補正すべき量に近い量の補正を加
えることができるため、広いエネルギー域で正確な校正
を行うことができる効果がある。(Effects) When calibrating a fluorescence . Furthermore, by interpolating the correction value between each energy, the fluorescence
Regarding i1 as well, since it is possible to apply a correction amount close to the amount that should really be corrected, there is an effect that accurate calibration can be performed in a wide energy range.
第1図は本発明の一実施例のブロック図である。
第2図番よ従来法による補正用と、本発明の校正法によ
る補正間との比較図である。
1・・・放射線源
2・・・励起放射線
3・・・校正用試料
4・・・蛍光X線
5・・・X線検出器
6・・・プリアンプ
7・・・リニアアンプ
8・・・マルチチャンネルアナライザ
9・・・CPIJ装置
本発明の大24列のプロ1.77図
第1図FIG. 1 is a block diagram of one embodiment of the present invention. Figure 2 is a comparison diagram between correction by the conventional method and correction by the calibration method of the present invention. 1... Radiation source 2... Excitation radiation 3... Calibration sample 4... Fluorescent X-ray 5... X-ray detector 6... Preamplifier 7... Linear amplifier 8... Multi Channel analyzer 9... CPIJ device Large 24-column professional of the present invention 1.77 Figure 1
Claims (1)
、放射線によって励起された試料からの蛍光X線を検出
するためのX線検出器と、X線検出器によって検出され
たX線をそのエネルギーによって弁別するためのマルチ
チャンネルアナライザと、弁別された各チャンネルのX
線強度を比較、変換することのできるCPU装置とを備
えた蛍光X線測定装置に於て、放射線で励起されること
によって二種類以上の異ったエネルギーの蛍光X線を発
生させる校正用試料を用い、校正用試料からの蛍光X線
を検出、弁別したのち、弁別された二種類以上の異った
エネルギーの蛍光X線のチャンネル数とX線強度とを前
記CPU装置にて求め、求められた各エネルギーのチャ
ンネル数とX線強度とをあらかじめ決められた標準値と
比較し、それらとのずれを各エネルギーの蛍光X線それ
ぞれについて前記CPU装置を用いて補正することによ
り、蛍光X線のエネルギー値とそのチャンネル数及びX
線強度の標準値からのずれとが直線関係でない場合にも
、広いエネルギー域に於て正確な蛍光X線測定装置の校
正が行えることを特徴とした、蛍光X線測定装置の校正
方法。A radiation source for generating radiation that excites a sample; an X-ray detector for detecting fluorescent X-rays from the sample excited by the radiation; Multi-channel analyzer for discrimination and X of each discriminated channel
A calibration sample that generates two or more types of fluorescent X-rays with different energies by being excited by radiation in a fluorescent X-ray measuring device equipped with a CPU device that can compare and convert ray intensities. After detecting and discriminating the fluorescent X-rays from the calibration sample using The number of channels and X-ray intensity of each energy are compared with predetermined standard values, and the discrepancies between them are corrected using the CPU device for each fluorescent X-ray of each energy. energy value, its number of channels and
A method for calibrating a fluorescent X-ray measuring device, characterized in that the fluorescent X-ray measuring device can be calibrated accurately in a wide energy range even when the deviation of the line intensity from a standard value is not in a linear relationship.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8557286A JPS62240846A (en) | 1986-04-14 | 1986-04-14 | Calibration for fluorescent x-ray measuring apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8557286A JPS62240846A (en) | 1986-04-14 | 1986-04-14 | Calibration for fluorescent x-ray measuring apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62240846A true JPS62240846A (en) | 1987-10-21 |
Family
ID=13862525
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8557286A Pending JPS62240846A (en) | 1986-04-14 | 1986-04-14 | Calibration for fluorescent x-ray measuring apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62240846A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01244346A (en) * | 1987-11-03 | 1989-09-28 | Uk Government | Monitoring of heat generation process |
KR100506083B1 (en) * | 2001-10-16 | 2005-08-04 | 삼성전자주식회사 | Electron spectroscopic analyzer for X-ray fluorescence |
JP2013517466A (en) * | 2010-01-12 | 2013-05-16 | クロメック リミテッド | Data set calibration |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51104888A (en) * | 1975-03-12 | 1976-09-17 | Seiko Instr & Electronics | x senbunsekisochi |
JPS52104982A (en) * | 1976-02-28 | 1977-09-02 | Horiba Ltd | Method of calibrating energy of semiiconductor for radiation |
-
1986
- 1986-04-14 JP JP8557286A patent/JPS62240846A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51104888A (en) * | 1975-03-12 | 1976-09-17 | Seiko Instr & Electronics | x senbunsekisochi |
JPS52104982A (en) * | 1976-02-28 | 1977-09-02 | Horiba Ltd | Method of calibrating energy of semiiconductor for radiation |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01244346A (en) * | 1987-11-03 | 1989-09-28 | Uk Government | Monitoring of heat generation process |
KR100506083B1 (en) * | 2001-10-16 | 2005-08-04 | 삼성전자주식회사 | Electron spectroscopic analyzer for X-ray fluorescence |
JP2013517466A (en) * | 2010-01-12 | 2013-05-16 | クロメック リミテッド | Data set calibration |
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