JPS5442792B2 - - Google Patents
Info
- Publication number
- JPS5442792B2 JPS5442792B2 JP2167476A JP2167476A JPS5442792B2 JP S5442792 B2 JPS5442792 B2 JP S5442792B2 JP 2167476 A JP2167476 A JP 2167476A JP 2167476 A JP2167476 A JP 2167476A JP S5442792 B2 JPS5442792 B2 JP S5442792B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
- Light Receiving Elements (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2167476A JPS52104982A (en) | 1976-02-28 | 1976-02-28 | Method of calibrating energy of semiiconductor for radiation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2167476A JPS52104982A (en) | 1976-02-28 | 1976-02-28 | Method of calibrating energy of semiiconductor for radiation |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS52104982A JPS52104982A (en) | 1977-09-02 |
| JPS5442792B2 true JPS5442792B2 (en) | 1979-12-15 |
Family
ID=12061588
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2167476A Granted JPS52104982A (en) | 1976-02-28 | 1976-02-28 | Method of calibrating energy of semiiconductor for radiation |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS52104982A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010107261A (en) * | 2008-10-29 | 2010-05-13 | Shimadzu Corp | Fluorescent x-ray analyzer |
| JP2014173864A (en) * | 2013-03-06 | 2014-09-22 | Jeol Ltd | Radiation detection device and sample analysis device |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62240846A (en) * | 1986-04-14 | 1987-10-21 | Seiko Instr & Electronics Ltd | Calibration for fluorescent x-ray measuring apparatus |
| JP2006029986A (en) * | 2004-07-16 | 2006-02-02 | Fuji Electric Systems Co Ltd | Radiation measuring device |
| JP5124332B2 (en) * | 2008-03-31 | 2013-01-23 | 株式会社日立製作所 | Radiation inspection apparatus and calibration method |
| CN107688195B (en) * | 2016-08-05 | 2020-12-11 | 清华大学 | Method and apparatus for reconstructing energy spectrum detected by detector |
-
1976
- 1976-02-28 JP JP2167476A patent/JPS52104982A/en active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010107261A (en) * | 2008-10-29 | 2010-05-13 | Shimadzu Corp | Fluorescent x-ray analyzer |
| JP2014173864A (en) * | 2013-03-06 | 2014-09-22 | Jeol Ltd | Radiation detection device and sample analysis device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS52104982A (en) | 1977-09-02 |