JPH08146353A - Laser light diffraction microscope method and microscope device therefor - Google Patents

Abstract

PURPOSE: To obtain a laser light diffraction microscope method and the microscope device for a conventional laser light diffraction device, similar to an electron microscope for an electronic diffraction device, to form the diffracted sample image by laser light, to perform an inverse Fourier transformation of the image through a lens system so that the enlarged real image of the sample may be formed. CONSTITUTION: As for the laser light diffraction microscope method, the sample 6 is irradiated with the incident laser light 4 from a laser light source 2, the incident laser light 4 is transmitted through the sample 6 so as to form the diffracted laser light 8, and then, the diffracted image 20 of the sample 6 is formed by the diffracted laser light 8, the diffracted laser light 8 is converged by the lens system 14 so as fo form the converged laser light 16, then, the real image of the sample 6 is enlarged and formed by the converged laser light 16. And also, in the device, in addition to the elements, the multistage lens system is prepared in order to increase the magnification, the lens system is constituted of not only a single convex lens but also a compound lens, besides, the image is easily formed by using an optical table.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a microscope for forming a magnified image of a sample, and more particularly to a laser light diffraction microscope method for forming a magnified image of a sample by using a laser beam on the same principle as that of an electron microscope. And its equipment.

[0002]

2. Description of the Related Art Conventionally, an optical microscope using a white light source has been used as an apparatus for forming a magnified image of a sample.
In this method, transmitted light or reflected light of an incident white light sample is introduced into an objective lens and an eyepiece lens to form a magnified image of the sample. However, white light contains many wavelengths of light, cannot be focused into a beam, has low coherence, and the entire field of view of the lens is expanded. There are limits to the range of use due to such reasons.

Since the discovery of the wave nature of electron beams, electron diffractometers and electron microscope devices have been developed in order to observe microscopic material structures that could not be seen with optical microscopes.
FIG. 9 is an explanatory diagram of the electron diffractometer, showing a state in which the incident electron beam 54 is irradiated from the electron gun 50 to the sample 52 and the diffracted electron beam 56 diffracted by the sample 52 forms a diffraction image 60 on the screen 58. Shows. Since this diffraction image 60 is a Fourier transform of the material structure of the sample 52, the density of the diffraction image 60 is inversely Fourier transformed by a computer to analyze the material structure of the sample 52.

FIG. 10 is an explanatory view of a transmission electron microscope apparatus. The diffracted electron beam 56 described in FIG.
A focused electron beam 64 is formed by focusing by 2 and a diffraction image 60 is formed on the back focal plane 66 of the electron lens 62. A magnified real image 68 of the sample 52 is formed on the screen 58 further behind. The electron lens 62 automatically reproduces the material structure of the sample 52 by performing an inverse Fourier transform on the diffraction image 60. In the transmission electron microscope, the material structure of the sample 52 is immediately imaged on the screen 58.

On the other hand, lasers have been developed in the optical field and, like electron beams, laser beams in the form of beams, which are coherent and have excellent monochromaticity, have become available. Laser light is used in various fields due to its characteristics, but is particularly used in the field of education to form a diffraction image. Figure 11
FIG. 3 is an explanatory diagram of a laser light diffraction device. Laser light source 2
The sample 6 is irradiated with the incident laser beam 4 from the above to form the diffracted laser beam 8, and the diffracted image 1 is formed on the front screen 10.
Image 2 When the sample 6 is a diffraction grating, a diffraction image corresponding to it can be formed, and in an educational experiment, the grating interval and the wavelength of laser light are obtained.

[0006]

While a transmission electron microscope has been developed from an electron diffraction apparatus using a monochromatic electron beam, a laser light diffraction apparatus utilizing a monochromatic laser beam has been developed. However, a diffraction microscope using laser light has not been developed. This was a blind spot when using laser light. The existence of optical microscopes that use white light is thought to have hindered the idea of using laser light.

[0007]

The present invention relates to a laser light diffraction microscope method, which irradiates a sample with incident laser light from a laser light source and transmits the incident laser light to the sample to form a diffracted laser light, This diffracted laser beam is focused by a lens system to form a focused laser beam, and the focused laser beam is used to enlarge and form a real image of a sample. Further, the present invention relates to a laser light diffraction microscope apparatus, which includes a laser light source, a sample for irradiating an incident laser beam from the laser light source, and a diffraction laser transmitted and diffracted by the sample. The-
It is characterized in that it is composed of a lens system that focuses light.

[0008]

Since the present invention is constructed as described above,
If the lens system is removed, the diffraction image of the sample can be formed on the screen by the diffracted laser light. If the diffracted laser light is focused by the lens system, a magnified real image of the sample can be formed on the screen by the focused laser light. The configuration is the same as that of the transmission electron microscope, and since the laser light is used, the electron lens is replaced with a lens system. The material structure of the sample is Fourier-transformed into a diffraction image, which is further inverse-Fourier-transformed by a lens system so that a real image of the sample structure can be enlarged and formed on the screen.
Next, it compares with an optical microscope. Since the optical microscope uses white light, the coherence is weak, and even if a beam of white light can be formed, it is difficult to form a diffraction image of the sample. On the other hand, the present invention is realized by the perfect correspondence between the diffraction image and the real image. In addition, since white light cannot be formed into a beam, white light with which the entire surface of the sample is irradiated is introduced into the lens system. On the other hand, since the laser light is in the form of a beam, it is possible to irradiate the local area of the sample point by point to diffract it. Further, since the laser is a monochromatic light, a specific color is added for each wavelength of the laser light, and H
The e-Ne laser produces a red color. Therefore, both the diffraction image and the real image are beautiful in that they are colored in that color, which is extremely effective when used as an educational device.

[0009]

1 is a block diagram of a first embodiment of a laser light diffraction microscope apparatus according to the present invention, in which a sample 6 is irradiated with an incident laser light 4 from a laser light source 2. The incident laser beam 4 is diffracted by the sample 6 to become the diffracted laser beam 8 which is introduced into the lens system 14. In this embodiment, the lens system 14 is composed of a single convex lens, and the diffracted laser beam 8 is focused by the lens system 14 into a focused laser beam 16, which is sampled on the back focal plane 18 of the lens system 14. After forming the diffraction image 20 by 6, the magnified real image 22 of the sample 6 is formed on the rear screen 10. Considering that the material structure of the sample 6 is Fourier-transformed into a diffraction image, the diffraction image is inverse-Fourier-transformed by the lens system 14 to return to the material structure of the sample 6, and this enlarged real image is formed on the screen 10. Good. The sample 6 may be anything as long as it transmits laser light, and may be a diffraction grating or a biological thin film sample. Lens system 14
May be a compound lens in which several lenses are combined as long as the diffractive laser 8 can be focused. The brightness of the real image 22 depends on the magnification, that is, how much the incident laser light is diffused. The magnification can be adjusted by setting the focal length of the lens system 14 variously, and the brightness of the laser light of the real image can be adjusted to a level at which it is easy to see. As the laser light source 2, a gas laser such as He-Ne, a semiconductor laser or the like can be used.

FIG. 2 is a block diagram of the second embodiment. The lens system 14 is composed of a first lens system 14a and a second lens system 14b.
It is a stepped lens. Although each stage lens is composed of a single convex lens, it may be a compound lens as described above. By using a two-stage lens, the magnification can be significantly increased. The operation will be described. The first focused laser beam 16a by the first lens system 14a forms a first diffraction image 20a on the back focal plane 18, and the second lens system 1
The second focused laser beam 16b from 4b forms a second diffraction image 20b in the vicinity of the rear of the second focused laser beam 16b. Then, a greatly magnified real image 22 is formed on the screen 10 behind it. If the lens system 14 is a three-stage lens, the magnification can be further increased, and the magnification can be increased to the limit of the optical resolution due to the wavelength of the laser light. In order to clearly form the real image 22, first, the second lens system 14b is removed, and only the first lens system 14a is moved back and forth to obtain a clear diffraction image on the screen 10. Next, when the second lens system 14b is set to an appropriate front, the diffraction image is disturbed. In order to correct this disturbance, the first lens system 14a is moved back and forth to the proper position to obtain a clear diffraction image.

FIG. 3 is an original drawing of a two-dimensional, ie, plane hexagonal lattice. This original image is reduced to black and white film and photographed, and the film is used as a hexagonal diffraction grating. When this hexagonal diffraction grating is used as sample 6 and laser light is irradiated according to FIG. 1,
The diffraction image having the six-fold symmetry shown in FIG. 4 appears as the diffraction image 20. This diffracted image is subjected to inverse Fourier transform by the lens system 14, and an enlarged real image 22 of hexagonal lattice shown in FIG. 5 is formed on the screen. In other words, a part of the planar hexagonal lattice of FIG. 3 is hollowed out by the laser beam, and its enlarged cross section appears.

Explaining exactly the same as above, the case of a planar polycrystalline lattice will be described. FIG. 6 is an original drawing of a planar polycrystalline lattice. This original image is reduced to a black and white film and photographed, and the film is used as a polycrystalline diffraction grating. When this polycrystalline diffraction grating is used as sample 6 and irradiated with laser light according to FIG. 1, a Debye-Scherrer ring shown in FIG. 7 appears as a diffraction image 20. This diffracted image is subjected to inverse Fourier transform by the lens system 14, and an enlarged real image 22 of the polycrystalline lattice shown in FIG. 8 is formed on the screen. The sample 6 may be a thin slice of a plant or an animal instead of a diffraction grating, and may be anything as long as it transmits and diffracts laser light.

With the above-mentioned embodiment as a basic form, it is possible to perform the following in order to operate them properly. If the laser light source 2, the sample 6, and the lens system 14 are placed on an optical table so that they can be moved in a straight line, the laser light will not come off from the lens system 14 and the real image 22
Can be imaged. An ordinary laser light source 2 has a beam cross section with a diameter of about 1 mm, and it is necessary to move the sample vertically and horizontally to enlarge a desired portion of the sample 6.
If the beam cross-sectional area of the incident laser light 4 is expanded in parallel, it is not necessary to move. For this reason, a beam cross-section variable device consisting of a combination lens can be installed immediately in front of the sample 6.

The present invention is not limited to the above embodiments, but includes various modifications, design changes and the like within the technical scope thereof within the scope of the technical idea of the present invention.

[0015]

Since the present invention is constructed as described above, it has the following effects. A novel and novel microscope method and apparatus can be provided in that a magnified real image of a sample can be obtained by using laser light in exactly the same manner as in an electron microscope. Especially when it is used as an educational device, it is possible to give guidance on the principle of the electron microscope without considering complicated matters such as a vacuum device. Since the laser light is in the form of a beam, it is possible to form an optically magnified real image of only a local portion of the sample, and use of a laser light source having a high beam intensity can prevent reduction in the brightness of the real image due to magnification. Laser light has a very high coherence, and a diffraction image can be formed only by transmitting a sample, and a real image can be formed by passing through a lens system. This is a feature that the optical microscope does not have, because it matches the electron microscope in that the diffraction image and the real image can be observed alternately. In addition, the use of an optical bench allows the imaging operation to be performed relatively easily, and the use of a beam cross-section variable device allows the beam cross-sectional area of the incident laser light to be enlarged or reduced. Can be done.

[0016]

[Brief description of drawings]

FIG. 1 is a configuration diagram of a first embodiment of the present invention.

FIG. 2 is a configuration diagram of a second embodiment of the present invention.

FIG. 3 is an original drawing of a plane hexagonal lattice.

4 is a diffraction image of FIG. 3 having six-fold symmetry.

5 is an enlarged real image of FIG. 3 obtained by inverse Fourier transforming FIG. 4 with a lens system.

FIG. 6 is an original drawing of a planar polycrystalline lattice.

7 is a diffraction image of FIG. 6 showing a Debye-Scherrer ring.

8 is an enlarged real image of FIG. 6 obtained by inverse Fourier transforming FIG. 7 with a lens system.

FIG. 9 is an explanatory diagram of an electron diffraction device.

FIG. 10 is an explanatory diagram of a transmission electron microscope.

FIG. 11 is an explanatory diagram of a laser beam diffractometer.

[Explanation of symbols]

 2 laser light source 4 incident laser light 6 sample 8 diffracted laser light 10 screen 12 diffracted image 14 lens system 14a first lens system 14b second lens system 16 focused laser light 16a first focused laser light 16b second focused laser light 18 back focus Surface 20 Diffraction image 20a First diffraction image 20b Second diffraction image 22 Real image 50 Electron gun 52 Sample 54 Incident electron beam 56 Diffraction electron beam 58 Screen 60 Diffraction image 62 Electron lens 64 Focused electron beam 66 Back focal plane 68 Real image

Claims (6)

[Claims] 1. A sample is irradiated with an incident laser beam from a laser light source, the incident laser beam is transmitted through the sample to form a diffracted laser beam, and a diffracted image of the sample is formed by the diffracted laser beam. A laser light diffraction microscope method in which a laser beam is focused by a lens system to form a focused laser beam, and a real image of a sample is enlarged and imaged by the focused laser beam. 2. A laser light source, a sample for irradiating an incident laser light from the laser light source, and a lens system for converging the diffracted laser light transmitted and diffracted by the sample. Laser light diffraction microscope device consisting of. 3. The laser light diffraction microscope apparatus according to claim 2, wherein the laser light source, the sample, and the lens system are linearly movable on an optical table. 4. The laser light diffraction microscope apparatus according to claim 2, further comprising a screen for enlarging and forming a real image of the sample by the focused laser light focused through the lens system. 5. The laser light diffraction microscope apparatus according to claim 2, further comprising a beam cross section varying device for enlarging or reducing the cross section diameter of the incident laser light. 6. The laser light diffraction microscope apparatus according to claim 2, wherein the lens system is composed of a convex lens.