JP7247409B1 - 低熱伝導シャフトを備える高温用サセプタ - Google Patents
低熱伝導シャフトを備える高温用サセプタ Download PDFInfo
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- JP7247409B1 JP7247409B1 JP2022144114A JP2022144114A JP7247409B1 JP 7247409 B1 JP7247409 B1 JP 7247409B1 JP 2022144114 A JP2022144114 A JP 2022144114A JP 2022144114 A JP2022144114 A JP 2022144114A JP 7247409 B1 JP7247409 B1 JP 7247409B1
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- 239000011777 magnesium Substances 0.000 claims abstract description 17
- 229910052749 magnesium Inorganic materials 0.000 claims abstract description 13
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims abstract description 10
- 238000005245 sintering Methods 0.000 claims description 24
- 239000002245 particle Substances 0.000 claims description 23
- 238000004519 manufacturing process Methods 0.000 claims description 16
- 239000010936 titanium Substances 0.000 claims description 9
- 229910052727 yttrium Inorganic materials 0.000 claims description 9
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 claims description 9
- 229910010413 TiO 2 Inorganic materials 0.000 claims description 5
- 238000013016 damping Methods 0.000 claims description 3
- 229910052719 titanium Inorganic materials 0.000 claims description 3
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 2
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 claims description 2
- 150000002680 magnesium Chemical class 0.000 claims 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 58
- 239000012071 phase Substances 0.000 description 32
- 239000010410 layer Substances 0.000 description 23
- 238000000034 method Methods 0.000 description 14
- 239000000463 material Substances 0.000 description 13
- 239000004065 semiconductor Substances 0.000 description 10
- 239000007767 bonding agent Substances 0.000 description 9
- 238000010586 diagram Methods 0.000 description 9
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 8
- 239000000203 mixture Substances 0.000 description 8
- 239000001301 oxygen Substances 0.000 description 8
- 229910052760 oxygen Inorganic materials 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 229910017109 AlON Inorganic materials 0.000 description 7
- 239000000919 ceramic Substances 0.000 description 7
- 239000013078 crystal Substances 0.000 description 7
- 239000000843 powder Substances 0.000 description 7
- 235000012431 wafers Nutrition 0.000 description 7
- 239000012535 impurity Substances 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000011230 binding agent Substances 0.000 description 5
- 230000007423 decrease Effects 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- RUDFQVOCFDJEEF-UHFFFAOYSA-N yttrium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[Y+3].[Y+3] RUDFQVOCFDJEEF-UHFFFAOYSA-N 0.000 description 4
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 239000007791 liquid phase Substances 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- 229910020068 MgAl Inorganic materials 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000007731 hot pressing Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 229910052761 rare earth metal Inorganic materials 0.000 description 2
- 150000002910 rare earth metals Chemical class 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 229910052596 spinel Inorganic materials 0.000 description 2
- 239000011029 spinel Substances 0.000 description 2
- 230000035882 stress Effects 0.000 description 2
- 230000008646 thermal stress Effects 0.000 description 2
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 1
- 229910018514 Al—O—N Inorganic materials 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010344 co-firing Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- KZHJGOXRZJKJNY-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Si]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O KZHJGOXRZJKJNY-UHFFFAOYSA-N 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 229910052863 mullite Inorganic materials 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 229910001404 rare earth metal oxide Inorganic materials 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 239000006104 solid solution Substances 0.000 description 1
- 229910052566 spinel group Inorganic materials 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- -1 yttrium (Y) Chemical class 0.000 description 1
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- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68757—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a coating or a hardness or a material
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Abstract
Description
図1を参照すると、サセプタ1は、基板を保持するためのプレート10と、前記プレートを支持するためのシャフト20を含んで構成される。
まず、図2を参照すると、プレート110の一面にシャフト120が結合している。
図2で、前記プレート110及びシャフト120はそれぞれ、セラミック焼結体を含む。好ましくは、本発明において、それぞれの焼結体は、窒化アルミニウム(AlN)を主相とする焼結体を含むことができる。本発明の明細書において、焼結体は、各部品の母材(base material)部分のことを指す。例えば、プレートは、表面に付着する又は内部に設置される金属熱線や金属メッシュ網のような介在要素(inclusions)をさらに含んでよいが、本発明の明細書でいうプレートの焼結体とは、そのような異なる要素を除いて、均質部である母材部分のことを指す。
図2に示すサセプタ構造とは違い、図3A~図3Cのサセプタ構造は、緩衝部材130A,130Bをさらに含んでいる。本発明において、緩衝部材130A,130Bは、プレート110及びシャフト120と同様に、AlN焼結体によって具現されてよい。
同図に示すように、シャフト120、緩衝部材130及びプレート110はそれぞれ異なる平均粒径のグレインで構成されている。例示的に、前記シャフト120側のグレインの平均粒径は、前記プレート110側のグレインの平均粒径よりも大きく、緩衝部材130をなすグレインの平均粒径は、それらの間の値を有することが好ましい。
図5Aを参照すると、プレート110とシャフト120との間に緩衝部材130が配置されている。この構造は、前述した構造に類似している。ここで、緩衝部材130は、板状の窒化アルミニウム焼結体であってよい。このように板状の焼結体を使用することによって、追加のバインダー無しでプレート110/緩衝部材130/シャフト120の積層構造とすることができる。図5Aのように積層された構造体は、ホットプレスのような接合によって一体に形成されてよい。
焼結助剤の種類及び含有量を異ならせながらAlN焼結体を1700~1900℃の温度で製造した。AlN粉末としては、トクヤマ社製のAlN粉末を使用した。AlN粉末の金属不純物及び酸素含有量は、次の表2の通りである。
実施例1の#1組成の配合原料粉末で成形体を製造した。この成形体上に、実施例1の#3組成の配合原料粉末からなる成形体を積層した。積層された成形体をホットプレスによって1700~1800℃の温度で焼結した。
実施例2によって製造された積層構造の焼結体は、Y2O3含有焼結体の表面に接合剤ペーストを60μm(範囲:50~70μm)の厚さで塗布した。このとき、接合剤ペーストは、AlNベースにAl2O3、CaO及びY2O3を添加した組成を使用した。
120 シャフト
130A,130B 緩衝部材
132,134,136 接合剤層
Claims (12)
- ウエハの安着のためのプレート、及び前記プレートに結合したシャフトを含むサセプタであって、
前記プレート及び前記シャフトはそれぞれ、AlN相が90wt%以上である焼結体を含み、
前記プレートの焼結体は、650℃で体積抵抗が5*108Ω・cm以上であるマグネシウム含有AlN焼結体であり、
前記シャフトの焼結体は、常温熱伝導度が100W/mK以下であるAlN焼結体であり、
前記プレートの焼結体は、マグネシウムをMgO換算で0.5~3.0wt%含有し、かつ、チタニウムをTiO 2 換算で0.05~0.5wt%含有することを特徴とする、
サセプタ。 - 前記プレートと前記シャフトとの間に介在した緩衝部材をさらに含むことを特徴とする、請求項1に記載のサセプタ。
- 前記緩衝部材は、焼結体中にAlN相が90wt%以上であることを特徴とする、請求項2に記載のサセプタ。
- 前記緩衝部材は、イットリウムをY2O3換算で3~8wt%含むことを特徴とする、請求項3に記載のサセプタ。
- 前記緩衝部材は、ブランケット、リング又は円形の形状であることを特徴とする、請求項2に記載のサセプタ。
- 前記プレート、前記緩衝部材及びシャフトの焼結体のAlN粒子の平均粒径をそれぞれ第1平均粒径、第2平均粒径、第3平均粒径とするとき、
第1平均粒径<第2平均粒径<第3平均粒径の関係が成立することを特徴とする、請求項2に記載のサセプタ。 - マグネシウム含有AlN焼結体のプレート、イットリウム含有AlN仮焼結体又は焼結体からなる緩衝部材、及び熱伝導度が100W/mK以下であるAlN焼結体のシャフトの積層構造を提供する段階;及び
前記積層構造を焼結する段階を含むサセプタの製造方法。 - 前記積層構造を提供する段階において、
前記緩衝部材はAlN焼結体であり、
前記プレートと前記緩衝部材は一体に焼結された状態で提供されることを特徴とする、請求項7に記載のサセプタの製造方法。 - 前記プレートの焼結体は、マグネシウムをMgO換算で0.5~3.0wt%含有することを特徴とする、請求項7に記載のサセプタの製造方法。
- 前記積層構造を提供する段階において、
前記緩衝部材は、イットリウム酸化物換算で3~8wt%のイットリウムを含むことを特徴とする、請求項7に記載のサセプタの製造方法。 - 前記プレートの焼結体は、TiO2換算で0.05~0.5wt%のTiを含有することを特徴とする、請求項7に記載のサセプタの製造方法。
- 前記積層構造を提供する段階において、
前記プレート、前記緩衝部材及びシャフトの焼結体のAlN粒子の平均粒径をそれぞれ第1平均粒径、第2平均粒径、第3平均粒径とするとき、
第1平均粒径<第2平均粒径<第3平均粒径の関係が成立することを特徴とする、請求項7に記載のサセプタの製造方法。
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