JP6994663B2 - 発光素子 - Google Patents
発光素子 Download PDFInfo
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- JP6994663B2 JP6994663B2 JP2019070455A JP2019070455A JP6994663B2 JP 6994663 B2 JP6994663 B2 JP 6994663B2 JP 2019070455 A JP2019070455 A JP 2019070455A JP 2019070455 A JP2019070455 A JP 2019070455A JP 6994663 B2 JP6994663 B2 JP 6994663B2
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- conductive film
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- 239000004065 semiconductor Substances 0.000 claims description 63
- 238000000605 extraction Methods 0.000 description 15
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 230000031700 light absorption Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 230000001902 propagating effect Effects 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 229910002704 AlGaN Inorganic materials 0.000 description 1
- 229910002601 GaN Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229910003465 moissanite Inorganic materials 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/40—Materials therefor
- H01L33/405—Reflective materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/44—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating
- H01L33/46—Reflective coating, e.g. dielectric Bragg reflector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/38—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/40—Materials therefor
- H01L33/42—Transparent materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/44—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/38—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape
- H01L33/382—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape the electrode extending partially in or entirely through the semiconductor body
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
Description
図3は、図2のIII-III線における模式断面図である。
図4は、図2のIV-IV線における模式断面図である。
図8は、図2に示す部分における透光性導電膜14の開口部15を示す模式上面図である。
図4は、図2のIV-IV線における断面図である。図4は、第2開口部15bが配置された領域の第2方向に沿った断面図である。
Claims (6)
- n型半導体層と、前記n型半導体層上に設けられた発光層と、前記発光層上に設けられたp型半導体層とを有する半導体積層体と、
前記p型半導体層上に設けられた絶縁膜と、
前記絶縁膜上に設けられ、パッド部と、前記パッド部から第1方向に連続した延伸部とを有するp側電極と、
前記p型半導体層上および前記絶縁膜上に設けられ、前記絶縁膜上に前記p側電極の前記延伸部に沿って連続して設けられた開口部を有する透光性導電膜と、
前記透光性導電膜の前記開口部において、前記絶縁膜と前記p側電極との間に設けられ、前記発光層が発する光の波長に対する反射率が前記p側電極よりも高い反射膜と、
を備え、
前記透光性導電膜の前記開口部は、第1開口部と第2開口部とを有し、
前記第1開口部の幅は、前記第1方向に直交する第2方向において、第2開口部の幅よりも小さく、
前記p側電極の前記延伸部の幅は、前記第2方向において、前記第2開口部の幅よりも小さく、前記第2開口部が配置された前記絶縁膜上の前記延伸部は前記透光性導電膜と接しておらず、
前記第2方向において、前記透光性導電膜のうち前記第1開口部が配置された領域に隣接して設けられた前記透光性導電膜は、前記p側電極の前記延伸部と電気的に接続されている発光素子。 - 前記第2方向において、前記第2開口部に設けられた前記反射膜の幅は、前記第1開口部に設けられた前記反射膜の幅よりも大きい請求項1記載の発光素子。
- 前記p側電極は、上面視において、前記絶縁膜が設けられた領域内に設けられている請求項1または2に記載の発光素子。
- 前記p側電極の前記延伸部は、前記第2方向において、前記透光性導電膜のうち前記第1開口部が配置された領域の両側に隣接して設けられた前記透光性導電膜と電気的に接続されている請求項1~3のいずれか1つに記載の発光素子。
- 前記p側電極は、前記反射膜の上面および側面を覆っている請求項1~4のいずれか1つに記載の発光素子。
- 前記第1開口部と前記第2開口部とが、前記第1方向に沿って交互に配置されている請求項1~5のいずれか1つに記載の発光素子。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019070455A JP6994663B2 (ja) | 2019-04-02 | 2019-04-02 | 発光素子 |
US16/808,577 US11276801B2 (en) | 2019-04-02 | 2020-03-04 | Light-emitting element |
CN202010211829.1A CN111799359B (zh) | 2019-04-02 | 2020-03-24 | 发光元件 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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JP2019070455A JP6994663B2 (ja) | 2019-04-02 | 2019-04-02 | 発光素子 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2020170763A JP2020170763A (ja) | 2020-10-15 |
JP6994663B2 true JP6994663B2 (ja) | 2022-01-14 |
Family
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JP2019070455A Active JP6994663B2 (ja) | 2019-04-02 | 2019-04-02 | 発光素子 |
Country Status (3)
Country | Link |
---|---|
US (1) | US11276801B2 (ja) |
JP (1) | JP6994663B2 (ja) |
CN (1) | CN111799359B (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWD219684S (zh) * | 2021-07-09 | 2022-07-01 | 晶元光電股份有限公司 | 發光二極體之部分 |
JP7492666B2 (ja) * | 2022-01-27 | 2024-05-30 | 日亜化学工業株式会社 | 発光素子 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013168598A (ja) | 2012-02-17 | 2013-08-29 | Toshiba Corp | 半導体発光素子 |
US20140367720A1 (en) | 2013-06-17 | 2014-12-18 | Ki Seok Kim | Semiconductor light emitting device and method of manufacturing the same |
JP2015225915A (ja) | 2014-05-27 | 2015-12-14 | 豊田合成株式会社 | 発光素子 |
JP5893699B1 (ja) | 2014-09-25 | 2016-03-23 | 泰谷光電科技股▲ふん▼有限公司 | 発光ダイオードの透明導電層構成 |
JP2018113442A (ja) | 2017-01-06 | 2018-07-19 | ソウル バイオシス カンパニー リミテッドSeoul Viosys Co.,Ltd. | 電流遮断層を有する発光素子 |
Family Cites Families (14)
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JP5130730B2 (ja) * | 2007-02-01 | 2013-01-30 | 日亜化学工業株式会社 | 半導体発光素子 |
WO2011083923A2 (en) * | 2010-01-07 | 2011-07-14 | Seoul Opto Device Co., Ltd. | Light emitting diode having electrode pads |
TW201216517A (en) * | 2010-10-06 | 2012-04-16 | Chi Mei Lighting Tech Corp | Light-emitting diode device and manufacturing method thereof |
CN103222074B (zh) * | 2010-11-18 | 2016-06-01 | 首尔伟傲世有限公司 | 具有电极焊盘的发光二极管芯片 |
US20140110741A1 (en) * | 2012-10-18 | 2014-04-24 | Epistar Corporation | Light-emitting device |
US9312453B2 (en) * | 2013-04-30 | 2016-04-12 | Semicon Light Co., Ltd. | Semiconductor light emitting device |
KR102075984B1 (ko) * | 2013-12-06 | 2020-02-11 | 삼성전자주식회사 | 반도체 발광소자 및 이를 구비한 반도체 발광장치 |
JP6458463B2 (ja) * | 2013-12-09 | 2019-01-30 | 日亜化学工業株式会社 | 発光素子 |
JP6256235B2 (ja) | 2014-07-18 | 2018-01-10 | 日亜化学工業株式会社 | 半導体発光素子の製造方法 |
JP6156402B2 (ja) * | 2015-02-13 | 2017-07-05 | 日亜化学工業株式会社 | 発光装置 |
JP6149878B2 (ja) | 2015-02-13 | 2017-06-21 | 日亜化学工業株式会社 | 発光素子 |
KR102366399B1 (ko) * | 2015-07-15 | 2022-02-24 | 서울바이오시스 주식회사 | ZnO 투명 전극을 포함하는 발광 소자 |
US10199542B2 (en) * | 2015-12-22 | 2019-02-05 | Epistar Corporation | Light-emitting device |
CN108231971A (zh) | 2018-02-01 | 2018-06-29 | 湘能华磊光电股份有限公司 | 一种高亮度led芯片及其制作方法 |
-
2019
- 2019-04-02 JP JP2019070455A patent/JP6994663B2/ja active Active
-
2020
- 2020-03-04 US US16/808,577 patent/US11276801B2/en active Active
- 2020-03-24 CN CN202010211829.1A patent/CN111799359B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013168598A (ja) | 2012-02-17 | 2013-08-29 | Toshiba Corp | 半導体発光素子 |
US20140367720A1 (en) | 2013-06-17 | 2014-12-18 | Ki Seok Kim | Semiconductor light emitting device and method of manufacturing the same |
JP2015225915A (ja) | 2014-05-27 | 2015-12-14 | 豊田合成株式会社 | 発光素子 |
JP5893699B1 (ja) | 2014-09-25 | 2016-03-23 | 泰谷光電科技股▲ふん▼有限公司 | 発光ダイオードの透明導電層構成 |
JP2018113442A (ja) | 2017-01-06 | 2018-07-19 | ソウル バイオシス カンパニー リミテッドSeoul Viosys Co.,Ltd. | 電流遮断層を有する発光素子 |
Also Published As
Publication number | Publication date |
---|---|
US11276801B2 (en) | 2022-03-15 |
CN111799359A (zh) | 2020-10-20 |
CN111799359B (zh) | 2024-08-20 |
JP2020170763A (ja) | 2020-10-15 |
US20200321492A1 (en) | 2020-10-08 |
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