JP5335379B2 - Organic semiconductor material and organic electronic device using the same - Google Patents
Organic semiconductor material and organic electronic device using the same Download PDFInfo
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- JP5335379B2 JP5335379B2 JP2008289317A JP2008289317A JP5335379B2 JP 5335379 B2 JP5335379 B2 JP 5335379B2 JP 2008289317 A JP2008289317 A JP 2008289317A JP 2008289317 A JP2008289317 A JP 2008289317A JP 5335379 B2 JP5335379 B2 JP 5335379B2
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- organic semiconductor
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- 239000004065 semiconductor Substances 0.000 title claims description 28
- 239000000463 material Substances 0.000 title claims description 24
- -1 2-heptylphenyl group Chemical group 0.000 claims description 69
- 125000001424 substituent group Chemical group 0.000 claims description 24
- 239000000126 substance Substances 0.000 claims description 19
- 125000003118 aryl group Chemical group 0.000 claims description 6
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 3
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 3
- YJTKZCDBKVTVBY-UHFFFAOYSA-N 1,3-Diphenylbenzene Chemical group C1=CC=CC=C1C1=CC=CC(C=2C=CC=CC=2)=C1 YJTKZCDBKVTVBY-UHFFFAOYSA-N 0.000 claims description 2
- 125000001255 4-fluorophenyl group Chemical group [H]C1=C([H])C(*)=C([H])C([H])=C1F 0.000 claims description 2
- 125000004172 4-methoxyphenyl group Chemical group [H]C1=C([H])C(OC([H])([H])[H])=C([H])C([H])=C1* 0.000 claims description 2
- 125000000590 4-methylphenyl group Chemical group [H]C1=C([H])C(=C([H])C([H])=C1*)C([H])([H])[H] 0.000 claims description 2
- 125000006267 biphenyl group Chemical group 0.000 claims description 2
- 125000000040 m-tolyl group Chemical group [H]C1=C([H])C(*)=C([H])C(=C1[H])C([H])([H])[H] 0.000 claims description 2
- 125000001624 naphthyl group Chemical group 0.000 claims description 2
- 125000003261 o-tolyl group Chemical group [H]C1=C([H])C(*)=C(C([H])=C1[H])C([H])([H])[H] 0.000 claims description 2
- 125000000538 pentafluorophenyl group Chemical group FC1=C(F)C(F)=C(*)C(F)=C1F 0.000 claims description 2
- 150000001875 compounds Chemical class 0.000 description 46
- 238000000034 method Methods 0.000 description 28
- 239000013078 crystal Substances 0.000 description 19
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 18
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- 230000015572 biosynthetic process Effects 0.000 description 13
- 238000003786 synthesis reaction Methods 0.000 description 13
- WDECIBYCCFPHNR-UHFFFAOYSA-N chrysene Chemical compound C1=CC=CC2=CC=C3C4=CC=CC=C4C=CC3=C21 WDECIBYCCFPHNR-UHFFFAOYSA-N 0.000 description 12
- SLIUAWYAILUBJU-UHFFFAOYSA-N pentacene Chemical compound C1=CC=CC2=CC3=CC4=CC5=CC=CC=C5C=C4C=C3C=C21 SLIUAWYAILUBJU-UHFFFAOYSA-N 0.000 description 11
- 230000008569 process Effects 0.000 description 11
- 238000006243 chemical reaction Methods 0.000 description 10
- 239000012299 nitrogen atmosphere Substances 0.000 description 10
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 9
- 239000000243 solution Substances 0.000 description 9
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 8
- 238000001816 cooling Methods 0.000 description 8
- 238000001035 drying Methods 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 8
- 239000003960 organic solvent Substances 0.000 description 8
- 230000005669 field effect Effects 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 6
- 238000000862 absorption spectrum Methods 0.000 description 6
- 239000010408 film Substances 0.000 description 6
- 239000010410 layer Substances 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- 125000003375 sulfoxide group Chemical group 0.000 description 5
- 125000000101 thioether group Chemical group 0.000 description 5
- CSNNHWWHGAXBCP-UHFFFAOYSA-L Magnesium sulfate Chemical compound [Mg+2].[O-][S+2]([O-])([O-])[O-] CSNNHWWHGAXBCP-UHFFFAOYSA-L 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 238000004440 column chromatography Methods 0.000 description 4
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- 238000001953 recrystallisation Methods 0.000 description 4
- 238000001771 vacuum deposition Methods 0.000 description 4
- ACZIXGYNHJPZKM-UHFFFAOYSA-N 2,8-diphenylchrysene Chemical compound C1=CC=CC=C1C1=CC=C2C3=CC=C4C=C(C=5C=CC=CC=5)C=CC4=C3C=CC2=C1 ACZIXGYNHJPZKM-UHFFFAOYSA-N 0.000 description 3
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- NDGHWEDWXFEKDZ-UHFFFAOYSA-N 6,12-dioctylchrysene Chemical compound CCCCCCCCc1cc2c3ccccc3c(CCCCCCCC)cc2c2ccccc12 NDGHWEDWXFEKDZ-UHFFFAOYSA-N 0.000 description 3
- IKHGUXGNUITLKF-UHFFFAOYSA-N Acetaldehyde Chemical compound CC=O IKHGUXGNUITLKF-UHFFFAOYSA-N 0.000 description 3
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 3
- 229940126062 Compound A Drugs 0.000 description 3
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 3
- NLDMNSXOCDLTTB-UHFFFAOYSA-N Heterophylliin A Natural products O1C2COC(=O)C3=CC(O)=C(O)C(O)=C3C3=C(O)C(O)=C(O)C=C3C(=O)OC2C(OC(=O)C=2C=C(O)C(O)=C(O)C=2)C(O)C1OC(=O)C1=CC(O)=C(O)C(O)=C1 NLDMNSXOCDLTTB-UHFFFAOYSA-N 0.000 description 3
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 3
- NBBJYMSMWIIQGU-UHFFFAOYSA-N Propionic aldehyde Chemical compound CCC=O NBBJYMSMWIIQGU-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 125000003342 alkenyl group Chemical group 0.000 description 3
- 125000000217 alkyl group Chemical group 0.000 description 3
- 125000000304 alkynyl group Chemical group 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 125000005578 chrysene group Chemical group 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- JNGZXGGOCLZBFB-IVCQMTBJSA-N compound E Chemical compound N([C@@H](C)C(=O)N[C@@H]1C(N(C)C2=CC=CC=C2C(C=2C=CC=CC=2)=N1)=O)C(=O)CC1=CC(F)=CC(F)=C1 JNGZXGGOCLZBFB-IVCQMTBJSA-N 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 125000000623 heterocyclic group Chemical group 0.000 description 3
- DPBLXKKOBLCELK-UHFFFAOYSA-N pentan-1-amine Chemical group CCCCCN DPBLXKKOBLCELK-UHFFFAOYSA-N 0.000 description 3
- 238000007639 printing Methods 0.000 description 3
- LVTJOONKWUXEFR-FZRMHRINSA-N protoneodioscin Natural products O(C[C@@H](CC[C@]1(O)[C@H](C)[C@@H]2[C@]3(C)[C@H]([C@H]4[C@@H]([C@]5(C)C(=CC4)C[C@@H](O[C@@H]4[C@H](O[C@H]6[C@@H](O)[C@@H](O)[C@@H](O)[C@H](C)O6)[C@@H](O)[C@H](O[C@H]6[C@@H](O)[C@@H](O)[C@@H](O)[C@H](C)O6)[C@H](CO)O4)CC5)CC3)C[C@@H]2O1)C)[C@H]1[C@H](O)[C@H](O)[C@H](O)[C@@H](CO)O1 LVTJOONKWUXEFR-FZRMHRINSA-N 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 239000002904 solvent Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 3
- QPFMBZIOSGYJDE-UHFFFAOYSA-N 1,1,2,2-tetrachloroethane Chemical compound ClC(Cl)C(Cl)Cl QPFMBZIOSGYJDE-UHFFFAOYSA-N 0.000 description 2
- VMKOFRJSULQZRM-UHFFFAOYSA-N 1-bromooctane Chemical compound CCCCCCCCBr VMKOFRJSULQZRM-UHFFFAOYSA-N 0.000 description 2
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical compound [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 2
- 239000007818 Grignard reagent Substances 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- UIIMBOGNXHQVGW-UHFFFAOYSA-M Sodium bicarbonate Chemical compound [Na+].OC([O-])=O UIIMBOGNXHQVGW-UHFFFAOYSA-M 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- HEDRZPFGACZZDS-MICDWDOJSA-N Trichloro(2H)methane Chemical compound [2H]C(Cl)(Cl)Cl HEDRZPFGACZZDS-MICDWDOJSA-N 0.000 description 2
- RWBMMASKJODNSV-UHFFFAOYSA-N [1]benzothiolo[2,3-g][1]benzothiole Chemical compound C1=CC=C2C3=C(SC=C4)C4=CC=C3SC2=C1 RWBMMASKJODNSV-UHFFFAOYSA-N 0.000 description 2
- 125000003368 amide group Chemical group 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- 125000004429 atom Chemical group 0.000 description 2
- 239000012267 brine Substances 0.000 description 2
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 2
- 229910052794 bromium Inorganic materials 0.000 description 2
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 description 2
- MVPPADPHJFYWMZ-UHFFFAOYSA-N chlorobenzene Chemical compound ClC1=CC=CC=C1 MVPPADPHJFYWMZ-UHFFFAOYSA-N 0.000 description 2
- 229910052731 fluorine Inorganic materials 0.000 description 2
- 125000001153 fluoro group Chemical group F* 0.000 description 2
- 150000004795 grignard reagents Chemical class 0.000 description 2
- 229910052943 magnesium sulfate Inorganic materials 0.000 description 2
- 235000019341 magnesium sulphate Nutrition 0.000 description 2
- 238000001819 mass spectrum Methods 0.000 description 2
- LQNUZADURLCDLV-UHFFFAOYSA-N nitrobenzene Chemical compound [O-][N+](=O)C1=CC=CC=C1 LQNUZADURLCDLV-UHFFFAOYSA-N 0.000 description 2
- 238000000655 nuclear magnetic resonance spectrum Methods 0.000 description 2
- HXITXNWTGFUOAU-UHFFFAOYSA-N phenylboronic acid Chemical compound OB(O)C1=CC=CC=C1 HXITXNWTGFUOAU-UHFFFAOYSA-N 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000000746 purification Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 125000003808 silyl group Chemical group [H][Si]([H])([H])[*] 0.000 description 2
- HPALAKNZSZLMCH-UHFFFAOYSA-M sodium;chloride;hydrate Chemical compound O.[Na+].[Cl-] HPALAKNZSZLMCH-UHFFFAOYSA-M 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000003756 stirring Methods 0.000 description 2
- 125000000472 sulfonyl group Chemical group *S(*)(=O)=O 0.000 description 2
- 230000002123 temporal effect Effects 0.000 description 2
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 2
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- CPDDDTNAMBSPRN-ZZXKWVIFSA-N (e)-3-(4-bromophenyl)prop-2-enoic acid Chemical compound OC(=O)\C=C\C1=CC=C(Br)C=C1 CPDDDTNAMBSPRN-ZZXKWVIFSA-N 0.000 description 1
- LOWMYOWHQMKBTM-UHFFFAOYSA-N 1-butylsulfinylbutane Chemical group CCCCS(=O)CCCC LOWMYOWHQMKBTM-UHFFFAOYSA-N 0.000 description 1
- LEMIDOZYVQXGLI-UHFFFAOYSA-N 1-heptylsulfanylheptane Chemical group CCCCCCCSCCCCCCC LEMIDOZYVQXGLI-UHFFFAOYSA-N 0.000 description 1
- UVMACQYJONOGQU-UHFFFAOYSA-N 1-heptylsulfinylheptane Chemical group CCCCCCCS(=O)CCCCCCC UVMACQYJONOGQU-UHFFFAOYSA-N 0.000 description 1
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- LOXRGHGHQYWXJK-UHFFFAOYSA-N 1-octylsulfanyloctane Chemical group CCCCCCCCSCCCCCCCC LOXRGHGHQYWXJK-UHFFFAOYSA-N 0.000 description 1
- VWCFQNQVNVMFGV-UHFFFAOYSA-N 1-octylsulfinyloctane Chemical group CCCCCCCCS(=O)CCCCCCCC VWCFQNQVNVMFGV-UHFFFAOYSA-N 0.000 description 1
- JOZDADPMWLVEJK-UHFFFAOYSA-N 1-pentylsulfanylpentane Chemical group CCCCCSCCCCC JOZDADPMWLVEJK-UHFFFAOYSA-N 0.000 description 1
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- 125000002941 2-furyl group Chemical group O1C([*])=C([H])C([H])=C1[H] 0.000 description 1
- CMWSRWTXVQLHNX-UHFFFAOYSA-N 2-methyl-1-(2-methylpropylsulfanyl)propane Chemical group CC(C)CSCC(C)C CMWSRWTXVQLHNX-UHFFFAOYSA-N 0.000 description 1
- MCDJZKPTBCWNSJ-UHFFFAOYSA-N 2-methyl-1-(2-methylpropylsulfinyl)propane Chemical group CC(C)CS(=O)CC(C)C MCDJZKPTBCWNSJ-UHFFFAOYSA-N 0.000 description 1
- WFJXYIUAMJAURQ-UHFFFAOYSA-N 2-propan-2-ylsulfinylpropane Chemical group CC(C)S(=O)C(C)C WFJXYIUAMJAURQ-UHFFFAOYSA-N 0.000 description 1
- 125000004105 2-pyridyl group Chemical group N1=C([*])C([H])=C([H])C([H])=C1[H] 0.000 description 1
- LNMBCRKRCIMQLW-UHFFFAOYSA-N 2-tert-butylsulfanyl-2-methylpropane Chemical group CC(C)(C)SC(C)(C)C LNMBCRKRCIMQLW-UHFFFAOYSA-N 0.000 description 1
- 125000000175 2-thienyl group Chemical group S1C([*])=C([H])C([H])=C1[H] 0.000 description 1
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 1
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- RDGHINMHEVHVPO-UHFFFAOYSA-N CCCCCCCCc1ccc2cc3cc4cc5cc(CCCCCCCC)ccc5cc4cc3cc2c1 Chemical compound CCCCCCCCc1ccc2cc3cc4cc5cc(CCCCCCCC)ccc5cc4cc3cc2c1 RDGHINMHEVHVPO-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- HTIRHQRTDBPHNZ-UHFFFAOYSA-N Dibutyl sulfide Chemical group CCCCSCCCC HTIRHQRTDBPHNZ-UHFFFAOYSA-N 0.000 description 1
- XYWDPYKBIRQXQS-UHFFFAOYSA-N Diisopropyl sulfide Chemical group CC(C)SC(C)C XYWDPYKBIRQXQS-UHFFFAOYSA-N 0.000 description 1
- IAZDPXIOMUYVGZ-WFGJKAKNSA-N Dimethyl sulfoxide Chemical group [2H]C([2H])([2H])S(=O)C([2H])([2H])[2H] IAZDPXIOMUYVGZ-WFGJKAKNSA-N 0.000 description 1
- JJHHIJFTHRNPIK-UHFFFAOYSA-N Diphenyl sulfoxide Chemical group C=1C=CC=CC=1S(=O)C1=CC=CC=C1 JJHHIJFTHRNPIK-UHFFFAOYSA-N 0.000 description 1
- ZERULLAPCVRMCO-UHFFFAOYSA-N Dipropyl sulfide Chemical group CCCSCCC ZERULLAPCVRMCO-UHFFFAOYSA-N 0.000 description 1
- 208000033962 Fontaine progeroid syndrome Diseases 0.000 description 1
- WJYIASZWHGOTOU-UHFFFAOYSA-N Heptylamine Chemical group CCCCCCCN WJYIASZWHGOTOU-UHFFFAOYSA-N 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- 101001047513 Mus musculus Lethal(2) giant larvae protein homolog 1 Proteins 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- 229910052772 Samarium Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- UIIMBOGNXHQVGW-DEQYMQKBSA-M Sodium bicarbonate-14C Chemical compound [Na+].O[14C]([O-])=O UIIMBOGNXHQVGW-DEQYMQKBSA-M 0.000 description 1
- 125000000738 acetamido group Chemical group [H]C([H])([H])C(=O)N([H])[*] 0.000 description 1
- 125000005073 adamantyl group Chemical group C12(CC3CC(CC(C1)C3)C2)* 0.000 description 1
- 125000003172 aldehyde group Chemical group 0.000 description 1
- 125000003545 alkoxy group Chemical group 0.000 description 1
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- 230000001548 androgenic effect Effects 0.000 description 1
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- 238000001460 carbon-13 nuclear magnetic resonance spectrum Methods 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
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- 150000001846 chrysenes Chemical class 0.000 description 1
- 125000006165 cyclic alkyl group Chemical group 0.000 description 1
- HPXRVTGHNJAIIH-UHFFFAOYSA-N cyclohexanol Chemical compound OC1CCCCC1 HPXRVTGHNJAIIH-UHFFFAOYSA-N 0.000 description 1
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 1
- 125000001511 cyclopentyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 1
- LJSQFQKUNVCTIA-UHFFFAOYSA-N diethyl sulfide Chemical group CCSCC LJSQFQKUNVCTIA-UHFFFAOYSA-N 0.000 description 1
- CCAFPWNGIUBUSD-UHFFFAOYSA-N diethyl sulfoxide Chemical group CCS(=O)CC CCAFPWNGIUBUSD-UHFFFAOYSA-N 0.000 description 1
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- LTYMSROWYAPPGB-UHFFFAOYSA-N diphenyl sulfide Chemical group C=1C=CC=CC=1SC1=CC=CC=C1 LTYMSROWYAPPGB-UHFFFAOYSA-N 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 125000004185 ester group Chemical group 0.000 description 1
- 125000006125 ethylsulfonyl group Chemical group 0.000 description 1
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 239000000706 filtrate Substances 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000005227 gel permeation chromatography Methods 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 125000001841 imino group Chemical group [H]N=* 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- PNDPGZBMCMUPRI-UHFFFAOYSA-N iodine Chemical compound II PNDPGZBMCMUPRI-UHFFFAOYSA-N 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 239000011630 iodine Substances 0.000 description 1
- 238000000752 ionisation method Methods 0.000 description 1
- BMFVGAAISNGQNM-UHFFFAOYSA-N isopentylamine Chemical group CC(C)CCN BMFVGAAISNGQNM-UHFFFAOYSA-N 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 238000004811 liquid chromatography Methods 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 230000015654 memory Effects 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 125000006217 methyl sulfide group Chemical group [H]C([H])([H])S* 0.000 description 1
- 125000005743 methylethenyl group Chemical group [H]\C(*)=C(\[H])C([H])([H])[H] 0.000 description 1
- 125000004170 methylsulfonyl group Chemical group [H]C([H])([H])S(*)(=O)=O 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- PCJWVQUPHYPGIE-UHFFFAOYSA-N n-butyl-4-methoxybenzamide Chemical group CCCCNC(=O)C1=CC=C(OC)C=C1 PCJWVQUPHYPGIE-UHFFFAOYSA-N 0.000 description 1
- 125000003136 n-heptyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000001280 n-hexyl group Chemical group C(CCCCC)* 0.000 description 1
- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004998 naphthylethyl group Chemical group C1(=CC=CC2=CC=CC=C12)CC* 0.000 description 1
- 125000002560 nitrile group Chemical group 0.000 description 1
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 1
- NUJGJRNETVAIRJ-UHFFFAOYSA-N octanal Chemical compound CCCCCCCC=O NUJGJRNETVAIRJ-UHFFFAOYSA-N 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000010525 oxidative degradation reaction Methods 0.000 description 1
- GARQDIVXKVBJFP-UHFFFAOYSA-N p-Octylacetophenone Chemical compound CCCCCCCCC1=CC=C(C(C)=O)C=C1 GARQDIVXKVBJFP-UHFFFAOYSA-N 0.000 description 1
- NFHFRUOZVGFOOS-UHFFFAOYSA-N palladium;triphenylphosphane Chemical compound [Pd].C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1.C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 NFHFRUOZVGFOOS-UHFFFAOYSA-N 0.000 description 1
- 150000002964 pentacenes Chemical class 0.000 description 1
- IGEIPFLJVCPEKU-UHFFFAOYSA-N pentan-2-amine Chemical group CCCC(C)N IGEIPFLJVCPEKU-UHFFFAOYSA-N 0.000 description 1
- 125000005007 perfluorooctyl group Chemical group FC(C(C(C(C(C(C(C(F)(F)F)(F)F)(F)F)(F)F)(F)F)(F)F)(F)F)(F)* 0.000 description 1
- 125000000286 phenylethyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000003170 phenylsulfonyl group Chemical group C1(=CC=CC=C1)S(=O)(=O)* 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- WGYKZJWCGVVSQN-UHFFFAOYSA-N propylamine Chemical group CCCN WGYKZJWCGVVSQN-UHFFFAOYSA-N 0.000 description 1
- 238000000425 proton nuclear magnetic resonance spectrum Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- KZUNJOHGWZRPMI-UHFFFAOYSA-N samarium atom Chemical compound [Sm] KZUNJOHGWZRPMI-UHFFFAOYSA-N 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 239000012488 sample solution Substances 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 235000017557 sodium bicarbonate Nutrition 0.000 description 1
- 229910000030 sodium bicarbonate Inorganic materials 0.000 description 1
- WBHQBSYUUJJSRZ-UHFFFAOYSA-M sodium bisulfate Chemical compound [Na+].OS([O-])(=O)=O WBHQBSYUUJJSRZ-UHFFFAOYSA-M 0.000 description 1
- 229910000342 sodium bisulfate Inorganic materials 0.000 description 1
- 229910000033 sodium borohydride Inorganic materials 0.000 description 1
- 239000012279 sodium borohydride Substances 0.000 description 1
- CDBYLPFSWZWCQE-UHFFFAOYSA-L sodium carbonate Substances [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 1
- 235000011182 sodium carbonates Nutrition 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000005092 sublimation method Methods 0.000 description 1
- 238000001308 synthesis method Methods 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 125000003396 thiol group Chemical group [H]S* 0.000 description 1
- 230000036962 time dependent Effects 0.000 description 1
- 125000002306 tributylsilyl group Chemical group C(CCC)[Si](CCCC)(CCCC)* 0.000 description 1
- ITMCEJHCFYSIIV-UHFFFAOYSA-N triflic acid Chemical compound OS(=O)(=O)C(F)(F)F ITMCEJHCFYSIIV-UHFFFAOYSA-N 0.000 description 1
- 125000000025 triisopropylsilyl group Chemical group C(C)(C)[Si](C(C)C)(C(C)C)* 0.000 description 1
- 125000000026 trimethylsilyl group Chemical group [H]C([H])([H])[Si]([*])(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 238000004857 zone melting Methods 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
Landscapes
- Photovoltaic Devices (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Thin Film Transistor (AREA)
Description
本発明は、耐酸化性等の安定性及び有機溶媒への溶解性に優れ、かつ加工性に特徴を有する有機半導体に関する。 The present invention relates to an organic semiconductor that is excellent in stability such as oxidation resistance and solubility in an organic solvent, and is characterized by processability.
有機薄膜トランジスタは、有機材料の特徴である軽量性と、柔軟性を活かした、安価なトランジスタ製品を実現できる可能性があることから、研究開発が盛んに行われている。有機半導体材料は、有機トランジスタの中で薄膜として存在するが、その特性は、デバイスの製造プロセスやデバイスの性能を左右する非常に重要な要素となっている。
中でも、ペンタセンに代表される多環芳香族化合物は、その高い移動度と化合物自体の安定性の面から、これまでも多くの報告がなされている。(非特許文献1)
Organic thin-film transistors have been actively researched and developed because of the possibility of realizing inexpensive transistor products utilizing the light weight and flexibility that are the characteristics of organic materials. Organic semiconductor materials exist as thin films in organic transistors, but their characteristics are very important factors that influence the device manufacturing process and device performance.
In particular, many reports have been made on polycyclic aromatic compounds represented by pentacene, from the viewpoint of high mobility and stability of the compounds themselves. (Non-Patent Document 1)
有機薄膜トランジスタの製造方法としては、一般的に真空蒸着法に代表されるドライプロセスと、溶液塗布法に代表されるウェットプロセスに大別でき、製造コストの大幅なコストダウンが実現できる点から、ウェットプロセスに適応できることが好ましい。しかし、トランジスタの性能面からは、ドライプロセスが有利なため、どちらの材料にも適応できる柔軟性の高い材料があれば、さらに好ましいといえる。 Organic thin film transistor manufacturing methods can be broadly divided into dry processes, typically represented by vacuum deposition, and wet processes, typically represented by solution coating, and can achieve significant cost reductions. Preferably it can be adapted to the process. However, since the dry process is advantageous in terms of transistor performance, it is more preferable if there is a highly flexible material that can be applied to either material.
そのような状況下、ウェットプロセスにもドライプロセスにも適応できる新たな有機半導体材料として、ベンゾカルコゲノベンゾカルコゲノフェン誘導体が開示された。(特許文献1、非特許文献2)
また、ベンゾチエノベンゾチオフェンとクリセンの可視紫外光吸収スペクトルが類似であることも報告された。(非特許文献3)
Under such circumstances, benzochalcogenobenzochalcogenophene derivatives have been disclosed as new organic semiconductor materials that can be applied to both wet and dry processes. (Patent Document 1, Non-Patent Document 2)
It was also reported that the visible ultraviolet absorption spectra of benzothienobenzothiophene and chrysene are similar. (Non Patent Literature 3)
ベンゾチエノベンゾチオフェンとクリセンの可視紫外光吸収スペクトルが酷似していることから、クリセンもウェットプロセスにもドライプロセスにも適応できる新たな有機半導体材料となるのではないかと考えられた。ただし、クリセン骨格を有する材料で有機トランジスタとしての性能はこれまで不明であった。本発明者らは、クリセンを用いて真空蒸着法にて有機トランジスタ素子を作製し評価を試みた。しかし、トランジスタ応答を観測することはできなかった。そこで、クリセン単体では無理であっても、様々な置換基を付与することで、トランジスタ応答を得ることができると考え、クリセンの誘導体を新規に合成し、そのトランジスタ特性の評価を繰り返すことで、本発明に至った。 Since the visible ultraviolet absorption spectra of benzothienobenzothiophene and chrysene are very similar, it was thought that chrysene could be a new organic semiconductor material that can be applied to both wet and dry processes. However, the performance as an organic transistor with a material having a chrysene skeleton has been unknown so far. The inventors of the present invention tried to evaluate an organic transistor element using chrysene by vacuum deposition. However, the transistor response could not be observed. Therefore, even if it is impossible with chrysene alone, we think that transistor response can be obtained by adding various substituents, and newly synthesized chrysene derivatives, and repeated evaluation of the transistor characteristics, The present invention has been reached.
代表的な有機半導体材料であるペンタセンは、有機溶媒に対する溶解性が低く、さらに、溶液状態での安定性に問題がある。そこで、ペンタセンに代わり、有機溶媒に対する溶解性が高く、溶液状態でも安定性がある有機半導体材料を提供することにある。 Pentacene, which is a typical organic semiconductor material, has low solubility in an organic solvent, and further has a problem in stability in a solution state. Accordingly, an object of the present invention is to provide an organic semiconductor material that has high solubility in an organic solvent and is stable even in a solution state, instead of pentacene.
そこで、本発明は前記課題を解決するために、本発明者らは鋭意検討した結果、クリセン骨格を有する化合物が、ペンタセンの不安定性を克服しつつ、有機トランジスタとしても高い性能を示す新規な有機半導体材料であることを見出し、本発明を完成するに至った。すなわち、本発明は次のような構成から成る。 Therefore, the present inventors have intensively studied to solve the above-mentioned problems, and as a result, the compound having a chrysene skeleton has overcome the instability of pentacene and is a novel organic transistor that exhibits high performance as an organic transistor. The present inventors have found that it is a semiconductor material and have completed the present invention. That is, the present invention has the following configuration.
すなわち、第1の発明は、下記化学式〔化1〕で表されるクリセン骨格を有する有機半導体材料を提供するものである。
〔化1〕
That is, the first invention provides an organic semiconductor material having a chrysene skeleton represented by the following chemical formula [Chemical Formula 1].
[Chemical formula 1]
ただし、化学式〔化1〕中の置換基R1からR12は、それぞれ独立に、ハロゲン原子、置換もしくは無置換のアリール基、置換もしくは無置換の複素環基、置換もしくは無置換のアルキル基、置換もしくは無置換のアルケニル基、置換もしくは無置換のアルキニル基、置換もしくは無置換のアルコキシル基、置換もしくは無置換のカルボニル基、置換もしくは無置換のエステル基、置換もしくは無置換のアミド基、置換もしくは無置換のイミノ基、置換もしくは無置換のスルフィド基、置換もしくは無置換のスルホキシド基、置換もしくは無置換のスルホニル基、置換もしくは無置換のシリル基、カルボキシル基、ヒドロキシル基、ニトロ基、ニトリル基、メルカプト基のうち、少なくとも一つを含むものとし、R 1 からR 12 が同時に2つの置換もしくは無置換のフェニルエテニル基となるものを除く。 However, R 12 from Substituent R 1 in chemical formula [1] in each independently C androgenic atom, a substituted or unsubstituted aryl group, a substituted or unsubstituted heterocyclic group, a substituted or unsubstituted alkyl group Substituted or unsubstituted alkenyl group, substituted or unsubstituted alkynyl group, substituted or unsubstituted alkoxyl group, substituted or unsubstituted carbonyl group, substituted or unsubstituted ester group, substituted or unsubstituted amide group, substituted Or unsubstituted imino group, substituted or unsubstituted sulfide group, substituted or unsubstituted sulfoxide group, substituted or unsubstituted sulfonyl group, substituted or unsubstituted silyl group, carboxyl group, hydroxyl group, nitro group, nitrile group among the mercapto group, at least one and Dressings containing from R 1 R 12 simultaneously Except for two substituted or unsubstituted phenylethenyl groups.
なお、置換基R1からR12の好ましい例は、フッ素原子、アリール基、複素環基、アルキル基、アルケニル基、アルキニル基である。 Preferable examples of R 12 from substituents R 1 are full Tsu atom, an aryl group, a heterocyclic group, an alkyl group, an alkenyl group, an alkynyl group.
置換基R1から R12における、ハロゲン原子はフッ素、塩素、臭素、ヨウ素であり、好ましい例はフッ素原子である。 In the substituents R 1 to R 12 , the halogen atom is fluorine, chlorine, bromine or iodine, and a preferred example is a fluorine atom.
置換基R1からR12における、アリール基は特に限定されず、例えば、フェニル基、2−メチルフェニル基、3−メチルフェニル基、4−メチルフェニル基、2−ヘプチルフェニル基、3−ヘプチルフェニル基、4−ヘプチルフェニル基、2−オクチルフェニル基、3−オクチルフェニル基、4−オクチルフェニル基、4−メトキシフェニル基、4−フルオロフェニル基、ペンタフルオロフェニル基、4−(トリフルオロメチル)フェニル基、ナフチル基、ビフェニル基、ターフェニル基などが挙げられる。 The aryl group in the substituents R 1 to R 12 is not particularly limited, and examples thereof include a phenyl group, 2-methylphenyl group, 3-methylphenyl group, 4-methylphenyl group, 2-heptylphenyl group, and 3-heptylphenyl. Group, 4-heptylphenyl group, 2-octylphenyl group, 3-octylphenyl group, 4-octylphenyl group, 4-methoxyphenyl group, 4-fluorophenyl group, pentafluorophenyl group, 4- (trifluoromethyl) A phenyl group, a naphthyl group, a biphenyl group, a terphenyl group, etc. are mentioned.
置換基R1からR12における、複素環基は特に限定されず、2−チエニル基、5−(1−フプチル)−2−チエニル基、2−ベンゾチエニル基、5’−ヘキシルー2,2’−ビチエノ−5−イル基、2−フリル基、1−メチル−2−ピロリル基、2−ピリジル基、2−ビピリジル基などが挙げられる。 The heterocyclic group in the substituents R 1 to R 12 is not particularly limited, and is a 2-thienyl group, a 5- (1-heptyl) -2-thienyl group, a 2-benzothienyl group, a 5′-hexyleu 2,2 ′. -Bithieno-5-yl group, 2-furyl group, 1-methyl-2-pyrrolyl group, 2-pyridyl group, 2-bipyridyl group and the like.
置換基R1からR12における、アルキル基は特に限定されず、直鎖型、分岐型、環状型のアルキル基であり、例えば、n−ブチル基、n−ペンチル基、n−ヘキシル基、n−ヘプチル基、n−オクチル基、n−ノニル基、n−デシル基、n−ウンデシル基、n−ドデシル基、n−トリデシル基、イソプロピル基、tert−ブチル基、シクロペンチル基、シクロヘキシル基、アダマンチル基、フェニルエチル基、(p−ヘキシルフェニル)エチル基、ナフチルエチル基、ビフェニルエチル基、ターフェニルエチル基、トリフルオロメチル基、パーフルオロオクチル基、パーフルオロドデシル基などが挙げられる。 The alkyl group in the substituents R 1 to R 12 is not particularly limited, and is a linear, branched, or cyclic alkyl group such as an n-butyl group, an n-pentyl group, an n-hexyl group, n -Heptyl group, n-octyl group, n-nonyl group, n-decyl group, n-undecyl group, n-dodecyl group, n-tridecyl group, isopropyl group, tert-butyl group, cyclopentyl group, cyclohexyl group, adamantyl group , Phenylethyl group, (p-hexylphenyl) ethyl group, naphthylethyl group, biphenylethyl group, terphenylethyl group, trifluoromethyl group, perfluorooctyl group, perfluorododecyl group and the like.
置換基R1からR12における、アルケニル基は特に限定されず、例えば、エテニル基、メチルエテニル基、ヘキシルエテニル基、フェニルエテニル基、(o−ヘキシルフェニル)エテニル基、(m−ヘキシルフェニル)エテニル基、(p−ヘキシルフェニル)エテニル基、(p−ヘプチルフェニル)エテニル基、(p−オクチルフェニル)エテニル基、ナフチルエテニル基、ビフェニルエテニル基、ターフェニルエテニル基、パーフルオロフェニルエテニル基などが挙げられる。 The alkenyl group in the substituents R 1 to R 12 is not particularly limited, and examples thereof include an ethenyl group, a methylethenyl group, a hexylethenyl group, a phenylethenyl group, a (o-hexylphenyl) ethenyl group, and a (m-hexylphenyl) ethenyl group. , (P-hexylphenyl) ethenyl group, (p-heptylphenyl) ethenyl group, (p-octylphenyl) ethenyl group, naphthylethenyl group, biphenylethenyl group, terphenylethenyl group, perfluorophenylethenyl group, etc. Can be mentioned.
置換基R1からR12における、アルキニル基は特に限定されず、例えば、エチニル基、メチルエチニル基、オクチルエチニル基、フェニルエチニル基、(o−ヘキシルフェニル)エチニル基、(m−ヘキシルフェニル)エチニル基、(p−ヘキシルフェニル)エチニル基、(p−ヘプチルフェニル)エチニル基、(p−オクチルフェニル)エチニル基、ナフチルエチニル基、ビフェニルエチニル基、ターフェニルエチニル基、パーフルオロフェニルエチニル基、トリメチルシリルエチニル基、トリエチルシリルエチニル基、トリプロピルシリルエチニル基、トリイソプロピルシリルエチニル基などが挙げられる。 The alkynyl group in the substituents R 1 to R 12 is not particularly limited. For example, ethynyl group, methyl ethynyl group, octyl ethynyl group, phenyl ethynyl group, (o-hexylphenyl) ethynyl group, (m-hexylphenyl) ethynyl Group, (p-hexylphenyl) ethynyl group, (p-heptylphenyl) ethynyl group, (p-octylphenyl) ethynyl group, naphthylethynyl group, biphenylethynyl group, terphenylethynyl group, perfluorophenylethynyl group, trimethylsilylethynyl Group, triethylsilylethynyl group, tripropylsilylethynyl group, triisopropylsilylethynyl group and the like.
置換基R1からR12における、カルボニル基は特に限定されず、例えば、アルデヒド基、エタノン、エタナール、1−プロパノン、2−プロパノン、プロパナール、1−オクタノン、(p−オクチルフェニル)エタノンなどが挙げられる。 The carbonyl group in the substituents R 1 to R 12 is not particularly limited, and examples thereof include an aldehyde group, ethanone, ethanal, 1-propanone, 2-propanone, propanal, 1-octanone, and (p-octylphenyl) ethanone. Can be mentioned.
置換基R1からR12における、アミド基は特に限定されず、例えば、アセトアミド基、プロピルアミド基、ブチルアミド基、イソブチルアミド基、ペンチルアミド基、イソペンチルアミド基、sec−ペンチルアミド基、tert−ペンチルアミド基、各種ヘプチルアミド基、各種ペンチルアミド基、各種オクチルアミド基等が挙げられる。 The amide group in the substituents R 1 to R 12 is not particularly limited, and for example, an acetamido group, a propylamide group, a butylamide group, an isobutylamide group, a pentylamide group, an isopentylamide group, a sec-pentylamide group, a tert- Examples include a pentylamide group, various heptylamide groups, various pentylamide groups, various octylamide groups, and the like.
置換基R1からR12における、スルフィド基は特に限定されず、例えば、メチルスルフィド基、エチルスルフィド基、プロピルスルフィド基、イソプロピルスルフィド基、ブチルスルフィド基、イソブチルスルフィド基、sec−ブチルスルフィド基、tert−ブチルスルフィド基、各種ペンチルスルフィド基、各種ヘキシルスルフィド基、各種ヘプチルスルフィド基、各種オクチルスルフィド基、フェニルスルフィド基、o−ヘキシルフェニルスルフィド基、m−ヘキシルフェニルスルフィド基、p−ヘキシルフェニルスルフィド基等が挙げられる。 The sulfide group in the substituents R 1 to R 12 is not particularly limited, and examples thereof include a methyl sulfide group, an ethyl sulfide group, a propyl sulfide group, an isopropyl sulfide group, a butyl sulfide group, an isobutyl sulfide group, a sec-butyl sulfide group, a tert -Butyl sulfide group, various pentyl sulfide groups, various hexyl sulfide groups, various heptyl sulfide groups, various octyl sulfide groups, phenyl sulfide groups, o-hexyl phenyl sulfide groups, m-hexyl phenyl sulfide groups, p-hexyl phenyl sulfide groups, etc. Is mentioned.
置換基R1からR12における、スルホキシド基は特に限定されず、例えば、メチルスルホキシド基、エチルスルホキシド基、プロピルスルホキシド基、イソプロピルスルホキシド基、ブチルスルホキシド基、イソブチルスルホキシド基、sec−ブチルスルホキシド基、tert−ブチルスルホキシド基、各種ペンチルスルホキシド基、各種ヘキシルスルホキシド基、各種ヘプチルスルホキシド基、各種オクチルスルホキシド基、フェニルスルホキシド基、o−ヘキシルフェニルスルホキシド基、m−ヘキシルフェニルスルホキシド基、p−ヘキシルフェニルスルホキシド基等が挙げられる。 The sulfoxide group in the substituents R 1 to R 12 is not particularly limited, and examples thereof include a methyl sulfoxide group, an ethyl sulfoxide group, a propyl sulfoxide group, an isopropyl sulfoxide group, a butyl sulfoxide group, an isobutyl sulfoxide group, a sec-butyl sulfoxide group, and a tert. -Butyl sulfoxide group, various pentyl sulfoxide groups, various hexyl sulfoxide groups, various heptyl sulfoxide groups, various octyl sulfoxide groups, phenyl sulfoxide groups, o-hexyl phenyl sulfoxide groups, m-hexyl phenyl sulfoxide groups, p-hexyl phenyl sulfoxide groups, etc. Is mentioned.
置換基R1からR12における、スルホニル基は特に限定されず、例えば、メチルスルホニル基、エチルスルホニル基、プロピルスルホニル基、イソプロピルスルホニル基、ブチルスルホニル基、イソブチルスルホニル基、sec−ブチルスルホニル基、tert−ブチルスルホニル基、各種ペンチルスルホニル基、各種ヘキシルスルホニル基、各種ヘプチルスルホニル基、各種オクチルスルホニル基、フェニルスルホニル基、o−ヘキシルフェニルスルホニル基、m−ヘキシルフェニルスルホニル基、p−ヘキシルフェニルスルホニル基等が挙げられる。 The sulfonyl group in the substituents R 1 to R 12 is not particularly limited, and examples thereof include a methylsulfonyl group, ethylsulfonyl group, propylsulfonyl group, isopropylsulfonyl group, butylsulfonyl group, isobutylsulfonyl group, sec-butylsulfonyl group, tert -Butylsulfonyl group, various pentylsulfonyl groups, various hexylsulfonyl groups, various heptylsulfonyl groups, various octylsulfonyl groups, phenylsulfonyl group, o-hexylphenylsulfonyl group, m-hexylphenylsulfonyl group, p-hexylphenylsulfonyl group, etc. Is mentioned.
置換基R1からR12における、シリル基は特に限定されず、例えば、トリメチルシリル基、トリエチルシリル基、トリブチルシリル基、トリイソブチルシリル基、トリプロピルシリル基、トリイソプロピルシリル基、トリsec−ブチルシリル基、トリtert−ブチルシリル基等が挙げられる。 The silyl group in the substituents R 1 to R 12 is not particularly limited, and examples thereof include a trimethylsilyl group, a triethylsilyl group, a tributylsilyl group, a triisobutylsilyl group, a tripropylsilyl group, a triisopropylsilyl group, and a trisec-butylsilyl group. And tritert-butylsilyl group.
続いて、第2の発明は、化学式〔化1〕中のR2、R8が水素原子以外の同一の置換基であることを特徴とする第1の発明に記載の有機半導体材料である。 Subsequently, the second invention is the organic semiconductor material according to the first invention, wherein R 2 and R 8 in the chemical formula [Chemical Formula 1] are the same substituents other than hydrogen atoms.
続いて、第3の発明は、化学式〔化1〕中のR6、R12が水素原子以外の同一の置換基であることを特徴とする第1の発明に記載の有機半導体材料である。 Subsequently, a third invention is the organic semiconductor material according to the first invention, wherein R 6 and R 12 in the chemical formula [Chemical Formula 1] are the same substituents other than hydrogen atoms.
第6の発明は、第1発明から第5発明のいずれかの有機半導体材料、あるいは、いずれかの有機半導体材料の複数を組み合わせてからなる有機電子デバイスである。
A sixth invention is an organic electronic device comprising any one of the organic semiconductor materials of the first to fifth inventions, or a combination of any of the organic semiconductor materials.
ここでいう有機電子デバイスとは、本化合物の電気特性を利用した電子デバイスのことであり、具体的には、有機トランジスタ、有機レーザー、有機薄膜太陽電池、有機メモリーなどが挙げられる。 The term “organic electronic device” as used herein refers to an electronic device that utilizes the electrical characteristics of the present compound, and specific examples include organic transistors, organic lasers, organic thin-film solar cells, and organic memories.
本発明の化合物をこれら有機電子デバイスに利用するにあたって、高純度化のために不純物の除去等の精製が必要になるが、本発明の化合物は、液体クロマトグラフィー法、昇華法、ゾーンメルティング法、ゲルパーミネーションクロマトグラフィー法、再結晶法、熱洗浄法などによって精製できる。 When the compound of the present invention is used in these organic electronic devices, purification such as removal of impurities is required for high purity, but the compound of the present invention can be obtained by liquid chromatography method, sublimation method, zone melting method. It can be purified by gel permeation chromatography, recrystallization, thermal washing, and the like.
また、本発明の化合物を有機電子デバイスに利用するにあたって、主として薄膜の形態で用いられるが、その薄膜作製法として、ウェットプロセスとドライプロセスどちらを使用してもよい。本発明の化合物は、有機溶媒等へ溶解させることにより、産業上メリットの大きいウェットプロセスに適応できる。 Further, when the compound of the present invention is used in an organic electronic device, it is mainly used in the form of a thin film, and either a wet process or a dry process may be used as a method for forming the thin film. By dissolving the compound of the present invention in an organic solvent or the like, it can be applied to a wet process having great industrial merit.
ここで、有機溶媒としては、例えば、ジクロロメタン、クロロホルム、クロロベンゼン、シクロヘキサノール、トルエン、キシレン、ニトロベンゼン、メチルエチルケトン、ジグライム、テトラヒドロフランなど、これまで公知のものが使用できる。また、本発明の化合物を有機溶媒等へ溶解させる場合、温度や圧力に特に制限は無いが、溶解させる温度に関しては、0〜200℃の範囲が好ましく、さらに好ましくは、10〜150℃の範囲である。また、溶解させる圧力に関しては、0.1〜100MPaの範囲が好ましく、さらに好ましくは、0.1〜10MPaの範囲である。また、有機溶媒の代わりに、超臨界二酸化炭素のようなものを用いることも可能である。 Here, as the organic solvent, for example, known solvents such as dichloromethane, chloroform, chlorobenzene, cyclohexanol, toluene, xylene, nitrobenzene, methyl ethyl ketone, diglyme, and tetrahydrofuran can be used. In addition, when the compound of the present invention is dissolved in an organic solvent or the like, the temperature and pressure are not particularly limited, but the temperature for dissolution is preferably in the range of 0 to 200 ° C, more preferably in the range of 10 to 150 ° C. It is. Moreover, regarding the pressure to melt | dissolve, the range of 0.1-100 MPa is preferable, More preferably, it is the range of 0.1-10 MPa. Moreover, it is also possible to use something like supercritical carbon dioxide instead of the organic solvent.
ここで言うウェットプロセスとは、スピンコート法、ディップコート法、バーコート法、スプレーコート法、インクジェット法、スクリーン印刷法、平板印刷法、凹版印刷法、凸版印刷法などを示しており、これら公知の方法が利用できる。
さらに、ここで言うドライプロセスとは、真空蒸着法、スパッタリング法、CVD法、レーザー蒸着法、分子線エピタキシャル成長法、気相輸送成長法などを示しており、これら公知の方法が利用できる。
The wet process here refers to a spin coating method, a dip coating method, a bar coating method, a spray coating method, an ink jet method, a screen printing method, a lithographic printing method, an intaglio printing method, a relief printing method, and the like. Can be used.
Furthermore, the dry process mentioned here indicates a vacuum deposition method, a sputtering method, a CVD method, a laser deposition method, a molecular beam epitaxial growth method, a vapor phase transport growth method, and the like, and these known methods can be used.
本発明の化合物を使用した有機電子デバイスの使用例を、図1及び図2に示す。図1では、電界効果型トランジスタ(以下FETとする)での使用例を挙げている。FETはその特徴から、スイッチング素子や増幅素子として利用される。ゲート電流が低いことに加え、構造が平面的であるため、ウェットプロセスによる作製や集積化が容易であり大面積化を可能とする。ここでは、本発明の化合物は、主にp型半導体として利用されているが、置換基、溶剤によってn型半導体として機能する場合もある。 Examples of use of the organic electronic device using the compound of the present invention are shown in FIGS. FIG. 1 shows an example of use in a field effect transistor (hereinafter referred to as FET). FETs are used as switching elements and amplifying elements because of their characteristics. In addition to a low gate current, the structure is planar, so that fabrication and integration by a wet process are easy and a large area can be achieved. Here, although the compound of the present invention is mainly used as a p-type semiconductor, it may function as an n-type semiconductor depending on a substituent or a solvent.
また、図2では有機薄膜太陽電池での使用例を挙げている。図2に示す共蒸着層とは、p型とn型を一緒に蒸着させた層であり、この層で太陽光により正孔と電子により分離させやすくするためである。 FIG. 2 shows an example of use in an organic thin film solar cell. The co-deposited layer shown in FIG. 2 is a layer in which p-type and n-type are vapor-deposited together, and this layer is intended to facilitate separation by holes and electrons by sunlight.
第1の発明では、大気中での取り扱いが容易で、かつ置換基の種類を変更することで、ドライプロセスにもウェットプロセスにも適応可能な、有機半導体電子デバイスを製造しやすい有機半導体材料を提供することができる。 In the first invention, an organic semiconductor material that is easy to manufacture in an organic semiconductor electronic device that can be easily handled in the atmosphere and can be adapted to both a dry process and a wet process by changing the type of substituent. Can be provided.
第2の発明では、置換基を同一にすることにより、その合成過程が容易になり、特にR2とR8に同一置換基にすることにより、ドライプロセスに適し、かつトランジスタ特性に優れた材料が提供できる。 In the second invention, by making the substituents the same, the synthesis process is facilitated. In particular, by making the same substituents R 2 and R 8 , the material is suitable for the dry process and has excellent transistor characteristics. Can be provided.
第3の発明では、置換基を同一にすることにより、その合成過程が容易になる。特にR6とR12に同一置換基にすることにより、ウェットプロセスに適し、かつトランジスタ特性に優れた材料が提供できる。 In 3rd invention, the synthetic | combination process becomes easy by making a substituent into the same. In particular, by using the same substituent for R 6 and R 12 , a material that is suitable for a wet process and excellent in transistor characteristics can be provided.
第4の発明では、第1の発明から第3の発明の有機半導体材料を有機電子デバイスに利用することを可能とする。 In the fourth invention, the organic semiconductor material of the first invention to the third invention can be used for an organic electronic device.
代表的な実施例を以下に示す。 A typical example is shown below.
本発明の化学式〔化1〕の合成過程の一例を〔合成経路〕に示し、その詳細を次に説明する。しかし下記の合成法は特に限定されるものではなく、公知の反応を組み合わせて合成することが可能である。なお、各化合物にA,B,・・・Hの符号を付す。
〔合成経路〕
An example of the synthesis process of the chemical formula [Chemical Formula 1] of the present invention is shown in [Synthesis Route], and the details will be described below. However, the synthesis method described below is not particularly limited, and can be synthesized by combining known reactions. Incidentally, denoted A, B, the sign of · · · H for each compound.
[Synthetic route]
上記〔合成経路〕を用いて本発明をさらに詳しく説明する。(化合物Fの合成)
(1)化合物Aの合成
窒素雰囲気下、冷却管付1LGLフラスコ中に4−ブロモけい皮酸103g(455mmol)、硫酸4.5g(46mmol)、メタノール1Lを加え、60℃で12時間攪拌した。反応終了後、室温まで冷却し、水1.2Lを加え、結晶を濾過した。得られた粗結晶を再結晶し、化合物Aを得た。
The present invention will be described in more detail using the above [synthesis route]. (Synthesis of Compound F )
(1) Synthesis of Compound A Under a nitrogen atmosphere, 103 g (455 mmol) of 4-bromocinnamic acid, 4.5 g (46 mmol) of sulfuric acid, and 1 L of methanol were added to a 1 LGL flask with a condenser, and stirred at 60 ° C. for 12 hours. After completion of the reaction, the reaction mixture was cooled to room temperature, 1.2 L of water was added, and the crystals were filtered. The obtained crude crystals were recrystallized to obtain Compound A.
(2)化合物Bの合成
窒素雰囲気下、冷却管付3LGLフラスコ中にアルミニウム29g(1058mmol)、メタノール600mL、よう素55g(216mmol)を加え、室温にて1時間攪拌した。0℃以下に冷却し、化合物A104g(432mmol)、メタノール600mLを加えた後、サマリウム56g(371mmol)を加えた。ゆっくりと室温まで戻し、室温で15時間攪拌した。反応終了後、トルエン800mLを加えてセライト濾過した。濾液は希塩酸、重曹水、食塩水の順に洗浄後、硫酸マグネシウムで乾燥し、減圧濃縮した。得られた粗結晶をカラムクロマトグラフィーで精製し、化合物Bを得た。
(2) Synthesis of Compound B Under a nitrogen atmosphere, 29 g (1058 mmol) of aluminum, 600 mL of methanol, and 55 g (216 mmol) of iodine were added to a 3LGL flask with a cooling tube, and stirred at room temperature for 1 hour. After cooling to 0 ° C. or lower, 104 g (432 mmol) of compound A and 600 mL of methanol were added, and 56 g (371 mmol) of samarium was then added. The mixture was slowly returned to room temperature and stirred at room temperature for 15 hours. After completion of the reaction, 800 mL of toluene was added and filtered through Celite. The filtrate was washed with dilute hydrochloric acid, aqueous sodium bicarbonate, and brine, dried over magnesium sulfate, and concentrated under reduced pressure. The resulting crude crystals were purified by column chromatography to obtain compound B.
(3)化合物Cの合成
窒素雰囲気下、冷却管付1LGLフラスコ中に化合物B32g(66mmol)、トリフルオロメタンスルホン酸250mLを加え、40℃で17時間攪拌した。反応終了後、5℃に冷却し、水300mLを滴下後、結晶を濾過した。得られた粗結晶はカラムクロマトグラフィーで精製し、化合物Cを得た。
(3) Synthesis of Compound C Under a nitrogen atmosphere, 32 g (66 mmol) of Compound B and 250 mL of trifluoromethanesulfonic acid were added to a 1 LGL flask with a cooling tube, and the mixture was stirred at 40 ° C. for 17 hours. After completion of the reaction, the reaction mixture was cooled to 5 ° C., 300 mL of water was added dropwise, and the crystals were filtered. The resulting crude crystals were purified by column chromatography to obtain compound C.
(4)化合物Dの合成
窒素雰囲気下、冷却管付2LGLフラスコ中に化合物C9.5g(23mmol)、イソプロパノール760mL、水素化ホウ素ナトリウム3.1g(84mmol)、水30mLを加え、40℃で17時間攪拌した。反応終了後、10℃に冷却し、水1Lを加えた。結晶を濾過し、得られた化合物Dの粗結晶は精製せずに次の反応へ使用した。
(4) Synthesis of Compound D Under a nitrogen atmosphere, 9.5 g (23 mmol) of Compound C , 760 mL of isopropanol, 3.1 g (84 mmol) of sodium borohydride, and 30 mL of water were added to a 2 LGL flask with a cooling tube. Stir for hours. After completion of the reaction, the reaction mixture was cooled to 10 ° C. and 1 L of water was added. The crystals were filtered, and the resulting crude crystals of compound D were used for the next reaction without purification.
(5)化合物Eの合成
窒素雰囲気下、冷却管付1LGLフラスコ中に化合物D8.6g(20mmol)、パラトルエンスルホン酸一水和物3.9g(20mmol)、トルエン430mLを加え、110℃で24時間攪拌した。反応終了後、室温まで冷却し、水200mL、n−ヘプタン200mLを加えて濾過した。得られた粗結晶は、カラムクロマトグラフィーを行った後、再結晶して精製し、化合物Eを得た。
(5) Synthesis of Compound E Under a nitrogen atmosphere, 8.6 g (20 mmol) of Compound D, 3.9 g (20 mmol) of paratoluenesulfonic acid monohydrate, and 430 mL of toluene were added to a 1 LGL flask with a cooling tube at 110 ° C. Stir for 24 hours. After completion of the reaction, the reaction mixture was cooled to room temperature, and 200 mL of water and 200 mL of n-heptane were added and filtered. The obtained crude crystals were purified by recrystallization after column chromatography to obtain Compound E.
(6)化合物Fの合成
窒素雰囲気下、冷却管付30mLGLフラスコ中に化合物E500mg(1.3mmol)、フェニルボロン酸470mg(3.9mmol)、テトラキストリフェニルホスフィンパラジウム30mg(0.03mmol)、炭酸カリウム1070mg(7.8mmol)、トルエン10mL、水3mLを加え、80℃で16時間攪拌した。反応終了後、室温まで冷却し、水を加えて結晶を濾過した。得られた粗結晶は熱洗浄にて精製し、化合物Fを得た。化合物Fのマススペクトルを図4に示す。
(6) Synthesis of Compound F In a nitrogen atmosphere with a cooling tube, Compound E 500 mg (1.3 mmol), phenylboronic acid 470 mg (3.9 mmol), tetrakistriphenylphosphine palladium 30 mg (0.03 mmol), carbonic acid 1070 mg (7.8 mmol) of potassium, 10 mL of toluene and 3 mL of water were added, and the mixture was stirred at 80 ° C. for 16 hours. After completion of the reaction, the mixture was cooled to room temperature, water was added, and the crystals were filtered. The obtained crude crystals were purified by heat washing to obtain Compound F. The mass spectrum of Compound F is shown in FIG.
(7)化合物Gの合成
窒素雰囲気下、冷却管付500mLGLフラスコ中にクリセン1.00g(4.4mmol)、クロロホルム250mLを加えて60℃に加熱し、続いて臭素1.8g(11.0mmol)を加えて60℃で24時間攪拌した。反応終了後、硫酸水素ナトリウム水溶液を加え、結晶を濾過した。得られた粗結晶は再結晶にて精製し、化合物Gを得た。
(7) Synthesis of Compound G Under a nitrogen atmosphere, 1.00 g (4.4 mmol) of chrysene and 250 mL of chloroform were added to a 500 mL GL flask with a cooling tube and heated to 60 ° C., followed by 1.8 g (11.0 mmol) of bromine. And stirred at 60 ° C. for 24 hours. After completion of the reaction, an aqueous sodium hydrogen sulfate solution was added, and the crystals were filtered. The obtained crude crystals were purified by recrystallization to obtain compound G.
(8)化合物Hの合成
窒素雰囲気下、冷却管付30mLGLフラスコ中に金属マグネシウム130mg(5.4mmol)、テトラヒドロフラン2.6mLを加えた後、1−ブロモオクタン1000mg(5.2mmol)を滴下し、40℃で1時間攪拌してグリニャール試薬を調整した。
窒素雰囲気下、30mLGLフラスコ中に化合物H500mg(1.3mmol)、ジフェニルホスフィノプロパンジクロロニッケル28mg(0.05mmol)、テトラヒドロフラン8mLを加え、0℃まで冷却した。続いて先に調整した1−ブロモオクタンのグリニャール試薬を加え、0℃で4時間攪拌した。反応終了後、希塩酸および、トルエンを加え、室温まで暖めた。有機層は重曹水、食塩水で洗浄した後、硫酸マグネシウムで乾燥して減圧濃縮した。得られた粗結晶は、カラムクロマトグラフィーを行った後、再結晶して精製し、化合物Hを得た。化合物HのNMRスペクトルを図5及び図6に示す。
(8) Synthesis of Compound H Under a nitrogen atmosphere, 130 mg (5.4 mmol) of metal magnesium and 2.6 mL of tetrahydrofuran were added to a 30 mLGL flask with a cooling tube, and then 1000 mg (5.2 mmol) of 1-bromooctane was added dropwise. The Grignard reagent was prepared by stirring at 40 ° C. for 1 hour.
Under a nitrogen atmosphere, 500 mg (1.3 mmol) of Compound H , 28 mg (0.05 mmol) of diphenylphosphinopropanedichloronickel and 8 mL of tetrahydrofuran were added to a 30 mL GL flask, and cooled to 0 ° C. Subsequently, the previously prepared Grignard reagent of 1-bromooctane was added and stirred at 0 ° C. for 4 hours. After completion of the reaction, dilute hydrochloric acid and toluene were added, and the mixture was warmed to room temperature. The organic layer was washed with aqueous sodium bicarbonate and brine, dried over magnesium sulfate and concentrated under reduced pressure. The obtained crude crystals were purified by recrystallization after performing column chromatography to obtain Compound H. The NMR spectrum of Compound H is shown in FIGS.
有機薄膜トランジスタの作製(単結晶貼り付け)
上記実施例1にて作製した2,8−ジフェニルクリセン(化合物F)を用いて、図1に示す構造の薄膜デバイスを作製した。具体的には、厚さ210nmの熱酸化膜を形成したシリコンウェハーに、ポリメチルメタクリレート(PMMA)のトルエン溶液(3wt%)を大気下にてスピンコート(回転数2000rpm、30sec)し、窒素雰囲気下にて70℃で一晩、続けて100℃で3時間熱処理をおこなうことでPMMA絶縁膜を作製した。この上に2,8−ジフェニルクリセン(化合物F)の薄片単結晶を貼り付け、結晶の両端に金ペーストを塗布し電界効果トランジスタ素子を作製し、評価を行った。
その結果、電界効果移動度は0.91cm2/V・sで、On/Off電流比は103であった。
Fabrication of organic thin film transistor (single crystal attachment)
Using the 2,8-diphenylchrysene (compound F ) produced in Example 1, a thin film device having the structure shown in FIG. 1 was produced. Specifically, a silicon wafer on which a thermal oxide film having a thickness of 210 nm is formed is spin-coated with polymethyl methacrylate (PMMA) in toluene (3 wt%) in the air (rotation speed: 2000 rpm, 30 sec), and a nitrogen atmosphere A PMMA insulating film was manufactured by performing heat treatment at 70 ° C. overnight and subsequently at 100 ° C. for 3 hours. A thin single crystal of 2,8-diphenylchrysene (compound F 2 ) was pasted on this, and a gold paste was applied to both ends of the crystal to produce a field effect transistor element and evaluated.
As a result, the field effect mobility was 0.91 cm 2 / V · s, and the On / Off current ratio was 10 3 .
有機薄膜トランジスタの作製(蒸着)
厚さ210nmの熱酸化膜を形成したシリコンウェハー上に、基板温度60℃にて、2,8−ジフェニルクリセン(化合物F)を真空蒸着し、その上から、ソース・ドレイン電極となる金を電子ビーム法にて80nm蒸着することで、TOPコンタクト型素子を作製し、評価をおこなった。
その結果、電界効果移動度は4.1×10−2cm2/V・sで、On/Off電流比は105であった。
Fabrication of organic thin-film transistors (evaporation)
2,8-diphenylchrysene (compound F ) is vacuum-deposited on a silicon wafer on which a thermal oxide film having a thickness of 210 nm is formed at a substrate temperature of 60 ° C., and gold serving as a source / drain electrode is electron-electronized thereon. A TOP contact type element was fabricated and evaluated by depositing 80 nm by the beam method.
As a result, the field effect mobility is 4.1 × 10 -2 cm 2 / V · s, On / Off current ratio was 10 5.
有機薄膜トランジスタの作製(塗布:キャスト)
厚さ210nmの熱酸化膜を形成したシリコンウェハー上に、6,12−ジオクチルクリセン(化合物H)のクロロホルム溶液(0.4wt%)を大気下にてキャストし、薄膜を作製した。その上から、ソース・ドレイン電極となる金を電子ビーム法にて80nm蒸着することで、TOPコンタクト型素子を作製し、評価をおこなった。
その結果、電界効果移動度は、1.2×10−3cm2/V・sで、On/Off電流比は104であった。
Fabrication of organic thin film transistor (coating: cast)
A chloroform solution (0.4 wt%) of 6,12-dioctylchrysene (compound H 2 ) was cast in the air on a silicon wafer on which a thermal oxide film having a thickness of 210 nm was formed, to produce a thin film. On top of that, gold was deposited as a source / drain electrode by 80 nm by an electron beam method, and a TOP contact type device was fabricated and evaluated.
As a result, the field-effect mobility, at 1.2 × 10 -3 cm 2 / V · s, On / Off current ratio was 10 4.
(比較例)
本発明の化合物に代えて、比較化合物として、以下に示すペンタセン(化合物I)を用い、上記実施例と同様にして比較素子を作製した。
その結果、ペンタセン(化合物I)の単結晶を貼り付けた素子では、電界効果移動度は0.27cm2/V・sで、On/Off電流比は103であった。
また、ペンタセンを蒸着した素子では、電界効果移動度は、0.15cm2/V・sで、On/Off電流比は104であった。塗布による素子は、ペンタセンの溶解性が乏しいため試料溶液が調整できなかった。また、ペンタセン誘導体である以下に示す2,9−ジオクチルペンタセン(化合物J)では、クロロホルム溶液(0.4wt%)を調整後に大気中にて速やかに酸化劣化が見られたため、デバイスを作製することが困難であった。
(Comparative example)
Instead of the compound of the present invention, the following pentacene (compound I ) was used as a comparative compound, and a comparative element was produced in the same manner as in the above example.
As a result, in the element to which the single crystal of pentacene (Compound I ) was attached, the field effect mobility was 0.27 cm 2 / V · s, and the On / Off current ratio was 10 3 .
In the element deposited with pentacene, the field effect mobility was 0.15 cm 2 / V · s, and the On / Off current ratio was 10 4 . In the device by coating, the sample solution could not be prepared due to poor solubility of pentacene. In addition, the 2,9-dioctylpentacene (compound J ) shown below, which is a pentacene derivative, rapidly oxidized in the atmosphere after adjusting the chloroform solution (0.4 wt%), and thus a device was manufactured. It was difficult.
図7,図8に、それぞれペンタセン(化合物I)、6,12−ジオクチルクリセン(化合物H)を有機溶媒1,1,2,2−テトラクロロエタンに溶解させた直後、24時間後及び、48時間後の可視紫外吸収スペクトルの経時変化を示す。図7より、ペンタセン(化合物I)は溶液調整直後と24時間後のスペクトルの形状が酸化劣化により大きく変化している。一方で図8より、6,12−ジオクチルクリセン(化合物H)は溶液調整直後から48時間経過後までスペクトルの形状が一致しており、溶液状態で非常に安定である。 7 and 8, respectively, immediately after dissolving pentacene (compound I ) and 6,12-dioctylchrysene (compound H ) in an organic solvent 1,1,2,2-tetrachloroethane, 24 hours and 48 hours, respectively. The time-dependent change of visible UV absorption spectrum afterwards is shown. From FIG. 7, the spectrum shape of pentacene (compound I ) changes greatly due to oxidative degradation immediately after solution preparation and after 24 hours. On the other hand, as shown in FIG. 8, 6,12-dioctylchrysene (Compound H 2 ) has the same spectral shape from immediately after the preparation of the solution to 48 hours later, and is very stable in the solution state.
なお、MSスペクトルは、島津製作所製 GCMS−QP2010で、直接試料導入装置DI−2010を用いたEIイオン化法にて測定した。
NMRスペクトルは、VARIAN社製 VARIAN Mercury Plus 400MHz(重クロロホルム溶媒)で測定した。
可視紫外吸収スペクトルは、日立社製U−3310形分光光度計で測定した。
The MS spectrum was measured with a GCMS-QP2010 manufactured by Shimadzu Corporation by an EI ionization method using a direct sample introduction apparatus DI-2010.
The NMR spectrum was measured with VARIAN Mercury Plus 400 MHz (deuterated chloroform solvent) manufactured by VARIAN.
The visible ultraviolet absorption spectrum was measured with a Hitachi U-3310 type spectrophotometer.
本発明の化合物を用いた有機トランジスタは、単結晶の貼り付け法、真空蒸着法、塗布法と多様な製造プロセスに適応でき、特に安価とされる塗布法にて作製された素子においては、大気中で薄膜を形成することが可能である。そのため、産業上非常に有用な有機半導体であって、今後広くこの分野で使用されることが期待される。 The organic transistor using the compound of the present invention can be applied to various manufacturing processes such as single crystal bonding method, vacuum deposition method and coating method. A thin film can be formed therein. Therefore, it is an organic semiconductor that is very useful in industry, and is expected to be widely used in this field in the future.
1 有機半導体を使用したFET
2 有機半導体
3 絶縁膜
4 ゲート 41 ゲート絶縁膜
5 ドレイン
6 ソース
7 エミッター
8 コレクター
9 ベース
10 基板(プラスチック) 11電極 12 n型半導体 13 p型半導体
14 共蒸着層 15 ITO(Indium Tin Oxide)
20 薄膜デバイス 21 Source 22 Drain
23 PMMA Dielectric Layer 24 Si/SiO2 Substrate
25 Gate 26 Organic Single Crystal
1 FETs using organic semiconductors
2 Organic semiconductor 3 Insulating film
4 gate 41 gate insulating film 5 drain 6 source 7 emitter 8 collector 9 base 10 substrate (plastic) 11 electrode 12 n-type semiconductor 13 p-type semiconductor 14 co-deposition layer 15 ITO (Indium Tin Oxide)
20 Thin Film Device 21 Source 22 Drain
23 PMMA Dielectric Layer 24 Si / SiO 2 Substrate
25 Gate 26 Organic Single Crystal
Claims (3)
〔化1〕
化学式〔化1〕中の置換基R1からR12は、R2、R8を除き、水素原子である。
また、アリール基は、フェニル基、2−メチルフェニル基、3−メチルフェニル基、4−メチルフェニル基、2−ヘプチルフェニル基、3−ヘプチルフェニル基、4−ヘプチルフェニル基、2−オクチルフェニル基、3−オクチルフェニル基、4−オクチルフェニル基、4−メトキシフェニル基、4−フルオロフ
ェニル基、ペンタフルオロフェニル基、4−(トリフルオロメチル)フェニル基、ナフチル基、ビフェニル基、ターフェニル基のいずれかである。 An organic semiconductor material represented by the following chemical formula [Chemical Formula 1], wherein R 2 and R 8 in the chemical formula [Chemical Formula 1] are each independently a substituted or unsubstituted aryl group. .
[Chemical formula 1]
The substituents R 1 to R 12 in the chemical formula [Chemical Formula 1] are hydrogen atoms except for R 2 and R 8 .
The aryl group is a phenyl group, 2-methylphenyl group, 3-methylphenyl group, 4-methylphenyl group, 2-heptylphenyl group, 3-heptylphenyl group, 4-heptylphenyl group, 2-octylphenyl group. Of 3-octylphenyl group, 4-octylphenyl group, 4-methoxyphenyl group, 4-fluorophenyl group, pentafluorophenyl group, 4- (trifluoromethyl) phenyl group, naphthyl group, biphenyl group, terphenyl group Either.
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