JP5203951B2 - スペクトル及び周波数符号化蛍光画像形成 - Google Patents
スペクトル及び周波数符号化蛍光画像形成 Download PDFInfo
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Description
本発明は、2005年10月14日に出願した米国特許出願番号第60/727,215号に基づく優先権の利益を請求するとともに、その全ての開示を参照によってここに援用する。
(連邦政府支援の声明)
図2は、代表的な実施の形態の干渉計、例えばマイケルソン干渉計のブロック図である。図2に示すように、光200は、ビームスプリッタ215に入射する。ビームスプリッタ215は、光200の一部分を固定ミラー225へ、光200の他の部分を走査ミラー230へ導く。反射されたビームは、ビームスプリッタ215に戻り、合成されて、干渉計の場合は当該サンプルに入射する、又は基準測定のための検出器に入射するスペクトル変調光235として干渉計を出る。ビームスプリッタ215の前方には、フルオロフォアの励起スペクトル内には含まない波長を除去するためにフィルタ205を配置してもよい。補償器220を、ミラーアーム225,230における分散の差を補正するために干渉計の一方のアームの中に挿入してもよい。
図3に、代表的なSFE手法を説明するために用いることができる本発明による装置の代表的な実施の形態を示し、図4に、このような手法の代表的な実現形態をより詳細に示す。例えば、広帯域光源302からの光は、フィルタ(F)308及びシングルモードファイバ(SMF)310を通じてマイケルソン干渉計に送ることができる。マイケルソン干渉計は、ビームスプリッタ312と少なくとも一方をスキャンされることのできる2つのミラー(M)とを含むマイケルソン干渉計に伝送可能である。干渉計は、広帯域光400に波長依存の周波数変調をもたらすことができる。例えば、ペア316としての小型回折格子316a及びレンズ316bの対を用いて、サンプル314,420を照射することができ、これにより、例えば、略1mmの直径の小型内視鏡がシミュレートされる。
代表的SFE技術は、単一の光ファイバを用いて高品質の画像形成を得ることができる点で有利である。今後のSFE内視鏡の発展においてサイズの最小化のため、プローブ回折格子を介して蛍光発光を集光することは有利となりうる。但し、ストークスシフトされた蛍光は、シングルモード照射ファイバのコアに戻って結合しないようにしてもよい。この課題に対する代表的な解決策として、デュアルクラッドファイバ(D. Yelin氏らの“Double−clad fiber for endoscopy,” Opt. Lett., Vol. 29(20), 2408 (2004)に記述)を用い、励起光に中心コアを透過させて、当該蛍光をその内側クラッディングを通じて得ることができるようにしてもよい。この代表的なアプローチは、代表的な光線追跡モデルを用いることにより、プローブ直径を大幅に増大させることがなく、又は分解能を損ねることもない効果的なものである。
代表的なSFE装置を、マルチファイバ構成で設けることもできる。このような本発明の代表的な実施の形態では、シングルモードファイバを用いて照射光をサンプルに伝搬することができ、1つ又は複数のマルチモードファイバを用いて、放射蛍光を集光してもよい。当該反射光を照射ファイバに戻るように結合することになるので、反射画像は復元が可能となる。
図10に、本発明の他の代表的な実施の形態のプローブの遠端部を示す。図10には代表的マルチファイバの実施の形態を示すが、この代表的な実施の形態のプローブ先端部は、全てのファイバ構成に用いることができる。この代表的な実施の形態では、光学素子の順序は変更することができる。例えば、照射ファイバから発散する照射光1020は、レンズ1025を透過することができる。このレンズは、GRINレンズ及び/又は他のタイプのレンズ又は対物レンズとすることができる。このファイバ−レンズ分離を選択して、当該光が回折格子1035を越えサンプル1050上のある焦点に収束し始めるようにすることができる。そして、その放射蛍光は、当該回折格子を透過することができ、レンズ1025によって集光ファイバ上に集めてもよい。
代表的なスペクトル符号化共焦点画像形成手法と同様に、代表的なSFE手法は、内視鏡蛍光顕微鏡法を可能にしうる構成でも実施できる。これらの代表的応用として、高倍率又は高開口数の結像レンズを利用することは有利となりうる。或る代表的な内視鏡顕微鏡法の構成では、開口数は、0.3を上回ることができ、好ましくは0.5を上回ってもよい。図12に示すように、大きな角度で当該回折格子を照射するときに生じうる収差のため、スペクトル符号化共焦点顕微鏡法(SECM;spectrally−encoded confocal microscopy)と称される技術(G. J. Tearney氏らの“Spectrally encoded confocal microscopy,” Opt. Lett., Vol. 23(15), 1152 (1998)及びC. Pitris氏らの“A GRISM−based プローブ for spectrally encoded confocal microscopy,” Optics Express, Vol. 11(2), 120 (2003)を参照)により行うように、レンズ1230の前に回折格子1225を配置することがさらに有利となりうる。
マイケルソン干渉計の走査ミラーを並進させることによる僅かな(1%未満の)非線形性でも、線形及び周波数(波長)の双方において不適正なスペクトル情報を生じ、これにより画像の歪み又は毀損させてしまう可能性がある。これは、図11のブロック図に示すように、本発明の代表的な実施の形態の装置を用いて、補正することができる。例えば、図11に示すように、通常、又は広帯域の照射光1100を、マイケルソン干渉計1105を透過させることができ、スペクトル変調光1110として射出させてもよい。この変調光1110を、蛍光サンプル又は基準照射検出器1115に透過させることができる。単一の周波数光1120(例えば、ヘリウムネオンレーザなどレーザ、又は他の光源などから供給されるもの)も、マイケルソン干渉計1105を透過させてもよい。こうして得られたスペクトル変調光1125は、基準補正検出器1130により検出することができる。スペクトル変調光1125は、等間隔のゼロ交差をもった単一の変調周波数を有することができる。但し、走査ミラーの動きによる非線形性は、ゼロ交差の間隔を変える可能性があるため、フーリエ変換を実行した際にスペクトル及び画像ラインの復元を不正確にすることがある。
照射光をサンプル上に分散してスペクトル符号化を行うことができるので、サンプル上の各スポットを異なる波長で照射することができる。例えば、分散のラインに対して略平行な、サンプルに沿うスペクトル符号化ラインを走査することにより、各ポイントを、照射光の全帯域幅によって順次照射することができる。各ポイントにおける強度を波長として観測することにより、励起スペクトルを、サンプル上の位置毎に回復させることができる。
本発明の代表的な実施の形態のSFE処理は、放射スペクトルを回復することができる。サンプル上の各ポイントは、異なる波長で照射することができ、その各々を、異なる変調周波数で符号化してもよい。例えば、発せられた光の一部又は全てを分光計の中へ結合する場合、放射スペクトルは、従来の手法及び/又は方法によって回復可能である。この分光計は、分散型及び/又はフーリエ変換型のものとすることができる。フーリエ変換型分光計を、代表的システムに追加する第2の干渉計としてもよい。スペクトル符号化されたラインを二つの方向(例えば一方は画像を形成する方向、他方は励起スペクトルを集光する方向)に走査することにより、励起放射マトリクスを画像のポイント毎に復元することができる。
本発明の他の代表的な実施の形態によれば、画像の各位置で蛍光の寿命を測定することもできる。式2に示すように、照射光は、正弦波状に振動し、同様に蛍光発光を強制的に振動させる。但し、この蛍光は、僅かな位相シフト(φ)と振幅を削減して発してもよい。
寿命は、次のようにしても計算できる。
表1に示す分解可能なポイントを多く得るためには、光源が全励起スペクトルを照射する能力があることが好ましい。これは、例えば、温度ランプ、アーク灯、固体レーザ及びLEDを使用することによって可能になる。これに加え、フォトニック結晶ファイバ技術によるスーパーコンティニューム発生のような代替の光源を利用することができる。これについては、G.McConnell氏の“Confocal lasar 走査ning fluorescence microscopy with a visible continuum source,”Opt.Express,Vol.12(13),2844(2004)に記載されている。光源として広帯域NIRレーザを使用することにより、SFE二光子蛍光同時イメージングを容易にすることができる。
蛍光画像を再生するための本発明の代表的な実施の形態の方法について、図17のフロー図を参照して説明する。この図に示されるように、式2は、ステップ1710で逆フーリエ変換される。こうして得られる信号は、画像における1つのラインになると見込むことができる。そして、強度補正は、ステップ1720に示すように照射スペクトルにより分割して行うことができる。
本発明の代表的な実施の形態には様々な構成部を用いることができる。以下に説明する内容は、かかる構成部の単なる例示に過ぎず、本発明の範囲を限定するものではない。
Claims (23)
- サンプルの少なくとも一つの部分からフォトルミネセンス放射を取得するシステムであって、
(i)第1の放射を受光し、該第1の放射を、前記少なくとも一つの部分の異なる位置に照射する、少なくとも一つの第2の放射と少なくも一つの第3の放射へと空間的にスペクトル分散するための構成、
(ii)前記第2の放射と前記第3の放射の少なくとも一つは、前記サンプルの少なくとも一つの部分を励起して前記フォトルミネセンス放射を生成する、前記第2の放射及び前記第3の放射に基づき、前記少なくとも一つの部分からの前記フォトルミネセンス放射を受光するための構成、を備えた少なくとも一つの装置を含む、システム。 - 前記少なくとも一つの装置は、回折格子、プリズム、グリズム、デュアルプリズム・グリズム、又はレンズの少なくとも一つを含む、請求項1記載のシステム。
- 前記少なくとも一つの装置は、開口数が0.5を上回るレンズを備える、請求項1記載のシステム。
- 少なくとも一つの第1の装置が、少なくとも一つの光ファイバを備える、請求項1記載のシステム。
- 前記少なくとも一つの光ファイバが、複数のクラッディングを含む、請求項4記載のシステム。
- 前記少なくとも一つの光ファイバが、複数の光ファイバを含む、請求項4記載のシステム。
- 少なくとも一つの第1の装置が、少なくとも一つのピンホール部又は少なくとも一つのスリット部の少なくとも一つを含む、請求項4記載のシステム。
- 前記少なくとも一つの光ファイバの少なくとも一つがマルチモードファイバである、請求項4記載のシステム。
- 少なくとも一つの第1の放射を提供するように構成された波長同調光源をさらに備える、請求項1記載のシステム。
- 複数の波長を有する少なくとも一つの第1の放射を提供するように構成された光源をさらに備える、請求項1記載のシステム。
- 異なる周波数で前記第2の放射又は前記第3の放射の少なくとも一つの波長を変調するように構成された更なる装置を備える、請求項1記載のシステム。
- 前記更なる装置は、干渉計装置を含む、請求項11記載のシステム。
- 前記干渉計装置は、少なくとも一つの並進可能な構成部を含む、請求項12記載のシステム。
- 前記更なる装置は、少なくとも一つの並進可能な構成部の非線形性を補正するように構成されたさらなる干渉計装置を含む、請求項13記載のシステム。
- 前記更なる装置は、周波数符号化機能を提供するように構成された音響光学的変調器又は電気光学的変調器の少なくとも一つを含む、請求項11記載のシステム。
- 前記少なくとも一つの装置は、前記フォトルミネセンス放射の関数として、前記異なる位置に関係する情報を生成するように構成されており、さらに、前記情報に基づいて少なくとも一つの画像を生成するように構成された処理装置をさらに備える、請求項1記載のシステム。
- 前記処理装置は、少なくとも一つの信号を受信して、前記少なくとも一つの信号をフーリエ変換して画像を生成する、請求項16記載のシステム。
- 前記少なくとも一つの画像は、顕微鏡画像又は内視鏡画像の少なくとも一つを含む、請求項16記載のシステム。
- 前記少なくとも一つの装置は、フォトルミネセンス放射を受け取り、前記フォトルミネセンス放射に関係する少なくとも一つの信号を生成する検出部を備える、請求項14記載のシステム。
- 前記少なくとも一つの装置は、前記サンプルの少なくとも一つの部分の異なる位置の前記第2の放射及び前記第3の放射の位置を制御することができる、請求項1記載のシステム。
- サンプルの少なくとも一つの部分からフォトルミネセンス放射を取得する方法であって、
(i)第1の放射を受光し、該第1の放射を、前記少なくとも一つの部分の異なる位置に照射する、少なくとも一つの第2の放射と少なくも一つの第3の放射へと空間的にスペクトル分散するステップと、
(ii)前記第2の放射と前記第3の放射の少なくとも一つは、前記サンプルの少なくとも一つの部分を励起して前記フォトルミネセンス放射を生成する、前記第2の放射及び前記第3の放射に基づき、前記少なくとも一つの部分からフォトルミネセンス放射を受光するためのステップとを含む、方法。 - 前記フォトルミネセンス放射の関数として、前記異なる位置に関係する情報を生成するステップと、前記情報に基づいて少なくとも一つの画像を生成するステップとをさらに含む、請求項21記載の方法。
- 前記少なくとも一つの装置は、
(i)単一デュアルクラッドファイバ、
(ii)シングルモードファイバ、
(iii)少なくとも一つのマルチモードファイバ、
の少なくとも一つを含む、
請求項1に記載のシステム。
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