JP2013524227A - 光学的にトレーサガスを検出する漏れ検知器 - Google Patents
光学的にトレーサガスを検出する漏れ検知器 Download PDFInfo
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- JP2013524227A JP2013524227A JP2013503100A JP2013503100A JP2013524227A JP 2013524227 A JP2013524227 A JP 2013524227A JP 2013503100 A JP2013503100 A JP 2013503100A JP 2013503100 A JP2013503100 A JP 2013503100A JP 2013524227 A JP2013524227 A JP 2013524227A
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- 239000000700 radioactive tracer Substances 0.000 title claims abstract description 83
- 230000003287 optical effect Effects 0.000 claims abstract description 5
- 239000012528 membrane Substances 0.000 claims description 21
- 230000005284 excitation Effects 0.000 claims description 11
- 238000005259 measurement Methods 0.000 abstract description 6
- 238000000862 absorption spectrum Methods 0.000 abstract description 2
- 238000001307 laser spectroscopy Methods 0.000 abstract 1
- 239000007789 gas Substances 0.000 description 101
- 239000001307 helium Substances 0.000 description 15
- 229910052734 helium Inorganic materials 0.000 description 15
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 15
- 238000007689 inspection Methods 0.000 description 12
- 239000012159 carrier gas Substances 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 3
- 238000004847 absorption spectroscopy Methods 0.000 description 3
- 239000012466 permeate Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 239000006096 absorbing agent Substances 0.000 description 1
- 239000012080 ambient air Substances 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000009530 blood pressure measurement Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005281 excited state Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000001506 fluorescence spectroscopy Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000005283 ground state Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 229910052756 noble gas Inorganic materials 0.000 description 1
- 150000002835 noble gases Chemical class 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/38—Investigating fluid-tightness of structures by using light
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Examining Or Testing Airtightness (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Description
a)直接または間接的に雰囲気の空気に露出してもよく(スニファー漏れ検知)、或いは、
b)トレーサガスが充填された検査対象を収容する検査チャンバ28に接続されてもよく(総体漏れ検査)、或いは、
c)外側からトレーサガスが噴射される空にした検査対象に接続されてもよい(真空漏れ検査)。
Claims (7)
- 好ましくはトレーサガスを透過できる膜(13)を含むトレーサガス入口(12)を備えるセル(10)と、
前記トレーサガスをエネルギ準位の高い準安定状態にするための、前記セル(10)の中の励起装置(25)と、
レーザ源(15)およびレーザビームを受光するフォトデテクタ(16)からなる光学測定部(14)とを含む、光学的にトレーサガスを認識する漏れ検知器。 - 前記セル(10)は、真空ポンプ装置に接続されている(図2)、請求項1の漏れ検知器。
- 前記セル(10)は、バッファガスのためのバッファガス入口(32)と、前記バッファガスをプラズマに変化させるガス放電部を備え、前記プラズマにより前記トレーサガスを準安定状態にする励起装置(25)とを含む、請求項1の漏れ検知器。
- 前記セル(10)は、前記トレーサガスを準安定状態にするために、電子衝突を利用する電子発生源を含む、請求項1の漏れ検知器。
- 前記セル(10)は、好ましくは前記トレーサガスを透過できる膜を備えるポンプ接続(35)をさらに含み、前記ポンプ接続は、前記セルを、さらに真空ポンプ装置に接続されたポンプチャンバ(36)に接続する、請求項1の漏れ検知器。
- 前記ポンプチャンバ(36)は、バッファガス接続(37)とポンプ接続(38)とを含む、請求項5の漏れ検知器。
- 前記セル(10)は、該セルの中に生じる前記トレーサガスの分圧が雰囲気中の前記トレーサガスの分圧に等しくなるように、前記トレーサガス入口(12)を除いて密閉シールされている、請求項1の漏れ検知器。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/757,631 US8756978B2 (en) | 2010-04-09 | 2010-04-09 | Leak detector with optical tracer gas detection |
US12/757,631 | 2010-04-09 | ||
PCT/EP2011/055361 WO2011124613A1 (en) | 2010-04-09 | 2011-04-06 | A leak detector with optical tracer gas detection |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013524227A true JP2013524227A (ja) | 2013-06-17 |
JP5864535B2 JP5864535B2 (ja) | 2016-02-17 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013503100A Active JP5864535B2 (ja) | 2010-04-09 | 2011-04-06 | 光学的にトレーサガスを検出する漏れ検知器 |
Country Status (7)
Country | Link |
---|---|
US (1) | US8756978B2 (ja) |
EP (1) | EP2556357B1 (ja) |
JP (1) | JP5864535B2 (ja) |
KR (1) | KR101798451B1 (ja) |
CN (1) | CN102859341B (ja) |
RU (1) | RU2576550C2 (ja) |
WO (1) | WO2011124613A1 (ja) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2014059345A1 (en) * | 2012-10-12 | 2014-04-17 | Lehmann Kevin K | Mercury vapor trace detection using pre-excitation cavity ring down spectroscopy |
EP2778644A1 (en) * | 2013-03-11 | 2014-09-17 | Inficon GmbH | Method for selective pin-pointing of utility gas leaks |
RU2576635C1 (ru) * | 2014-09-05 | 2016-03-10 | Открытое акционерное общество "Тамбовский завод "Электроприбор" | Способ контроля негерметичности кольцевых лазерных гироскопов |
US10408763B2 (en) | 2015-01-30 | 2019-09-10 | Mécanique Analytique Inc. | Systems and methods for testing for a gas leak through a gas flow component |
EP3362780B1 (en) * | 2015-10-16 | 2019-12-04 | Inficon GmbH | Optical detection of tracer gases in a gas discharge cell having unexposed electrodes |
CA3034074C (en) * | 2016-05-18 | 2023-01-24 | Phil MCNEIL | Apparatus and methodologies for leak detection using gas and infrared thermography |
US11846747B2 (en) * | 2019-08-23 | 2023-12-19 | Abb Schweiz Ag | Gas sampling instruments and methods |
US12085467B2 (en) * | 2019-09-20 | 2024-09-10 | Inficon ag | Method for detecting pressure, and pressure sensor |
US12117369B2 (en) | 2022-06-17 | 2024-10-15 | Packaging Technologies & Inspection, LLC | System and method for leak testing a sealed package |
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JPH06194259A (ja) * | 1992-12-24 | 1994-07-15 | Hitachi Ltd | ガスリーク検出装置 |
JPH09101230A (ja) * | 1995-10-05 | 1997-04-15 | Mitsubishi Heavy Ind Ltd | ガス漏れ検知方法および装置 |
JPH11507587A (ja) * | 1995-06-10 | 1999-07-06 | ライボルト ヴァークウム ゲゼルシャフト ミット ベシュレンクテル ハフツング | 選択作用性透過面を有するガス流路及びその透過面の製法 |
JP2005134218A (ja) * | 2003-10-29 | 2005-05-26 | Matsushita Electric Ind Co Ltd | ピンホール検出方法及びピンホール検出装置 |
US20060028640A1 (en) * | 2004-08-03 | 2006-02-09 | Daimlercrysler Ag | Test apparatus and method for examining sheet-like components for perforations |
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-
2010
- 2010-04-09 US US12/757,631 patent/US8756978B2/en active Active
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2011
- 2011-04-06 WO PCT/EP2011/055361 patent/WO2011124613A1/en active Application Filing
- 2011-04-06 EP EP11712855.3A patent/EP2556357B1/en active Active
- 2011-04-06 CN CN201180015156.1A patent/CN102859341B/zh active Active
- 2011-04-06 KR KR1020127029518A patent/KR101798451B1/ko active IP Right Grant
- 2011-04-06 RU RU2012147522/28A patent/RU2576550C2/ru active
- 2011-04-06 JP JP2013503100A patent/JP5864535B2/ja active Active
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JPS626134A (ja) * | 1985-07-03 | 1987-01-13 | Nippon Kokan Kk <Nkk> | 容器の漏洩検出装置 |
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JPH0599780A (ja) * | 1990-07-16 | 1993-04-23 | Daikin Ind Ltd | 容器の漏洩検出方法 |
JPH06194259A (ja) * | 1992-12-24 | 1994-07-15 | Hitachi Ltd | ガスリーク検出装置 |
JPH11507587A (ja) * | 1995-06-10 | 1999-07-06 | ライボルト ヴァークウム ゲゼルシャフト ミット ベシュレンクテル ハフツング | 選択作用性透過面を有するガス流路及びその透過面の製法 |
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Also Published As
Publication number | Publication date |
---|---|
US8756978B2 (en) | 2014-06-24 |
KR20130092969A (ko) | 2013-08-21 |
RU2012147522A (ru) | 2014-05-27 |
JP5864535B2 (ja) | 2016-02-17 |
RU2576550C2 (ru) | 2016-03-10 |
WO2011124613A1 (en) | 2011-10-13 |
CN102859341A (zh) | 2013-01-02 |
KR101798451B1 (ko) | 2017-11-16 |
CN102859341B (zh) | 2016-03-02 |
EP2556357A1 (en) | 2013-02-13 |
US20110247400A1 (en) | 2011-10-13 |
EP2556357B1 (en) | 2016-12-14 |
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