JP2009522755A - Led半導体本体及びled半導体本体の使用 - Google Patents
Led半導体本体及びled半導体本体の使用 Download PDFInfo
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- JP2009522755A JP2009522755A JP2008547845A JP2008547845A JP2009522755A JP 2009522755 A JP2009522755 A JP 2009522755A JP 2008547845 A JP2008547845 A JP 2008547845A JP 2008547845 A JP2008547845 A JP 2008547845A JP 2009522755 A JP2009522755 A JP 2009522755A
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 156
- 230000005855 radiation Effects 0.000 claims abstract description 54
- 239000000758 substrate Substances 0.000 claims description 9
- 238000005286 illumination Methods 0.000 claims 1
- 239000010409 thin film Substances 0.000 description 9
- 239000000463 material Substances 0.000 description 7
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 3
- 239000000470 constituent Substances 0.000 description 3
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 230000018109 developmental process Effects 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 238000000407 epitaxy Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 229910005540 GaP Inorganic materials 0.000 description 1
- 238000004026 adhesive bonding Methods 0.000 description 1
- 230000003679 aging effect Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000002096 quantum dot Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/08—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a plurality of light emitting regions, e.g. laterally discontinuous light emitting layer or photoluminescent region integrated within the semiconductor body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/0004—Devices characterised by their operation
- H01L33/0008—Devices characterised by their operation having p-n or hi-lo junctions
- H01L33/0016—Devices characterised by their operation having p-n or hi-lo junctions having at least two p-n junctions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/075—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
- H01L25/0756—Stacked arrangements of devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/44—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating
- H01L33/46—Reflective coating, e.g. dielectric Bragg reflector
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- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
Abstract
【選択図】図1
Description
それらのpn接合は、pn−pn又はnp−np構造を作り、介在するトンネル接合によってpn接合は連続して電気的に接続される。本発明の内容において、類似の方法で、3つ又はそれ以上の、LED半導体本体の活性層を互いに垂直に配置することも可能であり、活性層は、2つの隣接する活性層間に形成される各トンネル接合によって対応する方法で接続される。
−反射層はキャリア要素の方を向いている放射生成エピタキシャル層シークエンスの第1主領域において適用又は形成され、前記反射層はエピタキシャル層シークエンスにおいて生成された電磁放射の少なくとも1部分において、後者に反射する、
−エピタキシャル層シークエンスは、20μmかそれより小さい範囲において、特に10μmの範囲において、厚さを有する、そして
−エピタキシャル層シークエンスは、エピタキシャル層シークエンスにおける光の略エルゴード分布を理想的に起こす、すなわち出来る限りエルゴード的に確率的な散乱挙動をなす、混合構造を有する、少なくとも1つの領域を有する、少なくとも1つの半導体層を含む。
Claims (22)
- 第1放射生成活性層及び第2放射生成活性層を有し、
第1活性層及び第2活性層は互いに垂直に重なり合って配置される、
LED半導体本体。 - 前記第1活性層及び前記第2活性層は前記半導体本体においてモノリシックに集積される、
請求項1に記載のLED半導体本体。 - 前記第1活性層及び前記第2活性層は各層においてインコヒーレント放射を生成する、
前記請求項のうちの1項に記載のLED半導体本体。 - 前記第1活性層及び前記第2活性層は各層において類似の波長を有する放射を生成する、
前記請求項のうちの1項に記載のLED半導体本体。 - 前記第1活性層及び前記第2活性層は、異なる波長を有する放射を生成する、
請求項1ないし3のうちの1項に記載のLED半導体本体。 - トンネル接合は前記第1活性層と前記第2活性層との間に形成される、
前記請求項のうちの1項に記載のLED半導体本体。 - 前記トンネル接合は第1導電型の高ドープ層と第2導電型の高ドープ層とによって形成される、
請求項6に記載のLED半導体本体。 - 第1導電型の接続層は前記第1活性層と前記第2活性層との間に配置され、
第2導電型の層は前記接続層から離れた前記第1活性層及び前記第2活性層の側面にそれぞれに配置される、
請求項1ないし5のうちの1項に記載のLED半導体本体。 - 前記接続層はコンタクトによって電気的に接続可能である、
請求項8に記載のLED半導体本体。 - 前記第2導電型の外側の層は外部コンタクト接続によって電気的に接続される、
請求項8又は9に記載のLED半導体本体。 - 前記LED半導体本体はキャリア要素の上に配置される、
前記請求項のうちの1項に記載のLED半導体本体。 - 前記キャリア要素は、電気的に伝導性があり、又は生成された放射に対し透過性があり、あるいはその両方である、
請求項11に記載のLED半導体本体。 - 後側コンタクトは前記LED半導体本体から離れた前記キャリア要素の側面に配置される、
請求項11又は12に記載のLED半導体本体。 - 前記LED半導体本体は前記キャリア要素上で成長する、
請求項11ないし13のうち1項に記載のLED半導体本体。 - 前記LED半導体本体は前記キャリア要素と異なる成長基板の上で成長する、
請求項11ないし13のうち1項に記載のLED半導体本体。 - 前記成長基板は前記半導体本体から取り除かれる、
請求項15に記載のLED半導体本体。 - 前記半導体本体、好ましくは前記2つの活性層のうちの1つ又は両方の活性層はInGaAlAs又はInGaAlPを含む、
前記請求項のうちの1項に記載のLED半導体本体。 - 前記半導体本体、好ましくは前記2つの活性層のうちの1つ又は両方の活性層はInGaAlNを含む、
前記請求項のうちの1項に記載のLED半導体本体。 - 半導体本体は垂直方向に放射を放出する、
前記請求項のうちの1項に記載のLED半導体本体。 - 一般的な照明としての、請求項1ないし19のうちの1項に記載のLED半導体本体の使用。
- 例えばディスプレイの、バックライトとしての、請求項1ないし19のうち1項に記載のLED半導体本体の使用。
- 映写用途としての、請求項1ないし19のうち1項に記載のLED半導体本体の使用。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102005063105 | 2005-12-30 | ||
DE102006039369A DE102006039369A1 (de) | 2005-12-30 | 2006-08-22 | LED-Halbleiterkörper und Verwendung eines LED-Halbleiterkörpers |
PCT/DE2006/002228 WO2007076796A1 (de) | 2005-12-30 | 2006-12-13 | Led-halbleiterkörper und verwendung eines led-halbleiterkörpers |
Publications (1)
Publication Number | Publication Date |
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JP2009522755A true JP2009522755A (ja) | 2009-06-11 |
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Application Number | Title | Priority Date | Filing Date |
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JP2008547845A Pending JP2009522755A (ja) | 2005-12-30 | 2006-12-13 | Led半導体本体及びled半導体本体の使用 |
Country Status (8)
Country | Link |
---|---|
US (1) | US7932526B2 (ja) |
EP (1) | EP1966836B1 (ja) |
JP (1) | JP2009522755A (ja) |
KR (1) | KR101356271B1 (ja) |
CN (1) | CN101351900B (ja) |
DE (1) | DE102006039369A1 (ja) |
TW (1) | TWI393267B (ja) |
WO (1) | WO2007076796A1 (ja) |
Cited By (7)
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JP2011507239A (ja) * | 2007-12-14 | 2011-03-03 | オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツング | 放射放出デバイス |
JP2012209451A (ja) * | 2011-03-30 | 2012-10-25 | Dowa Holdings Co Ltd | 半導体発光素子 |
JP2013004631A (ja) * | 2011-06-14 | 2013-01-07 | Dowa Electronics Materials Co Ltd | 半導体発光素子およびその製造方法 |
JP2013004624A (ja) * | 2011-06-14 | 2013-01-07 | Dowa Electronics Materials Co Ltd | 半導体発光素子およびその製造方法 |
DE102018112228A1 (de) | 2017-05-25 | 2018-11-29 | Showa Denko K.K. | Lichtemissionsdiode und Verfahren zum Herstellen einer Tunnelkontakschicht |
KR20180129648A (ko) | 2017-05-25 | 2018-12-05 | 쇼와 덴코 가부시키가이샤 | 발광 다이오드 및 터널 접합층의 제조 방법 |
JP2021508175A (ja) * | 2017-12-22 | 2021-02-25 | ルミレッズ リミテッド ライアビリティ カンパニー | Iii−窒化物マルチ波長発光ダイオード |
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DE102006035627A1 (de) * | 2006-07-31 | 2008-02-07 | Osram Opto Semiconductors Gmbh | LED-Halbleiterkörper |
DE102006051745B4 (de) | 2006-09-28 | 2024-02-08 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | LED-Halbleiterkörper und Verwendung eines LED-Halbleiterkörpers |
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DE102013104954A1 (de) * | 2013-05-14 | 2014-11-20 | Osram Opto Semiconductors Gmbh | Optoelektronisches Bauelement und Verfahren zu seiner Herstellung |
DE102015119817A1 (de) | 2015-11-17 | 2017-05-18 | Osram Opto Semiconductors Gmbh | Halbleiterbauelement |
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KR20180129648A (ko) | 2017-05-25 | 2018-12-05 | 쇼와 덴코 가부시키가이샤 | 발광 다이오드 및 터널 접합층의 제조 방법 |
US10439103B2 (en) | 2017-05-25 | 2019-10-08 | Showa Denko K. K. | Light-emitting diode and method for manufacturing tunnel junction layer |
US10693036B2 (en) | 2017-05-25 | 2020-06-23 | Showa Denko K. K. | Method for manufacturing tunnel junction layer |
JP2021508175A (ja) * | 2017-12-22 | 2021-02-25 | ルミレッズ リミテッド ライアビリティ カンパニー | Iii−窒化物マルチ波長発光ダイオード |
JP7140835B2 (ja) | 2017-12-22 | 2022-09-21 | ルミレッズ リミテッド ライアビリティ カンパニー | Iii-窒化物マルチ波長発光ダイオード |
Also Published As
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DE102006039369A1 (de) | 2007-07-05 |
TW200735421A (en) | 2007-09-16 |
EP1966836B1 (de) | 2019-02-06 |
KR20080085057A (ko) | 2008-09-22 |
CN101351900A (zh) | 2009-01-21 |
EP1966836A1 (de) | 2008-09-10 |
TWI393267B (zh) | 2013-04-11 |
WO2007076796A1 (de) | 2007-07-12 |
CN101351900B (zh) | 2012-10-03 |
KR101356271B1 (ko) | 2014-01-28 |
US7932526B2 (en) | 2011-04-26 |
US20090173961A1 (en) | 2009-07-09 |
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