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FI20115057L - Menetelmä ja laite yhden tai useamman näytealueen leikkaamiseksi näytteen kantajasta - Google Patents

Menetelmä ja laite yhden tai useamman näytealueen leikkaamiseksi näytteen kantajasta Download PDF

Info

Publication number
FI20115057L
FI20115057L FI20115057A FI20115057A FI20115057L FI 20115057 L FI20115057 L FI 20115057L FI 20115057 A FI20115057 A FI 20115057A FI 20115057 A FI20115057 A FI 20115057A FI 20115057 L FI20115057 L FI 20115057L
Authority
FI
Finland
Prior art keywords
sample
cutting out
areas
carrier
sample carrier
Prior art date
Application number
FI20115057A
Other languages
English (en)
Swedish (sv)
Other versions
FI20115057A0 (fi
Inventor
Mika Routamaa
Jouni Reivolahti
Jarmo Korpi
Ilari Torsti
Kimmo Laine
Original Assignee
Wallac Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wallac Oy filed Critical Wallac Oy
Priority to FI20115057A priority Critical patent/FI20115057L/fi
Publication of FI20115057A0 publication Critical patent/FI20115057A0/fi
Priority to ES12709672T priority patent/ES2829558T3/es
Priority to PCT/FI2012/050014 priority patent/WO2012098286A1/en
Priority to CN201280006111.2A priority patent/CN103354896B/zh
Priority to US13/980,455 priority patent/US20130327195A1/en
Priority to EP12709672.5A priority patent/EP2666005B1/en
Priority to AU2012208507A priority patent/AU2012208507B2/en
Publication of FI20115057L publication Critical patent/FI20115057L/fi
Priority to US15/978,417 priority patent/US10875205B2/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/02Devices for withdrawing samples
    • G01N1/04Devices for withdrawing samples in the solid state, e.g. by cutting
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B26HAND CUTTING TOOLS; CUTTING; SEVERING
    • B26DCUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
    • B26D5/00Arrangements for operating and controlling machines or devices for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
    • B26D5/007Control means comprising cameras, vision or image processing systems
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/2813Producing thin layers of samples on a substrate, e.g. smearing, spinning-on
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/286Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/2813Producing thin layers of samples on a substrate, e.g. smearing, spinning-on
    • G01N2001/282Producing thin layers of samples on a substrate, e.g. smearing, spinning-on with mapping; Identification of areas; Spatial correlated pattern
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/286Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
    • G01N2001/2873Cutting or cleaving
    • G01N2001/288Filter punches
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0012Biomedical image inspection
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T83/00Cutting
    • Y10T83/04Processes
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T83/00Cutting
    • Y10T83/525Operation controlled by detector means responsive to work
    • Y10T83/533With photo-electric work-sensing means

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Forests & Forestry (AREA)
  • Mechanical Engineering (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Microscoopes, Condenser (AREA)
  • User Interface Of Digital Computer (AREA)
  • Processing Or Creating Images (AREA)
FI20115057A 2011-01-21 2011-01-21 Menetelmä ja laite yhden tai useamman näytealueen leikkaamiseksi näytteen kantajasta FI20115057L (fi)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FI20115057A FI20115057L (fi) 2011-01-21 2011-01-21 Menetelmä ja laite yhden tai useamman näytealueen leikkaamiseksi näytteen kantajasta
ES12709672T ES2829558T3 (es) 2011-01-21 2012-01-09 Método y dispositivo para cortar una o más regiones de muestra de un portador de muestras
PCT/FI2012/050014 WO2012098286A1 (en) 2011-01-21 2012-01-09 Method and device for cutting off one or more sample regions from a sample carrier
CN201280006111.2A CN103354896B (zh) 2011-01-21 2012-01-09 用于从样品载体切除一个或多个样品区域的方法和装置
US13/980,455 US20130327195A1 (en) 2011-01-21 2012-01-09 Method and device for cutting off one or more sample regions from a sample carrier
EP12709672.5A EP2666005B1 (en) 2011-01-21 2012-01-09 Method and device for cutting off one or more sample regions from a sample carrier
AU2012208507A AU2012208507B2 (en) 2011-01-21 2012-01-09 Method and device for cutting off one or more sample regions from a sample carrier
US15/978,417 US10875205B2 (en) 2011-01-21 2018-05-14 Method and device for cutting off one or more sample regions from a sample carrier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20115057A FI20115057L (fi) 2011-01-21 2011-01-21 Menetelmä ja laite yhden tai useamman näytealueen leikkaamiseksi näytteen kantajasta

Publications (2)

Publication Number Publication Date
FI20115057A0 FI20115057A0 (fi) 2011-01-21
FI20115057L true FI20115057L (fi) 2012-07-22

Family

ID=43528544

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20115057A FI20115057L (fi) 2011-01-21 2011-01-21 Menetelmä ja laite yhden tai useamman näytealueen leikkaamiseksi näytteen kantajasta

Country Status (7)

Country Link
US (2) US20130327195A1 (fi)
EP (1) EP2666005B1 (fi)
CN (1) CN103354896B (fi)
AU (1) AU2012208507B2 (fi)
ES (1) ES2829558T3 (fi)
FI (1) FI20115057L (fi)
WO (1) WO2012098286A1 (fi)

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DE102015108017A1 (de) 2015-05-20 2016-11-24 Leica Microsystems Cms Gmbh Verfahren und Untersuchungssystem zur Untersuchung und Bearbeitung einer mikroskopischen Probe
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Also Published As

Publication number Publication date
EP2666005B1 (en) 2020-08-12
CN103354896B (zh) 2016-04-27
US10875205B2 (en) 2020-12-29
EP2666005A1 (en) 2013-11-27
US20130327195A1 (en) 2013-12-12
CN103354896A (zh) 2013-10-16
US20180333884A1 (en) 2018-11-22
ES2829558T3 (es) 2021-06-01
AU2012208507A1 (en) 2013-08-29
AU2012208507B2 (en) 2015-04-23
FI20115057A0 (fi) 2011-01-21
WO2012098286A1 (en) 2012-07-26

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