CN1784784A - 复合材料及电路或电模块 - Google Patents
复合材料及电路或电模块 Download PDFInfo
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- CN1784784A CN1784784A CNA2004800124333A CN200480012433A CN1784784A CN 1784784 A CN1784784 A CN 1784784A CN A2004800124333 A CNA2004800124333 A CN A2004800124333A CN 200480012433 A CN200480012433 A CN 200480012433A CN 1784784 A CN1784784 A CN 1784784A
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- composite material
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- nanofibers
- alloy
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- 239000002131 composite material Substances 0.000 title claims abstract description 80
- 239000000463 material Substances 0.000 claims abstract description 56
- 229910052751 metal Inorganic materials 0.000 claims description 135
- 239000002184 metal Substances 0.000 claims description 135
- 239000002121 nanofiber Substances 0.000 claims description 101
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 41
- 239000010949 copper Substances 0.000 claims description 40
- 229910052802 copper Inorganic materials 0.000 claims description 37
- 239000000919 ceramic Substances 0.000 claims description 36
- 229910045601 alloy Inorganic materials 0.000 claims description 35
- 239000000956 alloy Substances 0.000 claims description 35
- 239000000758 substrate Substances 0.000 claims description 29
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 15
- 229910052799 carbon Inorganic materials 0.000 claims description 15
- 239000004020 conductor Substances 0.000 claims description 14
- 238000005516 engineering process Methods 0.000 claims description 14
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 12
- 229910000881 Cu alloy Inorganic materials 0.000 claims description 10
- 239000011521 glass Substances 0.000 claims description 8
- 238000003466 welding Methods 0.000 claims description 8
- 238000005868 electrolysis reaction Methods 0.000 claims description 7
- UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 claims description 7
- 230000004927 fusion Effects 0.000 claims description 6
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 claims description 5
- 229910052582 BN Inorganic materials 0.000 claims description 5
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 claims description 5
- 229910017083 AlN Inorganic materials 0.000 claims description 4
- 150000001875 compounds Chemical class 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- 230000017525 heat dissipation Effects 0.000 claims description 3
- 238000005476 soldering Methods 0.000 claims description 3
- 239000000853 adhesive Substances 0.000 claims description 2
- 230000001070 adhesive effect Effects 0.000 claims description 2
- 238000009826 distribution Methods 0.000 claims description 2
- 230000008595 infiltration Effects 0.000 claims description 2
- 238000001764 infiltration Methods 0.000 claims description 2
- 150000004767 nitrides Chemical class 0.000 claims description 2
- 239000010410 layer Substances 0.000 claims 9
- 238000009388 chemical precipitation Methods 0.000 claims 2
- 229910000838 Al alloy Inorganic materials 0.000 claims 1
- 229910052581 Si3N4 Inorganic materials 0.000 claims 1
- 230000004888 barrier function Effects 0.000 claims 1
- 239000011243 crosslinked material Substances 0.000 claims 1
- 239000002320 enamel (paints) Substances 0.000 claims 1
- 239000002245 particle Substances 0.000 claims 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims 1
- 238000004870 electrical engineering Methods 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 38
- 239000011888 foil Substances 0.000 description 16
- 239000000203 mixture Substances 0.000 description 14
- 239000004065 semiconductor Substances 0.000 description 11
- 239000000835 fiber Substances 0.000 description 10
- 230000008569 process Effects 0.000 description 10
- 239000000126 substance Substances 0.000 description 8
- 238000012545 processing Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000001556 precipitation Methods 0.000 description 5
- 239000002994 raw material Substances 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 239000011889 copper foil Substances 0.000 description 4
- 230000002349 favourable effect Effects 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 230000035882 stress Effects 0.000 description 4
- 239000000654 additive Substances 0.000 description 3
- 230000000996 additive effect Effects 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 239000012809 cooling fluid Substances 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000002706 hydrostatic effect Effects 0.000 description 3
- 230000006872 improvement Effects 0.000 description 3
- 238000005096 rolling process Methods 0.000 description 3
- 230000007704 transition Effects 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical group O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000004411 aluminium Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000000975 co-precipitation Methods 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 239000002826 coolant Substances 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 239000002659 electrodeposit Substances 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000004615 ingredient Substances 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 229910001092 metal group alloy Inorganic materials 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000003672 processing method Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 230000003014 reinforcing effect Effects 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 230000008646 thermal stress Effects 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000009736 wetting Methods 0.000 description 2
- 241000251468 Actinopterygii Species 0.000 description 1
- 229910000962 AlSiC Inorganic materials 0.000 description 1
- 229910000906 Bronze Inorganic materials 0.000 description 1
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 description 1
- 239000005751 Copper oxide Substances 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 210000000988 bone and bone Anatomy 0.000 description 1
- 239000010974 bronze Substances 0.000 description 1
- 239000002134 carbon nanofiber Substances 0.000 description 1
- 230000021615 conjugation Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910000431 copper oxide Inorganic materials 0.000 description 1
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000032798 delamination Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000006253 efflorescence Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 229920006332 epoxy adhesive Polymers 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 239000003733 fiber-reinforced composite Substances 0.000 description 1
- 230000002344 fibroplastic effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000002071 nanotube Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 206010037844 rash Diseases 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000004781 supercooling Methods 0.000 description 1
- 229920002994 synthetic fiber Polymers 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
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- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
- H01L23/49877—Carbon, e.g. fullerenes
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- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
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- Microelectronics & Electronic Packaging (AREA)
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- Ceramic Engineering (AREA)
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- Organic Chemistry (AREA)
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- Compositions Of Macromolecular Compounds (AREA)
Abstract
Description
λth单位W/mK | α单位10-6/K | |
Ag | 428 | 19.7 |
Cu | 395 | 16.8 |
CuCo0.2 | 385 | 17.7 |
CuSn0.12 | 364 | 17.7 |
Au | 312 | 14.3 |
Al | 239 | 23.8 |
BeO | 218 | 8.5 |
AlN | 140-170 | 2.6 |
Si | 152 | 2.6 |
SiC | 90 | 2.6 |
Ni | 81 | 12.8 |
Sn | 65 | 27 |
AuSn20 | 57 | 15.9 |
Fe | 50 | 13.2 |
Si3N4 | 10-40 | 3.1 |
Al2O3 | 18.8 | 6.5 |
FeNi42 | 15.1 | 5.1 |
银环氧粘合剂 | 0.8-2 | 53 |
环氧树脂模制件 | 0.63-0.76 | 18-30 |
SiO2 | 0.1 | 0.5 |
W | 130 | 4.5 |
Mo | 140 | 5.1 |
Cu/Mo/CU | 194 | 6.0 |
AlSiC | 160-220 | 7-10 |
Claims (34)
Applications Claiming Priority (2)
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DE2003120838 DE10320838B4 (de) | 2003-05-08 | 2003-05-08 | Faserverstärktes Metall-Keramik/Glas-Verbundmaterial als Substrat für elektrische Anwendungen, Verfahren zum Herstellen eines derartigen Verbundmaterials sowie Verwendung dieses Verbundmaterials |
DE10320838.0 | 2003-05-08 |
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CN1784784A true CN1784784A (zh) | 2006-06-07 |
CN100454525C CN100454525C (zh) | 2009-01-21 |
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CNB2004800124333A Expired - Fee Related CN100454525C (zh) | 2003-05-08 | 2004-04-20 | 复合材料及电路或电模块 |
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US (1) | US20060263584A1 (zh) |
EP (1) | EP1620892A2 (zh) |
JP (1) | JP2007500450A (zh) |
CN (1) | CN100454525C (zh) |
DE (1) | DE10320838B4 (zh) |
WO (1) | WO2004102659A2 (zh) |
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DE102007031490B4 (de) * | 2007-07-06 | 2017-11-16 | Infineon Technologies Ag | Verfahren zur Herstellung eines Halbleitermoduls |
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DE102007051613A1 (de) * | 2007-10-24 | 2009-04-30 | Siemens Ag | Schalt- und Schutzeinrichtung, Schmelzsicherung, Schaltanlage/Verteilersystem, Stromschienenverteiler und Anschlusseinrichtung |
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DE102012102611B4 (de) * | 2012-02-15 | 2017-07-27 | Rogers Germany Gmbh | Metall-Keramik-Substrat sowie Verfahren zum Herstellen eines Metall-Keramik-Substrates |
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2003
- 2003-05-08 DE DE2003120838 patent/DE10320838B4/de not_active Expired - Fee Related
-
2004
- 2004-04-20 JP JP2006529582A patent/JP2007500450A/ja active Pending
- 2004-04-20 US US10/554,496 patent/US20060263584A1/en not_active Abandoned
- 2004-04-20 WO PCT/DE2004/000824 patent/WO2004102659A2/de active Application Filing
- 2004-04-20 CN CNB2004800124333A patent/CN100454525C/zh not_active Expired - Fee Related
- 2004-04-20 EP EP04728319A patent/EP1620892A2/de not_active Withdrawn
Also Published As
Publication number | Publication date |
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WO2004102659A3 (de) | 2005-06-09 |
WO2004102659A2 (de) | 2004-11-25 |
DE10320838A1 (de) | 2004-12-02 |
EP1620892A2 (de) | 2006-02-01 |
US20060263584A1 (en) | 2006-11-23 |
JP2007500450A (ja) | 2007-01-11 |
DE10320838B4 (de) | 2014-11-06 |
CN100454525C (zh) | 2009-01-21 |
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