CN111736063A - Pcba睡眠功能检测电路及pcba睡眠控制方法 - Google Patents
Pcba睡眠功能检测电路及pcba睡眠控制方法 Download PDFInfo
- Publication number
- CN111736063A CN111736063A CN202010751223.7A CN202010751223A CN111736063A CN 111736063 A CN111736063 A CN 111736063A CN 202010751223 A CN202010751223 A CN 202010751223A CN 111736063 A CN111736063 A CN 111736063A
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- CN
- China
- Prior art keywords
- pcba
- mcu
- switch
- sleep
- time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- RVCKCEDKBVEEHL-UHFFFAOYSA-N 2,3,4,5,6-pentachlorobenzyl alcohol Chemical compound OCC1=C(Cl)C(Cl)=C(Cl)C(Cl)=C1Cl RVCKCEDKBVEEHL-UHFFFAOYSA-N 0.000 title claims abstract description 110
- 238000001514 detection method Methods 0.000 title claims abstract description 75
- 238000000034 method Methods 0.000 title claims abstract description 18
- 230000004622 sleep time Effects 0.000 claims abstract description 20
- 238000012360 testing method Methods 0.000 claims abstract description 19
- 239000003990 capacitor Substances 0.000 claims description 11
- 239000000523 sample Substances 0.000 claims description 10
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Power Sources (AREA)
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010751223.7A CN111736063A (zh) | 2020-07-30 | 2020-07-30 | Pcba睡眠功能检测电路及pcba睡眠控制方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010751223.7A CN111736063A (zh) | 2020-07-30 | 2020-07-30 | Pcba睡眠功能检测电路及pcba睡眠控制方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN111736063A true CN111736063A (zh) | 2020-10-02 |
Family
ID=72656587
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202010751223.7A Pending CN111736063A (zh) | 2020-07-30 | 2020-07-30 | Pcba睡眠功能检测电路及pcba睡眠控制方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN111736063A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114137392A (zh) * | 2021-11-29 | 2022-03-04 | 展讯通信(上海)有限公司 | Pcba故障检测装置和方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5974364A (en) * | 1997-01-29 | 1999-10-26 | Samsung Electronics Co., Ltd. | Method for controlling a test mode of an electric device |
US20070255984A1 (en) * | 2006-04-06 | 2007-11-01 | Micrel, Incorporated | Test Mode For Pin-Limited Devices |
JP2013108991A (ja) * | 2009-02-27 | 2013-06-06 | Hitachi Ltd | 電池監視装置 |
CN103389419A (zh) * | 2012-05-10 | 2013-11-13 | 上海博泰悦臻电子设备制造有限公司 | 车载系统的睡眠唤醒测试装置 |
CN104883051A (zh) * | 2015-05-27 | 2015-09-02 | 中国航天科技集团公司第九研究院第七七一研究所 | 一种多模式控制可配置型互补片上负压电荷泵电路 |
CN212301768U (zh) * | 2020-07-30 | 2021-01-05 | 深圳远致富海智能产业有限公司 | Pcba睡眠功能检测电路 |
-
2020
- 2020-07-30 CN CN202010751223.7A patent/CN111736063A/zh active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5974364A (en) * | 1997-01-29 | 1999-10-26 | Samsung Electronics Co., Ltd. | Method for controlling a test mode of an electric device |
US20070255984A1 (en) * | 2006-04-06 | 2007-11-01 | Micrel, Incorporated | Test Mode For Pin-Limited Devices |
JP2013108991A (ja) * | 2009-02-27 | 2013-06-06 | Hitachi Ltd | 電池監視装置 |
CN103389419A (zh) * | 2012-05-10 | 2013-11-13 | 上海博泰悦臻电子设备制造有限公司 | 车载系统的睡眠唤醒测试装置 |
CN104883051A (zh) * | 2015-05-27 | 2015-09-02 | 中国航天科技集团公司第九研究院第七七一研究所 | 一种多模式控制可配置型互补片上负压电荷泵电路 |
CN212301768U (zh) * | 2020-07-30 | 2021-01-05 | 深圳远致富海智能产业有限公司 | Pcba睡眠功能检测电路 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114137392A (zh) * | 2021-11-29 | 2022-03-04 | 展讯通信(上海)有限公司 | Pcba故障检测装置和方法 |
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Address after: 822, 823, 825, 826, South China Development Center, No.1, South China Avenue, Hehua community, Pinghu street, Longgang District, Shenzhen, Guangdong 518000 Applicant after: Shenzhen Huijin Intelligent Industry Co.,Ltd. Address before: 518000 C201, 2 / F, building C, Jianshe East Road, Qinghua community, Longhua street, Longhua District, Shenzhen City, Guangdong Province Applicant before: Shenzhen yuanfuhai Intelligent Industry Co.,Ltd. |
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CB02 | Change of applicant information | ||
CB02 | Change of applicant information |
Address after: 822, 823, 825, 826, South China Development Center, No.1, South China Avenue, Hehua community, Pinghu street, Longgang District, Shenzhen, Guangdong 518000 Applicant after: Shenzhen Huijin Intelligent Industry Co.,Ltd. Address before: 822, 823, 825, 826, South China Development Center, No.1, South China Avenue, Hehua community, Pinghu street, Longgang District, Shenzhen, Guangdong 518000 Applicant before: Shenzhen Huijin Intelligent Industry Co.,Ltd. |
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