CN101177598A - 喷水激光切割用粘合片 - Google Patents
喷水激光切割用粘合片 Download PDFInfo
- Publication number
- CN101177598A CN101177598A CNA2007101850728A CN200710185072A CN101177598A CN 101177598 A CN101177598 A CN 101177598A CN A2007101850728 A CNA2007101850728 A CN A2007101850728A CN 200710185072 A CN200710185072 A CN 200710185072A CN 101177598 A CN101177598 A CN 101177598A
- Authority
- CN
- China
- Prior art keywords
- adhesive sheet
- methyl
- base material
- material film
- water jet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000853 adhesive Substances 0.000 title claims abstract description 59
- 230000001070 adhesive effect Effects 0.000 title claims abstract description 59
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 title claims abstract description 33
- 239000000463 material Substances 0.000 claims abstract description 59
- 239000000835 fiber Substances 0.000 claims abstract description 11
- 239000011230 binding agent Substances 0.000 claims description 28
- 239000012528 membrane Substances 0.000 claims description 5
- 239000007788 liquid Substances 0.000 abstract description 17
- 239000004065 semiconductor Substances 0.000 abstract description 15
- 230000035699 permeability Effects 0.000 abstract description 4
- 239000012790 adhesive layer Substances 0.000 abstract description 2
- 238000005336 cracking Methods 0.000 abstract 1
- 230000007547 defect Effects 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 abstract 1
- 239000003795 chemical substances by application Substances 0.000 description 33
- 239000010410 layer Substances 0.000 description 31
- 238000005520 cutting process Methods 0.000 description 29
- -1 polyethylene Polymers 0.000 description 23
- BAPJBEWLBFYGME-UHFFFAOYSA-N Methyl acrylate Chemical compound COC(=O)C=C BAPJBEWLBFYGME-UHFFFAOYSA-N 0.000 description 19
- 239000000178 monomer Substances 0.000 description 19
- 238000000034 method Methods 0.000 description 16
- 238000012545 processing Methods 0.000 description 13
- 238000000576 coating method Methods 0.000 description 9
- 239000007921 spray Substances 0.000 description 9
- 229920000058 polyacrylate Polymers 0.000 description 8
- 239000000758 substrate Substances 0.000 description 8
- 239000002390 adhesive tape Substances 0.000 description 7
- 238000003698 laser cutting Methods 0.000 description 7
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 7
- 150000001875 compounds Chemical class 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 229940059574 pentaerithrityl Drugs 0.000 description 6
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 230000005284 excitation Effects 0.000 description 5
- TXBCBTDQIULDIA-UHFFFAOYSA-N 2-[[3-hydroxy-2,2-bis(hydroxymethyl)propoxy]methyl]-2-(hydroxymethyl)propane-1,3-diol Chemical compound OCC(CO)(CO)COCC(CO)(CO)CO TXBCBTDQIULDIA-UHFFFAOYSA-N 0.000 description 4
- LDHQCZJRKDOVOX-UHFFFAOYSA-N 2-butenoic acid Chemical compound CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 4
- NIXOWILDQLNWCW-UHFFFAOYSA-N Acrylic acid Chemical compound OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 4
- 229920005601 base polymer Polymers 0.000 description 4
- 229920001971 elastomer Polymers 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- 150000002576 ketones Chemical class 0.000 description 4
- 238000006116 polymerization reaction Methods 0.000 description 4
- 239000005060 rubber Substances 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 229920006243 acrylic copolymer Polymers 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- RTZKZFJDLAIYFH-UHFFFAOYSA-N ether Substances CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 229920000139 polyethylene terephthalate Polymers 0.000 description 3
- 239000005020 polyethylene terephthalate Substances 0.000 description 3
- 229920000098 polyolefin Polymers 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 230000002829 reductive effect Effects 0.000 description 3
- 239000007858 starting material Substances 0.000 description 3
- SVTBMSDMJJWYQN-UHFFFAOYSA-N 2-methylpentane-2,4-diol Chemical compound CC(O)CC(C)(C)O SVTBMSDMJJWYQN-UHFFFAOYSA-N 0.000 description 2
- KWOLFJPFCHCOCG-UHFFFAOYSA-N Acetophenone Natural products CC(=O)C1=CC=CC=C1 KWOLFJPFCHCOCG-UHFFFAOYSA-N 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 2
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 2
- 239000004743 Polypropylene Substances 0.000 description 2
- 239000004793 Polystyrene Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- ZJCCRDAZUWHFQH-UHFFFAOYSA-N Trimethylolpropane Chemical compound CCC(CO)(CO)CO ZJCCRDAZUWHFQH-UHFFFAOYSA-N 0.000 description 2
- 239000007983 Tris buffer Substances 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 125000005250 alkyl acrylate group Chemical group 0.000 description 2
- 238000004873 anchoring Methods 0.000 description 2
- 230000003712 anti-aging effect Effects 0.000 description 2
- 125000004432 carbon atom Chemical group C* 0.000 description 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 125000003438 dodecyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 150000002148 esters Chemical class 0.000 description 2
- YOQPJXKVVLAWRU-UHFFFAOYSA-N ethyl carbamate;methyl prop-2-enoate Chemical compound CCOC(N)=O.COC(=O)C=C YOQPJXKVVLAWRU-UHFFFAOYSA-N 0.000 description 2
- 239000005038 ethylene vinyl acetate Substances 0.000 description 2
- 239000012634 fragment Substances 0.000 description 2
- 238000010528 free radical solution polymerization reaction Methods 0.000 description 2
- 229920001903 high density polyethylene Polymers 0.000 description 2
- 239000004700 high-density polyethylene Substances 0.000 description 2
- LVHBHZANLOWSRM-UHFFFAOYSA-N itaconic acid Chemical compound OC(=O)CC(=C)C(O)=O LVHBHZANLOWSRM-UHFFFAOYSA-N 0.000 description 2
- 238000003475 lamination Methods 0.000 description 2
- 229920001684 low density polyethylene Polymers 0.000 description 2
- 239000004702 low-density polyethylene Substances 0.000 description 2
- 125000001400 nonyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 150000002923 oximes Chemical class 0.000 description 2
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 2
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 2
- 229920000728 polyester Polymers 0.000 description 2
- 229920001228 polyisocyanate Polymers 0.000 description 2
- 239000005056 polyisocyanate Substances 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 229920005594 polymer fiber Polymers 0.000 description 2
- 239000004814 polyurethane Substances 0.000 description 2
- 229920000915 polyvinyl chloride Polymers 0.000 description 2
- 239000004800 polyvinyl chloride Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 229920003048 styrene butadiene rubber Polymers 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- YRHRIQCWCFGUEQ-UHFFFAOYSA-N thioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3SC2=C1 YRHRIQCWCFGUEQ-UHFFFAOYSA-N 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 2
- 229920002554 vinyl polymer Polymers 0.000 description 2
- SWFHGTMLYIBPPA-UHFFFAOYSA-N (4-methoxyphenyl)-phenylmethanone Chemical compound C1=CC(OC)=CC=C1C(=O)C1=CC=CC=C1 SWFHGTMLYIBPPA-UHFFFAOYSA-N 0.000 description 1
- MSAHTMIQULFMRG-UHFFFAOYSA-N 1,2-diphenyl-2-propan-2-yloxyethanone Chemical compound C=1C=CC=CC=1C(OC(C)C)C(=O)C1=CC=CC=C1 MSAHTMIQULFMRG-UHFFFAOYSA-N 0.000 description 1
- VNQXSTWCDUXYEZ-UHFFFAOYSA-N 1,7,7-trimethylbicyclo[2.2.1]heptane-2,3-dione Chemical compound C1CC2(C)C(=O)C(=O)C1C2(C)C VNQXSTWCDUXYEZ-UHFFFAOYSA-N 0.000 description 1
- DLUPHJKQEIIYAM-UHFFFAOYSA-N 1-(2-ethoxyphenyl)-2-hydroxy-2-phenylethanone Chemical compound CCOC1=CC=CC=C1C(=O)C(O)C1=CC=CC=C1 DLUPHJKQEIIYAM-UHFFFAOYSA-N 0.000 description 1
- 239000012956 1-hydroxycyclohexylphenyl-ketone Substances 0.000 description 1
- XLPJNCYCZORXHG-UHFFFAOYSA-N 1-morpholin-4-ylprop-2-en-1-one Chemical compound C=CC(=O)N1CCOCC1 XLPJNCYCZORXHG-UHFFFAOYSA-N 0.000 description 1
- YIKSHDNOAYSSPX-UHFFFAOYSA-N 1-propan-2-ylthioxanthen-9-one Chemical compound S1C2=CC=CC=C2C(=O)C2=C1C=CC=C2C(C)C YIKSHDNOAYSSPX-UHFFFAOYSA-N 0.000 description 1
- PIZHFBODNLEQBL-UHFFFAOYSA-N 2,2-diethoxy-1-phenylethanone Chemical compound CCOC(OCC)C(=O)C1=CC=CC=C1 PIZHFBODNLEQBL-UHFFFAOYSA-N 0.000 description 1
- OVSKIKFHRZPJSS-UHFFFAOYSA-N 2,4-D Chemical compound OC(=O)COC1=CC=C(Cl)C=C1Cl OVSKIKFHRZPJSS-UHFFFAOYSA-N 0.000 description 1
- BTJPUDCSZVCXFQ-UHFFFAOYSA-N 2,4-diethylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(CC)=CC(CC)=C3SC2=C1 BTJPUDCSZVCXFQ-UHFFFAOYSA-N 0.000 description 1
- LCHAFMWSFCONOO-UHFFFAOYSA-N 2,4-dimethylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(C)=CC(C)=C3SC2=C1 LCHAFMWSFCONOO-UHFFFAOYSA-N 0.000 description 1
- YRNDGUSDBCARGC-UHFFFAOYSA-N 2-methoxyacetophenone Chemical compound COCC(=O)C1=CC=CC=C1 YRNDGUSDBCARGC-UHFFFAOYSA-N 0.000 description 1
- AUZRCMMVHXRSGT-UHFFFAOYSA-N 2-methylpropane-1-sulfonic acid;prop-2-enamide Chemical compound NC(=O)C=C.CC(C)CS(O)(=O)=O AUZRCMMVHXRSGT-UHFFFAOYSA-N 0.000 description 1
- MYISVPVWAQRUTL-UHFFFAOYSA-N 2-methylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(C)=CC=C3SC2=C1 MYISVPVWAQRUTL-UHFFFAOYSA-N 0.000 description 1
- AGBXYHCHUYARJY-UHFFFAOYSA-N 2-phenylethenesulfonic acid Chemical compound OS(=O)(=O)C=CC1=CC=CC=C1 AGBXYHCHUYARJY-UHFFFAOYSA-N 0.000 description 1
- OFNISBHGPNMTMS-UHFFFAOYSA-N 3-methylideneoxolane-2,5-dione Chemical compound C=C1CC(=O)OC1=O OFNISBHGPNMTMS-UHFFFAOYSA-N 0.000 description 1
- DUJMVKJJUANUMQ-UHFFFAOYSA-N 4-methylpentanenitrile Chemical compound CC(C)CCC#N DUJMVKJJUANUMQ-UHFFFAOYSA-N 0.000 description 1
- 241000931526 Acer campestre Species 0.000 description 1
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Natural products CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 1
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 description 1
- 229920002955 Art silk Polymers 0.000 description 1
- 239000004342 Benzoyl peroxide Substances 0.000 description 1
- OMPJBNCRMGITSC-UHFFFAOYSA-N Benzoylperoxide Chemical compound C=1C=CC=CC=1C(=O)OOC(=O)C1=CC=CC=C1 OMPJBNCRMGITSC-UHFFFAOYSA-N 0.000 description 1
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 description 1
- NGMNTLCQDNNBNT-UHFFFAOYSA-N C(C=C)(=O)OC.C(CS)(=O)OCCOC(CS)=O Chemical compound C(C=C)(=O)OC.C(CS)(=O)OCCOC(CS)=O NGMNTLCQDNNBNT-UHFFFAOYSA-N 0.000 description 1
- WQUYGVLLSSYSRD-UHFFFAOYSA-N C(C=C)(=O)OCC(C)O.CC=CC(=O)O Chemical compound C(C=C)(=O)OCC(C)O.CC=CC(=O)O WQUYGVLLSSYSRD-UHFFFAOYSA-N 0.000 description 1
- 229920000049 Carbon (fiber) Polymers 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229920000742 Cotton Polymers 0.000 description 1
- SNRUBQQJIBEYMU-UHFFFAOYSA-N Dodecane Natural products CCCCCCCCCCCC SNRUBQQJIBEYMU-UHFFFAOYSA-N 0.000 description 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 244000043261 Hevea brasiliensis Species 0.000 description 1
- 208000007976 Ketosis Diseases 0.000 description 1
- 229920000877 Melamine resin Polymers 0.000 description 1
- 239000004640 Melamine resin Substances 0.000 description 1
- WHNWPMSKXPGLAX-UHFFFAOYSA-N N-Vinyl-2-pyrrolidone Chemical compound C=CN1CCCC1=O WHNWPMSKXPGLAX-UHFFFAOYSA-N 0.000 description 1
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 1
- 239000004677 Nylon Substances 0.000 description 1
- NYXVMNRGBMOSIY-UHFFFAOYSA-N OCCC=CC(=O)OP(O)(O)=O Chemical compound OCCC=CC(=O)OP(O)(O)=O NYXVMNRGBMOSIY-UHFFFAOYSA-N 0.000 description 1
- 229910019142 PO4 Inorganic materials 0.000 description 1
- 239000005062 Polybutadiene Substances 0.000 description 1
- 229920001328 Polyvinylidene chloride Polymers 0.000 description 1
- 208000037656 Respiratory Sounds Diseases 0.000 description 1
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- GSEJCLTVZPLZKY-UHFFFAOYSA-N Triethanolamine Chemical compound OCCN(CCO)CCO GSEJCLTVZPLZKY-UHFFFAOYSA-N 0.000 description 1
- 229920001807 Urea-formaldehyde Polymers 0.000 description 1
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 description 1
- ZWFQZZLOCKGORW-UHFFFAOYSA-N [2-(2-hydroxypropyl)phenyl]-phenylmethanone Chemical compound OC(CC1=C(C(=O)C2=CC=CC=C2)C=CC=C1)C ZWFQZZLOCKGORW-UHFFFAOYSA-N 0.000 description 1
- HVVWZTWDBSEWIH-UHFFFAOYSA-N [2-(hydroxymethyl)-3-prop-2-enoyloxy-2-(prop-2-enoyloxymethyl)propyl] prop-2-enoate Chemical compound C=CC(=O)OCC(CO)(COC(=O)C=C)COC(=O)C=C HVVWZTWDBSEWIH-UHFFFAOYSA-N 0.000 description 1
- DHKHKXVYLBGOIT-UHFFFAOYSA-N acetaldehyde Diethyl Acetal Natural products CCOC(C)OCC DHKHKXVYLBGOIT-UHFFFAOYSA-N 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 150000001323 aldoses Chemical class 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 150000001408 amides Chemical class 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-N ammonia Natural products N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 1
- 150000008064 anhydrides Chemical class 0.000 description 1
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 1
- 239000012965 benzophenone Substances 0.000 description 1
- 235000019400 benzoyl peroxide Nutrition 0.000 description 1
- CGXDIDXEMHMPIX-UHFFFAOYSA-N bis(3-methylphenyl)methanone Chemical class CC1=CC=CC(C(=O)C=2C=C(C)C=CC=2)=C1 CGXDIDXEMHMPIX-UHFFFAOYSA-N 0.000 description 1
- MQDJYUACMFCOFT-UHFFFAOYSA-N bis[2-(1-hydroxycyclohexyl)phenyl]methanone Chemical compound C=1C=CC=C(C(=O)C=2C(=CC=CC=2)C2(O)CCCCC2)C=1C1(O)CCCCC1 MQDJYUACMFCOFT-UHFFFAOYSA-N 0.000 description 1
- 229930006711 bornane-2,3-dione Natural products 0.000 description 1
- 238000012662 bulk polymerization Methods 0.000 description 1
- NTXGQCSETZTARF-UHFFFAOYSA-N buta-1,3-diene;prop-2-enenitrile Chemical class C=CC=C.C=CC#N NTXGQCSETZTARF-UHFFFAOYSA-N 0.000 description 1
- WERYXYBDKMZEQL-UHFFFAOYSA-N butane-1,4-diol Chemical compound OCCCCO WERYXYBDKMZEQL-UHFFFAOYSA-N 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000004917 carbon fiber Substances 0.000 description 1
- 239000004568 cement Substances 0.000 description 1
- YACLQRRMGMJLJV-UHFFFAOYSA-N chloroprene Chemical class ClC(=C)C=C YACLQRRMGMJLJV-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 150000001868 cobalt Chemical class 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 229920001577 copolymer Polymers 0.000 description 1
- 238000007334 copolymerization reaction Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000003851 corona treatment Methods 0.000 description 1
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 1
- 125000002704 decyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- LSXWFXONGKSEMY-UHFFFAOYSA-N di-tert-butyl peroxide Chemical compound CC(C)(C)OOC(C)(C)C LSXWFXONGKSEMY-UHFFFAOYSA-N 0.000 description 1
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N dimethylmethane Natural products CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- GRWZHXKQBITJKP-UHFFFAOYSA-N dithionous acid Chemical compound OS(=O)S(O)=O GRWZHXKQBITJKP-UHFFFAOYSA-N 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000007720 emulsion polymerization reaction Methods 0.000 description 1
- 125000003754 ethoxycarbonyl group Chemical group C(=O)(OCC)* 0.000 description 1
- 125000004494 ethyl ester group Chemical group 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000001530 fumaric acid Substances 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- 230000003760 hair shine Effects 0.000 description 1
- 230000026030 halogenation Effects 0.000 description 1
- 238000005658 halogenation reaction Methods 0.000 description 1
- 125000003187 heptyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 229940051250 hexylene glycol Drugs 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000012948 isocyanate Substances 0.000 description 1
- 125000001972 isopentyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 150000002584 ketoses Chemical class 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 1
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 125000001421 myristyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- WTNTZFRNCHEDOS-UHFFFAOYSA-N n-(2-hydroxyethyl)-2-methylpropanamide Chemical compound CC(C)C(=O)NCCO WTNTZFRNCHEDOS-UHFFFAOYSA-N 0.000 description 1
- PUANAIYYEZIDDG-UHFFFAOYSA-N n-(hydroxymethyl)but-2-enamide Chemical compound CC=CC(=O)NCO PUANAIYYEZIDDG-UHFFFAOYSA-N 0.000 description 1
- YPHQUSNPXDGUHL-UHFFFAOYSA-N n-methylprop-2-enamide Chemical compound CNC(=O)C=C YPHQUSNPXDGUHL-UHFFFAOYSA-N 0.000 description 1
- LFJIAQOELDZMAR-UHFFFAOYSA-N n-methylprop-2-enamide;propane-1-sulfonic acid Chemical compound CNC(=O)C=C.CCCS(O)(=O)=O LFJIAQOELDZMAR-UHFFFAOYSA-N 0.000 description 1
- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 229920003052 natural elastomer Polymers 0.000 description 1
- 229920001194 natural rubber Polymers 0.000 description 1
- SLCVBVWXLSEKPL-UHFFFAOYSA-N neopentyl glycol Chemical compound OCC(C)(C)CO SLCVBVWXLSEKPL-UHFFFAOYSA-N 0.000 description 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Substances N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000005026 oriented polypropylene Substances 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 150000002978 peroxides Chemical class 0.000 description 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 1
- 239000010452 phosphate Substances 0.000 description 1
- 229920002492 poly(sulfone) Polymers 0.000 description 1
- 229920000768 polyamine Polymers 0.000 description 1
- 229920002857 polybutadiene Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920001195 polyisoprene Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000005033 polyvinylidene chloride Substances 0.000 description 1
- 230000037452 priming Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- UIIIBRHUICCMAI-UHFFFAOYSA-N prop-2-ene-1-sulfonic acid Chemical compound OS(=O)(=O)CC=C UIIIBRHUICCMAI-UHFFFAOYSA-N 0.000 description 1
- 239000001294 propane Substances 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 235000000346 sugar Nutrition 0.000 description 1
- 150000008163 sugars Chemical class 0.000 description 1
- LSNNMFCWUKXFEE-UHFFFAOYSA-L sulfite Chemical compound [O-]S([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-L 0.000 description 1
- 238000004441 surface measurement Methods 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 238000010557 suspension polymerization reaction Methods 0.000 description 1
- 229920003051 synthetic elastomer Polymers 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- 239000005061 synthetic rubber Substances 0.000 description 1
- 238000009864 tensile test Methods 0.000 description 1
- BFKJFAAPBSQJPD-UHFFFAOYSA-N tetrafluoroethene Chemical group FC(F)=C(F)F BFKJFAAPBSQJPD-UHFFFAOYSA-N 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
- 125000002889 tridecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229960004418 trolamine Drugs 0.000 description 1
- 125000002948 undecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
- 210000002268 wool Anatomy 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/14—Working by laser beam, e.g. welding, cutting or boring using a fluid stream, e.g. a jet of gas, in conjunction with the laser beam; Nozzles therefor
- B23K26/146—Working by laser beam, e.g. welding, cutting or boring using a fluid stream, e.g. a jet of gas, in conjunction with the laser beam; Nozzles therefor the fluid stream containing a liquid
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/40—Removing material taking account of the properties of the material involved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/50—Working by transmitting the laser beam through or within the workpiece
- B23K26/57—Working by transmitting the laser beam through or within the workpiece the laser beam entering a face of the workpiece from which it is transmitted through the workpiece material to work on a different workpiece face, e.g. for effecting removal, fusion splicing, modifying or reforming
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26F—PERFORATING; PUNCHING; CUTTING-OUT; STAMPING-OUT; SEVERING BY MEANS OTHER THAN CUTTING
- B26F3/00—Severing by means other than cutting; Apparatus therefor
- B26F3/004—Severing by means other than cutting; Apparatus therefor by means of a fluid jet
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/20—Adhesives in the form of films or foils characterised by their carriers
- C09J7/21—Paper; Textile fabrics
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/20—Adhesives in the form of films or foils characterised by their carriers
- C09J7/22—Plastics; Metallised plastics
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2103/00—Materials to be soldered, welded or cut
- B23K2103/50—Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2203/00—Applications of adhesives in processes or use of adhesives in the form of films or foils
- C09J2203/326—Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/10—Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet
- C09J2301/18—Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet characterized by perforations in the adhesive tape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/26—Web or sheet containing structurally defined element or component, the element or component having a specified physical dimension
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/28—Web or sheet containing structurally defined element or component and having an adhesive outermost layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T442/00—Fabric [woven, knitted, or nonwoven textile or cloth, etc.]
- Y10T442/10—Scrim [e.g., open net or mesh, gauze, loose or open weave or knit, etc.]
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Plasma & Fusion (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Forests & Forestry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Adhesive Tapes (AREA)
- Dicing (AREA)
- Adhesives Or Adhesive Processes (AREA)
Abstract
本发明提供一种粘合片,其在喷水激光切割中,通过使来自液体流的液体的透过性更加良好并且稳定化,在芯片或IC部件等的剥离时不会产生缺损等缺陷,并且能够进行极薄的半导体晶片或材料的加工。该喷水激光切割用粘合片在基材膜上叠层了粘合剂层,基材膜包括由纤维形成的网状物。
Description
技术领域
本发明涉及喷水激光切割(ウオ一タ一ジエツトダイシング)用粘合片,更详细地说,涉及在通过喷水激光来切割半导体晶片和/或半导体相关材料时为了进行固定而使用的喷水激光切割用粘合片。
背景技术
以往,半导体晶片和半导体相关材料等通过使用旋转刀片来切割,并分离为芯片和IC部件。在该切割工序中,通常,为了固定半导体晶片等而将半导体晶片粘接在粘合片上,并且,晶片等被切割为芯片状后,通过拾取从粘合片上剥离下来。
但是,在该方法中,由于切割刀片产生的物理应力,引起切飞(ダイフライ)或产生裂纹、碎片等缺陷,从而产生使这些芯片等的品质降低、该切割方法的生产性也降低这样的问题。特别是,近年来,由于需要电子装置小型化、薄膜化,因而成为更加严重的问题。
因此,作为代替使用切割刀片的半导体晶片等的切割技术,提出了使用激光束的切割方法,特别是使用由液体喷射引导的激光束进行的切断、穿孔、熔接、刻印和剥离等的材料加工方法(例如专利文献1)。在该方法中,由于晶片等只暴露于来自上方的水流,因而可以防止旋转刀片带来的物理应力而引起的切飞等。
另外,在使用该激光技术的切割方法中,存在由于利用水流而引起的芯片等容易从固定它们的粘合片上剥落的问题,对此,提出了可以适用于喷水激光切割的粘合片(例如,专利文献2)。
专利文献1:WO95/32834号
专利文献2:特开2001-316648号公报
发明内容
发明要解决的课题
本发明的目的在于提供一种粘合片,该粘合片通过在喷水激光切割中使来自液体流的液体的透过性更加良好,同时使基材膜和粘合剂层的粘合力提高,在切割后的拾取中,可防止粘合剂从基材膜上剥离以及粘合剂附着在被加工物上,并且,能够进行极薄的半导体晶片或材料的加工。
解决课题的方法
本发明的喷水激光切割用粘合片的特征是,在具有平均开口径5~30μm的孔的基材膜上叠层粘合剂层而构成。
在该喷水激光切割用粘合片中,基材膜优选网状膜或由纤维径10~200μm的单丝或复丝形成的膜。
另外,粘合剂层的厚度优选为1~30μm。
发明效果
采用本发明的喷水激光切割用粘合片,由于使用具有规定大小的平均开口径的基材膜,因此,在喷水激光切割时,可以确保来自液体流的液体的透过性良好,同时可以防止由液体进行的切割中从被加工物的粘合片上的剥离。另外,由于平均开口径比较小,可抑制基材表面的起伏,从而使表面平坦。其结果,可以提高对被加工物的粘合性,并可以确实地进行切割中的被加工物的固定。另外,由于可以使基材膜与粘合材料层的粘合性良好,因此在切割后的拾取中,可以防止粘合剂从基材膜上剥离以及粘合剂附着在被加工物上。
附图说明
图1是本发明的激光加工用粘合片的概略平面图。
图2是用于说明测定本发明的激光加工用粘合片中的基材膜和粘合剂层的粘合力的方法的图。
符号说明
10激光加工用粘合片
11胶带保持用板
12两面胶带
13粘合剂层
14胶带
具体实施方式
本发明的喷水激光切割用粘合片主要包括基材膜和设置于其上的粘合剂层。这里,所谓喷水激光切割用粘合片是指在使用由液体流(通常为水流)引导的激光束的切割中使用,并且可以在切割时使来自该液体流的液体从粘合片的一侧表面流向另一侧表面的粘合片,所述液体例如是从粘合剂层侧直接或间接地向粘合片上供给规定压力以上的液体流时的液体。此时的规定压力通常可以为几MPa左右以上。
作为基材膜,可列举膜、由纤维制成的非织造布和织造布(即,网状膜)等。作为该纤维,可列举聚合物纤维、合成纤维、天然纤维、无机纤维等。作为膜,可列举含有合成树脂,例如聚乙烯和聚丙烯等聚烯烃(具体地,低密度聚乙烯、直链低密度聚乙烯、高密度聚乙烯、拉伸聚丙烯、未拉伸聚丙烯、乙烯-丙烯共聚物、乙烯-醋酸乙烯酯共聚物、乙烯-(甲基)丙烯酸共聚物、乙烯-(甲基)丙烯酸酯共聚物等)、聚酯、聚对苯二甲酸乙二醇酯、聚氨酯、EVA、聚四氟乙烯、聚氯乙烯、聚偏氯乙烯、聚酰胺、缩醛树脂、聚苯乙烯、聚砜、聚碳酸酯、尼龙、氟树脂、苯乙烯-丁二烯共聚物等橡胶成分的聚合物等的膜;作为聚合物纤维,可列举PP、PVC、PE、PU、PS、PO或PET等;作为合成纤维,可列举人造丝或乙酸纤维素等;作为天然纤维,可列举棉、丝绸或羊毛等;作为无机纤维,可列举玻璃纤维或碳纤维等。其中,优选由聚烯烃制成或包含由聚烯烃制成的层。由此,可以确保对激光切割的适当的强度和扩展性2个特性。这些可以制成一层或两层以上的多层结构。另外,这些纤维可以是单丝或复丝的任一种。为了使后述的基材膜的平均开口径均匀,优选为单丝。
基材膜具有孔。该孔优选为在厚度方向贯通的孔,但也可以是多个孔相连结果在厚度方向上连通的孔。特别是,基材膜的孔优选基材膜以网状结构构成时的开口。基材膜的空隙率优选为30%左右以下,其平均开口径优选为5~30μm左右。这里所说的平均开口径,在孔为大致圆形时是指其直径,孔为多边形等时是指其一边的长度。另外,从其它观点看,孔的大小为例如0μm2~3.0mm2左右,优选为25μm2左右以上、100μm2左右以上、1000μm2左右以上、0.1mm2左右以上,并且优选为3.0mm2左右以下、2.0mm2左右以下、1.1mm2左右以下、900μm2左右以下。空隙率/网孔的平均开口径过大时,与粘合剂的接触面积变少,不能确保基材膜和粘合剂的充分的粘合性,另外,由于粘合剂埋入到空隙/网孔的开口中,因此有时不能确保粘合剂表面的平滑性。由此,在粘合片与被加工物的界面产生空隙等,激光加工时的尺寸精度变差,或者根据被加工物的种类(玻璃、硅晶片等)而在切割时产生“缺损”。另一方面,空隙率/网孔的平均开口径过小时,粘合片的粘合剂层的表面粗糙度虽然可以确保均匀的状态,但粘合剂几乎不埋入到空隙/网孔的开口中,锚定效果(楔(くさび)效果)降低,粘合力也降低。另外,喷水激光切割时使用的水难以透过基材膜,产生被加工物飞散等问题。
为了使基材膜成为网状结构,例如,优选纤维径为10~150μm左右,从液体的透过性的观点看,更加优选25~80μm左右。
从防止片的破损或半导体晶片等的加工中的切断,同时抑制制造成本的观点看,基材膜的厚度优选为10~400μm,更优选为30~250μm。
另外,网状膜可以实施电晕放电处理、火焰处理、等离子体处理、溅射蚀刻处理或底涂(例如底漆(primer))、氟处理等表面处理;采用药剂的脱脂处理等,用以提高与粘合剂的粘合性。其中,优选实施底涂处理。
本发明的基材膜优选断裂伸长率超过100%,更优选为150%。这是因为通过基材膜伸长,在切割工序后,可以容易地从粘合片上拾取芯片等。
而且,基材膜优选拉伸强度超过0.1N/20mm,更优选高于0.3N/20mm。这是为了避免粘合片本身的破损和/或切断。
断裂伸长率和拉伸强度例如可以使用长度5.0cm、宽度20mm的试样通过拉伸试验机测定。进行试验时的拉伸速度在室温下为300mm/分(基于ASTM D1000)。断裂伸长率可以如下算出。
断裂伸长率=(断裂时的长度-原来长度)/(原来长度)×100%,拉伸强度是断裂时的测定值。
粘合剂层由涂布在基材膜一面上的粘合剂层构成。该粘合剂可以是压敏型、热敏型、光敏型中的任意一种类型,但优选通过能量线照射而固化的类型的粘合剂。由此,可以容易地从被加工物上剥离下来。作为能量线,例如可以利用紫外线、可见光线、红外线等各种波长的能量线,但由于在切割中使用的激光束是400nm以下的激发波长或400nm以上的激发波长的激光等,因此优选使用不会由于照射所使用的切割装置的激光束而发生固化的粘合剂,所述400nm以下的激发波长的激光,例如:激发波长为248nm的KrF准分子激光、308nm的XeCI准分子激光、YAG激光的第三高次谐波(355nm)、第四高次谐波(266nm);所述400nm以上的激发波长的激光,例如:可吸收经由多光子吸收过程得到的紫外线区域的光且可利用多光子吸收消融(abration)进行20μm以下宽度的切割加工等的波长为750~800nm附近的钛蓝宝石激光等脉冲宽度为1e-9秒(0.000000001秒)以下的激光等。
作为粘合剂层的形成材料,可以使用含有橡胶类聚合物、(甲基)丙烯酸类聚合物等的公知的粘合剂,特别优选(甲基)丙烯酸类聚合物。由此,在制成光敏型粘合剂时,即使不添加用于能量线固化的特别的单体/低聚物成分等,也可以进行固化。
作为橡胶类聚合物,例如可以是天然橡胶(例如聚异戊二烯等)、合成橡胶(例如苯乙烯-丁二烯橡胶、聚丁二烯类、丁二烯-丙烯腈类、氯丁二烯类橡胶等)的任一种。
作为构成(甲基)丙烯酸类聚合物的单体成分,例如可举出,具有甲基、乙基、正丙基、异丙基、正丁基、叔丁基、异丁基、戊基、异戊基、己基、庚基、环己基、2-乙基己基、辛基、异辛基、壬基、异壬基、癸基、异癸基、十一烷基、月桂基、十三烷基、十四烷基、硬脂基、十八烷基以及十二烷基等碳原子数30以下,优选碳原子数4~18的直链或支链烷基的丙烯酸烷基酯或甲基丙烯酸烷基酯。这些(甲基)丙烯酸烷基酯既可以单独使用也可以同时使用两种以上。
作为除上述以外的单体成分,例如可举出丙烯酸、甲基丙烯酸、(甲基)丙烯酸羧乙酯、(甲基)丙烯酸羧戊酯、衣康酸、马来酸、富马酸以及巴豆酸等含有羧基的单体、马来酸酐或衣康酸酐等酸酐单体、(甲基)丙烯酸2-羟乙酯、(甲基)丙烯酸2-羟丙酯、(甲基)丙烯酸4-羟丁酯、(甲基)丙烯酸6-羟己酯、(甲基)丙烯酸8-羟辛酯、(甲基)丙烯酸10-羟癸酯、(甲基)丙烯酸12-羟基月桂酯以及(甲基)丙烯酸(4-羟甲基环己基)甲酯等含有羟基的单体;苯乙烯磺酸、烯丙基磺酸、2-(甲基)丙烯酰胺-2-甲基丙磺酸、(甲基)丙烯酰胺丙磺酸、磺丙基(甲基)丙烯酸酯以及(甲基)丙烯酰氧基萘磺酸等含有磺酸基的单体;2-羟乙基丙烯酰基磷酸酯等含有磷酸基的单体;(甲基)丙烯酰胺、(甲基)丙烯酸N-羟甲基酰胺、(甲基)丙烯酸烷基氨基烷基酯(例如,甲基丙烯酸二甲基氨乙酯、甲基丙烯酸叔丁基氨乙酯等)、N-乙烯基吡咯烷酮、丙烯酰基吗啉、醋酸乙烯酯、苯乙烯、丙烯腈等。这些单体成分既可以单独使用,也可以同时使用两种以上。
另外,为了(甲基)丙烯酸类聚合物的交联,可以任意使用多官能单体。作为多官能单体,例如可举出己二醇二(甲基)丙烯酸酯、(聚)乙二醇二(甲基)丙烯酸酯、(聚)丙二醇二(甲基)丙烯酸酯、新戊二醇二(甲基)丙烯酸酯、季戊四醇二(甲基)丙烯酸酯、三羟甲基丙烷三(甲基)丙烯酸酯、季戊四醇三(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇单羟基五(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、环氧(甲基)丙烯酸酯、聚酯(甲基)丙烯酸酯以及聚氨酯(甲基)丙烯酸酯等。这些多官能单体既可以单独使用,也可以同时使用两种以上。从粘合特性等观点看,多官能单体的使用量优选为所有单体成分的30重量%以下,更优选为20重量%以下。
另外,优选使用具有碳-碳双键等能量线固化性官能团的单体和/或低聚物。
作为单体/低聚物,例如可举出,聚氨酯(甲基)丙烯酸酯、三羟甲基丙烷三(甲基)丙烯酸酯、四羟甲基甲烷四(甲基)丙烯酸酯、季戊四醇三(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇单羟基五(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯以及1,4-丁二醇二(甲基)丙烯酸酯等。它们既可以单独使用,也可以同时使用两种以上。它们的配合量没有特别限制,但如果考虑到粘合性,则相对于100重量份构成粘合剂的(甲基)丙烯酸类聚合物等基础聚合物,优选为5~500重量份左右,更优选为70~150重量份左右。
另外,在构成光敏型粘合剂时,优选使用光聚合引发剂。作为光聚合引发剂,例如可举出4-(2-羟基乙氧基)苯基(2-羟基-2-丙基)甲酮、α-羟基-α,α-甲基苯乙酮、甲氧基苯乙酮、2,2-二甲氧基-2-苯基苯乙酮、2,2-二乙氧基苯乙酮、1-羟基环己基苯基酮、2-甲基-1-[4-(甲硫基)苯基]-2-吗啉代丙烷-1等苯乙酮类化合物;苯偶姻乙醚、苯偶姻异丙醚、甲氧苯甲酰甲基醚(anisoinmethyl ether)等苯偶姻醚类化合物;2-甲基-2-羟丙基苯酮等α-酮醇类化合物;苄基二甲基酮缩醇等酮缩醇类化合物;2-萘磺酰氯等芳香族磺酰氯类化合物;1-苯酮-1,1-丙二酮-2-(邻乙氧羰基)肟等光学活性肟类化合物;二苯甲酮、苯酰安息香酸、3,3’-二甲基-4-甲氧基二苯甲酮等二苯甲酮类化合物;噻吨酮、2-氯噻吨酮、2-甲基噻吨酮、2,4-二甲基噻吨酮、异丙基噻吨酮、2,4-二氯噻吨酮、2,4-二乙基噻吨酮、2,4-二异丙基噻吨酮等噻吨酮类化合物;樟脑醌、卤化酮、酰基氧化膦(acyl phosphinoxide)以及酰基膦酸酯等。它们既可以单独使用,也可以同时使用两种以上。光聚合引发剂的配合量相对于100重量份构成粘合剂的基础聚合物,优选为0.1~10重量份左右,更优选为0.5~5重量份左右。
而且,为了提高基础聚合物的重均分子量,可以任意添加交联剂。作为交联剂,可举出多异氰酸酯化合物、环氧化合物、氮杂环丙烷化合物、三聚氰胺树脂、尿素树脂、酸酐化合物(無水化合物)、多胺、含有羧基的聚合物等。它们既可以单独使用,也可以同时使用两种以上。使用交联剂时,考虑到不会使剥离粘合力过度降低,其使用量相对于100重量份基础聚合物,通常优选为0.01~5重量份左右。
另外,除上述成分以外,可以任意含有以往公知的增粘剂、防老剂、填充剂、防老剂、着色剂等添加剂。
丙烯酸类聚合物的制备例如可以使用溶液聚合法、乳液聚合法、本体聚合法、悬浮聚合法等公知的方法使一种或两种以上的单体或它们的混合物进行聚合。其中优选溶液聚合法。这里使用的溶剂例如可举出醋酸乙酯、甲苯等极性溶剂。溶液浓度通常为20~80重量%左右。
在聚合物的制备中,可以使用聚合引发剂。作为聚合引发剂,可以举出,过氧化氢、过氧化苯甲酰、叔丁基过氧化物等过氧化物类。优选单独使用,但也可以与还原剂组合制成氧化还原类聚合引发剂使用。作为还原剂,例如可举出,亚硫酸盐、亚硫酸氢盐、铁、铜、钴盐等离子化的盐、三乙醇胺等胺类、醛糖、酮糖等还原糖等。另外,可以使用2,2’-偶氮双-2-甲基丙基脒酸盐、2,2’-偶氮双-2,4-二甲基戊腈、2,2’-偶氮双-N,N’-二亚甲基异丁基脒酸盐、2,2’-偶氮二异丁腈、2,2’-偶氮双-2-甲基-N-(2-羟乙基)丙酰胺等偶氮化合物。它们既可以单独使用,也可以同时使用两种以上。
反应温度通常为50~85℃左右,反应时间为1~8小时左右。
从防止对被加工物的污染等观点看,丙烯酸类聚合物特别优选低分子量物质的含量少者,丙烯酸类聚合物的数均分子量优选为30万以上,更优选为80万~300万左右。
粘合剂层的厚度可以在不会从被加工物上剥离的范围内适宜调整,但从能够确保充分的粘合强度,同时在从片上取下半导体晶片等后,可防止在该晶片等的背面残存不需要的粘合剂残渣,另外,由于粘结层的切断而能够使水容易地通过的观点考虑,粘合剂层的厚度更加优选1~30μm左右、1~20μm左右、3~30μm左右、3~20μm左右。由此,可以将在切割时由于照射激光束或液体流引起的振动而导致的粘合剂层的共振控制在最小限度,并可以抑制振幅,防止芯片的裂纹、碎片等。另外,可以确实地进行切割时的被加工物的固定。
另外,如后所述,粘合剂层与基材膜一样,优选含有穿孔。穿孔可以通过关于基材膜的后述方法中的任一种方法形成,优选通过与基材膜的穿孔同时形成,从而使基材膜和粘合剂层的穿孔大致一致。
本发明的粘合片可以利用该技术领域公知的片的制造方法形成。例如,首先,准备基材膜。接着将粘合剂与基材膜叠层。这时,既可以直接在基材膜上涂布,或者利用转移涂布方法叠层,也可以在基材膜上压延叠层粘合剂,所述转移涂布方法是:将粘合剂涂布在涂布了剥离剂的处理材料(プロセス材料)上,干燥后,在基材膜上叠层该粘合剂。这些涂布方法可以利用例如反向辊涂布法、凹版涂布法、帘式涂布法、口模涂布法、挤出以及其它在工业上应用的涂布法等各种方法。另外,准备的基材膜可以以基材膜的状态具有穿孔,也可以在基材膜上涂布粘合剂后形成。
本发明的粘合片例如优选算术平均粗糙度Ra为1.0μm以下,更加优选为0.8μm以下、0.6μm以下。由此,可以确保基材膜与粘合剂层的粘合性、粘合剂层和被加工物的粘合性。
本发明的粘合片优选具有1.5N/20mm以上、更优选3N/20mm以上的粘合强度。而且,优选不足10N/20mm、更优选不足8N/20mm。即,随着切割技术向使用喷水激光技术的变迁,对切割用粘合片的粘合力的临界意义发生了变化,其结果,即使通过较弱的粘合力,也可以在切割时确保晶片等的良好粘结,同时,可以防止芯片或部件从粘合片上剥离。此外,由于初期粘合力的降低,可以降低拾取时的芯片或IC部件等的缺损等缺陷。特别是,在光敏型粘合剂的情况下,可以有效且迅速、简便地降低照射能量线后的粘合剂的粘合力。能量线照射后的粘合强度优选不足0.2N/20mm,更优选不足0.18N/20mm。
这里,粘合强度是在测定温度为23±3℃、剥离角度180°、剥离速度300mm/分(基于ASTM D1000)的条件下,在Si镜状晶片上测定时的值。
实施例
以下详细地说明本发明的喷水激光切割用粘合片的实施例。
(粘合剂层的形成)
在醋酸乙酯中,通过常规方法使60重量份丙烯酸甲酯、35重量份丙烯酸2-乙基己酯、5重量份丙烯酸共聚。由此,得到含有重均分子量为70万的丙烯酸类共聚物的溶液。
接着,在含有丙烯酸类共聚物的溶液中,添加100重量份使季戊四醇三丙烯酸酯和二异氰酸酯反应而得到的紫外线固化性低聚物(在25℃下的粘度为10Pa·sec)、3重量份光聚合引发剂(商品名“イルガキユア651”、チバ·スペシヤルテイ一·ケミカルズ公司制造)和2重量份多异氰酸酯化合物(商品名“コロネ一トL”、日本聚氨酯公司制造),得到丙烯酸类紫外线固化型粘合剂溶液。
实施例和比较例
使用线径20μm的聚对苯二甲酸乙二醇酯制成的网孔的平均开口径为3μm、5μm、30μm□(空隙率30%)、50μm□(空隙率55%)、100μm□(空隙率85%),平均厚度分别为45μm的网状膜作为基材,分别涂布上述制造的粘合剂,使厚度为5μm、15μm、30μm、50μm,制作激光加工用粘合片。
(算术平均粗糙度Ra的测定)
测定实施例和比较例制作的粘合片的算术平均粗糙度Ra。
使用テンコ一ル制造的高度差(段差)/表面粗糙度微形状测定装置P-15,如图1所示,对得到的激光加工用粘合片的粘合剂层表面,在激光加工用粘合片10宽度方向(例如,宽度E=1400mm)的3处(X、Y、Z),长度方向为间隔D(例如10m)的10处,对总计30处进行测定,将得到的平均粗糙度作为算术平均粗糙度Ra。各处的测定距离是在粘合剂层一侧的表面测定长度50mm的距离。
(基材膜和粘合剂层的粘合力)
如图2所示,以SUS板作为胶带保持用板11,通过日东电工公司制造的两面胶带12(No.500)将粘合片10固定。
在粘合片10的粘合剂层13一侧贴合日东电工公司制造的BT-315胶带14,使用JIS B7721中规定的拉伸试验机以剥离角度180°、剥离速度300mm/分的速度将日东电工公司制造的BT-315胶带14沿箭头方向剥离,并将此时的值作为“粘合力”。
在测定粘合力时,在粘合剂层和基材膜之间粘合剂层未被剥离的情况下,它们的粘合力为获得的值以上。
(评价)
使用实施例和比较例得到的粘合片切割硅晶片,测定加工时的水的透过性、加工精度(芯片飞散和芯片缺损的发生),进行综合的评价。切割条件如下。
激光波长:1064nm
切割速度:50mm/s
激光直径:50μm
喷水压:40MPa
芯片大小:1mm×1mm
晶片大小:13.7cm(5英寸)
晶片厚度:1 50μm
另外,水透过性的测定时,将水不透过的情况表示为×、将部分透过的情况表示为△、将水透过的情况表示为○。
加工精度如下表示:将芯片飞散和芯片缺损均产生50%以上的情况作为×、将发生不到50%的情况作为△、将芯片飞散和芯片缺损均不发生的情况作为○。
虽然基于水透过性和加工精度等进行了综合评价,但对发生了拾取不良的情况标注*。
[表1]
开口径 | 粘合剂层厚度(μm) | 平均粗糙度Ra(μm) | 粘合力(N/20mm) | 水透过性 | 加工精度 | 综合评价 |
3μm | 5 | 0.3 | 6.5 | △ | × | × |
20 | 0.2 | 6.7 | × | × | × | |
30 | 0.4 | 8.3 | × | × | × | |
50 | 0.3 | 8.4 | × | × | × | |
5μm | 5 | 0.4 | 9.5 | ○ | ○ | ○ |
20 | 0.5 | 13.4以上 | ○ | ○ | ○ | |
30 | 0.3 | 13.5以上 | △ | △ | △ | |
50 | 0.4 | 13.2以上 | × | × | × | |
30μm | 5 | 1.2 | 13.7以上 | ○ | ○ | ○ |
20 | 0.9 | 14.0以上 | ○ | ○ | ○ | |
30 | 0.9 | 13.4以上 | ○ | ○ | ○ | |
50 | 0.8 | 14.1以上 | △ | △ | △ | |
50μm | 5 | 1.4 | 13.2以上 | ○ | ○ | ○ |
20 | 0.8 | 13.8以上 | ○ | ○ | ○ | |
30 | 0.7 | 13.4以上 | ○ | ○ | ○ | |
50 | 0.8 | 13.6以上 | △ | △ | △* | |
100μm | 5 | 1.5 | 7.4 | ○ | ○ | △* |
20 | 1.2 | 8.3 | ○ | ○ | △* | |
30 | 1.3 | 7.2 | ○ | ○ | △* | |
50 | 1.4 | 8.8 | △ | △ | △* |
由表1可知,空隙率/网孔的平均开孔径过大时,与粘合剂的接触面积变少,不能确保基材膜和粘合剂的充分的粘合性,另外,由于粘合剂埋入到空隙/网孔开口中,不能确保粘合剂表面的平滑性。由此,在粘合片和被加工物的界面产生空隙等,激光的加工精度变差,或者在切割时发生缺损。
空隙率/网孔的平均开孔径过小时,可知粘合片的粘合剂层的表面粗糙度虽然可以确保均匀的状态,但粘合剂几乎不埋入到空隙/网孔的开口中,锚定效果(楔效果)降低,粘合力也降低。另外,喷水激光切割时使用的水难以透过基材膜,产生被加工物飞散等问题。
另一方面,基材膜具有规定范围内的平均开口径时,表面粗糙度和粘合性均良好,并可以抑制产生芯片的分散和芯片的缺损两者。特别是,尽管来自于水流的水可以容易地将粘合片抽出,而且可以充分确保粘合剂和芯片间的粘合性,难以发生芯片飞散。
工业实用性
本发明的喷水激光切割用粘合片不仅可以利用于由液体流导向的激光束能够进行切割的对象,即半导体相关材料(例如半导体晶片、BGA封装材料、印刷电路、陶瓷板、液晶装置用玻璃部件、片材、电路基板、玻璃基板、陶瓷基板、金属基板、半导体激光的发光/受光元件基板、MEMS基板或半导体封装材料等)等,而且对于所有种类的材料,都可以在广泛的范围内使用。
Claims (4)
1.一种喷水激光切割用粘合片,该粘合片是在基材膜上叠层粘合剂层而形成的,所述基材膜具有平均开口径5~30μm的孔。
2.权利要求1所述的喷水激光切割用粘合片,其中,基材膜是网状膜。
3.权利要求1所述的喷水激光切割用粘合片,其中,基材膜由纤维径10~200μm的单丝或复丝形成。
4.权利要求1所述的喷水激光切割用粘合片,其中,粘合剂层的厚度为1~30μm。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006299864A JP2008117945A (ja) | 2006-11-06 | 2006-11-06 | ウォータージェットレーザダイシング用粘着シート |
JP299864/06 | 2006-11-06 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN101177598A true CN101177598A (zh) | 2008-05-14 |
Family
ID=39015623
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNA2007101850728A Pending CN101177598A (zh) | 2006-11-06 | 2007-11-06 | 喷水激光切割用粘合片 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20080108262A1 (zh) |
EP (1) | EP1918343A1 (zh) |
JP (1) | JP2008117945A (zh) |
KR (1) | KR20080041123A (zh) |
CN (1) | CN101177598A (zh) |
TW (1) | TW200842031A (zh) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4107417B2 (ja) * | 2002-10-15 | 2008-06-25 | 日東電工株式会社 | チップ状ワークの固定方法 |
JP2008117943A (ja) * | 2006-11-06 | 2008-05-22 | Nitto Denko Corp | ウォータージェットレーザダイシング用粘着シート |
JP5000370B2 (ja) * | 2007-04-20 | 2012-08-15 | 日東電工株式会社 | ウォータージェットレーザダイシング用粘着シート |
CN101802120B (zh) * | 2007-08-30 | 2013-10-16 | 电气化学工业株式会社 | 粘附片以及电子元器件的制造方法 |
JP2009297734A (ja) * | 2008-06-11 | 2009-12-24 | Nitto Denko Corp | レーザー加工用粘着シート及びレーザー加工方法 |
FR2967365A1 (fr) * | 2010-11-15 | 2012-05-18 | Pascal Lutz | Utilisation d'un film de protection temporaire pour proteger une surface metallique lors de la decoupe par faisceau laser |
JP2012184324A (ja) * | 2011-03-04 | 2012-09-27 | Nitto Denko Corp | 薄膜基板固定用粘接着シート |
JP5996260B2 (ja) * | 2012-05-09 | 2016-09-21 | 株式会社ディスコ | 被加工物の分割方法 |
JP6870974B2 (ja) * | 2016-12-08 | 2021-05-12 | 株式会社ディスコ | 被加工物の分割方法 |
JP6938212B2 (ja) | 2017-05-11 | 2021-09-22 | 株式会社ディスコ | 加工方法 |
TWI805564B (zh) * | 2018-01-25 | 2023-06-21 | 晶元光電股份有限公司 | 晶粒轉移方法及其裝置 |
WO2024181556A1 (ja) * | 2023-03-01 | 2024-09-06 | 大日本印刷株式会社 | 電子部品加工用粘着テープ |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0560072A3 (en) | 1992-03-13 | 1993-10-06 | Nitto Denko Corporation | Anisotropic electrically conductive adhesive film and connection structure using the same |
JP4049452B2 (ja) * | 1998-07-02 | 2008-02-20 | 日東電工株式会社 | 半導体素子用接着シートおよびそれを用いた半導体装置 |
WO2001042341A1 (fr) * | 1999-12-10 | 2001-06-14 | Yupo Corporation | Film de resine poreux |
US6890617B1 (en) | 2000-01-13 | 2005-05-10 | Nitto Denko Corporation | Porous adhesive sheet, semiconductor wafer with porous adhesive sheet, and method of manufacture thereof |
ATE424040T1 (de) * | 2000-03-30 | 2009-03-15 | Nitto Denko Corp | Wasserdurchlässiges klebeband für die verarbeitung von halbleitern |
JP4087144B2 (ja) * | 2001-04-23 | 2008-05-21 | 古河電気工業株式会社 | レーザーダイシング用粘着テープ |
US6863976B2 (en) * | 2002-11-16 | 2005-03-08 | Milliken & Company | Polypropylene monofilament and tape fibers exhibiting certain creep-strain characteristics and corresponding crystalline configurations |
WO2004081506A2 (en) * | 2003-03-13 | 2004-09-23 | Electrovac Fabrikation Elektrotechnischer Spezialartikel Gmbh | Sealed sensor housing |
JP2005167042A (ja) * | 2003-12-04 | 2005-06-23 | Furukawa Electric Co Ltd:The | 半導体ウェハ固定用粘着テープ |
US7586060B2 (en) | 2003-12-25 | 2009-09-08 | Nitto Denko Corporation | Protective sheet for laser processing and manufacturing method of laser processed parts |
US7968039B2 (en) | 2004-06-22 | 2011-06-28 | Lintec Corporation | Method of producing pressure-sensitive adhesive sheet |
-
2006
- 2006-11-06 JP JP2006299864A patent/JP2008117945A/ja active Pending
-
2007
- 2007-10-31 EP EP20070021321 patent/EP1918343A1/en not_active Withdrawn
- 2007-10-31 US US11/931,124 patent/US20080108262A1/en not_active Abandoned
- 2007-11-02 TW TW96141441A patent/TW200842031A/zh unknown
- 2007-11-05 KR KR1020070112073A patent/KR20080041123A/ko not_active Application Discontinuation
- 2007-11-06 CN CNA2007101850728A patent/CN101177598A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
EP1918343A1 (en) | 2008-05-07 |
TW200842031A (en) | 2008-11-01 |
KR20080041123A (ko) | 2008-05-09 |
JP2008117945A (ja) | 2008-05-22 |
US20080108262A1 (en) | 2008-05-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101177598A (zh) | 喷水激光切割用粘合片 | |
CN101177597A (zh) | 喷水激光切割用粘合片 | |
KR100427566B1 (ko) | 투수성 접착테이프 | |
CN101542689A (zh) | 喷水激光切割用粘合片 | |
CN101712852B (zh) | 激光加工用压敏粘合片和用于激光加工的方法 | |
CN100523107C (zh) | 激光切割用粘合片及其制造方法 | |
CN101134876A (zh) | 喷水激光切割用粘合片 | |
US8168030B2 (en) | Manufacturing method of laser processed parts and adhesive sheet for laser processing | |
TWI409315B (zh) | Laser processing adhesive sheet | |
CN103081070A (zh) | 切割用粘合片及使用了切割用粘合片的半导体装置的制造方法 | |
CN101134877A (zh) | 喷水激光切割用粘合片 | |
CN102031072A (zh) | 保持元件用压敏粘合片和生产元件的方法 | |
JP2008270505A (ja) | ウォータージェットレーザダイシング用粘着シート | |
JP2005279757A (ja) | レーザー加工品の製造方法及びレーザー加工用保護シート | |
JP2008085303A (ja) | ウォータージェットレーザダイシング用粘着シート |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |
Open date: 20080514 |