article

Modeling the cosmic-ray-induced soft-error rate in integrated circuits: an overview

Author:

G. R. SrinivasanAuthors Info & Claims

IBM Journal of Research and Development, Volume 40, Issue 1

Pages 77 - 89

https://doi.org/10.1147/rd.401.0077

Published: 01 January 1996 Publication History

Abstract

No abstract available.

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Velamala JLiVolsi RTorres MCao YStok LDutt NHassoun S(2011)Design sensitivity of single event transients in scaled logic circuitsProceedings of the 48th Design Automation Conference10.1145/2024724.2024881(694-699)Online publication date: 5-Jun-2011
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Modeling the cosmic-ray-induced soft-error rate in integrated circuits: an overview

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cover image IBM Journal of Research and Development

IBM Journal of Research and Development Volume 40, Issue 1

Special issue: terrestrial cosmic rays and soft errors

Jan. 1996

125 pages

ISSN:0018-8646

Editors:
P. S. Hauge,
J. F. Ziegler
IBM Thomas J. Watson Research Center Yorktown Heights, NY
,
G. R. Srinivasan
Microelectronics Division, Hopewell Junction, NY

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Published: 01 January 1996

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Velamala JLiVolsi RTorres MCao YStok LDutt NHassoun S(2011)Design sensitivity of single event transients in scaled logic circuitsProceedings of the 48th Design Automation Conference10.1145/2024724.2024881(694-699)Online publication date: 5-Jun-2011
Shazli STahoori MLombardi FBhanja SMassoud YBahar R(2009)Soft error rate computation in early design stages using boolean satisfiabilityProceedings of the 19th ACM Great Lakes symposium on VLSI10.1145/1531542.1531568(101-104)Online publication date: 10-May-2009
Petroli LLisboa CKastensmidt FCarro L(2008)Majority Logic Mapping for Soft Error DependabilityJournal of Electronic Testing: Theory and Applications10.1007/s10836-007-5044-024:1-3(83-92)Online publication date: 1-Jun-2008
Mukherjee S(2008)Architecture Design for Soft ErrorsundefinedOnline publication date: 22-Feb-2008
Wirth GRibeiro IVieira MKastensmidt FCoelho CJacobi RBecker J(2006)Single event transients in dynamic logicProceedings of the 19th annual symposium on Integrated circuits and systems design10.1145/1150343.1150392(184-189)Online publication date: 28-Aug-2006
Neto ERibeiro IVieira MWirth GKastensmidt F(2006)Using Bulk Built-in Current Sensors to Detect Soft ErrorsIEEE Micro10.1109/MM.2006.10326:5(10-18)Online publication date: 1-Sep-2006
Wirth GVieira MNeto EKastensmidt FGalup-Montoro CBampi SOrailoglu A(2005)Single event transients in combinatorial circuitsProceedings of the 18th annual symposium on Integrated circuits and system design10.1145/1081081.1081115(121-126)Online publication date: 4-Sep-2005
Neto ERibeiro IVieira MWirth GKastensmidt FGalup-Montoro CBampi SOrailoglu A(2005)Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logicProceedings of the 18th annual symposium on Integrated circuits and system design10.1145/1081081.1081103(62-67)Online publication date: 4-Sep-2005
Memik GKandemir MOzturk O(2005)Increasing Register File Immunity to Transient ErrorsProceedings of the conference on Design, Automation and Test in Europe - Volume 110.1109/DATE.2005.181(586-591)Online publication date: 7-Mar-2005
Chen GKandemir MKarakoy M(2005)Memory space conscious loop iteration duplication for reliable executionProceedings of the 12th international conference on Static Analysis10.1007/11547662_6(52-69)Online publication date: 7-Sep-2005
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Cited By

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Recommendations

Effect of Bias Temperature Instability on Soft Error Rate

Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits

Fault modeling for FinFET circuits

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