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Soft-error Monte Carlo modeling program, SEMM

Authors:

G. R. SrinivasanAuthors Info & Claims

IBM Journal of Research and Development, Volume 40, Issue 1

Pages 109 - 118

https://doi.org/10.1147/rd.401.0109

Published: 01 January 1996 Publication History

Abstract

No abstract available.

References

[1]

G. R. Srinivasan, P. C. Murley, and H. H. K. Tang, "Accurate, Predictive Modeling of Soft Error Rate due to Cosmic Rays and Chip Alpha Radiation," Proceedings of the 32nd Annual IEEE International Reliability Physics Symposium, San Jose, CA, April 12, 1994, pp. 12-16.

[2]

G. R. Srinivasan, H. H. K. Tang, and P. C. Murley, "Parameter-Free, Predictive Modeling of Single Event Upsets due to Protons, Neutrons, and Pions in Terrestrial Cosmic Rays," IEEE Trans. Nucl. Sci. 41, No. 6, 2063-2070 (December 1994).

[3]

S. Kirkpatrick, "Modeling Diffusion and Collection of Charge from Ionizing Radiation in Silicon Devices," IEEE Trans. Electron Devices ED-26, No. 11, 1742-1753 (November 1979).

[4]

C. M. Hsieh, P. C. Murley, and R. R. O'Brien, "Collection of Charge from Alpha-Particle Tracks in Silicon Devices," IEEE Trans. Electron Devices ED-30, 686-693 (June 1983).

[5]

C. M. Hsieh, P. C. Murley, and R. R. O'Brien, "A Field-Funneling Effect on the Collection of Alpha-Particle-Generated Carriers in Silicon Devices," IEEE Electron Device Lett. EDL-2, 103-105 (April 1981).

[6]

G. A. Sai-Halasz, M. R. Wordeman, and R. H. Dennard, "Alpha Particle-Induced Soft Error Rate in VLSI Circuits," IEEE Trans. Electron Devices 29, 725 (1982).

[7]

G. A. Sai-Halasz and M. R. Wordeman, "Monte Carlo Modeling of the Transport of Ionizing Radiation-Created Carriers in Integrated Circuits," IEEE Electron Device Lett. EDL-10, 211-213 (1980).

[8]

H. H. K. Tang, G. R. Srinivasan, and N. Azziz, "Cascade Statistical Model for Nucleon-Induced Reactions on Light Nuclei in the Energy Range 50 MeV-1 GeV," Phys. Rev. C 42, No. 4, 1598-1622 (October 1990).

[9]

H. H. K. Tang, "Nuclear Physics of Cosmic Ray Interaction with Semiconductor Materials: Particle-Induced Soft Errors from a Physicist's Perspective," IBM J. Res. Develop. 40, No. 1, 91-108 (1996, this issue)

Digital Library

[10]

J. F. Ziegler, "Terrestrial Cosmic Rays," IBM J. Res. Develop 40, No. 1, 19-39 (1996, this issue).

Digital Library

[11]

H. W. Bertini, Report No. 3383, Oak Ridge National Laboratory, Oak Ridge, TN, 1963.

[12]

J. P. Biersack and L. G. Haggmark, "A Monte Carlo Computer Program for the Transport of Energetic Ions in Amorphous Targets," Nucl. Instr. & Meth. 174, 257-269 (1980).

[13]

J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Range of Ions in Solids, Pergamon Press, New York, 1985, p. 41.

[14]

P. G. Shewmon, Diffusion in Solids, McGraw-Hill Book Co., Inc., New York, 1963, p. 52.

[15]

C. M. Hsieh, P. C. Murley, and R. R. O'Brien, "Dynamics of Charge Collection from Alpha-Particle Tracks in Integrated Circuits," Proceedings of the 19th Annual IEEE International Reliability Physics Symposium, Orlando, FL, April 7, 1981, pp. 686-693.

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L. B. Freeman, "Critical Charge Calculations for a Bipolar Array Cell," IBM J. Res. Develop 40, No. 1, 119-129 (1996, this issue).

Digital Library

Cited By

Li TAmbrose JRagel RParameswaran S(2016)Processor Design for Soft ErrorsACM Computing Surveys10.1145/299635749:3(1-44)Online publication date: 8-Nov-2016
https://dl.acm.org/doi/10.1145/2996357
Paliaroutis GTsoumanis PDimitriou GStamoulis G(2016)SER Analysis of Multiple Transient Faults in Combinational LogicProceedings of the SouthEast European Design Automation, Computer Engineering, Computer Networks and Social Media Conference10.1145/2984393.2984414(36-41)Online publication date: 25-Sep-2016
https://dl.acm.org/doi/10.1145/2984393.2984414
Costenaro EAlexandrescu DBelhaddad KNicolaidis M(2013)A Practical Approach to Single Event Transient Analysis for Highly Complex DesignJournal of Electronic Testing: Theory and Applications10.1007/s10836-013-5385-929:3(301-315)Online publication date: 1-Jun-2013
https://dl.acm.org/doi/10.1007/s10836-013-5385-9
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Information & Contributors

Information

Published In

cover image IBM Journal of Research and Development

IBM Journal of Research and Development Volume 40, Issue 1

Special issue: terrestrial cosmic rays and soft errors

Jan. 1996

125 pages

ISSN:0018-8646

Editors:
P. S. Hauge,
J. F. Ziegler
IBM Thomas J. Watson Research Center Yorktown Heights, NY
,
G. R. Srinivasan
Microelectronics Division, Hopewell Junction, NY

Issue’s Table of Contents

Publisher

IBM Corp.

United States

Publication History

Published: 01 January 1996

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Cited By

Li TAmbrose JRagel RParameswaran S(2016)Processor Design for Soft ErrorsACM Computing Surveys10.1145/299635749:3(1-44)Online publication date: 8-Nov-2016
https://dl.acm.org/doi/10.1145/2996357
Paliaroutis GTsoumanis PDimitriou GStamoulis G(2016)SER Analysis of Multiple Transient Faults in Combinational LogicProceedings of the SouthEast European Design Automation, Computer Engineering, Computer Networks and Social Media Conference10.1145/2984393.2984414(36-41)Online publication date: 25-Sep-2016
https://dl.acm.org/doi/10.1145/2984393.2984414
Costenaro EAlexandrescu DBelhaddad KNicolaidis M(2013)A Practical Approach to Single Event Transient Analysis for Highly Complex DesignJournal of Electronic Testing: Theory and Applications10.1007/s10836-013-5385-929:3(301-315)Online publication date: 1-Jun-2013
https://dl.acm.org/doi/10.1007/s10836-013-5385-9
Kim SGuthaus MPhillips JHu AGraeb H(2011)Low-power multiple-bit upset tolerant memory optimizationProceedings of the International Conference on Computer-Aided Design10.5555/2132325.2132457(577-581)Online publication date: 7-Nov-2011
https://dl.acm.org/doi/10.5555/2132325.2132457
Seifert N(2010)Radiation-induced Soft ErrorsFoundations and Trends in Electronic Design Automation10.1561/10000000184:2–3(99-221)Online publication date: 1-Feb-2010
https://dl.acm.org/doi/10.1561/1000000018
Sheng WXiao LMao Z(2009)Soft error optimization of standard cell circuits based on gate sizing and multi-objective genetic algorithmProceedings of the 46th Annual Design Automation Conference10.1145/1629911.1630042(502-507)Online publication date: 26-Jul-2009
https://dl.acm.org/doi/10.1145/1629911.1630042
Dong WLi PHuang GNassif SRoychowdhury J(2008)SRAM dynamic stabilityProceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design10.5555/1509456.1509544(378-385)Online publication date: 10-Nov-2008
https://dl.acm.org/doi/10.5555/1509456.1509544
Gordon MRodbell KHeidel DCabral CCannon EReinhardt D(2008)Single-event-upset and alpha-particle emission rate measurement techniquesIBM Journal of Research and Development10.1147/rd.523.026552:3(265-273)Online publication date: 1-May-2008
https://dl.acm.org/doi/10.1147/rd.523.0265
KleinOsowski ACannon EOldiges PWissel L(2008)Circuit design and modeling for soft errorsIBM Journal of Research and Development10.1147/rd.523.025552:3(255-263)Online publication date: 1-May-2008
https://dl.acm.org/doi/10.1147/rd.523.0255
Tang HMurray CFiorenza GRodbell KGordon MHeidel D(2008)New simulation methodology for effects of radiation in semiconductor chip structuresIBM Journal of Research and Development10.1147/rd.523.024552:3(245-253)Online publication date: 1-May-2008
https://dl.acm.org/doi/10.1147/rd.523.0245
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