P. C. Murley and G. R. Srinivasan, "Soft-Error Monte Carlo Modeling Program, SEMM," IBM J. Res. Develop. 40, 109-118 and references cited therein (1996, this issue); G. R. Srinivasan, P. C. Murley, and H. K. Tang, IEEE Trans. NucL Sci. 41, 2063-2070 (1994); G. R. Srinivasan, "Modeling the Cosmic-Ray-Induced Soft-Error Rate in Integrated Circuits: An Overview," IBM J. Res. Develop. 40, 77-89 (1996, this issue).

Crossref

Google Scholar

[3]

J. F. Ziegler, "Terrestrial Cosmic Rays," IBM J. Res. Develop. 40, 19-39 (1996, this issue).

Crossref

Google Scholar

[4]

J. F. Ziegler, H. P. Muhlfeld, C. J. Montrose, H. W. Curtis, T. J. O'Gorman, and J. M. Ross, "Accelerated Testing for Cosmic Soft-Error Rate," IBM J. Res. Develop. 40, 51-72 (1996, this issue).

Crossref

Google Scholar

[5]

T. J. O'Gorman, J. M. Ross, A. H. Taber, J. F. Ziegler, H. P. Muhlfeld, C. J. Montrose, H. W. Curtis, and J. L. Walsh, "Field Testing for Cosmic Ray Soft Errors in Semiconductor Memories," IBM J. Res. Develop. 40, 41-50 (1996, this issue).

Crossref

Google Scholar

[6]

Annals of the IQSY, the summary of the International Research on the Quiet Sun Years, Vols. 1-7, MIT Press, Cambridge, MA, 1968-1970.

Google Scholar

[7]

D. Binder, E. C. Smith, and A. B. Holman, IEEE Trans. Nucl. Sci. NS-22, 2675 (1975).

Google Scholar

[8]

T. C. May and M. H. Woods, IEEE Trans. Electron Devices ED-26, 2 (1979).

Google Scholar

[9]

J. F. Ziegler and W. A. Lanford, SCIENCE 206, 776 (1979).

Google Scholar

[10]

J. F. Ziegler and W. A. Lanford, J. Appl. Phys. 52, 4305 (1981); see also J. F. Ziegler, IEEE Trans. Electron Devices ED-28, 560 (1981).

Google Scholar

[11]

W. A. Kolasinski et al., IEEE Trans. Nucl. Sci. NS-26, 5087 (1979).

Google Scholar

[12]

C. S. Guenzer, E. A. Wolicki, and R. G. Alias, IEEE Trans. Nucl. Sci. NS-26, 5048 (1979). A more complete study is their follow-up article: C. S. Guenzer, R. G. Alias, A. B. Campbell, J. W. Kidd, E. L. Petersen, N. Seeman, and E. A. Wolicki, IEEE Trans. Nucl. Sci. NS-26, 5048 (1979). See also R. C. Wyatt, P. J. McNulty, P. Toumbas, P. L. Rothwell, and R. C. Fitz, IEEE Trans. Nucl. Sci. NS-26, 4905 (1979).

Google Scholar

[13]

P. J. McNulty, G. E. Farrell, R. C. Wyatt, P. L. Rothwell, R. C. Filz, and J. N. Bradford, IEEE Trans. Nucl. Sci. NS-27, 1516 (1980); E. L. Petersen, IEEE Trans. Nucl. Sci. NS-27, 1494 (1980); J. N. Bradford, IEEE Trans. Nucl. Sci. NS-27, 1480 (1980). A recent review of these early studies can be found in Microelectronics for the Natural Radiation Environments of Space, P. J. McNulty, Ed., IEEE Press, New York, 1992.

Google Scholar

[14]

S. Kirkpatrick, IEEE Trans. Electron Devices ED-26, 1742 (1979).

Google Scholar

[15]

G. A. Sai-Halasz and M. R. Wordeman, IEEE Electron Device Lett. EDL-1, 211 (1980).

Google Scholar

[16]

C. M. Hsieh, P. C. Murley, and R. R. O'Brien, IEEE Electron Device Lett. EDL-2, 103 (1981). See also C. H. Hsieh, P. C. Murley, and R. R. O'Brien, Proceedings of the 19th Annual IEEE International Reliability Physics Symposium, 1981, p. 38; and C. H. Hsieh, P. C. Murley, and R. R. O'Brien, IEEE Trans. Electron Devices ED-30, 686 (1983).

Google Scholar

[17]

M. R. Wordeman, R. H. Dennard, and G. A. Sai-Halasz, IEDM Tech. Digest 40 (December 1981). See also G. A. Sai-Halasz, M. R. Wordeman, and R. H. Dennard, IEEE Trans. Electron Devices ED-29, 725 (1982), and G. A. Sai-Halasz and D. D. Tang, IEDM Tech. Digest 83, 344 (1983).

Google Scholar

[18]

J. F. Dicello, IEEE Trans. Nucl. Sci. NS-30, 4613 (1983).

Google Scholar

[19]

A. Taber and E. Normand, IEEE Trans. Nucl. Sci. 40, 120 (1993).

Google Scholar

[20]

A. Taber and E. Normand, 1993 U.S. Government Microcircuit Applications Conference Digest of Papers XIX, 223-226 (November 1993); available from the U.S. Defense Technical Information Center, Cameron Station, VA.

Google Scholar

[21]

L. M. Geppert, U. Bapst, D. F. Heidel, and K. A. Jenkins, IEEE J. Solid-State Circuits 26, 132 (1991); D. F. Heidel, U. H. Bapst, K. A. Jenkins, L. M. Geppert, and T. H. Zabel, IEEE Trans. Nucl. Sci. 40, 127 (1993).

Google Scholar

Cited By

View all

Benoit ADu YHerault TMarchal LPallez GPerotin LRobert YSun HVivien FSahni SSaxena VIyengar S(2022)Checkpointing à la Young/Daly: An OverviewProceedings of the 2022 Fourteenth International Conference on Contemporary Computing10.1145/3549206.3549328(701-710)Online publication date: 4-Aug-2022
https://dl.acm.org/doi/10.1145/3549206.3549328
Chabot AAlouani INouacer RNiar S(2021)A Memory Reliability Enhancement Technique for Multi Bit UpsetsJournal of Signal Processing Systems10.1007/s11265-020-01603-593:4(439-459)Online publication date: 1-Apr-2021
https://dl.acm.org/doi/10.1007/s11265-020-01603-5
Overill RVolkamer MWressnegger C(2020)Cosmic raysProceedings of the 15th International Conference on Availability, Reliability and Security10.1145/3407023.3409188(1-6)Online publication date: 25-Aug-2020
https://dl.acm.org/doi/10.1145/3407023.3409188
Show More Cited By

Index Terms

IBM experiments in soft fails in computer electronics (1978–1994)

Recommendations

Call-A.P.P.L.E. Magazine - 1978 Compendium
Book review: Human-Computer Interaction, by Jenny Preece, Yvonne Rogers, Helen Sharp, David Benyon, Simon Holland, and Tom Carey (Addison-Wesley, 1994)

One of the most significant events at CHI '94 in Boston did not appear in the program, and although it was conspicuous to some, it probably went unnoticed by most of the attendees. Given the venue, perhaps its name made it blend into the background. At ...
Soft topological soft groups and soft rings

In this paper, we produce and examine several new notions such as soft topological soft groups and their subsystem. Also, soft topological soft rings and their subsystems are introduced. Furthermore, we introduce some new concepts like softly ...

Comments

Please enable JavaScript to view thecomments powered by Disqus.

Information & Contributors

Information

Published In

cover image IBM Journal of Research and Development

IBM Journal of Research and Development Volume 40, Issue 1

Special issue: terrestrial cosmic rays and soft errors

Jan. 1996

125 pages

ISSN:0018-8646

Editors:
P. S. Hauge,
J. F. Ziegler
IBM Thomas J. Watson Research Center Yorktown Heights, NY
,
G. R. Srinivasan
Microelectronics Division, Hopewell Junction, NY

Issue’s Table of Contents

Publisher

IBM Corp.

United States

Publication History

Published: 01 January 1996

Qualifiers

Article

Contributors

Other Metrics

View Article Metrics

Bibliometrics & Citations

Bibliometrics

Article Metrics

88
Total Citations
View Citations
0
Total Downloads

Downloads (Last 12 months)0
Downloads (Last 6 weeks)0

Reflects downloads up to 31 Dec 2024

Other Metrics

View Author Metrics

Citations

Cited By

View all

Benoit ADu YHerault TMarchal LPallez GPerotin LRobert YSun HVivien FSahni SSaxena VIyengar S(2022)Checkpointing à la Young/Daly: An OverviewProceedings of the 2022 Fourteenth International Conference on Contemporary Computing10.1145/3549206.3549328(701-710)Online publication date: 4-Aug-2022
https://dl.acm.org/doi/10.1145/3549206.3549328
Chabot AAlouani INouacer RNiar S(2021)A Memory Reliability Enhancement Technique for Multi Bit UpsetsJournal of Signal Processing Systems10.1007/s11265-020-01603-593:4(439-459)Online publication date: 1-Apr-2021
https://dl.acm.org/doi/10.1007/s11265-020-01603-5
Overill RVolkamer MWressnegger C(2020)Cosmic raysProceedings of the 15th International Conference on Availability, Reliability and Security10.1145/3407023.3409188(1-6)Online publication date: 25-Aug-2020
https://dl.acm.org/doi/10.1145/3407023.3409188
Naseer MAhmad WHasan O(2020)Formal Verification of ECCs for Memories Using ACL2Journal of Electronic Testing: Theory and Applications10.1007/s10836-020-05904-236:5(643-663)Online publication date: 1-Oct-2020
https://dl.acm.org/doi/10.1007/s10836-020-05904-2
Xue LZhang ZZou D(2019)Modeling the Propagation of Soft Errors in ProgramsProceedings of the 2nd International Conference on Computer Science and Software Engineering10.1145/3339363.3339382(144-152)Online publication date: 24-May-2019
https://dl.acm.org/doi/10.1145/3339363.3339382
McIntosh-Smith SHunt RPrice JVesztrocy A(2018)Application-based fault tolerance techniques for sparse matrix solversInternational Journal of High Performance Computing Applications10.1177/109434201769494632:5(627-640)Online publication date: 1-Sep-2018
https://dl.acm.org/doi/10.1177/1094342017694946
Benoit ARaina SRobert Y(2017)Efficient checkpoint/verification patternsInternational Journal of High Performance Computing Applications10.1177/109434201559453131:1(52-65)Online publication date: 1-Jan-2017
https://dl.acm.org/doi/10.1177/1094342015594531
Zheng RHuang M(2017)Redundant Memory Array Architecture for Efficient Selective ProtectionACM SIGARCH Computer Architecture News10.1145/3140659.308021345:2(214-227)Online publication date: 24-Jun-2017
https://dl.acm.org/doi/10.1145/3140659.3080213
Benoit ACavelan ACappello FRaghavan PRobert YSun HDeBardeleben N(2017)Identifying the Right Replication Level to Detect and Correct Silent Errors at ScaleProceedings of the 2017 Workshop on Fault-Tolerance for HPC at Extreme Scale10.1145/3086157.3086162(31-38)Online publication date: 26-Jun-2017
https://dl.acm.org/doi/10.1145/3086157.3086162
Zheng RHuang M(2017)Redundant Memory Array Architecture for Efficient Selective ProtectionProceedings of the 44th Annual International Symposium on Computer Architecture10.1145/3079856.3080213(214-227)Online publication date: 24-Jun-2017
https://dl.acm.org/doi/10.1145/3079856.3080213
Show More Cited By

Abstract

References

Cited By

Index Terms

Recommendations

Call-A.P.P.L.E. Magazine - 1978 Compendium

Book review: Human-Computer Interaction, by Jenny Preece, Yvonne Rogers, Helen Sharp, David Benyon, Simon Holland, and Tom Carey (Addison-Wesley, 1994)

Soft topological soft groups and soft rings

Comments

Information

Published In

Publisher

Publication History

Qualifiers

Contributors

Other Metrics

Bibliometrics

Article Metrics

Other Metrics

Citations

Cited By

View options

Figures

Other

Share

Share this Publication link

Share on social media

Affiliations