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research-article

In-field aging measurement and calibration for power-performance optimization

Authors:

Mohammad Tehranipoor,

LeRoy WinembergAuthors Info & Claims

DAC '11: Proceedings of the 48th Design Automation Conference

Pages 706 - 711

https://doi.org/10.1145/2024724.2024883

Published: 05 June 2011 Publication History

Abstract

Aging of transistors has become a major reliability concern especially when the VLSI circuits are in the nanometer regime. In this paper, we propose a novel methodology to address circuit aging in the field. On-chip aging sensor is designed to monitor transitions on functional paths capturing functional mode workload. Path delay is then accurately measured and converted to a digital value. Diagnosis and calibration are performed in the field, thereby achieving power-performance optimization throughout the entire lifetime. Simulation results demonstrate the efficiency of the proposed structure.

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Cited By

Deng LSong LSun N(2020)On-Chip Health Monitoring Based on DE-Cluster in 2.5D ICsBio-inspired Computing: Theories and Applications10.1007/978-981-15-3425-6_40(517-526)Online publication date: 2-Apr-2020
https://doi.org/10.1007/978-981-15-3425-6_40
Chithira PVasudevan V(2019)Potential Critical Path Selection Based on a Time-Varying Statistical Timing Analysis FrameworkIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2019.2893020(1-12)Online publication date: 2019
https://doi.org/10.1109/TVLSI.2019.2893020
Tenentes VRossi DYang SKhursheed SAl-Hashimi BGunn S(2017)Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating InfrastructureIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2016.262621825:4(1397-1407)Online publication date: 1-Apr-2017
https://dl.acm.org/doi/10.1109/TVLSI.2016.2626218
Show More Cited By

Index Terms

In-field aging measurement and calibration for power-performance optimization
1. Hardware
  1. Robustness

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Information & Contributors

Information

Published In

cover image ACM Conferences

DAC '11: Proceedings of the 48th Design Automation Conference

June 2011

1055 pages

ISBN:9781450306362

DOI:10.1145/2024724

General Chair:
Leon Stok
IBM Corp., Hopewell Jct., NY
,
Program Chairs:
Nikil Dutt
Univ. of California, Irvine, CA
,
Soha Hassoun
Tufts Univ., Medford, MA

Copyright © 2011 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

Sponsors

EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE Council on Electronic Design Automation (CEDA)

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 05 June 2011

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Semiconductor Research Corporation

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DAC '11

Sponsor:

EDAC
SIGDA

DAC '11: The 48th Annual Design Automation Conference 2011

June 5 - 10, 2011

California, San Diego

Acceptance Rates

Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

Upcoming Conference

DAC '25

Sponsor:
sigda

62nd ACM/IEEE Design Automation Conference

June 22 - 26, 2025

San Francisco , CA , USA

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Citations

Cited By

Deng LSong LSun N(2020)On-Chip Health Monitoring Based on DE-Cluster in 2.5D ICsBio-inspired Computing: Theories and Applications10.1007/978-981-15-3425-6_40(517-526)Online publication date: 2-Apr-2020
https://doi.org/10.1007/978-981-15-3425-6_40
Chithira PVasudevan V(2019)Potential Critical Path Selection Based on a Time-Varying Statistical Timing Analysis FrameworkIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2019.2893020(1-12)Online publication date: 2019
https://doi.org/10.1109/TVLSI.2019.2893020
Tenentes VRossi DYang SKhursheed SAl-Hashimi BGunn S(2017)Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating InfrastructureIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2016.262621825:4(1397-1407)Online publication date: 1-Apr-2017
https://dl.acm.org/doi/10.1109/TVLSI.2016.2626218
He MTehranipoor M(2017)An Access Mechanism for Embedded Sensors in Modern SoCsJournal of Electronic Testing: Theory and Applications10.1007/s10836-017-5669-633:4(397-413)Online publication date: 1-Aug-2017
https://dl.acm.org/doi/10.1007/s10836-017-5669-6
Firouzi FYe FChakrabarty KTahoori M(2015)Aging- and Variation-Aware Delay Monitoring Using Representative Critical Path SelectionACM Transactions on Design Automation of Electronic Systems10.1145/274623720:3(1-23)Online publication date: 24-Jun-2015
https://dl.acm.org/doi/10.1145/2746237
Bidokhti NTehranipoor MChen JLee J(2014)Life after failure2014 Reliability and Maintainability Symposium10.1109/RAMS.2014.6798522(1-7)Online publication date: Jan-2014
https://doi.org/10.1109/RAMS.2014.6798522
Firouzi FYe FChakrabarty KTahoori M(2014)Chip Health Monitoring Using Machine LearningProceedings of the 2014 IEEE Computer Society Annual Symposium on VLSI10.1109/ISVLSI.2014.119(280-283)Online publication date: 9-Jul-2014
https://dl.acm.org/doi/10.1109/ISVLSI.2014.119
Ababei CTamma C(2014)Distributed minimum energy point tracking for systems-on-chipIEEE International Conference on Electro/Information Technology10.1109/EIT.2014.6871770(246-251)Online publication date: Jun-2014
https://doi.org/10.1109/EIT.2014.6871770
He MTehranipoor M(2014)SAM: A comprehensive mechanism for accessing embedded sensors in modern SoCs2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)10.1109/DFT.2014.6962097(240-245)Online publication date: Oct-2014
https://doi.org/10.1109/DFT.2014.6962097
Firouzi FYe FChakrabarty KTahoori M(2013)Representative critical-path selection for aging-induced delay monitoring2013 IEEE International Test Conference (ITC)10.1109/TEST.2013.6651924(1-10)Online publication date: Sep-2013
https://doi.org/10.1109/TEST.2013.6651924
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