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Adaptive techniques for overcoming performance degradation due to aging in digital circuits

Authors:

Sanjay V. Kumar,

Sachin S. SapatnekarAuthors Info & Claims

ASP-DAC '09: Proceedings of the 2009 Asia and South Pacific Design Automation Conference

Pages 284 - 289

Published: 19 January 2009 Publication History

Abstract

Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of Hf-based high-k dielectrics for gate leakage reduction, Positive Bias Temperature Instability (PBTI), the dual effect in NMOS transistors has also reached significant levels. Consequently, designers are required to build in substantial guard-bands into their designs, leading to large area and power overheads, in order to guarantee reliable operation over the lifetime of a chip. We propose a guard-banding technique based on adaptive body bias (ABB) and adaptive supply voltage (ASV), to recover the performance of an aged circuit, and compare its merits over previous approaches.

References

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Cited By

Guo XStan M(2017)Implications of accelerated self-healing as a key design knob for cross-layer resilienceIntegration, the VLSI Journal10.1016/j.vlsi.2016.10.00856:C(167-180)Online publication date: 1-Jan-2017
https://dl.acm.org/doi/10.1016/j.vlsi.2016.10.008
Sengupta DMishra VSapatnekar S(2016)Invited - Optimizing device reliability effects at the intersection of physics, circuits, and architectureProceedings of the 53rd Annual Design Automation Conference10.1145/2897937.2905016(1-6)Online publication date: 5-Jun-2016
https://dl.acm.org/doi/10.1145/2897937.2905016
Baranowski RFirouzi FKiamehr SLiu CTahoori MWunderlich HNebel WAtienza D(2015)On-line prediction of NBTI-induced aging ratesProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2755886(589-592)Online publication date: 9-Mar-2015
https://dl.acm.org/doi/10.5555/2755753.2755886
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Adaptive techniques for overcoming performance degradation due to aging in digital circuits
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Information & Contributors

Information

Published In

cover image ACM Conferences

ASP-DAC '09: Proceedings of the 2009 Asia and South Pacific Design Automation Conference

January 2009

902 pages

ISBN:9781424427482

General Chair:
Kazutoshi Wakabayashi
NEC Corporation

Sponsors

IEEE Circuits and Systems Society
SIGDA: ACM Special Interest Group on Design Automation
IPSJ SIGSLDM: Information Processing Society of Japan - SIG System LSI Design Methodology
IEICE ESS: Institute of Electronics, Information and Communication Engineers - Engineering Sciences Society

Publisher

IEEE Press

Publication History

Published: 19 January 2009

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Research-article

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ASPDAC '09

Sponsor:

SIGDA
IPSJ SIGSLDM
IEICE ESS

ASPDAC '09: Asia and South Pacific Design Automation Conference

January 19 - 22, 2009

Yokohama, Japan

Acceptance Rates

Overall Acceptance Rate 466 of 1,454 submissions, 32%

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ASPDAC '25

Sponsor:
sigda

30th Asia and South Pacific Design Automation Conference

January 20 - 23, 2025

Tokyo , Japan

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Cited By

Guo XStan M(2017)Implications of accelerated self-healing as a key design knob for cross-layer resilienceIntegration, the VLSI Journal10.1016/j.vlsi.2016.10.00856:C(167-180)Online publication date: 1-Jan-2017
https://dl.acm.org/doi/10.1016/j.vlsi.2016.10.008
Sengupta DMishra VSapatnekar S(2016)Invited - Optimizing device reliability effects at the intersection of physics, circuits, and architectureProceedings of the 53rd Annual Design Automation Conference10.1145/2897937.2905016(1-6)Online publication date: 5-Jun-2016
https://dl.acm.org/doi/10.1145/2897937.2905016
Baranowski RFirouzi FKiamehr SLiu CTahoori MWunderlich HNebel WAtienza D(2015)On-line prediction of NBTI-induced aging ratesProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2755886(589-592)Online publication date: 9-Mar-2015
https://dl.acm.org/doi/10.5555/2755753.2755886
Firouzi FYe FChakrabarty KTahoori M(2015)Aging- and Variation-Aware Delay Monitoring Using Representative Critical Path SelectionACM Transactions on Design Automation of Electronic Systems10.1145/274623720:3(1-23)Online publication date: 24-Jun-2015
https://dl.acm.org/doi/10.1145/2746237
Chan WKahng ANath S(2014)Methodology for Electromigration Signoff in the Presence of Adaptive Voltage ScalingProceedings of SLIP (System Level Interconnect Prediction) on System Level Interconnect Prediction Workshop10.1145/2633948.2633954(1-7)Online publication date: 1-Jun-2014
https://dl.acm.org/doi/10.1145/2633948.2633954
Guo XBurleson WStan M(2014)Modeling and Experimental Demonstration of Accelerated Self-Healing TechniquesProceedings of the 51st Annual Design Automation Conference10.1145/2593069.2593162(1-6)Online publication date: 1-Jun-2014
https://dl.acm.org/doi/10.1145/2593069.2593162
Ebrahimi MOboril FKiamehr STahoori MHenkel J(2013)Aging-aware logic synthesisProceedings of the International Conference on Computer-Aided Design10.5555/2561828.2561840(61-68)Online publication date: 18-Nov-2013
https://dl.acm.org/doi/10.5555/2561828.2561840
Balasubramanian RSankaralingam KFarrens MKozyrakis C(2013)Virtually-aged sampling DMRProceedings of the 46th Annual IEEE/ACM International Symposium on Microarchitecture10.1145/2540708.2540720(123-135)Online publication date: 7-Dec-2013
https://dl.acm.org/doi/10.1145/2540708.2540720
Henkel JBauer LDutt NGupta PNassif SShafique MTahoori MWehn N(2013)Reliable on-chip systems in the nano-eraProceedings of the 50th Annual Design Automation Conference10.1145/2463209.2488857(1-10)Online publication date: 29-May-2013
https://dl.acm.org/doi/10.1145/2463209.2488857
Fang JGupta SKumar SMarella SMishra VZhou PSapatnekar SHu A(2012)Circuit reliabilityProceedings of the International Conference on Computer-Aided Design10.1145/2429384.2429431(243-246)Online publication date: 5-Nov-2012
https://dl.acm.org/doi/10.1145/2429384.2429431
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