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High-level synthesis of gracefully degradable ASICs

Published: 11 March 1996 Publication History

Abstract

We propose a novel graceful degradation scheme, L/U reconfiguration, which can tolerate a single permanent fault in each hardware class of ASIC data paths. In the proposed scheme, dynamic hardware rebinding and operation rescheduling are performed by a systematic perturbation of the original configuration. A high-level synthesis procedure, which automatically generates such fault-tolerant systems, is also presented. Experiments show that our reconfigurable AISC designs, as compared to optimal nonfault-tolerant designs, achieve optimal pre-reconfiguration and near-optimal post-reconfiguration speed performance.

References

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{1} W. Chan and A. Orailo¿lu. High-Level Synthesis of Gracefully Degradable ASICs. Technical Report CS95-447, Univ. of California, San Diego, Dept. of CSE, September 1995.
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{2} M. Chean and J. A. B. Fortes. A Taxonomy of Reconfiguration Techniques for Fault-Tolerant Processor Arrays. IEEE Computer, 23(1):55-66, January 1990.
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{3} B. Iyer, R. Karri, and I. Koren. Phantom Redundancy: A High-Level Synthesis Approach for Manufacturability. In Proceedings of ICCAD, pages 658-661, November 1995.
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{4} K. H. Kernighan and S. Lin. An Efficient Heuristic Procedure for Partitioning Graph. Bell System Technical Journal, 49(2):291-307, February 1970.
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{5} R. Naidu and S. Mahapatra. Fault Tolerance in N-MOS Random Access Memories with Dynamic Redundancy Methods. Microelectronics and Reliability, 28(2):193-200, 1988.
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{6} R. Negrini, M. G. Sami, and R. Stefanelli. Fault Tolerance Through Reconfiguration in VLSi and WSI Arrays. MlT Press, 1989.
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{7} A. Orailo¿lu and R. Karri. Coactive Scheduling and Checkpoint Determination during High-Level Synthesis of Self-Recovering Microarchitectures. IEEE Transactions on VLSI Systems, 2(3):304-311, September 1994.
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{8} A. Orailo¿lu and R. Karri. Automatic Synthesis of Self-Recovering VLSI Systems. IEEE Transactions on Computers, February 1996.
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{9} P. G. Paulin and J. P. Knight. Algorithms for high-level synthesis. IEEE Design and Test of Computers, 6(6):18-31, December 1989.

Cited By

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  • (2010)HW/SW co-detection of transient and permanent faults with fast recovery in statically scheduled data pathsProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871101(723-728)Online publication date: 8-Mar-2010
  • (2002)Reliability Properties Assessment at System LevelJournal of Electronic Testing: Theory and Applications10.1023/A:101504752498518:3(351-356)Online publication date: 1-Jun-2002
  • (2001)On-line fault detection in a hardware/software co-design environmentProceedings of the 14th international symposium on Systems synthesis10.1145/500001.500013(51-56)Online publication date: 30-Sep-2001
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  1. High-level synthesis of gracefully degradable ASICs

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    View all
    • (2010)HW/SW co-detection of transient and permanent faults with fast recovery in statically scheduled data pathsProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871101(723-728)Online publication date: 8-Mar-2010
    • (2002)Reliability Properties Assessment at System LevelJournal of Electronic Testing: Theory and Applications10.1023/A:101504752498518:3(351-356)Online publication date: 1-Jun-2002
    • (2001)On-line fault detection in a hardware/software co-design environmentProceedings of the 14th international symposium on Systems synthesis10.1145/500001.500013(51-56)Online publication date: 30-Sep-2001
    • (1999)Self recovering controller and datapath codesignProceedings of the conference on Design, automation and test in Europe10.1145/307418.307571(118-es)Online publication date: 1-Jan-1999
    • (1998)Concurrent error recovery with near-zero latency in synthesized ASICsProceedings of the conference on Design, automation and test in Europe10.5555/368058.368307(604-611)Online publication date: 23-Feb-1998
    • (1998)On-Line Fault Resilience Through Gracefully Degradable ASICsJournal of Electronic Testing: Theory and Applications10.1023/A:100829822660012:1-2(145-151)Online publication date: 1-Feb-1998

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