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Modeling reliability growth during non-representative

Authors:

Brian Mitchell,

Steven J. ZeilAuthors Info & Claims

Annals of Software Engineering, Volume 4, Issue 1-4

Pages 11 - 29

Published: 29 January 1997 Publication History

Abstract

A reliability growth model is presented that permits prediction of operational reliability without requiring that testing be conducted according to the operation profile of the program input space. Compared to prior growth models, this one shifts the observed random variable from interfailure time to a postýmortem analysis of the debugged faults, using order statistics to combine the observed failure rates of faults no matter how those faults were detected. The primary advantages of this model are:

the flexibility it offers to test planners, as the choice of testing method is no longer solely determined by the desire to predict operational reliability, and

more robust experimental designs can be formulated by taking advantage of a wider variety of options for data collection.

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Cited By

Zeil S(2000)Reliability growth modeling from fault failure ratesACM SIGSOFT Software Engineering Notes10.1145/340855.34104525:1(94)Online publication date: 1-Jan-2000
https://dl.acm.org/doi/10.1145/340855.341045
Mitchell BZeil S(1998)An experiment in estimating reliability growth under both representative and directed testingACM SIGSOFT Software Engineering Notes10.1145/271775.27178423:2(32-41)Online publication date: 1-Mar-1998
https://dl.acm.org/doi/10.1145/271775.271784
Mitchell BZeil SSoffa MYoung M(1998)An experiment in estimating reliability growth under both representative and directed testingProceedings of the 1998 ACM SIGSOFT international symposium on Software testing and analysis10.1145/271771.271784(32-41)Online publication date: 1-Mar-1998
https://dl.acm.org/doi/10.1145/271771.271784

Modeling reliability growth during non-representative
1. Software and its engineering
  1. Software creation and management
    1. Software verification and validation
      1. Software defect analysis

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Information & Contributors

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Published In

cover image Annals of Software Engineering

Annals of Software Engineering Volume 4, Issue 1-4

1997

249 pages

ISSN:1022-7091

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Copyright © Copyright © 1997 Kluwer Academic Publishers.

Publisher

J. C. Baltzer AG, Science Publishers

United States

Publication History

Published: 29 January 1997

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Cited By

Zeil S(2000)Reliability growth modeling from fault failure ratesACM SIGSOFT Software Engineering Notes10.1145/340855.34104525:1(94)Online publication date: 1-Jan-2000
https://dl.acm.org/doi/10.1145/340855.341045
Mitchell BZeil S(1998)An experiment in estimating reliability growth under both representative and directed testingACM SIGSOFT Software Engineering Notes10.1145/271775.27178423:2(32-41)Online publication date: 1-Mar-1998
https://dl.acm.org/doi/10.1145/271775.271784
Mitchell BZeil SSoffa MYoung M(1998)An experiment in estimating reliability growth under both representative and directed testingProceedings of the 1998 ACM SIGSOFT international symposium on Software testing and analysis10.1145/271771.271784(32-41)Online publication date: 1-Mar-1998
https://dl.acm.org/doi/10.1145/271771.271784

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