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Reliability growth modeling from fault failure rates

Published: 01 January 2000 Publication History

Abstract

A variety of reliability growth models provide quantified measures of test effectiveness in terms that are directly relevant to project management [Lyu96], but at the cost of restricting testing to representative selection, in which test data is chosen to reflect the operational distribution of the program's inputs. During testing, data is collected on the observed times between program failures (or, similarly, numbers of failures within a time interval). These observations are fitted to one of various models, which can then be used to estimate the current reliability of the program.

References

[1]
{Lyu96} Michael R. Lyu, editor. Handbook of Software Reliability Engineering . IEEE Computer Society Press, 1996.
[2]
{MZ96} Brian Mitchell and Steven J. Zeil. A reliability model combining representative and directed testing. In Proceedings of the 18th International Conference on Software Engineering, pages 506- 514, Berlin, March 1996. IEEE Computer Society Press.
[3]
{MZ97} Brian Mitchell and Steven J. Zeil. Modeling the reliability growth of non-representative testing. Annals of Software Engineering , 4:11-29, 1997.
[4]
{MZ98} Brian Mitchell and Steven J. Zeil. An experiment in estimating reliability growth under both representative and directed testing. In 1998 International Symposium on Software Testing and Analysis, pages 32-41, March 1998.

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Information & Contributors

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Published In

cover image ACM SIGSOFT Software Engineering Notes
ACM SIGSOFT Software Engineering Notes  Volume 25, Issue 1
Jan 2000
242 pages
ISSN:0163-5948
DOI:10.1145/340855
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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 01 January 2000
Published in SIGSOFT Volume 25, Issue 1

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