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Procedures for static compaction of test sequences for synchronous sequential circuits based on vector restoration

Authors:

R. Guo,

I. Pomeranz,

S. M. ReddyAuthors Info & Claims

DATE '98: Proceedings of the conference on Design, automation and test in Europe

Pages 583 - 589

Published: 23 February 1998 Publication History

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Abstract

We propose several compaction procedures for synchronous sequential circuits based on test vector restoration. Under a vector restoration procedure, all or most of the test vectors are first omitted from the test sequence. Test vectors are then restored one at a time or in subsequences only as necessary to restore the fault coverage of the original sequence. Techniques to speed-up the restoration process are investigated. These include limiting the test vectors initially omitted from the test sequence, consideration of several faults in parallel during restoration, and the use of a parallel fault simulator.

References

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Cited By

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Chen XHsiao M(2006)Testing Embedded Sequential Cores in Parallel Using Spectrum-Based BISTIEEE Transactions on Computers10.1109/TC.2006.3055:2(150-162)Online publication date: 1-Feb-2006
https://dl.acm.org/doi/10.1109/TC.2006.30
Pomeranz IReddy S(2002)Enumeration of Test Sequences in Increasing Chronological Order to Improve the Levels of Compaction Achieved by Vector OmissionIEEE Transactions on Computers10.1109/TC.2002.101770551:7(866-872)Online publication date: 1-Jul-2002
https://dl.acm.org/doi/10.1109/TC.2002.1017705
Giani ASheng SHsiao MAgrawal V(2002)State and Fault Information for Compaction-Based Test GenerationJournal of Electronic Testing: Theory and Applications10.1023/A:101378002364318:1(63-72)Online publication date: 1-Feb-2002
https://dl.acm.org/doi/10.1023/A%3A1013780023643
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Procedures for static compaction of test sequences for synchronous sequential circuits based on vector restoration
1. Hardware

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Published In

DATE '98: Proceedings of the conference on Design, automation and test in Europe

February 1998

940 pages

ISBN:0818683597

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IEEE Computer Society

United States

Publication History

Published: 23 February 1998

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static test compaction synchronous sequential circuits

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DATE98: Design, Automation & Test in Europe

February 23 - 26, 1998

Le Palais des Congrés de Paris, France

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Overall Acceptance Rate 518 of 1,794 submissions, 29%

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Cited By

View all

Chen XHsiao M(2006)Testing Embedded Sequential Cores in Parallel Using Spectrum-Based BISTIEEE Transactions on Computers10.1109/TC.2006.3055:2(150-162)Online publication date: 1-Feb-2006
https://dl.acm.org/doi/10.1109/TC.2006.30
Pomeranz IReddy S(2002)Enumeration of Test Sequences in Increasing Chronological Order to Improve the Levels of Compaction Achieved by Vector OmissionIEEE Transactions on Computers10.1109/TC.2002.101770551:7(866-872)Online publication date: 1-Jul-2002
https://dl.acm.org/doi/10.1109/TC.2002.1017705
Giani ASheng SHsiao MAgrawal V(2002)State and Fault Information for Compaction-Based Test GenerationJournal of Electronic Testing: Theory and Applications10.1023/A:101378002364318:1(63-72)Online publication date: 1-Feb-2002
https://dl.acm.org/doi/10.1023/A%3A1013780023643
Pomeranz IReddy S(2001)Sequence reordering to improve the levels of compaction achievable by static compaction proceduresProceedings of the conference on Design, automation and test in Europe10.5555/367072.367158(214-218)Online publication date: 13-Mar-2001
https://dl.acm.org/doi/10.5555/367072.367158
Giani ASheng SHsiao MAgrawal V(2001)Efficient spectral techniques for sequential ATPGProceedings of the conference on Design, automation and test in Europe10.5555/367072.367152(204-208)Online publication date: 13-Mar-2001
https://dl.acm.org/doi/10.5555/367072.367152
Pomeranz IReddy S(2000)Procedures for Static Compaction of Test Sequences for Synchronous Sequential CircuitsIEEE Transactions on Computers10.1109/12.86221949:6(596-607)Online publication date: 1-Jun-2000
https://dl.acm.org/doi/10.1109/12.862219
Hsiao MChakradhar S(2000)Test Set and Fault Partitioning Techniques for Static Test Sequence Compaction for Sequential CircuitsJournal of Electronic Testing: Theory and Applications10.1023/A:100831390193816:4(329-338)Online publication date: 1-Aug-2000
https://dl.acm.org/doi/10.1023/A%3A1008313901938
Shao YGuo RPomeranz IReddy S(1999)The Effects of Test Compaction on Fault DiagnosisProceedings of the 1999 IEEE International Test Conference10.5555/518925.939446Online publication date: 28-Sep-1999
https://dl.acm.org/doi/10.5555/518925.939446
Pomeranz IReddy SWhite JSentovich E(1999)An approach for improving the levels of compaction achieved by vector omissionProceedings of the 1999 IEEE/ACM international conference on Computer-aided design10.5555/339492.340060(463-466)Online publication date: 7-Nov-1999
https://dl.acm.org/doi/10.5555/339492.340060
Bommu SChakradhar SDoreswamy KYasuura H(1998)Static compaction using overlapped restoration and segment pruningProceedings of the 1998 IEEE/ACM international conference on Computer-aided design10.1145/288548.288592(140-146)Online publication date: 1-Nov-1998
https://dl.acm.org/doi/10.1145/288548.288592

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