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New methods of improving parallel fault simulation in synchronous sequential circuits

Authors:

Hyung Ki Lee,

Dong Sam HaAuthors Info & Claims

ICCAD '93: Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design

Pages 10 - 17

Published: 07 November 1993 Publication History

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References

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Cited By

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Guo RPomeranz IReddy S(1999)A Fault Simulation Based Test Pattern Generator for Synchronous Sequential CircuitsProceedings of the 1999 17TH IEEE VLSI Test Symposium10.5555/832299.836542Online publication date: 26-Apr-1999
https://dl.acm.org/doi/10.5555/832299.836542
Shao YGuo RPomeranz IReddy S(1999)The Effects of Test Compaction on Fault DiagnosisProceedings of the 1999 IEEE International Test Conference10.5555/518925.939446Online publication date: 28-Sep-1999
https://dl.acm.org/doi/10.5555/518925.939446
Guo RReddy SPomeranz I(1999)ProptestProceedings of the 36th annual ACM/IEEE Design Automation Conference10.1145/309847.310019(653-659)Online publication date: 1-Jun-1999
https://dl.acm.org/doi/10.1145/309847.310019
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New methods of improving parallel fault simulation in synchronous sequential circuits
1. Hardware

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Data parallel fault simulation for combinational and sequential circuits

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Information

Published In

ICCAD '93: Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design

November 1993

781 pages

ISBN:0818644907

Chairmen:
Michael Lightner
Univ. of Colorado, Boulder
,
Jochen A. G. Jess
Eindhoven Univ. of Tech., Eindhoven, The Netherlands

Publisher

IEEE Computer Society Press

Washington, DC, United States

Publication History

Published: 07 November 1993

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Conference

ICCAD '93

Sponsor:

SIGDA
IEEE-CS

ICCAD '93: International Conference on Computer Aided Design

November 7 - 11, 1993

California, Santa Clara, USA

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Overall Acceptance Rate 457 of 1,762 submissions, 26%

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Cited By

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Guo RPomeranz IReddy S(1999)A Fault Simulation Based Test Pattern Generator for Synchronous Sequential CircuitsProceedings of the 1999 17TH IEEE VLSI Test Symposium10.5555/832299.836542Online publication date: 26-Apr-1999
https://dl.acm.org/doi/10.5555/832299.836542
Shao YGuo RPomeranz IReddy S(1999)The Effects of Test Compaction on Fault DiagnosisProceedings of the 1999 IEEE International Test Conference10.5555/518925.939446Online publication date: 28-Sep-1999
https://dl.acm.org/doi/10.5555/518925.939446
Guo RReddy SPomeranz I(1999)ProptestProceedings of the 36th annual ACM/IEEE Design Automation Conference10.1145/309847.310019(653-659)Online publication date: 1-Jun-1999
https://dl.acm.org/doi/10.1145/309847.310019
Pöhl FAnheier W(1999)Quality Determination for Gate Delay Fault Tests Considering Three-State ElementsJournal of Electronic Testing: Theory and Applications10.1023/A:100834522148814:1-2(49-55)Online publication date: 1-Feb-1999
https://dl.acm.org/doi/10.1023/A%3A1008345221488
Hsiao M(1999)On Non-Statistical Techniques for Fast Fault Coverage EstimationJournal of Electronic Testing: Theory and Applications10.1023/A:100833272335915:3(239-254)Online publication date: 1-Dec-1999
https://dl.acm.org/doi/10.1023/A%3A1008332723359
Guo RPomeranz IReddy SDewilde PRammig FMusgrave G(1998)Procedures for static compaction of test sequences for synchronous sequential circuits based on vector restorationProceedings of the conference on Design, automation and test in Europe10.5555/368058.368302(583-589)Online publication date: 23-Feb-1998
https://dl.acm.org/doi/10.5555/368058.368302
Rudnick EPatel J(1997)Overcoming the Serial Logic Simulation Bottleneck in Parallel Fault SimulationProceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications10.5555/523974.834866Online publication date: 4-Jan-1997
https://dl.acm.org/doi/10.5555/523974.834866
Graham CRudnick EPatel J(1997)Dynamic Fault Grouping for PROOFSProceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications10.5555/523974.834826Online publication date: 4-Jan-1997
https://dl.acm.org/doi/10.5555/523974.834826
Burgun LReblewski FFenelon GBerbier JLepape OPennino TYoffa E(1996)Serial fault emulationProceedings of the 33rd annual Design Automation Conference10.1145/240518.240669(801-806)Online publication date: 1-Jun-1996
https://dl.acm.org/doi/10.1145/240518.240669
Cheng KHuang SDai WRudell R(1995)Fault emulationProceedings of the 1995 IEEE/ACM international conference on Computer-aided design10.5555/224841.225144(681-686)Online publication date: 1-Dec-1995
https://dl.acm.org/doi/10.5555/224841.225144
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Parallel and sequential algorithms for the optimization and design of fault-tolerant nanoscale semiconductor devices

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