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research-article

Modeling and estimation of power supply noise using linear programming

Authors:

Farshad Firouzi,

Mehdi B. TahooriAuthors Info & Claims

ICCAD '11: Proceedings of the International Conference on Computer-Aided Design

Pages 537 - 542

Published: 07 November 2011 Publication History

Abstract

Power supply noise in nano-scale VLSI is one of the design concerns. Due to switching current of various logic gates, the actual supply voltage seen by different devices fluctuates, causing extra delays and ultimately intermittent faults during operation. Therefore, accurate estimation of worst case scenario, maximum noise and the vectors causing it, is extremely important for design, verification, and manufacturing test steps. In this paper we present a mixed-integer linear programming modeling of power supply noise in digital circuits to obtain fast and accurate solutions. Compared with accurate SPICE simulations of random vectors for a set of benchmark circuits, the proposed approach can achieve 13115x speedup while obtains 2.7% more optimization in average.

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Cited By

Firouzi FYe FChakrabarty KTahoori M(2015)Aging- and Variation-Aware Delay Monitoring Using Representative Critical Path SelectionACM Transactions on Design Automation of Electronic Systems10.1145/274623720:3(1-23)Online publication date: 24-Jun-2015
https://dl.acm.org/doi/10.1145/2746237

Modeling and estimation of power supply noise using linear programming
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Information & Contributors

Information

Published In

cover image ACM Conferences

ICCAD '11: Proceedings of the International Conference on Computer-Aided Design

November 2011

844 pages

ISBN:9781457713989

General Chair:
Joel Phillips
Cadence Research Labs, Berkeley, CA
,
Program Chairs:
Alan J. Hu
Univ. of British Columbia, Vancouver, BC, Canada
,
Helmut Graeb
Technische Universitaet, Munich, Germany

Sponsors

SIGDA: ACM Special Interest Group on Design Automation
IEEE-CEDA

Publisher

IEEE Press

Publication History

Published: 07 November 2011

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ICCAD '11

Sponsor:

SIGDA

ICCAD '11: The International Conference on Computer-Aided Design

November 7 - 10, 2011

California, San Jose

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Overall Acceptance Rate 457 of 1,762 submissions, 26%

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Cited By

Firouzi FYe FChakrabarty KTahoori M(2015)Aging- and Variation-Aware Delay Monitoring Using Representative Critical Path SelectionACM Transactions on Design Automation of Electronic Systems10.1145/274623720:3(1-23)Online publication date: 24-Jun-2015
https://dl.acm.org/doi/10.1145/2746237

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